High-temperature test oven for testing semiconductor photovoltaic diode

Abstract

The utility model discloses a high-temperature test oven for testing a semiconductor photovoltaic diode, which comprises an oven body, an oven door is rotatably connected inside the oven body, an outer gear ring is fixedly connected outside the oven door, a gear is rotatably connected inside the oven body, and the gear is meshed with the outer gear ring. According to the high-temperature test drying oven for testing the semiconductor photovoltaic diode, when the oven door is opened, the oven door can drive an outer gear ring to rotate, the outer gear ring drives a gear to rotate, the gear drives a second sliding rod to slide in a second sliding groove in a movable plate till the oven door is opened to a certain degree, and along with continuous opening of the oven door, the second sliding rod makes contact with the inner wall of the second sliding groove; and the movable plate drives the swing plate to rotate through the first sliding rod and the first sliding groove, and the swing plate drives the placement frame to automatically extend outwards through the first sliding groove and the third sliding rod, so that a tester can take and place elements such as diodes and the like more conveniently, a handle does not need to extend into the box body, and the tester is prevented from being scalded.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and more specifically, to a high-temperature test oven for testing semiconductor photovoltaic diodes. Background Technology

[0002] A semiconductor photovoltaic diode is an electronic device that converts light energy into electrical energy, commonly known as a photodiode. It utilizes the characteristics of a PN junction to generate photogenerated carriers under illumination, thereby forming a current and realizing the conversion of optical signals into electrical signals.

[0003] In the production and testing of semiconductor photovoltaic diodes and other components, high-temperature testing ovens are required. The diodes and other components need to be placed on racks inside the testing oven, and the high-temperature test is carried out after the oven door is closed. After the test, the temperature inside the testing oven is very high, possibly between 125°C and 150°C. Therefore, testers may get burned if they put their hands directly inside to take them out. Therefore, we provide a high-temperature testing oven for testing semiconductor photovoltaic diodes. Utility Model Content

[0004] The purpose of this invention is to provide a high-temperature test oven for testing semiconductor photovoltaic diodes, in order to solve the problems mentioned in the background art.

[0005] In the production and testing of semiconductor photovoltaic diodes and other components, high-temperature testing is required using an oven. The diodes and other components need to be placed on racks inside the oven, and the oven door is closed before the high-temperature test is performed. After the test, the temperature inside the oven is very high, possibly between 125°C and 150°C. Therefore, if the test personnel put their hands directly inside to take them out, they may get burned.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A high-temperature test oven for testing semiconductor photovoltaic diodes includes a chamber body. An oven door is rotatably connected inside the chamber body. An external gear ring is fixedly connected to the outside of the oven door. A gear is rotatably connected inside the chamber body, meshing with the external gear ring. A swing plate is rotatably connected inside the chamber body. A first sliding groove is formed inside the swing plate. A first sliding rod is slidably connected inside the first sliding groove. A movable plate is fixedly connected to the top of the first sliding rod. A second sliding groove is formed inside the movable plate. A second sliding rod is slidably connected inside the second sliding groove and fixedly connected to the gear. A third sliding rod is slidably connected inside the first sliding groove. A placement rack is fixedly connected to the outside of the third sliding rod.

[0008] Preferably, there are two external gear rings, and the two external gear rings are symmetrically distributed.

[0009] Preferably, the placement rack has a first groove inside, and a first fixing rod is slidably connected inside the first groove, and the first fixing rod is fixedly connected to the box body.

[0010] Preferably, a spring is provided between the first fixing rod and the first groove, one end of the spring is fixedly connected to the first fixing rod, and the other end of the spring is fixedly connected to the placement frame.

[0011] Preferably, the movable plate has a second groove inside, and a second fixing rod is slidably connected inside the second groove, and the second fixing rod is fixedly connected to the box body.

[0012] Preferably, a support plate is fixedly connected to the outside of the door, and the support plate is fixedly connected to the outer gear ring.

[0013] Compared with the prior art, the beneficial effects of this utility model are:

[0014] When the enclosure door is opened, the door will drive the external gear ring to rotate, which in turn drives the gear to rotate. The gear then drives the second slide rod to slide within the second groove on the movable plate until the enclosure door is opened to a certain extent. As the enclosure door continues to open, the second slide rod contacts the inner wall of the second groove and drives the movable plate to move. The movable plate drives the swing plate to rotate via the first slide rod and the first groove. The swing plate drives the placement rack to automatically extend outward via the first groove and the third slide rod, making it more convenient for testers to handle components such as diodes without having to put their hands inside the enclosure, thus avoiding burns. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of the box door before it is opened.

[0016] Figure 2 This is a schematic diagram of the structure of the box door after it is opened.

[0017] Figure 3 This is a schematic diagram of the external gear ring of this utility model.

[0018] Figure 4 This is a schematic diagram of the structure of the movable plate of this utility model.

[0019] Figure 5 This is a cross-sectional view of the placement rack of this utility model.

[0020] Figure 6 This is a cross-sectional schematic diagram of the movable plate of this utility model.

[0021] The following are the labels in the diagram: 1. Box body; 2. Box door; 3. Placement rack; 4. External gear ring; 5. Gear; 6. Movable plate; 7. Second slide groove; 8. Second slide rod; 9. Swing plate; 10. First slide groove; 11. First slide rod; 12. Third slide rod; 13. First groove; 14. First fixing rod; 15. Spring; 16. Second groove; 17. Second fixing rod; 18. Support plate. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] Please see Figures 1 to 6 A high-temperature test oven for testing semiconductor photovoltaic diodes includes a chamber body 1. A door 2 is rotatably connected inside the chamber body 1. An external gear ring 4 is fixedly connected to the outside of the door 2. A gear 5 is rotatably connected inside the chamber body 1, meshing with the external gear ring 4. A swing plate 9 is rotatably connected inside the chamber body 1. A first sliding groove 10 is formed inside the swing plate 9. A first sliding rod 11 is slidably connected inside the first sliding groove 10. A movable plate 6 is fixedly connected to the top of the first sliding rod 11. A second sliding groove 7 is formed inside the movable plate 6. When the gear 5 drives the second sliding rod 8 to rotate, the second sliding rod 8 will first slide in the second sliding groove 7, while the movable plate 6 remains stationary. The device moves until the door 2 is opened to a certain extent to prevent the placement rack 3 from colliding with the door 2 during the opening process. The second slide bar 8 is slidably connected inside the second slide groove 7 and is fixedly connected to the gear 5. The third slide bar 12 is slidably connected inside the first slide groove 10 and is fixedly connected to the placement rack 3 outside the third slide bar 12. The diode to be tested is placed on the placement rack 3. When the door 2 is opened, the placement rack 3 can automatically extend from the box body 1. After the door 2 is opened, although the outer gear ring 4 and the gear 5 will separate, the position of the placement rack 3 will not continue to change after it is fully extended. Therefore, it will not affect the re-meshing of the outer gear ring 4 and the gear 5 when the door 2 is closed.

[0024] Furthermore, there are two external gear rings 4, which are symmetrically distributed. The external gear rings 4 and other accessories are distributed vertically.

[0025] Furthermore, the placement rack 3 has a first groove 13 inside, and a first fixing rod 14 is slidably connected inside the first groove 13. The first fixing rod 14 is fixedly connected to the box body 1 and supports and limits the placement rack 3.

[0026] Furthermore, a spring 15 is provided between the first fixing rod 14 and the first groove 13. One end of the spring 15 is fixedly connected to the first fixing rod 14, and the other end of the spring 15 is fixedly connected to the placement rack 3. The spring 15 makes the placement rack 3 have an automatic tendency to move outward, which is beneficial for the placement rack 3 to extend better from the box body 1 when the box door 2 is opened.

[0027] Furthermore, a second groove 16 is provided inside the movable plate 6, and a second fixing rod 17 is slidably connected inside the second groove 16. The second fixing rod 17 is fixedly connected to the box body 1 and supports and limits the movable plate 6.

[0028] Furthermore, a support plate 18 is fixedly connected to the outside of the door 2. The support plate 18 is fixedly connected to the outer gear ring 4. The support plate 18 is located between the outer gear ring 4 and the door 2. The support plate 18 connects and fixes the outer gear ring 4 to the door 2 to ensure the stability of the outer gear ring 4.

[0029] The usage steps of this utility model are as follows: When using this high-temperature test oven for testing semiconductor photovoltaic diodes, when the chamber door 2 is opened, because the center of the outer gear ring 4 is on the central axis of the rotating shaft between the chamber door 2 and the chamber body 1, the chamber door 2 will drive the outer gear ring 4 to rotate. The outer gear ring 4 drives the gear 5 to rotate. The gear 5 drives the second slide rod 8 to slide in the second slide groove 7 on the movable plate 6 until the chamber door 2 is opened to a certain extent. As the chamber door 2 continues to open, the second slide rod 8 contacts the inner wall of the second slide groove 7 and drives the movable plate 6 to move. The movable plate 6 drives the swing plate 9 to rotate through the first slide rod 11 and the first slide groove 10. The swing plate 9 drives the placement rack 3 to automatically extend outward through the first slide groove 10 and the third slide rod 12, which makes it more convenient for testers to pick up and put down components such as diodes, and also avoids the need to put their hands into the chamber body 1 to avoid being burned.

[0030] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. A high-temperature test oven for testing semiconductor photovoltaic diodes, comprising a cabinet (1), a cabinet door (2) is rotatably connected to the inside of the cabinet (1), characterized in that: An external gear ring (4) is fixedly connected to the outside of the box door (2). A gear (5) is rotatably connected to the inside of the box body (1). The gear (5) meshes with the external gear ring (4). A swing plate (9) is rotatably connected to the inside of the box body (1). A first slide groove (10) is provided inside the swing plate (9). A first slide rod (11) is slidably connected inside the first slide groove (10). A movable plate (6) is fixedly connected to the top of the first slide rod (11). A second slide groove (7) is provided inside the movable plate (6). A second slide rod (8) is slidably connected inside the second slide groove (7). The second slide rod (8) is fixedly connected to the gear (5). A third slide rod (12) is slidably connected inside the first slide groove (10). A placement rack (3) is fixedly connected to the outside of the third slide rod (12).

2. The high temperature test oven for testing semiconductor photovoltaic diodes according to claim 1, wherein: There are two external gear rings (4), and the two external gear rings (4) are symmetrically distributed.

3. The high temperature test oven for testing semiconductor photovoltaic diodes of claim 1, wherein: The placement rack (3) has a first groove (13) inside, and a first fixing rod (14) is slidably connected inside the first groove (13). The first fixing rod (14) is fixedly connected to the box body (1).

4. The high temperature test oven for testing semiconductor photovoltaic diodes of claim 3, wherein: A spring (15) is provided between the first fixing rod (14) and the first groove (13). One end of the spring (15) is fixedly connected to the first fixing rod (14), and the other end of the spring (15) is fixedly connected to the placement frame (3).

5. A high-temperature test oven for testing semiconductor photovoltaic diodes according to claim 1, characterized in that: The movable plate (6) has a second groove (16) inside, and a second fixing rod (17) is slidably connected inside the second groove (16). The second fixing rod (17) is fixedly connected to the box body (1).

6. The high temperature test oven for testing semiconductor photovoltaic diodes of claim 1, wherein: The box door (2) is fixedly connected to a support plate (18), and the support plate (18) is fixedly connected to the outer gear ring (4).

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