Probe clamping device capable of enabling probe to be automatically attached to workpiece

Abstract

The probe clamping device comprises a probe frame and a supporting assembly, an elastic assembly extending upwards in the vertical direction is fixed to one side of the probe frame, and the supporting assembly is in sliding connection with the elastic assembly in the vertical direction. An elastic piece which stretches out and draws back in the vertical direction is connected between the supporting assembly and the elastic assembly, the upper end of the elastic piece is connected with the upper portion of the elastic assembly, and the lower end of the elastic piece is connected with the lower portion of the supporting assembly; during use, the supporting assembly is connected with a scanning rack arranged on the surface of a workpiece, the probe is fixed in the probe frame, and the probe frame is tightly attached to the surface of the workpiece. According to the probe clamping device with the probe automatically attached to the workpiece, the field measurement time is greatly shortened, the detection requirements of different pipe diameters are met, the detection precision is guaranteed, and the detection efficiency is improved.

Description

A probe clamping device for automatic probe fitting to workpiece Technical Field

[0001] This utility model belongs to the field of ship inspection technology, and specifically relates to a probe clamping device for automatically fitting the probe to the workpiece. Background Technology

[0002] The clamping device of the existing scanner mainly consists of a locking device, an elastic arm, a probe slot, and a wedge. The locking devices are all non-standard manufactured, so different scanners cannot be adapted to each other at the same time. The probe slot can only be adjusted on the Y-axis. At the same time, the wedge needs to be machined with a positioning groove, which increases the size of the wedge. Summary of the Invention

[0003] To address the aforementioned problems, this utility model provides a probe clamping device that automatically fits the probe into the workpiece.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] A probe clamping device for automatically fitting a probe to a workpiece includes a probe frame and a support assembly. An elastic component extending vertically upward is fixed to one side of the probe frame. The support assembly and the elastic component are slidably connected vertically. A vertically telescopic elastic element is connected between the support assembly and the elastic component. The upper end of the elastic element is connected to the upper part of the elastic component, and the lower end of the elastic element is connected to the lower part of the support assembly. In use, the support assembly is connected to a scanning frame placed on the surface of the workpiece, the probe is fixed inside the probe frame, and the probe frame is in close contact with the surface of the workpiece.

[0006] Furthermore, the number of elastic elements is two, symmetrically arranged on the left and right sides of the elastic component.

[0007] Furthermore, the elastic component includes an elastic arm, and ear plates are provided on the upper left and right sides of the elastic arm. The upper ends of the two elastic elements are respectively connected to an ear plate by bolts, and one end of the bolt extends above the upper surface of the support component.

[0008] Furthermore, the support assembly includes a support arm, which is located on the upper part of the elastic arm on the side away from the probe frame. A slider is provided between the support arm and the elastic arm, and a groove is provided on the side of the slider near the elastic arm. The elastic arm is inserted into the groove and slidably connected to the slider. The elastic element is located on both sides of the slider, and the lower end of the elastic element is connected to the lower part of the side of the support arm near the elastic arm.

[0009] Furthermore, a slider seat is fixed on the side of the support arm away from the elastic arm, and the slider seat is detachably connected to the scanning frame.

[0010] Furthermore, a slot is provided on the side of the slider seat away from the support arm, and a bolt is screwed onto the top surface of the slider seat. The scanning frame is locked in the slot, and the lower end of the bolt abuts against the scanning frame.

[0011] Furthermore, the probe clamping device also includes an extension arm, which is vertically arranged and its lower end is fixed to an outer side wall of the probe frame. A groove is provided on one vertical side surface of the extension arm, and the lower part of the elastic arm is placed in the groove and can be detachably connected to the extension arm.

[0012] This utility model discloses an automatic probe clamping device for attaching the probe to the workpiece. This device is used to fix ultrasonic phased array probes for pipe welds. During the inspection process, it ensures that the probe remains in contact with the workpiece surface, meeting coupling requirements. It allows for quick disassembly and is compatible with different scanners. This significantly reduces on-site measurement time, meets the inspection requirements of different pipe diameters, ensures inspection accuracy, and improves inspection efficiency. Attached Figure Description

[0013] Figure 1 is a perspective view of the probe clamping device for automatically fitting the probe to the workpiece according to the present invention.

[0014] Figure 2 is a front view of the probe clamping device for automatically fitting the probe to the workpiece according to this utility model.

[0015] Figure 3 is a side view of the probe clamping device for automatically fitting the probe to the workpiece according to the present invention.

[0016] Among them, 1-probe frame, 2-elastic arm, 3-spring, 4-ear plate, 5-bolt, 6-support arm, 7-slider, 8-slider seat, 9-screw, 10-extension arm. Detailed Implementation

[0017] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0018] As shown in Figures 1-3, a probe clamping device for automatically fitting a probe to a workpiece includes a probe frame 1 and a support assembly. An elastic component extending vertically upward is fixed on one side of the probe frame 1. The support assembly and the elastic component are slidably connected vertically. An elastic element extending vertically is connected between the support assembly and the elastic component. The upper end of the elastic element is connected to the upper part of the elastic component, and the lower end of the elastic element is connected to the lower part of the support assembly. In use, the support assembly is connected to a scanning frame (not shown in the figures) placed on the surface of the workpiece, and the probe (not shown in the figures) is fixed inside the probe frame 1, with the probe frame 1 tightly attached to the surface of the workpiece.

[0019] Specifically, there are two elastic elements, symmetrically arranged on the left and right sides of the elastic assembly. In this embodiment, the elastic element is a spring 3.

[0020] The elastic component includes an elastic arm 2, and ear plates 4 are provided on the upper left and right sides of the elastic arm 2. The upper ends of the two springs 3 are respectively connected to an ear plate 4 by bolts 5, and one end of the bolts 5 extends above the upper surface of the support component.

[0021] The support assembly includes a support arm 6, which is located on the upper part of the elastic arm 2 on the side away from the probe frame 1. A slider 7 is provided between the support arm 6 and the elastic arm 2. A groove is provided on the side of the slider 7 near the elastic arm 2. The elastic arm 2 is inserted into the groove and slidably connected to the slider 7. A spring 3 is located on both sides of the slider 7. The lower end of the spring 3 is connected to the lower part of the side of the support arm 6 near the elastic arm 2.

[0022] To facilitate the connection between the support assembly and the scanning frame, in some embodiments, a slider seat 8 is fixed on the side of the support arm 6 away from the elastic arm 2. The slider seat 8 has a slot on the side away from the support arm 6, and a screw 9 is screwed onto the top surface of the slider seat 8. The scanning frame is engaged in the slot, and the lower end of the screw 9 abuts against the scanning frame. The slider seat 8 and the scanning frame are detachably connected.

[0023] To further increase the adjustable overall length of the probe clamping device in the height direction, in some embodiments, the probe clamping device further includes an extension arm 10, which is vertically arranged and its lower end is fixed to an outer side wall of the probe frame 1. A groove is provided on one vertical side surface of the extension arm 10, and the lower part of the elastic arm 2 is placed in the groove and is detachably connected to the extension arm 10.

[0024] Those skilled in the art should understand that the above description is merely a specific embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A probe chucking device for automatically attaching a probe to a workpiece, characterized by, The device includes a probe frame and a support assembly. An elastic component extending vertically upward is fixed to one side of the probe frame. The support assembly and the elastic component are slidably connected vertically. An elastic element that extends vertically is connected between the support assembly and the elastic component. The upper end of the elastic element is connected to the upper part of the elastic component, and the lower end of the elastic element is connected to the lower part of the support assembly. In use, the support assembly is connected to a scanning frame placed on the surface of a workpiece, and the probe is fixed inside the probe frame, with the probe frame in close contact with the surface of the workpiece.

2. The probe clamping device for automatic probe-to-workpiece contact according to claim 1, characterized in that, The number of elastic elements is two, and they are symmetrically arranged on the left and right sides of the elastic component.

3. The probe chucking device for automatically attaching a workpiece to a probe according to claim 2, wherein The elastic component includes an elastic arm, and ear plates are provided on the upper left and right sides of the elastic arm. The upper ends of the two elastic elements are respectively connected to an ear plate by bolts, and one end of the bolt extends above the upper surface of the support component.

4. The probe chucking device for automatically attaching a probe to a workpiece according to claim 3, wherein The support assembly includes a support arm, which is located on the upper part of the elastic arm on the side away from the probe frame. A slider is provided between the support arm and the elastic arm. A groove is provided on the side of the slider near the elastic arm. The elastic arm is inserted into the groove and slidably connected to the slider. Elastic elements are located on both sides of the slider. The lower end of the elastic element is connected to the lower part of the side of the support arm near the elastic arm.

5. The probe chucking apparatus for automatically attaching a probe to a workpiece according to claim 4, wherein A slider seat is fixed on the side of the support arm away from the elastic arm, and the slider seat is detachably connected to the scanning frame.

6. The probe clamping device for automatically fitting the probe to the workpiece according to claim 5, characterized in that, The slider seat has a slot on the side away from the support arm, and a bolt is screwed onto the top surface of the slider seat. The scanning frame is locked in the slot, and the lower end of the bolt abuts against the scanning frame.

7. The probe chucking apparatus for automatically attaching a probe to a workpiece according to claim 3, wherein The probe clamping device also includes an extension arm, which is vertically arranged and its lower end is fixed to an outer side wall of the probe frame. A groove is provided on one vertical side surface of the extension arm, and the lower part of the elastic arm is placed in the groove and can be detachably connected to the extension arm.

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