In-situ high-temperature CT imaging device

Abstract

The utility model discloses an in-situ high-temperature CT imaging device which comprises a multidirectional displacement mechanism and a connecting piece installed on the multidirectional displacement mechanism, the connecting piece is connected with an imaging shell through a supporting column, a sample cavity is formed in the inner side of the imaging shell, and a heating system is arranged in the sample cavity. An X-ray light through hole communicated with the sample cavity is formed in the imaging shell, and a water cooling system and a temperature measuring element are further arranged in the imaging shell and located above the sample cavity. The multi-directional displacement mechanism realizes accurate control of the position of the imaging main body, improves flexibility, provides guarantee for visualization and operation convenience of a high-temperature test process, is provided with a heating system and a water cooling system for adjusting the temperature change in the sample cavity, and is provided with a temperature measuring element for real-time monitoring, so that the measurement accuracy is improved. The core temperature of the heating area can be accurately monitored, regulated and controlled, the quick responsiveness and accuracy of temperature change are guaranteed, and the precision and reliability of test data are effectively improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to CT imaging technical field, concretely relates to a in situ high temperature CT imaging device. BACKGROUND

[0002] Traditional imaging analysis means are mainly optical microscope, scanning electron microscope, transmission electron microscope, atomic force microscope and the like. In the imaging technology aspect, the research direction mainly focuses on how to improve the resolution, and the above-mentioned imaging technology is all the imaging means based on two-dimensional imaging technology, therefore can only see the surface interface information of the material, and as for the detection of the internal gap structure of the material, still cannot realize nondestructive testing. As a kind of nondestructive testing technology, X-ray computed tomography (CT) technology has been widely applied in life medicine, geology and geotechnical engineering, petroleum chemical industry and marine development and other fields, and can realize nondestructive, three-dimensional and high-resolution detection of electrode materials, electronic materials and the like.

[0003] In addition, in-situ CT technology is also widely used in the field of electrochemistry, and related in-situ CT devices are derived therefrom, for example, the in-situ characterization method of three-dimensional morphology of electrochemical electrode based on CT technology described in patent publication No. CN 112858413 A, which helps to model and analyze the data of electrolysis by in-situ CT technology, solves the problem that electrochemical experiments cannot be directly observed under high temperature environment, and proves the important advantages of in-situ CT experiments in observing the 3D evolution of electrode materials.

[0004] At present, in-situ X-ray computed tomography is realized by installing an in-situ loading platform on a CT, which is widely concerned by researchers. Researchers apply high temperature / low temperature environment, stress environment and the like to the material, stretch / bend the material, and according to the different attenuation densities of X-rays penetrating samples of different densities, different gray scales are presented, so as to explore the structural deformation of the sample under the action of force.

[0005] However, some in-situ CT high temperature devices select halogen lamp heating lamps as heating sources in the selection of heating methods, for example, Hrishikesh A. Bale and the like use a plurality of halogen lamps to heat the sample in the research on ceramic matrix composites, so as to study the crack damage of the material under high temperature. Different specifications of halogen lamp sources have different working focal lengths, which causes the internal volume of the device to be too large due to the working distance of the lamp source, and the stability of the device cannot be guaranteed for long time operation under high temperature by adopting the heating method.

[0006] For solid samples, the present patent aims to develop an in-situ high temperature CT imaging device. The utility model discloses the technical scheme of the prior art is improved

[0007] The utility model discloses to solve the technical problems of in the prior art:

[0008] To solve the above technical problems, the utility model provides the following technical scheme:

[0009] A in situ high temperature CT imaging device, including multidirectional displacement mechanism and the connecting piece that installs on multidirectional displacement mechanism, the imaging shell is connected through the support on the connecting piece, the imaging shell inside is provided with sample cavity, is provided with heating system in sample cavity, the X-ray light hole that is passed through with sample cavity is seted up on the imaging shell, still be equipped with water cooling system and temperature measuring element in the imaging shell and be located above sample cavity.

[0010] The utility model discloses through multidirectional displacement mechanism, realized accurate control to the imaging main body position, improved flexibility, this for high temperature test process's visualization and operation convenience provided the guarantee, and the utility model is through setting heating system and water cooling system, for adjusting the temperature change in sample cavity, real -time monitoring is carried out simultaneously to setting temperature measuring element, and the device is through advanced temperature control system, cooperates corresponding temperature measuring element, can accurate monitoring and regulation and control heating area core temperature, guarantee the quick response and accuracy of temperature change, effectively promoted the precision and reliability of test data.

[0011] As a further scheme of the utility model: the multidirectional displacement mechanism includes horizontal displacement table and the lifting support installed on it, the horizontal displacement table can drive the lifting support to move in " X " direction and " Y " direction.

[0012] As a further scheme of the utility model: the lifting support is installed with lifting lead screw in " Z " direction, and the lifting lead screw is screw connected with lifting platform, the top of the lifting support is installed with motor that drives the rotation of lifting lead screw, and the connecting piece is connected with lifting platform.

[0013] As a further scheme of the utility model: the connecting piece includes furnace body support and object table fixing frame connected with furnace body support, and the end of object table fixing frame is connected with the support.

[0014] As a further scheme of the utility model: the water cooling system includes water cooling copper installed in the inside of imaging shell, the water cooling copper is connected with water cooling connector on the imaging shell, and the water cooling connector is connected with external cooling water circulation system.

[0015] As a further scheme of the utility model: the heating system includes heating body installed in the inside of sample cavity, the ceramic sleeve is arranged on the outside of heating body, and the ceramic sleeve is connected to water cooling system through heating body connecting fitting.

[0016] As a further scheme of the present application: the temperature measuring element extends into the sample cavity from the top surface of the imaging shell and is located above the X-ray light hole.

[0017] As a further scheme of the present application: the temperature measuring element is selected from a thermocouple or a Pt100 temperature sensor.

[0018] As a further scheme of the present application: the bottom of the imaging shell is connected with a base, and a through hole in communication with the sample cavity in the imaging shell is formed in the base.

[0019] As a further scheme of the present application: the diameter of the X-ray light hole is ≤2mm.

[0020] Compared with the prior art, the present application has the following beneficial effects:

[0021] 1. The present application realizes accurate control of the position of the imaging main body through the multidirectional displacement mechanism, improves flexibility, which provides guarantee for the visualization and operation convenience of the high-temperature test process, and the present application is provided with a heating system and a water cooling system for adjusting the temperature change in the sample cavity, and a temperature measuring element is arranged for real-time monitoring, the device can accurately monitor and control the core temperature of the heating area through the advanced temperature control system and the corresponding temperature measuring element, guarantee the rapid response and accuracy of the temperature change, and effectively improve the precision and reliability of the test data.

[0022] 2. The present application adopts a stable and compact heating system, discards the traditional halogen lamp heating method, and successfully solves the problems of space occupation and stability of the heating source through the unique heating structure design, realizes the miniaturization of the whole device, which not only improves the stability of the system, but also ensures the reliable operation of the system under long-time high-temperature conditions, thereby overcoming the instability of similar devices caused by the limitation of the heating source.

[0023] In summary, the present technology realizes the comprehensive combination of high temperature, high resolution, stability and miniaturization, and has significant advantages in temperature adaptation range, imaging resolution, equipment size control and operation stability compared with the prior art. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 FIG. 1 is a structural schematic view of an in-situ high-temperature CT imaging device according to an embodiment of the present application;

[0025] Figure 2 FIG. 2 is a partial structural schematic view of the in-situ high-temperature CT imaging device according to the embodiment of the present application;

[0026] Figure 3 FIG. 3 is a structural schematic view of another angle of the in-situ high-temperature CT imaging device according to the embodiment of the present application; and Figure 2 FIG. 4 is a structural schematic view of another angle of the in-situ high-temperature CT imaging device according to the embodiment of the present application.

[0027] Figure 4 For Figure 2 the bottom view structure schematic diagram of the embodiment of the utility model;

[0028] Figure 5 For the cross section view of the shell structure of the embodiment of the utility model;

[0029] Mark explanation:

[0030] 1, horizontal displacement platform;2, lifting support;3, lifting platform;4, furnace body support;5, lifting screw;6, object table fixing frame;7, support column;8, PEEK joint;9, temperature measuring element;10, water cooling joint;11, shell;12, base;13, PEEK seat;14, base fixing plate;15, water-cooled copper;16, heating body connecting fitting;17, ceramic sleeve;18, sample cavity;19, X-ray light hole;20, heating body. Specific implementation

[0031] In order to make the purpose, technical scheme and advantage of the embodiment of the utility model clearer, the technical scheme in the embodiment of the utility model will be described clearly and completely below, obviously, the described embodiment is a part of the embodiment of the utility model, rather than all the embodiments. Based on the embodiment in the utility model, all other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the utility model.

[0032] Referring to Figure 1 , an in-situ high temperature CT imaging device, a sample three-dimensional topographic structure in-situ detection method, a multifunctional detection device with position adjustment, sample temperature adjustment and in-situ CT imaging function, suitable for various micron CT imaging devices and nanometer CT imaging devices;

[0033] Specifically, it comprises horizontal displacement platform 1, lifting support 2, lifting platform 3, furnace body support 4, lifting screw 5, object table fixing frame 6, wherein the bottom of the horizontal displacement platform 1 is provided with a base fixing plate 14, the top of the horizontal displacement platform 1 is provided with a lifting support 2 arranged vertically, the lifting support 2 is provided with a lifting screw 5 arranged vertically, the lifting screw 5 is threadedly connected with the lifting platform 3, the top of the lifting screw 5 is driven by a motor installed on the lifting support 2, and one side of the lifting platform 3 is connected with a horizontally arranged furnace body support 4, and the furnace body support 4 is connected with the object table fixing frame 6;

[0034] It should be noted that the horizontal displacement table 1 can drive the lifting support 2 and the lifting table 3, the furnace body support 4 and the object table fixing frame 6 and other structures to move along the "X" direction and the "Y" direction; and the motor can drive the lifting screw 5 to rotate, thereby driving the lifting table 3 to vertically ascend along the lifting screw 5, thereby driving the furnace body support 4, the object table fixing frame 6 and the structures thereon to vertically ascend. In order to stabilize the above-mentioned structures, the materials of the horizontal displacement table 1 and the lifting table 3 need to meet the rigid support, and the material selection includes but is not limited to various structural metal parts, such as stainless steel and aluminum alloy materials.

[0035] With reference to Figure 1 , Figure 2 , Figure 3 and Figure 4 , the end of the object table fixing frame 6 away from the furnace body support 4 is provided with two arc-shaped grooves, and two support columns 7 are rotatably connected in the two arc-shaped grooves, and the bottom of the two support columns 7 is connected to the shell 11, the shell 11 is in a cylindrical structure as a whole, the inside of the shell 11 is provided with a sample cavity 18, and a ceramic sleeve 17 is further arranged at the lower position of the sample cavity 18 for heat insulation, and a heating body 20 is arranged in the ceramic sleeve 17 for heating the sample cavity 18.

[0036] The bottom of the shell 11 is provided with a base 12 by screws and the like, and a circular hole is formed at the middle position of the base 12 for introducing a sample. In use, the sample is placed on the tip of the thimble, and the thimble is fixed to the sample cavity with glue.

[0037] It should be noted that in order to meet the requirements of CT imaging experiments, the sample needs to meet the 360° rotation imaging, therefore, the structure design of the shell 11 where the sample is located needs to meet the cylindrical structure, and in the present design, the volume of the lower cylinder of the shell 11 needs to meet the condition of ≤φ35mm. In order to meet the penetration effect of X-rays, an X-ray light hole 19 is formed at the lower position of the shell 11, and the diameter of the through hole meets the condition of ≤2mm to meet the requirements of high-resolution CT imaging.

[0038] In order to meet the heating requirement, a heating body 20 structure is arranged in the sample cavity 18, and the sample cavity 18 is sequentially arranged with a temperature measuring element 9, a heating body 20, a ceramic sleeve 17 and a shell 11 from inside to outside; a PEEK seat 13 is arranged on the top of the shell 11, and a PEEK joint 8 is arranged above the PEEK seat 13; the temperature measuring element 9 can be selected from conventional thermocouples or Pt100 temperature sensors, and is arranged to extend into the sample cavity 18 from the top surface of the shell 11 and above the X-ray light hole 19, and is arranged close to the sample directly above to ensure the accuracy of the temperature.

[0039] It should be noted that the ceramic sleeve 17 can be composed of porous material or multiple layers of metal thin layer to effectively isolate heat.

[0040] It should be noted that the heating body 20 can be directly connected with the external temperature control system through the metal connecting wire for controlling the temperature and the heating rate in the reaction chamber.

[0041] Referring to Figure 5 The water-cooled copper 15 is arranged at the upper position of the sample cavity 18 in the shell 11, and is connected to the ceramic sleeve 17 through the heating body connecting fitting 16 below the water-cooled copper 15. The water-cooled groove is arranged in the water-cooled copper 15, and is connected with the external cooling water circulation system through the water-cooled connector 10 arranged at the top of the imaging shell 11 and connected with the water-cooled groove at the bottom. The water-cooled connector 10 is connected with the external cooling water circulation system to directly realize the overall cooling function of the sample cavity 18. The water-cooled system can keep the shell 11 of the equipment at a low temperature to avoid high temperature from causing harm to people.

[0042] The specific operation principle of the application is as follows:

[0043] In use, the sample is placed on the needle tip of the needle, and the needle is fixed in the sample cavity 18 through the circular hole at the bottom of the base 12. The needle is fixed with the sample cavity by glue. The water-cooled connector 10 is connected with the external water-cooled system, and the PEEK plug 8 connected with the external temperature control system is inserted into the PEEK socket 13.

[0044] If the light parameter is introduced, the light source is applied to the side of the shell 11 to pass through the X-ray light hole 19 and act on the sample.

[0045] If the temperature parameter is applied, the cooling water circulation system is first opened, and then the temperature control system is opened. At this time, the heating body 20 and the water-cooled copper 15 start to work. After the temperature reaches the target value, the sample light-heat structure characterization can be performed.

[0046] The above embodiments are only used to illustrate the technical solutions of the application, but not to limit it. Although the application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced by equivalent ones. The modification or replacement does not make the essence of the corresponding technical solution deviate from the spirit and scope of the technical solutions of the embodiments of the application.

Claims

1. An in-situ high temperature CT imaging apparatus, characterized by, The utility model relates to a kind of X-ray imaging device, including multidirectional displacement mechanism and connecting piece installed on multidirectional displacement mechanism, connecting piece is connected with imaging shell (11) by support (7) on it, imaging shell (11) inside is provided with sample cavity, heating system is arranged in sample cavity, X-ray light hole (19) is opened in imaging shell (11) and is communicated with sample cavity, water cooling system and temperature measuring element (9) are further provided in imaging shell (11) and above sample cavity. Heating system includes heating body (20) installed in sample cavity (18) inside, ceramic sleeve (17) is provided outside heating body (20), ceramic sleeve (17) is connected to water cooling system by heating body connecting fitting (16) above.

2. The in-situ high temperature CT imaging apparatus according to claim 1, characterized in that: The multidirectional displacement mechanism includes a horizontal displacement table (1) and a lifting bracket (2) mounted thereon, the horizontal displacement table (1) can drive the lifting bracket (2) to move in the "X" direction and the "Y" direction.

3. The in-situ high temperature CT imaging apparatus of claim 2, wherein: The lifting bracket (2) is provided with a lifting lead screw (5) in the "Z" direction, wherein the lifting lead screw (5) is threadedly connected with a lifting table (3), the top of the lifting bracket (2) is provided with a motor for driving the lifting lead screw (5) to rotate, and the connecting piece is connected with the lifting table (3).

4. The in-situ high temperature CT imaging apparatus of claim 3, wherein: The connecting piece includes a furnace body support (4) and a sample stage fixing frame (6) connected with the furnace body support (4), and the end of the sample stage fixing frame (6) is connected with the support (7).

5. The in-situ high temperature CT imaging apparatus of claim 1, wherein: The water cooling system includes a water-cooled copper (15) installed inside the imaging shell (11), the water-cooled copper (15) is connected with a water cooling connector (10) located on the imaging shell (11), and the water cooling connector (10) is connected with an external cooling water circulation system.

6. The in-situ high temperature CT imaging apparatus of claim 1, wherein: The temperature measuring element (9) extends into the sample cavity (18) from the top surface of the imaging shell (11) and is located above the X-ray light hole (19).

7. The in-situ high temperature CT imaging apparatus of claim 6, wherein: The temperature measuring element (9) is selected from a thermocouple or a Pt100 temperature sensor.

8. The in-situ high temperature CT imaging apparatus of claim 1, wherein: The bottom of the imaging shell (11) is connected with a base (12), and the base (12) is provided with a through hole communicated with the sample cavity in the imaging shell (11).

9. The in-situ high temperature CT imaging apparatus of claim 1, wherein: The diameter of the X-ray light hole (19) is ≤2mm.

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