Quick release type semiconductor testing device support

Abstract

The utility model relates to the technical field of semiconductor testing, and discloses a quick release type semiconductor testing device support which comprises a testing device body, a limiting rail piece is fixedly installed on the side wall of the testing device body, the inner side of the limiting rail piece is connected with a sliding block in a sliding mode, and the sliding block is locked through elasticity. The outer side of the sliding block is fixedly provided with a connecting block extending out of the limiting rail piece, the other end of the connecting block is fixedly connected with a storage sleeve, the outer portion of the storage sleeve is slidably connected with a sliding frame extending to the upper portion of the storage sleeve, and the outer portion of the sliding frame is provided with a locking piece which extends to the inner side of the sliding frame and extrudes the storage sleeve; a hose communicating with the storage sleeve is arranged in the sliding frame, and an insertion drawer inserted into the storage sleeve is arranged outside the storage sleeve. The quick release type semiconductor test device support has the advantage that the collection point location can be conveniently changed according to the detected semiconductor element.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, specifically a quick-release semiconductor testing device bracket. Background Technology

[0002] Semiconductor testing is the process of detecting the performance and function of semiconductor devices or integrated circuits. It runs through the design verification, wafer inspection, and post-packaging testing stages of semiconductor manufacturing to ensure that products meet quality standards. Traditional semiconductor testing suffers from problems such as low efficiency, high cost, and difficulty in meeting the diverse testing needs of complex chips.

[0003] During the testing process of quick-release semiconductor testing equipment, the removed semiconductor devices usually need to be quickly stored. Existing storage methods usually involve storing them directly in containers. However, this storage method cannot be flexibly adjusted according to the size of the semiconductor devices, and it is easy for damage to occur during the collection process due to excessive drop height or incorrect drop center. Therefore, a quick-release semiconductor testing equipment bracket is proposed to solve the above-mentioned problems. Utility Model Content

[0004] (a) Technical problems to be solved

[0005] To address the shortcomings of existing technologies, this utility model provides a quick-release semiconductor testing device bracket, which has the advantage of being able to easily change the collection point according to the semiconductor device being tested. It solves the problem that during the testing process of the quick-release semiconductor testing device, the removed semiconductor devices usually need to be quickly stored. Existing storage methods usually involve directly storing them in containers. However, this storage method cannot be flexibly adjusted according to the size of the semiconductor device, and it is easy to cause damage during the collection process due to excessive drop height or incorrect drop center.

[0006] (II) Technical Solution

[0007] The technical solution of this utility model to solve the above-mentioned technical problems is as follows: A quick-release semiconductor testing device bracket includes a testing device body. A limiting track component is fixedly installed on the side wall of the testing device body. A sliding block that is elastically locked is slidably connected to the inner side of the limiting track component. A connecting block extending to the outside of the limiting track component is fixedly installed on the outer side of the sliding block. A storage sleeve is fixedly connected to the other end of the connecting block. A sliding frame extending above the storage sleeve is slidably connected to the outside of the storage sleeve. A locking component extending to the inner side of the sliding frame and pressing against the storage sleeve is provided on the outside of the sliding frame. A flexible tube communicating with the storage sleeve is provided inside the sliding frame. An insertion drawer inserted into the storage sleeve is provided outside the storage sleeve.

[0008] The beneficial effects of this utility model are:

[0009] This quick-release semiconductor testing device bracket has the advantage of allowing for easy adjustment of the collection point position according to the semiconductor device being tested.

[0010] Based on the above technical solution, the present invention can be further improved as follows.

[0011] Furthermore, the limiting track component includes a sliding track with a slot on its inner sidewall, an elastic sheet is fixedly installed on the side wall of the sliding track opposite to the slot, and a push plate that forms a compression with the sliding block is fixedly connected to the other end of the elastic sheet.

[0012] The beneficial effect of adopting the above-mentioned further solution is that this structure further clarifies that the limiting track component applies pressure to the sliding block through the elastic sheet and push plate, and achieves more precise and stable locking of the sliding block in conjunction with the slot, thereby enhancing the locking effect of the limiting track component on the sliding block.

[0013] Furthermore, the bottom and top of the sliding track are open, and the number of elastic sheets is multiple and they are arranged in an up-down array.

[0014] The beneficial effect of adopting the above-mentioned further solution is that the openings at the bottom and top of the sliding track can facilitate the separation of the sliding block, and the multiple elastic plates are arranged in an array above and below, making the compression of the sliding block more uniform and improving the stability of the locking.

[0015] Furthermore, the number of slots is multiple and they are arranged in an up-down array, and the sliding track engages with the sliding block through the slots.

[0016] The beneficial effect of adopting the above-mentioned further solution is that the multiple slots distributed in an upper and lower array increase the selection of the fixed position of the sliding block within the sliding track, thereby improving the flexibility and stability of the sliding block installation position.

[0017] Furthermore, the inner side of the plug-in drawer is provided with a plurality of inclined anti-collision plates that are connected in a downward inclination. The top of the inclined anti-collision plates is provided with a flexible pad. The bottom of the plug-in drawer is open. The outside of the plug-in drawer is plugged in with a material feeding plate that extends into its interior to close the opening.

[0018] The advantages of adopting the above-mentioned further solutions are that the inclined anti-collision plate and flexible pad can prevent items placed in the plug-in drawer from being damaged by collision, and the bottom opening combined with the setting of the material release plate facilitates the removal of semiconductor devices.

[0019] Furthermore, the locking component includes a spring fixedly connected to the outside of the sliding frame, a pulling block fixedly connected to the other end of the spring, and a T-shaped anti-slip block that is pressed against the storage sleeve fixedly connected to the end of the pulling block connected to the spring.

[0020] The beneficial effect of adopting the above-mentioned further solution is that the structural design of this locking component, through the cooperation of spring, pull block and T-shaped anti-slip block, achieves convenient and stable locking of the relative position of the sliding frame and the storage sleeve, which is easy to operate and has a good locking effect. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of this utility model;

[0022] Figure 2 This is an enlarged view of point A in the figure of this utility model;

[0023] Figure 3 This is a diagram showing the connection between the storage sleeve and the sliding frame of this utility model;

[0024] Figure 4 This is an enlarged view of section B in the figure of this utility model.

[0025] In the diagram: 1. Main body of the testing device; 2. Limiting track component; 21. Sliding track; 22. Elastic sheet; 23. Push plate; 3. Sliding block; 4. Connecting block; 5. Storage sleeve; 6. Sliding frame; 7. Locking component; 71. Spring; 72. Pull block; 73. T-shaped anti-slip block; 8. Flexible hose; 9. Plug-in drawer. Detailed Implementation

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0027] In the embodiments, by Figure 1-4 Provided is a quick-release semiconductor testing device bracket. The present invention includes a testing device body 1. A limiting track 2 is fixedly installed on the side wall of the testing device body 1. A sliding block 3 is slidably connected to the inner side of the limiting track 2 and is locked by elasticity. A connecting block 4 extending to the outside of the limiting track 2 is fixedly installed on the outer side of the sliding block 3. A storage sleeve 5 is fixedly connected to the other end of the connecting block 4. A sliding frame 6 extending above the storage sleeve 5 is slidably connected to the outside of the storage sleeve 5. A locking member 7 extending to the inner side of the sliding frame 6 and pressing against the storage sleeve 5 is provided on the outside of the sliding frame 6. A flexible tube 8 communicating with the storage sleeve 5 is provided inside the sliding frame 6. An insertion drawer 9 inserted into the storage sleeve 5 is provided outside the storage sleeve 5.

[0028] Furthermore, the limiting track component 2 includes a sliding track 21 with a slot on its inner sidewall. An elastic piece 22 is fixedly installed on the side wall of the sliding track 21 opposite to the slot. The other end of the elastic piece 22 is fixedly connected to a push plate 23 that forms a compression with the sliding block 3.

[0029] Furthermore, the bottom and top of the sliding track 21 are open, and the number of elastic pieces 22 is multiple and distributed in an up-down array.

[0030] Furthermore, there are multiple slots arranged in an up-down array, and the sliding track 21 engages with the sliding block 3 through the slots.

[0031] When the sliding block 3 slides within the sliding track 21, it can engage with slots at different positions, thus enabling the sliding block 3 to be stably engaged and fixed at different heights.

[0032] Furthermore, the inner side of the plug-in drawer 9 is provided with multiple inclined anti-collision plates that are connected in a downward tilt. The top of the inclined anti-collision plates is provided with a flexible pad. The bottom of the plug-in drawer 9 is open. The outside of the plug-in drawer 9 is plugged in with a material release plate that extends into its interior to close the opening.

[0033] When it is necessary to discharge the material in the plug-in drawer 9, simply remove the discharge plate.

[0034] Furthermore, the locking component 7 includes a spring 71 fixedly connected to the outside of the sliding frame 6, and a pull block 72 fixedly connected to the other end of the spring 71. A T-shaped anti-slip block 73 that is pressed against the storage sleeve 5 is fixedly connected to the end of the pull block 72 connected to the spring 71.

[0035] When it is necessary to change the relative position of the sliding frame 6 and the storage sleeve 5, the pull block 72 is pulled so that the T-shaped anti-slip block 73 no longer presses against the storage sleeve 5, thus preventing the relative movement of the limiter. After the movement is completed, the pull block 72 can be released and the elastic force of the spring 71 can be used to make the T-shaped anti-slip block 73 form a pressing force on the storage sleeve 5 again, thereby achieving locking.

[0036] Working principle:

[0037] When it is necessary to move the sliding block 3, the storage sleeve 5 can be pushed to disengage the sliding block 3 from the slot, allowing the storage sleeve 3 and the sliding block to slide freely up and down. When the sliding block 3 slides to the appropriate position within the limiting track 2, the storage sleeve 5 can be released, and the limiting track will lock it in place by spring force. When it is necessary to move the sliding frame to the appropriate position to ensure that the hose 8 can be effectively stored, the locking element 7 can be driven to prevent it from disengaging from the storage sleeve 5. At this time, the sliding frame can be slid directly to adjust its position. After the sliding frame 6 slides to the appropriate position, the locking element 7 can be released to restrict the position of the sliding frame 6 again, thereby fixing the position of the sliding frame 6. The hose 8 inside the sliding frame 6 is connected to the storage sleeve 5. When the semiconductor device falls, it can directly pass through the hose 8 to reach the inside of the insertion drawer 9 to complete the collection of the semiconductor device.

[0038] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0039] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A quick release semiconductor test device holder comprising a test device body (1) characterized by: The test device body (1) has a limiting track component (2) fixedly installed on its side wall. The inner side of the limiting track component (2) is slidably connected to a sliding block (3) that is locked by elasticity. The outer side of the sliding block (3) is fixedly installed with a connecting block (4) extending to the outside of the limiting track component (2). The other end of the connecting block (4) is fixedly connected to a storage sleeve (5). The outer side of the storage sleeve (5) is slidably connected to a sliding frame (6) extending above it. The outer side of the sliding frame (6) is provided with a locking component (7) extending to its inner side and pressing against the storage sleeve (5). The inner side of the sliding frame (6) is provided with a flexible tube (8) communicating with the storage sleeve (5). The outer side of the storage sleeve (5) is provided with a plug-in drawer (9) inserted into its interior.

2. The quick release semiconductor test device holder of claim 1, wherein: The limiting track component (2) includes a sliding track (21) with a slot on its inner sidewall. An elastic piece (22) is fixedly installed on the side wall of the sliding track (21) opposite to the slot. The other end of the elastic piece (22) is fixedly connected to a push plate (23) that forms a compression with the sliding block (3).

3. The quick release semiconductor test device holder of claim 2, wherein: The bottom and top of the sliding track (21) are open, and the number of elastic pieces (22) is multiple and they are arranged in an up-down array.

4. The quick release semiconductor test device holder of claim 2, wherein: The number of slots is multiple and they are arranged in an up-down array. The sliding track (21) is engaged with the sliding block (3) through the slots.

5. The quick release semiconductor test device holder of claim 1, wherein: The inner side of the plug-in drawer (9) is provided with a plurality of inclined anti-collision plates that are connected in a downward inclination. The top of the inclined anti-collision plate is provided with a flexible pad. The bottom of the plug-in drawer (9) is open. The outside of the plug-in drawer (9) is plugged in with a material feeding plate that extends into its interior to close the opening.

6. The quick release semiconductor test device holder of claim 1, wherein: The locking element (7) includes a spring (71) fixedly connected to the outside of the sliding frame (6), and a pull block (72) fixedly connected to the other end of the spring (71). A T-shaped anti-slip block (73) that is pressed against the storage sleeve (5) is fixedly connected to the end of the pull block (72) connected to the spring (71).

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