Test tool for integrated circuit chip

Abstract

The utility model relates to the technical field of test tools, and discloses a test tool for an integrated circuit chip, which comprises a base, and a moving assembly is arranged on the base. According to the test tool of the integrated circuit chip, in order to better test chip bodies with more sizes, by arranging the moving assembly, when the asynchronous motor drives the bidirectional threaded rod to rotate, the two groups of mold plates can synchronously move oppositely or oppositely, and the distance between the two groups of mold plates is flexibly adjusted according to the size of the chip, so that the test efficiency is improved. Therefore, the tool can bear a plurality of to-be-tested integrated circuit chips at the same time, the telescopic pins have the telescopic characteristic and can adapt to different concave-convex surfaces of the integrated circuit chips, multi-point contact with the chips is ensured, and the test efficiency is improved. The multi-point contact mode improves the stability of chip placement, and further realizes the test of a plurality of chips at the same time.

Description

Technical Field

[0001] This utility model relates to the field of testing fixture technology, specifically a testing fixture for integrated circuit chips. Background Technology

[0002] According to a published report on a testing tooling technology field, with the continuous advancement of technology, the scale and complexity of integrated chips are increasing, and their performance and reliability are crucial to the overall quality and functionality of electronic devices. To ensure that integrated chips can meet the needs of various application scenarios, efficient and accurate testing has become an indispensable step.

[0003] Traditional test fixtures often suffer from low testing efficiency when dealing with complex integrated chips, affecting testing efficiency. For different types and specifications of chips, test fixtures need to be changed frequently, increasing testing costs and time.

[0004] However, during actual use, the chip may be subjected to vibration or external interference. If the fixture's fixing structure is not firm enough, the chip may shift, causing the connection between the pins and probes to be interrupted or poorly contacted, thus affecting the smooth progress of the test. Utility Model Content

[0005] The purpose of this invention is to provide a testing fixture for integrated circuit chips to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A testing fixture for integrated circuit chips includes a base, on which a movable component is disposed, the movable component comprising:

[0008] A vertical slide rail is fixedly installed on the base. The bottom of the U-shaped frame is fixedly connected to the sliding part of the vertical slide rail. A horizontal slide rail is fixedly installed on the lower surface of the top of the U-shaped frame. The fixed end of the hydraulic cylinder is fixedly installed on the sliding part of the horizontal slide rail. A detection plate is fixedly installed on the piston end of the hydraulic cylinder. A detector is fixedly installed on the detection plate.

[0009] A rectangular groove is provided on the base. An asynchronous motor is fixedly installed on the outer wall of the base. A bidirectional threaded rod is fixedly installed on the output end of the asynchronous motor. The bidirectional threaded rod is rotatably installed inside the base. A threaded block is spirally installed on the bidirectional threaded rod. The threaded block slides and fits inside the rectangular groove. A mold plate is fixedly installed on the top of the threaded block.

[0010] A square groove is provided on the mold plate, and a telescopic pin is fixedly installed on the square groove.

[0011] Preferably, the vertical slide rails are provided in two sets, and both sets of vertical slide rails are mirror images of the vertical centerline of the base, and are mirror images of each other at both ends of the base.

[0012] Preferably, there are two sets of threaded blocks and mold plates, and both sets of threaded blocks and mold plates are mirror images of the vertical centerline of the bidirectional threaded rod at both ends of the bidirectional threaded rod.

[0013] Preferably, the square grooves on the single mold plate are configured as multiple sets, and the multiple sets of square grooves are arranged in a linear array with equal spacing. The telescopic pins inside the single set of square grooves are configured as multiple sets, and the multiple sets of telescopic pins are arranged in a linear array with equal spacing.

[0014] Preferably, the vertical movement trajectory of the probe plate does not intersect with the horizontal movement trajectory of the mold plate.

[0015] Preferably, the mold plate is provided with a connecting structure, the connecting structure including a hook, a hook is fixedly installed on the top of one end of the mold plate near the center of the base, and a fixing screw is threaded on the hook, a clamping plate is fixedly installed on the top of the other end of the mold plate near the center of the base, a handle is hinged on the clamping plate, and a pull ring is rotatably installed on the handle.

[0016] Preferably, the hook, fixing screw, clamp, handle, and pull ring are all in the same vertical plane.

[0017] Compared with the prior art, this utility model provides a testing fixture for integrated circuit chips, which has the following beneficial effects:

[0018] 1. This integrated circuit chip testing fixture, in order to better test chips of various sizes, incorporates a moving component. When the asynchronous motor drives the bidirectional threaded rod to rotate, two sets of mold plates can move synchronously relative to or in opposite directions. The spacing between the two sets of mold plates can be flexibly adjusted according to the chip size, thus accommodating chips of different sizes. The design of multiple square slots and telescopic pins allows the fixture to simultaneously carry multiple integrated circuit chips to be tested. Furthermore, the telescopic pins are retractable and can adapt to different uneven surfaces of the integrated circuit chips, ensuring multi-point contact with the chips. This multi-point contact method improves the stability of chip placement, thereby enabling the simultaneous testing of multiple chips.

[0019] 2. The testing fixture for this integrated circuit chip is designed to accommodate larger integrated circuit chips. It features a connection structure. After the two sets of mold plates are fitted together, the operator rotates the handle to hook the pull ring onto the hook, then rotates the handle in the opposite direction to connect the two sets of mold plates. Subsequently, the fixing screws on the hook are tightened using a tool. As the screws tighten, the pull ring is less likely to fall off, thus achieving a tight connection between the two sets of mold plates. This connection method is not only simple and convenient to operate, but also adaptable to larger integrated circuit chips. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 This is a schematic diagram of the overall structure of the present invention from another perspective;

[0022] Figure 3 This utility model Figure 2 Enlarged structural diagram of region A in the middle;

[0023] Figure 4 This is a cross-sectional view of the base of this utility model.

[0024] In the diagram: 1. Base; 2. Moving component; 21. Vertical slide rail; 22. U-shaped frame; 23. Horizontal slide rail; 24. Hydraulic cylinder; 25. Detector plate; 26. Detector; 27. Rectangular groove; 28. Asynchronous motor; 29. ​​Bidirectional threaded rod; 210. Threaded block; 211. Mold plate; 212. Square groove; 213. Telescopic pin; 3. Connecting structure; 31. Hook; 32. Clamping plate; 33. Handle; 34. Pull ring; 35. Fixing screw. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] Please see Figure 1 - Figure 4 This utility model provides a technical solution:

[0027] A testing fixture for integrated circuit chips includes a base 1, on which a moving component 2 is mounted. The moving component 2 includes a vertical slide rail 21, which is fixedly mounted on the base 1. The bottom of a U-shaped frame 22 is fixedly connected to the sliding part of the vertical slide rail 21. A horizontal slide rail 23 is fixedly mounted on the lower surface of the top of the U-shaped frame 22. The fixed end of a hydraulic cylinder 24 is fixedly mounted on the sliding part of the horizontal slide rail 23. A detection plate 25 is fixedly mounted on the piston end of the hydraulic cylinder 24. A detector 26 is fixedly mounted on the detection plate 25. A rectangular groove 27 is formed on the base 1. An asynchronous motor 28 is fixedly mounted on the outer wall of the base 1. A bidirectional threaded rod 29 is fixedly mounted on the output end of the asynchronous motor 28. The bidirectional threaded rod 29 is rotatably mounted inside the base 1. A threaded block 210 is helically mounted on the bidirectional threaded rod 29. 210 slides and fits inside the rectangular groove 27. A mold plate 211 is fixedly installed on the top of the threaded block 210. A square groove 212 is opened on the mold plate 211. A telescopic pin 213 is fixedly installed on the square groove 212. Two sets of vertical slide rails 21 are provided. Both sets of vertical slide rails 21 are mirrored at both ends of the base 1 with the vertical center line of the base 1 as the mirror axis. Two sets of threaded blocks 210 and mold plates 211 are provided. Both sets of threaded blocks 210 and mold plates 211 are mirrored at both ends of the bidirectional threaded rod 29 with the vertical center line of the bidirectional threaded rod 29 as the mirror axis. The square grooves 212 on a single set of mold plates 211 are set in multiple sets. The multiple sets of square grooves 212 are linearly arrayed with equal spacing. The telescopic pins 213 inside a single set of square grooves 212 are set in multiple sets. The multiple sets of telescopic pins 213 are linearly arrayed with equal spacing.

[0028] In this embodiment, when the asynchronous motor 28 operates, its output torque is transmitted to the bidirectional threaded rod 29, causing the bidirectional threaded rod 29 to rotate around its own axis. A threaded block 210 is helically mounted on the bidirectional threaded rod 29. Since a rectangular slot 27 is provided on the base 1, a portion of the threaded block 210 is embedded in the rectangular slot 27 and can only slide within the rectangular slot 27 along the axial direction of the bidirectional threaded rod 29, thus restricting the movement trajectory of the threaded block 210. When the bidirectional threaded rod 29 rotates, according to the transmission principle of the thread, the two sets of threaded blocks 210 will move synchronously along the axial direction of the bidirectional threaded rod 29, moving away from or towards the center of the bidirectional threaded rod 29, respectively. Because a mold plate 211 is fixedly mounted on the top of the threaded block 210, the two sets of mold plates 210... The 11 will also move synchronously relative to or opposite to each other, thereby flexibly adjusting the spacing between the two sets of mold plates 211 according to the chip size, thus accommodating chips of different sizes. When placing the integrated circuit chip to be tested, multiple chips are placed in the square slots 212 of the mold plate 211 respectively. Due to the retractable characteristic of the telescopic pins 213, when the chip is placed in the square slots 212, the different concave and convex surfaces of the chip will squeeze or release the telescopic pins 213. The telescopic pins 213 will adaptively adjust the length of extension or retraction according to the actual situation of the chip surface, thereby achieving multi-point contact with the chip. This multi-point contact method can provide multiple support points and contact points for the chip, effectively improving the stability of the chip placed on the mold plate 211 (each telescopic pin 213 is in contact with...). The internal circuitry of the tooling is interconnected. When the telescopic pin 213 contacts the chip surface, it establishes an electrical connection between the tooling circuitry and the chip. Multiple telescopic pins 213 contacting different parts of the chip form multiple electrical connection paths. The tester 26 can input test signals to the chip through these paths and receive response signals from the chip. For example, the tester 26 emits an electrical signal of a specific frequency, which is transmitted to the chip's internal circuitry through the telescopic pins 213 that are in contact with the chip. After processing the signal, the chip feeds back the processed signal to the tester 26 through other contacting telescopic pins 213. Based on the received feedback signals, the tester 26 analyzes whether the chip's electrical performance and logic functions are normal, thus completing the chip testing process. This completes the preparation work for multi-chip support, laying the foundation for subsequent testing operations. The vertical slide rail 21 is activated. The vertical slide rail 21 is electrically connected to and controlled by the controller. When the vertical slide rail 21 is activated, its internal drive device (such as a motor, lead screw, etc., with a specific structure based on existing conventional equipment) operates, driving the sliding member to move horizontally along the track of the vertical slide rail 21. The horizontal slide rail 23 is also activated. The horizontal slide rail 23 is similarly electrically connected to and controlled by the controller. When the horizontal slide rail 23 is activated, its internal drive device operates, driving the sliding member to move horizontally along the track of the horizontal slide rail 23. Because the fixed end of the hydraulic cylinder 24 is fixed to the sliding member of the horizontal slide rail 23, the hydraulic cylinder 24 will move horizontally along with the movement of the sliding member.The transverse position of the detector 26, mounted on the piston end of the hydraulic cylinder 24, is further precisely adjusted to ensure accurate alignment of the detector 26 with the test area of ​​the chip under test. When the hydraulic cylinder 24 is activated, its internal hydraulic system operates, pushing the piston end in a vertical linear motion. Since the probe plate 25 and the detector 26 are fixed to the piston end, the detector 26 moves up and down with the piston end, allowing it to contact the chip for testing. Through the coordinated operation of the vertical slide rail 21, the transverse slide rail 23, and the hydraulic cylinder 24, multiple chips placed on the mold plate 211 can be tested simultaneously.

[0029] In one embodiment of this utility model, a connecting structure 3 is provided on the mold plate 211. The connecting structure 3 includes a hook 31. A hook 31 is fixedly installed on the top of one end of the mold plate 211 near the center of the base 1. A fixing screw 35 is threaded on the hook 31. A clamping plate 32 is fixedly installed on the top of the other end of the mold plate 211 near the center of the base 1. A handle 33 is hinged on the clamping plate 32. A pull ring 34 is rotatably installed on the handle 33. At the same time, the hook 31, the fixing screw 35, the clamping plate 32, the handle 33 and the pull ring 34 are in the same vertical plane.

[0030] In this embodiment, when it is necessary to adapt to larger integrated circuit chips, the first step is to bring the two sets of mold plates 211 together. The operator rotates the handle 33, which rotates around its hinge point with the clamping plate 32. During the rotation, the pull ring 34 on the handle 33 gradually approaches the hook 31 until the pull ring 34 is hooked on the hook 31. Then, the operator rotates the handle 33 in the opposite direction. At this time, the handle 33 will apply a pulling force to the pull ring 34, so that the pull ring 34 generates a certain pre-tightening force on the hook 31. Next, the operator uses a tool (such as a wrench) to tighten the fixing screw 35 on the hook 31. As the fixing screw 35 is tightened, the pull ring 34 is tightly locked on the hook 31 and is not easy to fall off. In this way, the two sets of mold plates 211 are tightly connected, thereby expanding the size range of chips that the mold plate 211 can support to adapt to larger integrated circuit chips.

[0031] All electrical components appearing in this application are electrically connected to the controller and 220V AC mains power. The controller is a conventional known device that can control the vertical slide rail 21, horizontal slide rail 23, hydraulic cylinder 24, detector 26, asynchronous motor 28, telescopic needle 213, and other components. All standard parts used in this application can be purchased from the market. The specific connection methods of each part are all conventional methods such as riveting and welding, which are mature in the prior art. The machinery, parts, and equipment are all conventional models in the prior art. In addition, the circuit connection adopts conventional connection methods in the prior art, which will not be described in detail here.

[0032] The present invention has been described in detail above. However, modifications or improvements can be made to it, which will be obvious to those skilled in the art. Therefore, any modifications or improvements that do not depart from the spirit of the present invention are within the protection scope of the present invention.

Claims

1. A test tool for integrated circuit chips comprising a base (1) characterised in that: The base (1) is provided with a moving assembly (2), the moving assembly (2) comprises: Vertical slide rails (21), the base (1) is fixedly installed with vertical slide rails (21), the sliding part of the vertical slide rails (21) is fixedly connected with the bottom of a U-shaped frame (22), the top end of the U-shaped frame (22) is fixedly installed with a horizontal slide rail (23), the sliding part of the horizontal slide rail (23) is fixedly installed with the fixed end of a hydraulic cylinder (24), the piston end of the hydraulic cylinder (24) is fixedly installed with a detection plate (25), and the detection plate (25) is fixedly installed with a detector (26); A rectangular groove (27) is formed in the base (1), an asynchronous motor (28) is fixedly installed on the outer wall of the base (1), the output end of the asynchronous motor (28) is fixedly installed with a bidirectional threaded rod (29), the bidirectional threaded rod (29) is rotatably installed in the base (1), the threaded rod (29) is spirally installed with a threaded block (210), the threaded block (210) is slidably fitted in the rectangular groove (27), and the threaded block (210) is fixedly installed with a mold plate (211) on the top; A square groove (212) is formed in the mold plate (211), and a telescopic needle (213) is fixedly installed in the square groove (212).

2. The test handler for integrated circuit chips of claim 1, wherein: The vertical slide rails (21) are provided in two groups, and the two groups of vertical slide rails (21) are mirror images of each other with the vertical center line of the base (1) as the mirror axis and are arranged at both ends of the base (1).

3. The test handler for integrated circuit chips of claim 1 wherein: The threaded block (210) and the mold plate (211) are provided in two groups, and the two groups of threaded blocks (210) and mold plates (211) are mirror images of each other with the vertical center line of the bidirectional threaded rod (29) as the mirror axis and are arranged at both ends of the bidirectional threaded rod (29).

4. The test handler for integrated circuit chips of claim 3, wherein: The square grooves (212) on a single group of mold plates (211) are provided in multiple groups, and the multiple groups of square grooves (212) are linearly arrayed at equal intervals, and the telescopic needles (213) in a single group of square grooves (212) are provided in multiple groups, and the multiple groups of telescopic needles (213) are linearly arrayed at equal intervals.

5. The test handler for integrated circuit chips of claim 1 wherein: The vertical motion track of the detection plate (25) does not intersect with the horizontal motion track of the mold plate (211).

6. The test tool for integrated circuit chips of claim 1 wherein: The mold plate (211) is provided with a connecting structure (3), the connecting structure (3) comprises a drag hook (31), one end of a group of mold plates (211) near the center of the base (1) is fixedly installed with a drag hook (31) on the top, the drag hook (31) is threadedly installed with a fixing screw (35), one end of another group of mold plates (211) near the center of the base (1) is fixedly installed with a clamping plate (32) on the top, the clamping plate (32) is hingedly installed with a buckle (33), and the buckle (33) is rotatably installed with a pull ring (34).

7. The test handler for integrated circuit chips of claim 6, wherein: The drag hook (31), the fixing screw (35), the clamping plate (32), the buckle (33) and the pull ring (34) are in the same vertical plane.

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