Testing device for photo-thermal photoelectric integrator

Abstract

The utility model relates to the field of photo-thermal photoelectric integrator testing, and provides a photo-thermal photoelectric integrator testing device. The photo-thermal photoelectric integrator testing device comprises an enthalpy difference chamber, an air processing assembly, a wind speed adjusting assembly, an illumination adjusting assembly and a to-be-tested integrator are arranged in the enthalpy difference chamber, and the wind speed adjusting assembly and the illumination adjusting assembly are arranged between the first side of the to-be-tested integrator and the air processing assembly; the photoelectric test assembly is electrically connected to the second side of the to-be-tested integrator so as to detect the photoelectric performance of the to-be-tested integrator; and the photo-thermal testing assembly is in fluid communication with the second side of the to-be-tested integrator so as to detect the photo-thermal performance of the to-be-tested integrator. According to the photo-thermal and photoelectric integrator testing device, the photo-thermal performance and the photoelectric performance of the to-be-tested integrator are synchronously and rapidly tested, the testing period is greatly shortened, the testing efficiency is improved, and the research, development and production progress of the integrator can be accelerated.

Description

Technical Field

[0001] This utility model relates to the field of testing photothermal and optoelectronic integrated circuits, and provides a testing device for photothermal and optoelectronic integrated circuits. Background Technology

[0002] Solar thermal-photovoltaic integrated circuits are a new type of sustainable energy technology that can simultaneously capture photovoltaic energy and utilize thermal energy. This integrated structure can improve the conversion efficiency of photovoltaic modules, while also providing industrial heating or domestic hot water for other applications.

[0003] Currently, performance testing of solar thermal and photovoltaic integrators mainly focuses on two aspects: photothermal performance and photoelectric performance. However, due to limitations in existing testing methods, it is impossible to simultaneously test both photoelectric and photothermal performance, thus affecting the evaluation and optimization of the integrator's overall performance. Utility Model Content

[0004] This utility model provides a testing device for photothermal-photoelectric integrated circuits to solve the defect in related technologies that cannot simultaneously detect the photothermal and photoelectric performance of photothermal-photoelectric integrated circuits.

[0005] This utility model embodiment provides a testing device for photothermal and optoelectronic integrated circuits, including:

[0006] An enthalpy difference chamber is provided with an air handling component, a wind speed adjustment component, a light adjustment component, and a test unit. The wind speed adjustment component and the light adjustment component are disposed between the first side of the test unit and the air handling component.

[0007] An optoelectronic testing component, which is electrically connected to the second side of the integrator under test (IUT) to detect the optoelectronic performance of the IUT;

[0008] A photothermal testing assembly, which is fluidly connected to a second side of the integrator under test (IUT) to detect the photothermal performance of the IUT.

[0009] According to one embodiment of the present invention, the photoelectric testing component includes a current detection element and an adjustable resistor box connected in series, and a voltage detection element is connected in parallel between the current detection element and the adjustable resistor box.

[0010] According to one embodiment of the present invention, a junction box is provided on the second side of the integrated circuit under test, and the test circuit formed by the current detection element and the adjustable resistor box is electrically connected to the junction box.

[0011] According to one embodiment of the present invention, the photothermal testing component includes:

[0012] The insulated water tank is in fluid communication with the integrated circuit under test through an inlet pipe and an outlet pipe. The insulated water tank is equipped with a heating element. The inlet pipe is equipped with a first pressure acquisition element and a first temperature acquisition element. The outlet pipe is equipped with a second pressure acquisition element and a second temperature acquisition element.

[0013] A refrigeration unit is fluidly connected to the insulated water tank to adjust the water temperature in the insulated water tank.

[0014] According to one embodiment of the present invention, a pump body, a regulating valve and a flow meter are sequentially arranged on the water inlet pipe from the insulated water tank toward the integrated device under test.

[0015] According to one embodiment of the present invention, the insulated water tank is provided with a drain valve.

[0016] According to one embodiment of the present invention, an inlet pressure acquisition port is provided on the inlet pipe, and an outlet pressure acquisition port is provided on the outlet pipe. The inlet pressure acquisition port and the outlet pressure acquisition port are connected to a differential pressure sensor through a pressure pipe.

[0017] According to one embodiment of the present invention, at least three sets of third temperature acquisition elements are provided on the second side of the integrator under test along the height direction and / or width direction.

[0018] According to one embodiment of the present invention, the enthalpy difference chamber is provided with a temperature and humidity acquisition device, a wind speed acquisition device, and a radiation meter. The temperature and humidity acquisition device is disposed between the light adjustment component and the integrator under test. The wind speed acquisition device is disposed perpendicular to the air outlet direction of the wind speed adjustment component. The radiation meter is disposed parallel to the irradiation direction of the light adjustment component.

[0019] According to one embodiment of the present invention, the inner wall of the enthalpy difference chamber and / or the outer wall of the enthalpy difference chamber are covered with a heat insulation layer.

[0020] According to the photothermal and photoelectric integrator testing device provided in this embodiment, the device can simultaneously test the photoelectric and photothermal performance of the integrator under test, thereby achieving a comprehensive evaluation of the integrator's performance. This helps to more accurately understand the overall performance of the integrator, providing strong support for subsequent improvements and optimizations. By precisely controlling the environmental conditions (such as temperature, humidity, wind speed, and light intensity) within the enthalpy difference chamber, and using high-precision photoelectric and photothermal testing components, this invention ensures the accuracy of the test results. This helps to avoid the influence of the external environment on the test results, improving the reliability of the test. Since the air handling components, wind speed adjustment components, and light intensity adjustment components within the enthalpy difference chamber can all be adjusted as needed, the testing device provided by this invention has high flexibility. This allows testers to customize test plans according to different test requirements and environmental conditions, thereby improving the relevance and practicality of the test. By integrating the photoelectric and photothermal testing components together, this invention achieves rapid testing of the integrator's performance. This greatly shortens the test cycle, improves test efficiency, and helps to accelerate the research and development and production progress of the integrator. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0022] Figure 1 This is a schematic structural diagram of the photothermal and optoelectronic integrated test device provided by this utility model.

[0023] Figure label:

[0024] 100. Enthalpy difference chamber; 102. Air handling unit; 104. Fan speed regulation unit; 106. Light regulation unit; 108. Test unit; 110. Current detection device; 112. Adjustable resistance box; 114. Voltage detection device; 116. Junction box; 118. Insulated water tank; 120. Inlet water pipe; 122. Outlet water pipe; 124. Heating element; 126. First pressure acquisition device; 128. First temperature acquisition device; 130. Second pressure acquisition device; 132. Second temperature acquisition device; 134. Refrigeration unit; 136. Pump body; 138. Flow meter; 140. Regulating valve; 142. Third temperature acquisition device; 144. Temperature and humidity acquisition device; 146. Fan speed acquisition device; 148. Radiation meter; 150. Drain valve; 152. Inlet pressure acquisition port; 154. Outlet pressure acquisition port. Detailed Implementation

[0025] The embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and should not be construed as limiting the scope of this utility model.

[0026] like Figure 1 As shown, this utility model embodiment provides a testing device for photothermal and optoelectronic integrated circuits, comprising:

[0027] An enthalpy difference chamber 100 is provided with an air handling component 102, a wind speed adjustment component 104, a light adjustment component 106, and a test integrator 108. The wind speed adjustment component 104 and the light adjustment component 106 are located between the first side of the test integrator 108 and the air handling component 102.

[0028] The photoelectric test assembly is electrically connected to the second side of the integrated circuit under test 108 to detect the photoelectric performance of the integrated circuit under test 108.

[0029] A photothermal testing assembly is fluidly connected to the second side of the integrator under test 108 to detect the photothermal performance of the integrator under test 108.

[0030] According to the photothermal and photoelectric integrator testing device provided in this embodiment of the present invention, the testing device can simultaneously test the photoelectric and photothermal performance of the integrator 108 under test, thereby achieving a comprehensive evaluation of the integrator's performance. This helps to more accurately understand the overall performance of the integrator and provides strong support for subsequent improvement and optimization. By precisely controlling the environmental conditions (such as temperature, humidity, wind speed, and light intensity) within the enthalpy difference chamber 100, and using high-precision photoelectric and photothermal testing components, the present invention can ensure the accuracy of the test results. This helps to avoid the influence of the external environment on the test results and improves the reliability of the test. Since the air handling component 102, wind speed adjustment component 104, and light adjustment component 106 within the enthalpy difference chamber 100 can all be adjusted as needed, the testing device provided by the present invention has high flexibility. This allows testers to customize test plans according to different test requirements and environmental conditions, thereby improving the relevance and practicality of the test. By integrating the photoelectric and photothermal testing components together, the present invention achieves rapid testing of the integrator's performance. This significantly shortens the testing cycle, improves testing efficiency, and helps accelerate the research and development and production of integrators.

[0031] Please continue reading Figure 1 The photothermal-photovoltaic integrated circuit testing device provided in this embodiment is mainly used for comprehensive performance testing of photothermal-photovoltaic integrated circuits that integrate photothermal and photoelectric conversion functions. This testing device consists of several key components, forming a highly efficient and accurate testing system.

[0032] The enthalpy difference chamber 100 is the core environmental control component of the entire testing apparatus. It is equipped with an air handling unit 102 to regulate parameters such as air temperature and humidity within the chamber, simulating different external environmental conditions. Furthermore, the enthalpy difference chamber 100 also houses a wind speed regulation unit 104 and a light intensity regulation unit 106, positioned between the first side of the integrator under test 108 and the air handling unit 102. The wind speed regulation unit 104 adjusts the wind speed passing through the integrator under test 108, while the light intensity regulation unit 106 simulates different lighting conditions, thereby comprehensively evaluating the performance of the integrator under test 108 under various environmental conditions.

[0033] The optoelectronic testing component is electrically connected to the second side of the integrator under test 108 and is used to test the optoelectronic performance of the integrator under test 108. Through this component, the electrical energy output generated by the integrator under illumination conditions, as well as key optoelectronic performance indicators such as conversion efficiency, can be accurately measured.

[0034] The photothermal testing assembly is fluidly connected to the second side of the integrator under test 108 and is used to test the photothermal performance of the integrator 108. Through this assembly, the heat output generated by the integrator under illumination conditions, as well as key photothermal performance indicators such as heat conversion efficiency, can be measured. The fluid-connected design allows for efficient heat transfer and measurement, ensuring the accuracy of the test.

[0035] According to one embodiment of the present invention, the photoelectric testing assembly includes a current detection element 110 and an adjustable resistance box 112 connected in series, and a voltage detection element 114 is connected in parallel between the current detection element 110 and the adjustable resistance box 112.

[0036] In this embodiment of the invention, a specific design is provided for the photoelectric testing component. In this embodiment, the photoelectric testing component mainly consists of three key components: a current sensing element 110, an adjustable resistance box 112, and a voltage sensing element 114. These three components are connected in a specific manner to form a test circuit capable of accurately measuring the photoelectric performance of the integrated circuit under test 108.

[0037] The current sensing element 110 is a component used to measure the magnitude of current in a circuit. In the photoelectric test assembly, the current sensing element 110 is connected in series in the circuit and can detect the current output generated by the integrated circuit under test 108 in real time under illumination.

[0038] The adjustable resistor box 112 is a component whose resistance value can be adjusted. In the optoelectronic testing assembly, the adjustable resistor box 112 is connected in series with the current sensing element 110. By adjusting the resistance value, the current in the circuit can be changed, thereby enabling the testing of the integrated circuit performance under different lighting conditions. In addition, the adjustable resistor box 112 can also be used to calibrate the test circuit to ensure the accuracy of the test results.

[0039] A voltage sensor 114 is connected in parallel between a current sensor 110 and an adjustable resistor box 112 to measure the voltage in the circuit. By measuring the voltage, the optoelectronic performance of the integrated circuit under test 108 can be further understood, such as voltage output and conversion efficiency.

[0040] By connecting the current sensor 110 and the adjustable resistor box 112 in series, and the voltage sensor 114 in parallel, the photoelectric testing assembly provided by this invention can accurately measure the current and voltage output of the integrated circuit under test 108 under illumination conditions. This helps to more accurately evaluate the photoelectric performance of the integrated circuit and improve the accuracy of the test. The design of the adjustable resistor box 112 makes the photoelectric testing assembly highly flexible. Testers can adjust the resistance value as needed to adapt to different test requirements and environmental conditions. This helps to expand the test range and improve the relevance and practicality of the test. By simultaneously measuring the current and voltage output, the photoelectric testing assembly provided by this invention can more comprehensively evaluate the photoelectric performance of the integrated circuit under test 108. This helps to gain a deeper understanding of the performance characteristics of the integrated circuit and provides strong support for subsequent improvements and optimizations. The adjustable resistor box 112 can also be used to calibrate the test circuit to ensure the accuracy of the test results. This helps to avoid the influence of test errors on the evaluation results and improve the reliability of the test.

[0041] According to one embodiment of the present invention, a junction box 116 is provided on the second side of the integrated circuit under test, and a test circuit formed by the current detection element 110 and the adjustable resistor box 112 is electrically connected to the junction box 116.

[0042] In this embodiment of the invention, a junction box 116 is specially designed for the second side of the integrator under test 108. The function of this junction box 116 is to provide a convenient and reliable connection point for the current sensing element 110 and the adjustable resistor box 112 (which together constitute the test circuit). Through the junction box 116, the test circuit can be easily electrically connected to the integrator under test 108, thereby performing photoelectric performance testing.

[0043] Specifically, junction box 116 is installed on the second side of the integrator under test 108. Its internal design includes appropriate electrical interfaces and wiring to ensure accurate connection of the current sensing element 110 and the adjustable resistor box 112 to the integrator under test 108. During testing, the tester simply connects the current sensing element 110 and the adjustable resistor box 112 to the junction box 116 via wires to form a complete test circuit.

[0044] Furthermore, the design of junction box 116 also takes safety and ease of use into account. It incorporates features to protect against electric shock and short circuits, ensuring no electrical accidents occur during testing. At the same time, the interface design of junction box 116 is intuitive and easy to use, allowing testers to quickly complete connection procedures.

[0045] By designing junction box 116, the test circuit can be easily connected to the integrator under test (IUT) 108, greatly simplifying the testing process. This helps improve testing efficiency and shorten the testing cycle. Junction box 116 incorporates a design to prevent electric shock and short circuits, ensuring that no electrical accidents occur during testing. This helps protect the safety of test personnel and reduces testing risks. The design of junction box 116 ensures that the current sensing element 110 and the adjustable resistor box 112 can be accurately connected to the IUT 108. This helps reduce testing errors and improve testing accuracy. The design of junction box 116 also considers future maintenance and upgrade needs. Through simple disassembly and replacement, test personnel can easily maintain and upgrade junction box 116 to adapt to different testing needs and environmental conditions.

[0046] According to one embodiment of the present invention, the photothermal testing assembly includes:

[0047] The insulated water tank 118 is fluidly connected to the integrated circuit under test 108 through the inlet pipe 120 and the outlet pipe 122. The insulated water tank 118 is equipped with a heating element 124. The inlet pipe 120 is equipped with a first pressure acquisition element 126 and a first temperature acquisition element 128. The outlet pipe 122 is equipped with a second pressure acquisition element 130 and a second temperature acquisition element 132.

[0048] The refrigeration unit 134 is in fluid communication with the insulated water tank 118 to adjust the water temperature in the insulated water tank 118.

[0049] In this embodiment of the invention, the photothermal testing assembly is designed to accurately measure the photothermal performance of the integrated circuit under test 108. The assembly mainly includes key components such as an insulated water tank 118, an inlet pipe 120, an outlet pipe 122, a heating element 124, a first pressure acquisition element 126, a first temperature acquisition element 128, a second pressure acquisition element 130, a second temperature acquisition element 132, and a refrigeration unit 134.

[0050] The insulated water tank 118 is the core component of the entire photothermal testing assembly, used to store and regulate the water temperature. It is fluidly connected to the integrator under test 108 via inlet pipe 120 and outlet pipe 122, forming a closed water circulation system. The insulation performance of the insulated water tank 118 ensures stable water temperature, thereby improving the accuracy of the test.

[0051] The inlet pipe 120 and outlet pipe 122 are connected to the insulated water tank 118 and the integrated device under test 108, respectively, realizing the circulation of water. A first pressure sensor 126 and a first temperature sensor 128 are installed on the inlet pipe 120 to monitor the pressure and temperature of the water entering the integrated device under test 108 in real time. Similarly, a second pressure sensor 130 and a second temperature sensor 132 are installed on the outlet pipe 122 to monitor the pressure and temperature of the water flowing out of the integrated device under test 108.

[0052] Heating element 124 is installed in insulated water tank 118 to regulate water temperature. By operating heating element 124, different external ambient temperature conditions can be simulated, thereby comprehensively evaluating the photothermal performance of the integrated circuit under test 108 at different temperatures.

[0053] The first pressure acquisition element 126, the first temperature acquisition element 128, the second pressure acquisition element 130, and the second temperature acquisition element 132 are used to monitor the pressure and temperature of the water body in real time. The data from these acquisition elements will be used to analyze the photothermal performance of the integrated circuit under test 108, such as heat conversion efficiency and heat loss.

[0054] The refrigeration unit 134 is in fluid communication with the insulated water tank 118 and is used to lower the temperature of the water in the insulated water tank 118. The operation of the refrigeration unit 134 can further broaden the temperature range of the test, making the test more comprehensive and accurate.

[0055] Through the coordinated operation of the insulated water tank 118, inlet pipe 120, outlet pipe 122, and pressure and temperature acquisition components, this invention can monitor the pressure and temperature of the water in real time, thereby ensuring the accuracy of the test. Simultaneously, the insulation performance of the insulated water tank 118 reduces the influence of the external environment on the test results. The heating element 124 and the refrigeration unit 134 enable this invention to simulate different external environmental temperature conditions, thereby comprehensively evaluating the photothermal performance of the integrator 108 under test at different temperatures. This helps to gain a deeper understanding of the integrator's performance characteristics, providing strong support for subsequent improvements and optimizations. The photothermal testing component of this invention is rationally designed, compact in structure, and easy to operate and maintain. Testers can easily complete connection, setup, and monitoring work, thereby improving testing efficiency. The photothermal testing component of this invention also has a certain degree of scalability. By adding additional sensors or adjusting the parameters of existing components, the testing functions and scope can be further expanded to meet different testing needs and environmental conditions.

[0056] According to one embodiment of the present invention, a pump body 136, a regulating valve 140 and a flow meter 138 are sequentially arranged on the water inlet pipe 120 from the insulated water tank 118 toward the integrated circuit under test 108.

[0057] In this embodiment of the invention, a specific design was implemented on the water inlet pipe 120 to further optimize the performance of the photothermal testing component and improve the accuracy of the test. Specifically, a pump body 136, a regulating valve 140, and a flow meter 138 are sequentially installed on the water inlet pipe 120 from the insulated water tank 118 toward the integrator under test 108.

[0058] Pump body 136 is installed at the beginning of the inlet pipe 120, near the insulated water tank 118. Its main function is to provide power to draw water from the insulated water tank 118 and deliver it to the integrator under test 108 through the inlet pipe 120. The selection and setting of pump body 136 ensures that the water can flow stably and continuously, thereby guaranteeing the continuity and accuracy of the test.

[0059] The regulating valve 140 is installed after the pump body 136, close to the integrator under test 108. Its main function is to regulate the flow rate and pressure of the water entering the integrator under test 108. By adjusting the regulating valve 140, different flow rate and pressure conditions can be simulated, thereby comprehensively evaluating the photothermal performance of the integrator under test 108 under different operating conditions.

[0060] A flow meter 138 is installed after the regulating valve 140 to monitor and record the flow rate of water passing through the inlet pipe 120 in real time. Data from the flow meter 138 can be used to understand the photothermal performance of the integrator 108 under different flow conditions, which is of great significance for evaluating the integrator's performance characteristics and optimizing its design.

[0061] The sequential arrangement of these components ensures that water can be stably and accurately delivered to the integrator 108 under test, and through precise monitoring and adjustment, a comprehensive evaluation of the integrator's performance under different operating conditions is achieved.

[0062] Through the coordinated operation of pump body 136, flow meter 138, and regulating valve 140, this invention can precisely control the flow rate and pressure of water entering the integrator 108 under test, thereby improving the accuracy of the test. This helps to more accurately evaluate the photothermal performance of the integrator and reduce test errors. The setting of regulating valve 140 allows this invention to simulate different flow and pressure conditions, thereby enhancing the flexibility of the test. Testers can adjust the opening of regulating valve 140 as needed to adapt to different test requirements and environmental conditions. The selection and setting of pump body 136 ensures that the water can flow stably and continuously, thereby optimizing the test process. This helps to improve test efficiency, shorten the test cycle, and reduce test costs. The photothermal test assembly of this invention is reasonably designed, compact in structure, and easy to operate and maintain. Testers can easily complete the connection, setup, and monitoring work, thereby improving the convenience and practicality of the test.

[0063] According to one embodiment of the present invention, a drain valve 150 is provided on the insulated water tank 118.

[0064] In this embodiment of the invention, a drain valve 150 is added to the bottom or a suitable location of the insulated water tank 118. The drain valve 150 can be manual or automatic, depending on specific needs. The manual drain valve 150 is typically opened or closed by an operator by rotating a handle to drain water from the insulated water tank 118; while the automatic drain valve 150 can automatically open or close according to preset conditions (such as water level, time, etc.), improving the convenience and intelligence of operation.

[0065] With the addition of drain valve 150, operators can easily control the drainage process of the insulated water tank 118 without resorting to complex methods (such as disassembling components of the insulated water tank 118) as in traditional methods, thus greatly improving drainage efficiency. The addition of drain valve 150 also simplifies maintenance of the insulated water tank 118. Operators can quickly empty the water from the insulated water tank 118 by opening drain valve 150, facilitating subsequent maintenance.

[0066] According to one embodiment of the present invention, an inlet pressure acquisition port 152 is provided on the inlet pipe 120, and an outlet pressure acquisition port 154 is provided on the outlet pipe 122. The inlet pressure acquisition port 152 and the outlet pressure acquisition port 154 are connected to a differential pressure sensor through a pressure pipe.

[0067] In this embodiment of the utility model, an inlet pressure acquisition port 152 is provided on the inlet pipe 120, and an outlet pressure acquisition port 154 is provided on the outlet pipe 122. These two acquisition ports are connected to a differential pressure sensor through a pressure pipe.

[0068] The inlet pressure sampling port 152 is located at an appropriate position in the inlet water pipe 120 to collect the fluid pressure in the inlet water pipe 120. This sampling port is usually designed to be flush with the inner wall of the pipe to reduce resistance during fluid flow and to ensure that the collected pressure data is accurate and reliable.

[0069] The outlet pressure sampling port 154 is located at an appropriate position in the outlet water pipe 122 to collect the fluid pressure in the outlet water pipe 122. Similar to the inlet pressure sampling port 152, this sampling port is also designed to be flush with the inner wall of the pipe to ensure that the collected pressure data is accurate and reliable.

[0070] The pressure tube is used to connect the inlet pressure acquisition port 152 and the outlet pressure acquisition port 154 to the differential pressure sensor. The pressure tube should have good sealing and corrosion resistance to ensure that the fluid does not leak and to prevent internal corrosion of the pipeline from affecting the accuracy of the pressure data.

[0071] The differential pressure sensor is used to measure the pressure difference between the inlet pressure acquisition port 152 and the outlet pressure acquisition port 154. This sensor should possess high sensitivity, high accuracy, and good stability to ensure the accuracy and reliability of the measurement results.

[0072] The fluid pressure changes in the inlet and outlet water pipes 120 and 122 can be monitored in real time via the inlet pressure sensor 152 and outlet pressure sensor 154. This helps to promptly detect abnormalities in the pipelines, such as blockages or leaks, allowing for appropriate corrective measures. Monitoring pressure changes in the inlet and outlet water pipes 120 and 122 also enables the timely detection of potential safety hazards in the system. For example, an abnormally high pressure may indicate a blockage or leak in the pipeline, allowing for timely intervention to prevent accidents and improve system safety.

[0073] According to one embodiment of the present invention, at least three sets of third temperature acquisition elements 142 are provided on the second side of the integrator 108 along the height direction and / or width direction of the integrator 108 under test.

[0074] In this embodiment of the invention, the temperature monitoring of the integrator 108 under test is designed with greater precision. Specifically, at least three sets of third temperature acquisition elements 142 are provided on the second side of the integrator 108 along its height and / or width directions.

[0075] These third temperature acquisition elements 142 are evenly or systematically distributed on the second side of the integrator 108 under test, for real-time monitoring and recording of the temperature distribution of the integrator at different locations and under different operating conditions. By collecting this temperature data, a more comprehensive understanding of the thermal performance of the integrator 108 under test can be obtained, including the uniformity of temperature distribution, heat loss, and heat conversion efficiency.

[0076] Furthermore, the number and location of the third temperature acquisition elements 142 can be flexibly adjusted according to actual testing needs and the size of the integrator. For example, for larger integrators or those requiring higher precision temperature monitoring, the number or density of the third temperature acquisition elements 142 can be increased.

[0077] By arranging multiple sets of third temperature acquisition elements 142 along the height and / or width direction of the integrator 108 under test, this invention can more accurately monitor and record the temperature distribution of the integrator at different locations and under different operating conditions. This helps to more accurately evaluate the thermal performance of the integrator and reduce temperature monitoring errors. The arrangement of multiple sets of third temperature acquisition elements 142 allows this invention to obtain more information about the thermal performance of the integrator 108 under test, including the uniformity of temperature distribution, heat loss, and heat conversion efficiency. This helps to gain a more comprehensive understanding of the integrator's performance characteristics and provides strong support for subsequent improvements and optimizations. The number and location of the third temperature acquisition elements 142 can be flexibly adjusted according to actual testing needs and the size of the integrator. This allows this invention to adapt to the testing needs of integrators of different sizes and types, improving the flexibility and adaptability of the test. Through precise temperature monitoring and comprehensive thermal performance evaluation, this invention can more quickly identify problems and potential performance improvement points in the integrator. This helps to optimize the testing process, reduce unnecessary testing steps and time waste, thereby improving testing efficiency.

[0078] According to one embodiment of the present invention, a temperature and humidity acquisition device 144, a wind speed acquisition device 146, and a radiation meter 148 are provided in the enthalpy difference chamber 100. The temperature and humidity acquisition device 144 is disposed between the light adjustment component 106 and the integrated circuit under test 108. The wind speed acquisition device 146 is disposed perpendicular to the air outlet direction of the wind speed adjustment component 104. The radiation meter 148 is disposed parallel to the irradiation direction of the light adjustment component 106.

[0079] In this embodiment of the invention, a specific design was implemented within the enthalpy difference chamber 100 to more accurately simulate and control the test environment and to more comprehensively monitor the performance of the integrated circuit under test 108. Specifically, the enthalpy difference chamber 100 is equipped with a temperature and humidity sensor 144, a wind speed sensor 146, and a radiation meter 148.

[0080] A temperature and humidity sensor 144 is positioned between the illumination conditioning component 106 and the integrator under test 108. Its main function is to monitor and record the temperature and humidity in this critical area in real time to assess the thermal effects of the interaction between illumination and the integrator. Data from the temperature and humidity sensor 144 allows for a more accurate understanding of the integrator's temperature and humidity response under specific illumination conditions, which is crucial for evaluating the integrator's photothermal conversion efficiency and thermal stability.

[0081] The wind speed acquisition unit 146 is positioned perpendicular to the airflow direction of the wind speed regulation component 104. Its main function is to monitor and record the wind speed within the enthalpy difference chamber 100 in real time to assess the impact of wind speed on the integrator's performance. By adjusting the parameters of the wind speed regulation component 104, different wind speed conditions can be simulated, thereby comprehensively evaluating the integrator's performance under different wind speeds. The data from the wind speed acquisition unit 146 will be used to analyze key indicators of the integrator, such as its heat dissipation performance and wind resistance characteristics.

[0082] The radiometer 148 is positioned parallel to the illumination direction of the illumination adjustment assembly 106. Its main function is to monitor and record the radiation intensity emitted by the illumination adjustment assembly 106 in real time to ensure the accuracy and stability of the illumination conditions during testing. The data from the radiometer 148 will be used to calibrate the illumination adjustment assembly 106 to ensure the consistency and repeatability of the testing environment.

[0083] The placement and location of these components ensure accurate simulation and control of the test environment within the enthalpy difference chamber 100, as well as comprehensive monitoring of the performance of the integrator under test 108.

[0084] By coordinating the temperature and humidity sensor 144, the wind speed sensor 146, and the radiation meter 148, this invention can more accurately simulate and control the test environment within the enthalpy difference chamber 100. This helps reduce test errors and improves the accuracy and reliability of the test. The data from the temperature and humidity sensor 144, the wind speed sensor 146, and the radiation meter 148 will be used to comprehensively evaluate the performance of the integrator under test 108, including key indicators such as photothermal conversion efficiency, thermal stability, heat dissipation performance, and wind resistance characteristics. This helps to gain a deeper understanding of the integrator's performance characteristics and provides strong support for subsequent improvements and optimizations. By adjusting the parameters of the illumination adjustment component 106 and the wind speed adjustment component 104, as well as the position and number of the temperature and humidity sensor 144, the wind speed sensor 146, and the radiation meter 148, this invention can adapt to the testing needs of integrators of different sizes and types, improving the flexibility and adaptability of the test. Accurate environmental simulation and comprehensive performance monitoring help to identify problems and potential performance improvement points of the integrator more quickly. This helps to optimize the test process, reduce unnecessary test steps and time waste, thereby improving test efficiency.

[0085] According to one embodiment of the present invention, the inner wall of the enthalpy difference chamber 100 and / or the outer wall of the enthalpy difference chamber 100 are covered with a heat insulation layer.

[0086] In this embodiment of the invention, the insulation layer material should be selected to have good thermal insulation performance in order to effectively reduce the heat exchange inside and outside the enthalpy difference chamber 100 and improve the stability and accuracy of the test environment.

[0087] The insulation layer material can be high-performance insulation materials such as rigid polyurethane, rock wool, and glass wool. These materials have excellent thermal insulation properties and can effectively reduce the heat transfer rate inside and outside the enthalpy difference chamber, thereby maintaining the stability of the test environment.

[0088] The insulation layer can be applied to the inner and / or outer walls of the enthalpy difference chamber 100, and the specific structural form can be designed according to actual needs. For example, the insulation layer can be designed as a multi-layer structure to increase the insulation effect; it can also be designed as a structure with an air layer to further improve the insulation effect by utilizing the thermal insulation performance of the air layer.

[0089] By applying an insulation layer to the inner and / or outer walls of the enthalpy difference chamber 100, heat exchange between the inside and outside of the chamber can be effectively reduced, thereby maintaining the stability and accuracy of the testing environment. The presence of the insulation layer can effectively reduce the energy consumption of the enthalpy difference chamber 100. Because the insulation layer can reduce heat transfer, the electrical energy or other energy consumed by the enthalpy difference chamber 100 in maintaining a stable testing environment can be reduced.

[0090] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A testing device for photothermal-photoelectric integrated circuits, characterized in that, include: An enthalpy difference chamber (100) is provided with an air handling component (102), a wind speed adjustment component (104), a light adjustment component (106), and a test integrator (108). The wind speed adjustment component (104) and the light adjustment component (106) are disposed between the first side of the test integrator (108) and the air handling component (102). A photoelectric testing component is electrically connected to the second side of the integrator under test (108) to detect the photoelectric performance of the integrator under test (108); A photothermal testing assembly is fluidly connected to the second side of the integrator under test (108) to detect the photothermal performance of the integrator under test (108).

2. The photothermal-photoelectric integrated circuit testing device according to claim 1, characterized in that, The photoelectric testing assembly includes a current detection element (110) and an adjustable resistance box (112) connected in series, and a voltage detection element (114) is connected in parallel between the current detection element (110) and the adjustable resistance box (112).

3. The photothermal-photoelectric integrated circuit testing device according to claim 2, characterized in that, A junction box (116) is provided on the second side of the integrated circuit under test (108), and the test circuit formed by the current detection element (110) and the adjustable resistor box (112) is electrically connected to the junction box (116).

4. The photothermal-photoelectric integrated circuit testing device according to claim 1, characterized in that, The photothermal testing component includes: A thermal water tank (118) is fluidly connected to the integrated circuit under test (108) through an inlet pipe (120) and an outlet pipe (122). A heating element (124) is provided in the thermal water tank (118). A first pressure acquisition element (126) and a first temperature acquisition element (128) are provided on the inlet pipe (120). A second pressure acquisition element (130) and a second temperature acquisition element (132) are provided on the outlet pipe (122). A refrigeration unit (134) is fluidly connected to the insulated water tank (118) to adjust the water temperature in the insulated water tank (118).

5. The photothermal-photoelectric integrated circuit testing device according to claim 4, characterized in that, From the insulated water tank (118) toward the integrator under test (108), the water inlet pipe (120) is sequentially equipped with a pump body (136), a regulating valve (140) and a flow meter (138).

6. The photothermal-photoelectric integrated circuit testing device according to claim 4, characterized in that, The insulated water tank (118) is equipped with a drain valve (150).

7. The photothermal-photoelectric integrated circuit testing device according to claim 4, characterized in that, The inlet pipe (120) is provided with an inlet pressure acquisition port (152), and the outlet pipe (122) is provided with an outlet pressure acquisition port (154). The inlet pressure acquisition port (152) and the outlet pressure acquisition port (154) are connected to the differential pressure sensor through a pressure pipe.

8. The photothermal-photoelectric integrated circuit testing device according to any one of claims 1 to 7, characterized in that, At least three sets of third temperature acquisition elements (142) are provided on the second side of the integrator under test (108) along the height direction and / or width direction.

9. The testing apparatus for photothermal and optoelectronic integrated circuits according to any one of claims 1 to 7, characterized in that, The enthalpy difference chamber (100) is equipped with a temperature and humidity acquisition device (144), a wind speed acquisition device (146), and a radiation meter (148). The temperature and humidity acquisition device (144) is located between the light adjustment component (106) and the integrated circuit under test (108). The wind speed acquisition device (146) is set perpendicular to the air outlet direction of the wind speed adjustment component (104). The radiation meter (148) is set parallel to the irradiation direction of the light adjustment component (106).

10. The photothermal-photoelectric integrated circuit testing device according to any one of claims 1 to 7, characterized in that, The inner wall of the enthalpy difference chamber (100) and / or the outer wall of the enthalpy difference chamber (100) are covered with a heat insulation layer.

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