Test fixture for chip-type three-terminal capacitive filter

Abstract

The utility model relates to a test fixture for a chip-type three-terminal capacitive filter, and the fixture is characterized in that a test bench is provided with a test seat, the test seat is provided with a product placement groove, the periphery of which is provided with a gap, and the periphery of the product placement groove is provided with a first test probe, a second test probe, a third test probe, and a fourth test probe; the first test probe, the second test probe and the third test probe can move synchronously through the connecting rod mechanism, so that when the chip-type three-terminal capacitive filter placed in the product placing groove is tested, the distance of the fourth test probe can be adjusted to adapt to the size of the product, and the product is positioned in one direction; the product can be simultaneously positioned and clamped in other three directions only by adjusting the first test probe; according to the embodiment of the invention, the operation method is simple, and the detection efficiency of the electrical performance detection of the chip-type three-terminal capacitive filter is improved.

Description

Technical Field

[0001] This application relates to the technical field of testing chip three-terminal capacitive filters, and in particular to a test fixture for chip three-terminal capacitive filters. Background Technology

[0002] The electrical performance testing of a capacitor involves performing a series of tests to evaluate its electrical performance and specifications. These tests provide a comprehensive assessment of the capacitor's performance and ensure its reliable and stable operation in practical applications.

[0003] Traditional capacitor electrical performance testing fixtures can only hold the two ends of the capacitor with jaws to test it. However, chip three-terminal capacitive filters have four test terminals, and traditional fixtures cannot test chip three-terminal capacitive filters. Therefore, a new testing fixture for chip three-terminal capacitive filters is needed. Utility Model Content

[0004] Therefore, it is necessary to provide a test fixture for chip three-terminal capacitive filters that can solve the above-mentioned technical problems.

[0005] The above-mentioned objective of this application is achieved through the following technical solution:

[0006] This application provides a test fixture for a chip-type three-terminal capacitive filter, comprising:

[0007] Test bench;

[0008] A test stand is provided on the test platform. The top of the test stand is provided with a product placement slot with notches around the perimeter. The product placement slot is used to place a chip-type three-terminal capacitive filter to be tested.

[0009] A first test probe, a second test probe, a third test probe, and a fourth test probe are disposed on the test table in a direction perpendicular to the four end faces of the product placement slot and are capable of moving back and forth aligned with the notch. The first test probe is opposite to the fourth test probe, and the fourth test probe is capable of moving back and forth.

[0010] A linkage mechanism is provided, which is connected to the first test probe, the second test probe, and the third test probe respectively. When the first test probe moves back and forth, the linkage mechanism synchronously drives the second test probe and the third test probe to move back and forth.

[0011] In one embodiment, the first test probe includes a downwardly extending first extension rod, the second test probe includes a downwardly extending second extension rod, and the third test probe includes a downwardly extending third extension rod.

[0012] The linkage mechanism is connected to the first extension rod, the second extension rod, and the third extension rod, respectively.

[0013] In one embodiment, the linkage mechanism includes a first link and a second link, wherein a first end of the first link and a first end of the second link are respectively slidably connected to the first extension rod, and the first extension rod drives the first link and the second link to move in the same direction as the moving direction of the first test probe;

[0014] The second end of the first connecting rod is provided with a first inclined groove extending in the direction from the first test probe to the second test probe, and the second extension rod is confined to move within the first inclined groove;

[0015] The second end of the second connecting rod is provided with a second inclined groove extending in the direction from the first test probe to the third test probe, and the second extension rod is confined to move within the second inclined groove.

[0016] In one embodiment, the first connecting rod and the second connecting rod are integrally formed, and a connecting hole is provided at the connection between the first connecting rod and the second connecting rod. The first extension rod passes through the connecting hole and is slidably connected to the first connecting rod and the second connecting rod.

[0017] The bottom of the first connecting rod and the test platform is provided with a first guide post, and the other is provided with a first guide groove extending in the same direction as the movement direction of the first test probe. The first guide post extends into the first guide groove.

[0018] The second connecting rod and the bottom of the test platform are provided with a second guide post, and the other is provided with a second guide groove extending in the same direction as the movement direction of the first test probe. The second guide post extends into the second guide groove.

[0019] In one embodiment, an inner cavity is formed below the test platform, and the first extension rod, the second extension rod, and the third extension rod all extend into the inner cavity, with the first connecting rod and the second connecting rod disposed within the inner cavity;

[0020] The test bench is provided with a first strip groove, a second strip groove, and a third strip groove; the first strip groove is for the first extension rod to pass through, and its extension direction is the same as the movement direction of the first test probe; the second strip groove is for the second extension rod to pass through, and its extension direction is the same as the movement direction of the second test probe; the third strip groove is for the third extension rod to pass through, and its extension direction is the same as the movement direction of the third test probe.

[0021] The inner cavity is further provided with a second limiting block and a third limiting block at the bottom of the test platform;

[0022] The second limiting block is located below the second test probe, and the first connecting rod extends between the second limiting block and the test stage; the second limiting block is provided with a sixth strip groove extending along the moving direction of the second test probe, the length of the sixth strip groove is less than that of the second strip groove, and the second extension rod extends into the sixth strip groove;

[0023] The third limiting block is located below the third test probe, and the second connecting rod extends between the third limiting block and the test stage; the third limiting block is provided with a seventh strip groove extending along the moving direction of the third test probe, the length of the seventh strip groove is less than that of the third strip groove, and the third extension rod extends into the seventh strip groove.

[0024] In one embodiment, the first test probe includes a first terminal extending downward through the first slot, the second test probe includes a second terminal extending downward through the second slot, the third test probe includes a third terminal extending downward through the third slot, and the fourth test probe includes a fourth terminal extending downward.

[0025] The test bench is also provided with a fourth slot through which the fourth terminal block passes, and the extension direction of the fourth slot is the same as the moving direction of the fourth test probe;

[0026] The inner cavity is further provided with a first limiting block at the bottom of the test stage, and the first limiting block is located below the first test probe;

[0027] The first limiting block is provided with a fifth strip groove that limits the forward movement of the first terminal.

[0028] In one embodiment, the test platform is further provided with a guide block, which has a first guide hole for the first test probe to pass through, a second guide hole for the second test probe to pass through, a third guide hole for the third test probe to pass through, and a fourth guide hole for the fourth test probe to pass through on its four sides.

[0029] In one embodiment, the guide block is integrally formed with the test seat, the guide block includes an outer peripheral protrusion and a middle recess, and the test seat is disposed in the recess.

[0030] In one embodiment, a first elastic element is disposed between the first test probe and the guide block, and the first elastic element applies a forward elastic force to the first test probe; a second elastic element is disposed between the second test probe and the guide block, and the second elastic element applies a forward elastic force to the second test probe; a third elastic element is disposed between the third test probe and the guide block, and the third elastic element applies a forward elastic force to the third test probe.

[0031] In one embodiment, a limiting component is also included;

[0032] The first test probe further includes a handle block; the limiting component limits the position of the handle block when the handle block moves the first test probe backward to a set position;

[0033] The fourth test probe includes a locking element for locking the position of the fourth test probe;

[0034] The test stand includes a base and four positioning blocks distributed in four quadrants on the base, with a notch forming the product placement slot between every two positioning blocks;

[0035] Each of the positioning blocks forms a clearance space facing the center of the top of the base, and each clearance space encloses and forms the product placement groove;

[0036] Each clearance space has a transitional chamfered surface at its top.

[0037] This application has the following beneficial effects:

[0038] The test fixture for the chip three-terminal capacitive filter in this application embodiment includes a test base on a test bench with a product placement slot formed by notches around its four sides. A first test probe, a second test probe, a third test probe, and a fourth test probe are arranged around the product placement slot. A linkage mechanism enables the first, second, and third test probes to move synchronously. This allows for unidirectional positioning of the chip three-terminal capacitive filter placed in the product placement slot by first adjusting the distance of the fourth test probe to accommodate the product size; then, adjusting the first test probe allows for positioning of the product in the other three directions. Simultaneous positioning and clamping; the operation method of this application embodiment is simple and improves the detection efficiency of electrical performance testing of chip three-terminal capacitive filters; this application embodiment sets a first inclined groove on the first connecting rod and a second inclined groove on the second connecting rod, and limits the movement distance of the second test probe and the third test probe through the cooperation between the inclined groove and the strip groove; this application also sets an elastic element so that after manually adjusting the position of the fourth test probe to position the chip three-terminal capacitive filter, after releasing the first test probe, the first test probe can drive the second test probe and the third test probe to cooperate with the fourth test probe to clamp the chip three-terminal capacitive filter product under test. Attached Figure Description

[0039] Figure 1 This is a schematic diagram of the overall structure of a test fixture for a chip three-terminal capacitive filter in an exemplary embodiment.

[0040] Figure 2 This is a schematic diagram of the structure above the test stand of the test fixture for a chip three-terminal capacitive filter in an exemplary embodiment.

[0041] Figure 3 This is a schematic diagram of the structure below the test stand of the test fixture for a chip three-terminal capacitive filter in an exemplary embodiment.

[0042] Figure 4 A schematic diagram of the structure of a test fixture for a chip three-terminal capacitive filter, including a protective cover, in an exemplary embodiment;

[0043] Figure 5 This is a schematic diagram of the linkage mechanism in an exemplary embodiment;

[0044] Figure 6 This is a schematic diagram of the structure of the guide block and test seat in an exemplary embodiment;

[0045] Figure 7 This is a schematic diagram of the structure of a test socket in an exemplary embodiment.

[0046] Explanation of icon numbers:

[0047] 100. Test fixture for chip three-terminal capacitive filters;

[0048] 10. Test stand; 111. First slot; 112. Second slot; 113. Third slot; 114. Fourth slot; 121. First limiting block; 121a. Fifth slot; 122. Second limiting block; 122a. Sixth slot; 123. Third limiting block; 123a. Seventh slot;

[0049] 20. Test seat; 21. Seat body; 22. Positioning block; 221. Clearance space; 222. Transition chamfered surface; 23. Product placement slot; 231. Notch;

[0050] 31. First test probe; 311. First extension rod; 312. First terminal block; 313. Handle block; 32. Second test probe; 321. Second extension rod; 322. Second terminal block; 33. Third test probe; 331. Third extension rod; 332. Third terminal block; 34. Fourth test probe; 341. Fourth terminal block; 342. Locking element;

[0051] 40. Linkage mechanism; 41. First link; 411. First inclined groove; 42. Second link; 421. Second inclined groove; 43. Connecting hole;

[0052] 51. First elastic element; 52. Second elastic element; 53. Third elastic element;

[0053] 60. Guide block; 61. First guide hole; 62. Second guide hole; 63. Third guide hole; 64. Fourth guide hole; 65. Protrusion; 66. Recess;

[0054] 70. Limiting component; 71. Limiting seat; 72. Operating part; 73. Moving block;

[0055] 81. Side plate; 82. Wiring hole; 83. Base plate;

[0056] 90. Protective cover. Detailed Implementation

[0057] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, a detailed description of specific embodiments of this application is provided below. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0058] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0059] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0060] This application provides a test fixture for a chip three-terminal capacitive filter, used to perform electrical performance tests on the chip three-terminal capacitive filter to evaluate its electrical performance and indicators. Depending on the different output terminal wiring methods and the connection of different external test devices, the specific contents of the electrical performance test may include CP (Capacitance) test, DF (Dissipation Factor) test, BDV (Breakdown Voltage) test, and IR (Insulation Resistance) test, etc.

[0061] like Figures 1-7 As shown, in one embodiment, the test fixture 100 of the chip three-terminal capacitor filter of this application includes a test platform 10, a test seat 20 is provided on the test platform 10, and a product placement slot 23 with notches 231 formed around the top of the test seat 20. The product placement slot 23 is square and is used to place the chip three-terminal capacitor filter product to be tested.

[0062] A first test probe 31, a second test probe 32, a third test probe 33, and a fourth test probe 34 are provided in the directions perpendicular to the four end faces of the product placement slot 23, i.e., the four end faces of the three-terminal capacitive filter under test. The four test probes are aligned with the four notches 231 from four directions and can move back and forth towards the notches they are aligned with in a direction perpendicular to the end face of the product placement slot 23, thus moving closer to or away from the product placement slot 23. In this embodiment, the first test probe 31 and the fourth test probe 34 are arranged opposite each other, and the second test probe 32 and the third test probe 33 are arranged opposite each other.

[0063] like Figure 3As shown, in this embodiment, a linkage mechanism 40 is also provided. The linkage mechanism 40 is connected to the first test probe 31, the second test probe 32, and the third test probe 33 respectively. When the first test probe 31 moves back and forth, the linkage mechanism 40 synchronously drives the second test probe 32 and the third test probe 33 to move back and forth, so that the first test probe 31, the second test probe 32, and the third test probe 33 can synchronously approach or move away from the product placement slot 23. In this embodiment, the fourth test probe can move back and forth independently.

[0064] The test fixture for the chip three-terminal capacitive filter in this application embodiment features a test base on a test bench with a product placement slot formed by notches around its four sides. A first test probe, a second test probe, a third test probe, and a fourth test probe are positioned around the product placement slot. A linkage mechanism enables the first, second, and third test probes to move synchronously. This allows for unidirectional positioning of the chip three-terminal capacitive filter placed in the product placement slot by first adjusting the distance of the fourth test probe to accommodate the product size; then, adjusting the first test probe allows for simultaneous positioning and clamping of the product in the other three directions. This embodiment offers a simple operation method and improves the efficiency of testing the electrical performance of chip three-terminal capacitive filters.

[0065] In one specific embodiment, such as Figure 2 and Figure 3 As shown, the first test probe 31 includes a downwardly extending first extension rod 311, the second test probe 32 includes a downwardly extending second extension rod 321, and the third test probe 33 includes a downwardly extending third extension rod 331. The linkage mechanism 40 is connected to the first extension rod 311, the second extension rod 321, and the third extension rod 331 respectively. When the first extension rod 311 moves back and forth with the first test probe 31, the linkage mechanism 40 drives the second extension rod 321 and the third extension rod 331 to move back and forth, thereby driving the second test probe 32 and the third test probe 33 to move back and forth.

[0066] Preferred, such as Figure 3 , Figure 4 and Figure 5As shown, the linkage mechanism 40 includes a first link 41 and a second link 42. The first end of the first link 41 and the first end of the second link 42 are slidably connected to the first extension rod 311, respectively. The first extension rod 311 drives the first link 41 and the second link 42 to move back and forth in the same direction as the movement direction of the first test probe 31. The second end of the first link 41 is provided with a first inclined groove 411 extending in the direction from the first test probe 31 to the second test probe 32, and the second extension rod 32 is confined within the first inclined groove 411. The second end of the second link 42 is provided with a second inclined groove 421 extending in the direction from the first test probe 31 to the third test probe 33, and the second extension rod 321 is confined within the second inclined groove 421.

[0067] In this embodiment, when the first test probe 31 moves toward the product placement slot 23, it drives the first connecting rod 41 and the second connecting rod 42 to move forward in the same direction. Since the second test probe 32 and the third test probe 33 are limited to moving only forward and backward toward the product placement slot 23 in their direction of movement, under the respective action of the first inclined groove 411 and the second inclined groove 421, the second test probe 32 and the third test probe 33 move together toward the product placement slot 23. Conversely, when the first test probe 31 moves away from the product placement slot 23, under the respective action of the first inclined groove 411 and the second inclined groove 421, the second test probe 32 and the third test probe 33 move together toward the direction away from the product placement slot 23.

[0068] Preferred, such as Figure 3 and Figure 4 As shown, the first connecting rod 41 and the second connecting rod 42 are integrally formed. A connecting hole 43 is provided at the connection between the first connecting rod 41 and the second connecting rod 42. The first extension rod 311 passes through the connecting hole 43 and is slidably connected to the first connecting rod 41 and the second connecting rod 42.

[0069] To facilitate the installation of the linkage assembly 40, such as Figures 1-5 As shown, a base plate 83 is provided below the test platform 10. The test platform 10 and the base plate 83 are enclosed by four side plates 81 to form a square inner cavity. The first extension rod 311, the second extension rod 321, and the third extension rod 331 all extend into the inner cavity. The first connecting rod 41 and the second connecting rod 42 are located in the inner cavity.

[0070] In this embodiment, the test bench 10 is provided with a first strip groove 111, a second strip groove 112 and a third strip groove 113; the first strip groove 111 is for the first extension rod 311 to pass through, and its extension direction is the same as the movement direction of the first test probe 31; the second strip groove 112 is for the second extension rod 321 to pass through, and its extension direction is the same as the movement direction of the second test probe 32; the third strip groove 113 is for the third extension rod 331 to pass through, and its extension direction is the same as the movement direction of the third test probe 33.

[0071] To guide the movement of the first link 41 and the second link 42, such as Figure 3 and Figure 4 As shown, in one embodiment, the first connecting rod 41 is provided with a first guide groove 412, and the bottom of the test platform 10 is provided with a first guide post (not shown) extending into the first guide groove 412. The extension direction of the first guide groove 412 is the same as the movement direction of the first test probe 31, and it is used to guide the movement direction of the first connecting rod 41. The second connecting rod 42 is provided with a second guide groove 422, and the bottom of the test platform 10 is provided with a second guide post (not shown) extending into the second guide groove 422. The extension direction of the second guide groove 422 is the same as the movement direction of the first test probe 31, and it is used to guide the movement direction of the second connecting rod 42.

[0072] In other embodiments, the test bench 10 may be provided with a first guide groove 412 and a second guide groove 422, a first guide post may be provided on the first connecting rod 41, and a second guide post may be provided on the second connecting rod 42.

[0073] In another implementation of guiding and limiting the first link 41 and the second link 42, such as Figure 3 As shown, a second limiting block 122 and a third limiting block 123 are also provided at the bottom of the test bench 10.

[0074] The second limiting block 122 is located below the second test probe 32, and the first connecting rod 41 extends between the second limiting block 122 and the test stage 10. The second limiting block is provided with a sixth strip groove 122a extending along the moving direction of the second test probe 32. The length of the sixth strip groove 122a is less than that of the second strip groove 112, and the second extension rod 321 extends into the sixth strip groove 122a.

[0075] The third limiting block 123 is located below the third test probe 33, and the second connecting rod 42 extends between the third limiting block 123 and the test stage 10. The third limiting block 123 is provided with a seventh strip groove 123a extending along the moving direction of the third test probe 33. The length of the seventh strip groove 123a is less than that of the third strip groove 113, and the third extension rod 331 extends into the seventh strip groove 123a.

[0076] In this embodiment, by setting the second limiting block 122 and the third limiting block 123, not only can the positions of the first connecting rod 41 and the second connecting rod 42 be limited, but at the same time, the sixth strip groove 122a can work with the first inclined groove 411 to limit the moving distance of the second test probe 32, and the seventh strip groove 123a can work with the second inclined groove 421 to limit the moving distance of the third test probe 33.

[0077] In a preferred embodiment, to facilitate the connection of each test probe to external testing equipment, such as... Figure 2 and Figure 3 As shown, the first test probe 31 includes a first terminal 312 extending downward through the first strip groove 111, the second test probe 32 includes a second terminal 322 extending downward through the second strip groove 112, the third test probe 33 includes a third terminal 332 extending downward through the third strip groove 113, and the fourth test probe 34 includes a fourth terminal 341 extending downward.

[0078] The test bench 10 is also provided with a fourth strip groove 114 through which the fourth terminal 341 passes, and the extension direction of the fourth strip groove 114 is the same as the movement direction of the fourth test probe 34.

[0079] like Figure 4 As shown, a wiring hole 82 is also provided on the side plate 81. A wiring terminal can be provided on the wiring hole 82. Specifically, there can be two or four wiring holes. The wiring terminal is connected to the first terminal 312, the second terminal 322, the third terminal 332 and the fourth terminal 341 respectively through the cable in the inner cavity, so as to connect to the external electrodes of the chip three-terminal capacitive filter under test through each test probe.

[0080] In a preferred embodiment, such as Figure 3 As shown, a first limiting block 121 is also provided at the bottom of the test stage 10 inside the cavity. The first limiting block 121 is located below the first test probe 31. The first limiting block 121 is provided with a fifth strip groove 121a that limits the forward movement of the first terminal 312. Preferably, the fifth strip groove 121a has an opening that faces away from the product placement groove 23.

[0081] like Figure 1 , Figure 2 and Figure 6 As shown, the test stage 10 is also provided with a guide block 60. The guide block 60 has a first guide hole 61 for the first test probe 31 to pass through, a second guide hole 62 for the second test probe 32 to pass through, a third guide hole 63 for the third test probe 33 to pass through, and a fourth guide hole 64 for the fourth test probe 34 to pass through, respectively, formed around its perimeter. In this embodiment, the guide block 60 can be integrally set or can be divided into four sub-guide blocks.

[0082] In a preferred embodiment, the guide block 60 and the test seat 20 are integrally formed. The guide block 60 includes a protrusion 65 on the outer periphery and a recess 66 in the middle. The test seat 20 is disposed in the recess 66.

[0083] To achieve better clamping of the chip three-terminal capacitor filter, such as Figure 1-3 As shown, a first elastic element 51 is provided between the first test probe 31 and the guide block 60, and the first elastic element 51 applies an elastic force to the first test probe 31 to move towards the product placement groove 23; a second elastic element 52 is provided between the second test probe 32 and the guide block 60, and the second elastic element 52 applies an elastic force to the second test probe 32 to move towards the product placement groove 23; a third elastic element 53 is provided between the third test probe 33 and the guide block 60, and the third elastic element 53 applies an elastic force to the third test probe 33 to move towards the product placement groove 23.

[0084] Preferably, the first elastic element 51, the second elastic element 52 and the third elastic element 53 are all springs, and they are all in a stretched state.

[0085] For ease of operation, in one embodiment, such as Figure 1 , 2 As shown in Figure 4, the test fixture 100 for the chip three-terminal capacitive filter also includes a limiting component 70; the first test probe 31 also includes a handle block 313; the limiting component 70 limits the position of the handle block 313 when the handle block 313 drives the first test probe 31 to move backward to a set position.

[0086] In this embodiment, because the first elastic member 51 applies an elastic force to the first test probe 31 to move towards the product placement slot 23, after the first test probe 31 is pulled back, the limiting component 70 can keep the first test probe 31 in a set position, and at the same time keep the second test probe 32 and the third test probe 33 at a certain distance from the product placement slot 23, which facilitates the placement of the chip three-terminal capacitor filter into the product placement slot 23. Specifically, as shown... Figure 2 and Figure 4 As shown, the limiting component 70 includes a limiting seat 71 installed on the test bench 10. The limiting seat 71 is provided with an operating part 72 and a moving block 73 connected to each other. When the handle block 313 moves backward to the set position, the operating part 72 drives the moving block 73 to move to the position that blocks the handle block 313 from moving forward, thereby blocking the first test probe 313 from moving forward. After the operating part 72 drives the moving block 73 to reset, the first test probe 313 is released, allowing it to move forward toward the product placement slot 23.

[0087] In a preferred embodiment, such as Figure 1 , Figure 2 and Figure 4 As shown, the fourth test probe 34 includes a locking member 342, which is used to lock the position of the fourth test probe 34 after the fourth test probe 34 has completed unidirectional positioning of the product.

[0088] Specifically, such as Figure 4 As shown, the test bench 10 is also equipped with a protective cover 90, which covers the guide block 60 and the first elastic element 51, the second elastic element 52 and the third elastic element 53. The locking element 342 preferably passes through the protective cover 90 to lock the fourth test probe 34. The locking element is preferably a bolt, and the protective cover 90 is provided with a corresponding threaded hole.

[0089] like Figure 6 As shown, in one embodiment, the test stand 20 includes a stand body 21 and four positioning blocks 22 distributed in four quadrants on the stand body 21. A notch 231 is formed between every two positioning blocks 22 to form a product placement slot 23. Each positioning block 22 forms a clearance space 221 at the position facing the center of the top of the stand body 21. Each clearance space 221 encloses and forms a product placement slot 23.

[0090] Preferably, to facilitate the placement of the chip three-terminal capacitor filter into the product placement slot 23, each clearance slot 221 has a transition chamfered surface 222 on its top to facilitate product placement.

[0091] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0092] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims, and the specification can be used to interpret the content of the claims.

Claims

1. A test fixture for a chip-type three-terminal capacitive filter, characterized in that, include: Test bench; A test stand is provided on the test platform. The top of the test stand is provided with a product placement slot with notches around the perimeter. The product placement slot is used to place a chip-type three-terminal capacitive filter to be tested. A first test probe, a second test probe, a third test probe, and a fourth test probe are disposed on the test table in a direction perpendicular to the four end faces of the product placement slot and are capable of moving back and forth aligned with the notch. The first test probe is opposite to the fourth test probe, and the fourth test probe is capable of moving back and forth. A linkage mechanism is provided, which is connected to the first test probe, the second test probe, and the third test probe respectively. When the first test probe moves back and forth, the linkage mechanism synchronously drives the second test probe and the third test probe to move back and forth.

2. The test fixture for the chip three-terminal capacitor filter according to claim 1, characterized in that: The first test probe includes a first extension rod extending downward, the second test probe includes a second extension rod extending downward, and the third test probe includes a third extension rod extending downward. The linkage mechanism is connected to the first extension rod, the second extension rod, and the third extension rod, respectively.

3. The test fixture for the chip three-terminal capacitor filter according to claim 2, characterized in that: The linkage mechanism includes a first link and a second link. The first end of the first link and the first end of the second link are respectively slidably connected to the first extension rod. The first extension rod drives the first link and the second link to move in the same direction as the moving direction of the first test probe. The second end of the first connecting rod is provided with a first inclined groove extending in the direction from the first test probe to the second test probe, and the second extension rod is confined to move within the first inclined groove; The second end of the second connecting rod is provided with a second inclined groove extending in the direction from the first test probe to the third test probe, and the second extension rod is confined to move within the second inclined groove.

4. The test fixture for the chip three-terminal capacitor filter according to claim 3, characterized in that: The first connecting rod and the second connecting rod are integrally formed, and a connecting hole is provided at the connection between the first connecting rod and the second connecting rod. The first extension rod passes through the connecting hole and is slidably connected to the first connecting rod and the second connecting rod. The bottom of the first connecting rod and the test platform is provided with a first guide post, and the other is provided with a first guide groove extending in the same direction as the moving direction of the first test probe. The first guide post extends into the first guide groove. The second connecting rod and the bottom of the test platform are provided with a second guide post, and the other is provided with a second guide groove extending in the same direction as the movement direction of the first test probe. The second guide post extends into the second guide groove.

5. The test fixture for the chip three-terminal capacitor filter according to claim 3, characterized in that: The test platform is enclosed to form an inner cavity, and the first extension rod, the second extension rod, and the third extension rod all extend into the inner cavity. The first connecting rod and the second connecting rod are disposed in the inner cavity. The test bench is provided with a first strip groove, a second strip groove, and a third strip groove; the first strip groove is for the first extension rod to pass through, and its extension direction is the same as the movement direction of the first test probe; the second strip groove is for the second extension rod to pass through, and its extension direction is the same as the movement direction of the second test probe; the third strip groove is for the third extension rod to pass through, and its extension direction is the same as the movement direction of the third test probe. The inner cavity is further provided with a second limiting block and a third limiting block at the bottom of the test platform; The second limiting block is located below the second test probe, and the first connecting rod extends between the second limiting block and the test stage; the second limiting block is provided with a sixth strip groove extending along the moving direction of the second test probe, the length of the sixth strip groove is less than that of the second strip groove, and the second extension rod extends into the sixth strip groove; The third limiting block is located below the third test probe, and the second connecting rod extends between the third limiting block and the test stage; the third limiting block is provided with a seventh strip groove extending along the moving direction of the third test probe, the length of the seventh strip groove is less than that of the third strip groove, and the third extension rod extends into the seventh strip groove.

6. The test fixture for the chip three-terminal capacitor filter according to claim 5, characterized in that: The first test probe includes a first terminal extending downward through the first slot; the second test probe includes a second terminal extending downward through the second slot; the third test probe includes a third terminal extending downward through the third slot; and the fourth test probe includes a fourth terminal extending downward. The test bench is also provided with a fourth slot through which the fourth terminal block passes, and the extension direction of the fourth slot is the same as the moving direction of the fourth test probe; The inner cavity is further provided with a first limiting block at the bottom of the test stage, and the first limiting block is located below the first test probe; The first limiting block is provided with a fifth strip groove that limits the forward movement of the first terminal.

7. The test fixture for the chip three-terminal capacitive filter according to any one of claims 1-6, characterized in that: The test platform is also provided with a guide block, which has a first guide hole for the first test probe to pass through, a second guide hole for the second test probe to pass through, a third guide hole for the third test probe to pass through, and a fourth guide hole for the fourth test probe to pass through on its four sides.

8. The test fixture for the chip three-terminal capacitor filter according to claim 7, characterized in that: The guide block is integrally formed with the test seat. The guide block includes a protruding part on the outer periphery and a recessed part in the middle. The test seat is disposed in the recessed part.

9. The test fixture for the chip three-terminal capacitor filter according to claim 7, characterized in that: A first elastic element is disposed between the first test probe and the guide block, and the first elastic element applies an elastic force to the first test probe to move forward; a second elastic element is disposed between the second test probe and the guide block, and the second elastic element applies an elastic force to the second test probe to move forward; a third elastic element is disposed between the third test probe and the guide block, and the third elastic element applies an elastic force to the third test probe to move forward.

10. The test fixture for the chip three-terminal capacitive filter according to claim 9, characterized in that: It also includes limit components; The first test probe further includes a handle block; the limiting component limits the position of the handle block when the handle block moves the first test probe backward to a set position; The fourth test probe includes a locking element for locking the position of the fourth test probe; The test stand includes a base and four positioning blocks distributed in four quadrants on the base, with a notch forming the product placement slot between every two positioning blocks; Each of the positioning blocks forms a clearance space facing the center of the top of the base, and each clearance space encloses and forms the product placement groove; Each clearance space has a transitional chamfered surface at its top.

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