Vibration test bench for electronic component

Abstract

The utility model relates to the technical field of vibration test tables, and discloses a vibration test table for electronic components, which comprises a vibration table, a base and a rotating shaft. The dust collector is characterized by comprising a supporting assembly, a buffering assembly and a dust collecting assembly; the vibration table is arranged on the base, and the rotating shafts are arranged at the ends of the two sides of the vibration table. The supporting assembly is fixedly arranged at the end of one side of the base, the buffering assembly is arranged on the supporting assembly, and the dust collecting assembly is arranged on the base. The supporting assembly is arranged at the end of one side of the base, the telescopic rod of the supporting assembly is in sliding fit with the telescopic sleeve, and the driving motor is arranged, so that the supporting position can be flexibly adjusted; a buffering assembly on the supporting assembly can effectively buffer impact generated when a vibrator rotates by means of combination of a telescopic head, a second sleeve and a spring, the influence of vibration on the test bed is reduced, a dustproof plate in the dust collection assembly can block dust, a dust collection box slidably embedded below the dust collection assembly facilitates dust collection, the test bed is kept clean, and the service life of equipment is prolonged.

Description

TECHNICAL FIELD

[0001] The utility model relates to vibration test bench technical field, concretely is a kind of vibration test bench for electronic components. BACKGROUND

[0002] The patent document with the existing announcement number CN212931844U discloses an electronic component vibration test auxiliary device, including power box and vibration table, the vibration table is located above power box, the power box is connected between vibration table by position symmetrical telescopic pipe, the top rod is fixedly arranged in the center of vibration table lower side wall, the top rod is fixedly connected with top plate by penetrating power box upper side wall downwards, vibration driving device matched with top plate is arranged in power box, square block is fixedly arranged above vibration table, first fixed ear is symmetrically arranged on square block front side wall, base plate is arranged between first fixed ear, a plurality of evenly distributed components are arranged on base plate.The utility model effectively avoids the generation of the phenomenon that component is not fixed firm due to bolt loosening by twice positioning of bolt, without disassembling component when reversing vibration, improve the accuracy of result and realization efficiency.

[0003] But the above scheme and prior art, when vibrator rotates, some vibrators still have some deficiencies in the setting of buffer assembly, which may make the impact generated in the rotating process of vibrator cannot be effectively buffered and absorbed, thereby affecting test result, so it can be improved and optimized.

[0004] Therefore, the utility model provides a kind of vibration test bench for electronic components for solving the above problems. UTILITY MODEL CONTENT

[0005] The utility model aims at providing a kind of vibration test bench for electronic components to solve the problems raised in the above background.

[0006] To achieve the above object, the utility model provides the following technical scheme: a kind of vibration test bench for electronic components, including vibration table, pedestal, rotating shaft;Its characterized in that: including support assembly, buffer assembly, dust collection assembly;

[0007] The vibration table is arranged on the pedestal, and the rotating shaft is arranged on the both side ends of the vibration table.

[0008] The support assembly is fixedly arranged on one side end of the pedestal, the buffer assembly is arranged on the support assembly, and the dust collection assembly is arranged on the pedestal.

[0009] Preferably, one side end of the telescopic rod in the support assembly is slidingly embedded in the telescopic sleeve, and the other side end of the telescopic rod is fixedly provided with a driving motor.

[0010] Preferably, the first support plate in the support assembly is fixedly arranged at the other end of the telescopic rod, and the end of the first support plate is provided with a buffer pad.

[0011] Preferably, the telescopic head in the buffer assembly is slidingly connected with a second sleeve, and the second sleeve is uniformly and fixedly arranged in the buffer pad.

[0012] Preferably, the telescopic head in the buffer assembly is slidingly connected with a second sleeve, and the second sleeve is uniformly and fixedly arranged in the buffer pad.

[0013] Preferably, the dustproof plate in the dust collection assembly is fixedly arranged at the two side ends of the base, and the dustproof plate is provided with a dust collection box at the lower side, and the dust collection box is slidingly connected at the two side ends of the base.

[0014] Compared with the prior art, the utility model has the advantages that: the support assembly is arranged at one side end of the base, the telescopic rod and the telescopic sleeve are slidingly connected, and the driving motor can be used for flexibly adjusting the support position; the buffer assembly on the support assembly is combined with the telescopic head, the second sleeve and the spring, can effectively buffer the impact generated when the vibrator rotates, reduces the influence of vibration on the test bench, improves the accuracy of test results, the dustproof plate in the dust collection assembly can block dust, the dust collection box slidingly connected at the lower side can collect dust, keeps the test bench clean, prolongs the service life of the equipment, and improves the performance and practicality of the electronic component vibration test bench as a whole. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a whole structure schematic view of the utility model;

[0016] Figure 2 It is a positive side structure schematic view of the support assembly of the utility model;

[0017] Figure 3 It is an internal cut structure schematic view of the buffer assembly of the utility model;

[0018] Figure 4 It is a structure disassembly schematic view of the dust collection assembly of the utility model.

[0019] In the drawing: vibration table 1, base 2, rotating shaft 3, support assembly 4, buffer assembly 5, dust collection assembly 6, telescopic rod 401, telescopic sleeve 402, driving motor 403, first support plate 404, buffer pad 405, telescopic head 501, second sleeve 502, spring 503, dustproof plate 601, dust collection box 602. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical scheme of the utility model carry on clear, complete description, and the advantage is more clear and distinct, the following combining with the drawing to the utility model embodiment carries on further detailed description, should understand, the specific embodiment described here is the utility model a part of embodiment, rather than all the embodiment, only use to explain the utility model embodiment, and does not use to limit the utility model embodiment, the ordinary skill in the art of the person who obtains all other embodiments without doing the creative labor premise belongs to the utility model protection range, the following will be clear, complete description to the technical scheme in the utility model embodiment.

[0021] Embodiment one: please refer to Figures 1 to 2 A vibration test bench for electronic components, comprising a vibration table 1, a base 2, a rotating shaft 3, characterized in that it comprises a support assembly 4, a buffer assembly 5 and a dust collection assembly 6; the vibration table 1 is arranged on the base 2, and the rotating shaft 3 is arranged at the two side ends of the vibration table 1; the support assembly 4 is fixedly arranged at one side end of the base 2, the buffer assembly 5 is arranged on the support assembly 4, and the dust collection assembly 6 is arranged on the base 2.

[0022] One side end of the telescopic rod 401 in the support assembly 4 is slidingly embedded in the telescopic sleeve 402, and the other side end of the telescopic rod 401 is fixedly provided with a driving motor 403.

[0023] In use, before carrying out the vibration test of the electronic components, according to the requirements of the environment around the test bench and the support angle and position of the vibration table, the driving motor 403 is started, the driving motor 403 is operated, and the telescopic rod 401 is stably extended and retracted in the telescopic sleeve 402, for example, if the vibration table 1 needs to be finely adjusted to one side, the telescopic rod 401 is elongated or shortened, the position of the support assembly 4 is accurately adjusted, and the vibration table 1 is ensured to be in the best working state, thereby providing a stable support basis for subsequent tests.

[0024] Embodiment two: on the basis of embodiment one, please refer to Figures 2 to 3 The first support plate 404 in the support assembly 4 is fixedly arranged at the other side end of the telescopic rod 401, and the first support plate 404 is provided with a buffer pad 405 at the end.

[0025] The telescopic head 501 in the buffer assembly 5 is slidingly embedded with a second sleeve 502, and the second sleeve 502 is uniformly fixedly arranged inside the buffer pad 405.

[0026] In use, when the vibration table 1 rotates, the vibration table 1 is simply buffered under the action of the buffering assembly 5, the buffer pad 405 at the end of the first supporting plate 404 first buffers the vibration, when the performance test of the electronic components in the vibration environment is started, the vibration table 1 starts the vibration mode, at this time, the telescopic rod 401 in the buffering assembly 5 telescopes downward under the operation of the driving motor 403, preventing the buffer pad 405 from affecting the transverse vibration of the vibrator 1.

[0027] Embodiment three: on the basis of embodiment two, please refer to Figures 3 to 4 The telescopic head 501 in the buffering assembly 5 is sleeved with a spring 503 outside, one side end of the spring 503 is fixedly arranged on the telescopic head 501, and the other side end of the spring 503 is fixedly arranged on the second sleeve 503.

[0028] The dustproof plate 601 in the dust collecting assembly 6 is fixedly arranged at the two side ends of the base 2, the dust collecting box 602 is arranged at the lower side of the dustproof plate 601, and the dust collecting box 602 is slidingly embedded at the two side ends of the base 2.

[0029] In use, in the process of the rotation of the vibrator, the spring 503 reciprocally telescopes between the telescopic head 501 and the second sleeve 503 by virtue of the elasticity of the spring 503, continuously absorbs and consumes the energy brought by the rotation, greatly enhances the buffering effect, maintains the stable operation of the vibration table 1, and at the same time, the dust generated in the test process is blocked by the dustproof plate 601 at the two side ends of the base 2, the dust slides along the dustproof plate 601 and falls into the dust collecting box 602 below, the dust collecting box 602 is slidingly drawn out from the two side ends of the base 2 at regular time, the dust is cleaned, the test table is kept clean, and the service life of the equipment is prolonged.

[0030] Although the embodiments of the utility model have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to these embodiments without departing from the principles and spirits of the utility model, the range of the utility model is defined by the appended claims and its equivalents.

Claims

1. A vibration test bench for electronic components, comprising a vibration table (1), a base (2), and a rotating shaft (3); characterized in that: Includes support components (4), buffer components (5), and dust collection components (6); The vibration table (1) is mounted on the base (2), and the rotating shaft (3) is mounted on both ends of the vibration table (1); The support component (4) is fixedly installed on one side end of the base (2), the buffer component (5) is installed on the support component (4), and the dust collection component (6) is installed on the base (2).

2. The vibration test bench for electronic components according to claim 1, characterized in that: One end of the telescopic rod (401) in the support assembly (4) is slidably embedded in the telescopic sleeve (402), and a drive motor (403) is fixedly installed on the other end of the telescopic rod (401).

3. The vibration test bench for electronic components according to claim 2, characterized in that: The first support plate (404) in the support assembly (4) is fixedly installed at the other end of the telescopic rod (401), and a buffer pad (405) is provided at the end of the first support plate (404).

4. The vibration test bench for electronic components according to claim 1, characterized in that: The second sleeve (502) is slidably embedded in the telescopic head (501) of the buffer assembly (5), and the second sleeve (502) is uniformly and fixedly disposed inside the buffer pad (405).

5. The vibration test bench for electronic components according to claim 4, characterized in that: A spring (503) is sleeved on the outside of the telescopic head (501) in the buffer assembly (5). One end of the spring (503) is fixedly mounted on the telescopic head (501), and the other end of the spring (503) is fixedly mounted on the second sleeve (502).

6. The vibration test bench for electronic components according to claim 1, characterized in that: The dustproof plate (601) in the dust collection assembly (6) is fixedly installed at both ends of the base (2). A dust collection box (602) is provided on the lower side of the dustproof plate (601), and the dust collection box (602) is slidably embedded in both ends of the base (2).

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