Crystal oscillator test system

Abstract

A crystal oscillator test system comprises a test board, a test board clamp, a control board, a control board clamp, a near-field probe and a probe displacement clamp. The test board is installed in the cavity of the test board clamp, and the plurality of crystal oscillators to be tested are respectively installed on a plurality of reserved installation positions corresponding to a plurality of test channels of the test board; the control board clamp is installed on one side of the test board clamp, the control board is installed on the control board clamp, and the test board and the control board are electrically connected through a connecting line; the near-field probe is located above the crystal oscillator to be tested and installed on the probe displacement clamp, and the probe displacement clamp is installed on the other side of the test board clamp. According to the invention, a plurality of crystal oscillators can be tested at one time, the device is suitable for crystal oscillators used by different products, the test difficulty is greatly reduced, and the test efficiency is improved.

Description

Technical Field

[0001] This utility model relates to the field of passive crystal and active crystal oscillator testing used in products in the optical module industry, and specifically to a crystal oscillator testing system. Background Technology

[0002] Due to the rapid development of the optoelectronic industry, crystal oscillators are widely used in products. Currently, the performance testing of crystal oscillators is usually done on the product itself. In order to reduce testing costs and labor costs, as well as improve testing efficiency, there is an urgent need for a crystal oscillator testing system that can test multiple crystal oscillators at once and is compatible with the crystal oscillators used in different products. Utility Model Content

[0003] In view of the technical defects and drawbacks existing in the prior art, this utility model provides a crystal oscillator testing system that overcomes or at least partially solves the above problems, and the specific solution is as follows:

[0004] A crystal oscillator testing system includes a test board with multiple test channels, a test board fixture for fixing the test board, a control board for controlling the test channels on the test board, a control board fixture for fixing the control board, a near-field probe for detecting the electromagnetic field of the crystal oscillator under test, and a probe displacement fixture for controlling the movement of the near-field probe above the multiple crystal oscillators under test.

[0005] The test board is installed in the cavity of the test board fixture, and multiple crystal oscillators to be tested are respectively installed in multiple reserved mounting positions corresponding to multiple test channels of the test board; the control board fixture is installed on one side of the test board fixture, and the control board is installed on the control board fixture, and the test board and the control board are electrically connected by a connecting wire; the near-field probe is located above the crystal oscillators to be tested, and the near-field probe is installed on the probe displacement fixture, which is installed on the other side of the test board fixture.

[0006] Furthermore, the test board fixture includes a base, a housing, and a top cover, with the housing mounted on the base and the top cover covering the housing.

[0007] Furthermore, the upper cover has a circular opening with an annular groove for fitting the gas collection hood.

[0008] Furthermore, the test board fixture has a control board test fixture hole on one side of the control board for accommodating the connecting wire. The connecting wire passes through the control board test fixture hole and is connected to the test board and the control board respectively.

[0009] Furthermore, the test board fixture has a near-field probe side fixture hole on one side of the probe displacement fixture. One end of the near-field probe is fixed on the probe displacement fixture, and the other end extends through the near-field probe side fixture hole to the top of the crystal oscillator under test.

[0010] Furthermore, multiple reserved mounting positions corresponding to multiple test channels are arranged at intervals along the same direction on the test plate. The probe displacement fixture includes a horizontal displacement unit for driving the near-field probe to move horizontally along the arrangement direction of the reserved mounting positions and a vertical displacement unit for driving the near-field probe to move up and down. The horizontal displacement unit is mounted on the other side of the test plate fixture, the vertical displacement unit is mounted on the horizontal displacement unit, and the near-field probe is mounted on the vertical displacement unit.

[0011] Furthermore, the crystal oscillator testing system also includes a baffle plate for blocking the near-field probe side clamp hole. The baffle plate covers the near-field probe side clamp hole and is fixedly connected to the probe displacement clamp, moving synchronously with the movement of the probe displacement clamp. The baffle plate has a probe through hole adapted to the near-field probe. The other end of the near-field probe passes through the probe through hole and the near-field probe side clamp hole and extends to the top of the crystal oscillator under test.

[0012] Furthermore, the control board has multiple channel switches that correspond one-to-one with the number of test channels on the test board, and each channel switch is used to control the on / off state of a corresponding test channel on the test board.

[0013] Furthermore, the control board also has a main switch for controlling the on / off state of the test channels, a switch for switching from the current test channel to the previous test channel, and a switch for switching from the current test channel to the next test channel.

[0014] This utility model has the following beneficial effects:

[0015] 1. The crystal oscillator testing system of this utility model is compatible with the temperature characteristic testing of different types and models of crystal oscillators;

[0016] 2. The crystal oscillator testing system of this invention can test multiple samples at once, greatly shortening the testing time and reducing the inconvenience of frequently changing test boards.

[0017] 3. The use of the crystal oscillator testing system of this utility model can not only reduce the labor cost in the test, but also improve the test efficiency.

[0018] 4. The crystal oscillator testing system of this utility model is convenient for testing, reduces the time required for manual training, and shortens the time required for setup and testing.

[0019] 4. Using a test board facilitates comparison of reliability test data before and after testing. Reliability testing can be performed together with the test board, eliminating the need for repeated soldering of bare chips before and after reliability testing, thus avoiding the influence of soldering. Attached Figure Description

[0020] Figure 1 A structural diagram of a crystal oscillator testing system provided in an embodiment of this utility model;

[0021] Figure 2 A circuit diagram of the power supply section of the control board provided in an embodiment of this utility model;

[0022] Figure 3 A circuit diagram of the power switch section of the control board provided in this embodiment of the utility model;

[0023] Figure 4 A circuit diagram of the control chip portion of the control board provided in this embodiment of the utility model;

[0024] Figure 5 A circuit diagram of the control board switch section provided in an embodiment of this utility model;

[0025] Figure 6 The circuit diagram of the passive crystal oscillator test board provided in this embodiment of the utility model;

[0026] Figure 7 The circuit diagram of the active crystal oscillator test board provided in this embodiment of the utility model.

[0027] In the diagram: 1. Control board fixture, 2. Control board, 3. Connecting wire, 4. Top cover, 5. Test board, 6. Near-field probe, 7. Crystal oscillator under test, 8. Fixture handle, 9. Annular groove, 10. Wind baffle, 11. Probe displacement fixture, 12. Base, 13. Housing. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only a part of the present utility model, and not all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0029] like Figure 1As shown, a crystal oscillator testing system provided by this utility model embodiment includes a test board 5 with multiple test channels, a test board clamp for fixing the test board 5, a control board 2 for controlling the test channels on the test board 5, a control board clamp 1 for fixing the control board 2, a near-field probe 6 for detecting the electromagnetic field of the crystal oscillator 7 under test, a thermometer thermocouple for measuring the temperature of the crystal oscillator 7 under test, and a probe displacement clamp 11 for controlling the movement of the near-field probe 6 above the multiple crystal oscillators 7 under test.

[0030] The test board 5 is installed in the cavity of the test board fixture, and multiple crystal oscillators 7 to be tested are respectively installed in multiple reserved mounting positions corresponding to multiple test channels of the test board 5; the control board fixture 1 is installed on one side of the test board fixture, the control board 2 is installed on the control board fixture 1, and the test board 5 and the control board 2 are electrically connected through the connecting wire 3; the near-field probe 6 is located above the crystal oscillators 7 to be tested, the near-field probe 6 is installed on the probe displacement fixture 11, the point thermometer thermocouple is installed below the near-field probe 6, and the probe displacement fixture 11 is installed on the other side of the test board fixture.

[0031] The probe displacement fixture 11 drives the near-field probe 6 to move left, right, up, and down, controlling the near-field probe 6 to approach the crystal oscillator 7 under test. The probe displacement fixture 11 can be an existing two-axis or three-axis moving platform. The near-field probe 6 is mounted on the moving platform and is driven by the moving platform to move left, right, up, and down.

[0032] The crystal oscillator testing system designed in this utility model reduces the difficulty of soldering, can test multiple crystals at once, and is compatible with crystal oscillators used in different products, which greatly reduces the difficulty of testing and improves the efficiency of testing.

[0033] Optionally, the test plate fixture includes a base 12, a housing 13, and a top cover 4. The housing 13 is mounted on the base 12, and the top cover 4 covers the housing 13. The base 12, housing 13, and top cover 4 together form a cavity. The housing 13 is also provided with a fixture handle 8. The top cover 4 has a circular opening with an annular groove 9 for fitting the gas collection hood of the heat flow meter.

[0034] In this embodiment of the utility model, the upper cover 4 is tightened by screws, which makes it convenient for operators to disassemble flexibly. The upper cover 4 has an annular groove 9 that is adapted to the gas collection hood of the heat flow meter, which facilitates positioning and makes the gas collection hood of the heat flow meter fit more tightly with the clamp to prevent air leakage.

[0035] Optionally, the test board fixture has a control board 2 test fixture hole on one side of the control board 2 for accommodating the connecting wire 3. The connecting wire 3 passes through the control board 2 test fixture hole, and both ends of the connecting wire 3 are connected to the test board 5 and the control board 2 respectively. The size of the control board 2 test fixture hole is adapted to the cross-section of the connecting wire 3, so that the connecting wire 3 can just pass through the control board 2 test fixture hole. In order to increase the sealing of the cavity, a rubber sealing ring can be set in the control board 2 test fixture hole to seal the gap between the control board 2 test fixture hole and the connecting wire 3.

[0036] Optionally, the test board fixture has a near-field probe 6 side clamping hole on one side of the probe displacement clamp 11. One end of the near-field probe 6 is fixed on the probe displacement clamp 11, and the other end extends through the near-field probe 6 side clamping hole to the crystal oscillator 7 under test.

[0037] The length and width of the clamp hole on the side of the near-field probe 6 are designed to allow the near-field probe 6 to move above any crystal oscillator 7 under the action of the probe displacement clamp 11.

[0038] The crystal oscillator testing system also includes a baffle plate 10 for sealing the clamp hole on the near-field probe side. The baffle plate 10 covers the clamp hole on the near-field probe side and is fixedly connected to the probe displacement clamp 11. The baffle plate 10 moves synchronously with the movement of the probe displacement clamp 11. The baffle plate 10 has a probe through hole adapted to the near-field probe 6. The other end of the near-field probe 6 passes through the probe through hole and the clamp hole on the near-field probe 6 side and extends into the cavity and above the crystal oscillator 7 to be tested.

[0039] In the above embodiments, by setting the baffle plate 10, it is convenient to block the airflow inside the heat flow meter's gas collection hood, preventing heat loss and the temperature from rising normally; the size of the baffle plate 10 must be sufficient to completely cover the near-field probe side clamp hole during the synchronous movement of the baffle plate 10 with the probe displacement clamp 11.

[0040] Multiple test channels are arranged at intervals along the same direction on the test board 5, and the probe displacement fixture 11 includes a horizontal displacement unit for driving the near-field probe 6 to move horizontally along the arrangement direction of the reserved installation positions and a vertical displacement unit for driving the near-field probe 6 to move up and down. The horizontal displacement unit is mounted on the other side of the test board fixture, and the vertical displacement unit is mounted on the horizontal displacement unit. The near-field probe 6 is mounted on the vertical displacement unit.

[0041] The control board 2 has multiple channel switches that correspond one-to-one with the number of test channels on the test board 5. Each channel switch is used to control the on / off state of a corresponding test channel on the test board 5.

[0042] Optionally, the control board 2 also has a main switch for controlling the on / off state of the test channels, a switch for switching from the current test channel to the previous test channel, and a switch for switching from the current test channel to the next test channel.

[0043] The control board 2 of this utility model includes channel switches K1, K2, K3, K4, K5, K6, K7, K8, K9, K10, K11, main switch OFF, function switch FUM, switch to previous channel SUB, and switch to next channel ADD.

[0044] See Figure 2-5 As shown in the diagram, FUN is used to switch between power settings and current threshold settings; ADD / SUB is used to adjust the setting value; OFF is used to turn off the power; CH1-CH11 are used to turn the channel power on / off individually. When the power is turned on, the power of other channels will be turned off by default. The control board 2 is 60CM*120CM in size.

[0045] The test board 5 of this utility model includes an unstable crystal oscillator test board 5 and an active crystal oscillator test board 5.

[0046] Among them, 5 are uninsulated crystal oscillator test boards. Figure 6 See Crystal Oscillator Test Board 5 Figure 7 The test board 5 has peripheral circuits for 11 test channels of crystal oscillators with different packages. Each test board 5 has multiple packages to choose from, and only one type of crystal oscillator can be soldered on one test board 5. The position corresponding to the crystal oscillator under test 7 is a reserved mounting position. When the crystal oscillator under test needs to be tested, the crystal oscillator under test 7 is soldered and installed in the reserved mounting position.

[0047] The testing system provided by this utility model can simultaneously test 11 samples of different types and packages of crystal oscillators by replacing the test board 5. If it is desired to replace the crystal oscillator with another package, the chip can be soldered and reused. Therefore, this fixture can be used for most crystal oscillator testing needs by replacing the test board 5; it can also be reused by replacing the chip on the test board 5, or the chip with another package can be used for testing.

[0048] The crystal oscillator testing system provided by this utility model has the following specific testing procedure:

[0049] 1. Solder 11 crystal oscillators 7 to be tested onto the corresponding reserved mounting positions on the test board 5. After the test board 5 is connected to the control board 2, place it on the fixture and seal the fixture hole between the test board 5 and the control board 2.

[0050] 2. Put the clamp cover 4 on and fix it with screws;

[0051] 3. Cover the clamp hole on the side of the near-field probe 6 with the wind baffle 10 and fix it on the probe displacement clamp 11. Fix the near-field probe 6 on the probe displacement clamp 11, fix the thermometer thermocouple below the probe, and adjust the left and right and up and down axes of the probe displacement clamp 11 to adjust the position of the near-field probe 6 so that the probe matches the position of the crystal oscillator 7 to be tested.

[0052] 4. Place the heat flow meter's gas collection hood on the annular groove 9 of the fixture cover 4;

[0053] 5. Power on control board 2, turn on the test channel switch corresponding to the crystal oscillator 7 under test, and turn on the spectrum analyzer of the crystal oscillator performance testing equipment to test the crystal oscillator frequency.

[0054] It should be noted that the scheme for which protection is sought in this utility model is related to the selection and connection relationship of various hardware devices. Those skilled in the art, upon learning of the hardware scheme of this application, can obtain the corresponding upper-level program or calculation formula without any objection. Therefore, the scheme for which protection is sought in this application does not involve program improvement.

[0055] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A crystal oscillator testing system, characterized in that, The system comprises a test board with multiple test channels, a test board clamp for fixing the test board, a control board for controlling the test channels on the test board, a control board clamp for fixing the control board, a near-field probe for detecting the electromagnetic field of the crystal oscillator to be tested, and a probe displacement clamp for controlling the movement of the near-field probe above the multiple crystal oscillators to be tested. The test board is installed in the cavity of the test board clamp, and the multiple crystal oscillators to be tested are respectively installed on the multiple reserved installation positions corresponding to the multiple test channels of the test board. The control board clamp is installed on one side of the test board clamp, and the control board is installed on the control board clamp. The test board and the control board are electrically connected through the connecting line. The near-field probe is located above the crystal oscillator to be tested, and the near-field probe is installed on the probe displacement clamp. The probe displacement clamp is installed on the other side of the test board clamp.

2. The crystal oscillator testing system of claim 1, wherein, The test board clamp comprises a base, a shell and an upper cover. The shell is installed on the base, and the upper cover covers the shell.

3. The crystal testing system of claim 2, wherein A circular opening is formed on the upper cover, and the circular opening has an annular groove for adapting to the gas collection cover of the heat flow meter.

4. The crystal testing system of claim 1, wherein The test board clamp has a control board clamp hole on one side of the control board for adapting to the connecting line. The connecting line passes through the control board clamp hole and is connected with the test board and the control board respectively.

5. The crystal testing system of claim 1, wherein The test board clamp has a near-field probe side clamp hole on one side of the probe displacement clamp. One end of the near-field probe is fixed on the probe displacement clamp, and the other end extends above the crystal oscillator to be tested through the near-field probe side clamp hole.

6. The crystal testing system of claim 5, wherein The multiple reserved installation positions corresponding to the multiple test channels are arranged and installed in the same direction on the test board. The probe displacement clamp comprises a horizontal displacement unit for driving the near-field probe to move horizontally along the arrangement direction of the reserved installation positions and a vertical displacement unit for driving the near-field probe to move up and down. The horizontal displacement unit is installed on the other side of the test board clamp, and the vertical displacement unit is installed on the horizontal displacement unit. The near-field probe is installed on the vertical displacement unit.

7. The crystal testing system of claim 5, wherein The crystal oscillator test system further comprises a wind shield for plugging the near-field probe side clamp hole. The wind shield covers the near-field probe side clamp hole and is fixedly connected with the probe displacement clamp. The wind shield moves synchronously with the movement of the probe displacement clamp. The wind shield has a probe perforation for adapting to the near-field probe. The other end of the near-field probe extends above the crystal oscillator to be tested through the probe perforation and the near-field probe side clamp hole.

8. The crystal testing system of claim 1, wherein The control board has multiple channel switches corresponding to the number of test channels on the test board. Each channel switch is used to control the on-off of the corresponding test channel on the test board.

9. The crystal testing system of claim 8, wherein The control board further has a total switch for controlling the on-off of the test channels, a switch previous channel switch for switching from the current test channel to the previous test channel, and a switch next channel switch for switching from the current test channel to the next test channel.

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