Appearance inspection device for patch quartz crystal resonator

Abstract

The utility model relates to the technical field of surface-mounted quartz crystal resonators, in particular to an appearance inspection device of a surface-mounted quartz crystal resonator, which comprises a group of roll-over stands and two groups of conveying frames, the two groups of conveying frames are respectively arranged on two sides of the roll-over stands, transverse conveying belts are arranged on the conveying frames, and the two groups of conveying belts are arranged in a vertically staggered manner. The two groups of overturning frames are arranged in parallel, the rear sides of the two groups of overturning frames are respectively provided with an appearance inspection mechanism and a waste product removing mechanism, the overturning frames are rotatably connected with an overturning roller, a plurality of V-shaped grooves are uniformly formed in the circumferential direction of the overturning roller, and rubber blocks are arranged at the inner angle positions of the V-shaped grooves. Meanwhile, one face is detected firstly, then the other face is detected through overturning, and defective products are pushed out under the condition that the appearance quality is detected to be substandard, so that manual inspection and manual sorting are avoided, and the inspection effect is improved while the detection quality is improved.

Description

Technical Field

[0001] This utility model relates to the field of surface mount quartz crystal resonator technology, specifically to a surface mount quartz crystal resonator appearance inspection device. Background Technology

[0002] Surface mount quartz crystal resonators (SMRs) are electronic components that utilize the piezoelectric effect of quartz crystals (also known as crystals) to generate high-precision oscillation frequencies. They are passive components. These components mainly consist of a quartz wafer, a base, a housing, silver paste, and silver. Based on the lead configuration, they can be divided into through-hole (with leads) and surface mount (without leads) types. After manufacturing, SMRs require visual inspection. This is typically done manually, one by one, with visual inspection. This method is prone to operator fatigue, which can affect the quality of the inspection. Furthermore, manual inspection is inefficient. Therefore, a device is designed to facilitate continuous visual inspection, inspecting one side first and then flipping the device to inspect the other side. Defective products are ejected if they fail to meet quality standards, avoiding manual inspection and sorting, thus improving both inspection quality and efficiency. Utility Model Content

[0003] (a) Technical problems to be solved

[0004] To address the shortcomings of existing technologies, this utility model provides an appearance inspection device for patch quartz crystal resonators, which facilitates continuous appearance inspection. It can inspect one side first, then flip the device to inspect the other side. If any defective products fail to meet appearance quality standards, the defective products are pushed out, avoiding manual inspection and sorting, thus improving both inspection quality and efficiency.

[0005] (II) Technical Solution

[0006] To achieve the above objectives, this utility model provides the following technical solution: an appearance inspection device for a surface mount quartz crystal resonator, comprising a set of flipping frames and two sets of conveyor frames, the two sets of conveyor frames being respectively arranged on both sides of the flipping frame, a horizontally placed conveyor belt being provided on the conveyor frame, the two sets of conveyor belts being staggered vertically, and an appearance inspection mechanism and a defect removal mechanism being provided on the rear side of each of the two sets of flipping frames, a flipping roller being rotatably connected to the flipping frame, the flipping roller having multiple V-shaped grooves evenly distributed around its circumference, and a rubber block being provided at the inner corner of each of the multiple V-shaped grooves.

[0007] Preferably, the appearance inspection mechanism includes four sets of detection probes, which are symmetrically arranged on both sides of the conveyor belt and fixedly mounted on the conveyor frame by a mounting bracket. It also includes an appearance scanning controller adapted to the four sets of detection probes, which is electrically connected to the waste removal mechanism on the same side.

[0008] Preferably, the waste removal mechanism includes a pusher drive cylinder fixedly installed on the conveyor frame perpendicular to the conveyor belt transmission direction. The output end of the pusher drive cylinder is fixedly installed with a pusher plate through a flat pusher frame. The conveyor frame has notches on both sides at the position between the four detection probes, which are flush with the top surface of the conveyor belt. The pusher plate is located outside one of the notches.

[0009] Preferably, a support plate for supporting the conveyor belt is provided below the top of the conveyor belt, located below the two notches.

[0010] Preferably, a guide slide that slides in a guide-sliding manner with the conveyor frame is fixedly installed on the pusher frame.

[0011] Preferably, the conveyor frame and the tilting frame are respectively equipped with a drive motor and a tilting motor for driving the conveyor belt and the tilting roller to rotate.

[0012] (III) Beneficial Effects

[0013] Compared with the prior art, this utility model provides an appearance inspection device for patch quartz crystal resonators, which has the following advantages:

[0014] The appearance inspection device for this surface mount quartz crystal resonator uses a conveyor frame with a conveyor belt for continuous transport of the resonators. An appearance inspection mechanism and a defective product removal mechanism are located at the rear of the conveyor frame. This allows for inspection of one side of the resonator; if the inspection fails, the defective product removal mechanism removes it from the conveyor frame. A turnover roller and multiple V-grooves facilitate continuous feeding from a high-level drive motor. Rubber blocks help the surface mount quartz crystal resonators avoid impact wear when fed into the V-grooves, while also improving the turnover efficiency. The smoothness of the surface is measured, and then the surface is fed to the lower conveyor belt by clockwise rotation, so that the other side is inspected and the substandard ones are peeled off. At the end of the lower conveyor belt, the surface-mount quartz crystal resonators that meet the appearance inspection standards are collected. This surface-mount quartz crystal resonator appearance inspection device facilitates continuous appearance inspection. At the same time, one side is inspected first and then the other side is inspected by flipping. If the appearance quality does not meet the standards, the defective products are pushed out, avoiding manual inspection and manual sorting, improving the inspection quality and the inspection effect. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0016] Figure 2 This utility model Figure 1 A magnified schematic diagram of the local structure at point A;

[0017] Figure 3 This is a structural schematic diagram of the present invention from other perspectives;

[0018] Figure 4 This utility model Figure 3 A magnified view of the structure at point B in the middle;

[0019] Figure 5 This is a partial cross-sectional view of the structure of the present invention, showing the combination of the tilting roller, V-groove, and rubber block.

[0020] The following are labels in the attached diagram: 1. Conveyor frame; 2. Tilting frame; 3. Conveyor belt; 4. Drive motor; 5. Tilting roller; 6. Tilting motor; 7. Mounting frame; 8. Detection probe; 9. Support plate; 10. Pusher plate; 11. Pusher drive cylinder; 12. Flat pusher frame; 13. Guide slide; 14. V-groove; 15. Rubber block. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Example:

[0023] Please see Figure 1-5 A surface inspection device for a patch quartz crystal resonator includes a set of flipping frames 2 and two sets of conveyor frames 1. The two sets of conveyor frames 1 are respectively arranged on both sides of the flipping frame 2. A horizontally placed conveyor belt 3 is provided on the conveyor frame 1. The two sets of conveyor belts 3 are staggered vertically. A surface inspection mechanism and a defect removal mechanism are provided on the rear side of both sets of flipping frames 2. A flipping roller 5 is rotatably connected to the flipping frame 2. Multiple V-shaped grooves 14 are evenly distributed around the circumference of the flipping roller 5, and rubber blocks 15 are provided at the inner corners of the multiple V-shaped grooves 14.

[0024] The appearance inspection mechanism includes four sets of detection probes 8, which are symmetrically arranged on both sides of the conveyor belt 3 and fixedly mounted on the conveyor frame 1 by the mounting bracket 7. It also includes an appearance scanning controller adapted to the four sets of detection probes 8. The appearance scanning controller is electrically connected to the scrap removal mechanism on the same side. Through the four sets of detection probes 8, the appearance of the surface-mount quartz crystal resonators passing by can be easily inspected from the four corners, and the signal is transmitted to the appearance scanning controller. If the scan shows that the sample is unqualified, the appearance scanning controller will transmit the signal to the scrap removal mechanism on the same side for removal.

[0025] The waste removal mechanism includes a pusher cylinder 11 fixedly installed on the conveyor frame 1 perpendicular to the transmission direction of the conveyor belt 3. The output end of the pusher cylinder 11 is fixedly installed with a pusher plate 10 through a flat pusher frame 12. The conveyor frame 1 has notches on both sides of the position between the four detection probes 8, which are flush with the top surface of the conveyor belt 3. The pusher plate 10 is located outside one of the notches.

[0026] A support plate 9 is provided at the bottom of the top of the conveyor belt 3, below the two notches, to support the conveyor belt 3. The support plate 9 facilitates the support of the conveyor belt 3.

[0027] A guide slide 13 is fixedly installed on the flat push frame 12, which is in slidable cooperation with the conveyor frame 1. The guide slide 13 helps to improve the stability of the flat push frame 12 and the push plate 10.

[0028] The conveyor frame 1 and the tilting frame 2 are respectively equipped with a drive motor 4 and a tilting motor 6 to drive the conveyor belt 3 and the tilting roller 5 to rotate. The drive motor 4 facilitates the rotation of the conveyor belt 3, and the tilting motor 6 facilitates the rotation of the tilting roller 5.

[0029] In use, the surface mount quartz crystal resonators are placed flat on the high-position conveyor belt 3 and fed to the flipping frame 2 in the middle position. During the feeding process, the surface mount quartz crystal resonators are visually inspected by the visual inspection mechanism. If any defective products are found, they are peeled off by the scrap removal mechanism and then fed into the V-groove 14 on the flipping roller 5 at the end of the high-position conveyor belt 3. Then, by rotating clockwise, they are flipped over and fed onto the low-position conveyor belt 3. The other side is inspected by the visual inspection mechanism on the low-position side, and the defective quartz crystal resonators are removed by the scrap removal mechanism. The qualified quartz crystal resonators are collected at the end of the low-position conveyor belt 3.

[0030] It should be noted that the terms "one embodiment," "embodiment," "exemplary embodiment," "some embodiments," etc., mentioned in the specification indicate that the described embodiment may include a specific feature, structure, or characteristic, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, such phrases do not necessarily refer to the same embodiment. Moreover, when a specific feature, structure, or characteristic is described in connection with an embodiment, implementing such a feature, structure, or characteristic in conjunction with other embodiments, whether explicitly described or not, is within the knowledge scope of those skilled in the art.

[0031] It should be readily understood that the terms “on,” “above,” and “on top of” in this disclosure should be interpreted in the broadest possible sense, such that “on” means not only “directly on something” but also “on something” with an intermediate feature or layer therebetween, and that “above” or “on top of” means not only “on top of something” but also “on top of something” without an intermediate feature or layer therebetween (i.e., directly on something).

[0032] Furthermore, for ease of explanation, spatially relative terms such as "below," "below," "under," "above," and "above" may be used to describe the relationship of one element or feature relative to other elements or features as shown in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or operation other than those shown in the figures. The device may have other orientations (rotated 90 degrees or in other orientations), and the spatially relative descriptive terms used herein may be interpreted accordingly.

[0033] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0034] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A device for visually inspecting surface-mount quartz crystal resonators, characterized in that: The utility model provides a kind of appearance inspection mechanism and waste removal mechanism for flip rack, including a set of flip rack (2) and two sets of conveying frame (1), the two sets of conveying frame (1) are separately arranged in the two sides of the flip rack (2), the conveying frame (1) is provided with horizontal conveying belt (3), two sets of the conveying belt (3) are arranged staggered, and the rear side of two sets of the flip rack (2) is provided with appearance inspection mechanism and waste removal mechanism, the flip rack (2) is rotatably connected with flip roller (5), the circumferential of the flip roller (5) is evenly distributed and is provided with multiple V-shaped grooves (14), and the inner angle position of multiple V-shaped grooves (14) is provided with rubber block (15).

2. An appearance inspection apparatus for a patch quartz crystal resonator according to claim 1, characterized by: The appearance inspection mechanism includes four sets of detection probes (8), four sets of the detection probes (8) are symmetrically arranged on the two sides of the conveying belt (3) and are fixedly installed on the conveying frame (1) by mounting frame (7), and further includes appearance scanning controller matched with four sets of the detection probes (8), and the appearance scanning controller is electrically connected with the waste removal mechanism on the same side.

3. The appearance inspection apparatus of a patch quartz crystal resonator according to claim 2, characterized by: The waste removal mechanism includes pushing material driving cylinder (11) fixedly installed on the conveying frame (1) perpendicular to the transmission direction of the conveying belt (3), the output end of the pushing material driving cylinder (11) is fixedly installed with pushing plate (10) by flat pushing frame (12), the conveying frame (1) is opened and closed with the notch flush with the top end surface of the conveying belt (3) on the two sides of the position between four detection probes (8), and the pushing plate (10) is located outside one notch.

4. The appearance inspection apparatus of a patch quartz crystal resonator according to claim 3, characterized by: The top end of the conveying belt (3) is provided with support plate (9) below two notches.

5. An appearance inspection apparatus for a patch quartz crystal resonator according to claim 4, characterized by: The flat pushing frame (12) is fixedly installed with guide sliding frame (13) slidingly matched with the conveying frame (1).

6. An appearance inspection apparatus for a patch quartz crystal resonator according to claim 5, characterized by: The conveying frame (1) and flip rack (2) are respectively provided with transmission motor (4) and flip motor (6) for driving the rotation of the conveying belt (3) and flip roller (5).

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