Automatic docking device for test carriers in high and low temperature box

Abstract

The utility model discloses an automatic docking device for test carriers in a high and low temperature box, which comprises a high and low temperature test box, three groups of carrier docking mechanisms are fixedly connected on the inner wall of a test cavity of the high and low temperature test box, and netted shelves are clamped between the left and right sides of the carrier docking mechanisms. According to the technical scheme, the carrier docking mechanism is arranged in the test cavity of the high and low temperature test box, the net-shaped shelf is vertically clamped by the upper and lower layers of supporting strips, and the space between the upper and lower layers of supporting strips is filled with the rubber strips, so that the net-shaped shelf can be horizontally clamped; according to the technical scheme, the balls on the lower-layer supporting strips are clamped into the grooves in the net-shaped shelf, so that the shelf is reminded of being placed in place and being in butt joint with the shelf, the workpiece clamping mechanism is arranged on the shelf, and stable clamping force is provided for the workpiece, so that the workpiece is kept in a stable placement posture in the testing process.

Description

TECHNICAL FIELD

[0001] The utility model relates to high and low temperature box test auxiliary instrument technical field, concretely relates to a high and low temperature box in test carrier automatic docking device. BACKGROUND

[0002] The high and low temperature box is also called high and low temperature test box, and is suitable for the reliability test of industrial products at high temperature and low temperature. The performance indexes of rubber, plastic and other material workpieces are tested under the condition of high temperature and low temperature (alternating) cycle change. At present, the workpiece to be detected is placed on the net-shaped shelf, and the shelf is placed in the test cavity in the high and low temperature box. A plurality of equidistant support bars are usually fixed in the test cavity, and the shelf is placed on the support bars. However, this placement method cannot know whether the shelf is docked in place, and cannot be stably supported after docking. Therefore, the technical personnel in the field propose a high and low temperature box in test carrier automatic docking device. CONTENT OF UTILITY MODEL

[0003] The utility model discloses a kind of high and low temperature box in test carrier automatic docking device technical solutions, to solve the deficiency in background art proposed. In order to solve the drawbacks and defects described in the background art, the technical scheme has the following contents:

[0004] It includes high and low temperature test box, 3 groups of carrier docking mechanisms are fixedly connected on the inner wall of the test cavity of the high and low temperature test box, the left and right of the carrier docking mechanism are all clamped with net-shaped shelf, and the top surface of the net-shaped shelf is fixedly connected with workpiece clamping mechanism;

[0005] The carrier docking mechanism includes lower layer support bar located below and upper layer support bar located above, and a rubber strip is fixedly connected between the lower layer support bar and the upper layer support bar, and the left and right side walls of the net-shaped shelf are in contact with one side of the rubber strip close to each other;The rear side of the top surface of the lower layer support bar is embedded with cylindrical groove, the cylindrical spring is fixedly connected in the cylindrical groove, and the top end of the cylindrical spring is fixedly connected with the spherical ball located at the top end port of the cylindrical groove, wherein the rear side of the bottom surface of the net-shaped shelf is provided with spherical groove clamped with the spherical ball;

[0006] The workpiece clamping mechanism includes a shell, a bottom plate fixedly connected to the upper surface of the shell, and two racks rotatably arranged on the upper surface of the bottom plate, one side of the rack close to each other is provided with a plurality of teeth, the inner intermediate region of the bottom plate is rotatably provided with a gear engaged with the teeth of the rack, the bottom end of the gear is fixedly connected with a worm, and the inner rotation of the shell is provided with a worm wheel engaged with the worm.

[0007] As a preferred scheme of the utility model: the test cavity front side port of high and low temperature test box is equipped with the cabinet door through the hinge installation, the bottom surface four corner positions of high and low temperature test box are all equipped with the gyro wheel, and the top surface fixed connection of high and low temperature test box has the alarm light.

[0008] As a preferred scheme of the utility model: the side of the mutual faraway of lower layer support strip and the side of the mutual faraway of upper layer support strip are all with the fixed connection of the test cavity inboard side wall of high and low temperature test box, and the side of the mutual close of lower layer support strip and upper layer support strip has the interval for the net-shaped shelf insertion.

[0009] As a preferred scheme of the utility model: the surface of the side of the mutual close of rubber strip all is equipped with the groove of the contact of the left and right side wall of net-shaped shelf on.

[0010] As a preferred scheme of the utility model: the top surface rear side of lower layer support strip all is equipped with the cavity for the inlay and fixed of cylindrical groove, and the top end of cylindrical groove is flush with the top surface of lower layer support strip.

[0011] As a preferred scheme of the utility model: the bottom end of cylindrical spring is fixedly connected with the inner cavity bottom side wall of cylindrical groove, and the upper half position of spherical ball is exposed from the inside of cylindrical groove.

[0012] As a preferred scheme of the utility model: the bottom surface of shell is fixedly connected with the top surface middle area of net-shaped shelf.

[0013] As a preferred scheme of the utility model: the inside of worm wheel is fixedly connected with a transversely arranged rotating shaft, and one end of the rotating shaft is rotatably connected with the inner cavity side wall of shell, the other end penetrates out from the inside of shell, and one end of the rotating shaft in the inside of shell is connected with a knob.

[0014] As a preferred scheme of the utility model: the top surface of shell is fixedly connected with two sliding blocks, the inside of rack is provided with a sliding groove for the penetration and sliding of sliding block, and the end of the mutual faraway of rack is fixedly connected with clamping plate that can be mutually engaged.

[0015] In the above technical scheme, the utility model provides technical effect and advantage:

[0016] The utility model discloses a test cavity of high and low temperature test box is provided with the carrier docking mechanism, and the net-shaped shelf is clamped by the upper and lower two layers of support strips, and the rubber strip is filled between the upper and lower two layers of support strips, so that the net-shaped shelf can be clamped from left and right, and after the net-shaped shelf is inserted into the test cavity, the ball on the lower layer of support strips is clamped into the groove in the net-shaped shelf, thereby reminding the shelf to be placed in place and the effect of docking with the shelf, and the workpiece clamping mechanism is arranged on the shelf, the stable clamping force is provided for the workpiece, and the stable placement posture of the workpiece during the test is realized. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly explain the technical scheme in the embodiments of the present application or the prior art, the drawings needed in the embodiments will be briefly introduced below, and obviously, the drawings in the following description are only some embodiments described in the present application, and other drawings can also be obtained by those skilled in the art according to these drawings.

[0018] Figure 1 It is the whole structure schematic diagram of high and low temperature test box;

[0019] Figure 2 It is the internal schematic diagram of high and low temperature test box;

[0020] Figure 3 It is the schematic diagram of test carrier;

[0021] Figure 4 It is the schematic diagram of carrier docking mechanism;

[0022] Figure 5 It is the schematic diagram of workpiece clamping mechanism.

[0023] Explanation of reference signs:

[0024] 1, high and low temperature test box;2, carrier docking mechanism;21, lower layer of support strips;22, rubber strip;23, upper layer of support strips;24, ball;25, cylindrical spring;26, cylindrical groove;3, workpiece clamping mechanism;31, shell;32, sliding block;33, rack;34, clamping plate;35, bottom plate;36, gear;37, rotating shaft;38, worm wheel;39, worm;4, alarm lamp;5, box door;6, roller;7, net-shaped shelf. DETAILED DESCRIPTION

[0025] In order to make the technical scheme and implementation mode of the present application more clearly explained and described, the following introduces several preferred specific embodiments for realizing the technical scheme of the present application.

[0026] The following description is merely exemplary in nature and is not intended to limit the present disclosure, application and uses. It should be understood that throughout the drawings, the same or like reference numerals are used to designate the same or like components and features. The various drawings merely schematically represent the ideas and principles of embodiments of the present disclosure and do not necessarily illustrate all the specific details of the various embodiments of the present disclosure. In certain drawings, certain parts can be exaggerated to illustrate the relevant details or structures of the embodiments of the present disclosure. The disclosures of the various publications, patents and published patent specifications referred to herein are hereby incorporated by reference in their entireties. The technical solutions of the present disclosure will be described clearly and completely below with reference to the embodiments of the present disclosure. Obviously, the described embodiments are only a part of the embodiments of the present disclosure.

[0027] Embodiments, with reference to the description accompanying drawings Figure 1 -attached Figure 5 as shown;

[0028] A better technical scheme of an automatic docking device for a test carrier in a high-low temperature chamber includes the following.

[0029] The high-low temperature test chamber 1 is provided with three groups of carrier docking mechanisms 2 fixedly connected to the inner wall of the test cavity of the high-low temperature test chamber 1. The net-shaped shelves 7 are clamped between the carrier docking mechanisms 2. The workpiece clamping mechanisms 3 are fixedly connected to the top surface of the net-shaped shelves 7.

[0030] The carrier docking mechanism 2 includes a lower support strip 21 located below and an upper support strip 23 located above. The lower support strip 21 and the upper support strip 23 are fixedly connected to each other by a rubber strip 22. The left and right side walls of the net-shaped shelves 7 are in contact with one side of the rubber strip 22. The rear side of the top surface of the lower support strip 21 is embedded with a cylindrical groove 26. The cylindrical spring 25 is fixedly connected to the inside of the cylindrical groove 26. The top end of the cylindrical spring 25 is fixedly connected to the spherical ball 24 located at the top end of the cylindrical groove 26. The bottom surface of the net-shaped shelves 7 is provided with a spherical groove matched with the spherical ball 24.

[0031] The workpiece clamping mechanism 3 includes an outer shell 31, a bottom plate 35 fixedly connected to the upper surface of the outer shell 31, and two racks 33 rotatably and slidably arranged on the upper surface of the bottom plate 35. The side of the racks 33 close to each other is provided with a plurality of teeth. The inside of the bottom plate 35 is rotatably provided with a gear 36 engaged with the teeth of the racks 33. The bottom end of the gear 36 is fixedly connected to a worm 39. The inside of the outer shell 31 is rotatably provided with a worm wheel 38 engaged with the worm 39.

[0032] The test cavity front side port of the high and low temperature test box 1 is hingedly provided with a box door 5, the bottom surface four corner positions of the high and low temperature test box 1 are provided with rollers 6, and the top surface of the high and low temperature test box 1 is fixedly connected with an alarm lamp 4, the mutually far apart sides of the lower layer support strips 21 and the mutually far apart sides of the upper layer support strips 23 are fixedly connected with the test cavity inner side wall of the high and low temperature test box 1, and the mutually close sides of the lower layer support strips 21 and the upper layer support strips 23 have a spacing for the net-shaped shelf 7 to be inserted.

[0033] The mutually close side surfaces of the rubber strips 22 are each provided with a groove in contact with the left and right side walls of the net-shaped shelf 7. The top surface rear side of the lower layer support strip 21 is provided with a cavity for embedding and fixing the cylindrical groove 26, the top end of the cylindrical groove 26 is flush with the top surface of the lower layer support strip 21, the bottom end of the cylindrical spring 25 is fixedly connected with the inner cavity bottom side wall of the cylindrical groove 26, and the upper half of the spherical ball 24 is exposed from the inside of the cylindrical groove 26.

[0034] The bottom surface of the shell 31 is fixedly connected with the top surface middle area of the net-shaped shelf 7, the inside of the worm gear 38 is fixedly penetrated with a transversely arranged rotating shaft 37, one end of the rotating shaft 37 is rotatably connected with the inner cavity side wall of the shell 31, the other end penetrates out from the inside of the shell 31, one end of the rotating shaft 37 located in the inside of the shell 31 is connected with a knob, the top surface of the shell 31 is fixedly connected with two sliding blocks 32, the inside of the rack 33 is provided with a sliding groove for the sliding block 32 to penetrate and slide, and the mutually far apart ends of the rack 33 are fixedly connected with clamping plates 34 capable of being mutually engaged.

[0035] According to the above-mentioned preferred technical scheme, the working process of the technical scheme is described:

[0036] The workpiece to be subjected to high and low temperature test is placed between the clamping plates 34, the knob at one end of the rotating shaft 37 is rotated to drive the worm gear 38 to rotate, thereby driving the worm 39 to rotate, at this time the gear 36 is driven by the worm 39 to drive the rack 33 to move close to each other until the workpiece is clamped by the clamping plates 34. Then the net-shaped shelf 7 is placed into the test cavity of the high and low temperature test box 1, the net-shaped shelf 7 is slowly inserted along the spacing between the lower layer support strips 21 and the upper layer support strips 23, and the left and right sides of the net-shaped shelf 7 are in contact with the rubber strips 22, after the spherical ball 24 is pressed into the groove at the bottom of the net-shaped shelf 7 due to the elastic force of the cylindrical spring 25, the connection with the test cavity is completed.

[0037] The above has only described certain exemplary embodiments of the present application by way of illustration, and it is needless to say that the described embodiments can be modified in various ways without departing from the spirit and scope of the present application for those skilled in the art. Therefore, the above drawings and descriptions are illustrative in nature, and should not be understood as limiting the scope of protection of the claims of the present application.

Claims

1. A high-low temperature chamber in test carrier automatic docking device, comprising a high-low temperature test chamber (1), characterized in that: The high-low temperature test box (1) is fixedly connected with three groups of carrier docking mechanisms (2) on the inner wall of the test cavity, the carrier docking mechanisms (2) are clamped with the net-shaped shelves (7) between the left and right sides, and the top surface of the net-shaped shelves (7) is fixedly connected with the workpiece clamping mechanism (3); The carrier docking mechanism (2) comprises a lower layer support strip (21) located below and an upper layer support strip (23) located above, and the lower layer support strip (21) and the upper layer support strip (23) are fixedly connected with a rubber strip (22) therebetween, and the left and right side walls of the net-shaped shelf (7) are in contact with one side of the rubber strip (22) close to each other; the rear side of the top surface of the lower layer support strip (21) is embedded with a cylindrical groove (26), the inside of the cylindrical groove (26) is fixedly connected with a cylindrical spring (25), and the top end of the cylindrical spring (25) is fixedly connected with a spherical ball (24) located at the top end of the cylindrical groove (26), wherein the rear side of the bottom surface of the net-shaped shelf (7) is provided with a spherical groove matched with the spherical ball (24); The workpiece clamping mechanism (3) comprises a shell (31), a bottom plate (35) fixedly connected to the upper surface of the shell (31), and two racks (33) rotatably arranged on the upper surface of the bottom plate (35) and symmetrically arranged, the side close to each other of the rack (33) is provided with a plurality of teeth, the inside of the bottom plate (35) is rotatably provided with a gear (36) engaged with the teeth of the rack (33), the bottom end of the gear (36) is fixedly connected with a worm (39), and the inside of the shell (31) is rotatably provided with a worm wheel (38) engaged with the worm (39).

2. The automatic docking device for a test carrier in a high-low temperature chamber of claim 1, wherein: The front side of the test cavity of the high-low temperature test box (1) is hingedly provided with a box door (5), the bottom surface of the high-low temperature test box (1) is provided with a plurality of rollers (6) at the corners, and the top surface of the high-low temperature test box (1) is fixedly connected with an alarm lamp (4).

3. The automatic docking device for a test carrier in a high-low temperature chamber of claim 1, wherein: The side away from each other of the lower layer support strip (21) and the side away from each other of the upper layer support strip (23) are fixedly connected with the inner side wall of the test cavity of the high-low temperature test box (1), and the side close to each other of the lower layer support strip (21) and the upper layer support strip (23) has a spacing for the net-shaped shelf (7) to insert.

4. The automatic docking device for a test carrier in a high-low temperature chamber of claim 1, wherein: The side surface close to each other of the rubber strips (22) is provided with a groove in contact with the left and right side walls of the net-shaped shelf (7).

5. The automatic docking device for a test carrier within a high-low temperature chamber of claim 1, wherein: The rear side of the top surface of the lower layer support strip (21) is provided with a cavity for embedding and fixing the cylindrical groove (26), and the top port of the cylindrical groove (26) is flush with the top surface of the lower layer support strip (21).

6. The automatic docking device for a test carrier within a high-low temperature chamber of claim 1, wherein: The bottom end of the cylindrical spring (25) is fixedly connected with the inner cavity bottom side wall of the cylindrical groove (26), and the upper half of the spherical ball (24) is exposed from the inside of the cylindrical groove (26).

7. The automatic docking device for a test carrier within a high-low temperature chamber of claim 1, wherein: The bottom surface of the shell (31) is fixedly connected with the top surface of the net-shaped shelf (7).

8. The automatic docking device for a test carrier within a high-low temperature chamber of claim 1, wherein: The worm wheel (38) is internally fixed with a transversely arranged rotating shaft (37), one end of the rotating shaft (37) is rotationally connected with the inner cavity side wall of the shell (31), the other end penetrates out of the shell (31), and the end of the rotating shaft (37) in the shell (31) is connected with a knob.

9. The automatic docking device for a test carrier within a high-low temperature chamber of claim 1, wherein: The top surface of the shell (31) is fixedly connected with two sliding blocks (32), the inner part of the rack (33) is provided with a sliding groove for the penetration and sliding of the sliding blocks (32), and the ends of the rack (33) away from each other are fixedly connected with clamping plates (34) capable of being mutually engaged.

Images