Electric leakage detection mechanism of LED chip sorting machine

Abstract

The utility model belongs to the technical field of LED chips, and discloses an electric leakage detection mechanism of an LED chip sorting machine, which comprises a mechanical arm, a suction nozzle, an ampere meter, a power supply, a lead, a probe assembly, an upper computer and a sorting machine control module, the power supply, the probe assembly and the ampere meter are sequentially connected in series through the lead, and the ampere meter is electrically connected with the upper computer. The upper computer is electrically connected with the sorting machine control module, the probe assembly is arranged on the mechanical arm, when the suction nozzle conducts vacuum adsorption on the core particles, the probe assembly makes contact with electrodes on the core particles to form a series circuit and conduct electric leakage detection, and when the electric leakage value is higher than a set value, the sorting machine control module conducts vacuum breaking on the suction nozzle, and the corresponding core particles fall off from the suction nozzle. According to the utility model, the probe is arranged on the mechanical arm, electric leakage detection is carried out on the chip grabbed each time, and when electric leakage is detected to be abnormal, the suction nozzle breaks vacuum to enable the core particles to fall off in the transfer process, so that the core particles are prevented from being transferred to a bin sheet, and the purpose of screening out the electric leakage core particles is achieved.

Description

Technical Field

[0001] This utility model belongs to the field of LED chip technology, specifically relating to a leakage current detection mechanism for an LED chip sorting machine. Background Technology

[0002] The main function of an LED chip sorting machine is to classify and select LED chips. The specific sorting process is as follows: Figure 1 As shown, the core chip is picked up from the wafer using a suction nozzle mounted on a robotic arm via vacuum adsorption. The robotic arm then moves the core chip to a designated position on a predetermined bin. The sorting machine then breaks the vacuum, allowing the core chip to be placed in the target position under gravity. Since the sorting machine picks up the corresponding core chips based on the test results from the previous process, if the test machine malfunctions, resulting in incorrect test results, or if factors such as blue film shrinkage cause the latest real-time position of the core chip to differ from the map, the sorting machine may pick up the wrong core chip. This could lead to abnormal leakage core chips being picked up and sent to the bin, ultimately causing the abnormal core chip to flow downstream to the packaging end, affecting product quality. Utility Model Content

[0003] This invention addresses the shortcomings of the prior art by providing a leakage current detection mechanism for an LED chip sorting machine. By setting probes on the robotic arm, leakage current detection is performed on each chip picked up, ensuring that the chips that finally reach the bin end are free from leakage current abnormalities.

[0004] To achieve the above objectives, the technical solution of this utility model is as follows:

[0005] A leakage current detection mechanism for an LED chip sorting machine includes a robotic arm, a suction nozzle, an ammeter, a power supply, wires, a probe assembly, a host computer, and a sorting machine control module. The power supply, probe assembly, and ammeter are connected in series via wires. The ammeter is electrically connected to the host computer, and the host computer is electrically connected to the sorting machine control module. The probe assembly is mounted on the robotic arm. When the suction nozzle performs vacuum adsorption on the chip, the probe assembly contacts the electrodes on the chip to form a series circuit and perform leakage current detection. When the leakage current value is higher than a set value, the sorting machine control module breaks the vacuum at the suction nozzle, and the corresponding chip falls off the suction nozzle.

[0006] Preferably, the probe assembly includes a first probe and a second probe corresponding to the positions of the P electrode and N electrode on the core, respectively. The wire includes a first wire and a second wire. The first probe is connected to the positive terminal of the power supply through the first wire, and the second probe is connected in series with the ammeter and the negative terminal of the power supply through the second wire.

[0007] Preferably, the leakage current detection mechanism further includes an abnormal core recovery box, which is located between the wafer sheet and the bin sheet.

[0008] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0009] This invention uses a probe on a robotic arm to detect leakage current in each chip picked up. When an abnormal leakage current is detected, the suction nozzle breaks the vacuum during the transfer of the chip by the robotic arm, causing the chip to fall off during the transfer and preventing it from being transferred to the bin. This achieves the purpose of screening out the chip with leakage current and ensures that the chip that finally reaches the bin is free of leakage current. Attached Figure Description

[0010] Other features, objects, and advantages of this invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings.

[0011] Figure 1 This is a schematic diagram of the process of suction and transfer of core particles in the prior art;

[0012] Figure 2 This is a schematic diagram of the leakage current detection mechanism in Embodiment 1 of this utility model;

[0013] Figure 3 This is a schematic diagram of the leakage current detection process of this utility model;

[0014] Figure 4 This is a schematic diagram of the leakage current detection mechanism in Embodiment 2 of this utility model;

[0015] In the diagram: 1. Robotic arm, 2. Suction nozzle, 3. Ammeter, 4. Power supply, 5. Probe assembly, 501. First probe, 502. Second probe, 6. Core particle, 7. Electrode, 701. P electrode, 702. N electrode, 8. First lead wire, 9. Second lead wire, 10. Abnormal core particle recovery box. Detailed Implementation

[0016] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0017] In the description of this utility model, it should be understood that the terms "middle", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0018] In this utility model, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," "link," and "fix" should be interpreted broadly. For example, they can refer to a fixed connection or a detachable connection; a mechanical connection; a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0019] Example 1

[0020] like Figure 2 and Figure 3 As shown, an LED chip sorting machine leakage detection mechanism includes a robotic arm 1, a suction nozzle 2, an ammeter 3, a power supply 4, wires, a probe assembly 5, a host computer, and a sorting machine control module. The power supply 4, probe assembly, and ammeter are connected in series via wires. The ammeter is electrically connected to the host computer, and the host computer is electrically connected to the sorting machine control module. The probe assembly is mounted on the robotic arm. When the suction nozzle vacuum-adsorbs the chip, the probe assembly contacts the electrode 7 on the chip 6 to form a series circuit and perform leakage detection. The host computer analyzes and judges the current. If the leakage value exceeds the set value, it means that the chip is an abnormal leakage chip. The host computer feeds back the signal to the sorting machine control module, which breaks the vacuum at the suction nozzle, and the corresponding chip falls off the suction nozzle, thereby preventing the abnormal leakage chip from being transferred to the bin sheet.

[0021] The probe assembly includes a first probe 501 and a second probe 502, which correspond to the positions of the P electrode 701 and N electrode 702 on the core, respectively. The wires include a first wire 8 and a second wire 9. The first probe is connected to the positive terminal of the power supply through the first wire, and the second probe is connected in series with the ammeter and the negative terminal of the power supply through the second wire. The current flows out from the positive terminal of the power supply, passes through the first wire, the P electrode, the N electrode, the second wire, and the ammeter in sequence, and then flows to the negative terminal of the power supply. The ammeter detects the leakage current between the P electrode and the N electrode.

[0022] Example 2

[0023] like Figure 4 As shown, in practical applications, to prevent abnormal leakage particles from scattering inside the sorting machine during long-term production, an abnormal particle collection box is added. The abnormal particle collection box is located between the wafer plate and the bin plate, that is, on the path where normal particles are transferred from the wafer plate to the bin plate. The upper computer sets the vacuum breaking time for the sorting machine control module. When the time after detecting an abnormal current reaches the set time, the sorting machine control module breaks the vacuum in the suction nozzle, causing the particles to fall from the suction nozzle under gravity and into the abnormal particle collection box for unified recycling and processing.

[0024] The working process of this utility model is as follows: Figure 3 As shown in the map, the sorting machine control module drives the robotic arm to move towards the wafer. The suction nozzle on the robotic arm vacuum-adsorbs the corresponding core particle from the wafer. After core particle grabbing, two probes contact the P and N electrodes on the core particle to form a series circuit, detecting the current. The host computer determines whether there is leakage based on the ammeter reading. If the detection result is normal, the host computer sends a signal to the sorting machine control module, which then issues an execution command, and the robotic arm continues to transfer the particle to the bin. If the leakage value exceeds a set value, the host computer sends a signal to the sorting machine control module, which then issues an execution command to break the vacuum in the suction nozzle, causing the core particle to detach midway from the wafer to the bin, preventing it from being grabbed at the bin end and avoiding leakage to downstream customers.

[0025] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. It will be apparent to those skilled in the art that this utility model is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or basic characteristics of this utility model. Therefore, the embodiments should be considered exemplary and non-limiting in all respects. The scope of this utility model is defined by the appended claims rather than the foregoing description, and thus all changes falling within the meaning and scope of equivalents of the claims are intended to be included within this utility model.

Claims

1. A leakage current detection mechanism for an LED chip sorting machine, comprising a robotic arm and a suction nozzle, characterized in that: It also includes an ammeter, a power supply, wires, a probe assembly, a host computer, and a sorting machine control module. The power supply, probe assembly, and ammeter are connected in series via wires. The ammeter is electrically connected to the host computer, and the host computer is electrically connected to the sorting machine control module. The probe assembly is mounted on the robotic arm. When the nozzle performs vacuum adsorption on the core particle, the probe assembly contacts the electrode on the core particle to form a series circuit and perform leakage current detection. When the leakage current value is higher than the set value, the sorting machine control module breaks the vacuum of the nozzle, and the corresponding core particle falls off the nozzle.

2. The leakage current detection mechanism for an LED chip sorting machine as described in claim 1, characterized in that: The probe assembly includes a first probe and a second probe, which correspond to the positions of the P electrode and N electrode on the core, respectively. The wires include a first wire and a second wire. The first probe is connected to the positive terminal of the power supply through the first wire, and the second probe is connected in series with the ammeter and the negative terminal of the power supply through the second wire.

3. The leakage current detection mechanism for an LED chip sorting machine as described in claim 1, characterized in that: The leakage current detection mechanism also includes an abnormal core recovery box, which is located between the wafer and the bin.

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