Attached chip testing device
By designing a bonding-type chip testing device and utilizing the clamping structure of the conveying device and pusher assembly, the problem of chip displacement caused by vibration during testing was solved, achieving efficient and accurate chip testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- DONGGUAN CITY QIAN YING ELECTRONICS CO LTD
- Filing Date
- 2025-04-21
- Publication Date
- 2026-04-10
AI Technical Summary
In existing chip testing equipment, mechanical vibrations during testing can cause the chip to shift on the test stage, affecting the stability of the contact between the test probes and the chip, and consequently affecting the accuracy of the test.
A bonding chip testing device was designed. The chip holder is continuously transported to the testing machine through a conveying device. The chip is fixed on the testing board by the push plate assembly and the clamping structure of the base, ensuring that the chip remains stable during the testing process and avoiding loosening or displacement.
It enables continuous chip testing, improves testing efficiency and accuracy, ensures testing reliability, and avoids testing errors caused by chip loosening or misalignment.
Smart Images
Figure CN224109597U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip testing technical field, concretely relates to a kind of chip testing device of attachment. BACKGROUND
[0002] With the growth of emerging industries such as mobile internet, cloud computing, internet of things and big data, the electronic information industry has entered a new stage of development. Control, communication, human-computer interaction and network interconnection are integrated with a large number of emerging electronic technologies. The functions of equipment are becoming more and more complex, and the system integration is becoming more and more complex. The development of emerging electronic information technology relies on the continuous promotion of the semiconductor industry. Therefore, as a core technology, chips are becoming more and more frequent and important.
[0003] After the packaging of the chip is completed, it is generally tested to separate good products from defective products. In the existing chip testing device, when the chip is placed on the test table, mechanical vibration may occur during the operation of the testing equipment. These vibrations may cause the chip to displace on the test table, affecting the stability of the contact between the test probe and the chip, and ultimately affecting the accuracy of the test. UTILITY MODEL CONTENT
[0004] In view of the above technical problems existing in the prior art, the utility model provides a chip testing device of attachment.
[0005] To achieve the above purpose, the utility model provides the following technical scheme:
[0006] A chip testing device of attachment is provided, which includes a testing machine, a conveying device, and a plurality of chip seats. The plurality of chip seats are arranged in sequence and spaced apart on the conveying device. The conveying device is used to continuously convey the chip seats to the testing machine for testing and then convey the chip seats away after the testing is completed. The chip seat includes a base, a push plate assembly, and a test plate. The base is fixedly arranged on the conveying device, the push plate assembly is slidably arranged on the base, one end of the test plate penetrates through the side wall of one end of the base, and the other end of the test plate is connected with the push plate assembly. The push plate assembly can push the test plate to slide along the base, so that the push plate assembly and the side wall of one end of the base jointly clamp the chip and fix the chip on the test plate.
[0007] Preferably, a plurality of chip grooves are arranged on the test plate, and the chip grooves include a plurality of sizes to accommodate chips of different sizes. The plurality of chip grooves are arranged at one end of the test plate close to the push plate assembly, and the depth of the plurality of chip grooves is less than the thickness of the chip.
[0008] Preferably, the push plate assembly comprises a screw rod, a push plate and a driving device, the screw rod penetrates through the side wall of the other end of the base, one end of the screw rod is connected with the push plate; the push plate is slidingly arranged on the base and located between the two side walls of the base, the bottom of the push plate extends a boss, a sliding groove is arranged on the base, the boss is embedded in the sliding groove, so that the push plate can slide along the sliding groove; the driving device is arranged on the side wall of the other end of the base and is used for driving the screw rod to move, thereby driving the push plate to move along the sliding groove.
[0009] Preferably, the driving device comprises a driving motor and a threaded sleeve, the driving motor is arranged on the top of the side wall of the other end of the base, the threaded sleeve is rotatably arranged in the side wall of the other end of the base, the screw rod is arranged in the threaded sleeve and is matched with the threads of the threaded sleeve; a first gear is arranged on the output shaft of the driving motor, a second gear is arranged on the outer periphery of the threaded sleeve, and the first gear and the second gear are meshed with each other.
[0010] Preferably, the test machine comprises a workbench, a linear motor and a test assembly are arranged on the workbench, the test assembly is connected with the linear motor, and the linear motor can drive the test assembly to move along the Z-axis; the test assembly comprises a test seat, one end of the test seat is provided with a test probe, the test probe is arranged towards the conveying device, and the test probe is used for contacting the chip of the chip seat and testing.
[0011] Preferably, the test machine further comprises a display assembly, the display assembly comprises a display, a camera and a light source, the display is fixedly arranged on the linear motor; the camera and the light source are arranged on the test seat and are located at the same end as the test probe, the camera is used for shooting the position and state of the chip, and the light source is used for providing illumination for the camera; the display is electrically connected with the camera and is used for displaying the picture shot by the camera.
[0012] Preferably, the conveying device comprises a support frame, a plurality of rotating rollers are arranged on the support frame, and the plurality of rotating rollers are arranged in sequence and at intervals along the length direction of the support frame; the conveying device further comprises a plate chain conveying belt, the plate chain conveying belt is sleeved outside the plurality of rotating rollers, and the chip seat is arranged on the plate chain conveying belt.
[0013] Preferably, the conveying device further comprises a controller, the controller is arranged on the support frame and is used for controlling the rotation of the rotating rollers, so as to drive the plate chain conveying belt to move.
[0014] The utility model discloses the beneficial effect:
[0015] The utility model discloses a kind of attached chip testing devices, including testing machine, conveying device and multiple chip seats, multiple chip seats are sequentially spaced apart on conveying device, conveying device is used to continuously chip seat sequentially conveyed to testing machine place and is tested, and chip seat is conveyed to leave after testing machine test is completed;Chip seat includes base, push plate assembly and test plate, base is fixed on conveying device, push plate assembly is slidably arranged on base, one end of test plate penetrates the side wall of one end of base, the other end of test plate is connected with push plate assembly, push plate assembly can push test plate to slide along base, so that push plate assembly and the side wall of one end of base are collectively clamped chip, chip is fixed on test plate. Multiple chip seats are sequentially conveyed to testing machine place and are tested by conveying device, and chip seat is automatically conveyed to leave after testing is completed, the continuous test of chip is realized, and test efficiency is improved;And push plate assembly can push test plate to slide along base, so that chip both sides can be attached on push plate assembly and the side wall of one end of base, finally push plate assembly and the side wall of one end of base can collectively clamp chip to be detected, ensure that chip remains stable during testing, avoid the test error caused by loosening or deviation, improve the accuracy and reliability of test. BRIEF DESCRIPTION OF DRAWINGS
[0016] Figure 1 It is a structure schematic view of one kind attached chip testing device in embodiment.
[0017] Figure 2 It is the perspective view of linear motor, test seat and display component in embodiment.
[0018] Figure 3 It is the perspective view of chip seat in embodiment.
[0019] Figure 4 It is another perspective view of chip seat in embodiment.
[0020] Figure 5 It is the perspective view of driving device in embodiment.
[0021] Reference signs: 1, testing machine;10, workbench;11, linear motor;12, test seat;13, test probe;14, display;15, camera;16, light source;2, conveying device;20, support frame;21, plate chain conveyor belt;22, controller;3, chip seat;30, base;31, push plate assembly;32, screw;33, push plate;34, driving device;341, driving motor;342, first gear;343, threaded sleeve;344, second gear;35, test plate;351, chip slot. DETAILED DESCRIPTION
[0022] With reference to the accompanying drawings, the technical solutions in the embodiments of the present application will be clearly and completely described in the following. In the case of no conflict, the following embodiments and the features in the embodiments can be combined with each other.
[0023] The chip testing device according to the embodiment, as shown in the figure, comprises a testing machine 1 for testing chips. It also comprises a conveying device 2 and a plurality of chip seats 3, wherein the plurality of chip seats 3 are arranged on the conveying device 2 in sequence and at intervals. In use, the chips to be tested are first placed on the chip seats 3, and then the conveying device 2 is started to continuously convey the chip seats 3 to the testing machine 1 in sequence. After the testing machine 1 tests the chips on the chip seats 3, the conveying device 2 conveys the chip seats 3 away. Figures 1 to 5
[0024] The testing machine 1 comprises a workbench 10, a linear motor 11 and a testing assembly arranged on the workbench 10. The testing assembly is connected with the linear motor 11, and the linear motor 11 can drive the testing assembly to move along the Z axis. The testing assembly comprises a testing seat 12, and a testing probe 13 is arranged at one end of the testing seat 12 and faces the chip seats 3. When the conveying device 2 conveys the chip seats 3 carrying the chips to below the testing assembly, the linear motor 11 can drive the testing assembly to move along the Z axis, and then drive the testing probe 13 to move along the Z axis, so that the testing probe 13 can contact the chips on the chip seats 3 and test them.
[0025] The testing machine 1 also comprises a display assembly, which comprises a display 14, a camera 15 and a light source 16. The display 14 is fixedly arranged on the linear motor 11, and the camera 15 and the light source 16 are arranged on the testing seat 12 and located at the same end as the testing probe 13. The camera 15 is used to shoot the positions and states of the chips, and the light source 16 is used to provide illumination for the camera 15 to ensure that the shooting picture is clear. The display 14 is electrically connected with the camera 15, and the display 14 can display the picture shot by the camera 15 in real time, so as to facilitate the operator to observe and monitor the testing process.
[0026] Further, the conveying device 2 comprises a support frame 20, a plurality of rotating rollers are arranged on the support frame 20 in sequence and at intervals along the length direction of the support frame 20, the conveying device 2 further comprises a plate chain conveying belt 21, the plate chain conveying belt 21 is sleeved outside the plurality of rotating rollers, and the chip seat 3 is fixedly arranged on the plate chain conveying belt 21. The conveying device 2 further comprises a controller 22 arranged on the support frame 20, which is used to control the rotation of the rotating rollers, thereby driving the plate chain conveying belt 21 to move, so as to realize the continuous conveying of the chip seat 3. When the controller 22 is started, the rotating rollers rotate at a set speed, driving the plate chain conveying belt 21 to move, thereby conveying the chip seat 3 loaded with chips to the testing machine 1 in sequence for testing, and conveying the chip seat 3 away after the testing is completed.
[0027] Further, the chip seat 3 comprises a base 30 and a push plate assembly 31, the base 30 is fixedly arranged on the plate chain conveying belt 21, and the push plate assembly 31 is slidingly arranged on the base 30. The chip seat 3 further comprises a test plate 35, which is used to carry the chip to be tested, one end of the test plate 35 is connected with the push plate assembly 31, and the other end of the test plate 35 penetrates through the side wall of one end of the base 30. The push plate assembly 31 can push the test plate 35 to slide, so that the chips on the test plate 35 can be clamped on both sides of the push plate assembly 31 and the side wall of one end of the base 30, and finally the push plate assembly 31 and the side wall of one end of the base 30 can jointly clamp the chip to be tested, so as to fix the chip to be tested on the test plate 35, so that the test assembly in the testing machine 1 can test the chip.
[0028] Among them, the test plate 35 is provided with a plurality of chip grooves 351, and the chip grooves 351 are located at one end of the test plate 35 close to the push plate assembly 31. The chip grooves 351 include a plurality of sizes to adapt to chips of different sizes, and the depth of each chip groove 351 is less than the thickness of the chip itself. By arranging a plurality of chip grooves 351 of different sizes on the test plate 35, the test plate 35 can adapt to chips of different specifications, thereby improving the application range of the device, and the depth of the chip groove 351 is less than the thickness of the chip. When the chip to be tested is placed in the chip groove 351, the chip will partially expose, which is convenient for the test probe 13 to contact the pins of the chip.
[0029] Further, the push plate assembly 31 comprises a screw rod 32, a push plate 33 and a driving device 34, wherein the screw rod 32 penetrates through the side wall of the other end of the base 30, one end of the screw rod 32 is connected with the push plate 33, the push plate 33 is slidingly arranged on the base 30 and located between the two side walls of the base 30, the driving device 34 is arranged on the side wall of the other end of the base 30, the driving device 34 is used for driving the screw rod 32 to move, the screw rod 32 moves in turn to drive the push plate 33 to slide on the base 30, so that the push plate 33 gradually approaches the side wall of one end of the base 30 and the push plate 33 clamps the chip to be detected together with the base 30, and finally the chip to be detected is fixed on the test plate 35, so that the position of the chip is fixed during the test, test errors caused by loosening or deviation are avoided, and the accuracy and reliability of the test are improved.
[0030] Wherein, the push plate 33 extends a boss at the bottom, the base 30 is provided with a sliding groove, the boss on the push plate 33 is embedded in the sliding groove of the base 30, when the driving device 34 drives the screw rod 32 to move, the screw rod 32 drives the push plate 33 to slide along the sliding groove. By setting the boss at the bottom of the push plate 33, setting the sliding groove on the base 30, and embedding the boss in the sliding groove, when the boss slides in the sliding groove, the sliding groove can provide a guide function for the boss, so that the push plate 33 slides along a straight line, and deviation or inclination of the push plate 33 during movement is avoided.
[0031] Further, the driving device 34 comprises a driving motor 341 and a threaded sleeve 343, the driving motor 341 is arranged on the top of the side wall of the other end of the base 30, the threaded sleeve 343 is rotatably arranged in the side wall of the other end of the base 30, the screw rod 32 is arranged in the threaded sleeve 343 and matched with the threads of the threaded sleeve 343; a first gear 342 is arranged on the output shaft of the driving motor 341, a second gear 344 is arranged on the outer periphery of the threaded sleeve 343, the first gear 342 and the second gear 344 are meshed with each other. When the driving motor 341 is started, the first gear 342 drives the second gear 344 to rotate, so as to drive the threaded sleeve 343 to rotate; the rotational movement of the threaded sleeve 343 is converted into the linear movement of the screw rod 32 through the thread matching, and in turn drives the push plate 33 to slide along the sliding groove.
[0032] In the description of the present application, obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings herein can be arranged and designed in various different configurations.
[0033] Therefore, the above detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of the present application.
Claims
1. An in-line chip testing apparatus comprising a testing machine (1), a transport device (2) and a plurality of chip holders (3), characterized in that, Multiple chip seats (3) are arranged in sequence and spaced apart on the conveying device (2), the conveying device (2) is used for continuously conveying the chip seats (3) to the testing machine (1) in sequence for testing, and conveying the chip seats (3) away after the testing of the testing machine (1) is completed; the chip seat (3) comprises a base (30), a push plate assembly (31) and a test plate (35), the base (30) is fixed on the conveying device (2), the push plate assembly (31) is slidably arranged on the base (30), one end of the test plate (35) penetrates through the side wall of one end of the base (30), the other end of the test plate (35) is connected with the push plate assembly (31), and the push plate assembly (31) can push the test plate (35) to slide along the base (30), so that the push plate assembly (31) and the side wall of one end of the base (30) jointly clamp the chip to fix the chip on the test plate (35).
2. The flip chip test apparatus of claim 1, wherein The test plate (35) is also provided with multiple chip grooves (351), and the chip grooves (351) comprise multiple sizes to adapt to chips of different sizes; the multiple chip grooves (351) are located at one end of the test plate (35) close to the push plate assembly (31), and the depth of the multiple chip grooves (351) is less than the thickness of the chip itself.
3. The flip chip test apparatus of claim 1, wherein The push plate assembly (31) comprises a screw rod (32), a push plate (33) and a driving device (34), the screw rod (32) penetrates through the side wall of the other end of the base (30), and one end of the screw rod (32) is connected with the push plate (33); the push plate (33) is slidably arranged on the base (30) and located between the two side walls of the base (30), the bottom of the push plate (33) extends a boss, a sliding groove is arranged on the base (30), and the boss is embedded in the sliding groove, so that the push plate (33) can slide along the sliding groove; the driving device (34) is arranged on the side wall of the other end of the base (30) and used for driving the screw rod (32) to move, thereby driving the push plate (33) to move along the sliding groove.
4. The flip chip test apparatus of claim 3, wherein The driving device (34) comprises a driving motor (341) and a threaded sleeve (343), the driving motor (341) is arranged on the top of the side wall of the other end of the base (30), the threaded sleeve (343) is rotatably arranged in the side wall of the other end of the base (30), the screw rod (32) is arranged in the threaded sleeve (343) and matched with the threads of the threaded sleeve (343); a first gear (342) is arranged on the output shaft of the driving motor (341), a second gear (344) is arranged on the outer periphery of the threaded sleeve (343), and the first gear (342) and the second gear (344) are meshed with each other.
5. The flip chip test apparatus of claim 1, wherein The testing machine (1) comprises a workbench (10), a linear motor (11) and a test assembly are arranged on the workbench (10), the test assembly is connected with the linear motor (11), and the linear motor (11) can drive the test assembly to move along the Z axis; the test assembly comprises a test seat (12), one end of the test seat (12) is provided with a test probe (13), the test probe (13) is arranged towards the conveying device (2), and the test probe (13) is used for contacting the chip of the chip seat (3) and testing.
6. The flip chip test apparatus of claim 5, wherein The testing machine (1) further comprises a display assembly, the display assembly comprising a display (14), a camera (15) and a light source (16), the display (14) being fixed on the linear motor (11); the camera (15) and the light source (16) being arranged on the testing seat (12) and located at the same end as the testing probe (13), the camera (15) being used for shooting the position and state of the chip, and the light source (16) being used for providing illumination for the camera (15); the display (14) being electrically connected with the camera (15) and being used for displaying the picture shot by the camera (15).
7. The flip chip test apparatus of claim 1, wherein The conveying device (2) comprises a support frame (20), a plurality of rotating rollers are arranged on the support frame (20) and are arranged in sequence and at intervals along the length direction of the support frame (20); the conveying device (2) further comprises a plate chain conveying belt (21), the plate chain conveying belt (21) is sleeved outside the plurality of rotating rollers, and the chip seat (3) is arranged on the plate chain conveying belt (21).
8. The flip chip test apparatus of claim 7, wherein The conveying device (2) further comprises a controller (22), the controller (22) is arranged on the support frame (20) and is used for controlling the rotation of the rotating rollers, so as to drive the plate chain conveying belt (21) to move.