Probe and insulation resistance tester
By designing probes and adhesive films with a contact surface greater than or equal to 2mm, accurate insulation resistance testing of the edge of solar cells can be achieved, solving the problem that existing instruments cannot easily test, and improving the accuracy and safety of the test.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-13
- Publication Date
- 2026-03-06
AI Technical Summary
Existing testing instruments are unable to accurately test the insulation resistance at the edge of solar cells, leading to leakage current, which may cause hot spot failure and safety accidents.
Design a probe with a contact surface length or area greater than or equal to 2 mm, employing a columnar structure and equipped with an adhesive film component to ensure line or surface contact, avoid piercing the coating, and improve test accuracy by combining a densely distributed probe design.
By using line contact or surface contact, false positives are reduced, test accuracy is improved, and missed detection of edge plating on solar cells is avoided, thus ensuring the safety of solar cells.
Smart Images
Figure CN223977271U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of solar cell technology and solar cell testing technology, and in particular to a probe and insulation resistance tester. Background Technology
[0002] During the fabrication of solar cells, when depositing polycrystalline silicon (POLY) on the back of the cell, some POLY is deposited around the side edge of the cell to the front edge. This plating can cause the positive and negative electrodes to become conductive at the edge of the cell after screen printing. The most direct manifestation of this is leakage current. Cells with leakage current will experience hot spot failure at the module end, and a hot spot failure solar panel will short-circuit and burn through during operation, causing a serious safety accident.
[0003] Because leakage current parameter testing is required for finished solar cells, the testing instruments commonly used on production lines are difficult to accurately test the edges of silicon wafers. The probes are too sharp and can easily damage the silicon wafer surface, and because the silicon wafer surface is very smooth, it is prone to lateral slippage.
[0004] It should be noted that the above content is not necessarily prior art, nor is it intended to limit the scope of patent protection of this application. Summary of the Invention
[0005] This application provides a probe and an insulation resistance tester to solve or alleviate one or more of the technical problems mentioned above.
[0006] As one aspect of the embodiments of this application, this application provides a probe, including a probe body, the probe body including a contact surface for contacting a test object, the length of the contact surface in at least one direction being greater than or equal to 2 mm; or the area of the contact surface being greater than or equal to 2 mm². 2 .
[0007] In one embodiment, the contact surface is circular or polygonal in shape; the probe body is cylindrical.
[0008] In one embodiment, the probe further includes a film element bonded to a first side of the probe body, the first side being the side of the probe body facing away from the center of the test object; the film element is made of rubber material.
[0009] In one embodiment, the height of the adhesive film is higher than or lower than the height of the probe body; the height difference between the adhesive film and the probe body is 1-3 mm.
[0010] In one embodiment, the contact surface includes a first edge and a second edge opposite to each other; the first edge is an edge of the contact surface that is away from the center of the test object; the length of the first edge is greater than or equal to the length of the second edge.
[0011] In one implementation, the length of the first edge is less than or equal to 1 / 5 of the edge length of the test object.
[0012] As another aspect of the embodiments of this application, this application provides an insulation resistance tester, including:
[0013] The first test board includes a first cover plate and a plurality of first probes; the plurality of first probes are evenly distributed in the edge region of the first cover plate.
[0014] The second test board includes a second cover plate and multiple second probes; the multiple second probes are evenly distributed in the edge region of the second cover plate.
[0015] In this configuration, when the first test board and the second test board are closed, multiple first probes are respectively positioned opposite to multiple second probes; the first probes and the second probes are probes from any of the above embodiments.
[0016] In one embodiment, the spacing between adjacent first probes / second probes is 2-5 mm.
[0017] In one embodiment, the first probe includes a first probe body and a first adhesive film; the second probe includes a second probe body and a second adhesive film; the height of the first adhesive film is higher than the height of the first probe body, the height of the second adhesive film is lower than the height of the second probe body, and a first height difference and a second height difference are adapted to each other, the first height difference being the height difference between the first adhesive film and the first probe body, and the second height difference being the height difference between the second adhesive film and the second probe body.
[0018] In one embodiment, the first height difference is less than the second height difference, and the difference between the two is 1-3 mm.
[0019] This application embodiment achieves reduced false positives and improved test accuracy by making line or surface contact between the probe and the battery cell, avoiding the probe piercing the coating and making contact with the conductive parts of the battery cell. Attached Figure Description
[0020] In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the various drawings denote the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings depict only some embodiments disclosed in this application and should not be construed as limiting the scope of this application.
[0021] Figure 1 This diagram illustrates the structure of an existing probe for testing the insulation resistance of a solar cell.
[0022] Figure 2The diagram shows the circuit connection structure when the probe performs an insulation resistance test.
[0023] Figure 3 This diagram shows another circuit connection structure for the probe to perform an insulation resistance test.
[0024] Figure 4 This diagram illustrates the structure of a probe used to test the insulation resistance of a solar cell according to an embodiment of this application.
[0025] Figure 5 This paper shows a schematic diagram of the insulation resistance tester provided in an embodiment of this application. Detailed Implementation
[0026] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other. The application will now be described in detail with reference to the accompanying drawings and embodiments.
[0027] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such terms can be used interchangeably where appropriate so that the embodiments of this application described herein can be implemented, for example, in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0028] In this application, when numerical intervals (i.e., numerical ranges) are involved, unless otherwise specified, the distribution of selectable numerical values within the numerical interval is considered continuous, and includes the two endpoints of the numerical interval (i.e., the minimum and maximum values), as well as every numerical value between these two endpoints. Unless otherwise specified, when a numerical interval refers only to integers within that numerical interval, it includes the two endpoint integers of the numerical range, as well as every integer between the two endpoints, which is equivalent to directly listing every integer. When multiple numerical ranges are provided to describe features or characteristics, these numerical ranges can be merged. In other words, unless otherwise specified, the numerical ranges disclosed in this application should be understood to include any and all subranges included therein. The "numerical value" in the numerical interval can be any quantitative value, such as a number, percentage, ratio, etc. The term "numerical interval" can be broadly included to include percentage intervals, ratio intervals, proportion intervals, etc.
[0029] Exemplary embodiments according to this application will now be described in more detail with reference to the accompanying drawings. It should be understood that these exemplary embodiments may be implemented in many different forms and should not be construed as being limited to the embodiments set forth herein.
[0030] Figure 1 This diagram illustrates the structure of an existing probe for testing the insulation resistance of a solar cell. Figure 2 The diagram shows the circuit connection structure when the probe performs an insulation resistance test. Figure 3 This diagram illustrates another circuit connection structure for insulation resistance testing using a probe. (Example:) Figures 1 to 3 As shown, where, Figure 2 This is a schematic diagram showing the edge coating phenomenon of solar cell 600. The yellow coating in solar cell 600 is the edge coating layer 601. Figure 3 This is a schematic diagram of the structure of a high-quality solar cell 600 without any coating defects. When the insulation resistance tester 300 uses the existing probe 100 to perform insulation resistance testing, the tip of the probe 100 is pointed and makes point contact with the surface of the cell 600. This can easily pierce the coating 601 and come into contact with the conductive part of the cell 600. As a result, when coating defects are present in the solar cell 600, they are not detected and are mistakenly judged as qualified cells, affecting the product quality of the cell 600.
[0031] This application provides a probe 100. Figure 4 This illustration shows a schematic diagram of the structure of the probe 100 provided in this application when testing the insulation resistance of a solar cell 600. Figure 4 As shown, the probe 100 includes a probe body 110, which includes a contact surface (not shown) for contacting the test object, and the length of the contact surface in at least one direction is greater than or equal to 2 mm.
[0032] In the contact surface of probe 100, a line segment formed by connecting two critical points can be generated in any direction along 360°. As long as the length in one direction is greater than or equal to 2mm, it indicates that the contact between the contact surface and the solar cell 600 is at least not a point contact, but at least a line contact or a surface contact.
[0033] In this embodiment, the probe 100 makes line contact or surface contact with the battery cell 600, thereby avoiding the probe 100 piercing the conductive part of the coating 601 and the battery cell 600, thus reducing misjudgments and improving test accuracy.
[0034] In this embodiment of the application, by limiting the length of the contact surface in at least one direction to be greater than or equal to 2 mm, it is ensured that the probe 100 and the battery cell 600 are at least in line contact or surface contact.
[0035] In some other examples, the probe 100 and the battery cell 600 may be in line contact or surface contact by means of a length greater than or equal to 1.5 mm in at least one direction of the contact surface. These implementations are all within the protection scope of the embodiments of this application.
[0036] In one embodiment, the area of the contact surface is greater than or equal to 2 mm. 2 .
[0037] This application embodiment limits the contact surface area to be greater than or equal to 2mm. 2 This ensures that the contact surface has a certain area, guaranteeing that the probe 100 and the battery cell 600 are in surface contact. This surface contact method further ensures that the probe 100 will not pierce the coating 601 and come into contact with the conductive part of the battery cell 600.
[0038] In one embodiment, the contact surface is circular or polygonal in shape.
[0039] As long as the contact surface of probe 100 has a certain area, it can achieve surface contact with the battery cell 600. The shape of the contact surface can be arbitrary, such as a circle or a polygon. The circle includes a perfect circle and an ellipse, and the polygon can include irregular polygons.
[0040] In a preferred example, the shape of the contact surface can be circular, triangular, quadrilateral, pentagonal, or hexagonal, etc.
[0041] In one embodiment, the probe body 110 is cylindrical.
[0042] The probe body 110 is cylindrical, which makes the top and bottom of the probe body 110 have the same width. When applying pressure to the battery cell 600, the force is more concentrated and uniform, which can further ensure stable contact between the probe 100 and the battery cell 600 without damaging the coating 601.
[0043] In one example, the contact surface is circular, while the probe body 110 can be cylindrical.
[0044] In one embodiment, the probe 100 further includes an adhesive film 120, which is bonded to a first side of the probe body 110. The first side is the side of the probe body 110 that is away from the center of the test object.
[0045] like Figure 5As shown, the probe 100 is disposed inside the housing of the insulation resistance tester 300. The adhesive film 120 is bonded to the first side of the probe body 110, that is, the adhesive film 120 is disposed near the side wall 350 of the housing. By disposing of the adhesive film 120 on the first side of the probe 100, the entire probe 100 can be made to adhere to the side wall 350 of the housing, keeping the vertical direction of the probe body 110 vertical and preventing deformation of the probe body 110.
[0046] In one example, the adhesive film 120 can be in elastic contact with the side wall 350 of the box, for example, the side wall 350 of the box is provided with a sponge pad; the adhesive film 120 is made of a rubber material that is not easily deformed. When the adhesive film 120 is attached to the side wall 350 of the box, it can ensure that the probe 100 is pushed to a position close to the edge of the battery cell 600, so as to avoid the probe 100 not making good contact with the battery cell 600 and being misjudged as having a plating phenomenon.
[0047] In one embodiment, the adhesive film 120 is made of rubber material. The adhesive film 120, being made of rubber material, can be a material that is not easily deformed and is easy to bond with the probe 100.
[0048] In one embodiment, the height of the adhesive film 120 is higher than the height of the probe body 110, or lower than the height of the probe body 110.
[0049] like Figure 4 As shown, by adjusting the height of the probe body 110 in at least one of the two opposing probes 100, the position of the battery cell 600 can be defined when the battery cell 600 is clamped, preventing the probe 100 from moving close to the center of the battery cell 600, and preventing the coating from being undetected at the edge of the battery cell 600.
[0050] In one embodiment, the height difference between the adhesive film 120 and the probe body 110 is 1-3 mm. If the height difference between the adhesive film 120 and the probe body 110 is too high, it will be inconvenient for the two opposing probes 100 to clamp the battery cell 600, and the protruding adhesive film 120 will not easily pass through the edge of the battery cell 600, thus affecting the efficiency of clamping the battery cell 600. The height difference between the adhesive film 120 and the probe body 110 cannot be too small, otherwise it will be difficult to achieve the effect of defining the position of the battery cell 600. The minimum height difference between the adhesive film 120 and the probe body 110 can be adapted to the thickness of the battery cell 600.
[0051] In this embodiment of the application, the height difference between the adhesive film 120 and the probe body 110 is limited to 1-3mm, for example, 1mm, 2mm or 3mm, so that the adhesive film 120 can have the function of limiting the position of the battery cell 600 without affecting the clamping efficiency of the battery cell 600.
[0052] In one embodiment, the contact surface includes a first edge and a second edge opposite to each other; the first edge is an edge of the contact surface that is away from the center of the test object; the length of the first edge is greater than or equal to the length of the second edge.
[0053] The length of the first edge is greater than the length of the second edge, which can ensure that when the probe body 110 clamps the battery cell 600, it is firmly clamped at the outer edge of the battery cell 600.
[0054] In one implementation, the length of the first edge is less than or equal to 1 / 5 of the edge length of the test object.
[0055] The first edge is the long edge, and the length of the long edge is less than or equal to 1 / 5 of the edge length of the test object. That is, along one edge of the test object, at least 5 probes 100 can be distributed and clamped to one edge of the battery cell 600.
[0056] This application also provides an insulation resistance tester, such as... Figure 5 As shown, the insulation resistance tester 300 includes a first test board and a second test board.
[0057] The first test plate includes a first cover plate 310 and a plurality of first probes 330; the plurality of first probes 330 are evenly distributed in the edge region of the first cover plate 310. The first cover plate 310 may be an open box shape, including a side wall 350, and the plurality of first probes 330 are arranged close to the side wall 350.
[0058] The second test plate includes a second cover plate 320 and a plurality of second probes 340; the plurality of second probes 340 are evenly distributed in the edge region of the second cover plate 320.
[0059] With the first test plate and the second test plate closed, a plurality of first probes 330 are respectively disposed opposite to a plurality of second probes 340; the first probes 330 and the second probes 340 are probes in any of the above embodiments.
[0060] The first probe 330 and the second probe 340 respectively clamp the upper and lower surfaces of the battery cell, and the edge resistance of the multiple battery cells is tested. If the resistance value is large, it indicates that there is plating around the edge position clamped by the first probe 330 or the second probe 340. Both the first probe 330 and the second probe 340 are probes provided in the above embodiment, which can avoid the situation where the plating around the edge of the battery cell is pierced by the probe and cause misjudgment, thereby improving the test accuracy.
[0061] In one embodiment, the spacing between adjacent first probe 330 / second probe 340 is 2-5 mm.
[0062] In the above embodiments, when the probe body is columnar, the spacing between adjacent probes can be smaller. Compared with the existing method, the probes can be set more densely, thereby testing multiple positions on the edge of the battery cell and avoiding misjudgment caused by small areas of the coating area not contacting the probe.
[0063] The embodiments of this application can reduce the area of the battery cell edge that is missed by densely distributing probes, thereby improving the accuracy of the test.
[0064] In one embodiment, the first probe 330 includes a first probe 330 body and a first adhesive film; the second probe 340 includes a second probe 340 body and a second adhesive film; the height of the first adhesive film is higher than the height of the first probe 330 body, the height of the second adhesive film is lower than the height of the second probe 340 body, and a first height difference and a second height difference are matched, the first height difference being the height difference between the first adhesive film and the first probe 330 body, and the second height difference being the height difference between the second adhesive film and the second probe 340 body.
[0065] In one embodiment, the first height difference is less than the second height difference, and the difference between the two is 1-3 mm.
[0066] The first height difference is smaller than the second height difference, creating a gap between the two opposing adhesive film components. Since the probe body is elastic, when the two opposing probe bodies clamp the battery cell, they will compress each other due to elasticity. However, the adhesive film components are not elastic. Therefore, maintaining a certain gap prevents the two adhesive film components from colliding and affecting the clamping of the battery cell by the two opposing probe bodies.
[0067] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.
[0068] For ease of description, directional terms such as "front, back, up, down, left, right," "horizontal, vertical, horizontal," and "top, bottom" generally indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings. These terms are used solely for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as limiting the scope of protection of this application. The directional terms "inner" and "outer" refer to the inner or outer contours relative to the components themselves. For example, if a device in the drawings is inverted, a device described as "above" or "on top of" other devices or structures will subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.
[0069] Unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a communication connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0070] Unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0071] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values of the components and steps described in these embodiments do not limit the scope of this application. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items; therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.
[0072] It should also be noted that the terms "one embodiment," "another embodiment," or "embodiment" used in this specification refer to specific features, structures, or characteristics described in connection with that embodiment, which are included in at least one embodiment described in the general description of this application. The appearance of the same expression in multiple places in the specification does not necessarily refer to the same embodiment. Furthermore, when a specific feature, structure, or characteristic is described in connection with any embodiment, the intention is to suggest that implementing such a feature, structure, or characteristic in conjunction with other embodiments also falls within the scope of this application.
[0073] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0074] It should also be noted that the above are merely preferred embodiments of this application and do not limit the scope of patent protection of this application. Any equivalent structural or procedural changes made using the content of this application’s specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of this application.
Claims
1. A probe, characterized in that, A probe body comprising a contact surface for contacting a test object, the length of the contact surface in at least one direction being greater than or equal to 2 mm; or the area of the contact surface being greater than or equal to 2 mm 2 .
2. The probe of claim 1, wherein The contact surface is circular or polygonal in shape; and the probe body is columnar.
3. The probe of claim 1, wherein The probe further comprises a rubber film member attached to a first side of the probe body, the first side being a side of the probe body away from the center of the test object; and the rubber film member is made of rubber material.
4. The probe of claim 3, wherein The height of the rubber film member is higher or lower than the height of the probe body; and the height difference between the rubber film member and the probe body is 1-3 mm.
5. The probe according to any one of claims 1 to 4, characterized in that, The contact surface comprises opposite first and second edges; the first edge is an edge of the contact surface away from the center of the test object; and the length of the first edge is greater than or equal to the length of the second edge.
6. The probe of claim 5, wherein The length of the first edge is less than or equal to 1 / 5 of the length of the edge of the test object.
7. An insulation resistance tester characterized by comprising: The test plate comprises: a first test plate comprising a first cover plate and a plurality of first probes; the first probes are uniformly distributed in the edge region of the first cover plate; a second test plate comprising a second cover plate and a plurality of second probes; and the second probes are uniformly distributed in the edge region of the second cover plate; wherein, when the first test plate and the second test plate are closed, the first probes and the second probes are arranged opposite to each other; and the first probe and the second probe are the probe as claimed in any one of claims 1-6.
8. The insulation resistance tester of claim 7, wherein, The distance between adjacent first / second probes is 2-5 mm.
9. The insulation resistance tester of claim 7, wherein, The first probe comprises a first probe body and a first rubber film member; and the second probe comprises a second probe body and a second rubber film member; the height of the first rubber film member is higher than the height of the first probe body, the height of the second rubber film member is lower than the height of the second probe body, and the first height difference and the second height difference are matched; the first height difference is the height difference between the first rubber film member and the first probe body, and the second height difference is the height difference between the second rubber film member and the second probe body.
10. The insulation resistance tester of claim 9, wherein, The first height difference is less than the second height difference, and the difference between the two is 1-3 mm.