Electronic equipment test fixture

Abstract

The embodiment of the utility model provides an electronic equipment test fixture, and relates to the field of electronic equipment. The electronic equipment test fixture comprises a clamping piece and a connecting piece. The clamping piece is provided with an accommodating cavity, the accommodating cavity is used for accommodating to-be-tested electronic equipment, the connecting piece is provided with a first surface and a second surface which are opposite to each other, the first surface of the connecting piece is connected with the clamping piece, the second surface of the connecting piece is used for being fixedly connected with a mechanical arm, and the accommodating cavity is provided with a first hollow area; the NFC chip of the electronic equipment is arranged in the first hollow area. According to the electronic equipment test fixture, the NFC chip of the electronic equipment can be opposite to the first hollow area, so that interference is prevented when the electronic equipment test fixture tests the NFC chip of the electronic equipment, and the electronic equipment test fixture can ensure that the electronic equipment is located at the same position during each test; and the accuracy of the obtained test data is effectively improved.

Description

Technical Field

[0001] This disclosure relates to the field of electronic devices, and in particular to a test fixture for electronic devices. Background Technology

[0002] When testing the NFC (near field communication) performance of mobile phones and other electronic devices, manual operation of the phone to swipe the card is required. However, manual operation makes it difficult to ensure that the height and position of the card swipe are completely consistent each time, resulting in deviations in the data from repeated tests and making it difficult to accurately test the NFC performance of the phone. Utility Model Content

[0003] In view of this, the present disclosure provides an electronic device test fixture that can improve the accuracy of test data when performing NFC performance testing on electronic devices.

[0004] Specifically, the following technical solutions are included:

[0005] In a first aspect, embodiments of this disclosure provide an electronic device test fixture, including a clamping member and a connecting member;

[0006] The clamping member is provided with a receiving cavity for accommodating and limiting the electronic device to be tested. The connector has a first side and a second side. The first side of the connector is connected to the clamping member, and the second side of the connector is used for fixed connection with the robotic arm. The receiving cavity is provided with a first hollow area. When the electronic device is accommodated in the receiving cavity, the NFC chip of the electronic device is located in the first hollow area.

[0007] Optionally, the clamping member includes a first clamping arm, a second clamping arm, and a base plate. The first clamping arm and the second clamping arm are disposed opposite to each other on two sides of the base plate. The first clamping arm and the second clamping arm are located on the same surface of the base plate. The first clamping arm, the second clamping arm, and the base plate form the receiving cavity.

[0008] Optionally, the first hollowed-out area is disposed on the base plate and located between the first clamping arm and the second clamping arm.

[0009] Optionally, the base plate is provided with a second hollow area, the projection of the connector on the base plate at least partially overlaps with the first hollow area, and the first hollow area and the second hollow area are spaced apart.

[0010] Optionally, the first clamping arm is provided with a third hollow area, and the second clamping arm is provided with a fourth hollow area, wherein the third hollow area and the fourth hollow area are opposite to each other.

[0011] Optionally, the clamping member further includes a first limiting part and a second limiting part, the first limiting part being connected to the first clamping arm, the second limiting part being connected to the second clamping arm, the first limiting part and the second limiting part being disposed opposite to each other, and the first surface of the connecting member being connected to the first limiting part and the second limiting part.

[0012] The distance between the first limiting part and the second limiting part is less than the distance between the first clamping arm and the second clamping arm.

[0013] Optionally, the first clamping arm and the second clamping arm are made of elastic material.

[0014] Optionally, the clamping member further includes a first baffle and a second baffle, the first baffle being connected to one end of the base plate and the second baffle being connected to the other end of the base plate. When the electronic device is accommodated in the receiving cavity, the first baffle and the second baffle define the electronic device to prevent the electronic device from sliding in the length direction of the base plate.

[0015] Optionally, the sidewalls of the connector and the first baffle away from the second baffle are provided with positioning grooves, which are configured to align with the positioning structure of the robotic arm.

[0016] The second baffle includes a first blocking portion and a second blocking portion, the first blocking portion and the second blocking portion having a gap region, the gap region being configured to be opposite to the interface of the electronic device.

[0017] Optionally, the second side of the connector is provided with a connection hole, and the connector is fixedly connected to the robotic arm through the connection hole.

[0018] Optionally, the electronic device test fixture is made of a non-metallic material.

[0019] The beneficial effects of the technical solutions provided in this disclosure include at least the following:

[0020] In the electronic device testing fixture provided in this embodiment, the receiving cavity of the clamping member can accommodate the electronic device to be tested, so that the NFC chip of the electronic device is opposite to the first hollow area, thereby preventing interference when the electronic device testing fixture tests the NFC chip of the electronic device. The connector is used for fixed connection with the robotic arm. During multiple NFC performance tests of the electronic device, the electronic device testing fixture can fix the electronic device, ensuring that the electronic device is in the same position during each test, thereby sensing the NFC chip of the electronic device multiple times in the same position, effectively improving the accuracy of the acquired test data. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this disclosure, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 A schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure;

[0023] Figure 2 A schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure;

[0024] Figure 3 This is a partial schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure.

[0025] The reference numerals in the figure are respectively:

[0026] 1-Clamping component; 2-Connecting component;

[0027] 100 - Receiving cavity; 101 - First clamping arm; 102 - Second clamping arm; 103 - Base plate; 104 - First baffle; 105 - Second baffle; 106 - First limiting part; 107 - Second limiting part; 201 - Positioning groove; 202 - Connecting hole;

[0028] 1031 - First hollow area; 1032 - Second hollow area; 1011 - Third hollow area; 1021 - Fourth hollow area; 1051 - First blocking part; 1052 - Second blocking part; 1053 - Interval area.

[0029] The accompanying drawings have illustrated specific embodiments of this disclosure, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concepts of this disclosure to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0030] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this disclosure. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0031] Figure 1 This is a schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure. Figure 1As shown, the electronic device test fixture includes a clamping member 1 and a connecting member 2. The clamping member 1 is provided with a receiving cavity 100, which is used to receive and limit the electronic device to be tested. The connecting member 2 has a first side and a second side. The first side of the connecting member 2 is connected to the clamping member 1, and the second side of the connecting member 2 is used to fix it to a robotic arm. The receiving cavity 100 is provided with a first hollow area 1031. When the electronic device is received in the receiving cavity 100, the NFC chip of the electronic device is located in the first hollow area 1031.

[0032] In the electronic device testing fixture provided in this embodiment, the receiving cavity 100 of the clamping member 1 can accommodate the electronic device to be tested, so that the NFC chip of the electronic device is opposite to the first hollow area 1031, thereby preventing interference when the electronic device testing fixture tests the NFC chip of the electronic device. The connecting member 2 is used for fixed connection with the robotic arm. During multiple NFC performance tests of the electronic device, the electronic device testing fixture can fix the electronic device, ensuring that the electronic device is in the same position during each test, thereby sensing the NFC chip of the electronic device multiple times in the same position, effectively improving the accuracy of the acquired test data.

[0033] To make the technical solutions and advantages of this disclosure clearer, the embodiments of this disclosure will be described in further detail below with reference to the accompanying drawings.

[0034] like Figure 1 As shown, the electronic device testing fixture provided in this embodiment includes a clamping member 1 and a connecting member 2. The clamping member 1 is provided with a receiving cavity 100, the shape of which is adapted to the shape of the electronic device. The receiving cavity 100 is used to accommodate the electronic device to be tested and to fix the electronic device in the clamping member 1. The connecting member 2 has a first surface and a second surface. The first surface of the connecting member 2 is connected to the clamping member 1, and the second surface of the connecting member 2 is used to fix it to a robotic arm. The robotic arm can drive the electronic device testing fixture to move through the connecting member 2 and control the electronic device to move to a designated position, thereby enabling multiple NFC performance tests to be performed on the electronic device at the same position, improving the accuracy of the acquired test data.

[0035] It should be noted that the electronic device mentioned in the embodiments of this disclosure supports NFC functionality. This electronic device may be, but is not limited to, a remote control, a tablet computer, an MP3 player (Moving Picture Experts Group Audio Layer III), an MP4 player (Moving Picture Experts Group Audio Layer IV), or a laptop computer. This electronic device may also be referred to as a user device, a portable terminal, a laptop terminal, or other similar names.

[0036] In some embodiments of this disclosure, such as Figure 1 As shown, the clamping member 1 includes a first clamping arm 101, a second clamping arm 102, and a base plate 103. The first clamping arm 101 and the second clamping arm 102 are disposed opposite each other on two sides of the base plate 103. The first clamping arm 101 and the second clamping arm 102 are located on the same surface of the base plate 103. The first clamping arm 101, the second clamping arm 102, and the base plate 103 form a receiving cavity 100. The two sides of the base plate 103 refer to the opposite two edges of the base plate 103 in the width direction. The first clamping arm 101 and the second clamping arm 102 are used to clamp the electronic device from opposite sides in the width direction, thereby fixing the electronic device in the clamping member 1.

[0037] In some embodiments of this disclosure, see Figure 1 The first cutout area 1031 is disposed on the base plate 103 and located between the first clamping arm 101 and the second clamping arm 102. The first cutout area 1031 exposes the back cover of the electronic device, preventing interference with the NFC chip of the electronic device, so that the NFC chip of the electronic device can be close to the testing device during testing, thereby improving the accuracy of the testing data. In addition, for electronic devices with a protruding camera on the back cover, the first cutout area 1031 can accommodate the protruding camera, so that the back cover of the electronic device can be tightly attached to the base plate 103, avoiding an excessive gap between the back cover of the electronic device and the base plate 103, and the electronic device can be firmly fixed in the receiving cavity 100.

[0038] Optionally, such as Figure 1As shown, the base plate 103 has a second hollow area 1032. The projection of the connector 2 on the base plate 103 at least partially overlaps with the first hollow area 1031, and the first hollow area 1031 and the second hollow area 1032 are spaced apart. The first hollow area 1031 is located near one end of the base plate 103, and the second hollow area 1032 is located near the other end of the base plate 103. The area of ​​the second hollow area 1032 can be smaller than the area of ​​the first hollow area 1031. When the electronic device is located in the receiving cavity 100, the rear shell of the electronic device is exposed in the second hollow area 1032. At this time, the electronic device can be pushed up through the second hollow area 1032 to facilitate removal of the electronic device from the clamp 1 after testing.

[0039] In some embodiments of this disclosure, such as Figure 1 As shown, the first clamping arm 101 has a third hollowed-out area 1011, and the second clamping arm 102 has a fourth hollowed-out area 1021, with the third hollowed-out area 1011 and the fourth hollowed-out area 1021 opposite to each other. The first clamping arm 101 and the second clamping arm 102 are used to clamp the two opposite sidewalls of the electronic device. The sidewalls of the electronic device may have buttons. The third hollowed-out area 1011 and the fourth hollowed-out area 1021 can accommodate the buttons on the sidewalls of the electronic device, preventing the buttons on the sidewalls of the electronic device from being triggered during testing.

[0040] It should be noted that the length of the third hollow area 1011 is less than the length of the first clamping arm 101, and the length of the fourth hollow area 1021 is less than the length of the second clamping arm 102, so as to adapt to electronic devices with various structures, achieve better compatibility, and avoid the third hollow area 1011 and the fourth hollow area 1021 being too large, which would affect the stability of the first clamping arm 101 and the second clamping arm 102 when clamping.

[0041] For example, the shape of the third hollow area 1011 is the same as that of the fourth hollow area 1021. The third hollow area 1011 and the fourth hollow area 1021 are elongated, and the extending direction of the third hollow area 1011 and the fourth hollow area 1021 is the same as the length direction of the first clamping arm 101 and the second clamping arm 102.

[0042] In some embodiments of this disclosure, see Figure 1The clamping member 1 further includes a first limiting part 106 and a second limiting part 107. The first limiting part 106 is connected to the first clamping arm 101, and the second limiting part 107 is connected to the second clamping arm 102. The first limiting part 106 and the second limiting part 107 are disposed opposite to each other. The first surface of the connecting member 2 is connected to the first limiting part 106 and the second limiting part 107. The distance between the first limiting part 106 and the second limiting part 107 is smaller than the distance between the first clamping arm 101 and the second clamping arm 102. The first limiting part 106 and the second limiting part 107 are used to fix the electronic device in the thickness direction of the electronic device and limit the electronic device to move up and down in its thickness direction, so that the electronic device can be more firmly fixed in the receiving cavity 100.

[0043] Optionally, the first clamping arm 101 and the second clamping arm 102 are made of elastic material, and when the electronic device is located in the receiving cavity 100, the first clamping arm 101 and the second clamping arm 102 undergo elastic deformation. Alternatively, elastic pads are respectively provided on opposite sides of the first clamping arm 101 and the second clamping arm 102, and the elastic pads can undergo elastic deformation when the electronic device is located in the receiving cavity 100. The first clamping arm 101 and the second clamping arm 102 can provide elastic force to opposite sides in the width direction of the electronic device, thereby fixing electronic devices of different sizes in the receiving cavity 100 and preventing the electronic device from shaking relative to the clamping member 1.

[0044] Figure 2 This is a schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure. In some embodiments of this disclosure, such as... Figure 2 As shown, the clamping member 1 also includes a first baffle 104 and a second baffle 105. The first baffle 104 is connected to one end of the base plate 103, and the second baffle 105 is connected to the other end of the base plate 103. When the electronic device is accommodated in the receiving cavity 100, the first baffle 104 and the second baffle 105 limit the electronic device to prevent it from sliding along the length of the base plate 103. Specifically, "one end" and "other end" of the base plate 103 refer to the opposite ends along the length of the base plate 103. The first baffle 104 is located at the end of the base plate 103 near the first hollow area 1031, and the second baffle 105 is located at the end of the base plate 103 near the second hollow area 1032. The first baffle 104 and the second baffle 105 can abut against the two ends along the length of the electronic device, thereby limiting its movement along the length of the electronic device.

[0045] Optionally, see Figure 1 and 2The first baffle 104 can completely enclose the space formed by the first clamping arm 101, the second clamping arm 102, and the base plate 103. The second baffle 105 includes a first blocking part 1051 and a second blocking part 1052, with a gap region 1053 between the first blocking part 1051 and the second blocking part 1052. The gap region 1053 is configured to face the interface of the electronic device. The partially enclosed structure of the second baffle 105 can be adapted to the interface of the electronic device, allowing the interface of the electronic device located in the receiving cavity 100 to be exposed. This allows the electronic device to be electrically connected to an external device via a circuit during testing, facilitating the transmission of test data to the external device.

[0046] In some embodiments of this disclosure, such as Figure 2 As shown, the sidewalls of the connector 2 and the first baffle 104 away from the second baffle 105 are provided with positioning grooves 201, which are configured to align with the positioning structure of the robotic arm. The positioning grooves 201 are used to position the connector 2 so that it can be accurately installed onto the robotic arm. For example, the positioning structure on the robotic arm can be a groove or a column that matches the positioning groove 201. When the groove of the robotic arm aligns with the positioning groove 201 or the main body is located within the positioning groove 201, the connector 2 can be determined to be in a predetermined installation position.

[0047] Figure 3 This is a partial schematic diagram of an electronic device test fixture provided in an embodiment of this disclosure. In some embodiments of this disclosure, such as... Figure 3 As shown, the second side of the connector 2 is provided with a connecting hole 202, through which the connector 2 is fixedly connected to the robotic arm. A connecting post can be provided on the robotic arm, which cooperates with the connecting hole 202 to fix the connector 2 onto the robotic arm.

[0048] Optionally, see Figure 3 The connecting hole 202 is a threaded hole, and the connector 2 is fixedly connected to the robotic arm via bolts and the connecting hole 202. For example, the connecting hole 202 connects the first and second surfaces of the connector 2. The second surface of the connector 2 is a planar structure, and there are four connecting holes 202. The connector 2 is a right quadrangular prism structure, with the four connecting holes 202 located at the four corners of the connector 2. The connecting hole 202 on the first surface of the connector 2 is a countersunk hole structure, allowing the connecting hole 202 to be aligned with the threaded hole on the robotic arm during installation. The bolt is then screwed through the first hollow area 1031 into the connecting hole 202 and the threaded hole on the robotic arm. It should be noted that the robotic arm can have multiple threaded holes to accommodate connectors 2 of various sizes.

[0049] Furthermore, the electronic device test fixtures disclosed in this embodiment are made of non-metallic materials. Using non-metallic materials for the test fixtures avoids electromagnetic interference from metals to the electronic devices, thus improving the accuracy of the acquired test data.

[0050] It should be noted that in this article, "several" and "at least one" refer to one or more, while "multiple" and "at least two" refer to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0051] In the description of this disclosure, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0052] In this disclosure, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0053] In the description of this disclosure, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this disclosure.

[0054] In the description of this specification, the references to the terms "certain embodiments", "one embodiment", "some embodiments", "illustrative embodiment", "example", "specific example", or "some examples" refer to specific features, structures, materials, or characteristics described in connection with the embodiments or examples that are included in at least one embodiment or example of this disclosure.

[0055] The above description is merely an embodiment of this disclosure and is not intended to limit this disclosure. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the protection scope of this disclosure.

Claims

1. An electronic device test fixture, comprising: The clamping piece (1) and the connecting piece (2) are included. The clamping piece (1) is provided with a containing cavity (100) for containing and limiting the electronic device to be tested, and the connecting piece (2) has a first surface and a second surface, the first surface of the connecting piece (2) is connected with the clamping piece (1), and the second surface of the connecting piece (2) is used for fixed connection with a mechanical arm, and the containing cavity (100) is provided with a first hollow area (1031), and when the electronic device is contained in the containing cavity (100), the setting position of the NFC chip of the electronic device is located in the first hollow area (1031).

2. The electronic device test fixture of claim 1, wherein, The clamping piece (1) includes a first clamping arm (101), a second clamping arm (102) and a bottom plate (103), the first clamping arm (101) and the second clamping arm (102) are oppositely arranged on two side edges of the bottom plate (103), and the first clamping arm (101) and the second clamping arm (102) are located on the same surface of the bottom plate (103), and the first clamping arm (101), the second clamping arm (102) and the bottom plate (103) enclose the containing cavity (100).

3. The electronic device test fixture of claim 2, wherein, The first hollow area (1031) is arranged on the bottom plate (103) and located between the first clamping arm (101) and the second clamping arm (102).

4. The electronic device test fixture of claim 3, wherein, The bottom plate (103) is provided with a second hollow area (1032), a projection of the connecting piece (2) on the bottom plate (103) at least partially coincides with the first hollow area (1031), and the first hollow area (1031) is spaced apart from the second hollow area (1032).

5. The electronic device test fixture of claim 2, wherein, The first clamping arm (101) is provided with a third hollow area (1011), the second clamping arm (102) is provided with a fourth hollow area (1021), and the third hollow area (1011) is opposite to the fourth hollow area (1021).

6. The electronic device test fixture of claim 2, wherein, The clamping piece (1) further includes a first limiting part (106) and a second limiting part (107), the first limiting part (106) is connected with the first clamping arm (101), the second limiting part (107) is connected with the second clamping arm (102), the first limiting part (106) and the second limiting part (107) are oppositely arranged, and the first surface of the connecting piece (2) is connected with the first limiting part (106) and the second limiting part (107). The distance between the first limiting part (106) and the second limiting part (107) is smaller than the distance between the first clamping arm (101) and the second clamping arm (102).

7. The electronic device test fixture of claim 2, wherein, The first clamping arm (101) and the second clamping arm (102) are made of elastic material.

8. The electronic device test fixture of claim 2, wherein, The clamping piece (1) further comprises a first baffle (104) connected to one end of the bottom plate (103) and a second baffle (105) connected to the other end of the bottom plate (103), and the first baffle (104) and the second baffle (105) define the electronic device to prevent the electronic device from sliding in the length direction of the bottom plate (103) when the electronic device is accommodated in the accommodation cavity (100).

9. The electronic device test fixture of claim 8, wherein, The side wall of the connecting piece (2) and the first baffle (104) away from the second baffle (105) is provided with a positioning groove (201) configured to be aligned with the positioning structure of the mechanical arm.

10. The electronic device test fixture of claim 8, wherein, The second baffle (105) comprises a first blocking part (1051) and a second blocking part (1052) having a spacing area (1053) configured to be opposite to the interface of the electronic device.

11. The electronic device test fixture of claim 1, wherein, The second surface of the connecting piece (2) is provided with a connecting hole (202), and the connecting piece (2) is fixedly connected with the mechanical arm through the connecting hole (202).

12. The electronic device test fixture of any one of claims 1-11, wherein, The electronic device test fixture is made of a non-metallic material.

Images