Probe card dismounting tool
By using a protective cover and push rod design for the probe card disassembly fixture, the problem of probe damage in traditional disassembly methods is solved, achieving a safe and efficient disassembly process and reducing maintenance costs.
Patent Information
- Application Number
- CN202520399727.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-07
- Publication Date
- 2026-03-06
- Estimated Expiration
- 2035-03-07
AI Technical Summary
Traditional methods of disassembling probe card connectors can easily damage the probes, increasing the difficulty of replacing connectors and maintenance costs.
A probe card disassembly fixture was designed, including a protective cover and a push rod. The protective cover stably connects the part to be disassembled, and the push rod is used to gradually separate the part to be disassembled from the main body to avoid direct contact with the probe. The position of the push rod is adjusted by a guide block and a limiting plate to achieve safe and efficient disassembly.
It effectively protects the probe from damage, reduces the risk during disassembly, improves disassembly efficiency, and reduces maintenance costs.
Smart Images
Figure CN223977276U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of probe card testing tools, and in particular to a probe card disassembly fixture. Background Technology
[0002] Probe cards (such as 3D MEMS pin cards) typically include components such as MEMS probes, PCB substrates, reinforcement plates, and connectors.
[0003] During the use and maintenance of probe cards, the internal connectors are usually replaced to ensure the performance of the probe cards. Replacing the connectors requires disassembling the probe card. Traditional disassembly methods usually involve direct contact with the probe card, which can easily damage the delicate probes. In particular, when external force is applied during disassembly, the probes may bend or break due to uneven external force. Therefore, extra care must be taken with the disassembly steps and force when replacing the connectors, which increases the difficulty of replacing the connectors and increases the maintenance cost. Utility Model Content
[0004] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a probe card disassembly fixture to solve the problem of probes being damaged during connector disassembly.
[0005] This utility model provides a probe card disassembly fixture, including: a protective cover;
[0006] A mounting structure is provided on the protective cover; the mounting structure has a mounting part that protrudes from the protective cover;
[0007] The push rod is movably fixed to the mounting part via a guide block; the guide block has a channel, and the push rod can move along the defined direction of the channel.
[0008] Based on the probe card disassembly fixture described above, when disassembling and assembling the probe card, firstly, a protective cover is placed on the part to be disassembled, and the protective cover is stably connected to the part to be disassembled, so that the probe part is protected from external interference or damage, and can also provide stable support for the separation of the part to be disassembled from the main body; then, the push rod is adjusted so that it abuts against the part to be disassembled, and the push rod is further adjusted to push the part to be disassembled, so that the part to be disassembled is gradually separated from the main body, thereby achieving safe and efficient separation of the part to be disassembled and avoiding damage to the probe.
[0009] In one embodiment of the probe card disassembly fixture described above, the mounting structure includes a guide rod with a groove, and the guide block slides in conjunction with the groove.
[0010] Furthermore, based on the aforementioned probe disassembly fixture, the relative position of the push rod and the part to be disassembled can be adjusted by moving the guide block.
[0011] In one embodiment of the probe card disassembly fixture described above, the channel is provided with an internal thread, the side of the push rod is provided with an external thread that mates with the internal thread, and one end of the push rod extending out of the guide block is used to abut against the part of the component to be disassembled.
[0012] Furthermore, based on the aforementioned channel configuration, the top rod can be gradually adjusted, improving stability during disassembly.
[0013] In one embodiment of the probe card disassembly fixture described above, the mounting structure further includes a limiting plate sleeved on the push rod. The limiting plate is detachably connected to the guide block. After the limiting plate is connected to the guide block, it cooperates to clamp the side wall of the slide groove to restrict the movement of the guide block.
[0014] Furthermore, based on the connection between the limiting plate and the guide block, the guide block can be restricted to stabilize the push rod.
[0015] In one embodiment of the probe card disassembly fixture described above, the guide block and the guide rod are detachably connected.
[0016] Furthermore, the detachable design based on the guide blocks allows for easier storage and assembly of the fixture.
[0017] In one embodiment of the probe card disassembly fixture described above, one end of the push rod is provided with a pad;
[0018] And / or,
[0019] The other end of the push rod is equipped with a handle.
[0020] Furthermore, based on the aforementioned probe card disassembly fixture, the padding layer can reduce wear on the parts to be disassembled and extend the service life of the push rod; while the handle design improves the ease of push rod adjustment.
[0021] In one embodiment of the probe card disassembly fixture described above, there are at least two push rods that are equidistantly spaced around the outer side of the circumference of the protective cover.
[0022] Furthermore, based on the aforementioned push rod configuration, the push rods at multiple specific locations can apply force evenly to the part to be disassembled, reducing the possibility of the probe bending or breaking due to uneven force.
[0023] In one embodiment of the probe card disassembly fixture described above, the protective cover includes a cover body and a frame connected together, and the frame is provided with at least one fixing structure that is detachably connected to the part to be disassembled.
[0024] Furthermore, based on the aforementioned protective cover, the material settings of the cover body and frame can be flexibly adjusted to balance the overall quality and service life of the protective cover and reduce adverse effects on the probe.
[0025] In one embodiment of the probe card disassembly fixture described above, the cover is a transparent cover.
[0026] Furthermore, the aforementioned cover allows users to easily observe the status of the probe.
[0027] In one embodiment of the probe card disassembly fixture described above, the fixture further includes a bracket with a preset height for supporting the protective cover.
[0028] Furthermore, based on the aforementioned bracket, more operational space is provided for the installation and use of the push rod.
[0029] The above-described one or more embodiments of this utility model have at least one or more of the following beneficial effects:
[0030] When installing or removing the probe card, first place the protective cover on the part to be removed and stably connect the protective cover to the part to be removed. This protects the probe from external interference or damage and provides stable support for the separation of the part to be removed from the main body. Then, adjust the push rod so that it abuts against the part to be removed and continue to adjust the push rod to push the part to be removed, so that the part to be removed gradually separates from the main body. This achieves safe and efficient separation of the part to be removed and avoids damage to the probe.
[0031] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description
[0032] The disclosure of this utility model will become more readily understood with reference to the accompanying drawings. It will be readily understood by those skilled in the art that these drawings are for illustrative purposes only and are not intended to limit the scope of protection of this utility model. Furthermore, similar numbers in the drawings are used to denote similar components, wherein:
[0033] Figure 1 This is a schematic diagram of a probe card disassembly fixture provided in an embodiment of this application;
[0034] Figure 2 This is a top view of a probe card disassembly fixture provided in an embodiment of this application;
[0035] Figure 3 This is a front view of a probe card disassembly fixture provided in an embodiment of this application;
[0036] Figure 4 yes Figure 3 Enlarged view of point A in the middle.
[0037] Explanation of reference numerals in the attached figures
[0038] 1. Protective cover; 11. Frame; 12. Cover body; 2. Mounting structure; 21. Guide block; 22. Guide rod; 221. Slide groove; 23. Limiting plate; 3. Push rod; 31. Pad layer; 32. Handle; 4. Fixing structure. Detailed Implementation
[0039] Some embodiments of the present invention will now be described with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are merely illustrative of the technical principles of the present invention and are not intended to limit the scope of protection of the present invention.
[0040] When using tools to replace the connector of a probe card, the probe card is usually in direct contact, which can easily damage the delicate probes. Especially when external force is applied during disassembly, the probes may bend or break due to uneven external force, which increases the difficulty of connector replacement and increases maintenance costs.
[0041] Therefore, this application creatively proposes a probe card disassembly fixture, which includes a protective cover, a mounting structure, and a push rod. When disassembling or assembling a probe card, the protective cover is first placed on the part to be disassembled, and the protective cover can be stably connected to the part to be disassembled, so that the probe part is protected from external interference or damage, and can also provide stable support for the separation of the part to be disassembled from the main body. Then, the push rod is adjusted so that it abuts against the part to be disassembled, and the push rod is further adjusted to push the part to be disassembled, so that the part to be disassembled gradually separates from the main body, thereby achieving safe and efficient separation of the part to be disassembled and avoiding damage to the probe.
[0042] The present invention will be specifically described below through specific embodiments.
[0043] Reference Figures 1 to 4 As shown, this application provides a probe card disassembly fixture, which includes a protective cover 1, a mounting structure 2, and a push rod 3. The mounting structure 2 is disposed on the protective cover 1. The mounting structure 2 has a mounting part that protrudes from the protective cover 1. The push rod 3 is movably fixed to the mounting part by a guide block 21. The guide block 21 has a channel, and the push rod 3 can move along the defined direction of the channel.
[0044] It should be noted that in this embodiment, the component to be disassembled is a probe card, and the part to be disassembled is the connector of the probe card. Of course, it can also be any other electronic component or mechanical structure capable of disassembly. In some embodiments, the protective cover 1 is detachably installed on the component to be disassembled, thereby providing stable support for the separation of the part to be disassembled from the main body.
[0045] In addition, when the push rod 3 pushes the part to be disassembled, it can choose to make direct contact, that is, the push rod 3 has a part that abuts against the part to be disassembled, and this part can move in the direction of approaching or moving away from the part to be disassembled (i.e., the axis of the protective cover 1). Alternatively, it can choose to make indirect contact, such as the push rod 3 releasing gas with a certain pressure to push the part to be disassembled. The magnitude of the pushing force can be adjusted by adjusting the gas pressure and / or moving the push rod 3 to adjust the distance between the air outlet and the part to be disassembled.
[0046] It is understood that the protective cover 1 can be a regular shape such as a disc or a square, or other irregular shapes, as long as it covers the probe portion and does not affect the disassembly of the probe card connector. In this embodiment, the protective cover 1 is disc-shaped.
[0047] Specifically, when disassembling and assembling the probe card, firstly, the protective cover 1 is placed on the part to be disassembled, and the protective cover 1 is stably connected to the part to be disassembled, so that the probe part is protected from external interference or damage, and can also provide stable support for the separation of the part to be disassembled from the main body; then, the push rod 3 is adjusted so that it abuts against the part to be disassembled, and the push rod 3 is further adjusted to push the part to be disassembled, so that the part to be disassembled is gradually separated from the main body, thereby achieving safe and efficient separation of the part to be disassembled and avoiding damage to the probe.
[0048] In some embodiments, the push rod 3 is slidably connected to the guide block 21 or threadedly connected to it.
[0049] It should be noted that the push rod 3 should be adjusted gradually to avoid impacting the probe card. Specifically, this can be achieved through the connection between the push rod 3 and the guide block 21. For example, a threaded connection can be used to allow for gradual adjustment of the push rod 3, or the push rod 3 can be slidably connected to the mounting structure 2, but with a damping structure at the sliding connection point to ensure that the push rod 3 can only be adjusted gradually.
[0050] In some embodiments, refer to Figure 1 As shown, there are at least two push rods 3, which are equally spaced around the outer side of the perimeter of the protective cover 1. By using multiple push rods 3 that are equally spaced, balanced force can be applied to the part to be disassembled at multiple points, ensuring that the part to be disassembled can be pushed smoothly.
[0051] In some embodiments, refer to Figure 1 and Figure 2 As shown, the mounting structure 2 includes a guide rod 22 with a groove 221, and the guide block 21 slides in conjunction with the groove 221.
[0052] In some embodiments, the channel is provided with an internal thread, and the side of the push rod 3 is provided with an external thread that mates with the internal thread. One end of the push rod 3 that extends out of the guide block 21 is used to abut against the part of the component to be disassembled.
[0053] It is understandable that the number of guide blocks 21 and guide rods 22 in the installation structure 2 can be adjusted according to the number of push rods 3. For example, a set of guide blocks 21 and guide rods 22 corresponds to one push rod 3, so that the push rods 3 can be relatively independent, so that a certain push rod 3 can be pushed and adjusted individually for the part to be disassembled.
[0054] Specifically, by moving the guide block 21, the relative position of the push rod 3 and the part to be disassembled can be adjusted to change the force application point of the part to be disassembled, thereby applying a balanced force to the entire force-bearing surface of the part to be disassembled; at the same time, the position of each push rod 3 can be flexibly adjusted according to the actual shape of the part to be disassembled and the disassembly requirements, so as to realize the flexible adjustment of the force application point of the push rod 3.
[0055] Furthermore, in some embodiments, reference is made to... Figure 3 and Figure 4 As shown, the mounting structure 2 also includes a limiting plate 23 sleeved on the push rod 3. The limiting plate 23 is detachably connected to the guide block 21. After the limiting plate 23 is connected to the guide block 21, it cooperates to clamp the side wall of the slide groove 221 to restrict the movement of the guide block 21.
[0056] It should be noted that the cross-sectional shape of the slide groove 221 can be any shape, such as I-shaped or dovetail-shaped, as long as it allows the guide block 21 to slide smoothly within the slide groove 221. In this embodiment, the cross-sectional shape of the slide groove 221 is I-shaped, and correspondingly, the guide block 21 is T-shaped. After being connected with the limiting plate 23, it forms an I-shaped structure, which can clamp the slide groove 221, thereby fixing it to a designated position within the slide groove 221.
[0057] It is understood that the detachable connection between the limiting plate 23 and the guide block 21 can be any of the following: bolt connection, snap-fit connection, or plug-in connection. In this embodiment, the limiting plate 23 and the guide block 21 are bolted together, meaning that mounting holes can be provided on both the guide block 21 and the guide block 21, and at least one of the mounting holes has an internal thread. Then, the bolt is screwed into both mounting holes to the installation position.
[0058] Specifically, when adjusting the position of push rod 3, the limiting plate 23 and guide block 21 are not yet assembled. At this time, guide block 21 can be moved quickly and easily. After the position of push rod 3 is adjusted, the limiting plate 23 and guide block 21 are assembled so that the limiting plate 23 and guide block 21 cooperate to clamp the two opposite side walls of slide groove 221, thereby fixing guide block 21 on guide rod 22 and ensuring the stability of push rod 3 when pushing the part to be disassembled.
[0059] In some embodiments, multiple right-angled triangular teeth arranged at equal intervals can be provided along the length direction of the slide groove 221, and a slot is formed between adjacent teeth. The guide block 21 is provided with an elastic metal sheet that is adapted to the slot. When the elastic metal sheet is engaged in the slot, the guide block 21 is fixed in the slide groove 221. When a lateral force is applied to the guide block 21, the elastic metal sheet deforms and moves out of the slot, and then into the next slot, thereby realizing the position adjustment of the guide block 21.
[0060] In some embodiments, refer to Figure 2 and Figure 4 As shown, the guide block 21 and the guide rod 22 are detachably connected. The detachable design of the guide block 21 allows the fixture to be disassembled and assembled, facilitating its storage and use.
[0061] In some embodiments, refer to Figure 4 As shown, one end of the push rod 3 is provided with a pad 31; and / or, the other end of the push rod 3 is provided with a handle 32. The pad 31 reduces wear on the part of the push rod 3 to be disassembled. In this embodiment, the pad 31 is made of rubber. The handle 32 facilitates the user in applying force to the push rod 3.
[0062] In some embodiments, the protective cover 1 includes a cover body 12 and a frame 11 connected together, and the frame 11 is provided with at least one fixing structure 4 that is detachably connected to the part to be disassembled.
[0063] In some embodiments, the cover 12 is a transparent cover 12 to allow staff to observe the probe portion. In this embodiment, the cover 12 is made of high-strength, lightweight materials such as acrylic sheet and polycarbonate, which ensures the durability of the fixture without putting additional pressure on the probe card.
[0064] It should be noted that the fixing structure 4 can be any structure that can achieve a stable and detachable connection between the fixture and the probe card, such as a bolt structure or a snap-fit structure. In this embodiment, the fixing structure 4 includes mounting holes and bolts, and multiple fixing structures 4 are equally spaced along the circumference of the frame 11, so that the frame 11 and the probe card are uniformly connected.
[0065] In some embodiments, the fixture further includes a bracket with a preset height for supporting the protective cover 1. By providing the bracket, the protective cover 1 can be raised, thereby leaving sufficient height space for the installation and use of the push rod 3.
[0066] Specifically, when disassembling the connector of the probe card, first place the protective cover 1 (the side with the mounting structure 2) on the bracket, then place the front of the probe card opposite the protective cover 1 and place the probe card on the protective cover 1 to protect the probe part of the probe card from damage. Then assemble the guide block 21, the limiting plate 23 and the push rod 3, and insert the guide block 21 into the slide groove 221. Then push the guide block 21 to move the push rod 3 directly below the part to be disassembled (the connector). Then assemble the limiting plate 23 and the guide block 21 so that the push rod 3 is restricted directly below the part to be disassembled. Then screw the push rod 3 so that each push rod 3 abuts against the part to be disassembled. Then screw the push rod 3 as simultaneously as possible to push the part to be disassembled and the main body to be separated evenly, thereby achieving safe, efficient and low-cost separation of the disassembled parts and avoiding damage to the probe.
[0067] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0068] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this utility model, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0069] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.
Claims
1. A probe card dismounting jig characterized by comprising: The tool comprises: a protective cover; a mounting structure provided on the protective cover, the mounting structure having a mounting portion protruding from the protective cover; a push rod movably fixed to the mounting portion via a guide block, the guide block being provided with a channel along which the push rod is movable.
2. The probe card dismounting jig according to claim 1, characterized by The mounting structure comprises a guide rod having a sliding groove, and the guide block is in sliding fit with the sliding groove.
3. The probe card disassembly jig according to claim 1, wherein The channel is internally threaded, and the push rod is externally threaded on a side surface thereof, and an end of the push rod protruding from the guide block is used for abutting against a to-be-disassembled part of the to-be-disassembled component.
4. The probe card disassembly jig according to Claim 2, wherein The mounting structure further comprises a limiting plate sleeved on the push rod, the limiting plate being detachably connected with the guide block, and the limiting plate and the guide block are connected to cooperatively clamp a side wall of the sliding groove to limit movement of the guide block.
5. The probe card disassembly jig according to claim 2, wherein The guide block and the guide rod are detachably connected.
6. The probe card disassembly jig according to claim 3, wherein An end of the push rod is provided with a cushion layer. And / or, the other end of the push rod is provided with a handle.
7. The probe card dismounting jig according to any one of claims 1 to 6, characterized by The push rod has at least two and is equally spaced around the outer side of the circumference of the protective cover.
8. The probe card disassembly jig according to Claim 1, wherein The protective cover comprises a cover body and a frame connected with each other, and the frame is provided with at least one fixing structure detachably connected with the to-be-disassembled component.
9. The probe card disassembly jig according to claim 8, wherein The cover body is a transparent cover body.
10. The probe card disassembly jig according to Claim 1, wherein The tool further comprises a support having a preset height, and the support is used for carrying the protective cover.