Illumination test positioning plate and illumination test device
By setting up splicable illuminance testing positioning plates and devices within the light source illumination area, the problem of inconsistent illuminance data collection in the inner cavity of household appliances was solved, achieving comparability of light source optimization effects and data validity.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- NINGBO FOTILE KITCHEN WARE CO LTD
- Filing Date
- 2025-05-15
- Publication Date
- 2026-04-21
AI Technical Summary
The lack of a unified standard for illuminance data collection in existing technologies leads to large deviations in the collection of illuminance data for the inner cavity shelves of household appliances, resulting in poor data validity and reproducibility. This fails to meet user expectations and lacks a method for measuring the optimization effect in product design.
An illuminance testing positioning plate and an illuminance testing device are provided, including a splicable splicing plate and an illuminance acquisition device. By setting a global positioning pattern and calibration points within the light source illumination area, illuminance data of the light source is acquired, ensuring the consistency of the number and location of acquisition points.
It achieves consistency in the acquisition of illuminance data from different light sources, enabling comparisons using the same testing standard to measure the optimization effect of light sources and improve the validity and comparability of the data.
Smart Images
Figure CN224151987U_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of light intensity testing technology, and in particular to an illuminance testing positioning plate and an illuminance testing device. Background Technology
[0002] Currently, there is no unified testing standard for collecting illuminance data from the interior shelves of electrical appliances. The location and number of sampling points vary significantly, leading to large deviations in data from different sampling points, and poor data validity and reproducibility. Looking at the industry situation regarding illuminance within the cavities of household appliances, the results generally fail to meet user expectations. Furthermore, due to the lack of unified measurement standards, there is no evaluation method to measure the optimization effects during product design, thus preventing user expectations from being met. Utility Model Content
[0003] The technical problem to be solved by this disclosure is to overcome the deficiency in the prior art that the lack of a unified standard for illuminance data acquisition and testing makes it impossible to measure the optimization effect, and to provide an illuminance testing positioning plate and an illuminance testing device.
[0004] This disclosure solves the above-mentioned technical problems through the following technical solution:
[0005] According to a first aspect of this disclosure, an illuminance testing positioning plate is provided, the illuminance testing positioning plate includes a panel structure, the panel structure is placed within the illumination area of a target light source, and the overlap between the area where the panel structure is located and the illumination area satisfies a preset condition.
[0006] The panel structure includes several splicing panels arranged in a preset splicing method. Each splicing panel is provided with a local positioning pattern including several calibration points. After the several splicing panels are spliced together, a global positioning pattern is obtained. The panel structure includes a side of the global positioning pattern facing the target light source.
[0007] During illuminance acquisition, each calibration point is used to place an illuminance acquisition device to acquire illuminance data of the target light source at the calibration point.
[0008] Optionally, the local positioning pattern is pre-drawn on the splicing board;
[0009] The local positioning patterns of two adjacent splicing panels match at the splicing position.
[0010] Optionally, the local positioning pattern on the splicing board is obtained based on the global positioning pattern drawn after splicing.
[0011] Optionally, the multiple calibration points in the global positioning pattern are arranged according to a preset arrangement rule.
[0012] Optionally, the illuminance test positioning plate is placed on the inner cavity layer of the target electrical appliance.
[0013] Optionally, a support member is provided on the side of the splicing panel opposite to the local positioning pattern to support the panel structure, which is spliced from several splicing panels, in a horizontal state.
[0014] Optionally, the support includes pads.
[0015] Optionally, the splicing panel includes a PVC splicing panel;
[0016] And / or,
[0017] The calibration points in the global positioning pattern are marked with circles;
[0018] And / or,
[0019] The global positioning pattern also includes multiple horizontal and vertical dashed lines arranged according to a preset rule, and the intersection of the horizontal and vertical dashed lines is the calibration point.
[0020] According to a second aspect of this disclosure, an illuminance testing device is provided, the illuminance testing device including an illuminance acquisition device and the illuminance testing positioning plate described in the first aspect of this disclosure;
[0021] The illuminance test positioning plate is used to be placed within the illumination area of the target light source;
[0022] The illuminance acquisition device includes an illuminance meter probe and a host computer that is communicatively connected to the illuminance meter probe;
[0023] The illuminance meter probe is placed at the target calibration point on the illuminance test positioning plate. The illuminance meter probe is used to collect the illuminance data of the target calibration point and transmit the illuminance data to the host.
[0024] The host is used to receive and display the illuminance data; and / or, the host is also used to obtain the light intensity of the target light source based on the illuminance data received from different target calibration points.
[0025] Optionally, the host is further configured to receive illuminance data of different target calibration points under different test stages, and obtain the light intensity of the target light source corresponding to different test stages;
[0026] or,
[0027] The host is also used to receive illuminance data of the same target calibration point under different test phases.
[0028] The positive and progressive effects of this disclosure are as follows: by constructing a set of splicing boards that can be easily spliced together and include several local positioning patterns of calibration points, selecting an appropriate number of splicing boards according to the illumination area of the target light source, and determining the number of points that need to collect illuminance, the same test standard can be used for different light sources, thereby enabling the comparison of the collected illuminance data to measure the optimization effect. Attached Figure Description
[0029] Figure 1 This is a first structural schematic diagram of the illuminance testing positioning plate according to Embodiment 1 of this disclosure;
[0030] Figure 2 This is a schematic diagram of the second structure of the illuminance testing positioning plate according to Embodiment 1 of this disclosure;
[0031] Figure 3 This is a schematic diagram of the third structure of the illuminance test positioning plate in Embodiment 1 of this disclosure;
[0032] Figure 4 This is a schematic diagram of the illuminance testing device according to Embodiment 1 of this disclosure. Detailed Implementation
[0033] The present disclosure will be explained more clearly and completely below with reference to a preferred embodiment and the accompanying drawings.
[0034] Example 1
[0035] In one specific embodiment of this disclosure, an illuminance testing positioning plate 100 is provided, such as... Figure 1 As shown, the illuminance test positioning plate 100 includes a panel structure 1, which is placed within the irradiation area of the target light source, and the overlap between the area where the panel structure 1 is located and the irradiation area meets the preset conditions.
[0036] The panel structure 1 includes several splicing panels arranged in a preset splicing method. Each splicing panel is provided with a local positioning pattern including several calibration points. After the several splicing panels are spliced together, a global positioning pattern is obtained. The side of the panel structure 1 including the global positioning pattern faces the target light source.
[0037] During illuminance acquisition, each calibration point is used to place the illuminance acquisition device to collect illuminance data of the target light source at the calibration point.
[0038] Specifically, such as Figure 1 As shown, solid lines represent the edges of each panel, and dashed lines and circles (i.e., calibration points) within each panel constitute a local positioning pattern. Figure 1The splicing panels 11, 12, 13, 14, 15, 16, 17, 18, 19, and 20 are spliced together to form panel structure 1. The local positioning pattern of each splicing panel is spliced together to obtain the global positioning pattern. The splicing panels can be made of PVB material with good performance.
[0039] When illuminance data collection is required, the number of splicing panels is determined based on the irradiated area of the target light source, ensuring that the overlap between the spliced panel structure 1 and the irradiated area meets preset conditions. For example, panel structure 1 is placed within the irradiated area, and the distance between the edge of panel structure 1 and the edge of the irradiated area is less than a preset threshold. The side of panel structure 1 including the global positioning pattern faces the target light source, and an illuminance acquisition device is placed according to the calibration point position in the global positioning pattern, thereby collecting illuminance data of the target light source at the corresponding calibration point.
[0040] Since the panel structure 1 has a global positioning pattern including calibration points, and the overlap between the area where the panel structure 1 is located and the irradiation area meets the preset conditions, the arrangement can be quickly completed according to the calibration points during the process of collecting data from the target light source multiple times. Moreover, the number and position of the collection points for each illuminance data collection are within the preset error range. This allows the same test standard to be used for multiple illuminance data collections of the same light source or illuminance data collections of different light sources. In this way, the collected illuminance data can be compared to measure the optimization effect.
[0041] It should be noted that, Figure 1 The example used is a rectangular panel, but it shouldn't be limited to only rectangular panels. In reality, panels can be quadrilaterals, hexagons, irregular polygons, and various other shapes, as long as they can be freely assembled. Similarly, Figure 1 The dotted lines and circles in the diagram are merely illustrative examples of local / global positioning patterns. Local / global positioning patterns can be set according to actual needs. For example, local / global positioning patterns may not include dotted lines, and the calibration points can be squares, rhombuses, flowers, etc. This specific embodiment does not impose any limitations on this. Furthermore, each splicing panel may have a local positioning pattern on one side or on both sides.
[0042] This specific implementation method constructs a splicing board that can be easily spliced together and includes several local positioning patterns of calibration points. By selecting an appropriate number of splicing boards according to the illumination area of the target light source, the number of points that need to be collected for illuminance is determined, so that the same test standard can be used for different light sources. This allows for comparison of the collected illuminance data to measure the optimization effect.
[0043] In one specific embodiment, local positioning patterns are pre-drawn on the splicing plates, and the local positioning patterns of two adjacent splicing plates match at the splicing position.
[0044] Specifically, local positioning patterns can be pre-drawn on each splicing board. The local positioning pattern on each splicing board at the splicing position can match the local positioning patterns on other splicing boards at the splicing position. Thus, after splicing a number of splicing boards, a global positioning pattern can be directly obtained.
[0045] In another specific implementation, the local positioning pattern on the splicing board is obtained based on the global positioning pattern drawn after splicing.
[0046] Specifically, the global positioning pattern can be determined by the number of splicing panels based on the illumination area of the target light source, and after splicing to obtain panel structure 1, it can be printed according to the preset collection point standard.
[0047] As a preferred method, multiple horizontal and vertical dashed lines can be printed at preset intervals, with the intersection of the horizontal and vertical dashed lines serving as calibration points to form a global positioning pattern in which multiple calibration points are arranged according to preset rules.
[0048] like Figure 2 As shown, starting from the midpoint of the top edge of panel structure 1, a vertical dotted line is sprayed in the center. Then, vertical dotted lines are sprayed sequentially in the left and right directions at a preset interval (e.g., 150mm). Next, the horizontal dotted line is started from the top edge and horizontal dotted lines are sprayed sequentially in the downward direction at a preset interval. Circles are sprayed at the intersection of the horizontal and vertical dotted lines as calibration points to obtain a global positioning pattern.
[0049] In one specific embodiment, the illuminance test positioning plate 100 is placed on the inner cavity layer plate of the target electrical appliance.
[0050] Specifically, when collecting illuminance data from the inner shelves of household appliances of different sizes (such as refrigerators and ovens), an appropriate number of splicing plates can be selected based on the dimensions of the target appliance's inner cavity. For example, taking a refrigerator as an example, a preliminary panel structure 1 is initially assembled and placed centered on the inner shelf with its top edge close to the inner wall. When the distance from the left and right sides to the cavity sidewall is greater than 150mm, a splicing plate is added to each side of the preliminary panel structure 1, and so on. When the refrigerator cavity depth is large, a splicing plate can be added below the preliminary panel structure 1 until the difference between the depth of the preliminary panel structure 1 and the cavity depth is less than 150mm, thus obtaining the assembled illuminance test positioning plate 100. The assembled illuminance test positioning plate 100 is placed on the inner shelf of the target appliance to determine the number and location of illuminance data collection points based on the global positioning pattern on the panel structure 1.
[0051] In one specific embodiment, a support member 2 is provided on the side of the splicing panel opposite to the local positioning pattern, which is used to support the panel structure 1, which is spliced from several splicing panels, in a horizontal state.
[0052] Specifically, because the surfaces of the inner shelves of some household appliances are not flat—for example, the front edge of the inner shelf of a refrigerator usually has a front edging to prevent items from slipping—if the illuminance testing positioning plate 100 is placed directly on the inner shelf, the entire panel structure 1 will be tilted. Therefore, to ensure that the panel structure 1 is horizontal, a support member 2 can be provided on the side opposite to each splicing plate and the local positioning pattern, such as... Figure 3 As shown, each splicing panel has a pad underneath to eliminate the height difference of the front edge.
[0053] This embodiment constructs a splicing board that can be easily assembled and includes several local positioning patterns of calibration points. By selecting an appropriate number of splicing boards according to the illumination area of the target light source, the number of points that need to be collected for illuminance is determined, so that the same test standard can be used for different light sources. This allows for comparison of the collected illuminance data to measure the optimization effect.
[0054] Example 2
[0055] In one specific embodiment of this disclosure, an illuminance testing device is provided, such as... Figure 4 As shown, the illuminance testing device includes an illuminance acquisition device 200 and an illuminance testing positioning plate 100 as described in any of the above embodiments;
[0056] The illuminance test positioning plate 100 is used to be placed within the illumination area of the target light source;
[0057] The illuminance acquisition device 200 includes an illuminance meter probe 201 and a host 202 that is communicatively connected to the illuminance meter probe 201;
[0058] The illuminance probe 201 is placed at the target calibration point on the illuminance test positioning plate 100. The illuminance probe 201 is used to collect illuminance data of the target calibration point and transmit the illuminance data to the host 202.
[0059] The host 202 is used to receive and display illuminance data; and / or, the host 202 is also used to obtain the light intensity of the target light source based on the illuminance data of different target calibration points received.
[0060] Specifically, the illuminance testing device includes an illuminance acquisition device 200 and an illuminance testing positioning plate 100. When illuminance data needs to be acquired, the illuminance testing positioning plate 100 is placed within the illumination area of the target light source, and the illuminance meter probe 201 is placed at the target calibration point on the illuminance testing positioning plate 100. Illuminance data at the target calibration point is acquired, and the host computer 202 receives and displays the illuminance data at the target calibration point. The illuminance data at each calibration point is obtained by sequentially traversing each calibration point, and then the light intensity of the target light source is calculated based on the illuminance data at each calibration point.
[0061] For example, refer to Figure 2 For household appliances with small internal cavities, splicing panel 11 is sufficient to meet their size requirements; therefore, illuminance data can be collected from points 1-9. For household appliances with larger internal cavities, splicing panels 11, 12, and 13 need to be spliced together; therefore, illuminance data can be collected from points 1-15. For household appliances with deeper internal cavities, splicing panels 11 and 16 need to be spliced together; therefore, illuminance data can be collected from points 1-9, as well as points A, B1, and B2. By calculating the mean and standard deviation of the illuminance data collected at each point, the light intensity of the household appliance can be obtained.
[0062] In one specific implementation, the host 202 is also used to receive illuminance data of different target calibration points under different test stages, and obtain the light intensity of the target light source corresponding to different test stages.
[0063] Specifically, when it is necessary to compare the light intensity of different target light sources, the illuminance data of different target light sources at the same collection point can be collected by the illuminance test positioning plate 100 to ensure the comparability of the light intensity of different target light sources.
[0064] In one specific implementation, the host 202 is also used to receive illuminance data of the same target calibration point under different test phases.
[0065] Specifically, when it is necessary to compare the light intensity optimization effect of the same target light source, the illuminance test positioning plate 100 can be used to collect illuminance data of the same target light source at the same collection point under different test stages to compare the light intensity of the same target light source.
[0066] This embodiment constructs a splicing board that can be easily assembled and includes several local positioning patterns of calibration points. By selecting an appropriate number of splicing boards according to the illumination area of the target light source, the number of points that need to be collected for illuminance is determined, so that the same test standard can be used for different light sources. This allows for comparison of the collected illuminance data to measure the optimization effect.
[0067] While specific embodiments of this disclosure have been described above, those skilled in the art should understand that these are merely illustrative examples, and the scope of protection of this disclosure is defined by the appended claims. Those skilled in the art can make various changes or modifications to these embodiments without departing from the principles and essence of this disclosure, but all such changes and modifications fall within the scope of protection of this disclosure.
Claims
1. An illuminance test positioning plate characterized by, The illuminance test positioning plate includes a panel structure, which is placed within the illumination area of the target light source, and the overlap between the area where the panel structure is located and the illumination area meets a preset condition. The panel structure includes several splicing panels arranged in a preset splicing method. Each splicing panel is provided with a local positioning pattern including several calibration points. After the several splicing panels are spliced together, a global positioning pattern is obtained. The panel structure includes a side of the global positioning pattern facing the target light source. During illuminance acquisition, each calibration point is used to place an illuminance acquisition device to acquire illuminance data of the target light source at the calibration point.
2. The illumination test positioning plate of claim 1, wherein, The local positioning pattern is pre-drawn on the splicing board; The local positioning patterns of two adjacent splicing panels match at the splicing position.
3. The illumination test positioning plate of claim 1, wherein, The local positioning pattern on the splicing board is obtained based on the global positioning pattern drawn after splicing.
4. The illumination test positioning plate of claim 1, wherein, The multiple calibration points in the global positioning pattern are arranged according to a preset arrangement rule.
5. The illumination test positioning plate of claim 1, wherein, The illumination test positioning plate is placed on the inner cavity layer plate of the target electrical appliance.
6. The illumination test positioning plate according to any one of claims 1 to 5, characterized in that, The side of the splicing panel opposite to the local positioning pattern is provided with a support member to support the panel structure, which is composed of several splicing panels, in a horizontal state.
7. The illumination test positioning plate of claim 6, wherein, The support includes feet.
8. The illumination test positioning plate according to any one of claims 1 to 5, characterized in that, The splicing panel includes a PVC splicing panel; And / or, The calibration points in the global positioning pattern are marked with circles; And / or, The global positioning pattern also includes multiple horizontal and vertical dashed lines arranged according to a preset rule, and the intersection of the horizontal and vertical dashed lines is the calibration point.
9. An illuminance testing device, characterized by, The illuminance testing device includes an illuminance acquisition device and an illuminance testing positioning plate as described in any one of claims 1 to 8; The illuminance test positioning plate is used to be placed within the illumination area of the target light source; The illuminance acquisition device includes an illuminance meter probe and a host computer that is communicatively connected to the illuminance meter probe; The illuminance meter probe is placed at the target calibration point on the illuminance test positioning plate. The illuminance meter probe is used to collect the illuminance data of the target calibration point and transmit the illuminance data to the host. The host is used to receive and display the illuminance data; and / or, the host is also used to obtain the light intensity of the target light source based on the illuminance data received from different target calibration points.
10. The illuminance testing device of claim 9, wherein, The host is also used to receive the illuminance data of different target calibration points under different test stages, and to obtain the light intensity of the target light source corresponding to different test stages; or, The host is also used to receive illuminance data of the same target calibration point under different test phases.