Clamp for testing optical device
By designing a fixture for testing optical devices and utilizing the self-locking function of the metal clamps and conductive parts, the problem of poor connection during factory testing of optical devices was solved, improving the reliability of test results and product yield, and ensuring the stability of optical devices.
Patent Information
- Application Number
- CN202520350854.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-03
- Publication Date
- 2026-02-03
- Estimated Expiration
- 2035-03-03
AI Technical Summary
In existing factory testing of optical devices, poor or broken connections between the test device and the metal casing lead to defective products entering the customer's market. Furthermore, the lack of effective control over casing parameters affects the reliability of test results and product yield.
A fixture for testing optical devices is designed, including an insulating substrate and a self-locking movable part. Through the cooperation of the metal clamp and the conductive part, the metal shell of the optical device is kept in stable contact with the test device to form a reliable circuit. The fixture is self-locking at the test position to avoid poor contact or disconnection, thus ensuring the accuracy of the test results.
This has improved the reliability and accuracy of optical device testing results, increased product yield, ensured the stability of optical device performance during high and low temperature aging tests, and reduced the risk of defective products reaching customers.
Smart Images
Figure CN223870712U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to optical device clamp technical field, specifically provide a kind of optical device test fixture. BACKGROUND
[0002] After the production of optical device, the electrical performance between each pin needs to be tested before and after each process operation, especially the resistance value of each pin and metal shell needs to be strictly controlled. The resistance between optical device and metal shell is usually high, generally reaching megahertz, so the ideal situation is that optical device and shell are completely insulated. Ensure the high resistance between optical device and metal shell to ensure the performance of the product in high-low temperature aging test.
[0003] But in the existing optical device factory test, the test end of the test device and the metal shell will appear connection bad or disconnect situation, when this situation occurs, even if the part of pin of optical device and shell appears short circuit, its actual detection result will also show qualified, cannot truly detect defective product. In addition, many current test schemes do not control the parameter value of shell, which will lead to many defective products flowing to customer end. With the growth of use time, these defective products will gradually appear various problems. Therefore, an apparatus capable of ensuring stable connection between shell and test device during factory test of optical device is urgently needed to ensure the reliability of detection result of optical device before leaving factory. SUMMARY
[0004] To solve the above problems, the utility model provides a kind of fixture for fixing optical device when optical device is tested, which can ensure good contact between the metal shell of optical device and the test device when the fixture fixes the optical device.
[0005] The technical scheme of the utility model is as follows:
[0006] A kind of fixture for testing optical device, characterized by comprising insulating substrate, the insulating substrate is provided with placing table and mobile part with self-locking function, the placing table is fixedly provided with conductive part, the placing table is used to place optical device with metal shell, the conductive part is in contact with the metal shell of the optical device, the mobile part includes movable metal chuck, the metal chuck is self-locked when moving to detection position, at this time, the metal chuck and the conductive part clamp the optical device.
[0007] In the scheme, the optical device to be tested is arranged on the placement table and fixed on the placement table by the metal clamp head, the metal clamp head and the conductive part are in direct contact with the metal shell of the optical device, the conductive part and the metal clamp head can be electrically connected to the two poles of the shell test end respectively, the metal clamp head and the conductive part are communicated by contact, the metal shell and the shell test end form a loop, the metal clamp head always abuts against the metal shell of the optical device, the metal clamp head and the conductive part always contact with the metal shell of the optical device, and the reliability of the subsequent detection result can be ensured, and the subsequent test of the optical device can be directly performed by using the clamp, only when the moving part moves to the detection position and the metal clamp head forms a loop with the test current, the optical device to be tested is eligible in size and correctly placed on the placement table, and the accuracy of the subsequent test and the shell yield of the optical device can be ensured.
[0008] Preferably, the conductive part is a metal stopper protruding from the upper surface of the placement table, and the optical device is placed on one side of the metal stopper.
[0009] Preferably, the moving part comprises a moving rod arranged horizontally, the metal clamp head is elongated by the moving rod to abut against the optical device placed on the placement table, and the metal shell on the optical device abuts against the metal stopper and the metal clamp head respectively, in the scheme, the moving rod is arranged horizontally and abuts against the optical device from the side, so that the side wall of the optical device is attached to the side surface of the metal stopper, the optical device is placed in place on the placement table, the metal stopper and the metal clamp head are in contact with the metal shell of the optical device from the side of the optical device, and the detection of the pin of the optical device at the bottom of the optical device is not affected, and the accuracy of the subsequent detection is further improved.
[0010] Preferably, the moving part further comprises a fixed sliding cylinder and a rotating handle, the moving rod is slidably arranged on the fixed sliding cylinder, and the rotating handle is rotatably arranged on the insulating base plate, a connecting rod is rotatably arranged in the middle of the rotating handle, and the other end of the connecting rod is rotatably arranged on the end of the moving rod, by rotating the rotating handle, the moving rod can slide along the axis of the fixed sliding cylinder.
[0011] In the scheme, the fixed sliding cylinder ensures the stability of the moving rod during sliding, and reduces the generation of errors, at the same time, the rotating handle, the connecting rod and the sliding moving rod form a crank slider mechanism, by rotating the rotating handle, the sliding distance of the moving rod can be ensured to be accurate, the rotating center of the rotating handle on the insulating base plate, the rotating center of the connecting rod and the rotating handle, and the rotating center of the connecting rod and the moving rod are on a straight line, that is, the "dead position" of the crank structure formed by the three, after the moving rod slides outward to the maximum distance, the detection position of the metal clamp head is reached, and the metal clamp head has a certain self-locking ability, and will not retreat due to external force at the tested optical device, and the problem of fixed failure of the metal clamp head is avoided.
[0012] Preferably, the rotating handle is provided with a groove capable of accommodating the connecting rod.
[0013] In this scheme, the groove on the rotating handle can accommodate the connecting rod when the connecting rod is in contact with the rotating handle, and the connecting rod can be accommodated by the groove to allow the rotating handle to further rotate to the "dead position", thereby extending the length of the rotating handle and improving the force arm of the rotating handle, so that the user can move the moving rod more easily and labor-savingly.
[0014] Preferably, the rotating handle is provided with a protrusion, which abuts against the connecting rod when the moving rod slides to the farthest distance.
[0015] In this scheme, when the moving rod slides to the farthest distance, i.e. the rotating handle is in the "dead position", the protrusion just abuts against the connecting rod, so that the user can easily determine the limit position of the moving part; at the same time, the rotating handle is directly rotated to abut against the connecting rod, so that the self-locking of the metal chuck can be realized without repeated adjustment, thereby ensuring the clamping reliability of the metal chuck.
[0016] Preferably, the metal chuck is provided with a right-angled groove, one right angle of the right-angled groove is parallel to the side of the optical device, and the other right angle of the right-angled groove is parallel to the top surface of the optical device, so that when the metal chuck abuts against the optical device, as long as the optical device is not placed in place or the parameter error of the metal shell is too large, the metal head will interfere with the optical device, so that the optical device cannot enter the right-angled groove of the metal chuck, which directly shows that the moving part cannot reach the limit position, so that the user can intuitively perceive the placement of the optical device or the size problem of the shell, thereby ensuring the accuracy of the detection of the optical device and the product yield.
[0017] Preferably, the moving rod is an insulating rod, so that when no optical device is placed on the placement table, the test circuit board lamp will not be turned on regardless of the position of the metal chuck.
[0018] The beneficial effects of the utility model are as follows:
[0019] 1. The utility model discloses a placement table, a metal chuck, an optical device and a test circuit board, and the metal chuck, the metal shell of the optical device and the conductive part are in direct contact with each other, the metal chuck can be self-locked, and the metal chuck and the conductive part are always in contact with the metal shell of the optical device, so that the contact or disconnection of the metal chuck and the conductive part is avoided, and the reliability of the subsequent detection result is ensured.
[0020] 2. The metal shell and the test circuit board form a loop by abutting, different analog voltages are output through the test circuit board, the test circuit can monitor the metal shell of the optical device in real time, when the shell test loop is normal, it indicates that the test circuit board is in good contact with the metal shell of the optical device, thereby ensuring the reliability of the subsequent detection result.
[0021] 3. The utility model discloses a direct subsequent optical device test, only when the moving part moves to the detection position, and the metal chuck and the shell test end, such as test circuit board form loop, can be clear that the shell size qualified optical device is correctly placed on the placement platform, when the moving part does not move limit position form loop or move to limit position does not form loop, can prove that the optical device is placed wrong or shell parameter deviation is too big, and then can guarantee the accuracy of optical device detection, improve the yield. BRIEF DESCRIPTION OF DRAWINGS
[0022] In order to more clearly illustrate the technical scheme of the present application, the following will be a brief description of the drawings needed to use the embodiment, obviously, the following description in the drawings only some embodiments of the present application, for those skilled in the art, without creative labor, can also obtain other drawings according to these drawings.
[0023] Figure 1 It is a three-dimensional schematic view of the utility model;
[0024] Figure 2 It is a schematic view when the utility model fixes optical device.
[0025] In the above drawings, corresponding to the figure mark as follows:
[0026] 1-insulating substrate, 2-placing table, 3-metal chuck, 4-moving rod, 5-metal stopper, 6-fixed slide cylinder, 7-connecting rod, 8-rotary handle, 9-groove, 10-optical device, 11-bump. DETAILED DESCRIPTION
[0027] Combined with the drawings, the technical scheme of the present application is clearly and completely explained by the specific implementation mode of the embodiment of the present application.
[0028] Example one:
[0029] As shown in Figure 1 And Figure 2 A kind of optical device 10 test fixture shown in, including insulating substrate 1, the insulating substrate 1 is provided with placing table 2 and movable part with self-locking function, the placing table 2 is fixedly provided with conducting part, the placing table 2 is used to place the optical device 10 with metal shell, the conducting part is in contact with the metal shell of the optical device 10, the movable part includes movable metal chuck 3, the conducting part and metal chuck 3 can be electrically connected the two poles of shell test end respectively, the metal chuck 3 moves to detection position and self-locking, at this time, the metal chuck 3 and the conducting part hold the optical device 10.
[0030] The moving part can move from all directions and fix the optical device 10, and the detection position indicates that the metal clamp head can firmly abut against the optical device 10. It is only necessary to ensure that the metal clamp head 3 and the optical device 10 shell contact and do not contact the conductive part. Preferably, the moving part further includes a horizontally arranged moving rod 4, one end of the moving rod 4 is connected to the metal clamp head 3, and the moving rod 4 moves horizontally to move the metal clamp head 3 away from or abut against the optical device 10 placed on the placement table 2. Meanwhile, the conductive part is a metal blocking piece 5 protruding from the upper surface of the placement table 2. By placing the optical device 10 on one side of the metal blocking piece 5, the optical device 10 can be clamped and fixed by the metal clamp head 3 and the metal blocking piece 5 when the metal clamp head 3 abuts against the optical device 10. The side wall of the optical device 10 is in contact with the side of the metal blocking piece 5, ensuring the accuracy of the installation direction of the optical device 10. Meanwhile, the metal blocking piece 5 and the metal clamp head 3 are in contact with the metal shell of the optical device 10 from the side of the optical device 10, which does not affect the detection of the pins of the optical device 10 at the bottom of the optical device 10, further improving the accuracy of subsequent detection.
[0031] In this embodiment, the optical device 10 to be tested is placed on the placement table 2 and fixed on the placement table 2 by the metal clamp head 3. The metal clamp head 3, the metal shell of the optical device 10, and the conductive part are in contact with each other, so that the metal shell is electrically connected to the shell test end, such as forming a loop with the test circuit board. By outputting different analog voltages through the shell test end, the contact condition of the metal shell of the optical device 10 to be tested can be monitored in real time by detecting the feedback voltage. When the loop formed by the shell test end is normal, the reliability of the subsequent detection result can be ensured. The metal clamp head 3, the metal shell of the optical device 10, and the conductive part are in direct contact with each other. The metal clamp head 3 can be self-locked and always abut against the metal shell of the optical device, ensuring that the metal clamp head 3 and the conductive part are always in contact with the metal shell of the optical device 10, avoiding poor contact or disconnection, and ensuring the reliability of the subsequent detection result. At the same time, this clamp can be used to directly test the subsequent optical device 10. When the moving part moves to the limit position and the metal clamp head 3 forms a loop with the test circuit board, it can be determined that the optical device 10 with a qualified shell size is correctly placed on the placement table 2. When the moving part does not move to the limit position to form a loop or moves to the limit position without forming a loop, it can be proved that the optical device 10 is placed incorrectly or the shell parameter deviation is too large, thereby ensuring the accuracy of the optical device 10 detection and improving the yield.
[0032] Further, the metal chuck 3 is provided with a right-angled groove, one of the right-angled edges of the right-angled groove is parallel to the side edge of the optical device 10, and the other edge is parallel to the top surface of the optical device 10, so that when the metal chuck 3 is pressed against the optical device 10, as long as the optical device 10 is not placed in place or the metal shell error is too large, the metal chuck 3 will interfere with the optical device 10, so that the optical device 10 cannot enter the right-angled groove of the metal chuck 3, directly showing that the moving part cannot reach the limit position, so that the user can intuitively perceive the placement problem of the optical device 10, thereby ensuring the correct placement of the optical device 10.
[0033] It should be noted that the metal chuck 3 shown in the figure is only a design structure corresponding to a rectangular optical device 10, and when the shape of the optical device 10 is different, the right-angled groove of the metal chuck 3 should be modified to different shapes.
[0034] Further, the moving rod 4 is an insulating rod, which ensures that when the optical device 10 is not placed on the placement table 2, the test circuit board lamp will not be turned on regardless of the position of the metal chuck 3.
[0035] Embodiment two:
[0036] Based on embodiment one, as shown in Figure 1 and Figure 2 , a specific driving structure of the moving rod 4 is provided, wherein the moving part further includes a fixed sliding cylinder 6 and a rotating handle 8, the moving rod 4 is slidably arranged on the fixed sliding cylinder 6, and the rotating handle 8 is rotatably arranged on the insulating base plate 1, the middle part of the rotating handle 8 is rotatably provided with a connecting rod 7, and the other end of the connecting rod 7 is rotatably arranged at the end of the moving rod 4, so that by rotating the rotating handle 8, the moving rod 4 can slide along the axis direction of the fixed sliding cylinder.
[0037] Specifically, the rotating handle 8, the connecting rod 7 and the slidingly arranged moving rod 4 form a crank slider mechanism, which can ensure the sliding distance of the moving rod 4 by rotating the rotating handle 8, and the fixed sliding cylinder 6 ensures the stability of the moving rod 4 during sliding, so that the metal chuck 3 is in the detection position when it is pressed against the optical device 10, and the detection position is the position closest to the optical device 10 placed on the placement table 2, at this time, the rotating center of the rotating handle 8 on the insulating base plate, the rotating center of the connecting rod 7 and the rotating handle 8, and the rotating center of the connecting rod 7 and the moving rod 4 are on a straight line, that is, the "dead position" of the crank structure formed by the three, so that after the moving rod 4 slides to the maximum distance, it has a certain self-locking ability and will not retreat due to external force at the to-be-tested optical device 10, avoiding the problem of fixed failure of the metal chuck 3.
[0038] Further, the rotating handle 8 is provided with a groove 9 capable of accommodating the connecting rod 7, and the rotating handle 8 is provided with a protrusion 11 abutting against the connecting rod 7 when the moving rod 4 slides to the farthest distance. The groove 9 on the rotating handle 8 can accommodate the connecting rod 7 when the connecting rod 7 is in close contact with the rotating handle 8, and the connecting rod 7 can be accommodated by the groove 9 to allow the rotating handle 8 to further rotate to the dead position, and the length of the rotating handle 8 can be extended, the force arm of the rotating handle 8 is increased, and the user can move the moving rod 4 more easily and more easily when using the rotating handle 8 to control the moving rod 4. When the moving rod 4 slides to the farthest distance, that is, the rotating handle 8 is in the dead position, the protrusion 11 abuts against the connecting rod 7, so that the user can easily determine the limit position of the moving part; at the same time, the rotating handle 8 is directly rotated to abut the protrusion 11 against the connecting rod 7, so that the self-locking of the metal chuck 3 can be realized, and repeated adjustment is not required, and the clamping reliability of the metal chuck 3 is ensured.
[0039] It should be noted that the moving rod can also be a powered pneumatic telescopic rod, a threaded rod controlled by a manually rotating nut, etc.
[0040] The above shows and describes the basic principles, main features and advantages of the present application. It should be understood by those skilled in the art that the present application is not limited by the above examples, and the above examples and descriptions in the specification are only to illustrate the principles of the present application. Without departing from the spirit and scope of the present application, various changes and improvements can be made to the present application, and these changes and improvements all fall within the scope of the present application.
Claims
1. A fixture for testing optical devices, characterized in that, The device includes an insulating substrate (1), on which a placement platform (2) and a movable part with a self-locking function are provided. A conductive part is fixedly provided on the placement platform (2). The placement platform (2) is used to place an optical device (10) with a metal shell. The conductive part is in contact with the metal shell of the optical device (10). The movable part includes a movable metal clamp (3). The conductive part and the metal clamp (3) can be electrically connected to the two poles of the shell test end respectively. When the metal clamp (3) moves to the detection position, it performs self-locking. At this time, the metal clamp (3) and the conductive part clamp the optical device (10).
2. The fixture for testing optical devices according to claim 1, characterized in that, The conductive part is a metal baffle (5) protruding from the upper surface of the placement platform (2), and the optical device (10) is placed in one side of the metal baffle (5).
3. The optical device testing fixture according to claim 2, characterized in that, The metal clamp (3) is provided with a right-angle groove. One right-angle side of the right-angle groove is parallel to the side of the optical device (10), and the other side of the right-angle groove is parallel to the top surface of the optical device (10).
4. The fixture for testing optical devices according to claim 1, characterized in that, The moving part includes a horizontally arranged moving rod (4), and the metal clamp (3) can extend through the moving rod (4) to abut against the optical device (10) placed on the placement table (2), and the metal shell on the optical device (10) abuts against the metal stop (5) and the metal clamp (3) respectively.
5. A fixture for testing optical devices according to claim 4, characterized in that, The moving part further includes a fixed slide cylinder (6) and a rotating handle (8). The moving rod (4) slides through the fixed slide cylinder (6). The rotating handle (8) is rotatably mounted on the insulating substrate (1). A connecting rod (7) is rotatably mounted in the middle of the rotating handle (8). The other end of the connecting rod (7) is rotatably mounted at the end of the moving rod (4). By rotating the rotating handle (8), the moving rod (4) can slide along the axial direction of the fixed slide cylinder.
6. A fixture for testing optical devices according to claim 5, characterized in that, The rotating handle (8) is provided with a groove (9) that can accommodate the connecting rod (7).
7. A fixture for testing optical devices according to claim 6, characterized in that, The rotating handle (8) is provided with a protrusion (11), which abuts against the connecting rod (7) when the moving rod (4) slides to the farthest distance.
8. A fixture for testing optical devices according to any one of claims 4 to 7, characterized in that, The movable rod (4) is an insulating rod.