Sensing connector

Abstract

The utility model provides a sensing connector comprising a body which is provided with an opening and an accommodating groove located in the opening; the first terminal is configured in the accommodating groove and comprises a fixing part connected to the body; the connecting arm is connected to the fixing part and extends from the opening to the direction of the accommodating groove; the buffer component is connected to the connecting arm and is provided with a first bending part and a second bending part; a second bending part; the buffer section is arranged between the first bending part and the second bending part; a first arm connected to the buffer member and extending in a first direction; the contact part is connected to the first arm; and the second arm is connected to the contact part, the first terminal is provided with a force reference line penetrating through the first bending part and the second arm, the force reference line is parallel to the first arm, the second arm is a driving front section between the force reference line and the contact part, and the remaining second arm is a driving rear section.

Description

Technical Field

[0001] This utility model relates to a sensing connector, and more particularly to a biosensing connector with sensing terminals. Background Technology

[0002] In recent years, due to the aging population and the busy work schedules of modern people who frequently eat out and neglect dietary habits, metabolic-related diseases such as diabetes, cardiovascular disease, and hypertension have become increasingly common. Therefore, in vitro medical measurements play a crucial role in the modern medical industry. Commonly used point-of-care testing (POCT) systems in medical facilities and homes measure changes in bodily fluids, providing users with rapid access to information related to disease and treatment.

[0003] The testing instrument can insert test pieces of different types or thicknesses to perform measurements according to the user's needs. The test pieces are contacted through the terminals of the connector structure in the testing instrument. It is known that when test pieces of different thicknesses are inserted into the terminals, the force points or parts of the terminals will be concentrated in specific parts of the terminals. This can easily lead to excessive force concentration on the terminals, resulting in problems such as elastic fatigue and deformation. Consequently, it can lead to incorrect contact between the terminals and the test pieces, thus affecting the test results.

[0004] Therefore, it is necessary to improve the connector structure in current testing instruments to reduce or even avoid problems such as incorrect contact and improve the accuracy of testing.

[0005] The above description of "prior art" provides background information only and does not acknowledge that the above description of "prior art" discloses the subject matter of this disclosure. It does not constitute prior art of this disclosure, and no description of the above "prior art" should be considered part of this utility model. Utility Model Content

[0006] The purpose of this invention is to provide a sensing connector to solve at least one of the above-mentioned problems.

[0007] This utility model provides a sensing connector, comprising: a body having an opening and a receiving groove located within the opening; and a first terminal disposed in the receiving groove, and including: a fixing portion connected to the body; and a connecting arm connected to the fixing portion and extending from the opening toward the receiving groove; and a buffer member connected to the connecting arm, and having: a first bending portion; a second bending portion; and a buffer section located between the first bending portion and the second bending portion; a first arm connected to the buffer member and extending along a first direction; a contact portion connected to the first arm; and a second arm connected to the contact portion, wherein the first terminal has a force reference line passing through the first bending portion and the second arm, the force reference line being parallel to the first arm, the second arm being a drive front section between the force reference line and the contact portion, and the remaining portion of the second arm being a drive rear section.

[0008] According to one embodiment of the present invention, the second arm extends along a second direction, wherein the second direction is different from the first direction.

[0009] According to one embodiment of the present invention, the bending directions of the first bending portion and the second bending portion are the same.

[0010] According to one embodiment of the present invention, a limiting part is further included, which is connected to the second arm and separate from the connecting arm and the buffer member.

[0011] According to one embodiment of the present invention, the first bending portion has a first angle, and the second bending portion has a second angle.

[0012] According to one embodiment of the present invention, the sum of the first angle and the second angle is between 90° and 180°.

[0013] According to one embodiment of the present invention, the front drive section faces the buffer member, and the rear drive section faces the connecting arm.

[0014] According to one embodiment of the present invention, a second terminal is further included, disposed in the receiving groove, wherein the configuration of the second terminal is the same as or different from the configuration of the first terminal.

[0015] According to one embodiment of the present invention, the extending direction of the first terminal is opposite to the extending direction of the second terminal.

[0016] According to one embodiment of the present invention, the height of the receiving groove is less than 4 mm.

[0017] The beneficial effect of this utility model is that the terminal of this utility model has a part for receiving the test piece to drive the terminal to move, and when receiving test pieces of different thicknesses, it contacts different driving points to drive the terminal to move. Different driving points will drive the terminal to move within the elastic limit and present different force states. Therefore, regardless of whether a thick test piece, a thin test piece, or a double-layer test piece with two sections of different thicknesses is inserted, the terminal can be driven to present different force states and the force can be effectively dispersed. It can stabilize the contact between the contact part and the electrode group on the test piece, thereby stabilizing the current impedance of the signal and improving the measurement accuracy. Attached Figure Description

[0018] The following detailed description, taken in conjunction with the accompanying drawings, will provide the best understanding of the present invention. It should be noted that various features may not be drawn to scale. In fact, the dimensions of various features may be arbitrarily increased or decreased for clarity of explanation. A more complete understanding of the disclosure of this application can be obtained by referring to the accompanying drawings, in which like reference numerals refer to like elements.

[0019] Figure 1 This is a side sectional view of a sensing connector according to some embodiments of the present invention.

[0020] Figure 2 This is a perspective view of the terminals in a sensing connector according to some embodiments of the present invention.

[0021] Figure 3 This is a side sectional view of a terminal in a sensing connector according to some embodiments of the present invention, before the thin test piece is inserted, after the thin test piece is removed, or in a state where the terminal is not under force.

[0022] Figures 4 to 6 This is a schematic diagram showing the force distribution of the terminals during the insertion of a thin test piece into a sensing connector, according to some embodiments of the present invention.

[0023] Figure 7 and Figure 8 This is a schematic diagram showing the force distribution of the terminals during the process of removing the thin test piece from the sensing connector, according to some embodiments of the present invention.

[0024] Figures 9 to 11 This is a schematic diagram showing the force distribution of the terminals during the insertion of a thick test piece into a sensing connector, according to some embodiments of the present invention.

[0025] Figure 12 and Figure 13 This is a schematic diagram showing the force distribution of the terminals during the process of removing the thick test piece from the sensing connector, according to some embodiments of the present invention.

[0026] Figures 14 to 18The diagram illustrates the insertion of a double-layer test piece into a sensing connector according to some embodiments of the present invention.

[0027] The attached figures are labeled as follows:

[0028] 1: Sensor connector

[0029] 1A: Sensor connector

[0030] 10:Ontology

[0031] 12: Top Cover

[0032] 12P: Protrusion

[0033] 14: Base

[0034] 15: Opening

[0035] 16: Receiving slot

[0036] 20:Terminal

[0037] 20A: Terminal exterior

[0038] 20B: Inner side of terminal

[0039] 21: Fixing part

[0040] 22: Connecting arm

[0041] 23: Buffer component

[0042] 24: First Arm

[0043] 25:Contact Department

[0044] 26: Second Arm

[0045] 27: Limiting part

[0046] 27C: Third bend

[0047] 28: Buffer space

[0048] 29A: Front drive point

[0049] 29B: Rear drive point

[0050] 30: Test Film

[0051] 32: Thin test piece

[0052] 33: Lower layer test piece

[0053] 34: Thick test piece

[0054] 35: Upper layer test piece

[0055] 36: Double-layer test piece

[0056] 120P: Corner

[0057] 201: First terminal

[0058] 202: Second terminal

[0059] 231: First bend

[0060] 232: Second bend

[0061] 233: Buffer Section

[0062] 251: First Contact Section

[0063] 252: Second contact part

[0064] 271: First paragraph

[0065] 272: Second paragraph

[0066] 291: Drive front end

[0067] 292: Drive section

[0068] d1: Straight-line distance

[0069] D10: Direction

[0070] D20: Direction

[0071] H1: Height

[0072] H10: Vertical distance

[0073] H100: Height

[0074] H20: Vertical distance

[0075] L1: External force

[0076] L10: Power Baseline

[0077] R1: External force

[0078] R10: Section

[0079] R12: Section

[0080] R20: Section

[0081] R22: Section

[0082] S1: Upper surface

[0083] S2: Lower surface

[0084] θ1: First angle

[0085] θ2: Second angle Detailed Implementation

[0086] The following disclosure provides numerous different embodiments or instances for implementing various features of the provided subject matter. Specific examples of components and configurations are described below to simplify the present invention. Of course, these components and configurations are merely examples and are not intended to be limiting. Furthermore, reference numerals and / or letters may be repeated in various instances of the present invention. This repetition is for simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or states discussed.

[0087] Embodiments of the present invention are discussed in more detail below. However, it should be understood that the present invention provides many applicable concepts that can be embodied in a wide variety of specific contexts. The specific embodiments discussed are merely illustrative and do not limit the scope of the present invention.

[0088] Furthermore, for ease of description, spatial relative terms such as “below,” “under,” “above,” “upper,” “lower,” “left,” “right,” and similar terms may be used herein to describe the relationship of one element or feature to another (or more) elements or features as illustrated in the accompanying drawings. In addition to the orientations depicted in the drawings, spatial relative terms are intended to cover different orientations of the device in use or operation. The device may be oriented in other ways (rotated 90 degrees or in other orientations), and the spatial relative descriptive terms used herein may be interpreted accordingly. It should be understood that when an element is referred to as “connected to” or “coupled to” another element, the element may be directly connected to or coupled to the other element, or there may be intervening elements.

[0089] The numerical ranges and parameters describing the broad scope of this invention are approximate values, and the values ​​described in specific examples are reported as accurately as possible. However, some values ​​may contain certain errors necessarily caused by the standard deviation found in individual test measurements. Furthermore, alternatively, those skilled in the art generally consider the term "about" to mean within an acceptable standard error of the mean. Except in operational / working examples, or unless otherwise expressly specified, all numerical ranges, quantities, values, and percentages (such as the quantities of material, durations, temperatures, operating conditions, ratios of quantities, and the like thereof disclosed herein) should be understood to be modified by the term "about" in all cases. Therefore, unless indicated to the contrary, the numerical parameters set forth in this invention and the appended claims are variable approximations. At least, each numerical parameter should be understood based on the number of significant digits reported and by applying general rounding techniques. A range may be expressed herein as from one endpoint to another or between two endpoints. Unless otherwise specified, all ranges disclosed herein include the endpoints. The term “largely coplanar” can refer to two surfaces that are within a few micrometers (μm) along the same plane, such as two surfaces that are within 10 micrometers, 5 micrometers, 1 micrometer or 0.5 micrometers along the same plane.

[0090] Figure 1 This is a side sectional view of the sensing connector 1 according to some embodiments of the present invention. The sensing connector 1 includes a body 10 and terminals 20. The body 10 is made of insulating materials such as polyethylene (PE), polypropylene (PP), polyvinyl chloride (PVC), polycarbonate (PC), polyethylene terephthalate (PET), polystyrene (PS), polyolefin (PO), polyimide (PI), polyurethane (PU), polyethylene naphthalate (PEN), polyethersulfone (PES), ethylene vinyl acetate (EVA), glass plate, ceramic, glass fiber (FR-4), polyester, bakelite, etc., or any combination of the above materials. Terminal 20 is a malleable conductive material, including copper, brass, phosphor bronze, iron, stainless steel, carbon, or any combination of the above materials. Furthermore, the surface of terminal 20 may undergo surface treatments such as nickel plating, tin plating, chromium plating, palladium plating, or gold plating. The manufacturing process of terminal 20 may include, but is not limited to, blanking stamping, bending, cutting and pressing, injection molding, and embedding injection molding.

[0091] In some embodiments, the body 10 has a top cover 12 and a base 14. The top cover 12 and the base 14 are separate from each other. Figure 1 As shown, the upper cover 12 and the base 14 are connected on one side, but not on the opposite side. The upper cover 12 has a protrusion 12P on the side not connected to the base 14, which is separate from the base 14, forming an opening 15. The upper cover 12 and the protrusion 12P can be an integrally formed structure or a structure combining two independent components. The size of the opening 15 depends on the distance between the upper surface S1 of the base 14 and the lower surface S2 of the protrusion 12P. This invention does not limit the position of the protrusion 12P relative to the upper surface S1; the protrusion S1 can be aligned with the opening 15, or it can be positioned at any position on the upper surface S1 of the receiving groove 16 to accommodate the test piece. The opening 15 is used to receive one or more test pieces 30 inserted into the sensing connector 1 along direction D10 or to remove one or more test pieces 30 from the sensing connector 1 along direction D20.

[0092] The body 10 has an internal receiving groove 16 located between the upper cover 12 and the base 14, with a height H100 of less than 4 millimeters (mm). Terminals 20 are disposed in the receiving groove 16, and the number of terminals 20 can be at least one or more. That is, the receiving groove 16 of the body 10 can accommodate multiple terminals 20, each terminal 20 can have the same or different shapes or materials, and each terminal 20 can be formed using the same or different processes. The number of terminals 20 corresponds to the electrode group (not shown) of the test piece 30 and is used for electrical connection with the test piece 30.

[0093] Figure 2 This is a perspective view of terminal 20 according to some embodiments of the present invention. (See reference) Figure 1 and Figure 2 Terminal 20 can be divided into an outer terminal 20A and an inner terminal 20B. In some embodiments, terminal 20 has a fixing part 21, a connecting arm 22, a buffer member 23, a first arm 24, a contact part 25, a second arm 26, and a limiting part 27. The following describes each part of terminal 20 in further detail.

[0094] The fixing part 21 is fixedly connected to a portion of the body 10. In some embodiments, the fixing part 21 is connected to the body 10 or the protrusion 12P by means of snaps, screws, adhesives, welding, and embedding, or / and any suitable means. In some embodiments, the fixing part 21 is fitted to one side of the protrusion 12P and located at the opening 15. Except for the fixing part 21 and part of the connecting arm 22, the remaining parts of the terminal 20 do not contact the protrusion 12P. The fixing part 21 is the substantially stationary part of the terminal 20. In some embodiments, the terminal 20 is disposed on the body 10 by means of the fixing part 21.

[0095] The connecting arm 22 is connected to the fixing part 21 and extends toward the receiving groove 16. A portion of the connecting arm 22 abuts against the lower surface S2 of the protrusion 12P. In some embodiments, the connecting arm 22 is horizontal near the opening 15, parallel to the lower surface S2 and abutting against the lower surface S2 of the protrusion 12P. In some embodiments, at least a portion of the connecting arm 22 is a straight arm and is substantially perpendicular to the fixing part 21. In such embodiments, due to the elasticity of the connecting arm 22, the inclined portion of the connecting arm 22 can produce slight up-and-down offsets or bends along a retention distance of height H1. In other embodiments, the terminal 20 is fixed to the side of the fixing part 21 away from the opening 15 and near the receiving groove 16. In some embodiments, the fixing part 21 may be rectangular, circular, or any other shape in cross-sectional view.

[0096] The buffer member 23 is connected to the connecting arm 22 and has a bent portion and a buffer section; the number of bent portions and buffer sections is not limited. Furthermore, this invention does not limit the length ratio between the first bent portion 231, the second bent portion 232, and the buffer section 233. Figure 2 As shown, the buffer member 23 has a first bend 231, a second bend 232, and a buffer segment 233, which connects the first bend 231 and the second bend 232. In some embodiments, the buffer segment 233 is a straight or nearly straight structure, while the first bend 231 and the second bend 232 have an arc or a bent structure. The first bend 231 has a first angle θ1 located inside the terminal 20B, and the second bend 232 has a second angle θ2 located inside the terminal 20B. In some embodiments, the sum of the first angle θ1 and the second angle θ2 is between 90° and 180° (i.e., 90° < θ1 + θ2 ≤ 180°). In some embodiments, the bending directions of the first bend 231 and the second bend 232 are the same, that is, the first angle θ1 and the second angle θ2 are defined on both sides of the buffer segment 233 and are both located inside the terminal 20B. The magnitudes of the first angle θ1 and the second angle θ2 can be the same or different. Since the sum of the first angle θ1 and the second angle θ2 is between 90° and 180°, the terminal 20 exhibits an inwardly extending structure, which reduces the overall volume of the terminal 20. Furthermore, it reduces or prevents deformation caused by excessive angles when the terminal 20 is under stress (e.g., when the test piece 30 contacts the terminal 20). The buffer section 233 of the terminal 20 of this invention has a straight structure, which provides stronger support compared to the first bend 231 and the second bend 232 of the arc structure. When the terminal 20 is under stress, the first bend 231 and the second bend 232 deform, and the buffer section 233 can evenly distribute the stress between the first bend 231 and the second bend 232, thereby increasing the elasticity and structural strength of the terminal 20.

[0097] The first arm 24 is connected to the buffer member 23 and extends from the end of the second bend 232 of the buffer member 23. The connecting arm 22 is above the first arm 24. In some embodiments, the first arm 24 is a straight arm. In some embodiments, the extending direction of the first arm 24 is different from the extending direction of the connecting arm 22. In some embodiments, the extending direction of the first arm 24 is not parallel to the extending direction of the connecting arm 22.

[0098] The contact portion 25 is connected to the first arm 24. In some embodiments, the contact portion 25 has a bent structure, presenting, for example, a "V" shape, a "U" shape, a "ㄩ" shape, or a "W" shape. However, this utility model is not limited to the above structures; any shape that allows the contact portion 25 to contact the electrode of the test piece is within the scope of protection of the contact portion 25 claimed by this utility model. In some embodiments, the bending direction of the contact portion 25 is the same as the bending direction of the first bent portion 231 and the bending direction of the second bent portion 232. The bottom end of the contact portion 25 is close to the upper surface S1 of the base 14. In some embodiments, before the test piece 30 is inserted into the receiving groove 16 of the body 10, the contact portion 25 is in contact with the upper surface S1 of the base 14. In another embodiment, before the test piece 30 is inserted into the receiving groove 16 of the body 10, the contact portion 25 is not in contact with the upper surface S1 of the base 14 and has a certain amount of suspension space.

[0099] The second arm 26 is connected to the contact portion 25, and the first arm 24 is connected to the second arm 26 via the contact portion 25. That is, one end of the contact portion 25 is connected to the first arm 24, and the other opposite end is connected to the second arm 26. In some embodiments, the second arm 26 is a straight arm. In other embodiments, the second arm 26 is a bent arm, an arm with an arc or serrations, or an irregular shape; however, the shape of the second arm 26 is not limited to the aforementioned shapes. In some embodiments, the extension direction of the second arm 26 is different from the extension direction of the first arm 24. In some embodiments, the extension direction of the second arm 26 is not parallel to the extension direction of the first arm 24. In some embodiments, the extension direction of the second arm 26 is different from the extension direction of the connecting arm 22. In some embodiments, the extension direction of the second arm 26 is not parallel to the extension direction of the connecting arm 22. In some embodiments, the first arm 24, the contact portion 25, and the second arm 26 form a bent structure, exhibiting, for example, a "V" shape or a "U" shape.

[0100] The limiting portion 27 is connected to the second arm 26, and the extending direction of the limiting portion 27 is different from that of the second arm 26. In some embodiments, the extending direction of the limiting portion 27 is not parallel to the extending direction of the second arm 26. In some embodiments, the limiting portion 27 is connected to the second arm 26 via a third bend 27C. The second arm 26 and the limiting portion 27 have, for example, a "V" shape or a "U" shape. In another embodiment, the limiting portion 27 has a two-segment structure. For example, the limiting portion 27 has only a first segment 271 and a second segment 272. In some embodiments, the limiting portion 27 has a straight segment without a bend. In some embodiments, the connecting arm 22 is used to resist and limit the movement of the limiting portion 27. In some embodiments, when the test piece 30 is inserted into the receiving groove 16 of the body 10, at least a portion of the limiting portion 27 will contact the connecting arm 22.

[0101] In some embodiments, there is a linear distance d1 between the end of the limiting portion 27 and the buffer member 23, such that a buffer space 28 is formed between the first bend 231, the buffer segment 233, and the second bend 232. In some embodiments, the buffer space 28 is located inside the terminal 20B. The buffer space 28 prevents the limiting portion 27 from pressing against the buffer member 23 when the test piece 30 is inserted into the receiving groove 16 of the body 10.

[0102] When the test piece 30 is inserted into the receiving groove 16 of the body 10, the contact part 25 is pushed upward by the test piece 30 and moves towards the buffer space 28, so that the contact part 25 is less likely to squeeze other parts of the terminal 20, reducing the possibility of deformation of the terminal 20 due to squeezing.

[0103] Figure 3 This is a side sectional view of the terminal 20 in an unstressed state, according to some embodiments of the present invention. In some embodiments, the second arm 26 of the terminal 20 is adapted to contact the test piece 30 and serve as the initiation point for the terminal 20 to be stressed. The second arm 26 of the terminal 20 is typically the part of the terminal 20 that first contacts the test piece 30; that is, when the test piece 30 is inserted into the receiving groove 16 of the body 10, the end edge of the test piece 30 first contacts the second arm 26, causing various parts of the terminal 20 to begin to be stressed. Therefore, the second arm 26 can be referred to as the driving element of the terminal 20. However, the shape and structure of the driving element are not limited to the shape and structure of the second arm 26. The driving element can be other parts of the terminal 20, as long as it can achieve the effect of causing the terminal 20 and the test piece 30 to make initial contact and initiating the stress on the terminal 20, it is a driving element within the scope of protection of the present invention.

[0104] Since the test piece 30 inserted into the receiving groove 16 may have different thicknesses, when the test piece 30 is inserted into the receiving groove 16, the test piece 30 may contact different positions of the second arm 26, thus creating different driving points. In some embodiments, the thickness of the test piece 30 is less than or equal to the vertical distance H2 between the third bend 27C and the upper surface S1.

[0105] When terminal 20 is in an unloaded state, such as Figure 3As shown, the line connecting the first bend 231 of the buffer member 23 and a point on the second arm 26 is used as the force reference line L10. In some embodiments, the force reference line L10 is substantially parallel to the first arm 24. The second arm 26 can be divided into a front drive section 291 and a rear drive section 292 by the force reference line L10. The second arm 26 below the force reference line L10 and closer to the contact portion 251 is the front drive section 291, and the second arm 26 above the force reference line L10 and farther away from the contact portion 25 is the rear drive section 292. The front drive section 291 has a front drive point 29A, and the rear drive section 292 has a rear drive point 29B. The front drive point 29A and the rear drive point 29B are not fixed points, but are the points where test pieces 30 of different thicknesses first come into contact with the front drive section 291 and the rear drive section 292, respectively. The front drive point 29A is closer to the contact portion 25 than the rear drive point 29B, and the vertical distance H10 between the front drive point 29A and the upper surface S1 is smaller than the vertical distance H20 between the rear drive point 29B and the upper surface S1. Therefore, test pieces 30 of different thicknesses will contact the front drive point 29A or the rear drive point 29B at different vertical heights, resulting in different force distribution states for the drive terminal 20.

[0106] In the following figures, thin specimen 32 and thick specimen 34 are used to represent specimens 30 of different thicknesses. In some embodiments, thin specimen 32 refers to a specimen with a thickness of less than or equal to 0.34 mm, while thick specimen 34 refers to a specimen with a thickness greater than 0.34 mm. The lengths and thicknesses of thin specimen 32 and thick specimen 34 in the following figures are for illustrative purposes only.

[0107] Figures 4 to 6 This is a schematic diagram showing the force distribution of the terminal 20 during the insertion of the thin test piece 32 into the sensing connector 1 according to some embodiments of the present invention.

[0108] refer to Figure 4 When the user inserts the thin test piece 32 into the receiving slot 16 of the body 10, the end edge of the thin test piece 32 contacts the driving front section 291 of the terminal 20. At the instant of contact, the front driving point 29A senses an external force R1, causing the entire terminal 20 to begin to bear force. In some embodiments, the direction of the external force R1 is approximately parallel to the direction of the force reference line L10. At this time, the driving buffer member 23 senses the stress generated by the thin test piece 32.

[0109] refer to Figure 5The thin test piece 32 is further inserted into the receiving groove 16 of the body 10 and contacts the contact portion 25. At this time, the electrode group on the thin test piece 32 is electrically connected to the terminal 20 through the contact portion 25. Due to the thickness of the thin test piece 32, when the terminal 20 is subjected to force, the portion of the terminal 20 other than the fixing portion 21 and the horizontal portion of the connecting arm 22 will be lifted. At this time, the connecting arm 22 bends slightly upward about the corner 120P of the protrusion 12P as the fulcrum, at a height H1 (see Figure 1 Within the retention distance range, the absorber thin sample 32 pushes the terminal 20 upward by the amount of displacement.

[0110] refer to Figure 5 An enlarged view of the contact portion 25 of the middle terminal 20. The connecting arm 22 is slightly bent upwards, thus maintaining a taut state under stress. Section R10 shows the stress distribution on the connecting arm 22, with a gradient of black and gray indicating the magnitude of the stress; darker areas indicate greater stress, and lighter areas indicate less stress. Because the connecting arm 22 cannot rotate at the connection point with the fixing portion 21, section R10 experiences the greatest stress near the corner 120P. Along the connecting arm 22 towards the buffer member 23, the stress experienced in section R10 gradually decreases with increasing distance from the corner 120P.

[0111] refer to Figure 6 When the thin test piece 32 is further inserted into the end of the receiving groove 16 of the body 10 and cannot move, the connecting arm 22 will share the stress on the buffer member 23. Since the thin test piece 32 is the front driving point 29A of the contact drive front section 291, the direction of the force at the front driving point 29A corresponds to the force range of the buffer member 23, that is, the direction of the external force R1 points towards the buffer member 23. Therefore, the buffer member 23 will share part of the force transmitted from the connecting arm 22, as shown in section R12. At the same time, since the first arm 24 extends from the buffer member 23, the buffer member 23 can also transmit part of the force to the first arm 24.

[0112] refer to Figure 6An enlarged view of the buffer member 23 of the middle terminal 20 shows that darker areas indicate greater stress, while lighter areas indicate less stress. It can be observed that the dark gray gradient on section R12 is relatively evenly distributed across the first bend 231, buffer section 233, and second bend 232, unlike the dark gray gradient on section R10 which is concentrated near the corner 120P. This stress distribution indicates that the buffer member 23 shares part of the stress on the connecting arm 22 by distributing the force across the first bend 231, buffer section 233, and second bend 232, and even across the first arm 24. Since the first bend 231 and the second bend 232 are respectively connected to both sides of the buffer section 233, the first bend 231 and the second bend 232 are spatially separated. When the terminal 20 is compressed under force, the buffer section 233 makes the first bend 231 and the second bend 232 form a discontinuous force structure, which can effectively distribute the force of the buffer section 233 to the first bend 231 and the second bend 232, forming a more even distribution of force.

[0113] Furthermore, since the buffer section 233 is a straight-arm structure, it has stronger support compared to the first bend 231 and the second bend 232 of the arc structure. When the terminal 20 is subjected to force, the first bend 231 and the second bend 232 deform, and the buffer section 233 can evenly distribute the force between the first bend 231 and the second bend 232, thereby increasing the elasticity and structural strength of the terminal 20 to resist deformation.

[0114] Figure 7 and Figure 8 This is a schematic diagram of the force distribution of terminal 20 during the process of removing the thin test piece from the sensing connector 1, according to some embodiments of the present invention.

[0115] refer to Figure 7 When the user slowly pulls the thin test piece 32 away from the receiving groove 16 of the body 10 along the direction D20 opposite to the direction D10 against the upper surface S1, the stress in the section R12 (i.e. the terminal 20 near the buffer member 23 and the first arm 24) will be released first.

[0116] refer to Figure 8 As the thin test piece 32 ceases to contact the terminal 20, the stress on section R10 will gradually be released until the terminal 20 returns to its original shape and position.

[0117] Figures 9 to 10 This is a schematic diagram showing the force distribution of the terminal 20 during the insertion of the thick test piece 34 into the sensing connector 1 according to some embodiments of the present invention.

[0118] refer to Figure 9When the user inserts the thick test piece 34 into the receiving slot 16 of the body 10, the end edge of the thick test piece 34 contacts the driving rear section 292 of the terminal 20. At the instant of contact, the rear driving point 29B is subjected to an external force L1, causing the entire terminal 20 to begin to bear force. In some embodiments, the direction of the external force L1 is approximately parallel to the direction of the force reference line L1. In some embodiments, the direction of the external force L1 is approximately parallel to the extension direction of the first arm 24.

[0119] refer to Figure 10 When the thick test piece 34 is further inserted into the receiving groove 16 of the body 10 and contacts the contact portion 25, the electrode assembly on the thick test piece 34 is electrically connected to the terminal 20 through the contact portion 25. Due to the thickness of the thick test piece 34, when the terminal 20 is subjected to force, the portion of the terminal 20 other than the horizontal portion of the fixing portion 21 and the connecting arm 22 will be lifted. At this time, the connecting arm 22 bends upward with the angle 120P of the protrusion 12P as the fulcrum. Due to the thickness of the thick test piece 34, the amount of upward movement of the terminal 20 has exceeded the height H1 formed by the tilt of the connecting arm 22 (see...). Figure 1 Within the retention distance range, the inclined portion of the connecting arm 22 will continue to be raised upwards. Since the connecting arm 22 cannot rotate at the connection point with the fixing part 21, the section R20 of the connecting arm 22 near the corner 120P of the terminal 20 will be subjected to stress.

[0120] Since the thick test piece 34 is the rear drive point 29B of the contact drive rear section 292, the force direction of the rear drive point 29B corresponds to the force range of the connecting arm 22. That is, the direction of the external force L1 points towards the connecting arm 22, so the external stress is mainly borne by the connecting arm 22. At this time, the buffer member 23 will share part of the stress from the connecting arm 22. At the same time, since the first arm 24 extends from the buffer member 23, the buffer member 23 can also transfer part of the force to the first arm 24, for example, to the front section of the first arm 24, such as section R22.

[0121] refer to Figure 10 An enlarged view of the buffer member 23 of the middle terminal 20 shows that darker colors indicate greater force and lighter colors indicate less force. It can be observed that the black-gray gradient on section R22 is relatively evenly distributed from the buffer member 23 to the first arm 24, unlike the black-gray gradient on section R20 which is concentrated on the side near the corner 120P.

[0122] refer to Figure 11When the thick specimen 34 is inserted into the receiving groove 16 of the body 10 until it can no longer move, the connecting arm 22 is raised to its highest point, at which point the section R20 of the connecting arm 22 near the corner 120P experiences the greatest stress. In some embodiments, the second arm 26 is almost parallel to the thick specimen 34 at this point. In some embodiments, the entirety or part of the second arm 26 is in contact with the thick specimen 34 at this point.

[0123] refer to Figure 11 Enlarged view of the buffer member 23 of the middle terminal 20. From Figure 11 It can be observed that even when the thick test piece 34 is inserted into the body 10 until it cannot be moved, the black color on the section R22 is still relatively evenly distributed in the range from the buffer member 23 to the first arm 24.

[0124] Figure 12 and Figure 13 This is a schematic diagram showing the force distribution of terminal 20 during the process of removing the thick test piece 34 from the sensing connector 1, according to some embodiments of the present invention.

[0125] refer to Figure 12 When the user slowly pulls the thick test piece 34 away from the body 10 along the direction D20 opposite to the direction D10 against the upper surface S1, the connecting arm 22 descends, the stress on the section R20 is reduced, and some of the stress is distributed to the buffer member 23 and the first arm 24.

[0126] refer to Figure 13 As the thick test piece 34 ceases to contact the terminal 20, the stress on section R20 gradually dissipates until the portion of the terminal 20, excluding the horizontal portion of the fixing part 21 and the connecting arm 22, returns to its original position, and the contact part 25 contacts the upper surface S1 of the base 14. In some embodiments, when the thick test piece 34 is withdrawn, the test piece 30 causes the terminal 20 to move downwards and outwards from the opening 15. The limiting part 27 abuts against and supports the connecting arm 22 to prevent the connecting arm 22 from descending beyond its movement limit (e.g., exceeding the retention distance range of height H1) due to the withdrawal of the thick test piece 34, thus avoiding deformation of the terminal 20. Because test pieces of different thicknesses and different trigger points produce different deformation effects, this invention can prevent deformation of the terminal 20.

[0127] Figures 14 to 18 The diagram illustrates the insertion of a double-layer test piece 36 into a sensing connector 1A according to some embodiments of the present invention. The sensing connector 1A is similar to... Figure 1 The sensing connector 1 in the middle is the same as the one mentioned above, and for the sake of simplicity, the same components will not be described again. The double-layer test piece 36 includes a lower test piece 33 and an upper test piece 35 disposed on the lower test piece 33. Figures 14 to 18The displayed sensing connector 1A has two or more terminals 20, which are used for electrical connection of the lower test piece 33 and the upper test piece 35, respectively. Figure 14 This is the state before inserting the double-layered specimen 36. (Reference) Figure 15 and Figure 16 When the double-layer test piece 36 is inserted, the lower test piece 33 first contacts the front drive point 29A and causes the terminal 20 to begin to bear force, similar to... Figures 4 to 6 The diagram shows the force applied to terminal 20 during the insertion of the thin test piece 32 into the sensing connector 1.

[0128] refer to Figure 17 As the double-layer test piece 36 continues to advance, until the upper test piece 35 contacts the rear drive point 29B and causes the terminal 20 to begin to be subjected to another force, similar to... Figures 9 to 11 The diagram illustrates the force exerted on terminal 20 during the insertion of the thick test piece 34 into the biosensor connector 1. Specifically, when the double-layer test piece 36 is inserted, the front drive point 29A and the rear drive point 29B are driven sequentially. Therefore, regardless of the type of test piece inserted, the second arm 26 can drive terminal 20 to exhibit different force states within its elastic limits, thereby stabilizing the contact between the contact portion 25 of terminal 20 and the electrode assembly on the test piece. This prevents wear caused by mutual contact between terminal 20 and the electrode assembly, further stabilizing the current impedance of the signal and reducing signal errors in the measurement results.

[0129] This invention also provides different sensing connectors in other embodiments. The sensing connector may have at least two terminals to form a circuit with the electrode assembly of the test piece, such as a first terminal and a second terminal. However, this invention does not limit the number of terminals, only requiring a circuit suitable for the actual measurement. In some embodiments, the first and second terminals can be used to measure different items, for example, for blood glucose measurement, and the second terminal for interference measurement. In some embodiments, the first and second terminals can be combined for blood glucose measurement through the circuit settings of the sensing connector.

[0130] In some embodiments, the extension directions of the first terminal and the second terminal are the same in all directions (up, down, left, and right). In some embodiments, the extension directions of the first terminal and the second terminal are opposite in all directions (up, down). In some embodiments, the extension directions of the first terminal and the second terminal are opposite in all directions (left, right).

[0131] The first terminal has a first contact portion, and the second terminal has a second contact portion. In some embodiments, the first contact portion and the second contact portion may be configured to contact the same side, for example, the same side of the test piece. In some embodiments, the first contact portion and the second contact portion may be configured to contact different sides, for example, opposite sides of the test piece. For instance, when electrode groups are configured on both sides of a test piece, the first contact portion and the second contact portion of the sensing connector can respectively correspond to and contact the electrode groups located on both sides of the test piece.

[0132] The configurations of the first and second terminals can be the same or different. The number and arrangement of terminals can be designed and adjusted according to actual needs, such as adjusting the terminal height, orientation, or arrangement.

[0133] The terminal of this invention has a portion for receiving test pieces to drive the terminal movement. When receiving test pieces of different thicknesses, it contacts different driving points to drive the terminal movement. Different driving points drive the terminal to move within its elastic limit and exhibit different stress states. Therefore, regardless of whether a thick test piece, a thin test piece, or a double-layered test piece with two sections of different thicknesses is inserted, the terminal can be driven to exhibit different stress states, effectively dispersing the force and stabilizing the contact between the contact portion and the electrode assembly on the test piece. This stabilizes the current impedance of the signal and improves measurement accuracy. Furthermore, because the terminal's buffer component has multiple bends in the same direction, it not only disperses the force and reduces the overall volume, but also connects multiple bends through a buffer section to form a discontinuous buffer structure. This allows the buffer component to bear force evenly and simultaneously improves structural strength or compressive resistance.

[0134] The above embodiments are merely illustrative of the implementation methods of this utility model and to explain its technical features, and are not intended to limit the scope of protection of this utility model. Any changes or equivalent arrangements that can be easily made by those skilled in the art are within the scope of this utility model, and the scope of protection of this utility model shall be determined by the claims.

[0135] While this disclosure and its advantages have been described in detail, it should be understood that various changes, substitutions, and alternatives can be made without departing from the spirit and scope of this disclosure as defined in the claims. Furthermore, the scope of this application is not limited to the specific embodiments of the processes, machinery, manufacturing, material compositions, means, methods, and steps described in the specification. Those skilled in the art will understand from the content of this disclosure that existing or future processes, machinery, manufacturing, material compositions, means, methods, or steps that have the same function or achieve substantially the same results as the corresponding embodiments described herein can be used in accordance with this disclosure. Accordingly, such processes, machinery, manufacturing, material compositions, means, methods, or steps are included within the scope of the claims of this application.

Claims

1. A sensing connector, characterized by, include: The body has an opening and a receiving groove located within the opening; as well as A first terminal, disposed in the receiving groove, includes: The fixing part is connected to the body; and A connecting arm is attached to the fixing part and extends from the opening toward the receiving groove; and A buffer member, connected to the connecting arm, has: First bend; The second bend; and A buffer section is located between the first bend and the second bend; The first arm is connected to the buffer member and extends along the first direction; Contact portion, connected to the first arm; and The second arm is connected to the contact portion, wherein The first terminal has a force reference line passing through the first bend and the second arm, the force reference line being parallel to the first arm, the second arm being the drive front section between the force reference line and the contact portion, and the remaining part of the second arm being the drive rear section.

2. The sensing connector of claim 1, wherein, The second arm extends along a second direction, which is different from the first direction.

3. The sensing connector of claim 1, wherein, The first bend and the second bend have the same bending direction.

4. The sensing connector of claim 1, wherein, It further includes a limiting part, which is connected to the second arm and separate from the connecting arm and the buffer member.

5. The sensing connector of claim 1, wherein, The first bend has a first angle, and the second bend has a second angle.

6. The sensing connector of claim 5, wherein, The sum of the first angle and the second angle is between 90° and 180°.

7. The sensing connector of claim 1, wherein, The front section of the drive faces the buffer member, and the rear section of the drive faces the connecting arm.

8. The sensing connector of claim 1, wherein, It further includes a second terminal disposed in the receiving groove, wherein the configuration of the second terminal is the same as or different from that of the first terminal.

9. The sensing connector of claim 8, wherein, The extension direction of the first terminal is opposite to that of the extension direction of the second terminal.

10. The sensing connector of claim 1, wherein, The height of the receiving slot is less than 4 mm.

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