Electrical testing equipment
By designing an electrical testing device that includes a main unit, a conveyor rail, and a vacuum fixture, efficient transport and testing of the test object in the assembly line was achieved, solving the shortcomings of existing equipment in terms of efficiency and cost, improving the operating efficiency of the assembly line and reducing costs.
Patent Information
- Application Number
- CN202520197235.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Priority Date
- 2024-03-19
- Filing Date
- 2025-02-08
- Publication Date
- 2026-02-06
- Estimated Expiration
- 2035-02-08
AI Technical Summary
There is room for improvement in the testing efficiency and cost of existing electrical testing equipment, especially in terms of how to improve operational efficiency and reduce operating costs in assembly lines.
An electrical testing device was designed, comprising a main unit, a conveyor rail, a moving device, an upper fixture, and a lower fixture. By moving the conveyor rail and raising or lowering the support, the device under test can be efficiently transported and tested in an assembly line. The device under test is held in a vacuum fixture for electronic testing.
It improves the operating efficiency of electrical testing equipment, reduces operating costs, and is suitable for high-efficiency electronic testing in assembly lines.
Smart Images
Figure CN223883620U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to an electrical measuring device. BACKGROUND
[0002] With the increasing demand for electronic devices, the quality of different parts in the electronic devices has become particularly important to the industry. Therefore, in addition to improving the manufacturing technology of the parts, the testing of the parts naturally becomes an important part that cannot be ignored.
[0003] For example, the industry generally uses electrical measuring devices to test the electrical performance of electronic parts. In the frequent testing process, how to improve the testing efficiency and reduce the testing cost is undoubtedly an important issue of great concern to the industry. SUMMARY
[0004] One of the purposes of the utility model is to provide an electrical measuring device that can be used in a flow line to improve operating efficiency and reduce operating costs.
[0005] According to an embodiment of the utility model, an electrical measuring device includes a host, a pair of conveying rails, and a first moving device. The conveying rails are movably arranged on the host and are configured to convey a test object. The first moving device is arranged on the host and is connected to the conveying rails. The first moving device is configured to move the conveying rails closer to or farther away from each other.
[0006] In one or more embodiments of the utility model, the host has a supporting surface. The electrical measuring device further includes a lower jig. The lower jig is arranged on the supporting surface and has a working surface configured to support the test object. The working surface has a first height relative to the supporting surface. The conveying rails have a second height relative to the supporting surface, and the second height is greater than the first height.
[0007] In one or more embodiments of the utility model, when the conveying rails are moved away from each other, the conveying rails have a first distance therebetween. The electrical measuring device further includes an upper jig. The upper jig is configured to move towards the lower jig to sandwich the test object therebetween. The upper jig has a width, and the first distance is greater than the width.
[0008] In one or more embodiments of the utility model, when the conveying rails are moved closer to each other, the conveying rails have a second distance therebetween, and the second distance is less than the width.
[0009] In one or more embodiments of the utility model, the electrical measuring device further includes a clamping device and a second moving device. The clamping device is configured to clamp the upper jig. The second moving device is connected to the host and the clamping device and is configured to move the clamping device relative to the host to move the clamping device closer to or farther away from the lower jig.
[0010] In one or more embodiments of the present application, the upper jig comprises a jig main body and a plurality of first buckling portions, and the first buckling portions are arranged on the jig main body. The clamping device comprises a device main body and a plurality of second buckling portions, and the second buckling portions are movably connected to the device main body and configured to buckle the first buckling portions.
[0011] In one or more embodiments of the present application, the upper jig and the lower jig are vacuum jigs.
[0012] In one or more embodiments of the present application, the electrical testing device further comprises at least one support portion. The support portion is arranged at least partially in the lower jig, and the support portion is configured to move relative to the lower jig to at least partially protrude from the working surface and support the test object.
[0013] In one or more embodiments of the present application, the conveying rails are configured to convey the test objects in a first direction, and the first moving device is configured to move the conveying rails towards or away from each other in a second direction perpendicular to the first direction.
[0014] In one or more embodiments of the present application, the support portion is configured to move relative to the lower jig in a third direction perpendicular to the first direction and the second direction.
[0015] In one or more embodiments of the present application, the first moving device is further configured to move the conveying rails towards or away from the lower jig.
[0016] The above-mentioned embodiments of the present application have at least the following advantages: the conveying rails can move in the second direction and the third direction, and the support portion can lift or lower the test object relative to the lower jig. Even if the upper jig and the lower jig are vacuum jigs, the electrical testing device can still be applied to the flow line to receive the test object from the previous working station and convey the test object to the next working station after the electronic test is completed. In this way, the operation efficiency of the electrical testing device can be effectively improved, and the operation cost of the electrical testing device can also be effectively reduced. BRIEF DESCRIPTION OF DRAWINGS
[0017] Figure 1 FIG. 1 is a front view of an electrical testing device according to an embodiment of the present application;
[0018] Figure 2 FIG. 2 is a front view of the electrical testing device of FIG. 1, in which the conveying rails are away from the lower jig; Figure 1
[0019] Figure 3 FIG. 4 is a front view of the electrical testing device of FIG. 1, in which the conveying rails are away from each other; Figure 2
[0020] Figure 4 For illustration Figure 3 A front view of the electrical testing equipment, wherein the upper fixture and the lower fixture clamp the object to be tested therein, and the support part moves relative to the lower fixture and is at least partially housed in the lower fixture;
[0021] Figure 5 For illustration Figure 4 A front view of the electrical testing equipment, in which the upper fixture is away from the lower fixture, while the support moves relative to the lower fixture to lift the object to be tested;
[0022] Figure 6 For illustration Figure 5 A front view of the electrical testing equipment, in which the conveyor rails are close together and support the object to be tested;
[0023] Figure 7 For illustration Figure 6 A front view of the electrical testing equipment, in which the conveyor rail is away from the lower fixture and the object to be tested is detached from the support;
[0024] Figure 8 For illustration Figure 1 A partially enlarged schematic diagram of the upper fixture and clamping device.
[0025] [Symbol Explanation]
[0026] 100: Electrical testing equipment
[0027] 110: Host
[0028] 110S: Supporting surface
[0029] 120: Conveyor rail
[0030] 130: First moving device
[0031] 140:Lower jig
[0032] 140S: Working surface
[0033] 150: Upper jig
[0034] 151: Jig body
[0035] 152: First buckle part
[0036] 160: Clamping device
[0037] 161: Main body of the device
[0038] 162: Second buckle part
[0039] 170: Second mobile device
[0040] 180: Support section
[0041] 200: Test Item
[0042] D1: First Direction
[0043] D2: Second Direction
[0044] D3: Third direction
[0045] H1: First Height
[0046] H2: Second Altitude
[0047] W: Width
[0048] X1: First distance
[0049] X2: Second distance Detailed Implementation
[0050] The following describes several embodiments of the present invention with reference to the accompanying drawings. For clarity, many practical details will be described in the following description. However, it should be understood that these practical details are not intended to limit the present invention. That is, in some embodiments of the present invention, these practical details are not essential. Furthermore, for the sake of simplicity, some conventional structures and elements will be shown in a simple schematic manner in the drawings, and in all drawings, the same reference numerals will be used to denote the same or similar elements. And, where feasible, features of different embodiments can be interchanged.
[0051] Unless otherwise defined, all terms used herein (including technical and scientific terms) have their ordinary meanings, meanings that are understandable to those skilled in the art. Furthermore, the definitions of the aforementioned terms in commonly used dictionaries should be interpreted in the context of this specification as having the meaning consistent with the relevant field of this invention. Unless specifically defined, these terms will not be construed as having idealized or overly formal meanings.
[0052] Please refer to Figure 1 . Figure 1 This is a front view diagram illustrating an electrical measuring device 100 according to an embodiment of the present invention. In this embodiment, as... Figure 1As shown, an electrical testing device 100 includes a main unit 110, a pair of transport rails 120, and a first moving device 130. The transport rails 120 are movably disposed on the main unit 110 and configured to transport a test object 200 along a first direction D1. For example, the transport rails 120 can receive the test object 200 from a previous workstation. The first moving device 130 is disposed on the main unit 110 and connected to the transport rails 120, and the first moving device 130 is configured to move the transport rails 120 closer together or further apart along a second direction D2, which is perpendicular to the first direction D1. For simplicity, the connection between the first moving device 130 and the transport rails 120 is shown only with dashed lines. When the transport rails 120 move closer together along the second direction D2, as... Figure 1 As shown, the conveyor rail 120 can support and convey the object to be tested 200 along the first direction D1.
[0053] In this embodiment, such as Figure 1 As shown, the electrical testing device 100 also includes an upper fixture 150 and a lower fixture 140. In practical applications, the upper fixture 150 and the lower fixture 140 are vacuum fixtures. Further, the main unit 110 has a support surface 110S, and the lower fixture 140 is disposed on the support surface 110S of the main unit 110, while the upper fixture 150 is located on the side of the lower fixture 140 away from the main unit 110. The lower fixture 140 has a working surface 140S, which is configured to support the object to be tested 200, and is substantially parallel to the support surface 110S of the main unit 110. The working surface 140S of the lower fixture 140 has a first height H1 relative to the support surface 110S of the main unit 110, while a second height H2 exists between the conveyor rail 120 and the support surface 110S. In this embodiment, the second height H2 is greater than the first height H1. In other words, the conveyor rail 120 is higher than the working surface 140S of the lower fixture 140.
[0054] Furthermore, in this embodiment, such as Figure 1 As shown, the electrical testing device 100 further includes a clamping device 160 and a second moving device 170. The clamping device 160 is configured to clamp the upper fixture 150. The second moving device 170 is connected to the host 110 and the clamping device 160, and is configured to move the clamping device 160 relative to the host 110 along a third direction D3, so that the clamping device 160 moves closer to or further away from the lower fixture 140. The third direction D3 is perpendicular to the first direction D1 and the second direction D2, and is substantially perpendicular to the support surface 110S of the host 110 and the working surface 140S of the lower fixture 140. More specifically, the upper fixture 150 is configured to move along the third direction D3 toward the lower fixture 140 to clamp the object to be tested 200 therein.
[0055] In practical applications, the upper fixture 150 has a width W in the second direction D2. When the conveyor rails 120 move closer together along the second direction D2 to support and convey the object to be measured 200 along the first direction D1, there is a second distance X2 between the conveyor rails 120, and this second distance X2 is less than the width W of the upper fixture 150. At this time, as... Figure 1 As shown, the conveyor rail 120 is located between the upper fixture 150 and the lower fixture 140.
[0056] Reference Figure 2 . Figure 2 For illustration Figure 1 A front view of the electrical testing equipment 100, wherein the conveyor rail 120 is close to the lower fixture 140, and the support portion 180 supports the object to be tested 200. In this embodiment, the first moving device 130 is further configured to move the conveyor rail 120 closer to or further away from the lower fixture 140 along a third direction D3. Figures 1-2 As shown, the electrical testing device 100 further includes at least one support portion 180. The support portion 180 is at least partially disposed within the lower fixture 140, and is configured to move relative to the lower fixture 140 along a third direction D3 to at least partially protrude from the working surface 140S. When the first moving device 130 moves the conveyor rail 120 closer to the lower fixture 140 along the third direction D3, as... Figure 2 As shown, the support portion 180 protruding from the working surface 140S can contact and support the object to be tested 200.
[0057] Please refer to Figure 3 . Figure 3 For illustration Figure 2 A front view of the electrical testing equipment 100, wherein the conveyor rails 120 are spaced far apart. In this embodiment, as... Figure 3 As shown, when the support portion 180 protruding from the working surface 140S supports the object to be tested 200, the conveyor rails 120 move away from each other along the second direction D2 and detach from the object to be tested 200.
[0058] Please refer to Figure 4 . Figure 4 For illustration Figure 3 A front view of the electrical testing device 100, wherein the upper fixture 150 and the lower fixture 140 clamp the object to be tested 200 therein, and the support portion 180 is movable relative to the lower fixture 140 and at least partially accommodated within the lower fixture 140. In this embodiment, as... Figure 4As shown, when the conveyor rails 120 move away from each other along the second direction D2, a first distance X1 exists between them. In this embodiment, the first distance X1 is greater than the width W of the upper fixture 150. That is, when the conveyor rails 120 move away from each other along the second direction D2, the upper fixture 150 can move toward the lower fixture 140, thereby clamping the object to be tested 200 between the upper fixture 150 and the lower fixture 140. At this time, the upper fixture 150 is at least partially located between the conveyor rails 120.
[0059] As described above, the support 180 is configured to move relative to the lower fixture 140 along the third direction D3. Before the upper fixture 150 moves toward the lower fixture 140 to clamp the object to be tested 200 therein, as... Figure 4 As shown, the support part 180 first moves at least partially along the third direction D3 into the interior of the lower fixture 140, so that the test object 200 can be stably placed on the working surface 140S of the lower fixture 140, so that the test object 200 can be properly clamped between the upper fixture 150 and the lower fixture 140 for subsequent electronic testing.
[0060] Please refer to Figure 5 . Figure 5 For illustration Figure 4 A front view of the electrical testing device 100, wherein the upper fixture 150 is moved away from the lower fixture 140, and the support 180 moves relative to the lower fixture 140 to lift the object to be tested 200. In this embodiment, as... Figure 5 As shown, after the electronic test on the test object 200 is completed, the upper fixture 150 moves upward along the third direction D3 to move away from the lower fixture 140. Subsequently, the support 180 moves relative to the lower fixture 140 along the third direction D3 to lift the test object 200, so that the test object 200 is moved away from the working surface 140S of the lower fixture 140. Additionally, the electrical testing equipment 100... Figure 5 The state in is essentially the same as Figure 3 The state in.
[0061] Please refer to Figure 6 . Figure 6 For illustration Figure 5 A front view of the electrical testing equipment 100, wherein the conveyor rails 120 are close together and support the object to be tested 200. In this embodiment, as... Figure 6 As shown, when the upper fixture 150 moves away from the lower fixture 140 and the support portion 180 moves relative to the lower fixture 140 to lift the object to be tested 200, the transport rails 120 move closer together along the second direction D2 to support the object to be tested 200. Additionally, the electrical testing device 100... Figure 6 The state in is essentially the same as Figure 2 The state in.
[0062] Please refer to Figure 7 . Figure 7For illustration Figure 6 A front view of the electrical testing equipment 100, wherein the conveyor rail 120 is moved away from the lower fixture 140 and the object to be tested 200 is detached from the support portion 180. In this embodiment, as... Figure 7 As shown, after the conveyor rails 120 move closer together along the second direction D2 to support the object under test 200, the first moving device 130 moves the conveyor rails 120 away from the lower fixture 140 along the third direction D3, and removes the object under test 200 from the support 180. At this time, the conveyor rails 120 can transport the object under test 200 to the next workstation. Additionally, the electrical testing equipment 100... Figure 7 The state in is essentially the same as Figure 1 The state in.
[0063] In simple terms, the conveyor rail 120 can move along the second direction D2 and the third direction D3, and the support 180 can lift or lower the test object 200 relative to the lower fixture 140. Even when the upper fixture 150 and the lower fixture 140 are vacuum fixtures, the electrical testing equipment 100 can still be used in a production line to receive the test object 200 from the previous workstation and transport it to the next workstation after electronic testing. In this way, the operating efficiency of the electrical testing equipment 100 can be effectively improved, and the operating cost of the electrical testing equipment 100 can also be effectively reduced.
[0064] Please refer to Figure 8 . Figure 8 For illustration Figure 1 A partially enlarged schematic diagram of the upper fixture 150 and the clamping device 160. In this embodiment, as... Figure 8 As shown, the upper fixture 150 includes a fixture body 151 and a plurality of first latching portions 152, the first latching portions 152 being disposed on the fixture body 151. The clamping device 160 includes a device body 161 and a plurality of second latching portions 162, the second latching portions 162 being movably connected to the device body 161 and configured to latch the first latching portions 152 of the upper fixture 150. Specifically, as... Figure 8 As shown, the second latching part 162, drawn in dashed lines, is in the position before moving and latching the first latching part 152, while the second latching part 162, drawn in solid lines, has moved relative to the main body 161 and latched the first latching part 152 of the upper fixture 150. For the sake of simplicity, the first latching part 152 of the upper fixture 150 and the second latching part 162 of the clamping device 160 are not shown in other figures.
[0065] In summary, the technical scheme disclosed by the above-mentioned embodiments of the utility model has at least the following advantages: the conveying rail can move in the second direction and the third direction, and the support part can lift or lower the to-be-tested object relative to the lower jig, even if the upper jig and the lower jig are vacuum jigs respectively, the electrical testing equipment can still be applied to the flow line to receive the to-be-tested object from the previous work station and convey the to-be-tested object to the next work station after the electronic testing is completed. In this way, the operation efficiency of the electrical testing equipment can be effectively improved, and the operation cost of the electrical testing equipment can also be effectively reduced.
[0066] Although the utility model has been disclosed as above with embodiments, it is not used to limit the utility model, and anyone skilled in the art can make various changes and decorations without departing from the spirit and scope of the utility model, so the protection scope of the utility model should be defined by the appended claims.
Claims
1. An electrical measuring device, characterized by The electronic measuring apparatus comprises: a main body; a pair of conveying rails movably arranged on the main body and configured to convey a test object; and a first moving device arranged on the main body and connected to the pair of conveying rails, the first moving device being configured to move the pair of conveying rails towards or away from each other.
2. The electrical measuring device of claim 1, wherein, The main body has a supporting surface, and the electronic measuring apparatus further comprises: a lower jig arranged on the supporting surface, the lower jig having a working surface configured to support the test object and having a first height relative to the supporting surface, the pair of conveying rails and the supporting surface having a second height therebetween, the second height being greater than the first height.
3. The electrical measuring device of claim 2, wherein, When the pair of conveying rails are away from each other, the pair of conveying rails have a first distance therebetween, and the electronic measuring apparatus further comprises: an upper jig configured to move towards the lower jig to sandwich the test object therebetween, the upper jig having a width, the first distance being greater than the width.
4. The electrical measuring device of claim 3, wherein, When the pair of conveying rails are towards each other, the pair of conveying rails have a second distance therebetween, the second distance being less than the width.
5. The electrical measuring device of claim 3, wherein, The electronic measuring apparatus further comprises: a clamping device configured to clamp the upper jig; and a second moving device connected to the main body and the clamping device and configured to move the clamping device relative to the main body to move the clamping device towards or away from the lower jig.
6. The electrical measuring device of claim 5, wherein, The upper jig comprises a jig body and a plurality of first clamping portions arranged on the jig body, and the clamping device comprises a device body and a plurality of second clamping portions movably connected to the device body and configured to clamp the plurality of first clamping portions.
7. The electrical measuring device of claim 3, wherein, The upper jig and the lower jig are vacuum jigs.
8. The electrical measuring device of claim 2, wherein, The electronic measuring apparatus further comprises: at least one supporting portion at least partially arranged in the lower jig, the supporting portion being configured to move relative to the lower jig to at least partially protrude from the working surface and support the test object.
9. The electrical measuring device of claim 8, wherein, The pair of conveying rails are configured to convey the test object in a first direction, and the first moving device is configured to move the pair of conveying rails towards or away from each other in a second direction perpendicular to the first direction.
10. The electrical measuring device of claim 9, wherein, The supporting portion is configured to move relative to the lower jig in a third direction perpendicular to the first direction and the second direction.
11. The electrical measuring device of claim 8, wherein, The first moving device is further configured to move the pair of conveying rails towards or away from the lower jig.