Test probe capable of preventing probe head from being deformed

Abstract

The utility model relates to the technical field of semiconductor detection, and discloses a test probe capable of preventing probe head deformation, which comprises a test probe rod and a test probe head, the test probe head is arranged on the left side of the test probe rod, a protective sleeve is arranged outside the test probe head, the front end and the rear end of the test probe head are fixedly connected with first magnetic strips, and the first magnetic strips are arranged on the protective sleeve. The bottom end of the protective sleeve is fixedly connected with a first buffer ring, the top end of the protective sleeve is fixedly connected with a second buffer ring, and the front end and the rear end of the interior of the protective sleeve are fixedly connected with second magnetic strips. According to the test probe capable of preventing the probe head from deformation, the test probe head can be protected through the protective sleeve, the first buffer ring and the second buffer ring on the protective sleeve have buffer and protection effects when the test probe is subjected to external force, the test probe head can be prevented from deformation, and the test probe head can be prevented from deformation only by pushing the protective sleeve downwards during use. And the second magnetic strip on the protective sleeve can be taken down after being separated from the first magnetic strip, so that the problem that the needle head is easy to deform is solved.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, specifically a test probe that prevents needle deformation. Background Technology

[0002] Semiconductors are materials whose conductivity at room temperature is between that of conductors and insulators. Semiconductors are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high-power power conversion and other fields. For example, diodes are devices made of semiconductors. During the production process, semiconductors need to be tested using test probes.

[0003] There are many types of semiconductor test probes, including probes with fine tips. These probes are easily deformed when subjected to external pressure during storage and use, which affects their normal use. In addition, the tips of some probes are fixed and inconvenient to replace, thus reducing the flexibility of probe use.

[0004] There is an urgent need for a test probe that prevents needle deformation to address the technical deficiencies mentioned above. Utility Model Content

[0005] The purpose of this invention is to provide a test probe that prevents needle deformation, so as to solve the problem of easy needle deformation mentioned in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a test probe for preventing needle deformation, comprising a test probe shaft and a test probe tip. The test probe tip is installed on the left side of the test probe shaft. A protective sleeve is installed on the outside of the test probe tip. A first magnetic strip is fixedly connected to the front and rear ends of the test probe tip. A first buffer ring is fixedly connected to the bottom end of the protective sleeve. A second buffer ring is fixedly connected to the top end of the protective sleeve. A second magnetic strip is fixedly connected to the front and rear ends inside the protective sleeve. A reserved sliding groove is provided inside the second magnetic strip. A connector is fixedly connected to the end of the test probe tip. A bolt hole is provided inside the connector. An installation groove is provided on the right side of the test probe shaft. A mating hole is provided on the right side inside the installation groove. Positioning bolts are provided on the right sides of the top and bottom ends of the test probe shaft.

[0007] Preferably, the first magnetic strip can be embedded inside the reserved groove of the second magnetic strip, and the first magnetic strip and the second magnetic strip are magnetically attracted and fixed together.

[0008] Preferably, the protective sleeve is inverted conical in shape, and both the first and second buffer rings are made of silicone.

[0009] Preferably, the connector is embedded inside the mounting groove and is inserted into the mating hole.

[0010] Preferably, the connector is embedded inside the mounting groove and is inserted into the mating hole.

[0011] Preferably, the positioning bolt can be embedded inside the bolt hole in a threaded connection, and an anti-slip knob is fixedly connected to the positioning bolt.

[0012] Compared with the prior art, the beneficial effects of this utility model are: the test probe that prevents needle deformation not only achieves the function of preventing needle deformation and facilitating needle replacement, but also improves the flexibility of detection.

[0013] By incorporating a test needle, a protective sleeve, a first magnetic strip, a second magnetic strip, a first buffer ring, and a second buffer ring, the test needle is designed to prevent deformation due to its thinness during storage and handling. The protective sleeve protects the test needle from external force, and the first and second buffer rings on the sleeve provide cushioning to prevent deformation. To remove the test needle, simply push the protective sleeve downwards; the second magnetic strip separates from the first magnetic strip. This structure effectively prevents needle deformation.

[0014] With a test needle, connector, rubber ring, positioning bolt, mounting groove, and anti-slip knob, when replacing the test needle, the tester can first rotate the anti-slip knob. After the anti-slip knob moves the positioning bolt out of the bolt hole, the test needle can be taken out of the mounting groove. Then, the test needle that meets the test requirements can be installed on the test needle bar. When installing the test needle, the rubber ring on the connector can fit tightly with the mounting groove. This structure realizes the function of easy needle replacement.

[0015] The test probe is equipped with a test probe bar, a test probe tip, a connector, a mating hole, and a mounting slot. The test probe tip can be replaced as needed. When replacing the connector, the old test probe tip needs to be removed, and then the connector on the new test probe tip is inserted into the mounting slot on the right side of the test probe bar. The connector is connected to the mating hole inside the mounting slot to achieve normal testing. This structure realizes the function of flexible testing with replaceable probe tips. Attached Figure Description

[0016] Figure 1 This is a frontal cross-sectional view of the present invention.

[0017] Figure 2 This is a top view of the protective sleeve structure of this utility model;

[0018] Figure 3 For the present utility model Figure 1 Enlarged structural diagram at point A in the middle;

[0019] Figure 4 This is a front view cross-sectional structural diagram of the protective sleeve of this utility model.

[0020] In the diagram: 1. Test probe bar; 2. Test probe tip; 3. Protective sleeve; 4. First magnetic strip; 5. Connector; 6. Rubber ring; 7. Positioning bolt; 8. Connecting hole; 9. Mounting groove; 10. Second magnetic strip; 11. First buffer ring; 12. Second buffer ring; 13. Reserved slide groove; 14. Bolt hole; 15. Anti-slip knob. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Please see Figure 1-4 The present invention provides an embodiment of a test probe for preventing needle deformation, comprising a test needle rod 1 and a test needle 2. The test needle 2 is installed on the left side of the test needle rod 1. A protective sleeve 3 is installed on the outside of the test needle 2. A first magnetic strip 4 is fixedly connected to the front and rear ends of the test needle 2. A first buffer ring 11 is fixedly connected to the bottom end of the protective sleeve 3. A second buffer ring 12 is fixedly connected to the top end of the protective sleeve 3. A second magnetic strip 10 is fixedly connected to the front and rear ends inside the protective sleeve 3. A reserved sliding groove 13 is provided inside the second magnetic strip 10. A connector 5 is fixedly connected to the end of the test needle 2. A bolt hole 14 is provided inside the connector 5. An installation groove 9 is provided on the right side of the test needle rod 1. A docking hole 8 is provided on the right side inside the installation groove 9.

[0023] The first magnetic strip 4 can be embedded in the reserved groove 13 of the second magnetic strip 10. The first magnetic strip 4 and the second magnetic strip 10 are magnetically fixed. The protective sleeve 3 is inverted conical. The first buffer ring 11 and the second buffer ring 12 are both made of silicone material.

[0024] Specifically, such as Figure 1 , Figure 2 and Figure 4As shown, the protective sleeve 3 can protect the test needle 2. When subjected to external force, the first buffer ring 11 and the second buffer ring 12 on the protective sleeve 3 have a buffering and protective effect, which can prevent the test needle 2 from deforming. When in use, simply push the protective sleeve 3 downwards, and the second magnetic strip 10 on the protective sleeve 3 will separate from the first magnetic strip 4, and it can be removed. Alternatively, the protective sleeve 3 can be pushed upwards to expose the test area of ​​the test needle 2, and it can also be used normally. The protective sleeve 3 can continue to be magnetically attached to the outside of the test needle 2 to protect the test needle 2 during the test.

[0025] The connector 5 is embedded inside the mounting groove 9 and is inserted into the mating hole 8.

[0026] Specifically, such as Figure 1 As shown, the test needle 2 can be replaced as needed. When replacing the connector, the old test needle 2 needs to be removed, and then the connector 5 on the new test needle 2 is inserted into the mounting groove 9 on the right side of the test needle rod 1. The connector 5 is connected to the mating hole 8 inside the mounting groove 9 to achieve normal testing.

[0027] The right side of the top and bottom of the test needle bar 1 is provided with positioning bolts 7. The positioning bolts 7 can be embedded in the bolt hole 14 and are threaded. The positioning bolts 7 are fixedly connected with anti-slip knobs 15.

[0028] Specifically, such as Figure 1 and Figure 3 As shown, when replacing the test needle 2, the tester can first rotate the anti-slip knob 15. After the anti-slip knob 15 moves the positioning bolt 7 out of the bolt hole 14, the test needle 2 can be taken out from the mounting slot 9. Then, the test needle 2 that meets the test requirements can be installed on the test needle rod 1. When installing the test needle 2, the rubber ring 6 on the connector 5 can be tightly fitted with the mounting slot 9.

[0029] Working principle: When using this invention, the test probe 1 needs to be connected to the testing equipment first. Then, the test probe 1 and test needle 2 are used to test the semiconductor. The protective sleeve 3 can protect the test needle 2. When subjected to external force, the first buffer ring 11 and the second buffer ring 12 on the protective sleeve 3 have a buffering and protective effect, which can prevent the test needle 2 from deforming. When using, simply push the protective sleeve 3 downwards, and the second magnetic strip 10 on the protective sleeve 3 will separate from the first magnetic strip 4, and it can be removed. Alternatively, the protective sleeve 3 can be pushed upwards to expose the testing area of ​​the test needle 2. The field can also be used normally. The protective sleeve 3 continues to be magnetically installed on the outside of the test needle 2 to protect the test needle 2 during the test. The test needle 2 can be replaced as needed. When replacing the test needle 2, the tester can first rotate the anti-slip knob 15. After the anti-slip knob 15 moves the positioning bolt 7 out of the bolt hole 14, the test needle 2 can be taken out from the mounting groove 9. Then, the test needle 2 that meets the test requirements is installed on the test needle rod 1. When the test needle 2 is installed, the rubber ring 6 on the connector 5 can be tightly fitted with the mounting groove 9. This structure realizes the function of easy needle replacement.

[0030] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A test probe for preventing needle deformation, comprising a test probe shaft (1) and a test probe tip (2), characterized in that: The test needle (2) is installed on the left side of the test needle rod (1). A protective sleeve (3) is installed on the outside of the test needle (2). A first magnetic strip (4) is fixedly connected to the front and rear ends of the test needle (2). A first buffer ring (11) is fixedly connected to the bottom end of the protective sleeve (3). A second buffer ring (12) is fixedly connected to the top end of the protective sleeve (3). A second magnetic strip (10) is fixedly connected to the front and rear ends inside the protective sleeve (3). A reserved sliding groove (13) is provided inside the second magnetic strip (10). A connector (5) is fixedly connected to the end of the test needle (2). A bolt hole (14) is provided inside the connector (5). An installation groove (9) is provided on the right side of the test needle rod (1). A docking hole (8) is provided on the right side inside the installation groove (9). A positioning bolt (7) is provided on the right side of the top and bottom ends of the test needle rod (1).

2. The test probe for preventing needle deformation according to claim 1, characterized in that: The first magnetic strip (4) can be embedded in the reserved groove (13) of the second magnetic strip (10), and the first magnetic strip (4) and the second magnetic strip (10) are magnetically fixed together.

3. A test probe for preventing needle deformation according to claim 1, characterized in that: The protective sleeve (3) is inverted conical in shape, and the first buffer ring (11) and the second buffer ring (12) are both made of silicone.

4. A test probe for preventing needle deformation according to claim 1, characterized in that: The connector (5) is embedded inside the mounting groove (9) and is inserted into the mating hole (8).

5. A test probe for preventing needle deformation according to claim 1, characterized in that: The connector (5) is externally fixed with a rubber ring (6), which is tightly fitted to the right side of the test needle rod (1).

6. A test probe for preventing needle deformation according to claim 1, characterized in that: The positioning bolt (7) can be threaded into the bolt hole (14), and an anti-slip knob (15) is fixedly connected to the positioning bolt (7).

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