MOSFET detection device
By designing a MOSFET testing device with clamping components and a stop structure, the problem of inaccurate testing caused by dust accumulation in the equipment was solved, maintenance costs were reduced, and testing efficiency was improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-03
- Publication Date
- 2026-04-10
AI Technical Summary
Existing MOSFET testing equipment is prone to dust accumulation after prolonged use, leading to inaccurate testing and high maintenance costs.
Design a MOSFET detection device that uses a clamping component to hold the MOSFET through a reset structure, and prevents the clamping component from resetting after long-term use through a stop structure, so as to facilitate cleaning of the detection port.
It effectively prevents dust and other foreign objects from entering the detection port, reducing equipment maintenance costs and improving detection efficiency.
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Figure CN224109592U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to MOSFET production technical field especially relates to a MOSFET detection device. BACKGROUND
[0002] MOSFET is the abbreviation of metal-oxide-semiconductor field-effect transistor, and it is a kind of field effect transistor that can be widely used in analog circuit and digital circuit.
[0003] MOSFET needs to be detected by the way of power connection in the production process, to ensure the good nature of product, such as prior art Chinese patent announcement number "CN221960179U" discloses a MOSFET detection device, including detection box body, the detection box body inside detachable connection test circuit board, the test circuit board top is equipped with a plurality of MOSFET junction box, the detection box body both sides symmetry open sliding groove, the sliding groove sliding connection reciprocating movement column, the reciprocating movement column bottom connection cleaning brush, to solve the present MOSFET detection equipment inside is equipped with each circuit board matched with the MOSFET to be detected, needs to detect only when MOSFET pin is inserted into corresponding connecting position and can carry out detection, however, the connecting position and circuit board of detection equipment are prone to dust accumulation and dust interference under the action of static electricity after long time use, leading to inaccurate MOSFET detection, at this time, the internal detection circuit board needs to be cleaned, and then the MOSFET detection efficiency is reduced.
[0004] In specific operation, the dust on the detection jack is cleaned by the mode that the motor drives the cleaning brush to move, but the motor needs to be disassembled and maintained in long time use, and the maintenance cost of equipment is increased. UTILITY MODEL CONTENTS
[0005] The utility model aims at solving the shortcoming that the maintenance cost of prior art equipment is higher, and provides a MOSFET detection device.
[0006] In order to achieve the above object, the utility model adopts the following technical scheme:
[0007] Design a kind of MOSFET detection device, including detection table, the top of the detection table is distributed with several detection seats, the top of the detection seat is equipped with clamping piece on both sides, a pair of clamping pieces are opened and closed by reset structure, for clamping MOS tube and closing protection to detection socket;
[0008] The bottom of the clamping piece is provided with a stop structure, and the pair of clamping pieces are unfolded through the stop structure, so that the detection socket is cleaned.
[0009] Further, the reset structure comprises a shaft and a torsion spring, the clamping piece is a T-shaped structure, and the clamping piece is rotationally connected in a clearance groove at the top of the detection seat through the shaft at the bottom and the torsion spring.
[0010] Further, the detection seat is provided with an opening communicating with the clearance groove at the middle of the top, and abutting portions are arranged between the opposite sides of the top of the pair of clamping pieces, the abutting portions on the two sides are matched and matched with the opening at the top of the detection seat.
[0011] Further, the abutting portions on the two sides are provided with guide inclined surfaces at the top of the opposite sides and clearance inclined surfaces at the bottom.
[0012] Further, the stop structure comprises an extension, the bottom of the clamping piece is extended outward to form the extension near one side of the clearance groove, the extension has a protruding end, the side wall of the clearance groove has a protruding structure, and the extension is in abutment with the protruding structure through rotation.
[0013] Further, a deformation cavity is further arranged, the bottom of the clamping piece is provided with the deformation cavity communicating with the two sides near one side of the extension, and the extension avoids and abuts against the protruding structure through the deformation cavity.
[0014] The MOSFET detection device has the advantages that the MOS tube is clamped by the pair of clamping pieces, the movement of the MOS tube is prevented, the detection socket of the detection seat is closed by the pair of clamping pieces under the action of the reset structure, foreign matters such as dust are prevented from accumulating, the clamping piece can be directly rotated after long-time use, the extension at the bottom of the clamping piece abuts against the protruding structure after the clamping piece is rotated to a certain extent, the purpose of preventing the clamping piece from resetting is achieved, and the detection socket is cleaned and maintained. BRIEF DESCRIPTION OF DRAWINGS
[0015] Figure 1 It is a structural schematic view of the utility model;
[0016] Figure 2 It is a structural schematic view of the reset structure of the utility model;
[0017] Figure 3 It is a structural schematic view of the A area of the utility model; Figure 2
[0018] Figure 4 It is a sectional view of the stop structure of the utility model;
[0019] Figure 5 for Figure 4 A magnified structural diagram of region B.
[0020] In the figure: 1. Testing table; 2. Testing seat; 21. Relief groove; 22. Protruding structure; 3. Clamping part; 31. Abutting part; 32. Guide slope; 33. Relief slope; 4. Reset structure; 41. Shaft; 42. Torsion spring; 5. Stop structure; 51. Extension part; 52. Deformation cavity. Detailed Implementation
[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.
[0022] Reference Figures 1-5 A MOSFET testing device includes a testing platform 1, with a plurality of testing seats 2 distributed on the top of the testing platform 1. Clamping members 3 are provided on both sides of the top of the testing seats 2. A pair of clamping members 3 are opened and closed by a reset structure 4 for clamping MOSFETs and for closing and protecting the testing socket.
[0023] The clamping member 3 is provided with a stop structure 5 at its bottom. The pair of clamping members 3 are unfolded through the stop structure 5 to facilitate dust removal and cleaning of the detection port.
[0024] It should be added that the principle of the detection unit is existing technology. The detection is mainly based on the detection pins to determine whether it is good or bad. Specifically, a MOSFET usually has three pins: gate (G), drain (D) and source (S). The pins can be tested using diode testing function.
[0025] Furthermore, a pair of clamping parts 3 close the detection port by fitting together to prevent dust, foreign objects and other impurities from entering the detection port. After long-term use, the clamping parts 3 can be prevented from resetting by the stop structure 5, so that the detection port can be cleaned by removing dust.
[0026] Furthermore, the reset structure 4 includes a shaft 41 and a torsion spring 42. The clamping member 3 has a T-shaped structure and is rotatably connected to the clearance groove 21 at the top of the detection seat 2 via the shaft 41 and the torsion spring 42 at the bottom.
[0027] It should be added that the two ends of the torsion spring 42 are fixedly connected to the clamping member 3 and the detection seat 2 respectively. Under normal circumstances, the clamping member 3 rotates towards the detection seat 2 under the action of the torsion springs 42 on both sides.
[0028] Further, the detection seat 2 is provided with an opening communicating with the clearance slot 21 at the middle of the top end, and each of the two opposite sides of the top of the pair of clamping members 3 is provided with an abutting portion 31, and the two abutting portions 31 are matched and matched with the top opening of the detection seat 2.
[0029] More specifically, the two abutting portions 31 are provided with a guide inclined surface 32 at the top of the opposite side, and a clearance inclined surface 33 at the bottom.
[0030] In this embodiment, the pair of clamping members 3 reduces the friction generated by the resistance between the pins and the MOS tube through the guide inclined surface 32, and the clearance inclined surface 33 is used to avoid the MOS tube.
[0031] In general, the stop structure 5 includes an extension 51, and the bottom of the clamping member 3 extends outwardly to form the extension 51 near one side of the clearance slot 21, and the extension 51 has a protruding end, and the side wall of the clearance slot 21 has a protruding structure 22, and the extension 51 is in contact with the protruding structure 22 by rotating.
[0032] Finally, it also includes a deformation cavity 52, and the bottom of the clamping member 3 is provided with the deformation cavity 52 communicating with the two sides near the extension 51, and the extension 51 avoids and contacts the protruding structure 22 through the deformation cavity 52.
[0033] It is worth mentioning that the clamping member 3 is preferably made of rubber, plastic and other materials with deformation ability, wherein the protruding structure 22 and the protruding end are arranged in a staggered manner in an up-down relationship;
[0034] After the clamping member 3 is rotated to a certain extent, the extension 51 contacts the protruding structure 22, and when the clamping member 3 is continuously rotated by manual intervention, the protruding end of the extension 51 avoids the protruding structure 22 through the deformation cavity 52, and after the deformation is restored, the side wall of the extension 51 contacts the clearance slot 21 and the protruding structure 22, preventing the clamping member 3 from resetting;
[0035] In addition, the protruding structure 22 is in an arc structure.
[0036] Working mode; when working, the pair of clamping members 3 clamps the MOS tube under the action of the reset structure 4, and the pins of the MOS tube are movably inserted into the detection socket for detection by the monitoring unit;
[0037] When not detecting, the pair of clamping members 3 shields and protects the detection socket by being matched and folded, and when long-term use needs to be cleaned, the clamping member 3 can be directly rotated, and because the protruding structure 22 and the protruding end are arranged in a staggered manner in an up-down relationship, the extension 51 is in contact with the protruding structure 22 after being rotated to a certain extent.
[0038] Then, the protruding end of the extension 51 avoids the protruding structure 22 by the deformation cavity 52, and after the deformation is restored, the sidewall of the extension 51 is in contact with the displacement slot 21, and the clamping piece 3 is prevented from resetting, so as to clean the detection socket.
[0039] The above merely describes a preferred embodiment of the present application, but the protection scope of the present application is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.
Claims
1. A MOSFET testing device comprising a testing station (1), characterized in that: The detection platform (1) is provided with a plurality of detection seats (2) on the top, and the top of each detection seat (2) is provided with a clamping piece (3). A pair of clamping pieces (3) are opened and closed through a reset structure (4) to clamp MOS tubes and protect the detection socket. The bottom of the clamping piece (3) is provided with a stop structure (5), and a pair of clamping pieces (3) are unfolded through the stop structure (5) to clean the detection socket.
2. The MOSFET detection apparatus of claim 1, wherein: The reset structure (4) includes a shaft (41) and a torsional spring (42), the clamping piece (3) is in T-shaped structure, and the clamping piece (3) is rotationally connected in the accommodation groove (21) on the top of the detection seat (2) through the shaft (41) and the torsional spring (42) at the bottom.
3. The MOSFET detection apparatus of claim 2, wherein: The middle of the top of the detection seat (2) is provided with an opening communicating with the accommodation groove (21), and the top of each clamping piece (3) is provided with an abutting part (31) between the opposite sides.
4. The MOSFET detection apparatus of claim 3, wherein: The abutting parts (31) on the opposite sides are provided with guide inclined surfaces (32) on the top and accommodation inclined surfaces (33) on the bottom.
5. The MOSFET detection apparatus of claim 2, wherein: The stop structure (5) includes an extension (51), the bottom of the clamping piece (3) extends outward to form the extension (51) near one side of the accommodation groove (21), the extension (51) has a protruding end, the side wall of the accommodation groove (21) has a protruding structure (22), and the extension (51) is in abutment with the protruding structure (22) through rotation.
6. The MOSFET detection apparatus of claim 5, wherein: Further comprising a deformation cavity (52), the bottom of the clamping piece (3) is provided with the deformation cavity (52) communicating with the two sides near one side of the extension (51), and the extension (51) avoids and abuts against the protruding structure (22) through the deformation cavity (52).
Citation Information
Patent Citations
MOSFET detection device
CN221960179U