Circuit board testing device

Abstract

The utility model relates to the technical field of circuit board testing, and discloses a circuit board testing device which comprises a clamping piece, the clamping piece comprises a first plate body, a second plate body, a connecting piece and an elastic piece, the first plate body, the second plate body and the elastic piece penetrate through the connecting piece, and the first plate body and the second plate body are oppositely arranged; the elastic piece abuts against the inner wall of the first plate body and the inner wall of the second plate body. The plurality of conductive pieces are respectively arranged at one end of the first plate body and one end of the second plate body, and the plurality of conductive pieces are respectively close to the connecting piece; wherein the first plate body and the second plate body are internally provided with a plurality of conductive circuits respectively, and each conductive part is electrically connected with the corresponding conductive circuit respectively. The reliability and the testing efficiency of circuit board testing are improved.

Description

Technical Field

[0001] This application relates to the field of circuit board testing technology, and specifically to a circuit board testing device. Background Technology

[0002] In the field of circuit board testing, embedded chips are connected to circuit boards via test circuit boards (adapter boards). Due to the limited space of embedded chips, test circuit boards have stamp hole pads (also known as half-hole pads) on their edges to achieve electrical connection between the module and the motherboard. These pads are usually arranged in an array and their conductivity and signal integrity need to be verified through electrical testing.

[0003] Currently, the testing methods for circuit boards rely on manually operated single-point probes, which are used to test each pad individually. For example, for a circuit board with 20 stamp hole pads, the operator needs to repeatedly position and press the probe 20 times, resulting in testing efficiency being inversely proportional to the number of pads. In addition, when manually pressing the probe, it is difficult for the operator to accurately control the consistency of the contact pressure. Too little pressure will cause the contact resistance between the probe and the pad to increase, leading to signal attenuation or misjudgment of poor connection. Too much pressure may cause scratches on the pad plating or even deformation of the via, affecting the reliability of subsequent soldering. Utility Model Content

[0004] In view of this, this application provides a circuit board testing device to improve the reliability and efficiency of circuit board testing.

[0005] To achieve the above objectives, the technical solution adopted is as follows:

[0006] A circuit board testing device, comprising:

[0007] A clamping member, comprising a first plate, a second plate, a connecting member, and an elastic member, wherein the first plate, the second plate, and the elastic member respectively pass through the connecting member, the first plate and the second plate are disposed opposite to each other, and the elastic member abuts against the inner walls of the first plate and the second plate respectively.

[0008] Multiple conductive elements are respectively disposed at one end of the first plate and the second plate, and the multiple conductive elements are respectively close to the connector;

[0009] The first plate and the second plate are respectively provided with a plurality of conductive lines, and each of the conductive elements is electrically connected to the corresponding conductive line.

[0010] This application further specifies that the conductive element includes conductive needles, which are linearly arranged at one end of the first plate and the second plate, respectively.

[0011] This application further specifies that the end of the conductive pin away from the connector is configured in a J-shape.

[0012] This application further specifies that: the conductive component also includes a first fixing seat, the first fixing seat is respectively connected to one end of the first plate and the second plate, and the end of the conductive needle near the connector is correspondingly connected to the first fixing seat.

[0013] This application is further configured such that: the connecting member includes a rotating shaft, support blocks are respectively provided on the inner walls of the first plate and the second plate, the support blocks pass through the rotating shaft, and the elastic member is sleeved on the rotating shaft.

[0014] This application is further configured to include a plurality of assemblies, each of which is disposed between adjacent clamping members and is respectively disposed on the first plate and the second plate.

[0015] This application further specifies that: the assembly includes a magnetic absorbing piece, and the sides of the first plate and the second plate are provided with fixing grooves, and the magnetic absorbing piece is connected to the fixing grooves.

[0016] This application further specifies that the assembly includes a snap-fit ​​groove and a snap-fit ​​block, wherein the snap-fit ​​groove and the snap-fit ​​block are respectively disposed on the side of an adjacent first plate or on the side of an adjacent second plate.

[0017] This application is further configured such that: the other end of the first plate and the second plate are respectively provided with a second fixing seat, and the conductive line is led out from the end of the second fixing seat away from the connector.

[0018] This application further specifies that the elastic element includes a V-shaped spring sheet or a V-shaped torsion spring.

[0019] In summary, compared with the prior art, this application discloses a circuit board testing device, including a clamping member and multiple conductive members. The clamping member has a first plate, a second plate, and an elastic member passing through a connecting member. The first and second plates are arranged opposite to each other, and the elastic members abut against the inner walls of the first and second plates respectively. Multiple conductive members are respectively disposed at one end of the first and second plates, and multiple conductive lines are provided within the first and second plates. Each conductive member is electrically connected to a corresponding conductive line. Through the above arrangement, the elastic member unifies the testing pressure of the testing device, and the clamping member adjusts the testing opening and closing degree of the conductive members, thereby enabling consistent batch testing of circuit boards and improving the reliability and efficiency of circuit board testing. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the structure of the first type of circuit board testing device of this application;

[0022] Figure 2 This is a schematic diagram of the structure of the second type of circuit board testing device in this application;

[0023] Figure 3 This is a schematic diagram of the third type of circuit board testing device in this application;

[0024] Figure 4 This is a partial structural cross-sectional view of the circuit board testing device of this application;

[0025] Figure 5 This is a schematic diagram of the combined structure of the circuit board testing device of this application. Detailed Implementation

[0026] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0027] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, components, features, and elements with the same names in different embodiments of this application may have the same meaning or different meanings, the specific meaning of which must be determined by its interpretation in that specific embodiment or further in conjunction with the context of that specific embodiment.

[0028] It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to limit this application.

[0029] In the following description, the use of suffixes such as "module," "part," or "unit" to denote elements is solely for the purpose of illustrative purposes and has no specific meaning in itself. Therefore, "module," "part," or "unit" may be used interchangeably.

[0030] In the description of this application, it should be noted that the terms "upper," "lower," "left," "right," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0031] The technical solutions shown in this application will be described in detail below through specific embodiments. It should be noted that the order of description of the following embodiments is not intended to limit the priority of the embodiments.

[0032] Please refer to Figures 1 to 4 The circuit board testing device of this application includes a clamping member 1 and a plurality of conductive members 2 disposed on the clamping member 1.

[0033] In specific implementation, the clamping member 1 includes a first plate 11, a second plate 12, a connecting member 13, and an elastic member 14. The first plate 11, the second plate 12, and the elastic member 14 respectively pass through the connecting member 13. The first plate 11 and the second plate 12 are arranged opposite to each other, and the elastic member 14 abuts against the inner walls of the first plate 11 and the second plate 12 respectively. Multiple conductive members 2 are respectively disposed at one end of the first plate 11 and the second plate 12, and the multiple conductive members 2 are respectively close to the connecting member 13 and the first plate 11. The second plate 12 is provided with multiple conductive lines 3, and each conductive element 2 is electrically connected to the corresponding conductive line 3. That is, the elastic element 14 provides elastic pressure to the clamping element 1 through the connecting element 13, and the conductive element 2 contacts and tests the circuit board. The elastic element 14 can be used to uniformly test the pressure, the first plate 11 and the second plate 12 of the clamping element 1 can be used to adjust the test opening and closing degree of the conductive element 2, and the conductive line 3 can be used to input / output test signals to the conductive element 2, thereby enabling consistent batch testing of circuit boards.

[0034] The device includes at least one clamping member 1, meaning that the circuit board testing device can perform circuit board testing through the clamping member 1 or through a combination of multiple clamping members 1.

[0035] During the operation of the circuit board testing device, the elastic element 14 provides necessary elastic pressure to the first plate 11 and the second plate 12 on the connector 13. The first plate 11 and the second plate 12 are arranged opposite each other to facilitate the opening and closing of the first plate 11 and the second plate 12 relative to the connector 13, thereby forming a stable clamping structure to ensure consistent testing pressure. Furthermore, by pressing the first plate 11 and the second plate 12, the opening and closing of the conductive element 2 connected to the end of the first plate 11 and the second plate 12 near the connector 13 can be adjusted, thereby adjusting the spacing between the conductive elements 2 on the first plate 11 and the second plate 12. The spacing between the pads on the circuit board is greater than that between the pads on the circuit board, thereby matching the pads with different arrangements on the circuit board (such as stamp hole pads), adapting to circuit boards of different specifications and layouts, facilitating the connection between the conductive component 2 and the pads, and after the conductive component 2 is placed on the circuit board, the first plate body 11 and the second plate body 12 can be released. Then, under the elastic force recovery of the elastic component 14, the conductive component 2 can be stably connected to the pad. That is, the circuit board testing device uses the elastic component 14 to unify the test pressure and uses the clamping component 1 to adjust the test opening and closing degree of the conductive component 2, thereby consistently testing circuit boards in batches, improving the reliability and efficiency of circuit board testing.

[0036] The conductive element 2 can be disposed opposite to one end of the first plate 11 and the second plate 12 to be suitable for regularly arranged pads on the circuit board.

[0037] In the specific implementation process, the conductive component 2 includes conductive pins 21, which are linearly arranged at one end of the first plate 11 and the second plate 12, so as to adapt to the pads of the circuit board through the conductive pins 21 to ensure the test accuracy.

[0038] Optionally, the conductive pins 21 are plugged into and plugged into the first board 11 and the second board 12, thereby allowing for flexible adjustment of the specific number and spacing of the conductive pins 21 on the first board 11 and the second board 12. Especially when dealing with circuit boards with different numbers of pads or different pad arrangements, the configuration of the conductive pins 21 can be easily adjusted, improving the versatility and adaptability of the equipment.

[0039] Preferably, the end of the conductive pin 21 furthest from the connector 13 is configured in a J-shape to facilitate quick and easy connection of the tip of the conductive pin 21 to the pads on the circuit board. Due to the J-shaped bending design, the tip of the conductive pin 21 can better adapt to pads in different positions, especially in areas with compact layouts or difficult-to-reach pads. This avoids inaccurate contact caused by straight structures. Furthermore, the J-shaped design can effectively reduce misoperation or excessive pressure when the conductive pin 21 contacts the pads, thereby reducing the risk of pad damage, especially when performing multiple tests on the circuit board pads. The J-shaped structure also ensures the contact angle and contact pressure between the conductive pin 21 and the pads, meeting the requirements for stability and signal transmission accuracy during the testing process.

[0040] In one embodiment, the end of the conductive pin 21 away from the connector 13 may also be arranged in an L-shape.

[0041] It should be noted that, driven by the elastic element 14, the conductive pin 21 has a set contact pressure with the solder pads of the circuit board, and the set contact pressure includes 0.5N-2N.

[0042] Preferably, the contact pressure is set to 1N, thereby unifying the test pressure through the elastic element 14, and thus ensuring consistent batch testing of circuit boards, improving the reliability and efficiency of circuit board testing.

[0043] Optionally, the conductive pin 21 adopts a gold-plated structure design with a diameter of 0.6 mm.

[0044] In the specific implementation process, the conductive component 2 also includes a first fixing seat 22, which is connected to one end of the first plate 11 and the second plate 12 respectively, and the end of the conductive needle 21 near the connector 13 is correspondingly connected to the first fixing seat 22, thereby improving the reliability and firmness of the connection between the conductive needle 21 and the first plate 11 and the second plate 12.

[0045] Optionally, the first fixing seat 22 is integrally connected to the first plate 11 or the second plate 12 or is fixed by thread.

[0046] Optionally, the first fixing seat 22 is plugged into the first plate 11 and the second plate 12. With the conductive pin 21 connected to the first fixing seat 22 at one end near the connector 13, it can be regarded as the conductive pin 21 being plugged into the first plate 11 and the second plate 12. This allows for flexible adjustment of the specific number of conductive pins 21 on the first plate 11 and the second plate 12, so that the electrical contact of the conductive pin 21 with the entire row of solder pads (e.g., 4-8) on the circuit board can be completed simultaneously in a single operation.

[0047] It should be noted that the conductive line 3 can pass through the first plate 11 and the second plate 12 and be electrically connected to the conductive pin 21. Specifically, the first plate 11 and the second plate 12 can be provided with corresponding wiring grooves, and the conductive line 3 is adapted to the wiring grooves.

[0048] Optionally, one end of the conductive line 3 is welded to the end of the conductive needle 21 near the connector 13.

[0049] Among them, the conductive line 3 includes a shielded conductive line, which stably transmits high-frequency signals above 20MHz, thereby meeting the synchronous testing requirements of power supply, ground and differential signals of high-density modules of circuit boards (such as 5G communication boards), and improving the testing efficiency by 5-10 times compared with traditional single-point probes.

[0050] In one embodiment, the other ends of the first plate 11 and the second plate 12 are respectively provided with second fixing seats 18. The conductive line 3 is led out from the end of the second fixing seat 18 away from the connector 13. That is, the circuit board testing device connects to the external test signal through the conductive line 3 led out from the second fixing seat 18, so that the conductive component 2 can input / output test signals to the pads of the circuit board. At the same time, the second fixing seat 18 ensures the reliability and firmness of the connection between the conductive line 3 and the first plate 11 and the second plate 12.

[0051] In the specific implementation process, the connector 13 includes a rotating shaft 15, and support blocks 16 are respectively provided on the inner walls of the first plate 11 and the second plate 12. The support blocks 16 pass through the rotating shaft 15 to provide a movable fulcrum for the first plate 11 and the second plate 12. An elastic element 14 is sleeved on the rotating shaft 15 so that it abuts against the inner walls of the first plate 11 and the second plate 12. Thus, through the cooperation of the rotating shaft 15, the support blocks 16 and the elastic element 14, the first plate 11 and the second plate 12 can open and close relative to each other after the elastic element 14 is pressed by external force. This allows the opening and closing of the conductive element 2 connected to the first plate 11 and the second plate 12 to match the pads with different arrangement positions on the circuit board, facilitating the connection between the conductive element 2 and the pads. After the conductive element 2 is placed on the circuit board, the first plate 11 and the second plate 12 can be released. Then, under the elastic force recovery of the elastic element 14, the conductive element 2 can be stably connected to the pads.

[0052] It should be noted that the ends of the support blocks 16 on the first plate 11 overlap with the ends of the support blocks 16 on the second plate 12 so as to pass through the rotating shaft 15 synchronously. The support blocks 16 can be integrally formed with the first plate 11 and the second plate 12 respectively.

[0053] In one embodiment, connector 13 may also include a hinge.

[0054] In one embodiment, the elastic element 14 may include a V-shaped spring sheet or a V-shaped torsion spring, so that the elastic element 14 abuts against the inner walls of the first plate 11 and the second plate 12 respectively, and the test pressure ensures the consistency of the solder pads of the batch conductive elements 2 on the circuit board.

[0055] In one embodiment, the first plate 11 and the second plate 12 are provided with a pressing area 19 on the side opposite to the connector 13. The pressing area 19 is provided with anti-slip texture so that external force can stably press and release the first plate 11 and the second plate 12.

[0056] In the specific implementation process, we will continue to combine Figures 1 to 5 The circuit board testing device also includes multiple assemblies 4, each assembly 4 being arranged between adjacent clamping members 1 and respectively located on the first board body 11 and the second board body 12, thereby facilitating the combination of multiple clamping members 1 for circuit board testing, ensuring batch testing of circuit boards, and improving testing efficiency.

[0057] Furthermore, the assembly 4 includes a magnetic absorbing piece 41. The sides of the first plate 11 and the second plate 12 are provided with fixing grooves 17. The magnetic absorbing piece 41 is connected to the fixing grooves 17 so that adjacent first plates 11 or adjacent second plates 12 can be magnetically connected together. That is, multiple clamping pieces 1 can be detachably connected through the magnetic absorbing piece 41, so that the electrical contact of the conductive piece 2 with the entire row of solder pads on the circuit board can be completed simultaneously in a single operation.

[0058] The circuit board testing of single clamping component 1 and multiple clamping components 1 can be detachably selected according to the actual arrangement of the pads on the circuit board. For example, when the number of conductive components 2 is fixed, at least two clamping components 1 can be combined to test the entire row of pads on the circuit board. When there are fewer pads, redundant clamping components 1 can be detached to avoid interference. Of course, the above test selection can also be achieved by adjusting the number of corresponding conductive components 2 on the first board body 11 and the second board body 12.

[0059] Optionally, the magnetic sheet 41 is bonded and fixed to the fixing groove 17, or embedded and fixed to the fixing groove 17.

[0060] In one embodiment, the assembly 4 includes a snap-fit ​​groove 42 and a snap-fit ​​block 43. The snap-fit ​​groove 42 and the snap-fit ​​block 43 are respectively disposed on the side of an adjacent first plate 11 or on the side of an adjacent second plate 12. Thus, the snap-fit ​​groove 42 and the snap-fit ​​block 43 engage with each other to achieve the combination of multiple clamping components 1. That is, when the multiple clamping components 1 are combined for circuit board testing, adjacent clamping components 1 can be detachably connected through the snap-fit ​​groove 42 and the snap-fit ​​block 43, so that the electrical contact of the conductive component 2 with the entire row of solder pads on the circuit board can be completed simultaneously in a single operation.

[0061] Optionally, on the side of the first plate 11 or the second plate 12, a magnetic absorbing piece 41 can be combined with the snap-fit ​​groove 42 and the snap-fit ​​block 43. The magnetic absorbing piece 41 is wrapped around the side of the snap-fit ​​groove 42 and the snap-fit ​​block 43, so that when adjacent clamping members 1 are engaged through the snap-fit ​​groove 42 and the snap-fit ​​block 43, the magnetic absorbing piece 41 can further magnetically attract the adjacent clamping members 1 to further ensure the connection stability of the clamping members 1.

[0062] In summary, the circuit board testing device of this application includes a clamping member 1 and multiple conductive members 2. The first plate 11, the second plate 12, and the elastic member 14 of the clamping member 1 pass through the connecting member 13. The first plate 11 and the second plate 12 are arranged opposite to each other, and the elastic member 14 abuts against the inner walls of the first plate 11 and the second plate 12. The multiple conductive members 2 are respectively disposed at one end of the first plate 11 and the second plate 12. The first plate 11 and the second plate 12 are respectively provided with multiple conductive lines 3, and each conductive member 2 is electrically connected to the corresponding conductive line 3. Thus, the elastic member 14 unifies the test pressure of the testing device, and the clamping member 1 adjusts the test opening and closing degree of the conductive members 2, thereby enabling consistent batch testing of circuit boards and improving the reliability and efficiency of circuit board testing.

[0063] The present application has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only for the purpose of helping to understand the core ideas of the present application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present application. Therefore, the content of this specification should not be construed as a limitation of the present application.

Claims

1. A circuit board testing apparatus, characterized by comprising: The utility model relates to a clamping piece, a plurality of conductive pieces and a plurality of combination pieces, and belongs to the technical field of electronic products. The clamping piece comprises a first plate body, a second plate body, a connecting piece and an elastic piece, the first plate body, the second plate body and the elastic piece pass through the connecting piece respectively, the first plate body and the second plate body are oppositely arranged, and the elastic piece abuts against the inner wall of the first plate body and the second plate body respectively. A plurality of conductive pieces are arranged at one end of the first plate body and the second plate body respectively, and the plurality of conductive pieces are close to the connecting piece respectively. The first plate body and the second plate body are respectively provided with a plurality of conductive lines, and each conductive piece is electrically connected with the corresponding conductive line.

2. The circuit board testing apparatus of claim 1, wherein The conductive piece comprises a conductive needle, and the conductive needle is linearly arranged at one end of the first plate body and the second plate body.

3. The circuit board testing apparatus of claim 2, wherein, The end of the conductive needle away from the connecting piece is provided in a J-shaped structure.

4. The circuit board testing apparatus of claim 2, wherein The conductive piece further comprises a first fixing seat, the first fixing seat is connected at one end of the first plate body and the second plate body respectively, and the end of the conductive needle close to the connecting piece is connected in the first fixing seat correspondingly.

5. The circuit board testing apparatus of claim 1, wherein, The connecting piece comprises a rotating shaft, the inner wall of the first plate body and the second plate body is respectively provided with a supporting block, the supporting block passes through the rotating shaft, and the elastic piece is sleeved on the rotating shaft.

6. The circuit board testing apparatus of claim 1, wherein, The utility model further comprises a plurality of combination pieces, each combination piece is arranged between adjacent clamping pieces, and is arranged on the first plate body and the second plate body respectively.

7. The circuit board testing apparatus of claim 6, wherein The combination piece comprises a magnetic attraction piece, the side edge of the first plate body and the second plate body is provided with a fixing groove, and the magnetic attraction piece is connected on the fixing groove.

8. The circuit board testing apparatus of claim 6, wherein, The combination piece comprises a clamping groove and a clamping block, the clamping groove and the clamping block are arranged on the side edge of the adjacent first plate body correspondingly or are arranged on the side edge of the adjacent second plate body correspondingly.

9. The circuit board testing apparatus of claim 1, wherein, The other end of the first plate body and the second plate body is respectively provided with a second fixing seat, and the conductive line is led out from the end of the second fixing seat away from the connecting piece.

10. The circuit board testing apparatus of claim 1, wherein, The elastic piece comprises a V-shaped spring piece or a V-shaped torsion spring.

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