Transistor test equipment easy to maintain

Abstract

The utility model discloses a transistor test device easy to maintain, which relates to the technical field of transistor detection and comprises a transistor conveying mechanism used for conveying a transistor to be tested; the mounting mechanism is used for mounting the turnover type testing mechanism; the turnover testing mechanism comprises a rotating shaft, a fixed plate, a reset torsion spring, a first magnet, a second magnet, a third magnet, a rotating disc, a fourth magnet and a testing camera; the rotating shaft penetrates through the inner side of the mounting groove and is rotationally connected with the L-shaped mounting plate through a bearing, and the fixing plate is fixedly arranged in the middle of the outer side of the rotating shaft in a sleeving mode. According to the utility model, the regular maintenance work of the test camera can be completed more conveniently, so that the maintenance difficulty of the test camera and the physical output of an operator in the maintenance process are reduced, and the practical use is more convenient.

Description

Technical Field

[0001] This utility model relates to the field of transistor testing technology, and in particular to a transistor testing device that is easy to maintain. Background Technology

[0002] A transistor is a single component based on semiconductor materials. It has multiple functions such as detection, rectification, amplification, switching, voltage regulation, and signal modulation. After the transistor is manufactured, it needs to be transported to testing equipment for testing using a test camera.

[0003] A search revealed that utility model patent CN221725891U discloses a transistor testing device that is easy to maintain, including a fixed platform, a support block fixedly connected to the surface of the fixed platform, a fixing ring fixedly connected to the surface of the fixed platform, a limit plate fixedly connected to the top surface of the fixed platform, and a bracket fixedly connected to the back of the fixed platform.

[0004] However, the above-mentioned device still has some drawbacks in actual use. The most obvious one is that there are few situations in actual application where the test camera needs to be disassembled. The routine maintenance of the test camera does not require disassembly. If it is disassembled for maintenance, subsequent rewiring and fixing will be required, which is not convenient in actual use.

[0005] Therefore, it is necessary to invent an easy-to-maintain transistor testing device to solve the above problems. Utility Model Content

[0006] The purpose of this invention is to provide an easy-to-maintain transistor testing device that can more conveniently complete the regular maintenance of the test camera, thereby reducing the difficulty of test camera maintenance and the physical exertion of operators during the maintenance process. It is more convenient in actual use, in order to solve the problem mentioned in the background art that in actual applications, there are few situations where the test camera needs to be disassembled, and the routine maintenance of the test camera does not require disassembly. If disassembly is used for maintenance, subsequent rewiring and fixing are required, which is not convenient in actual use.

[0007] According to one aspect of this disclosure, the following technical solution is provided: an easy-to-maintain transistor testing device, comprising:

[0008] A transistor delivery mechanism for delivering transistors to be tested;

[0009] Mounting mechanism, the mounting mechanism being used to mount the flip-type test mechanism; and

[0010] A flip-type testing mechanism, comprising a rotating shaft, a fixed plate, a reset torsion spring, a first magnet, a second magnet, a third magnet, a rotating disk, a fourth magnet, and a testing camera;

[0011] The rotating shaft passes through the inner side of the mounting groove and is rotatably connected to the L-shaped mounting plate via a bearing. The fixed plate is fixedly sleeved on the middle of the outer side of the rotating shaft. The reset torsion spring is sleeved on the outer side of the rotating shaft and fixedly connected between the fixed plate and the inner wall of the reset torsion spring. The first magnet is fixedly mounted on the side of the fixed plate. The second magnet is fixedly mounted on the inner wall of the mounting groove and magnetically attracted to the first magnet. Multiple third magnets are provided, and the multiple third magnets are evenly fixedly nested on the top of the fixed plate. The rotating disk is rotatably nested on the top of the fixed plate via a bearing. The fourth magnet is fixedly mounted on the outer side of the rotating disk and magnetically attracted to the adjacent third magnet. The test camera is fixedly mounted on the top of the rotating disk.

[0012] According to at least one embodiment of the present disclosure, an easy-to-maintain transistor testing apparatus includes a transistor transport mechanism comprising a worktable and a base, the base being fixedly disposed at the bottom of the worktable.

[0013] According to at least one embodiment of the present disclosure, an easy-to-maintain transistor testing device includes a transistor conveying mechanism that further comprises a conveyor belt and limiting baffles. The conveyor belt is disposed on the top of the worktable, and two limiting baffles are provided, which are respectively located on the front and back of the conveyor belt and are both fixedly connected to the worktable.

[0014] According to at least one embodiment of the present disclosure, an easy-to-maintain transistor test apparatus includes a mounting mechanism comprising a fixed base and an L-shaped mounting plate, wherein the fixed base is fixedly disposed on the top of an adjacent limiting baffle, and the L-shaped mounting plate is fixedly disposed on the top of the fixed base.

[0015] According to at least one embodiment of the easily maintainable transistor test apparatus of the present disclosure, the mounting mechanism further includes a mounting slot and a placement box, the mounting slot being disposed through the top of the L-shaped mounting plate, and the placement box being fixedly disposed on the back of the L-shaped mounting plate.

[0016] The technical effects and advantages of this utility model are as follows:

[0017] This invention features a flip-type testing mechanism, allowing the test camera to be positioned above the L-shaped mounting plate for easy maintenance in its initial state. The operator can stand behind the camera and face it directly for maintenance. Tools are placed inside the storage box. To switch the orientation of the test camera and the operator, a rotating disk is used, causing the test camera to rotate as well. During rotation, the fourth magnet attracts the adjacent third magnet, achieving positioning. After maintenance, the rotating shaft is rotated counter-clockwise. This rotation, via a fixing plate, rotates the test camera and simultaneously disengages the first and third magnets. Once the first magnet is no longer attracted to the third magnet, a reset torsion spring, via the fixing plate, rotates the test camera to a vertically downward testing position. Compared to existing devices of this type, this invention provides a more convenient way to perform regular maintenance on the test camera, reducing maintenance difficulty and operator fatigue, making it more convenient in actual use. Attached Figure Description

[0018] The accompanying drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0019] Figure 1 This is a schematic diagram of the overall structure of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0020] Figure 2 This is a schematic diagram of the transistor delivery mechanism and mounting mechanism of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0021] Figure 3 This is a schematic diagram of a flip-type test mechanism structure of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0022] The specific labels in the attached figures are as follows:

[0023] 1. Transistor conveying mechanism; 11. Worktable; 12. Base; 13. Conveyor belt; 14. Limiting baffle;

[0024] 2. Mounting mechanism; 21. Fixing base; 22. L-shaped mounting plate; 23. Mounting slot; 24. Placement box;

[0025] 3. Flip-type testing mechanism; 31. Rotating shaft; 32. Fixing plate; 33. Reset torsion spring; 34. First magnet; 35. Second magnet; 36. Third magnet; 37. Rotating disk; 38. Fourth magnet; 39. Test camera. Detailed Implementation

[0026] For descriptive purposes, this disclosure may use spatial relative terms such as “below,” “under,” “below,” “down,” “above,” “above,” “higher,” and “side (e.g., in a “sidewall”)” to describe the relationship between one component and another component as shown in the accompanying drawings. In addition to the orientations depicted in the drawings, the spatial relative terms are also intended to encompass different orientations of the device during use, operation, and / or manufacture. For example, if the device in the drawings is flipped, a component described as “below” or “under” other components or features would subsequently be positioned “above” said other components or features. Thus, the exemplary term “below” can encompass both “above” and “below” orientations. Furthermore, the device may be otherwise positioned (e.g., rotated 90 degrees or in other orientations), thus interpreting the spatial relative descriptive terms used herein accordingly.

[0027] Figure 1 This is a schematic diagram of the overall structure of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0028] Figure 2 This is a schematic diagram of the transistor delivery mechanism 1 and mounting mechanism 2 of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0029] Figure 3 This is a schematic diagram of the structure of a flip-type test mechanism 3 of an easy-to-maintain transistor test apparatus according to one embodiment of the present disclosure.

[0030] like Figures 1-3 As shown, the easily maintainable transistor testing equipment disclosed herein may include components such as a transistor delivery mechanism 1, a mounting mechanism 2, and a flip-type testing mechanism 3.

[0031] like Figure 2 As shown in this disclosure, the transistor conveying mechanism 1 includes a worktable 11, a base 12, a conveyor belt 13, and a limiting baffle 14. The base 12 is fixedly disposed at the bottom of the worktable 11, the conveyor belt 13 is disposed at the top of the worktable 11, and two limiting baffles 14 are provided. The two limiting baffles 14 are respectively located on the front and back of the conveyor belt 13 and are both fixedly connected to the worktable 11.

[0032] This allows the transistors to be continuously transported by the conveyor belt 13, so that multiple transistors pass under the vertically downward test camera 39 in sequence and are then detected by the test camera 39.

[0033] like Figure 2As shown, in a preferred embodiment, the installation mechanism 2 includes a fixed base 21, an L-shaped mounting plate 22, a mounting groove 23, and a placement box 24. The fixed base 21 is fixedly disposed on the top of the adjacent limiting baffle 14, the L-shaped mounting plate 22 is fixedly disposed on the top of the fixed base 21, the mounting groove 23 is disposed through the top of the L-shaped mounting plate 22, and the placement box 24 is fixedly disposed on the back of the L-shaped mounting plate 22.

[0034] Therefore, the tools needed during maintenance can be placed inside the storage box 24 for easy access by maintenance personnel.

[0035] like Figure 3 As shown in this disclosure, the flip-type testing mechanism 3 includes a rotating shaft 31, a fixed plate 32, a reset torsion spring 33, a first magnet 34, a second magnet 35, a third magnet 36, a rotating disk 37, a fourth magnet 38, and a testing camera 39. The rotating shaft 31 is disposed through the inner side of the mounting groove 23 and is rotatably connected to the L-shaped mounting plate 22 via a bearing. The fixed plate 32 is fixedly sleeved on the outer middle of the rotating shaft 31. The reset torsion spring 33 is sleeved on the outer side of the rotating shaft 31 and fixedly connected to the fixed plate 32 and the reset torsion spring. Between the inner walls of the mounting plate 32, the first magnet 34 is fixedly disposed on the side of the mounting plate 32, the second magnet 35 is fixedly disposed on the inner wall of the mounting groove 23 and magnetically attracted to the first magnet 34, multiple third magnets 36 are provided, and multiple third magnets 36 are evenly fixedly nested on the top of the mounting plate 32, the rotating disk 37 is rotatably nested on the top of the mounting plate 32 through the bearing, the fourth magnet 38 is fixedly disposed on the outside of the rotating disk 37 and magnetically attracted to the adjacent third magnet 36, and the test camera 39 is fixedly disposed on the top of the rotating disk 37.

[0036] Therefore, in the initial state, the test camera 39 is positioned above the L-shaped mounting plate 22 for easy maintenance. At this time, the operator can stand on the back and face the test camera 39 for maintenance. During maintenance, when it is necessary to switch the relative positions of the test camera 39 and the maintenance personnel, the rotating disk 37 can be rotated, which in turn causes the test camera 39 to rotate to complete the switch. During the rotation of the rotating disk 37, the fourth magnet 38 is attracted to the adjacent third magnet 36 in sequence, thereby achieving positioning. After maintenance is completed, the rotating shaft 31 is rotated counterclockwise. When the rotating shaft 31 rotates, it drives the test camera 39 to rotate through the fixing plate 32, and at the same time, it causes the first magnet 34 to disengage from the third magnet 36. After the first magnet 34 is no longer attracted to the third magnet 36, the reset torsion spring 33 drives the test camera 39 to rotate to a vertically downward test position through the fixing plate 32. Compared with existing similar devices, the regular maintenance of the test camera 39 can be completed more conveniently, thereby reducing the difficulty of maintaining the test camera 39 and the physical exertion of the operator during the maintenance process, making it more convenient in actual use.

[0037] It should also be noted that any content not described in detail in this specification is prior art known to those skilled in the art.

[0038] Those skilled in the art should understand that the above embodiments are merely for illustrating the present disclosure and are not intended to limit the scope of the disclosure. Those skilled in the art can make other changes or modifications based on the above disclosure, and these changes or modifications still fall within the scope of the present disclosure.

Claims

1. An easy-to-maintain transistor testing device, characterized in that, Include: Transistor conveying mechanism for conveying the transistor to be tested; Installation mechanism for installing the flip test mechanism; And The flip test mechanism includes a rotating shaft, a fixed plate, a reset torsion spring, a first magnet, a second magnet, a third magnet, a rotating disc, a fourth magnet and a test camera; The rotating shaft is arranged through the inside of the installation slot and is rotatably connected with the L-shaped mounting plate through the bearing, the fixed plate is fixedly sleeved and arranged at the middle part outside the rotating shaft, the reset torsion spring is sleeved and arranged outside the rotating shaft and is fixedly connected between the fixed plate and the inner wall of the reset torsion spring, the first magnet is fixedly arranged on the side surface of the fixed plate, the second magnet is fixedly arranged on the inner wall of the installation slot and is magnetically attracted to the first magnet, the third magnet is provided with a plurality of third magnets, the plurality of third magnets are uniformly fixedly nested on the top of the fixed plate, the rotating disc is rotatably nested on the top of the fixed plate through the bearing, the fourth magnet is fixedly arranged on the outside of the rotating disc and is magnetically attracted to the adjacent third magnet, and the test camera is fixedly arranged on the top of the rotating disc.

2. The transistor testing apparatus of claim 1, wherein: The transistor conveying mechanism includes a workbench and a base, and the base is fixedly arranged at the bottom of the workbench.

3. The transistor testing apparatus of claim 2, wherein: The transistor conveying mechanism further includes a conveyor belt and a limiting baffle, the conveyor belt is arranged on the top of the workbench, and the limiting baffle is provided with two limiting baffles, the two limiting baffles are respectively located on the front and back of the conveyor belt and are fixedly connected with the workbench.

4. The transistor testing apparatus of claim 3, wherein: The installation mechanism includes a fixed seat and an L-shaped mounting plate, the fixed seat is fixedly arranged on the top of the adjacent limiting baffle, and the L-shaped mounting plate is fixedly arranged on the top of the fixed seat.

5. The easy-to-maintain transistor testing apparatus according to claim 4, characterized by: The installation mechanism further includes an installation slot and a placing box, the installation slot is arranged through the top of the L-shaped mounting plate, and the placing box is fixedly arranged on the back of the L-shaped mounting plate.

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