Power supply aging test line

Abstract

The utility model provides a power supply aging test line, which comprises a test carrier, an aging cabinet, a test line body and a test device, the test carrier is used for loading a product to be subjected to an aging test, the aging cabinet is used for aging the product placed on the test carrier, the aging cabinet and the test line body are arranged side by side, and the test device is arranged on the test line body. The aging cabinet is arranged on the test line body, the test carrier is arranged between the aging cabinet and the test line body, the test equipment is arranged on the test line body, the test line body is used for conveying the test carrier loaded with a product subjected to aging treatment by the aging cabinet to the test equipment, and the test equipment is used for carrying out aging performance test on the product. The device has dual functions of power supply aging and testing, and the production efficiency is greatly improved.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of aging test, and in particular to a power supply aging test line. BACKGROUND

[0002] With the development of power electronic technology and the improvement of industrialization level, various switching power supplies are widely applied to various aspects of social production. Whether the power supply operation is reliable directly relates to the safety and accuracy of system operation and influences the safety of people's life. The switching power supply in the electronic field must be subjected to aging and electrical performance test after production and assembly are completed, so as to ensure that process problems can be found and solved in time before leaving the factory.

[0003] After being subjected to ultrasonic treatment in the switching power supply production process, the switching power supply needs to be subjected to aging, ATE test, voltage resistance test and label pasting or laser marking, packaging and other process procedures before leaving the factory. The aging, ATE test and voltage resistance test belong to the electrical performance test of the switching power supply. The label pasting or laser marking and packaging belong to the appearance processing link of the switching power supply. In the test of the traditional switching power supply, the aging, ATE test, voltage resistance test and post-processing technology of the switching power supply product are various setting test stations, and each electrical performance test is completed separately. Therefore, at least four mounting and dismounting processes are needed after each switching power supply test is completed. In the various tests of the traditional switching power supply, the clamping and mounting process of the switching power supply product in the aging, ATE test and voltage resistance test is completed by manual operation.

[0004] Therefore, the electrical performance test of the traditional switching power supply occupies a large amount of human resources, is low in efficiency and high in cost. In addition, the input and output interfaces of the switching power supply product need to be plugged in and out many times in the aging and electrical performance test, which influences the performance and service life of the product. In the aging and electrical performance test of the traditional switching power supply, the input and output interfaces of the product are not standardized and many are not foolproof, so that the input and output interfaces are easily damaged or misinserted during manual operation, which causes the product to be damaged by human operation and reduces the yield. CONTENT OF THE INVENTION

[0005] The application aims to provide a power supply aging test line capable of aging and testing.

[0006] In order to achieve the above-mentioned purpose, the application provides the following technical scheme:

[0007] The power supply aging test line comprises a test carrier, an aging cabinet, a test line body and a test device, the test carrier is used for loading products to be tested for aging, the aging cabinet is used for aging treatment of the products placed on the test carrier, the aging cabinet is arranged side by side with the test line body, and the test carrier circulates between the aging cabinet and the test line body, the test device is arranged on the test line body, the test line body is used for conveying the test carrier loaded with the products after aging treatment of the aging cabinet to the test device, and the test device is used for aging performance test of the products.

[0008] Further, the test carrier comprises a tray and a slot arranged on the tray, AC input end and DC output end are arranged at two ends of the slot respectively, an assembly station for assembling the products is formed between the AC input end and the DC output end, and an LED lamp connected in series with the AC input end is arranged on the tray.

[0009] Further, a plurality of slots are arranged side by side on the tray, and a baffle is arranged between two adjacent slots.

[0010] Further, the aging cabinet is provided with a layer plate for placing the test carrier.

[0011] Further, a cabinet interface is arranged on the back plate of the aging cabinet above each layer plate, and a carrier interface is arranged on the side of the test carrier to electrically connect the test carrier with the aging cabinet.

[0012] Further, a positioning column extending towards the interior of the aging cabinet is arranged on the back plate of the aging cabinet at the cabinet interface, and a positioning hole is arranged on the side of the test carrier to positionally connect the test carrier with the aging cabinet.

[0013] Further, the test line body comprises a rack and a speed-up chain arranged on the rack, the speed-up chain is arranged in double layers, and a transfer mechanism is arranged at the end of the rack to transfer the test carrier on the upper speed-up chain to the lower speed-up chain.

[0014] Further, the transfer mechanism comprises a bracket and a lifting cylinder, and the lifting cylinder is used to drive the bracket to move up and down between the two layers of speed-up chains.

[0015] Further, a conveying belt is arranged on the bracket in the same direction as the conveying direction of the speed-up chain.

[0016] Further, the test device comprises a high-voltage test station and a final test station arranged in sequence along the conveying direction of the test line body.

[0017] Compared with the prior art, the scheme has the following advantages:

[0018] The power supply aging test line of the present application can realize batch aging treatment of products by setting an aging cabinet. After the test carrier is placed in the aging cabinet, the interface of the test carrier needs to be connected with the interface of the cabinet. Through the connection, the test carrier can closely cooperate with the environmental control system (such as temperature, humidity, etc.) of the aging cabinet, so as to ensure that the sample is in a consistent simulated environment during the test, thereby improving the accuracy and reliability of the test. The test carrier can be integrated with the automatic system of the aging cabinet to realize automatic adjustment of test parameters, real-time collection and monitoring of data, reduce human intervention, improve test efficiency, and record test data in real time for subsequent analysis and problem tracing to provide basis for product improvement. In addition, the aging cabinet and the test line body are arranged side by side, which can facilitate workers to carry the test carrier in the aging cabinet to the test line body, and then the test carrier is transported to the test equipment by the test line body. The product is transported to the test equipment with the test carrier to perform performance test, so as to distinguish the advantages and disadvantages of the product to facilitate workers to classify the qualified products and the substandard products in time, and then the test carrier is transferred to the lower speed chain by the transfer mechanism to be transported to the next process.

[0019] Additional aspects and advantages of the present application will be in part apparent and in part pointed out hereinafter. BRIEF DESCRIPTION OF DRAWINGS

[0020] The above and / or additional aspects and advantages of the present application will become apparent and be readily appreciated from the following description, including the appended drawings.

[0021] Figure 1 Structure diagram of an embodiment of the power supply aging test line of the present application;

[0022] Figure 2 Top view of an embodiment of the power supply aging test line of the present application;

[0023] Figure 3 Front view of an embodiment of the power supply aging test line of the present application;

[0024] Figure 4 Structure diagram of a test carrier in the power supply aging test line of the present application;

[0025] Figure 5 Side view of a test carrier in the power supply aging test line of the present application for showing the side of the carrier interface thereof;

[0026] Figure 6 Diagram of a transport line body of the power supply aging test line of the present application close to the side of the loading station thereof;

[0027] Figure 7Figure 1 is a schematic view of a power supply burn-in test line according to the present application.

[0028] Figure 1 is a schematic view of a power supply burn-in test line according to the present application. DETAILED DESCRIPTION

[0029] Embodiments of the present application are described in detail below with reference to the attached drawing figures, wherein the same or like reference numerals and characters in different figures denote the same or like components (features or functions). These embodiments are presented as examples of the present application only, not as limitations. As such, the figures can not be to scale and not all aspects of the present application will be described with reference to the figures.

[0030] It is to be understood that the various steps of the method embodiments of the present application can be performed in different orders, and / or in parallel. Furthermore, the method embodiments can include additional steps and / or omit performing the steps shown. The scope of the present application is not limited in this respect.

[0031] The term "comprising" and variations thereof as used herein are used inclusively, i.e., "comprising but not limited to." The term "connected" can be direct or indirect "connected" through intervening components (elements). The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments." Related definitions will be given in the description below.

[0032] It should be noted that the terms "first", "second", and the like in the description do not necessarily mean "different", but are used to distinguish an entity from another entity performing a similar action or function. In addition, the terms "first", "second", and the like are not necessarily used to distinguish an entity or limit the sequence of the functions performed by the entities.

[0033] Reference should be made to Figures 1 to 7The power supply aging test line can be applied to aging test of AC / AC, AC / DC, DC / AC and DC / DC power converters such as LED driving power supply, TV power supply, PC power supply, charger, display power supply, adapter, module power supply, industrial power supply and communication power supply, so as to find potential defects of the power supply through the aging test, verify stability and reliability of the power supply, and then find possible safety accident hazards in advance, facilitate to reduce use risk through improvement of related technology or process, and optimize durability and anti-aging ability of the power supply.

[0034] It should be noted that the aging test is a necessary link to meet international standards (such as UL and CE certification), and ensures that the product meets the safety and reliability regulation requirements.

[0035] Specifically, the power supply aging test line comprises a test carrier, an aging cabinet, a test line body and a test device. The test carrier is used to load products that need to be subjected to aging test. The aging cabinet is used to age the products placed on the test carrier. The test line body is used to transport the test carrier placed thereon to the test device. The test device is used to test the aging performance of the products on the test carrier transported to the test station thereof. In addition, the aging cabinet and the test line body of the embodiment are arranged side by side. Workers can carry the test carrier loaded with products subjected to aging treatment in the aging cabinet to the test line body, so as to realize the turnover of the test carrier between the aging cabinet and the test line body.

[0036] When arranging the positions of the aging cabinet and the test line body, the distance between the aging cabinet and the test line body needs to be considered, and it is ensured that there is no obstacle in the passage between the aging cabinet and the test line body, so as to reduce the carrying difficulty and collision risk.

[0037] The aging cabinet is provided with a layer plate for placing the test carrier. In the embodiment, a plurality of aging cabinets are arranged along the transportation direction of the test line body. Each aging cabinet is provided with a plurality of layer plates. Each layer plate can place a plurality of test carriers, so that each aging cabinet can simultaneously age a plurality of power supplies, and the aging efficiency of the power supply products is improved. In addition, each aging cabinet is provided with two groups of electric control modules. The two groups of electric control modules can manage loads in different areas respectively, support independent test of different load types, and support partition management of charging modules and discharging modules.

[0038] The test carrier includes a tray and a slot arranged on the tray, AC input end and DC output end are arranged at two ends of the slot respectively to form an assembly station for product assembly between the AC input end and the DC output end, and an LED lamp in series with the AC input end is further arranged on the tray. In order to improve the aging efficiency of the product, a plurality of slots arranged side by side are arranged on the tray of each test carrier, and a baffle is arranged between adjacent two slots, and the AC input end and the DC output end are arranged at two ends of each slot respectively, and the baffle can effectively reduce electromagnetic interference or signal crosstalk that may be generated in the aging process or test process. The back plate of the aging cabinet is provided with a cabinet interface above each layer of the back plate, and the side of the test carrier is provided with a carrier interface matched with the cabinet interface to electrically connect the test carrier with the aging cabinet, so that when the test carrier of the application is placed on the layer plate in the aging cabinet, the carrier interface of the test carrier needs to be docked with the cabinet interface to realize subsequent aging treatment.

[0039] Further, the back plate of the aging cabinet is provided with a positioning hole extending towards the interior of the aging cabinet at the position where the cabinet interface is arranged, and the test carrier is provided with a positioning hole for inserting a positioning column at the side where the carrier interface is arranged, so that the positioning connection of the test carrier with the aging cabinet can be realized to ensure the accuracy of the docking of the carrier interface with the cabinet interface.

[0040] After the carrier interface of the test carrier is docked with the cabinet interface of the aging cabinet, the AC input end of the test carrier is connected with an alternating current power supply, and the DC output end is used to convert alternating current into direct current, and the AC input end and the DC output end jointly constitute an electrical circuit of the test carrier to ensure that the product can be normally powered and operated during the test. Through the cooperation of the AC input end and the DC output end, the test carrier can simulate the electrical conditions in the actual working environment to improve the authenticity and reliability of the test. The arrangement of the LED lamp can indicate the aging product state or test process, facilitate real-time monitoring by workers, and also enhance the visualization function of the test carrier to improve the convenience and safety of operation.

[0041] The aging cabinet can set parameters such as charging voltage, circuit, temperature, etc. according to the type and performance index of the product to ensure the accuracy and pertinence of the test. The aging cabinet can perform charge-discharge simulation and environmental simulation. In the simulation of the charge-discharge process, the charging module provides a charging current and voltage for the battery under test to simulate the actual charging process; after the charging is completed, the load module consumes the electrical energy of the battery to simulate the load in actual use. The battery can also be heated or cooled by the temperature control module to simulate the temperature environment in actual use.

[0042] In addition, a handle is further arranged at the end side of the test carrier, and the handle can facilitate workers to pull out the test carrier from the aging cabinet.

[0043] The test carrier loaded with the product after the aging cabinet aging treatment is carried by a worker to the test line body, and the test carrier is transported to the test equipment through the test line body, thereby improving the automation degree of the aging test of the application. The test line body includes a rack and a speed-up chain arranged on the rack, and the speed-up chain can realize accurate stopping and positioning of the test carrier, so that the test carrier can be accurately stopped at the test station for detection by the test equipment. The test line body of the embodiment is provided with five feeding stations, and the five feeding stations can simultaneously perform feeding operations, thereby reducing the waiting time and improving the transportation efficiency of the test line body.

[0044] Further, the application is provided with two layers of speed-up chains arranged side by side on the rack, the upper speed-up chain is used to transport the test carrier to the test equipment, and the lower speed-up chain is used to transfer the test carrier after the test to the next process. The double-layer speed-up chain conveying line is designed compactly, reduces the space occupation of the production site, and is suitable for the production environment with limited space. Meanwhile, the transfer mechanism is arranged at the end of the speed-up chain away from the feeding station. The transfer mechanism of the embodiment includes a bracket and a lifting cylinder, the lifting cylinder is used to drive the bracket to reciprocate between the two layers of speed-up chains, so that the test carrier on the upper speed-up chain can be transferred to the lower speed-up chain. A transmission belt that can rotate forward or reverse is further arranged on the bracket, and the test carrier can be completely transferred to the bracket through the transmission belt, so that the test carrier can be lifted with the bracket.

[0045] The test line body is provided with a test station between the feeding station and the transfer mechanism, and the test equipment is arranged at the test station. The test equipment of the embodiment includes a high-voltage test station and a final test station arranged in sequence along the transportation direction of the test line body. The high-voltage test station is mainly used for high-voltage test of the product, to ensure the safety and reliability of the product in the high-voltage environment. This test usually involves verification of electrical performance, such as voltage resistance test, insulation test, etc.; the final test station is also called ATE (Automatic Test Equipment) final test station, which is mainly used for comprehensive automatic test of the product, to ensure that the product meets all design specifications and quality standards before leaving the factory. The final test usually includes function test, performance test, parameter test, etc., to verify the overall performance and consistency of the product. The combination of the above two test stations can ensure that the product is subjected to comprehensive quality detection before leaving the factory, thereby improving the reliability and market competitiveness of the product.

[0046] The power supply needs to be aged before leaving the factory. Through aging test, the various environmental conditions of the power supply in actual use are simulated, the internal chemical reaction of the power supply tends to be stable, thereby improving the performance stability of the power supply in high load and variable environment, and the active substances in the power supply can fully react, the electrochemical performance of the power supply is optimized, the power supply reaches the best state before leaving the factory, and the power supply with potential problems such as unstable voltage, abnormal internal resistance, etc. can be screened out, the safety hazards of the power supply such as overheating, short circuit, etc. are found in advance, the safety risk of the power supply in use is reduced, and the quality consistency of the power supply leaving the factory is ensured.

[0047] The power supply aging test line of the present application can realize batch aging treatment of products by setting multiple aging cabinets, and different aging cabinets can set different parameters to meet the test needs of different products. After the test carrier is placed in the aging cabinet, the interface of the test carrier needs to be connected with the interface of the cabinet body. Through the connection, the test carrier can closely cooperate with the environmental control system (such as temperature, humidity, etc.) of the aging cabinet, so as to ensure that the sample is in a consistent simulated environment during the test, thereby improving the accuracy and reliability of the test. The test carrier can be integrated with the automatic system of the aging cabinet to realize automatic adjustment of test parameters, real-time collection and monitoring of data, reduce human intervention, improve test efficiency, and record test data in real time, which is convenient for subsequent analysis and problem tracing, and provides basis for product improvement. The aging cabinet and the test line body are arranged side by side, which can facilitate workers to carry the test carrier in the aging cabinet to the test line body, and then the test carrier is transported to the test equipment by the test line body. The product is transported to the test equipment with the test carrier to perform performance test, so as to distinguish the advantages and disadvantages of the product, so that workers can classify the qualified products and substandard products in time, and then the test carrier is transferred to the lower speed chain by the transfer mechanism to be transported to the next process.

[0048] The above only describes some embodiments of the present application. It should be pointed out that for ordinary skilled persons in the technical field, some improvements and refinements can be made without departing from the principles of the present application, and these improvements and refinements should also be considered as the protection scope of the present application.

Claims

1. A power supply burn-in line, characterized by, The test carrier is used for loading products to be tested, the aging cabinet is used for aging the products placed on the test carrier, the aging cabinet is arranged side by side with the test line body, and the test carrier circulates between the aging cabinet and the test line body, the test equipment is arranged on the test line body, the test line body is used for conveying the test carrier loaded with the products aged by the aging cabinet to the test equipment, and the test equipment is used for testing the aging performance of the products.

2. The power aging test line of claim 1, wherein, The test carrier includes a tray and a slot arranged on the tray, two ends of the slot are respectively provided with an AC input end and a DC output end, an assembly station for assembling the products is formed between the AC input end and the DC output end, and the tray is further provided with an LED lamp connected in series with the AC input end.

3. The power aging test line of claim 2, wherein, The tray is provided with a plurality of slots arranged side by side, and a baffle is arranged between two adjacent slots.

4. The power aging test line of claim 2, wherein, The aging cabinet is provided with a layer plate for placing the test carrier.

5. The power aging test line of claim 4, wherein, The back plate of the aging cabinet is provided with a cabinet interface above each layer plate, and the side of the test carrier is provided with a carrier interface matched with the cabinet interface to electrically connect the test carrier and the aging cabinet.

6. The power aging test line of claim 5, wherein, The back plate of the aging cabinet is provided with a positioning column extending towards the interior of the aging cabinet at the cabinet interface, and the side of the test carrier provided with the carrier interface is provided with a positioning hole for inserting the positioning column to positionally connect the test carrier and the aging cabinet.

7. The power aging test line of claim 1, wherein, The test line body includes a rack and a speed-up chain arranged on the rack, the speed-up chain is arranged in double layers, and the end of the rack is provided with a transfer mechanism for transferring the test carrier on the upper speed-up chain to the lower speed-up chain.

8. The power aging test line of claim 7, wherein, The transfer mechanism includes a bracket and a lifting cylinder, and the lifting cylinder is used for driving the bracket to move up and down between the two layers of speed-up chains.

9. The power aging test line of claim 8, wherein, The bracket is provided with a conveyor belt.

10. The power aging test line of claim 1, wherein, The test equipment includes a high-voltage test station and a final test station arranged in sequence along the conveying direction of the test line body.

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