Hard disk high-temperature aging test equipment

Abstract

The utility model discloses a high-temperature aging test device for a hard disk, which relates to the technical field of test devices and comprises a test box body, a high-temperature aging chamber and a low-temperature aging chamber are sequentially arranged in an inner cavity of the test box body from top to bottom, and the high-temperature aging chamber is communicated with the low-temperature aging chamber. A first bottom plate is arranged in the high-temperature aging chamber, a detection supporting plate is arranged on the first bottom plate, a power assembly is arranged on the first bottom plate, the power assembly is used for driving the first bottom plate to enter the low-temperature aging chamber, and after the high-temperature aging test is completed, the power assembly drives the first bottom plate to be transferred from the high-temperature aging chamber to the low-temperature aging chamber; the low-temperature aging performance test of the product in the low-temperature environment is carried out, the detected product can be transferred from the high-temperature aging chamber to the low-temperature aging chamber without manual operation, the scalding condition during manual transferring is avoided, and the test efficiency can be improved while the working safety is improved.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, and in particular to a hard disk high-temperature aging testing device. Background Technology

[0002] Solid-state drives (SSDs) are hard drives made of solid-state electronic storage chip arrays. They are widely used in many fields such as military, automotive, industrial control, video surveillance, network monitoring, network terminals, power, medical, aviation, and navigation equipment. In the production process of SSDs, performance testing is a crucial step. This step not only reveals the product's various data parameters but also its performance and lifespan under different environments. Therefore, it is necessary to test the high-temperature aging performance of SSDs.

[0003] The structure is as described in Chinese Patent No. CN217238240U, "A High and Low Temperature Aging Test Equipment for Electronic Storage Products," which includes a test chamber body. A low-temperature aging chamber is located at the top of the test chamber body, and a high-temperature aging chamber is located at the bottom of the test chamber body. A second protective door is movably installed at the front end of the high-temperature aging chamber, and a first protective door is movably installed at the front end of the low-temperature aging chamber. A slide is formed in the inner wall of the low-temperature aging chamber, and a test tray is movably installed inside the slide. Slide rails are fixedly installed at the rear ends of the left and right walls of the test tray, and rollers are movably installed inside the slide rails. A fixed plate is movably installed above the test tray, and a spring shaft is movably installed at one end of the fixed plate. A protective pad is fixedly installed on the inner wall of the fixed plate, and an electronic product box is movably installed inside the protective pad.

[0004] While the aforementioned technical solution allows for easy forward pulling of the testing tray via multiple rollers inside the slide rail, facilitating the placement of electronic product boxes containing electronic components, and includes high-temperature and low-temperature aging chambers for testing, it still has some technical drawbacks in practical use. For example, during testing, the testing tray containing the product needs to be transferred from the high-temperature aging chamber to the low-temperature aging chamber (or vice versa). During this transfer, operators are prone to accidental burns due to the need to remove the testing tray from the high-temperature aging chamber, such as from skin contact with the inner wall of the chamber or handling the tray without gloves. Therefore, the technical solution in the prior art still presents a safety hazard of burns. Furthermore, if the power is turned off before removing the testing tray to lower the internal temperature of the high-temperature aging chamber, a waiting period is required after each product is tested, severely impacting testing efficiency.

[0005] Therefore, it is necessary to propose a new technical solution to address the above problems. Utility Model Content

[0006] To overcome the shortcomings mentioned above, this utility model aims to provide a technical solution that can solve the aforementioned problems.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a hard disk high-temperature aging test device, comprising a test chamber body, wherein a high-temperature aging chamber and a low-temperature aging chamber are arranged sequentially from top to bottom in the inner cavity of the test chamber body, and the high-temperature aging chamber and the low-temperature aging chamber are connected, a first base plate is provided in the high-temperature aging chamber, a test support plate is provided on the first base plate, and a power component is provided on the first base plate, the power component being used to drive the first base plate into the low-temperature aging chamber.

[0008] As a further embodiment of this utility model: the inner cavity of the test chamber body is provided with a first partition and a second partition, and the first partition and the second partition form a high-temperature aging chamber, a transition chamber and a low-temperature aging chamber from top to bottom inside the test chamber body;

[0009] The first base plate has a second base plate and a third base plate at its upper end. The first base plate, the second base plate and the third base plate are connected by a number of first support rods. The top of the third base plate is connected to the power assembly. The first base plate has a telescopic rod at its lower end. The lower end of the telescopic rod is connected to a fourth base plate.

[0010] The first partition has a first connecting port, and the second partition has a second connecting port. The first connecting port and the second connecting port correspond to the first bottom plate, the second bottom plate, the third bottom plate, and the fourth bottom plate. The first bottom plate is located in the first connecting port, and the fourth bottom plate is located in the second connecting port.

[0011] As a further embodiment of this utility model: a first air pump and a second air pump are installed on the back of the test chamber body. The air inlet pipe of the first air pump is connected to the high-temperature aging chamber, and the air outlet pipe is connected to the transition chamber. The air inlet pipe of the second air pump is connected to the low-temperature aging chamber, and the air outlet pipe is connected to the transition chamber.

[0012] As a further embodiment of this utility model: the power assembly includes cylinders respectively installed on both sides of the test chamber body, the power rod at the upper end of the cylinder is connected to a top plate, and a plurality of second support rods are provided at the lower end of the top plate, the second support rods passing through the test chamber body and connected to a third bottom plate.

[0013] As a further embodiment of this utility model: sealing rings are provided on the edges of the first base plate, the second base plate, the third base plate and the fourth base plate.

[0014] As a further embodiment of this utility model: the main body of the test box is provided with several through holes, and a sealed bearing is provided in the through holes. The second support rod passes through and is guided and connected to the sealed bearing.

[0015] Compared with existing technologies, the beneficial effects of this technical solution are as follows:

[0016] 1. During testing, the product is placed on the testing tray, which is located in the high-temperature aging chamber. After the high-temperature aging test is completed, the first base plate is moved from the high-temperature aging chamber to the low-temperature aging chamber by the power component to conduct the low-temperature aging performance test of the product in a low-temperature environment. This allows the product to be transferred from the high-temperature aging chamber to the low-temperature aging chamber without manual operation, avoiding burns during manual transfer, improving work safety and testing efficiency.

[0017] 2. By adding a first partition and a second partition, a transition chamber is formed between the high-temperature aging chamber and the low-temperature aging chamber. The first and second air pumps respectively transport the heat from the high-temperature aging chamber and the cold air from the low-temperature aging chamber to the transition chamber, so that the temperature inside the transition chamber is between hot and cold. This establishes a temperature transition zone, allowing the product to gradually adapt when it is transferred from a high-temperature environment to a low-temperature environment, rather than being transferred directly from a high-temperature environment to a low-temperature environment. This avoids excessive temperature fluctuations inside the product that could cause irreversible damage.

[0018] By adding a second, third, and fourth base plate and using a power unit for driving, the sealing of the high-temperature aging chamber and the low-temperature aging chamber can be maintained during the process of transferring the first base plate carrying the product back and forth between the high-temperature aging chamber and the low-temperature aging chamber for testing. This prevents the loss of heat from the high-temperature aging chamber and cold air from the low-temperature aging chamber, thereby reducing energy consumption and lowering testing costs.

[0019] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0022] Figure 2 This is a schematic diagram of the structure of the first base plate of this utility model when it is moved to the low-temperature aging chamber;

[0023] Figure 3 This is a schematic diagram of the structure of this utility model from another perspective;

[0024] Figure 4 This is a partial structural schematic diagram of the present invention;

[0025] Figure 5 This is a schematic diagram of the main structure of the test box of this utility model;

[0026] The corresponding labels in the attached diagram are explained as follows:

[0027] 1. Test chamber body; 2. High temperature aging chamber; 3. Low temperature aging chamber; 4. First base plate; 5. Test tray; 6. First partition; 7. Second partition; 8. Transition chamber; 9. Second base plate; 10. Third base plate; 11. First support rod; 12. Telescopic rod; 13. Fourth base plate; 14. First connecting port; 15. Second connecting port; 16. Cylinder; 17. Top plate; 18. Second support rod; 19. First vacuum pump; 20. Second vacuum pump; 21. Sealing ring; 22. Sealed bearing. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0029] Please see Figure 1-5 A hard drive high-temperature aging test device includes a test chamber body 1. The inner cavity of the test chamber body 1 is provided with a high-temperature aging chamber 2 and a low-temperature aging chamber 3 from top to bottom, and the high-temperature aging chamber 2 and the low-temperature aging chamber 3 are connected. A first base plate 4 is provided in the high-temperature aging chamber 2, and a test support plate 5 is provided on the first base plate 4. A power component is provided on the first base plate 4. The power component is used to drive the first base plate 4 into the low-temperature aging chamber 3. The inner wall of the high-temperature aging chamber 2 is provided with heating wires, and the low-temperature aging chamber 3 is provided with cooling copper pipes, which are used to create a high-temperature test environment in the high-temperature aging chamber 2 and a low-temperature test environment in the low-temperature aging chamber 3, respectively.

[0030] Specifically, in use, the detection tray 5 on the first base plate 4 in this technical solution is classified as the existing structure protected in publication number CN217238240U, that is, the detection tray 5 includes "detection tray, fixing plate, protective pad, slide rail, roller and spring shaft". The overall use of the detection tray 5 is consistent with the prior art, and will not be elaborated further here.

[0031] During testing, the product is placed on the testing tray 5, which is located inside the high-temperature aging chamber 2. The temperature inside the high-temperature aging chamber 2 is increased to test the product's high-temperature aging performance under high-temperature conditions. After the high-temperature aging test is completed, the first base plate 4 is moved from the high-temperature aging chamber 2 to the low-temperature aging chamber 3 by the power component. The temperature inside the low-temperature aging chamber 3 is decreased to test the product's low-temperature aging performance under low-temperature conditions. This allows the product to be transferred from the high-temperature aging chamber 2 to the low-temperature aging chamber 3 without manual operation, avoiding burns during manual transfer, improving work safety and testing efficiency.

[0032] After the product completes the low-temperature aging performance test in the low-temperature aging chamber 3, the product can be taken out of the low-temperature aging chamber 3, and then the next product can be placed on the test tray 5. Then, the first base plate 4 is driven by the power component to rise into the high-temperature aging chamber 2, and then the high and low temperature aging performance tests are carried out in sequence. It is convenient and quick. The operator does not need to come into contact with high temperature during the entire test, which effectively avoids the risk of burns.

[0033] In this embodiment, please refer to Figures 1-2 and Figures 4-5 Furthermore, it is proposed that the inner cavity of the test chamber body 1 is provided with a first partition 6 and a second partition 7, and the first partition 6 and the second partition 7 form a high temperature aging chamber 2, a transition chamber 8 and a low temperature aging chamber 3 from top to bottom inside the test chamber body 1.

[0034] The upper end of the first base plate 4 is provided with a second base plate 9 and a third base plate 10. The first base plate 4, the second base plate 9 and the third base plate 10 are connected by a number of first support rods 11, and the top of the third base plate 10 is connected to the power assembly. The lower end of the first base plate 4 is provided with a telescopic rod 12, and the lower end of the telescopic rod 12 is connected to a fourth base plate 13.

[0035] The first partition 6 has a first connecting port 14, and the second partition 7 has a second connecting port 15. The first connecting port 14 and the second connecting port 15 correspond to the first base plate 4, the second base plate 9, the third base plate 10 and the fourth base plate 13. The first base plate 4 is located in the first connecting port 14, and the fourth base plate 13 is located in the second connecting port 15.

[0036] Specifically, when the power unit starts, it drives the third base plate 10 to descend. The first support rod 11 causes the second base plate 9 and the first base plate 4 to move downwards as well. The first base plate 4 carries the test product through the transition chamber 8 and into the low-temperature aging chamber 3 during this downward movement. During this descent, the first base plate 4 not only disengages from the first connecting port 14, but also pushes the fourth base plate 13 away from the second connecting port 15 after the telescopic rod 12 retracts to its limit. Simultaneously, after the descent is complete, the second base plate 9 seals the second connecting port 15, and the third base plate 10 seals the first connecting port 14. This prevents heat loss from the high-temperature aging chamber 2 and cold air loss from the low-temperature aging chamber 3 after the product transfer, thereby reducing energy consumption and lowering the test cost. When the power component is activated and the third base plate 10 moves upward, the third base plate 10 moves the second base plate 9 and the first base plate 4, causing the second base plate 9 and the third base plate 10 to move upward into the high-temperature aging chamber 2, and the first base plate 4 to move again into the first connecting port 14. While the high-temperature aging performance test of the product can be carried out, the first connecting port 14 can also be blocked to prevent heat loss. During the upward movement, the first base plate 4 stretches the telescopic rod 12 between itself and the fourth base plate 13. After the telescopic rod 12 is stretched to its maximum extent, it moves the fourth base plate 13 upward into the second connecting port 15, so that the second connecting port 15 is blocked to prevent cold air from flowing out. This reduces energy consumption while automatically transferring product parts.

[0037] Furthermore, the main body 1 of the test chamber is equipped with sealed cabinet doors corresponding to the high-temperature aging chamber 2, the transition chamber 8, and the low-temperature aging chamber 3, respectively. After the product is placed in, the sealed cabinet doors are closed, which can form a sealed space inside the high-temperature aging chamber 2, the transition chamber 8, and the low-temperature aging chamber 3 to improve the test effect.

[0038] In this embodiment, please refer to Figures 1-3 Furthermore, it is proposed that a first air pump 19 and a second air pump 20 are installed on the back of the test chamber body 1. The air inlet pipe of the first air pump 19 is connected to the high temperature aging chamber 2, and the air outlet pipe is connected to the transition chamber 8. The air inlet pipe of the second air pump 20 is connected to the low temperature aging chamber 3, and the air outlet pipe is connected to the transition chamber 8.

[0039] During the process of the product being moved from the high-temperature aging chamber 2 to the low-temperature aging chamber 3 by the first base plate 4, it will pass through the transition chamber 8 between the high-temperature aging chamber 2 and the low-temperature aging chamber 3. By activating the first air pump 19 and the second air pump 20, the heat inside the high-temperature aging chamber 2 and the cold air inside the low-temperature aging chamber 3 can be transported to the transition chamber 8, so that the temperature inside the transition chamber 8 is between hot and cold, thereby establishing a temperature transition zone. This allows the product to gradually adapt during the process of moving from a high-temperature environment to a low-temperature environment, rather than moving directly from a high-temperature environment to a low-temperature environment, so as to avoid irreversible damage caused by excessive temperature fluctuations inside the product.

[0040] In one embodiment, temperature sensors can be installed inside the high-temperature aging chamber 2, the transition chamber 8, and the low-temperature aging chamber 3 to monitor the temperature inside the high-temperature aging chamber 2, the transition chamber 8, and the low-temperature aging chamber 3 in real time. Then, the temperature inside the high-temperature aging chamber 2, the transition chamber 8, and the low-temperature aging chamber 3 can be adjusted by regulating the power of the heating wire, the cooling copper pipe, the first air pump 19, and the second air pump 20.

[0041] In this embodiment, please refer to Figure 4 Furthermore, it is proposed that sealing rings 21 are provided on the edges of the first base plate 4, the second base plate 9, the third base plate 10, and the fourth base plate 13.

[0042] Specifically, the sealing ring 21 can increase the sealing performance between the first base plate 4 and the third base plate 10 and the first connecting port 14, and between the second base plate 9 and the fourth base plate 13 and the second connecting port 15, thereby further reducing the loss of heat and cold air.

[0043] Among them, the sealing ring 21 is made of high temperature resistant material, such as silicone rubber.

[0044] In this embodiment, please refer to Figures 1-2 Furthermore, the power assembly includes cylinders 16 respectively installed on both sides of the test chamber body 1. The power rod at the upper end of the cylinder 16 is connected to a top plate 17. Several second support rods 18 are provided at the lower end of the top plate 17. The second support rods 18 penetrate the test chamber body 1 and are connected to the third bottom plate 10.

[0045] Specifically, cylinder 16 serves as the power source for the power assembly. When started, it drives the power rod to extend and retract, thereby driving the top plate 17. The top plate 17 then drives the third bottom plate 10 through the second support rod 18, which in turn drives the product on the first bottom plate 4 to change position.

[0046] In this embodiment, please refer to Figure - Figure 2 Furthermore, it is proposed that the main body 1 of the test box has several through holes, and a sealed bearing 22 is installed in the through holes. The second support rod 18 passes through and is guided and connected to the sealed bearing 22.

[0047] Specifically, by using the sealed bearing 22, the sealing between the second support rod 18 and the test chamber body 1 can be improved, so as to prevent the heat inside the high-temperature aging chamber 2 from being lost from the top.

[0048] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A hard disk high temperature burn-in test apparatus, characterized by, The utility model relates to a test box body (1), the test box body (1) inner chamber is equipped with high temperature ageing chamber (2) and low temperature ageing chamber (3) from top to bottom successively, and high temperature ageing chamber (2) with low temperature ageing chamber (3) are communicated, first bottom plate (4) is equipped with in high temperature ageing chamber (2), and detection support plate (5) is equipped on first bottom plate (4), and power assembly is equipped on first bottom plate (4), and power assembly is used to drive first bottom plate (4) to enter low temperature ageing chamber (3) in.

2. The hard disk high temperature burn-in test apparatus according to claim 1, wherein, The test box body (1) inner chamber is equipped with first baffle (6) and second baffle (7), and the test box body (1) is formed with high temperature ageing chamber (2), transition chamber (8) and low temperature ageing chamber (3) from top to bottom by first baffle (6) and second baffle (7); The second bottom plate (9) and third bottom plate (10) are arranged on the upper end of the first bottom plate (4), the first bottom plate (4), the second bottom plate (9) and the third bottom plate (10) are connected by a plurality of first supporting rods (11), the top end of the third bottom plate (10) is connected with the power assembly, and the lower end of the first bottom plate (4) is provided with a telescopic rod (12), and the lower end of the telescopic rod (12) is connected with a fourth bottom plate (13). The first baffle (6) is provided with a first communication port (14), the second baffle (7) is provided with a second communication port (15), the first communication port (14) and the second communication port (15) correspond to the first bottom plate (4), the second bottom plate (9), the third bottom plate (10) and the fourth bottom plate (13), the first bottom plate (4) is located in the first communication port (14), and the fourth bottom plate (13) is located in the second communication port (15).

3. The hard disk high temperature burn-in test apparatus according to claim 2, wherein The first suction pump (19) and the second suction pump (20) are installed on the back of the test box body (1), the air inlet pipe of the first suction pump (19) is connected with the high temperature ageing chamber (2), the air outlet pipe is connected with the transition chamber (8), the air inlet pipe of the second suction pump (20) is connected with the low temperature ageing chamber (3), and the air outlet pipe is connected with the transition chamber (8).

4. The hard disk high temperature burn-in test apparatus of claim 2, wherein, The power assembly includes cylinders (16) installed on both sides of the test box body (1), the power rods at the upper end of the cylinders (16) are connected with a top plate (17), the lower end of the top plate (17) is provided with a plurality of second supporting rods (18), the second supporting rods (18) penetrate through the test box body (1) and are connected with the third bottom plate (10).

5. The hard disk high temperature burn-in test apparatus of claim 2, wherein, The edges of the first bottom plate (4), the second bottom plate (9), the third bottom plate (10) and the fourth bottom plate (13) are provided with sealing rings (21).

6. The hard disk high temperature burn-in test apparatus of claim 4, wherein, A plurality of through holes are formed in the test box body (1), sealing bearings (22) are arranged in the through holes, and the second supporting rods (18) penetrate through and are connected with the sealing bearings (22) in a guide mode.

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