Support system for short-distance wireless communication test

Abstract

The utility model relates to a support system for a short-distance wireless communication test. The support system comprises a tested circuit board, a support, a power supply, an FPGA control unit and a bit error tester. The support is composed of a stand column with a base, a vertical moving assembly and a horizontal transverse moving assembly, the vertical moving assembly locks the Z-axis position through a fastening screw, the horizontal transverse moving assembly is inserted into a penetrating groove of the vertical moving assembly and adjusts X-axis displacement through scale marks and the fastening screw, and the tail end of the horizontal transverse moving assembly is of a multi-face cube structure and is connected with a customized PCB clamp frame. And the tested circuit board is fixed through the nylon pillar screws. The system switches the radiation direction of a wireless signal by rotating the PCB clamp plate frame, and adjusts the displacement of the X axis, the Y axis and the Z axis to realize communication testing under different dislocation distances. According to the support system, electromagnetic interference is reduced through a pure mechanical structure, automatic control and high-precision scale identification are combined, the problems that traditional manual testing is low in efficiency, inaccurate in positioning and high in cost are solved, and the support system is suitable for limit distance and bit error rate evaluation of short-distance wireless communication equipment.

Description

Technical Field

[0001] This utility model relates to the field of wireless testing, and in particular to a support system for short-range wireless communication testing. Background Technology

[0002] In wireless communication testing, the standard uses an anechoic chamber in conjunction with a multi-axis robotic arm or sampling rack system to perform performance tests on products. The robotic arm or sampling rack system offers high degrees of freedom and adjustability across multiple axes, providing a wide range of test parameters to meet various testing needs. However, the construction and use of anechoic chambers and their associated testing systems are costly. For simple short-range wireless communication capability tests, such a comprehensive testing system is unnecessary; manual measurement on a test table can suffice for evaluation.

[0003] Typically, short-range wireless communication capability testing involves placing test pieces at predetermined positions on a test table, measuring the distance using a scale, transmitting packets via a computer, and evaluating the wireless communication capability based on the packet loss rate. However, this type of testing requires manual intervention throughout the entire process; positioning and movement require manual operation, handheld placement makes precise measurement difficult, communication alignment is challenging, and specialized computer testing software is required.

[0004] Therefore, existing testing methods are not very convenient for manually testing short-range wireless communication capabilities, and there are also issues with testing accuracy. Thus, a targeted testing support system is urgently needed. Utility Model Content

[0005] To address the aforementioned technical problems, this utility model provides a support system for short-range wireless communication testing, comprising a first test circuit board, a second test circuit board, a power supply, an FPGA control unit, a bit error rate tester, and a support:

[0006] The support includes a column, a base, a first vertical moving component, a second vertical moving component, a first horizontal moving component, and a second horizontal moving component;

[0007] The column is vertically fixed to the base, and its surface is provided with Z-axis scale lines;

[0008] The first vertical moving component and the second vertical moving component are sleeved on the column and locked in the Z-axis position by the first vertical fastening screw and the second vertical fastening screw. Both the front and back sides are provided with through slots.

[0009] The first horizontal lateral movement component is inserted into the through slot of the first vertical movement component, and the second horizontal lateral movement component is inserted into the through slot of the second vertical movement component. The front of the first horizontal lateral movement component and the second horizontal lateral movement component are provided with X-axis scale lines, and the X-axis position is locked by the first horizontal fastening screw and the second horizontal fastening screw.

[0010] The ends of the first horizontal traverse component and the second horizontal traverse component are five-sided cubic structures, and each face is provided with an array of screw holes;

[0011] The array screw holes at the end of the first horizontal traverse component are connected to the first PCB fixture frame, and the array screw holes at one end of the second horizontal traverse component are connected to the second PCB fixture frame. The first PCB fixture frame and the second PCB fixture frame are fixed to the test circuit board by adjustable first support screws and second support screws made of nylon material.

[0012] By adjusting the first vertical movement component, the second vertical movement component, the first horizontal movement component, and the second horizontal movement component, the relative displacement of the circuit board under test in the XYZ axis directions is achieved, and wireless communication testing is completed in conjunction with the FPGA control unit and the bit error rate tester. The FPGA control unit integrates a one-button trigger function, directly controlling the first and second circuit boards under test to execute preset test procedures without external computer intervention. Furthermore, the bit error rate tester's display shows the bit error rate in real time and supports quantitative output of test results.

[0013] In one embodiment of the present invention, the first horizontal moving component and the second horizontal moving component are provided with a five-sided cubic structure at one end face, which includes a front face, a back face, a top face, a bottom face and a right face, and each face is provided with an array of screw holes.

[0014] In one embodiment of this utility model, one end corner of the first PCB fixture frame and the second PCB fixture frame are provided with mounting holes that match the array screw holes. By rotating and mounting them onto different cubic surfaces, equivalent displacement adjustment in the Y-axis direction can be achieved.

[0015] In one embodiment of this utility model, the lengths of the first support screw and the second support screw are selected according to the device height of the circuit board under test, and their nylon material avoids affecting the wireless signal radiation.

[0016] In one embodiment of the present invention, the width of the through groove of the first vertical moving component and the second vertical moving component is adapted to the cross-sectional dimensions of the first horizontal moving component and the second horizontal moving component to ensure the stability of the horizontal moving component when sliding.

[0017] In one embodiment of this utility model, the dimensions of the first PCB fixture frame and the second PCB fixture frame are customized according to the dimensions of the circuit board under test, and the thickness of their frames is 3mm less than the outline of the first and second circuit boards under test, respectively, to avoid blocking the wireless signal radiation area.

[0018] In one embodiment of this utility model, the FPGA control unit is directly connected to the test circuit board via a ribbon cable, and the automatic test process is triggered with one click without the need for external computer control; the bit error rate meter is connected to the first test circuit board and the second test circuit board via an RF cable, and analyzes the signal bit error rate in real time and outputs quantitative test results.

[0019] In one embodiment of this utility model, the base is provided with an anti-slip rubber pad to fix the position of the bracket and reduce vibration interference during the test.

[0020] In one embodiment of this utility model, the power supply is an adjustable DC power supply, and the output voltage range covers the operating voltage requirements of the first test circuit board and the second test circuit board.

[0021] Compared with the prior art, the above-mentioned technical solution of this utility model has the following advantages: The support system for short-range wireless communication testing described in this utility model overcomes the low efficiency and inaccurate quantification caused by manual testing throughout the process. At the same time, it avoids the use of expensive supporting equipment such as robotic arms. Moreover, the test circuit board is mounted on the support, and the support can realize the relative displacement adjustment of the test circuit board in the XYZ axis direction. With the help of the bit error rate tester and FPGA control unit, it can realize the short-range wireless communication limit distance test or the communication bit error rate test at a set distance. Attached Figure Description

[0022] To make the content of this utility model easier to understand, the present utility model will be further described in detail below with reference to specific embodiments and accompanying drawings.

[0023] Figure 1 This is a schematic diagram of the wireless communication test system of this utility model;

[0024] Figure 2 This is a schematic diagram of the installation of the wireless communication radiation perpendicular to the PCB surface and the X-axis displacement test according to this utility model;

[0025] Figure 3 This is a schematic diagram of the installation of the wireless communication radiation perpendicular to the PCB surface, with rotation equivalent to Y-axis displacement test according to the present invention;

[0026] Figure 4 This is a schematic diagram of the installation of the wireless communication radiation parallel to the PCB surface and the X-axis displacement test according to the present invention.

[0027] Figure 5 This is a schematic diagram of the installation of the wireless communication radiation parallel to the PCB surface, with rotation equivalent to Y-axis displacement testing, as described in this utility model.

[0028] As shown in the figure: 1. Column, 2. First vertical moving assembly, 3. First vertical fastening screw, 4. First horizontal moving assembly, 5. First horizontal fastening screw, 6. First PCB fixture frame, 7. First support screw, 8. First test circuit board, 9. Second vertical moving assembly, 10. Second vertical fastening screw, 11. Second horizontal moving assembly, 12. Second horizontal fastening screw, 13. Second PCB fixture frame, 14. Second support screw, 15. Second test circuit board, 16. Base, 17. Power supply, 18. FPGA control unit, 19. Bit error rate tester. Detailed Implementation

[0029] Example 1

[0030] like Figure 1 As shown, this embodiment provides a support system for short-range wireless communication testing. The short-range wireless communication testing system includes a first test circuit board 8 and a second test circuit board 15, a power supply 17, an FPGA control unit 18, a bit error rate tester 19, and a support assembled from multiple mechanical structures. The support is placed on the ground or a tabletop by a base 16. A column 1 is mounted on the base 16, and the surface of the column 1 has markings for reading the relative distance along the Z-axis. A first vertical movement component 2 and a second vertical movement component 9 are mounted on the column 1. By moving the first vertical movement component 2 and the second vertical movement component 9, the relative displacement of the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction can be achieved. A first vertical fastening screw 3 and a second vertical fastening screw 10 are located to the left of the first vertical movement component 2 and the second vertical movement component 9, respectively. When the position of the first test circuit board 8 and the second test circuit board 15 along the Z-axis is determined, the first vertical fastening screw 3 and the second vertical fastening screw 10 are tightened to fix the position of the first vertical movement component 2 and the second vertical movement component 8.

[0031] The first vertical moving component 2 and the second vertical moving component 9 have through slots on their front and back sides, which are respectively inserted into the first horizontal moving component 4 and the second horizontal moving component 11. The front sides of the first horizontal moving component 4 and the second horizontal moving component 11 have scale lines for reading the relative distance along the X-axis. The front sides of the first vertical moving component 2 and the second vertical moving component 9 have a first horizontal fastening screw 5 and a second horizontal fastening screw 12, respectively. When the positions of the first test circuit board 8 and the second test circuit board 15 on the X-axis are determined, the first horizontal fastening screw 5 and the second horizontal fastening screw 12 are tightened to fix the positions of the first horizontal moving component 4 and the second horizontal moving component 11.

[0032] The right ends of the first horizontal traverse assembly 4 and the second horizontal traverse assembly 11 are both cubic in shape, with arrayed screw holes on the top, bottom, front, back, and right sides of the cubic shape. The dimensions of the first PCB fixture frame 6 and the second PCB fixture frame 13 are determined according to the dimensions of the first test circuit board 8 and the second test circuit board 15, respectively. The corners of the first PCB fixture frame 6 and the second PCB fixture frame 13 are also equipped with arrayed screw holes, which are then fixed to the arrayed screw holes of the cubic shape at the right ends of the first horizontal traverse assembly 4 and the second horizontal traverse assembly 11 by screws.

[0033] The first test circuit board 8 and the second test circuit board 15, which are used for wireless communication testing, are respectively mounted onto the corresponding first PCB fixture frame 6 and second PCB fixture frame 13 using first support screws 7 and second support screws 14. To avoid affecting electromagnetic radiation during wireless communication testing, nylon screws are used for the first support screws 7 and second support screws 14, and their selection can be based on the height of the components on the test circuit board.

[0034] The power supply to the first test circuit board 8 and the second test circuit board 15 is connected to the power supply 17 via power cables. The control of the first test circuit board 8 and the second test circuit board 15 is connected to the FPGA control unit 18 via ribbon cables. The signals from the first test circuit board 8 and the second test circuit board 15 are connected to the bit error rate tester 19 via RF cables. The FPGA control unit controls the operation of the first test circuit board 8 and the second test circuit board 15, and the bit error rate tester 19 analyzes the signal quality to complete the short-range wireless communication limit distance test or the communication bit error rate test at a set distance.

[0035] See attached document Figure 1-3 First, install the test circuit board onto the corresponding PCB fixture frame and connect all cables. When the wireless communication signal radiation direction of both the first test circuit board 8 and the second test circuit board 15 used for testing is perpendicular to the PCB surface, proceed according to... Figure 2 As shown, the bottom surface of the first PCB fixture frame 6 is connected to the right end square head of the first horizontal moving component 4, and the top surface of the second PCB fixture frame 13 is connected to the right end square head of the second horizontal moving component 11, so that the wireless communication signal radiation directions of the first test circuit board 8 and the second test circuit board 15 are aligned.

[0036] When conducting short-range wireless communication limit distance tests or communication bit error rate tests at a set distance, the position is first zeroed. The first vertical movement component 2 and the second vertical movement component 9 are moved so that the first test circuit board 8 and the second test circuit board 15 are at zero distance in the Z-axis direction, and then the first vertical fastening screw 3 and the second vertical fastening screw 10 are tightened. The first horizontal movement component 4 and the second horizontal movement component 11 are adjusted so that the wireless radiation direction of the first test circuit board 8 and the second test circuit board 15 is at zero misalignment distance in the X-axis, and then the first horizontal fastening screw 5 and the second horizontal fastening screw 12 are tightened. The zero misalignment distance of the wireless radiation direction in the Y-axis is set by the first PCB fixture frame 6 and the second PCB fixture frame 13 during customization. Then, the communication distance of the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction is set by adjusting the different heights of the first vertical movement component 2. The bit error rate meter 19 tests and evaluates the signal quality, and obtains the communication bit error rate at the set distance. The steps are repeated, and the limit communication distance can be measured based on the bit error rate.

[0037] The first horizontal traverse component 4 is moved to set the misalignment distance between the first test circuit board 8 and the second test circuit board 15 in the X-axis direction. The different heights of the first vertical traverse component 2 are adjusted to set the communication distance between the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction. The bit error rate meter 19 tests and evaluates the signal quality, and obtains the communication bit error rate at different Z-axis communication distances when the misalignment distance in the X-axis direction is set. The steps are repeated, and the limit communication distance at different misalignment distances in the X-axis direction can be measured based on the bit error rate.

[0038] according to Figure 3 As shown, the first PCB fixture frame 6 and the second PCB fixture frame 13 are rotated 90 degrees counterclockwise, connecting to the bottom surface of the right end square head of the first horizontal traverse assembly 4 and the top surface of the right end square head of the second horizontal traverse assembly 11, respectively. The same steps are used to zero the position. At this time, the first horizontal traverse assembly 4 is moved to set the misalignment distance of the first test circuit board 8 and the second test circuit board 15 in the X-axis direction, which is equivalent to setting the misalignment distance of the first test circuit board 8 and the second test circuit board 15 in the Y-axis direction without counterclockwise rotation. The different heights of the first vertical movement assembly 2 are adjusted to set the communication distance of the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction. The bit error rate meter 19 tests and evaluates the signal quality, obtaining the communication bit error rate at different Z-axis communication distances when the equivalent Y-axis misalignment distance is set. The steps are repeated, and the limit communication distance at different equivalent Y-axis misalignment distances can be measured based on the bit error rate.

[0039] In summary, this method can be used to test the bit error rate of various communication distances under different X and Y axis misalignment distances when the radiation direction of the wireless communication signal is perpendicular to the PCB board surface. It can also determine the limit communication distance under different X and Y axis misalignment distances.

[0040] Example 2

[0041] This embodiment provides a test installation method for wireless radiation parallel to the PCB board surface based on a bracket system. See attached diagram for details. Figure 1 , Figure 4-5 When the wireless communication signal radiation directions of the first test circuit board 8 and the second test circuit board 15 used for testing are parallel to the PCB board surface, the test circuit board is installed on the corresponding PCB fixture frame, all cables are connected, the first PCB fixture frame 6 is connected to the front of the right end square head of the first horizontal traverse component 4, and the second PCB fixture frame 13 is connected to the front of the right end square head of the second horizontal traverse component 11, so that the wireless communication signal radiation directions of the first test circuit board 8 and the second test circuit board 15 are aligned.

[0042] When conducting short-range wireless communication limit distance tests or communication bit error rate tests at a set distance, the position is first zeroed, and the zeroing steps are the same as in Example 1. The testing steps are also the same as in Example 1. The communication distance between the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction is set by adjusting the different heights of the first vertical moving component 2. The bit error rate meter 19 tests and evaluates the signal quality to obtain the communication bit error rate at the set distance. The steps are repeated, and the limit communication distance can be measured based on the bit error rate. Using the same steps as in Example 1, the communication bit error rate at different Z-axis communication distances when the X-axis misalignment distance is set can be obtained, and the limit communication distance at different X-axis misalignment distances can also be measured.

[0043] according to Figure 5 As shown, the first PCB fixture frame 6 is connected to the right side of the right end square head of the first horizontal traverse assembly 4, and the second PCB fixture frame 13 is connected to the right side of the right end square head of the second horizontal traverse assembly 11. The same steps are used to zero the position. At this time, the first horizontal traverse assembly 4 is moved to set the misalignment distance of the first test circuit board 8 and the second test circuit board 15 in the X-axis direction, which is equivalent to setting the misalignment distance of the first test circuit board 8 and the second test circuit board 15 in the Y-axis direction when the PCB fixture frames are connected frontally. The different heights of the first vertical movement assembly 2 are adjusted to set the communication distance of the first test circuit board 8 and the second test circuit board 15 in the Z-axis direction. The bit error rate meter 19 tests and evaluates the signal quality, obtaining the communication bit error rate at different Z-axis communication distances when the equivalent Y-axis misalignment distance is set. The steps are repeated, and the limit communication distance at different equivalent Y-axis misalignment distances can be measured based on the bit error rate.

[0044] In summary, this method can be used to test the bit error rate of various communication distances under different X and Y axis misalignment distances when the radiation direction of the wireless communication signal is parallel to the PCB board surface. It can also determine the limit communication distance under different X and Y axis misalignment distances.

[0045] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the protection scope of this invention.

Claims

1. A support system for short-range wireless communication testing, comprising a first test circuit board (8), a second test circuit board (15), a power supply (17), an FPGA control unit (18), a bit error rate tester (19), and a support, characterized in that: The support includes a column (1), a base (16), a first vertical moving component (2), a second vertical moving component (9), a first horizontal moving component (4), and a second horizontal moving component (11); The column (1) is vertically fixed on the base (16), and the surface is provided with Z-axis scale lines; The first vertical moving component (2) and the second vertical moving component (9) are sleeved on the column (1) and locked in the Z-axis position by the first vertical fastening screw (3) and the second vertical fastening screw (10). Both the front and back sides are provided with through grooves. The first horizontal transverse component (4) is inserted into the through slot of the first vertical moving component (2), and the second horizontal transverse component (11) is inserted into the through slot of the second vertical moving component (9). The front of the first horizontal transverse component (4) and the second horizontal transverse component (11) are provided with X-axis scale lines, and the X-axis position is locked by the first horizontal fastening screw (5) and the second horizontal fastening screw (12). The ends of the first horizontal transverse component (4) and the second horizontal transverse component (11) are five-sided cubic structures, and each face is provided with an array of screw holes; The array screw holes at the end of the first horizontal transverse component (4) are connected to the first PCB fixture frame (6), and the array screw holes at one end of the second horizontal transverse component (11) are connected to the second PCB fixture frame (13). The first PCB fixture frame (6) and the second PCB fixture frame (13) are fixed to the test circuit board by adjustable first support screws (7) and second support screws (14) made of nylon material. By adjusting the first vertical moving component (2), the second vertical moving component (9), the first horizontal moving component (4), and the second horizontal moving component (11), the relative displacement of the test circuit board in the XYZ axis direction is realized, and wireless communication test is completed in conjunction with the FPGA control unit (18) and the bit error rate tester (19).

2. The support system according to claim 1, characterized in that: The first horizontal transverse component (4) and the second horizontal transverse component (11) are provided with a five-sided cubic structure at one end face, which includes a front face, a back face, a top face, a bottom face and a right face, and each face is provided with an array of screw holes.

3. The support system according to claim 1, characterized in that: The first PCB fixture frame (6) and the second PCB fixture frame (13) have mounting holes at one end corner that match the array screw holes, and can be rotated to mount onto different cubic surfaces.

4. The support system according to claim 1, characterized in that: The lengths of the first support screw (7) and the second support screw (14) are selected according to the device height of the circuit board under test.

5. The support system according to claim 1, characterized in that: The through-slot widths of the first vertical moving component (2) and the second vertical moving component (9) are adapted to the cross-sectional dimensions of the first horizontal moving component (4) and the second horizontal moving component (11).

6. The support system according to claim 1, characterized in that: The dimensions of the first PCB fixture frame (6) and the second PCB fixture frame (13) are customized according to the dimensions of the circuit board under test, and their frame thicknesses are both smaller than those of the first circuit board under test (8) and the second circuit board under test (15).

7. The support system according to claim 4, characterized in that: The FPGA control unit (18) is directly connected to the test circuit board via a ribbon cable; the bit error rate tester (19) is connected to the first test circuit board (8) and the second test circuit board (15) via radio frequency cables.

8. The support system according to claim 1, characterized in that: The base (16) is provided with an anti-slip rubber pad.

9. The support system according to claim 1, characterized in that: The power supply (17) is an adjustable DC power supply, and its output voltage range covers the working voltage requirements of the first test circuit board (8) and the second test circuit board (15).

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