Device for measuring radius of curvature and optical measurement system

Abstract

The embodiment of the utility model provides a device for measuring radius of curvature and an optical measurement system, and relates to the technical field of optical measurement. The device for measuring the curvature radius comprises a first linear matrix photoelectric sensor, a second linear matrix photoelectric sensor and a first surface matrix photoelectric sensor, wherein the first linear matrix photoelectric sensor and the second linear matrix photoelectric sensor are arranged at an interval along the incident direction of incident light; and the first surface matrix photoelectric sensor and the first line matrix photoelectric sensor are arranged in parallel. And the first linear matrix photoelectric sensor, the second linear matrix photoelectric sensor and the first surface matrix photoelectric sensor are used for receiving light spots formed by reflected light irradiated on the optical element by the light source. The device for measuring the curvature radius adopts non-contact measurement, does not cause damage to the surface of an element, is small in size, has no requirement on the placement orientation during measurement, and is wide in application range.

Description

A device and optical measurement system for measuring radius of curvature Technical Field

[0001] This utility model relates to the field of optical measurement technology, and more specifically, to a device and optical measurement system for measuring the radius of curvature. Background Technology

[0002] In an optical system, optical elements are the main components, and most optical elements have spherical or cylindrical surfaces, such as convex lenses, concave lenses, convex mirrors, concave mirrors, cylindrical lenses, and cylindrical mirrors. One of the key parameters of these elements is their radius of curvature. A spherical diameter meter is currently the most commonly used instrument for measuring the radius of curvature. Its principle is to place the spherical element on three steel ball contact points at known relative positions, and then move a lifting probe from the center position to the contact surface of the element. By measuring the amount of movement of the contact element by the lifting probe, combined with the known positional relationship of the three steel ball contact points, the radius of curvature of the spherical surface of the element can be calculated. During the measurement process, to prevent the element from being lifted by the lifting probe, a rod needs to be pressed down from directly above to fix it in place. Therefore, the entire measurement process involves five physical contacts of the element surface.

[0003] However, ball diameter meters are relatively large, involve contact measurement, and come into contact with the center of the component, which can easily damage the component's surface and affect its use. Furthermore, ball diameter meters can only be placed upwards and can only measure the radius of curvature of a spherical surface, limiting their applicability. Summary of the Invention

[0004] This invention provides a device and optical measurement system for measuring the radius of curvature. It is a non-contact measurement system that will not damage the surface of the component. It is also small in size, has no requirements on the placement direction during measurement, and has a wide range of applications.

[0005] The embodiments of this utility model can be implemented as follows:

[0006] An embodiment of this utility model provides a device for measuring the radius of curvature, comprising:

[0007] First line matrix photoelectric sensor, second line matrix photoelectric sensor and first surface matrix photoelectric sensor;

[0008] The first linear matrix photoelectric sensor and the second linear matrix photoelectric sensor are spaced apart along the incident direction of the incident light; the first surface matrix photoelectric sensor is arranged parallel to the first linear matrix photoelectric sensor.

[0009] In an optional embodiment, the device for measuring the radius of curvature further includes a second surface matrix photoelectric sensor, which is arranged parallel to the second line matrix photoelectric sensor.

[0010] In an optional embodiment, the device for measuring the radius of curvature further includes a third line matrix photoelectric sensor and a fourth line matrix photoelectric sensor; the third line matrix photoelectric sensor and the first line matrix photoelectric sensor are located at the same height along the incident direction of the incident light, and the third line matrix photoelectric sensor and the first line matrix photoelectric sensor are spaced apart; the first surface matrix photoelectric sensor is located between the first line matrix photoelectric sensor and the third line matrix photoelectric sensor;

[0011] The fourth line matrix photoelectric sensor and the second line matrix photoelectric sensor are located at the same height along the incident direction of the incident light, and the fourth line matrix photoelectric sensor and the second line matrix photoelectric sensor are spaced apart.

[0012] In an optional embodiment, the second surface matrix photoelectric sensor is located between the second line matrix photoelectric sensor and the fourth line matrix photoelectric sensor.

[0013] In an optional embodiment, the device for measuring the radius of curvature further includes a first translation stage, which is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction; the first linear matrix photoelectric sensor, the third linear matrix photoelectric sensor and the first surface matrix photoelectric sensor are all disposed on the first translation stage.

[0014] In an optional embodiment, the device for measuring the radius of curvature further includes a second translation stage, which is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction; the second linear matrix photoelectric sensor, the fourth linear matrix photoelectric sensor, and the second surface matrix photoelectric sensor are all disposed on the second translation stage.

[0015] In an optional embodiment, the device for measuring the radius of curvature is made as a probe.

[0016] An embodiment of this utility model also provides an optical measurement system, including a light source device and a device for measuring the radius of curvature as described in any of the above embodiments, wherein the light source device provides the required light source for the device for measuring the radius of curvature.

[0017] In an optional embodiment, the light source device is used to generate two beams of light, and the two beams of light are parallel and spaced apart.

[0018] In an optional implementation, the light source device is used to generate four centrally symmetrical light beams.

[0019] The beneficial effects of the apparatus and optical measurement system for measuring the radius of curvature according to the embodiments of this utility model include, for example:

[0020] The device for measuring the radius of curvature includes a first linear matrix photoelectric sensor, a second linear matrix photoelectric sensor, and a first surface matrix photoelectric sensor. The first and second linear matrix photoelectric sensors are spaced apart along the incident direction of the incident light; the first surface matrix photoelectric sensor is arranged parallel to the first linear matrix photoelectric sensor. All three sensors receive the light spot formed by reflected light from the light source onto the optical element. The sensors are then moved in parallel, and the position of the second light spot on each sensor is recorded. Based on the geometric relationship between the spacing between the first and second linear matrix photoelectric sensors, the distance moved between the two measurements, and the position of the incident light, the radius of curvature of the optical element can be determined. This device allows for non-contact measurement, minimizing damage to the optical element, and its position can be adjusted according to the location of the optical element. Furthermore, this device can measure the radius of curvature of both spherical and cylindrical surfaces of optical elements, making it widely applicable. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 is a schematic diagram from a first perspective of the device for measuring the radius of curvature provided in an embodiment of this utility model;

[0023] Figure 2 is a schematic diagram from a second perspective of the device for measuring the radius of curvature provided in an embodiment of this utility model;

[0024] Figure 3 is a schematic diagram of the principle of measuring a convex spherical surface provided in an embodiment of this utility model;

[0025] Figure 4 is a schematic diagram of the principle of measuring a concave spherical surface provided in an embodiment of this utility model;

[0026] Figure 5 is a schematic diagram showing the positional relationship between the light beam and the optical axis in an embodiment of this utility model when they are aligned in a parallel and symmetrical manner.

[0027] Icons: 1000 - Device for measuring radius of curvature; 100 - First line matrix photoelectric sensor; 200 - Second line matrix photoelectric sensor; 300 - First surface matrix photoelectric sensor; 400 - Second surface matrix photoelectric sensor; 500 - Third line matrix photoelectric sensor; 600 - Fourth line matrix photoelectric sensor; 2000 - Beam. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0029] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0030] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0031] In the description of this utility model, it should be noted that if terms such as "upper," "lower," "inner," or "outer" are used to indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship in which the utility model product is usually placed during use, they are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0032] Furthermore, the terms "first" and "second" are used only to distinguish descriptions and should not be interpreted as indicating or implying relative importance.

[0033] It should be noted that, where there is no conflict, the features in the embodiments of this utility model can be combined with each other.

[0034] In an optical system, optical elements are the main components, and most optical elements have spherical or cylindrical surfaces, such as convex lenses, concave lenses, convex mirrors, concave mirrors, cylindrical lenses, and cylindrical mirrors. One of the key parameters of these elements is their radius of curvature. A spherical diameter meter is currently the most commonly used instrument for measuring the radius of curvature. Its principle is to place the spherical element on three steel ball contact points at known relative positions, and then move a lifting probe from the center position to the contact surface of the element. By measuring the amount of movement of the lifting probe and combining it with the known positional relationship of the three steel ball contact points, the radius of curvature of the spherical surface of the element can be calculated. During the measurement process, to prevent the element from being lifted by the lifting probe, a rod needs to be pressed down from directly above to fix it in place. Therefore, the entire measurement process involves five physical contacts of the element surface. However, spherical diameter meters are relatively large, involve contact measurement, and are in contact with the center of the element, which can easily damage the element surface and affect its use. Furthermore, the sphere diameter meter can only be placed upwards during use, and can only measure the radius of curvature of the spherical surface of the component, thus having a limited range of applications.

[0035] Based on this, referring to Figures 1 and 2, the device 1000 for measuring the radius of curvature provided in the embodiments of this utility model can improve the aforementioned technical problems. This device 1000 uses non-contact measurement, which will not damage the surface of the component, and is small in size, with no requirements on the placement orientation during measurement, making it widely applicable. This device 1000 is applied to optical measurement systems; any optical equipment or system having the aforementioned device 1000 has the same function, and is not limited thereto.

[0036] The optical measurement system in this embodiment includes an optical device and a device 1000 for measuring the radius of curvature. A light source device provides the necessary light source for the radius of curvature measurement device 1000. When measuring the radius of curvature of the cylindrical surface of an optical element, only two symmetrical beams 2000 are required. In this embodiment, the light source device generates two beams 2000, which are parallel and spaced apart; half the distance between the two parallel beams 2000 is l. When measuring the radius of curvature of the spherical surface of an optical element, four symmetrical beams 2000 are required. Therefore, when measuring the radius of curvature of a spherical surface, the light source device in this embodiment generates four centrally symmetrical beams 2000 to meet the measurement requirements. Half the distance between two beams 2000 located on the same horizontal line is l.

[0037] Figure 1 is a schematic diagram of the device 1000 for measuring the radius of curvature provided in an embodiment of the present invention from a first perspective; Figure 2 is a schematic diagram of the device 1000 for measuring the radius of curvature provided in an embodiment of the present invention from a second perspective. As shown in Figures 1 and 2, the device 1000 for measuring the radius of curvature includes a first linear matrix photoelectric sensor 100, a second linear matrix photoelectric sensor 200, and a first surface matrix photoelectric sensor 300; wherein, the first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200 are spaced apart along the incident direction of the incident light. That is, the first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200 are not set at the same horizontal height; the first linear matrix photoelectric sensor 100 is located at a first height, and the second linear matrix photoelectric sensor 200 is located at a second height, with a spacing of h. The first surface matrix photoelectric sensor 300 is arranged parallel to the first linear matrix photoelectric sensor 100.

[0038] The first linear matrix photoelectric sensor 100, the second linear matrix photoelectric sensor 200, and the first surface matrix photoelectric sensor 300 are all used to receive the light spot formed by the reflected light from the light source illuminating the optical element. Then, the first linear matrix photoelectric sensor 100, the second linear matrix photoelectric sensor 200, and the first surface matrix photoelectric sensor 300 are moved in parallel, and the position of the second light spot on the first linear matrix photoelectric sensor 100, the second linear matrix photoelectric sensor 200, and the first surface matrix photoelectric sensor 300 is recorded again. Based on the geometric relationship between the interval distance h between the first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200, the moving distance d between the two measurements, and the position l of the incident light, the radius of curvature of the optical element can be determined. This device 1000 for measuring the radius of curvature can achieve non-contact measurement, is less likely to damage the optical element, and its setting position can be changed according to the position of the optical element. Furthermore, this device can measure the radius of curvature of both spherical and cylindrical surfaces of the optical element, making it widely applicable.

[0039] Planar matrix photoelectric sensors offer high precision and high resolution, enabling them to capture higher-resolution images due to their numerous and widely distributed photosensitive elements. This makes them excellent for detecting small objects or tasks requiring high-precision position detection. Furthermore, planar matrix sensors can capture the entire image at once, resulting in faster imaging speeds. They offer greater flexibility and versatility in dynamic scenes. In addition, planar matrix photoelectric sensors are unaffected by factors such as the material and shape of the object, making them widely applicable.

[0040] Please continue to refer to Figures 1 and 2. In order to improve the accuracy of the reflected light spot acquisition at the second height, the device 1000 for measuring the radius of curvature in this embodiment also includes a second surface matrix photoelectric sensor 400, which is arranged in parallel with the second line matrix photoelectric sensor 200.

[0041] Furthermore, in order to receive the reflected light spots from at least two parallel light beams 2000 and improve the accuracy of the measurement results, the device 1000 for measuring the radius of curvature in this embodiment also includes a third linear matrix photoelectric sensor 500 and a fourth linear matrix photoelectric sensor 600. The third linear matrix photoelectric sensor 500 and the first linear matrix photoelectric sensor 100 are located at the same height along the incident direction of the incident light, and are spaced apart from each other. A first linear matrix photoelectric sensor 300 is located between the first linear matrix photoelectric sensor 100 and the third linear matrix photoelectric sensor 500. The fourth linear matrix photoelectric sensor 600 and the second linear matrix photoelectric sensor 200 are located at the same height along the incident direction of the incident light, and are spaced apart from each other.

[0042] The number of the first-line matrix photoelectric sensor 100, the second-line matrix photoelectric sensor 200, the third-line matrix photoelectric sensor 500, and the fourth-line matrix photoelectric sensor 600 can all be multiple. In this embodiment, the number of the first-line matrix photoelectric sensor 100, the second-line matrix photoelectric sensor 200, the third-line matrix photoelectric sensor 500, and the fourth-line matrix photoelectric sensor 600 is two. The two first-line matrix photoelectric sensors 100, the second-line matrix photoelectric sensor 200, the third-line matrix photoelectric sensor 500, and the fourth-line matrix photoelectric sensor 600 are arranged at an angle, or in this embodiment, they are arranged at a right angle. The number of the first-line matrix photoelectric sensor 100, the second-line matrix photoelectric sensor 200, the third-line matrix photoelectric sensor 500, and the fourth-line matrix photoelectric sensor 600 is determined by the number of incident beams 2000, and is not limited here.

[0043] To ensure that the reflected light spot between the second linear matrix photoelectric sensor 200 and the fourth linear matrix photoelectric sensor 600 can also be received, thereby improving the accuracy of the measurement, please refer to Figures 1 and 2. In this embodiment, the second linear matrix photoelectric sensor 400 is located between the second linear matrix photoelectric sensor 200 and the fourth linear matrix photoelectric sensor 600.

[0044] To facilitate the movement of the first linear matrix photoelectric sensor 100, the third linear matrix photoelectric sensor 500, and the first surface matrix photoelectric sensor 300, the device 1000 for measuring the radius of curvature in this embodiment further includes a first translation stage (not shown in the figure). The first translation stage is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction. The first linear matrix photoelectric sensor 100, the third linear matrix photoelectric sensor 500, and the first surface matrix photoelectric sensor 300 are all disposed on the first translation stage.

[0045] In addition, to facilitate the movement of the second linear matrix photoelectric sensor 200, the fourth linear matrix photoelectric sensor 600, and the second surface matrix photoelectric sensor 400, the device 1000 for measuring the radius of curvature also includes a second translation stage (not shown in the figure). The second translation stage is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction. The second linear matrix photoelectric sensor 200, the fourth linear matrix photoelectric sensor 600, and the second surface matrix photoelectric sensor 400 are all disposed on the second translation stage.

[0046] To achieve miniaturization and portability of the device 1000 for measuring the radius of curvature, in this embodiment, the device 1000 is fabricated as a probe. By using the probe in combination with an optical fiber, endoscopic active pointing control can be achieved.

[0047] In this embodiment, the line matrix and area matrix photoelectric sensors are both CMOS pattern sensors. Of course, other types of sensors can also be used, and this is not limited here.

[0048] Figure 3 is a schematic diagram of the principle of measuring a convex spherical surface provided in an embodiment of this utility model; Figure 4 is a schematic diagram of the principle of measuring a concave spherical surface provided in an embodiment of this utility model. The known parameters are: the interval h between the first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200; the distance d between the two moving photoelectric sensors; and the distance l between the incident light ray and the optical axis. These parameters are all manually set and are therefore known. Referring to Figure 3, when measuring the radius of curvature of a convex spherical surface, a light beam 2000 parallel to the radius of the circle is incident on the convex circle and reflected. At this time, linear matrix photoelectric sensors and surface matrix photoelectric sensors are respectively set on the Height1 and Height2 height lines to record the positions Dot1 and Dot2 where the reflected light beam intersects these two height lines. Based on the geometric relationship shown in the figure, and knowing the values ​​of h, d, and l, the radius of curvature r of the circle can be calculated. That is, the radius of curvature r can be obtained according to the following relationship:

[0049] tanα=d / h; θ=β=α / 2; r=l / sinθ.

[0050] When measuring the radius of curvature of a concave sphere, a light beam parallel to the radius of the circle (2000) is incident on the concave sphere and reflected. Sensors are placed on two height lines (Height1 and Height2) to record the positions (Dot1 and Dot2) where the reflected beam intersects these two height lines. Based on the geometric relationships shown in the diagram, and given the values ​​of h, d, and l, the radius of curvature r of the circle can be calculated. That is, the radius of curvature r can be obtained using the following formula:

[0051] tanα=d / h; α=2β; θ=β; r=l / sinθ.

[0052] l is achieved by setting two parallel beams 2000, and half the distance between these two beams 2000 is l.

[0053] Note: Figure 5 is a schematic diagram showing the positional relationship between the beam and the optical axis in an embodiment of this utility model when they are aligned parallel and symmetrical. Please refer to Figure 5. The incident beam 2000 needs to be aligned with the optical axis, that is, the incident beam 2000 needs to be set parallel to the optical axis. If two incident beams 2000 are used, they also need to be set symmetrically. The values ​​of dL and dR can be obtained by analyzing the position of the spot of the reflected light on the sensor. When the incident light is parallel and symmetrical with the radius of the circle, dL = dR. When the incident light is not parallel and symmetrical with the radius of the circle, dL > dR or dL < dR will occur. That is, an accurate radius of curvature value cannot be obtained.

[0054] The working principle of the device 1000 for measuring the radius of curvature provided in this embodiment is as follows:

[0055] Linear matrix photoelectric sensors and area matrix photoelectric sensors are used to detect reflected light. Four collimated beams 2000 are symmetrically arranged in parallel between the linear and area array sensors as incident light. During measurement, the linear and area array sensors are connected to the same linear translation stage, which can be moved back and forth to achieve a known movement h. Before and after the movement, the reflected beam will illuminate the linear or area array sensor, forming a light spot. By adjusting the relative position of the device with the circular surface being measured until the reflected beam symmetrically illuminates the sensor, the positional relationship meets the measurement requirements. This position is then maintained, and the sensor is quickly moved back and forth. The position of the light spot on the sensor is recorded before and after the movement, thus obtaining the d and h values. Since the d, h, and l values ​​are known, the radius of curvature r can be calculated using the above formula.

[0056] In summary, the device 1000 for measuring the radius of curvature includes a first linear matrix photoelectric sensor 100, a second linear matrix photoelectric sensor 200, and a first surface matrix photoelectric sensor 300. The first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200 are spaced apart along the incident direction of the incident light; the first surface matrix photoelectric sensor 300 is arranged parallel to the first linear matrix photoelectric sensor 100. All three sensors are used to receive the light spot formed by reflected light from the light source illuminating the optical element. Then, the first linear matrix photoelectric sensor 100, the second linear matrix photoelectric sensor 200, and the first surface matrix photoelectric sensor 300 are moved in parallel, and the position of the second light spot on each sensor is recorded again. Based on the interval between the first linear matrix photoelectric sensor 100 and the second linear matrix photoelectric sensor 200, the distance moved between the two measurements, and the position of the incident light, the geometric relationship between these factors allows the determination of the radius of curvature of the optical element. The device 1000 for measuring the radius of curvature enables non-contact measurement, minimizing damage to optical elements. Furthermore, its position can be adjusted according to the location of the optical element. In addition, the device can measure the radius of curvature of both spherical and cylindrical surfaces of optical elements, making it widely applicable.

[0057] The above description is only a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model.

Claims

1. A device for measuring the radius of curvature, characterized in that, include: A first linear matrix photoelectric sensor (100), a second linear matrix photoelectric sensor (200), and a first surface matrix photoelectric sensor (300); wherein the first linear matrix photoelectric sensor (100) and the second linear matrix photoelectric sensor (200) are spaced apart along the incident direction of the incident light; the first surface matrix photoelectric sensor (300) is arranged parallel to the first linear matrix photoelectric sensor (100).

2. The apparatus for measuring the radius of curvature according to claim 1, characterized in that, The device (1000) for measuring the radius of curvature further includes a second surface matrix photoelectric sensor (400), which is arranged in parallel with the second line matrix photoelectric sensor (200).

3. The apparatus for measuring the radius of curvature according to claim 2, characterized in that, The device (1000) for measuring the radius of curvature further includes a third linear matrix photoelectric sensor (500) and a fourth linear matrix photoelectric sensor (600); the third linear matrix photoelectric sensor (500) and the first linear matrix photoelectric sensor (100) are located at the same height along the incident direction of the incident light, and the third linear matrix photoelectric sensor (500) and the first linear matrix photoelectric sensor (100) are spaced apart; the first linear matrix photoelectric sensor (300) is located between the first linear matrix photoelectric sensor (100) and the third linear matrix photoelectric sensor (500); the fourth linear matrix photoelectric sensor (600) and the second linear matrix photoelectric sensor (200) are located at the same height along the incident direction of the incident light, and the fourth linear matrix photoelectric sensor (600) and the second linear matrix photoelectric sensor (200) are spaced apart.

4. The apparatus for measuring the radius of curvature according to claim 3, characterized in that, The second surface matrix photoelectric sensor (400) is located between the second line matrix photoelectric sensor (200) and the fourth line matrix photoelectric sensor (600).

5. The apparatus for measuring the radius of curvature according to claim 4, characterized in that, The device (1000) for measuring the radius of curvature further includes a first translation stage, which is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction; the first linear matrix photoelectric sensor (100), the third linear matrix photoelectric sensor (500) and the first surface matrix photoelectric sensor (300) are all disposed on the first translation stage.

6. The apparatus for measuring the radius of curvature according to claim 4, characterized in that, The device (1000) for measuring the radius of curvature further includes a second translation stage, which is perpendicular to the incident direction and can move in a horizontal direction perpendicular to the incident direction; the second linear matrix photoelectric sensor (200), the fourth linear matrix photoelectric sensor (600) and the second surface matrix photoelectric sensor (400) are all disposed on the second translation stage.

7. The apparatus for measuring the radius of curvature according to any one of claims 1-6, characterized in that, The device (1000) for measuring the radius of curvature is made as a probe.

8. An optical measurement system, characterized in that, The device includes a light source and a measuring device (1000) for measuring radius of curvature as described in any one of claims 1-7, wherein the light source provides the required light source for the measuring device (1000) for measuring radius of curvature.

9. The optical measurement system according to claim 8, characterized in that, The light source device is used to generate two beams (2000), and the two beams (2000) are parallel and spaced apart.

10. The optical measurement system according to claim 8, characterized in that, The light source device is used to generate four centrally symmetrical light beams (2000).

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