Automatic chip test head detection device of mechanical arm
The automated chip testing head inspection device using a robotic arm enables comprehensive inspection of chip testing heads, solving the problem of incomplete inspection by fixed inspection devices, improving inspection accuracy and efficiency, and reducing human error and production costs.
Patent Information
- Application Number
- CN202520294604.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-24
- Publication Date
- 2026-02-24
- Estimated Expiration
- 2035-02-24
AI Technical Summary
Existing chip testing head inspection methods mostly use fixed testing devices, which make it difficult to comprehensively inspect every corner of the chip testing head. This leads to the failure to detect potential defects in a timely manner, increasing the risk of defective chips entering the market. In addition, manual operation is inefficient, prone to errors, and increases production costs.
The automated chip testing head detection device employs a robotic arm, which uses HIWIN guide rails, sliders, and multi-stage arm components to achieve flexible movement and precise positioning of the testing head assembly. Combined with the indexing plate base and large-diameter indexing plate, it ensures the comprehensiveness and accuracy of the detection.
It improves the comprehensiveness and accuracy of chip test head detection, reduces manual operation time, increases detection efficiency, and reduces the risk of defective chips entering the market.
Smart Images
Figure CN223941055U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of detection device technology, and in particular to a robotic arm automated chip testing head detection device. Background Technology
[0002] In the current booming chip industry, chip functions are becoming increasingly complex, and integration levels are constantly rising, placing stringent demands on chip testing head inspection. As a crucial link in ensuring chip quality, the accuracy and efficiency of chip testing directly affect chip performance and production efficiency. Existing chip testing head inspection methods mostly employ fixed testing devices. In this method, the testing equipment is in a fixed position, allowing inspection only on a limited number of specific locations on the testing head. This is akin to working in a confined space, making it difficult to reach every corner of the chip testing head. As chip sizes gradually shrink and internal structures become increasingly sophisticated, the shortcomings in comprehensive inspection become more pronounced. Many potential defects cannot be detected in time, increasing the risk of substandard chips entering the market. Manual operation is not only slow, but operators are also prone to fatigue after long hours, leading to more operational errors and further slowing down the inspection process. This increases production costs and fails to meet the market's urgent demand for chips.
[0003] Therefore, this utility model proposes an automated chip testing head detection device for robotic arms. Utility Model Content
[0004] The purpose of this invention is to address the problem that many chip testing head inspection methods in the background technology use fixed inspection devices. In this method, the inspection equipment is in a fixed position and can only inspect a limited number of specific positions on the test head. It is like working in a confined space, making it difficult to reach all corners of the chip test head. As chip size gradually shrinks and internal structure becomes increasingly sophisticated, the shortcomings in comprehensive inspection become more and more prominent. A large number of potential defects cannot be detected in time, increasing the risk of defective chips entering the market. Manual operation is not only slow, but operators are also prone to fatigue after working for a long time, leading to more operational errors and further slowing down the inspection process. This increases production costs and makes it difficult to meet the urgent market demand for chips. Therefore, this invention proposes an automated chip testing head inspection device with a robotic arm.
[0005] The technical solution of this utility model is as follows: an automated chip testing head detection device for a robotic arm, comprising: a base plate for support, a chassis base fixedly mounted on the upper surface of the base plate, and a column body fixedly mounted on the upper surface of the chassis base; an HIWIN guide rail fixedly mounted on one side of the column body, a slider slidably mounted on the HIWIN guide rail, a first-stage arm assembly being engaged at one end of the slider, a second-stage arm assembly being rotatably mounted at one end of the first-stage arm assembly; and a test head assembly mounted at one end of the second-stage arm assembly for detecting a clamped brake block.
[0006] Optionally, the first stage arm assembly includes a slider connecting plate snapped onto one end of the slider. A set of first rotary joint supports is fixedly disposed on one side of the slider connecting plate. A first rotary shaft is rotatably disposed between the first rotary joint supports. A set of joint seats is sleeved on the outer wall of the first rotary shaft. A joint center balance block is fixedly disposed between the joint seats. One end of the joint center balance block is sleeved with the first rotary shaft. A first rotary shaft locking component for limiting the movement is disposed at one end of the first rotary shaft. A large-diameter thrust bearing is passed through one end of the joint seats. A second rotary shaft is rotatably disposed between the large-diameter thrust bearings. A second rotary shaft locking component for limiting the movement is sleeved on one end of the second rotary shaft.
[0007] Optionally, the second step arm assembly includes a second joint seat sleeved on the outer wall of the large-diameter thrust bearing. A third rotating shaft is rotatably provided at one end of the second joint seat. A second rotating joint support is sleeved on the outer wall of the third rotating shaft. A third rotating shaft locking assembly for limiting the second joint seat is provided on one side of the second rotating joint support. The third rotating shaft locking assembly is sleeved with the second joint seat.
[0008] Optionally, the test head assembly includes an indexing plate base fixedly mounted on one end of the second rotary joint support. Multiple plunger mounting blocks are snapped onto the outer wall of the indexing plate base. A fixed-position plunger is provided on one side of each plunger mounting block. A large-diameter indexing plate is fixedly mounted on one side of the indexing plate base. A rotating column is provided on one side of the large-diameter indexing plate. A large-diameter tapered bearing is installed inside the rotating column. A large-diameter bearing pressure plate is provided on one side of the large-diameter tapered bearing. A cylindrical positioning pin is provided on one side of the large-diameter bearing pressure plate. A brake clamping assembly is fixedly mounted on the side wall of the indexing plate base.
[0009] Optionally, the first, second, and third rotary shaft locking assemblies have the same structure and include a locking block. One side of the locking block has a mounting hole, and another side of the locking block has a handle mounting position. The handle mounting position is internally threaded with a handle.
[0010] Optionally, the brake clamping assembly includes a brake clamping block, which is engaged with a large-diameter indexing plate. One side of the brake clamping block has an installation connection hole, and another side of the brake clamping block has a handle installation hole.
[0011] Optionally, the bottom surface of the base plate is provided with multiple feet and casters.
[0012] Optionally, an integrated bracket is fixedly installed on one side of the column body, and a slider limiting block is fixedly installed on the other side.
[0013] Optionally, a top cover plate is fixedly installed on the top of the column body.
[0014] Optionally, a guide rail clamp is fixedly provided on the side of the slider connecting plate, and a lower limiting quick connector is fixedly provided on one side of the slider connecting plate.
[0015] Compared with the prior art, the present invention has the following beneficial technical effects:
[0016] This invention, by setting up HIWIN guide rails, sliders, and multi-stage arm assemblies, enables the test head assembly to move flexibly and be precisely positioned in multiple dimensions. The multi-axis rotation design of the first and second stage arm assemblies allows the test head to easily reach various detection parts of the chip test head, which greatly improves the comprehensiveness and accuracy of the detection compared to the traditional fixed detection method.
[0017] Furthermore, this invention, through the indexing plate base and large-diameter indexing plate in the test head assembly, along with components such as the fixed-position plunger, can precisely position and fix the chip test head, ensuring that the test head will not shift during the testing process, thereby effectively improving testing accuracy. Simultaneously, the automated operation of the robotic arm can quickly complete the testing process, reducing the time lost through manual operation and significantly improving testing efficiency. Attached Figure Description
[0018] Figure 1 A schematic diagram of the structure of an automated chip testing head detection device for a robotic arm according to this utility model is provided;
[0019] Figure 2 This utility model is provided Figure 1 A schematic diagram of the connection structure of the first-stage arm assembly, the second-stage arm assembly, and the test head assembly;
[0020] Figure 3 This utility model is provided Figure 2 Schematic diagram of the first-stage arm assembly;
[0021] Figure 4 This utility model is provided Figure 2 Schematic diagram of the second-order arm assembly;
[0022] Figure 5 This utility model is provided Figure 2 A schematic diagram of the structure of the test head assembly;
[0023] Figure 6 This utility model is provided Figure 3 and Figure 4 A schematic diagram of the structure of the first rotating axis locking assembly, the second rotating axis locking assembly and the third rotating axis locking assembly;
[0024] Figure 7 This utility model is provided Figure 5 A schematic diagram of the structure of the brake clamping assembly.
[0025] Figure label:
[0026] 1. Base plate; 2. Chassis base; 3. Column body; 4. HIWIN guide rail; 5. Slider;
[0027] 6. First-stage arm assembly; 61. Slider connecting plate; 62. First rotary joint support; 63. First rotary shaft; 64. Joint seat; 65. Joint center balance block; 66. First rotary shaft locking assembly; 67. Large-diameter thrust bearing; 68. Second rotary shaft; 69. Second rotary shaft locking assembly;
[0028] 7. Second-stage arm assembly; 71. Second joint seat; 72. Third rotation axis; 73. Second rotation joint support; 74. Third rotation axis locking assembly;
[0029] 8. Test head assembly; 81. Indexing plate base; 82. Plunger mounting block; 83. Fixed plunger; 84. Large diameter indexing plate; 85. Rotating column; 86. Large diameter tapered roller bearing; 87. Large diameter bearing pressure plate; 88. Cylindrical locating pin; 89. Brake clamping assembly; 891. Brake clamping block; 892. Mounting connection hole; 893. Handle mounting hole;
[0030] 91. Locking block; 92. Mounting hole; 93. Handle mounting position; 94. Handle;
[0031] 10. Foot cup; 11. Casters; 12. Integrated bracket; 13. Slider limit block; 14. Top cover; 15. Guide rail clamp; 16. Lower limit quick insert. Detailed Implementation
[0032] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of this utility model, but not all embodiments.
[0033] The components of the present invention embodiments described and shown in the accompanying drawings can typically be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention.
[0034] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.
[0035] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0036] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0037] Example
[0038] like Figure 1 and Figure 2As shown, this utility model proposes an automated chip testing head detection device for robotic arms, comprising: a base plate 1 for support, a chassis base 2 fixedly mounted on the upper surface of the base plate 1, and a column body 3 fixedly mounted on the upper surface of the chassis base 2. The base plate 1 is the basic support structure of the entire device, providing a stable installation platform for the entire detection device. Its bottom surface is equipped with multiple feet 10 and casters 11. The feet 10 mainly serve to provide stable support, placing the device stably on the working surface and preventing displacement of the device due to vibration or other external forces during testing, ensuring the accuracy and safety of the test. The casters 11 facilitate the movement of the device; when the device needs to be repositioned or moved to different testing areas, it can be easily pushed, improving the device's mobility and flexibility. The chassis base 2, as an intermediate component connecting the base plate 1 and the column body 3, serves as a transition and load-bearing component, ensuring that the column body 3 can be stably mounted on the base plate 1. The column body 3 is a crucial supporting structure of the device. An integrated bracket 12 is fixedly mounted on one side, providing installation positions for other auxiliary equipment or components, enabling the integration of different functional parts. A slider limit block 13 is fixedly mounted on the other side, limiting the sliding range of the slider 5 to prevent it from exceeding a predetermined range during sliding, ensuring the safety and stability of the entire robotic arm's movement. A top cover plate 14 is fixedly mounted on the top of the column body 3, protecting the internal structure of the column from dust and debris, and also enhancing the overall structural strength of the column. An HIWIN guide rail 4 is fixedly mounted on one side of the column body 3, with a slider 5 sliding along it. The HIWIN guide rail 4 provides precise linear motion guidance for the slider 5, ensuring it moves along a preset linear trajectory, thereby driving subsequent robotic arm components to perform precise position adjustments. A first-stage arm assembly 6 is snapped into one end of the slider 5, serving as a connection between the HIWIN guide rail 4 and the first-stage arm assembly 6, transmitting linear motion to the first-stage arm assembly 6. A second-stage arm assembly 7 is rotatably mounted on one end of the first-stage arm assembly 6; a test head assembly 8 is mounted on one end of the second-stage arm assembly 7 for detecting the clamping brake block.
[0039] like Figure 2 and Figure 3As shown, the first-stage arm assembly 6 includes a slider connecting plate 61 snapped onto one end of the slider 5. A set of first rotary joint supports 62 are fixedly mounted on one side of the slider connecting plate 61. The slider connecting plate 61 acts as a bridge connecting the slider 5 and other components of the first-stage arm assembly 6, transmitting the force and motion from the slider 5 to the subsequent components. A first rotary shaft 63 is rotatably mounted between the first rotary joint supports 62. The first rotary joint supports 62 provide rotational support for the first rotary shaft 63, allowing the first rotary shaft 63 to rotate around its own axis. A set of joint seats 64 are sleeved on the outer wall of the first rotary shaft 63. A joint center balance block 65 is fixedly mounted between the joint seats 64. The joint seats 64 provide support and connection for the rotation of the first-stage arm. One end of the joint center balance block 65 is sleeved with the first rotary shaft 63. The main function of the joint center balance block 65 is to balance the center of gravity of the first-stage arm during rotation, preventing unstable rotation due to center of gravity shift, and ensuring the stability and reliability of the first-stage arm during rotational operation. One end of the first rotating shaft 63 is provided with a first rotating shaft locking component 66 for limiting its movement. The first rotating shaft locking component 66 can lock the first rotating shaft 63 when needed to prevent unnecessary rotation, ensure the stability of the first step arm in a specific position, and improve testing accuracy and safety. A large-diameter thrust bearing 67 is provided through one end of the joint seat 64. A second rotating shaft 68 is rotatably mounted between the large-diameter thrust bearings 67. The large-diameter thrust bearings 67 can withstand large axial and radial loads, providing reliable support and smooth rotation conditions for the rotation of the second rotating shaft 68, ensuring that the second rotating shaft 68 will not jam or be damaged during rotation due to large loads. One end of the second rotating shaft 68 is fitted with a second rotating shaft locking component 69 for limiting its movement. Its function is similar to that of the first rotating shaft locking component 66, used to lock the second rotating shaft 68, ensuring that the relative position between the second step arm and the first step arm remains fixed when needed.
[0040] like Figure 2 and Figure 4As shown, the second-stage arm assembly 7 includes a second joint seat 71 sleeved on the outer wall of a large-diameter thrust bearing 67. A third rotating shaft 72 is rotatably mounted on one end of the second joint seat 71. The second joint seat 71 is a crucial support and connecting component of the second-stage arm assembly 7, connecting the second-stage arm to the first-stage arm via the large-diameter thrust bearing 67. A second rotating joint support 73 is sleeved on the outer wall of the third rotating shaft 72. The third rotating shaft 72 allows the second-stage arm to rotate relative to the second joint seat 71, enabling more flexible posture adjustment of the second-stage arm. A third rotating shaft locking assembly 74 is provided on one side of the second rotating joint support 73 to limit the position of the second joint seat 71. The third rotating shaft locking assembly 74 is sleeved on the second joint seat 71, limiting the rotation of the second-stage arm and ensuring that the second-stage arm remains in the required position during testing, preventing positional deviation due to external forces or other factors that could affect the test results.
[0041] like Figure 2 and Figure 5 As shown, the test head assembly 8 includes an indexing base 81 fixedly mounted on one end of the second rotary joint support 73. The indexing base 81 serves as the mounting foundation for the test head assembly, fixing it onto the second-stage arm assembly 7. Multiple plunger mounting blocks 82 are snap-fitted onto the outer wall of the indexing base 81. A fixed-position plunger 83 is located on one side of each plunger mounting block 82. The plunger mounting blocks 82 provide snap-fit mounting positions for other components, while the fixed-position plunger 83 positions and fixes other components, ensuring the relative positional relationship between different components and guaranteeing accuracy and stability during the testing process. A large-diameter indexing plate 84 is fixedly mounted on one side of the indexing base 81, and a rotating column 85 is located on one side of the large-diameter indexing plate 84. The large-diameter indexing plate 84 may be used to precisely control the rotation angle of the test head, enabling chip testing at different angles and improving the test coverage and accuracy. A large-diameter tapered bearing 86 is installed inside the rotating column 85. The large-diameter tapered bearing 86 provides support and smooth rotation for the rotating column 85, and has the ability to withstand large axial and radial loads, ensuring the stability and reliability of the rotating column 85 during rotation. A large-diameter bearing pressure plate 87 is provided on one side of the large-diameter tapered bearing 86, and a cylindrical locating pin 88 is provided on one side of the large-diameter bearing pressure plate 87. The large-diameter bearing pressure plate 87 is mainly used to fix and tighten the large-diameter tapered bearing 86, ensuring the normal operation of the bearing. The cylindrical locating pin 88 can position other components, ensuring assembly accuracy. A brake clamping assembly 89 is fixedly installed on the side wall of the indexing plate base 81. The brake clamping assembly 89 can clamp the large-diameter indexing plate 84 when needed, preventing its rotation and ensuring that the position of the test head remains stable during testing, avoiding test errors caused by rotation.
[0042] like Figure 3 , Figure 4 and Figure 6 As shown, the first rotating shaft locking assembly 66, the second rotating shaft locking assembly 69, and the third rotating shaft locking assembly 74 have the same structure and include a locking block 91. A mounting hole 92 is provided on one side of the locking block 91, and a handle mounting position 93 is provided on another side of the locking block 91. The locking block 91 provides basic structural support for the locking assembly. The mounting hole 92 can be used to install the locking assembly onto the corresponding rotating shaft. A handle 94 is internally threaded onto the handle mounting position 93. By operating the handle 94, the locking and unlocking operations of the corresponding rotating shaft can be easily realized, providing operators with a convenient operating method and improving the operability and ease of use of the equipment.
[0043] like Figure 5 and Figure 7 As shown, the brake clamping assembly 89 includes a brake clamping block 891, which is engaged with the large-diameter indexing plate 84. The brake clamping block 891, as a component that directly contacts the large-diameter indexing plate 84, realizes the clamping function. A mounting connection hole 892 is provided on one side of the brake clamping block 891. The mounting connection hole 892 can be used to install other components related to the clamping operation, such as transmission components that connect the clamping force. A handle mounting hole 893 is provided on one side of the brake clamping block 891, which can be used to install a handle, making it convenient for the operator to manually operate the brake clamping block 891 to perform clamping and releasing actions.
[0044] In addition, a guide rail clamp 15 is fixedly installed on the side of the slider connecting plate 61. The guide rail clamp 15 can brake the movement of the slider 5 when needed, so that it stops at the current position and ensures that the slider 5 remains stable when performing certain operations. A lower limit quick-release plug 16 is fixedly installed on one side of the slider connecting plate 61. The lower limit quick-release plug 16 can accurately position the lower limit position of the slider 5, ensuring that the slider 5 will not exceed the lower limit position during sliding, and avoiding collisions between the slider 5 and other components or damage to the equipment.
[0045] The working principle of this embodiment is as follows: First, through the cooperation of the HIWIN guide rail 4 and the slider 5, the robotic arm can move linearly in the vertical direction, and the height of the detection device can be adjusted to meet the detection requirements of chip test heads at different height positions.
[0046] The first rotation axis 63 and the second rotation axis 68 in the first-stage arm assembly 6, and the third rotation axis 72 in the second-stage arm assembly 7, constitute a multi-axis rotation system. By combining different angles of these three rotation axes, the test head assembly 8 can reach any position and orientation in three-dimensional space, thereby achieving omnidirectional testing of the chip test head.
[0047] The first rotating axis locking assembly 66, the second rotating axis locking assembly 69, and the third rotating axis locking assembly 74 can fix the rotating axes after the angles of each rotating axis are adjusted, ensuring the stability of the robotic arm during the detection process and preventing the accuracy of the detection results from being affected by the shaking of the robotic arm.
[0048] The indexing base 81 and large-diameter indexing plate 84 in the test head assembly 8, together with the fixed position plunger 83, can accurately position and fix the chip test head. During the testing process, components such as the large-diameter tapered bearing 86, the large-diameter bearing pressure plate 87, and the cylindrical positioning pin 88 ensure the stability and accuracy of the test head assembly 8 itself.
[0049] The brake clamping block 891 in the brake clamping assembly 89 can firmly clamp the chip test head by engaging with the large-diameter indexing plate 84, preventing the chip test head from shifting during the test and ensuring the reliability of the test results.
[0050] Furthermore, the feet 10 and casters 11 on the bottom surface of the base plate 1 allow the equipment to be moved when needed. Once in the appropriate position, the height of the feet 10 can be adjusted to secure the equipment stably on the workbench. The integrated bracket 12 on one side of the column body 3 can be used to install other auxiliary equipment, while the slider limit block 13 on the other side prevents the slider 5 from exceeding its limit position during movement, thus protecting the equipment. The top cover 14 on the top of the column body 3 prevents debris from falling into the equipment and affecting its normal operation. The guide rail clamp 15 on the side of the slider connecting plate 61 can fix the slider 5 to the guide rail when needed, and the lower limit quick-release plug 16 on the side of the slider connecting plate 61 can be used to determine the lower limit position of the slider 5, ensuring the safety and stability of the equipment operation.
[0051] The above specific embodiments are merely optional embodiments of this utility model. Based on the technical solution of this utility model and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above specific embodiments.
Claims
1. A robotic arm automated chip testing head detection device, characterized in that, include: A base plate (1) for support, a chassis base (2) is fixedly installed on the upper surface of the base plate (1), and a column body (3) is fixedly installed on the upper surface of the chassis base (2). An HIWIN guide rail (4) is fixedly installed on one side of the column body (3). A slider (5) is slidably installed on the HIWIN guide rail (4). A first-stage arm assembly (6) is snapped onto one end of the slider (5). The first-stage arm assembly (6) includes a slider connecting plate (61) snapped onto one end of the slider (5). A set of first rotary joint supports (62) is fixedly installed on one side of the slider connecting plate (61). A first rotary shaft (63) is rotatably installed between the first rotary joint supports (62). A set of joint seats (64) is sleeved on the outer wall of the first rotary shaft (63). A joint center balance block (65) is fixedly arranged between the joints. One end of the joint center balance block (65) is sleeved with a first rotating shaft (63). One end of the first rotating shaft (63) is provided with a first rotating shaft locking assembly (66) for limiting the position. One end of the joint seat (64) is provided with a large-diameter thrust bearing (67). A second rotating shaft (68) is rotatably arranged between the large-diameter thrust bearings (67). One end of the second rotating shaft (68) is sleeved with a second rotating shaft locking assembly (69) for limiting the position. One end of the first step arm assembly (6) is rotatably provided with a second step arm assembly (7). A test head assembly (8) is installed at one end of the second-stage arm assembly (7) for detecting the clamping brake block.
2. The robotic arm automated chip testing head detection device according to claim 1, characterized in that: The second stage arm assembly (7) includes a second joint seat (71) sleeved on the outer wall of the large-diameter thrust bearing (67). A third rotating shaft (72) is rotatably provided at one end of the second joint seat (71). A second rotating joint support (73) is sleeved on the outer wall of the third rotating shaft (72). A third rotating shaft locking assembly (74) for limiting the second joint seat (71) is provided on one side of the second rotating joint support (73). The third rotating shaft locking assembly (74) is sleeved with the second joint seat (71).
3. The robotic arm automated chip testing head detection device according to claim 2, characterized in that: The test head assembly (8) includes an indexing plate base (81) fixedly mounted on one end of the second rotary joint support (73). Multiple plunger mounting blocks (82) are snapped onto the outer wall of the indexing plate base (81). A fixed position plunger (83) is provided on one side of each plunger mounting block (82). A large diameter indexing plate (84) is fixedly mounted on one side of the indexing plate base (81). A rotating column (85) is provided on one side of the large diameter indexing plate (84). A large diameter tapered bearing (86) is installed inside the rotating column (85). A large diameter bearing pressure plate (87) is provided on one side of the large diameter tapered bearing (86). A cylindrical positioning pin (88) is provided on one side of the large diameter bearing pressure plate (87). A brake clamping assembly (89) is fixedly mounted on the side wall of the indexing plate base (81).
4. The robotic arm automated chip testing head detection device according to claim 3, characterized in that: The first rotating shaft locking assembly (66), the second rotating shaft locking assembly (69) and the third rotating shaft locking assembly (74) have the same structure and include a locking block (91). A mounting hole (92) is provided on one side of the locking block (91), and a handle mounting position (93) is provided on one side of the locking block (91). A handle (94) is threadedly connected to the inside of the handle mounting position (93).
5. The robotic arm automated chip testing head detection device according to claim 4, characterized in that: The brake clamping assembly (89) includes a brake clamping block (891), which is engaged with the large-diameter indexing plate (84). A mounting connection hole (892) is provided on one side of the brake clamping block (891), and a handle mounting hole (893) is provided on one side of the brake clamping block (891).
6. The robotic arm automated chip testing head detection device according to claim 1, characterized in that: The bottom surface of the base plate (1) is provided with multiple feet (10) and casters (11).
7. The robotic arm automated chip testing head detection device according to claim 1, characterized in that: One side of the column body (3) is fixedly provided with an integrated bracket (12), and the other side is fixedly provided with a slider limit block (13).
8. The robotic arm automated chip testing head detection device according to claim 1, characterized in that: The top of the column body (3) is fixedly provided with a top cover plate (14).
9. The robotic arm automated chip testing head detection device according to claim 1, characterized in that: A guide rail clamp (15) is fixedly provided on the side of the slider connecting plate (61), and a lower limiting quick plug (16) is fixedly provided on one side of the slider connecting plate (61).