Clamp for chip testing

The chip test fixture, designed with a linkage of transmission components, solves the problems of low efficiency and insufficient positioning accuracy of manual operation in existing technologies, achieving fast and accurate chip positioning and stable contact, thus improving testing efficiency and reliability.

CN223903753UActive Publication Date: 2026-02-13JIANGXI SARUI SEMICON TECH CO LTD
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Patent Information

Application Number
CN202520411791.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-11
Publication Date
2026-02-13
Estimated Expiration
2035-03-11

AI Technical Summary

Technical Problem

Existing chip testing fixtures rely on frequent manual manipulation of the clamping blocks for clamping and fixing, which is inefficient, increases production costs, and causes wear on the connection between the clamping blocks and the placement slots over time, affecting chip positioning accuracy and testing reliability.

Method used

A fixture comprising a base and a cover plate was designed. The transmission component enables efficient linkage between the rotating shaft and the limiting rod. The operator only needs to manually rotate the cover plate to achieve rapid chip positioning. The meshing transmission of gears, racks and pinions drives the limiting rod to slide in the guide groove to achieve precise positioning. The flattening component ensures stable contact between the chip and the test contact.

Benefits of technology

It improves the efficiency and reliability of chip testing, reduces manual operation steps, lowers time costs, and enhances the accuracy of chip positioning and testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a chip test fixture, which comprises a base and a cover plate rotationally connected with the base through a rotating shaft, the top surface of the base is provided with a placement groove for placing a chip, the bottom of the placement groove is provided with a plurality of guide grooves, and the plurality of guide grooves are radially distributed by taking the center of the placement groove as an original point. A limiting rod is slidably arranged in the guide groove in a penetrating manner; a transmission assembly is arranged on the bottom face of the base, the limiting rod is in linkage with the rotating shaft through the transmission assembly, the transmission assembly comprises a gear, a rack meshed with the gear, a gear ring meshed with the end, away from the gear, of the rack and a rotating disc coaxially connected with the gear ring, the gear and the rotating shaft are coaxially fixed, and the middle of the rotating disc is rotationally connected with the base. A plurality of arc-shaped sliding grooves extending in the radial direction are formed in the rotary disc, and the ends of the limiting rods are in sliding fit with the arc-shaped sliding grooves. Linkage between the rotating shaft and the limiting rod is achieved by arranging the transmission assembly, the chip can be rapidly limited by the limiting rod only by rotating the cover plate, and frequent manual operation of the clamp is not needed.
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Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of chip test fixture, especially relates to a chip test fixture. BACKGROUND

[0002] As the core component in electronic equipment, the performance of chip directly influences the running performance of equipment, in order to ensure the reliable stability of chip performance, it is necessary to test the performance of chip in the chip production process, and in the testing process, in order to ensure the accurate connection of test equipment and chip pin, the chip needs to be positioned and fixed by the aid of fixture.

[0003] The existing chip test fixture generally includes base and the cover plate rotationally connected with one side of the base, the base is provided with the placing groove for placing the chip, a plurality of clamping blocks are arranged in the placing groove, the plurality of clamping blocks are combined to form a clamping space, the size of the clamping space is changed by manually frequently poking the clamping block, so as to realize the clamping and fixing of the chip in the placing groove, or the chip is taken out from the placing groove after the test is completed. However, the operation mode of clamping and fixing the chip by manually poking the clamping block is inefficient, in the large-scale chip testing scene, a large amount of time is consumed, the production cost is significantly increased, and long-term frequent poking can cause the abrasion of the connecting part of the clamping block and the placing groove, so that the positioning accuracy of the clamping block to the chip is reduced, and the reliability of chip testing is affected. SUMMARY

[0004] Therefore, the utility model aims at providing a chip test fixture, which aims at solving the technical problems that the operation mode of clamping and fixing the chip by manually frequently poking the clamping block in the existing chip test fixture is inefficient, a large amount of time is consumed in the large-scale chip testing scene, the production cost is significantly increased, long-term frequent poking can cause the abrasion of the connecting part of the clamping block and the placing groove, the positioning accuracy of the clamping block to the chip is reduced, and the reliability of chip testing is affected.

[0005] The utility model discloses a chip test fixture, which comprises a base and a cover plate rotationally connected with the base through a rotating shaft, the top surface of the base is provided with a placing groove for placing the chip, the bottom of the placing groove is provided with a plurality of guide grooves, the plurality of guide grooves are distributed radially with the center of the placing groove as the origin, and a limiting rod is slidably arranged in the guide groove.

[0006] The bottom surface of the base is provided with a transmission assembly, the limiting rod is linked with the rotating shaft through the transmission assembly, the transmission assembly comprises a gear, a rack meshing with the gear, a gear ring meshing with one end of the rack away from the gear, and a rotating disc coaxially connected with the gear ring, the gear is coaxially fixed with the rotating shaft, the middle part of the rotating disc is rotationally connected with the base, a plurality of radially extending arc-shaped sliding grooves are arranged on the rotating disc, and the end of the limiting rod is in sliding fit with the arc-shaped sliding grooves.

[0007] Compared with the prior art, the chip testing clamp has the beneficial effects that: the efficient linkage between the rotating shaft and the limiting rod is realized through the transmission assembly, the operator only needs to manually rotate the cover plate to realize the rapid limiting of the chip, manual frequent operation of the clamp is not needed, and the time cost is effectively reduced.

[0008] In addition, the chip testing clamp according to the utility model has the following additional technical features:

[0009] Further, the rack comprises a first rack section, a connecting rod section connected with the first rack section, and a second rack section connected with the connecting rod section, the first rack section is meshed with the gear, and the second rack section is meshed with the gear ring.

[0010] Further, the transmission assembly further comprises a guide block, the guide block is fixedly arranged on the bottom surface of the base, a guide channel is arranged in the guide block, the guide channel is arranged along the movement direction of the rack, and the guide channel is matched with the connecting rod section.

[0011] Further, one side middle part of the cover plate is fixedly connected with the middle part of the rotating shaft, both ends of one side of the base are provided with connecting blocks, and both ends of the rotating shaft are rotationally connected with the connecting blocks.

[0012] Further, the base and the cover plate are respectively provided with avoiding grooves, the avoiding grooves are used for accommodating the outer edge of the gear, and the depth of the avoiding grooves is greater than the addendum height of the gear.

[0013] Further, the cover plate is provided with a mounting groove, and a flattening assembly is arranged in the mounting groove, the flattening assembly comprises a pressing plate, a pressing rod connected with the pressing plate, and a spring sleeved on the pressing rod, the plate surface of the pressing plate is parallel to the plate surface of the cover plate, one end of the spring is connected with the plate surface of the pressing plate, the other end of the spring is connected with the bottom wall of the mounting groove, and the bottom wall of the mounting groove is provided with a groove matched with the pressing rod, and a buffer gap is arranged between the end surface of the pressing rod and the bottom wall of the groove when the spring is in a natural state.

[0014] Further, the cover plate is provided with a mounting groove, and a flattening assembly is arranged in the mounting groove, the flattening assembly comprises a pressing plate, a pressing rod connected with the pressing plate, and a spring sleeved on the pressing rod, the plate surface of the pressing plate is parallel to the plate surface of the cover plate, one end of the spring is connected with the plate surface of the pressing plate, the other end of the spring is connected with the bottom wall of the mounting groove, and the bottom wall of the mounting groove is provided with a groove matched with the pressing rod, and a buffer gap is arranged between the end surface of the pressing rod and the bottom wall of the groove when the spring is in a natural state.

[0015] Further, the cover plate is provided with a mounting groove, and a flattening assembly is arranged in the mounting groove, the flattening assembly comprises a pressing plate, a pressing rod connected with the pressing plate, and a spring sleeved on the pressing rod, the plate surface of the pressing plate is parallel to the plate surface of the cover plate, one end of the spring is connected with the plate surface of the pressing plate, the other end of the spring is connected with the bottom wall of the mounting groove, and the bottom wall of the mounting groove is provided with a groove matched with the pressing rod, and a buffer gap is arranged between the end surface of the pressing rod and the bottom wall of the groove when the spring is in a natural state. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a three-dimensional structure diagram of the chip test clamp of the utility model;

[0017] Figure 2 It is a structure schematic view of the cover plate and the lock catch assembly in the chip test clamp of the utility model;

[0018] Figure 3 It is a structure schematic view of the cover plate and the lock catch assembly in the chip test clamp of the utility model;

[0019] Figure 4 It is a structure schematic view of the cover plate and the lock catch assembly in the chip test clamp of the utility model;

[0020] Figure 5 It is a structure schematic view of the cover plate and the lock catch assembly in the chip test clamp of the utility model;

[0021] Wherein, the above-mentioned drawing includes the following reference signs: 10 - base; 11 - connecting block; 101 - placing groove; 102 - guide groove; 20 - rotating shaft; 30 - cover plate; 301 - mounting groove; 302 - recess; 40 - limiting rod; 51 - gear; 52 - rack; 521 - first rack segment; 522 - connecting rod segment; 523 - second rack segment; 53 - gear ring; 54 - rotating disc; 55 - guide block; 501 - arc-shaped sliding groove; 502 - avoiding groove; 60 - flattening assembly; 61 - pressing plate; 62 - pressing rod; 63 - spring; 71 - buckling rod; 72 - buckling plate; 721 - pushing plate part; 722 - rotating part; 723 - buckling part; 701 - U-shaped clamping groove; 73 - torsion spring; 74 - mounting rod; 80 - chip.

[0022] The following specific embodiments will further illustrate the present application in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0023] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The drawings show several embodiments of the present application. However, the present application can be realized in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0024] It should be noted that when an element is referred to as being "fixedly attached" to another element, it can be directly on the other element or there can be intervening elements. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements can be present. As used herein the terms "vertical", "horizontal", "left", "right", and the like are merely for purposes of illustration.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0026] Please refer to Figures 1 to 5The utility model provides a kind of clamp for chip test, shown in the utility model, including base 10 and the cover plate 30 of rotation connection with base 10 by pivot 20, specifically, in the embodiment, the middle part of one side of cover plate 30 is fixedly connected with the middle part of pivot 20, and the both ends of one side of base 10 are respectively equipped with connecting block 11, and the both ends of pivot 20 are respectively rotationally connected with corresponding connecting block 11.Base 10 top surface is equipped with the placement slot 101 for placing chip 80, and the bottom of placement slot 101 is equipped with multiple guide grooves 102, and multiple guide grooves 102 are distributed radially with the center of placement slot 101 as origin, and limit rod 40 is slidably arranged in guide groove 102.As a specific example, in the embodiment, four guide grooves 102 are arranged in placement slot 101, and guide groove 102 is a waist-shaped hole structure, and one limit rod 40 is arranged in each guide groove 102, and limit space for limiting chip 80 is formed by surrounding four limit rods 40, and the size of limit space is changed by changing the position of limit rod 40 in guide groove 102, when the size of limit space is adapted to the outer contour of chip 80 to be tested, the rod body circumferential surface of four limit rods 40 forms four-point contact limit with the circumferential edge of chip 80, to effectively prevent displacement of chip 80 during testing.

[0027] In the embodiment, the bottom surface of base 10 is equipped with transmission assembly, and the design of transmission assembly enables the sliding of limit rod 40 in guide groove 102 to be efficiently linked with the rotation of pivot 20, specifically, transmission assembly includes gear 51, rack 52 engaged with gear 51, gear ring 53 engaged with one end of rack 52 away from gear 51, and turntable 54 coaxially connected with gear ring 53, wherein gear 51 is coaxially fixed with pivot 20 to ensure that gear 51 and pivot 20 form an integral whole, and when pivot 20 rotates, gear 51 can rotate synchronously, to ensure the timeliness and accuracy of motion transmission.

[0028] Further, rack 52 includes first rack section 521, connecting rod section 522 connected with first rack section 521, and second rack section 523 connected with connecting rod section 522, first rack section 521 is engaged with gear 51, and second rack section 523 is engaged with gear ring 53.When gear 51 rotates, its teeth interact with the teeth grooves of first rack section 521 to convert the circumferential rotation of gear 51 into linear motion of rack 52, and the teeth grooves of second rack section 523 interact with the teeth of gear ring 53 to convert the linear motion of rack 52 into circumferential rotation of gear ring 53.And since gear ring 53 and turntable 54 are coaxially connected, when gear ring 53 rotates, it can directly drive turntable 54 to rotate synchronously.

[0029] The middle part of the rotating disc 54 is rotationally connected with the base 10, so that the rotating disc 54 can stably rotate around the center thereof on the bottom surface of the base 10. The rotating disc 54 is provided with a plurality of radially extending arc-shaped sliding grooves 501, and the end of the limiting rod 40 is in sliding fit with the arc-shaped sliding grooves 501. As a specific example, in the embodiment, the rotating disc 54 is provided with four arc-shaped sliding grooves 501 extending in the radial direction of the rotating disc 54, and the four arc-shaped sliding grooves 501 are uniformly spaced in the circumferential direction of the rotating disc 54. The end of the limiting rod 40 is in movement fit with the arc-shaped sliding grooves 501 by sliding clamping. When the rotating disc 54 rotates, the arc-shaped sliding grooves 501 will exert a force in a specific direction on the end of the limiting rod 40, so as to promote the limiting rod 40 to slide in the guide groove 102, thereby realizing flexible adjustment of the size of the limiting space formed by the four limiting rods 40. Such linkage design enables the operator to accurately adjust the displacement amount of the limiting rod 40 by precisely controlling the rotation angle of the rotating shaft 20, so as to realize accurate control of the size of the limiting space, and improve the accuracy and operability of the chip testing clamp in use.

[0030] To realize accurate limitation of the movement track of the rack 52, the transmission assembly in the application further includes a guide block 55 fixed to the bottom surface of the base 10. The guide block 55 is internally provided with a guide channel arranged in the movement direction of the rack 52. The guide channel is adapted to the connecting rod segment 522, or in other words, the connecting rod segment 522 of the rack 52 is slidably arranged in the guide channel. Such structural design can ensure that the rack 52 slides along the preset straight line direction, avoid reduction of transmission efficiency or transmission failure caused by movement deviation, and further improve the stability and reliability of the transmission assembly.

[0031] In the embodiment, the base 10 and the cover plate 30 are respectively provided with a relief groove for accommodating the outer edge of the gear 51. The relief groove extends in the circumferential direction along the rotation track of the gear 51, and the depth of the relief groove is greater than the addendum height of the gear 51. Such structural design enables the outer edge of the gear 51 to maintain a certain non-contact gap with the inner wall of the relief groove during rotation, avoids interference between the gear 51 and other components during rotation, and ensures the movement transmission between the gear 51 and the rack 52.

[0032] In the embodiment, the cover plate 30 is provided with a mounting groove 301, and the mounting groove 301 is provided with a flattening assembly 60. When the cover plate 30 is covered on the base 10, the mounting groove 301 is located directly above the placing groove 101, so that the flattening assembly 60 can stably flatten the chip 80 during the chip testing process, and ensure good contact between the chip 80 and the test contacts. Specifically, the flattening assembly 60 includes a pressing plate 61, a pressing rod 62 connected with the pressing plate 61, and a spring 63 sleeved on the pressing rod 62. The plate surface of the pressing plate 61 is parallel to the plate surface of the cover plate 30. One end of the spring 63 is connected with the plate surface of the pressing plate 61, and the other end of the spring 63 is connected with the bottom wall of the mounting groove 301. The bottom wall of the mounting groove 301 is provided with a groove 302 matched with the pressing rod 62. When the spring 63 is in a natural state, a buffer gap is provided between the end surface of the pressing rod 62 and the bottom wall of the groove 302, and the buffer gap is 1mm-3mm.

[0033] The chip testing fixture of the application further includes a lock catch assembly, which includes a catch rod 71 and a catch plate 72 matched with the catch rod 71. The catch rod 71 is arranged on the side of the base 10 opposite to the rotating shaft 20. One side of the catch plate 72 is rotationally connected with the cover plate 30 through a torsion spring 73, and the other side of the catch plate 72 is provided with a U-shaped clamping groove 701 matched with the catch rod 71. In the embodiment, the side of the cover plate 30 opposite to the rotating shaft 20 is provided with a mounting rod 74. The catch plate 72 includes a push plate part 721, a rotating part 722 connected with the push plate part 721, and a clamping part 723 connected with the rotating part 722. The mounting rod 74 is arranged in the rotating part 722, and the two ends of the rotating part 722 in the axial direction are rotationally connected with the mounting rod 74 through the torsion spring 73. The clamping part 723 is provided with the U-shaped clamping groove 701. When the cover plate 30 is covered on the base 10, the push plate part 721 is manually operated to rotate the entire catch plate 72 around the mounting rod 74 by a certain angle, so that the catch rod 71 can enter the opening of the U-shaped clamping groove 701, and finally form an interference fit with the groove wall of the U-shaped clamping groove 701. The reset elastic force of the torsion spring 73 tightly clamps the catch plate 72 to the catch rod 71, thereby firmly locking the cover plate 30 and the base 10 together. When it is necessary to open the cover plate 30, a certain external force is applied to the catch plate 72 to overcome the elastic force of the torsion spring 73, so that the catch plate 72 can rotate around the mounting rod 74, and the catch rod 71 can slide out of the U-shaped clamping groove 701, thereby realizing the opening operation of the cover plate 30.

[0034] In actual use, the working principle of the chip testing clamp can be: the chip 80 is placed in the placing groove 101, and the position of the chip 80 needs to be ensured to be roughly in the middle during placement, thereby laying a foundation for subsequent accurate positioning operation. Subsequently, the cover plate 30 is slowly rotated manually, and the cover plate 30 is gradually rotated towards the direction where the base 10 is located. In the process of rotation of the cover plate 30, the rotating shaft 20 fixedly connected with the cover plate 30 also rotates, and simultaneously drives the gear 51 to rotate synchronously. In the rotating process of the gear 51, the gear teeth of the gear 51 and the tooth grooves of the rack 52 are closely meshed with each other, the circumferential rotation of the gear 51 is converted into the linear motion of the rack 52, so that the rack 52 slides linearly along the bottom surface of the base 10. With the linear sliding of the rack 52, the gear ring 53 meshing with the end of the rack 52 away from the gear 51 starts to rotate, and simultaneously drives the rotating disc 54 to rotate synchronously. When the rotating disc 54 rotates, the arc-shaped sliding groove 501 applies a force in a specific direction to the end of the limiting rod 40, so that the limiting rod 40 can stably slide along the guide groove 102, thereby changing the size of the limiting space formed by the four limiting rods 40, so that the rod body of the limiting rod 40 can abut against the circumferential outer edge of the chip 80, thereby realizing accurate positioning of the chip 80, and ensuring that the chip 80 does not displace during the test.

[0035] At the same time, the flattening assembly 60 located in the mounting groove 301 of the cover plate 30 also performs flattening work on the chip 80. Specifically, when the cover plate 30 gradually approaches the base 10 until the plate surface on the side of the pressing plate 61 away from the pressing rod 62 is in contact with the surface of the chip 80, the spring 63 is gradually compressed and generates a corresponding reset elastic force. This reset elastic force will continuously provide a stable and gradually increasing pressure for the pressing plate 61. Under the action of the pressure, the pressing plate 61 can stably and firmly flatten the chip 80 on the test position, ensuring that the chip 80 can realize close and stable contact with the test contact during the test, effectively avoiding the test result deviation caused by the position deviation or poor contact of the chip 80, and guaranteeing the accuracy of the chip test.

[0036] The chip testing clamp has the beneficial effects that: the transmission assembly is arranged to realize efficient linkage between the rotating shaft and the limiting rod, and the operator only needs to manually rotate the cover plate to realize quick limiting of the chip, without frequent manual operation of the clamp, thereby effectively reducing the time cost.

[0037] In the description of the present specification, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0038] The above-described embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the scope of the present application. It should be pointed out that, for ordinary skilled persons in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A fixture for chip testing, characterized in that, The application relates to a chip placing device, which comprises a base and a cover plate rotationally connected with the base through a rotating shaft, the top surface of the base is provided with a placing groove for placing a chip, the bottom of the placing groove is provided with a plurality of guide grooves which are radially distributed with the center of the placing groove as the origin, and a limiting rod is slidably arranged in the guide groove. The bottom surface of the base is provided with a transmission assembly, the limiting rod is linked with the rotating shaft through the transmission assembly, the transmission assembly comprises a gear, a rack meshing with the gear, a gear ring meshing with the rack at the end away from the gear, and a rotating disc coaxially connected with the gear ring, the gear is coaxially fixed with the rotating shaft, the middle part of the rotating disc is rotationally connected with the base, a plurality of radially extending arc-shaped sliding grooves are arranged on the rotating disc, and the end of the limiting rod is slidably matched with the arc-shaped sliding grooves.

2. The chip testing jig according to claim 1, wherein The rack comprises a first rack segment, a connecting rod segment connected with the first rack segment, and a second rack segment connected with the connecting rod segment, the first rack segment is meshed with the gear, and the second rack segment is meshed with the gear ring.

3. The chip testing jig according to claim 2, wherein The transmission assembly further comprises a guide block, the guide block is fixedly arranged on the bottom surface of the base, a guide channel is arranged in the guide block, the guide channel is arranged along the movement direction of the rack, and the guide channel is matched with the connecting rod segment.

4. The chip testing jig according to claim 1, wherein The middle part of one side of the cover plate is fixedly connected with the middle part of the rotating shaft, the two ends of one side of the base are provided with connecting blocks, and the two ends of the rotating shaft are rotationally connected with the connecting blocks.

5. The chip testing jig according to claim 1, wherein Respectively arranged on the base and the cover plate are avoiding grooves for accommodating the outer edge of the gear, and the depth of the avoiding grooves is greater than the addendum height of the gear.

6. The chip testing jig according to claim 1, wherein An installation groove is arranged on the cover plate, a flattening assembly is arranged in the installation groove, the flattening assembly comprises a pressing plate, a pressing rod connected with the pressing plate, and a spring sleeved on the pressing rod, the plate surface of the pressing plate is parallel to the plate surface of the cover plate, one end of the spring is connected with the plate surface of the pressing plate, the other end of the spring is connected with the bottom wall of the installation groove, a recess matched with the pressing rod is arranged on the bottom wall of the installation groove, and a buffer gap is arranged between the end surface of the pressing rod and the bottom wall of the recess when the spring is in a natural state.

7. The chip testing jig according to claim 1, wherein The application further comprises a lock catch assembly, the lock catch assembly comprises a catch rod and a catch plate, the catch rod is arranged on the side of the base opposite to the rotating shaft, one side of the catch plate is rotationally connected with the cover plate through a torsion spring, and the other side of the catch plate is provided with a U-shaped clamping groove matched with the catch rod.

8. The chip testing jig according to claim 7, wherein An installation rod is arranged on the side of the cover plate opposite to the rotating shaft, the catch plate comprises a poking plate part, a rotating part connected with the poking plate part, and a clamping part connected with the rotating part, the installation rod is arranged in the rotating part, and the two ends of the rotating part in the axial direction are respectively rotationally connected with the installation rod through torsion springs, and the U-shaped clamping groove is arranged on the clamping part.