Substrate assembly and display module

Abstract

The utility model relates to a substrate assembly and a display module. The substrate assembly comprises a display area and a cutting area, the cutting area is arranged on the periphery of the display area, and the substrate assembly comprises a substrate; the first signal lines are arranged on the substrate of the display area at intervals; the two ends of the first signal line in the extending direction are a first end and a second end respectively. The plurality of first test electrodes are arranged on the substrate in the cutting area at intervals and are arranged corresponding to the plurality of first signal lines, and the first test electrodes are electrically connected with the first ends of the corresponding first signal lines; and the second test electrode is arranged on the substrate in the cutting area and is electrically connected with the second ends of the plurality of first signal lines. Therefore, according to the substrate assembly and the display module, waste of production materials in the production process of the display module can be reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of display, in particular to a substrate assembly and a display module. BACKGROUND

[0002] Compared with organic substrates, glass substrates have attracted attention in advanced packaging due to their superior flatness, insulation, thermal and optical properties. In glass substrates, vertical electrical connections are provided by high-density through holes, which are called through glass vias (TGV for short).

[0003] In the related art, an LED integrated packaging display product can include a glass substrate having a first surface and a second surface oppositely arranged along the thickness direction of the glass substrate, and metal wiring can be arranged on both the first surface and the second surface.

[0004] However, due to the characteristics of the glass substrate, microcracks are prone to occur in the glass substrate during production and packaging, but there is no corresponding detection method to detect the microcracks, resulting in the glass substrate flowing into the subsequent process and causing waste of materials. UTILITY MODEL CONTENT

[0005] Therefore, it is necessary to provide a substrate assembly and a display module, which can reduce the waste of production materials in the production process of the display module.

[0006] In a first aspect, an embodiment of the present application provides a substrate assembly, which includes a display area and a cutting area, the cutting area is arranged at the outer periphery of the display area, and the substrate assembly includes:

[0007] a substrate;

[0008] a plurality of first signal lines, which are arranged on the substrate in the display area at intervals; the two ends of the first signal line along the extension direction are respectively a first end and a second end;

[0009] a plurality of first test poles, which are arranged on the substrate in the cutting area at intervals and correspond to the plurality of first signal lines, and the first test pole is electrically connected to the first end of the corresponding first signal line;

[0010] a second test pole, which is arranged on the substrate in the cutting area and is electrically connected to the second end of the plurality of first signal lines.

[0011] The substrate assembly provided by the embodiment of the present application arranges the first test pole and the second test pole in the cutting area instead of the display area, and the cutting area does not need to be attached with a chip and will not cause the first test pole and the second test pole to be blocked, so that the first signal line can be tested at any process, thereby the abnormal condition of the substrate assembly can be found in time, the waste of materials can be reduced, and the sunk cost of working hours can be reduced.

[0012] In one of the embodiments, the substrate assembly includes a plurality of second signal lines, a plurality of third test electrodes and a fourth test electrode disposed on the substrate, the plurality of second signal lines are disposed in the display area and are electrically isolated from the first signal lines, the two ends of the second signal line along the extending direction are respectively a third end and a fourth end, the plurality of third test electrodes are disposed in the cutting area and are electrically isolated from the first test electrodes;

[0013] The plurality of second signal lines are correspondingly disposed with the plurality of third test electrodes, the third end of the second signal line is electrically connected with the corresponding third test electrode, and the fourth end of the plurality of second signal lines are all electrically connected with the fourth test electrode.

[0014] In one of the embodiments, the plurality of first signal lines are disposed in the first direction and extend in the second direction, and any two of the first direction, the second direction and the thickness direction of the substrate intersect;

[0015] The first test electrodes corresponding to the adjacent two first signal lines are oppositely disposed in the first direction, or the first test electrodes corresponding to the adjacent two first signal lines are staggered in the first direction.

[0016] In one of the embodiments, the plurality of second signal lines are disposed in the second direction and extend in the first direction, and any two of the first direction, the second direction and the thickness direction of the substrate intersect;

[0017] The third test electrodes corresponding to the adjacent two second signal lines are oppositely disposed in the second direction, or the third test electrodes corresponding to the adjacent two second signal lines are staggered in the second direction.

[0018] In one of the embodiments, the substrate includes a first surface and a second surface opposite in the thickness direction of the substrate;

[0019] One of the first signal line and the second signal line is disposed on the first surface, and the other is disposed on the second surface;

[0020] At least one of the first test electrode, the second test electrode, the third test electrode and the fourth test electrode is disposed on the first surface, or at least one of the first test electrode, the second test electrode, the third test electrode and the fourth test electrode is disposed on the second surface.

[0021] In one of the embodiments, the second test electrode and the fourth test electrode are both disposed on the same side in the thickness direction of the substrate;

[0022] The second test electrode and the fourth test electrode are disposed in the cutting area and are electrically isolated from the first test electrodes;

[0023] The second test electrode and the fourth test electrode are connected.

[0024] In one of the embodiments, the second test electrode and the fourth test electrode are respectively disposed on the two sides in the thickness direction of the substrate;

[0025] The second test electrode and the fourth test electrode are arranged in the substrate plane.

[0026] The substrate assembly includes a first connecting line arranged in the cutting area, the second test electrode and the second ends of the plurality of first signal lines are electrically connected through the first connecting line, the second test electrode and the fourth test electrode are arranged in the substrate plane, the first connecting line is arranged in the substrate plane, and the first connecting line is arranged in the substrate plane.

[0027] In one of the embodiments, the substrate assembly includes a plurality of fifth test electrodes arranged in the cutting area, one of the fifth test electrodes corresponds to the plurality of first test electrodes, and the fifth test electrode is electrically connected to the corresponding plurality of first test electrodes.

[0028] In one of the embodiments, the substrate assembly includes a plurality of second connecting lines arranged in the cutting area, each of the first test electrodes is electrically connected to the fifth test electrode through a different second connecting line among the plurality of second connecting lines.

[0029] The second connecting line includes a first extension segment, a second extension segment and a third extension segment connected in sequence, the size of the second extension segment is smaller than the size of the first extension segment and the third extension segment along the direction perpendicular to the extension direction of the second connecting line, and a first peelable layer is arranged between the second extension segment and the substrate.

[0030] In one of the embodiments, the first extension segment includes a first sub-portion close to the second extension segment, and the size of the first sub-portion along the direction perpendicular to the extension direction of the second connecting line gradually decreases from the first extension segment to the second extension segment.

[0031] In one of the embodiments, the third extension segment includes a second sub-portion close to the second extension segment, and the size of the second sub-portion along the direction perpendicular to the extension direction of the second connecting line gradually decreases from the third extension segment to the second extension segment.

[0032] In the second aspect, the embodiments of the present application provide a display module including the substrate assembly of the first aspect. BRIEF DESCRIPTION OF DRAWINGS

[0033] Figure 1 A top view of the substrate assembly provided by the embodiments of the present application.

[0034] Figure 2 Another top view of the substrate assembly provided by the embodiments of the present application.

[0035] Figure 3 Another top view of the substrate assembly provided by the embodiments of the present application.

[0036] Figure 4Another top view of the substrate assembly provided by an embodiment of the present application.

[0037] Figure 5 Another top view of the substrate assembly provided by an embodiment of the present application.

[0038] Figure 6 A top view of the first peelable layer and the second connection line provided by an embodiment of the present application.

[0039] Figure 7 A top view of the substrate assembly provided by an embodiment of the present application.

[0040] Explanation of reference signs:

[0041] 100, substrate assembly; 100a, display area; 100b, cutting area; 110, first connection line; 120, second connection line; 121, first extension segment; 1211, first sub-portion; 122, second extension segment; 123, third extension segment; 1232, second sub-portion; 130, third connection line; 140, substrate; 151, first signal line; 152, second signal line; 161, first test pole; 162, second test pole; 163, third test pole; 164, fourth test pole; 165, fifth test pole; 166, sixth test pole; 171, first peelable layer; 172, second peelable layer; 180, light emitting diode. DETAILED DESCRIPTION

[0042] In order to make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application can be practiced without using these specific details. In other instances, well-known methods have not been described in detail in order to avoid obscuring the present application. Therefore, the specific embodiments described herein are not intended to limit the present application, but rather to disclose particular ways of practicing the present application.

[0043] In the description of the present application, it should be understood that, if there are terms such as "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0044] In addition, if there are these terms "first", "second", these terms are only used for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In the description of the present application, if there are terms "a plurality of", the meaning of "a plurality of" is at least two, such as two, three, etc., unless otherwise specifically limited.

[0045] In the present application, unless otherwise expressly specified and limited, if there are terms "installation", "connection", "connection", "fixation" and the like, these terms should be understood in a broad sense. For example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise expressly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0046] In the present application, unless otherwise expressly specified and limited, if there are similar descriptions such as "first feature on" or "below" the second feature, the meaning can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature "above", "above" and "above" the second feature can be the first feature directly above or obliquely above the second feature, or only indicates that the first feature is higher than the second feature in horizontal height. The first feature "below", "below" and "below" the second feature can be the first feature directly below or obliquely below the second feature, or only indicates that the first feature is lower than the second feature in horizontal height.

[0047] It should be noted that if an element is referred to as "fixed to" or "provided on" another element, it can be directly on another element or there can be a middle element. If an element is considered to be "connected" to another element, it can be directly connected to another element or there can be a middle element. If present, the terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used in the present application are only for the purpose of illustration, and do not represent the only implementation.

[0048] In the related art, the LED integrated packaging display product can include a glass substrate having a first surface and a second surface arranged opposite along the thickness direction of the glass substrate, and the first surface and the second surface can be provided with metal wires and pads. The metal wires on the first surface are electrically connected to the pads on the first surface, and the metal wires on the second surface are electrically connected to the pads on the second surface. The glass substrate can be provided with a TGV through hole, and the electrical connection of the metal wires on the first surface and the second surface is realized through the TGV through hole.

[0049] Since the glass substrate can be provided with the TGV through hole, the strength of the glass substrate is reduced, which is easy to be broken during transportation and production process and causes the metal wiring to be broken, and it is necessary to contact the probe with the pad after the metal wiring and the pad are formed on the substrate assembly and before the chip is attached to the pad, so as to perform needle bed detection on the metal wiring, and ensure that the metal wiring is not broken before being provided to the downstream packaging factory.

[0050] However, after the chip is attached to the pad, the pad is blocked by the chip and the probe cannot be in contact with the pad, so that the needle bed detection on the metal wiring cannot be performed after the chip is arranged, so that the subsequent processes cannot perform the needle bed detection on the metal wiring, so that the abnormality such as micro-cracks of the glass substrate cannot be found during the subsequent process, so that the production material waste is more serious and the sunk cost of working hours is higher.

[0051] In addition, the metal wiring and the pad on the glass substrate have the ultra-thin feature, and the micron-level line width and the ultra-thin structure of the metal wiring and the pad cause the mechanical strength to be seriously insufficient. If the probe is directly in contact with the pad for testing, the surface scratch of the pad, the peeling of the metal layer and other irreversible damage are easy to occur, which seriously affects the product yield. With the miniaturization evolution of the LED module, the size of the pad has been reduced to the sub-micron level and presents a high-density micro-pad array arrangement. The traditional probe array is difficult to realize high-precision positioning matching, and there are problems of virtual measurement / mis-measurement caused by contact point deviation, and mismatch between the physical limit of the probe spacing and the pad spacing, which seriously restricts the test coverage of the miniaturized product. The inherent brittleness of the glass substrate is easy to induce micro-cracks or breakage when subjected to the multi-probe concurrent contact pressure in the needle bed test. The stress superposition effect of the flatness tolerance of the test fixture and the warping deformation of the glass substrate further aggravates the failure risk of the glass substrate contacted by the probe.

[0052] To solve the above problems, the embodiments of the present application provide a substrate assembly and a display module, which can reduce the waste of production materials during the production process of the display module.

[0053] The following will be combined with Figures 1-7 The substrate assembly 100 and the display module provided by the embodiments of the present application will be described.

[0054] The embodiments of the present application provide a substrate assembly 100, which includes a display area 100a and a cutting area 100b. The cutting area 100b is arranged at the outer periphery of the display area 100a, and the cutting area 100b can be cut and removed in the subsequent process.

[0055] Referring to Figure 1 The substrate assembly 100 includes a substrate 140, and the substrate 140 includes a first surface and a second surface arranged opposite to each other in the thickness direction of the substrate 140. The substrate 140 can be used to support the material arranged on the substrate 140 subsequently.

[0056] The substrate 140 can be a glass substrate, a silicon substrate, or other substrates. The embodiments of the present application are described by taking the glass substrate as an example. The glass substrate has a low cost and is environmentally friendly.

[0057] The substrate assembly 100 can be applied to at least one of AM driving and PM driving.

[0058] The substrate assembly 100 can include any one of a PCB substrate assembly, an FPC substrate assembly, a BT substrate assembly, a glass substrate assembly, and the like.

[0059] Referring to Figure 1 The substrate assembly 100 includes a plurality of first signal lines 151 which are spaced apart on the substrate 140 of the display area 100a. The two ends of the first signal line 151 along the extension direction are respectively a first end and a second end.

[0060] Referring to Figure 1The substrate assembly 100 comprises a plurality of first test poles 161, the plurality of first test poles 161 are arranged on the substrate 140 in the cutting area 100b, and the plurality of first test poles 161 are arranged corresponding to the plurality of first signal lines 151, and the first test pole 161 is electrically connected to the first end of the corresponding first signal line 151. The substrate assembly 100 comprises a second test pole 162, the second test pole 162 is arranged on the substrate 140 in the cutting area 100b, and the second test pole 162 is electrically connected to the second end of the plurality of first signal lines 151, that is, the second end of the plurality of first signal lines 151 is connected to the same second test pole 162. The test device comprises a first test probe and a second test probe, the first test probe contacts the first test pole 161, and the second test probe contacts the second test pole 162. The first signal line 151 is detected by using the scanning point detection method, so that the detection method is relatively simple. If the first signal line 151 is detected to be not connected or the on-resistance exceeds the preset range, the production line needs to be removed for maintenance or scrapped. On the one hand, the first test pole 161 and the second test pole 162 are arranged in the cutting area 100b, not in the display area 100a. The first test pole 161 and the second test pole 162 are not blocked by the chip in the cutting area 100b, and the first signal line 151 can be tested at any process, so that the abnormal condition of the substrate assembly 100 can be found in time, the waste of materials is reduced, the sunk cost of working hours is reduced, in addition, the probe does not directly contact the pad in the display area 100a during the test process, which can avoid damaging the pad in the display area 100a. Since the first test pole 161 and the second test pole 162 are removed by cutting in the subsequent process, they will not affect the yield of the final product. Secondly, the wiring design of the display area 100a can not be changed, the arrangement density of the first test pole 161 in the cutting area 100b can be set smaller, the setting area of the first test pole 161 and the second test pole 162 can be increased, the false detection / misjudgment problem can be improved, the test coverage problem of the micro product can be improved, the test precision can be improved, and the efficiency of the line detection is greatly improved. On the other hand, by adjusting the position of the first test probe to contact different first test poles 161, different first signal lines 151 can be tested. In addition, the second end of each first signal line 151 is electrically connected to the same second test pole 162, so that the position of the second test probe does not need to be changed when testing different first signal lines 151, so that the test is more simple and easy to operate.

[0061] In some embodiments, referring to Figure 1The substrate assembly 100 includes a plurality of second signal lines 152, a plurality of third test poles 163 and a fourth test pole 164 disposed on the substrate 140. The plurality of second signal lines 152 are disposed in the display area 100a and are electrically isolated from the first signal lines 151. The second signal lines 152 have third ends and fourth ends at two ends along the extending direction. The plurality of third test poles 163 are disposed in the cutting area 100b and are electrically isolated from the first test poles 161. The plurality of second signal lines 152 are correspondingly arranged with the plurality of third test poles 163. The third ends of the second signal lines 152 are electrically connected with the corresponding third test poles 163. The fourth ends of the plurality of second signal lines 152 are electrically connected with the fourth test pole 164. For example, the first test probe contacts the third test pole 163, and the second test probe contacts the fourth test pole 164. On the one hand, since the third test pole 163 and the fourth test pole 164 are disposed in the cutting area 100b instead of the display area 100a, the second signal lines 152 can be tested at any process, so that the abnormality of the substrate assembly 100 can be found in time, the waste of materials is reduced, the sunk cost of working hours is reduced, and even if the third test pole 163 and the fourth test pole 164 are damaged during the measurement process, the yield of the final product will not be affected, the false measurement / mismeasurement problem can be improved, the test coverage problem of the miniaturized product can be improved, and on the other hand, by adjusting the position of the first test probe to contact different third test poles 163, different second signal lines 152 can be tested. In addition, the fourth ends of the second signal lines 152 are electrically connected with the fourth test pole 164, so that the position of the second test probe does not need to be changed when different second signal lines 152 are tested, so that the test is more simple and easy to operate.

[0062] It should be noted that the first signal lines 151 and the second signal lines 152 can be tested by the first test probe and the second test probe. Alternatively, the first signal lines 151 can be tested by the first test probe and the second test probe, and the second signal lines 152 can be tested by a third test probe and a fourth test probe. The third test probe contacts the third test pole 163, and the fourth test probe contacts the fourth test pole 164. The number of the first test probe and the second test probe can be one, and one first signal line 151 can be measured at a time. Alternatively, the first test probe is a plurality and the second test probe is one, and a plurality of first signal lines 151 can be measured at a time. Similarly, one second signal line 152 can be measured at a time, or a plurality of second signal lines 152 can be measured at a time.

[0063] For example, the material of at least one of the first signal lines 151, the second signal lines 152 and the test poles can include copper, iron, nickel, silver, titanium, molybdenum and the like.

[0064] Referring toFigure 1 The substrate assembly 100 can have a first direction X, a second direction Y, and a third direction, which are all different. The first direction X and the second direction Y can be any two different directions parallel to the substrate 140, and the third direction can be any direction intersecting the substrate 140. For example, the first direction X, the second direction Y, and the third direction can be perpendicular to each other. For example, the first direction X can be the width direction of the substrate assembly 100, the second direction Y can be the length direction of the substrate assembly 100, and the third direction can be the thickness direction of the substrate assembly 100. The length, width, and thickness in the embodiments of the present application are only for the convenience of description, and do not mean any limitation on the size. For example, the width can be greater than, equal to, or less than the length.

[0065] In some embodiments, referring to Figure 1 The plurality of first signal lines 151 are arranged at intervals along the first direction X, and the first signal lines 151 extend along the second direction Y. The plurality of second signal lines 152 are arranged at intervals along the second direction Y, and the second signal lines 152 extend along the first direction X. One of the first signal lines 151 and the second signal lines 152 can be a scan line, and the other can be a driving line. One of the first signal lines 151 and the second signal lines 152 can be connected to the cathode of the light-emitting diode 180, and the other can be connected to the anode of the light-emitting diode 180.

[0066] In some examples, referring to Figure 1 The first test poles 161 corresponding to the two adjacent first signal lines 151 are arranged opposite to each other along the first direction X, so that the arrangement of the first test poles 161 corresponding to the two adjacent first signal lines 151 is more regular, which is beneficial to reducing the design difficulty of the first test poles 161, improving the efficiency of needle testing, simplifying the design of the needle testing jig, and reducing the cost of the jig. In other examples, referring to Figure 2 The first test poles 161 corresponding to the two adjacent first signal lines 151 are arranged staggered along the first direction X, so that the size of the first test poles 161 along the first direction X can be set larger, which is beneficial to reducing the alignment difficulty of the first test probe and the first test poles 161.

[0067] In some examples, referring to Figure 1 The third test poles 163 corresponding to the two adjacent second signal lines 152 are arranged opposite to each other along the second direction Y, so that the arrangement of the third test poles 163 corresponding to the two adjacent second signal lines 152 is more regular, which is beneficial to reducing the design difficulty of the third test poles 163, improving the efficiency of needle testing, simplifying the design of the needle testing jig, and reducing the cost of the jig. In other examples, referring to Figure 2The third test poles 163 corresponding to two adjacent second signal lines 152 are arranged in the second direction Y in a staggered manner. In this way, the third test poles 163 can be arranged in the second direction Y in a larger size, which is conducive to reducing the alignment difficulty of the first test probe and the third test pole 163.

[0068] In some embodiments, the substrate 140 includes a first surface and a second surface opposite to each other in the thickness direction of the substrate 140. One of the first signal lines 151 and the second signal lines 152 is arranged on the first surface, and the other is arranged on the second surface. The embodiments of the present application are described by taking the first signal lines 151 arranged on the first surface and the second signal lines 152 arranged on the second surface as an example.

[0069] In some embodiments, at least one of the first test poles 161, the second test poles 162, the third test poles 163, and the fourth test poles 164 is arranged on the first surface. For example, the first test poles 161 and the second test poles 162 can be arranged on the first surface. In this case, the first test poles 161, the second test poles 162, and the first signal lines 151 are all arranged on the first surface, and the first test poles 161, the second test poles 162, and the first signal lines 151 can be prepared at the same time, which simplifies the preparation process of the first test poles 161, the second test poles 162, and the first signal lines 151. In addition, the first test poles 161, the second test poles 162, and the first signal lines 151 are arranged on the same side in the thickness direction of the substrate 140, which can reduce the electrical connection difficulty between the first test poles 161 and the first signal lines 151 and between the second test poles 162 and the first signal lines 151.

[0070] For another example, the first test poles 161, the second test poles 162, the third test poles 163, and the fourth test poles 164 are all arranged on the first surface. In this case, the first test poles 161, the second test poles 162, the third test poles 163, and the fourth test poles 164 can be prepared at the same time, which simplifies the preparation process of the first test poles 161, the second test poles 162, the third test poles 163, and the fourth test poles 164.

[0071] In some embodiments, at least one of the first test poles 161, the second test poles 162, the third test poles 163, and the fourth test poles 164 is arranged on the second surface. For example, the third test poles 163 and the fourth test poles 164 can be arranged on the second surface. In this case, the third test poles 163, the fourth test poles 164, and the second signal lines 152 are all arranged on the second surface, and the third test poles 163, the fourth test poles 164, and the second signal lines 152 can be prepared at the same time, which simplifies the preparation process of the third test poles 163, the fourth test poles 164, and the second signal lines 152. In addition, the third test poles 163, the fourth test poles 164, and the second signal lines 152 are arranged on the same side in the thickness direction of the substrate 140, which can reduce the electrical connection difficulty between the third test poles 163 and the second signal lines 152 and between the fourth test poles 164 and the second signal lines 152.

[0072] For example, the first test electrode 161, the second test electrode 162, the third test electrode 163 and the fourth test electrode 164 are arranged on the second surface, and the first test electrode 161, the second test electrode 162, the third test electrode 163 and the fourth test electrode 164 can be prepared simultaneously, thereby simplifying the preparation process of the first test electrode 161, the second test electrode 162, the third test electrode 163 and the fourth test electrode 164.

[0073] For example, the test electrode (at least one of the first test electrode 161, the second test electrode 162, the third test electrode 163 and the fourth test electrode 164) and the signal line (at least one of the first signal line 151 and the second signal line 152) can be prepared simultaneously in the production process of the substrate assembly 100, for example, by physical vapor deposition (PVD), chemical plating, screen printing, chemical vapor deposition (CVD) and the like.

[0074] Referring to Figure 1 In the embodiment in which the second test electrode 162 and the fourth test electrode 164 are arranged on the same side of the substrate 140 in the thickness direction, the second test electrode 162 and the fourth test electrode 164 are arranged at intervals.

[0075] Referring to Figure 3 In the embodiment in which the second test electrode 162 and the fourth test electrode 164 are arranged on the same side of the substrate 140 in the thickness direction, the second test electrode 162 and the fourth test electrode 164 can be connected, so that the second test probe can contact the overall structure formed by the second test electrode 162 and the fourth test electrode 164 when testing the first signal line 151 and the second signal line 152, and the position of the second test probe does not need to be changed when testing different first signal lines 151 and / or second signal lines 152, thereby making the test simpler and easier to operate.

[0076] Referring to Figure 1 In the embodiment in which the second test electrode 162 and the fourth test electrode 164 are arranged on the two sides of the substrate 140 in the thickness direction, the second test electrode 162 and the fourth test electrode 164 are arranged at intervals in the projection of the substrate 140 on the plane, so that the second test electrode 162 and the fourth test electrode 164 can be arranged more flexibly, which is conducive to reducing the design difficulty of the second test electrode 162 and the fourth test electrode 164.

[0077] Referring to Figure 4In the embodiment in which the second test electrode 162 and the fourth test electrode 164 are arranged on two sides of the substrate 140 in the thickness direction, the substrate assembly 100 includes a first connecting line 110 arranged in the cutting area 100b, the second test electrode 162 and the second ends of the plurality of first signal lines 151 are electrically connected through the first connecting line 110, the first connecting line 110 is electrically connected with the second ends of the plurality of first signal lines 151, and the first connecting line 110 is electrically connected with the second test electrode 162, the orthographic projection of the second test electrode 162 on the plane of the substrate 140 overlaps with the orthographic projection of the fourth test electrode 164 on the plane of the substrate 140, the size of the first connecting line 110 along the direction perpendicular to the extension direction of the first connecting line 110 is smaller than the size of the second test electrode 162 along the direction perpendicular to the extension direction of the second test electrode 162, in this way, the area occupied by the first connecting line 110 is small, and the second test electrode 162 and the fourth test electrode 164 overlap in the thickness direction, so that the total area occupied by the second test electrode 162 and the fourth test electrode 164 is small, thereby facilitating the reduction of the area of the part of the cutting area 100b where the first connecting line 110 is located, and the waste of materials of the cutting area 100b can be reduced.

[0078] In some embodiments, referring to Figure 5 , the substrate assembly 100 includes a plurality of fifth test electrodes 165 arranged in the cutting area 100b, one fifth test electrode 165 is arranged corresponding to the plurality of first test electrodes 161, and the fifth test electrode 165 is electrically connected with the corresponding plurality of first test electrodes 161. In this way, when testing the first signal lines 151, the first test probe is in contact with the fifth test electrode 165, and the second test probe is in contact with the second test electrode 162, so that the plurality of first signal lines 151 corresponding to the fifth test electrode 165 can be tested simultaneously through the two probes, if the plurality of first signal lines 151 are all normally conductive, the signal obtained by the testing device is a normal signal, and it is not necessary to test the plurality of first signal lines 151 individually, thereby improving the testing efficiency. If at least one of the plurality of first signal lines 151 cannot be normally conductive, the signal obtained by the testing device is an abnormal signal. Then, the plurality of first signal lines 151 can be tested respectively to determine the first signal line 151 that cannot be normally conductive.

[0079] In some embodiments, referring to Figure 5 and Figure 6The substrate assembly 100 comprises a plurality of second connecting lines 120 arranged in the cutting area 100b, and each of the plurality of first test electrodes 161 is electrically connected to the fifth test electrode 165 through a different second connecting line 120. The second connecting line 120 comprises a first extending section 121, a second extending section 122 and a third extending section 123 connected in sequence, and the size (width) of the second extending section 122 is smaller than that of the first extending section 121 and the third extending section 123 along a direction perpendicular to the extending direction of the second connecting line 120. A first peelable layer 171 is arranged between the second extending section 122 and the substrate 140. In this way, if at least one of the plurality of first signal lines 151 corresponding to the fifth test electrode 165 cannot be normally turned on, and the signal obtained by the testing device is an abnormal signal, the second extending section 122 can be removed by simply tearing off the first peelable layer 171, so that the fifth test electrode 165 and the corresponding plurality of first test electrodes 161 are disconnected, thereby facilitating the determination of the plurality of first signal lines 151 to determine the first signal line 151 that cannot be normally turned on. In addition, the width of the second extending section 122 is set to be small, so that the second extending section 122 is more easily disconnected from the first extending section 121 and the third extending section 123 in the process of tearing off the first peelable layer 171, so that the first extending section 121 and the third extending section 123 are not easily peeled off from the substrate 140 and are not easily damaged.

[0080] In some other embodiments, the plurality of first test electrodes 161 corresponding to the fifth test electrode 165 can be disconnected by cutting off the part of the cutting area 100b where the fifth test electrode 165 is located, thereby facilitating the determination of the plurality of first signal lines 151 to determine the first signal line 151 that cannot be normally turned on.

[0081] In some embodiments, referring to Figure 6 The first extending section 121 comprises a first sub-section 1211 close to the second extending section 122, and the size of the first sub-section 1211 along a direction perpendicular to the extending direction of the second connecting line 120 gradually decreases from the first extending section 121 to the second extending section 122. In this way, the sudden change in width between the second extending section 122 and the first extending section 121 can be prevented, so that stress concentration is avoided and the second connecting line 120 is not easily damaged before the first peelable layer 171 is torn off.

[0082] In some embodiments, the third extending section 123 comprises a second sub-section 1232 close to the second extending section 122, and the size of the second sub-section 1232 along the direction perpendicular to the extending direction of the second connecting line 120 gradually decreases from the direction of the third extending section 123 to the second extending section 122. In this way, the sudden change in width between the second extending section 122 and the third extending section 123 can be prevented, so as to avoid stress concentration and damage. This is conducive to avoiding the failure of the second connecting line 120 before the first peelable layer 171 is torn off.

[0083] In some embodiments, referring to Figure 5 The substrate assembly 100 comprises a plurality of sixth test electrodes 166 arranged at intervals in the cutting area 100b, one sixth test electrode 166 is arranged corresponding to a plurality of third test electrodes 163, and the sixth test electrode 166 is electrically connected to the corresponding plurality of third test electrodes 163. In this way, when testing the second signal line 152, the first test probe is in contact with the sixth test electrode 166, and the second test probe is in contact with the fourth test electrode 164, so that the plurality of second signal lines 152 corresponding to the sixth test electrode 166 can be tested simultaneously by two probes. If the plurality of second signal lines 152 are all normally conductive, the signal obtained by the testing device is a normal signal, and it is not necessary to test the plurality of second signal lines 152 individually, which can improve the testing efficiency. If at least one of the plurality of second signal lines 152 cannot be normally conductive, the signal obtained by the testing device is an abnormal signal. Then, the plurality of second signal lines 152 can be tested respectively to determine the second signal line 152 that cannot be normally conductive.

[0084] In some embodiments, referring to Figure 5The substrate assembly 100 comprises a plurality of third connection lines 130, each of the plurality of third connection lines 130 electrically connecting the sixth test electrode 166 and a corresponding third test electrode 163. The third connection line 130 comprises a fourth extension section, a fifth extension section and a sixth extension section connected in sequence. The fifth extension section has a smaller size (width) than the fourth extension section and the sixth extension section in a direction perpendicular to the extension direction of the third connection line 130. The second peelable layer 172 is arranged between the fifth extension section and the substrate 140. In this way, if at least one of the plurality of second signal lines 152 corresponding to the sixth test electrode 166 cannot be normally turned on, and the signal acquired by the testing device is an abnormal signal, the fifth extension section can be removed by simply tearing off the second peelable layer 172, so that the sixth test electrode 166 and the corresponding plurality of third test electrodes 163 are disconnected, thereby facilitating the determination of the plurality of second signal lines 152 to determine the second signal line 152 that cannot be normally turned on. In addition, the fifth extension section has a smaller width, and the fifth extension section is more likely to be disconnected from the fourth extension section and the sixth extension section during the process of tearing off the second peelable layer 172, so that the fourth extension section and the sixth extension section are less likely to be peeled off from the substrate 140 and less likely to be damaged.

[0085] In some other embodiments, the plurality of third test electrodes 163 corresponding to the sixth test electrode 166 can be disconnected by cutting off the portion of the cutting area 100b where the sixth test electrode 166 is located, thereby facilitating the determination of the plurality of second signal lines 152 to determine the second signal line 152 that cannot be normally turned on.

[0086] In some embodiments, the fourth extension section comprises a third sub-section close to the fifth extension section, and the size of the third sub-section in a direction perpendicular to the extension direction of the third connection line 130 gradually decreases from the fourth extension section to the fifth extension section. In this way, the fourth extension section and the fifth extension section are less likely to be damaged due to stress concentration caused by sudden change in width between the fourth extension section and the fifth extension section, and the third connection line 130 is less likely to fail before the second peelable layer 172 is torn off.

[0087] In some embodiments, the sixth extension section comprises a fourth sub-section close to the fifth extension section, and the size of the fourth sub-section in a direction perpendicular to the extension direction of the third connection line 130 gradually decreases from the sixth extension section to the fifth extension section. In this way, the fifth extension section and the sixth extension section are less likely to be damaged due to stress concentration caused by sudden change in width between the fifth extension section and the sixth extension section, and the third connection line 130 is less likely to fail before the second peelable layer 172 is torn off.

[0088] In some embodiments, at least one of the first extension section 121, the second extension section 122 and the third extension section 123 has a same size in a direction perpendicular to the extension direction of the second connection line 120.

[0089] In some embodiments, at least one of the fourth extension, the fifth extension, and the sixth extension is uniform along a dimension perpendicular to the direction of extension of the third connection line 130.

[0090] The display module provided by the embodiments of the present application is described below.

[0091] The display module provided by the embodiments of the present application is described below.

[0092] When the production stage of the display module is completed, the cutting area 100b can be cut to remove the cutting area 100b, and the circuit of the display module after cutting restores the original electrical connection. Among them, Figure 7 A top view of the substrate assembly after removing the cutting area 100b is shown.

[0093] In some embodiments, a plurality of cut display modules can be spliced and displayed, and an insulating material is coated on the edge of the cut display module to prevent short circuit of the circuits of the edges of two adjacent display modules.

[0094] In some embodiments, the display module can include a plurality of light emitting diodes 180, the light emitting diodes 180 are arranged on one side of the substrate assembly 100, and the light emitting diodes 180 are electrically connected to the substrate assembly 100. For example, the plurality of light emitting diodes 180 are arranged at intervals, and there is a spacing between two adjacent light emitting diodes 180.

[0095] For example, the light emitting diode 180 can be an LED chip.

[0096] In some embodiments, the display module includes a plurality of pixel units, and each pixel unit includes at least one light emitting diode 180. The embodiments of the present application are described by taking an example of a pixel unit including a plurality of light emitting diodes 180.

[0097] In some embodiments, the pixel unit includes at least two of a red light LED chip, a green light LED chip, and a blue light LED chip.

[0098] In some embodiments, the pixel unit includes at least one red light LED chip, at least one green light LED chip, and at least one blue light LED chip.

[0099] Specifically, the pixel unit can include a red light LED chip, a green light LED chip, and a blue light LED chip, and the red light LED chip, the blue light LED chip, and the green light LED chip are arranged in a linear type or a triangular type. The linear type can be a horizontal linear type or a vertical linear type. The triangular type can be an equilateral triangle, an isosceles triangle, a right triangle, or other irregular triangles.

[0100] Specifically, the pixel unit can include four LED chips, the four LED chips are arranged in a quadrilateral shape, the quadrilateral shape can be a square shape, a rectangular shape, a rhombus shape or other irregular quadrilateral shape; for example, each pixel unit includes two red light LED chips, one green light LED chip and one blue light LED chip, the two red light LED chips are respectively located at opposite corners of the quadrilateral, and the green light LED chip and the blue light LED chip are respectively located at the other opposite corners of the quadrilateral; or, each pixel unit includes two green light LED chips, one red light LED chip and one blue light LED chip, the two green light LED chips are respectively located at opposite corners of the quadrilateral, and the red light LED chip and the blue light LED chip are respectively located at the other opposite corners of the quadrilateral; or, each pixel unit includes two blue light LED chips, one red light LED chip and one green light LED chip, the two blue light LED chips are respectively located at opposite corners of the quadrilateral, and the red light LED chip and the green light LED chip are respectively located at the other opposite corners of the quadrilateral.

[0101] In some embodiments, the display module can further include a driving circuit (for example, a driving chip), the driving circuit is arranged on the other side of the substrate assembly 100, and the driving circuit is electrically connected with the substrate assembly 100. In this way, the driving circuit and the light-emitting diode 180 can be electrically connected through the substrate assembly 100.

[0102] The display device provided by the embodiments of the present application is described below.

[0103] The display device provided by the embodiments of the present application includes the display module in the above embodiments. The display device can include a mobile phone, a television, a notebook computer, a desktop display, a tablet computer, a digital camera, a smart bracelet, smart glasses, a vehicle-mounted display, an industrial control device, a medical display screen, a touch interaction terminal, or other devices with display functions, and the like, and the embodiments of the present application are not limited thereto.

[0104] The technical features of the above-described embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described, however, as long as the combinations of the technical features do not exist contradictions, they should be considered as the scope of the present application.

[0105] The above-described embodiments only express several implementation manners of the present application, the description is relatively specific and detailed, but it should not be understood as a limitation on the patent scope of the application. It should be pointed out that, for ordinary skilled persons in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A substrate assembly, characterized by, The substrate assembly comprises a display area and a cutting area, the cutting area is arranged at the periphery of the display area, and the substrate assembly comprises: a substrate; a plurality of first signal lines are arranged on the substrate in the display area; the two ends of the first signal lines along the extension direction are respectively a first end and a second end; a plurality of first test electrodes are arranged on the substrate in the cutting area, and are arranged correspondingly with the plurality of first signal lines; the first test electrode is electrically connected with the first end of the corresponding first signal line; a second test electrode is arranged on the substrate in the cutting area, and is electrically connected with the second end of the plurality of first signal lines.

2. The substrate assembly of claim 1, wherein, The substrate assembly comprises a plurality of second signal lines, a plurality of third test electrodes and a fourth test electrode arranged on the substrate; the plurality of second signal lines are arranged in the display area and are electrically isolated from the first signal lines; the two ends of the second signal lines along the extension direction are respectively a third end and a fourth end; the plurality of third test electrodes are arranged in the cutting area and are electrically isolated from the first test electrodes; The plurality of second signal lines are arranged correspondingly with the plurality of third test electrodes; the third end of the second signal line is electrically connected with the corresponding third test electrode; the fourth end of the plurality of second signal lines is electrically connected with the fourth test electrode.

3. The substrate assembly of claim 2, wherein, The plurality of first signal lines are arranged in the first direction and extend in the second direction; any two of the first direction, the second direction and the thickness direction of the substrate intersect; The first test electrodes corresponding to the adjacent two first signal lines are arranged oppositely along the first direction, or the first test electrodes corresponding to the adjacent two first signal lines are arranged staggeredly along the first direction.

4. The substrate assembly of claim 2, wherein, The plurality of second signal lines are arranged in the second direction and extend in the first direction; any two of the first direction, the second direction and the thickness direction of the substrate intersect; The third test electrodes corresponding to the adjacent two second signal lines are arranged oppositely along the second direction, or the third test electrodes corresponding to the adjacent two second signal lines are arranged staggeredly along the second direction.

5. The substrate assembly of any of claims 2-4, wherein, The substrate comprises a first surface and a second surface opposite in the thickness direction of the substrate; One of the first signal lines and the second signal lines is arranged on the first surface, and the other is arranged on the second surface; At least one of the first test electrode, the second test electrode, the third test electrode and the fourth test electrode is arranged on the first surface; or at least one of the first test electrode, the second test electrode, the third test electrode and the fourth test electrode is arranged on the second surface.

6. The substrate assembly of any of claims 2-4, wherein, The second test electrode and the fourth test electrode are arranged on the same side in the thickness direction of the substrate; The second test electrode and the fourth test electrode are arranged oppositely; or The second test electrode and the fourth test electrode are connected.

7. The substrate assembly of any of claims 2-4, wherein, The second test electrode and the fourth test electrode are arranged on the two sides in the thickness direction of the substrate respectively; The second test electrode and the fourth test electrode are arranged oppositely in the projection on the plane of the substrate; or The substrate assembly comprises a first connecting line arranged in the cutting area, the second test electrode and the second ends of the plurality of first signal lines are electrically connected through the first connecting line, the second test electrode and the fourth test electrode are overlapped in the projection on the plane of the substrate, the first connecting line has a dimension perpendicular to the extending direction of the first connecting line, which is smaller than the dimension of the second test electrode perpendicular to the extending direction of the second test electrode.

8. The substrate assembly of any of claims 1-4, wherein, The substrate assembly comprises a plurality of fifth test electrodes arranged in the cutting area, one fifth test electrode is arranged corresponding to a plurality of first test electrodes, and the fifth test electrode is electrically connected to the corresponding plurality of first test electrodes.

9. The substrate assembly of claim 8, wherein, The substrate assembly comprises a plurality of second connecting lines arranged in the cutting area, each first test electrode is electrically connected to the corresponding fifth test electrode through different second connecting lines. The second connecting line comprises a first extending segment, a second extending segment and a third extending segment connected in sequence, the dimension of the second extending segment is smaller than the dimensions of the first extending segment and the third extending segment in the direction perpendicular to the extending direction of the second connecting line, and a first peelable layer is arranged between the second extending segment and the substrate.

10. A display module, characterized by The substrate assembly comprises any one of claims 1-9.

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