Operational amplifier test equipment

Abstract

The utility model discloses an operational amplifier test device, which comprises a single chip microcomputer, a power supply noise superposition module, an operational amplifier module to be tested, an amplification module and an upper computer, the power supply noise superposition module is electrically connected with the single chip microcomputer to receive PWM signals of the single chip microcomputer, and the power supply noise superposition module carries out voltage division and voltage superposition processing on the PWM signals. The power supply noise superposition module is electrically connected with the to-be-tested operational amplifier module and provides power for the amplification module, the amplification module is electrically connected with the to-be-tested operational amplifier module and receives noise output by the to-be-tested operational amplifier module, the amplification module amplifies the noise, the single-chip microcomputer is electrically connected with the amplification module, the single-chip microcomputer samples the noise to obtain a data signal, and the data signal is transmitted to the power supply noise superposition module. The upper computer is electrically connected with the single-chip microcomputer and receives the data signal, the upper computer analyzes the data signal to generate a corresponding analysis report, the noise influence of an interference source is reduced, and the stability of the detection operational amplifier is improved.

Description

Technical Field

[0001] This utility model relates to the field of testing technology, and in particular to an operational amplifier testing device. Background Technology

[0002] With the development of modern electronic technology, the requirements for the stability of integrated operational amplifiers are becoming increasingly stringent. General-purpose testing methods and instruments are gradually becoming insufficient to meet all performance testing needs. In practical applications, operational amplifiers are often affected by noise from power lines and other external interference sources. Utility Model Content

[0003] The purpose of this invention is to address the technical problems existing in the background art by proposing an operational amplifier testing device.

[0004] To achieve the above-mentioned technical objectives, the technical solution adopted by this utility model in the first aspect is as follows:

[0005] An operational amplifier (op-amp) testing device includes a microcontroller, a power supply noise superposition module, an op-amp module under test (DUT), an amplification module, and a host computer. The power supply noise superposition module is electrically connected to the microcontroller to receive PWM signals from the microcontroller. The power supply noise superposition module performs voltage division and superposition processing on the PWM signals. The power supply noise superposition module is electrically connected to the op-amp module under test and provides power to the amplification module. The amplification module is electrically connected to the op-amp module under test and receives the noise output by the op-amp module under test. The amplification module amplifies the noise. The microcontroller is electrically connected to the amplification module and samples the noise to obtain data signals. The host computer is electrically connected to the microcontroller and receives the data signals. The host computer analyzes the data signals to generate corresponding analysis reports.

[0006] Preferably, the power supply noise superposition module includes a voltage divider unit and a superposition unit. The voltage divider unit is used to reduce the voltage amplitude, and the superposition unit is used to output a fixed DC voltage. The microcontroller and the power supply noise superposition module are electrically connected to the voltage divider unit and the superposition unit, respectively. The PWM signal of the microcontroller is processed by the voltage divider unit to reduce the voltage amplitude, and then the fixed DC voltage is superimposed by the superposition unit.

[0007] Preferably, the power supply noise superposition module further includes an operational amplifier. The input terminal of the operational amplifier is electrically connected to the microcontroller, and the output terminal of the operational amplifier is electrically connected to the operational amplifier module under test. The operational amplifier is used to receive and amplify the PWM signal processed by the voltage divider unit and the superposition unit, and input the amplified PWM signal as the power input of the operational amplifier module under test.

[0008] Preferably, the operational amplifier is electrically connected to an adjustment resistor, which is used to adjust the amplitude of the square wave superimposed on the PWM signal.

[0009] Preferably, the operational amplifier used is the LM358.

[0010] Preferably, the amplification module includes a second-order low-pass amplifier, which is used to receive noise from the operational amplifier module under test and amplify the noise to output an amplified voltage.

[0011] Preferably, the second-order low-pass amplifier used is the LMV721.

[0012] Preferably, the microcontroller used is an STM32F030F4.

[0013] Compared with the prior art, the utility model has the following beneficial technical effects: it includes a microcontroller, a power supply noise superposition module, an operational amplifier module under test (op-amp) module, an amplification module, and a host computer. The power supply noise superposition module is electrically connected to the microcontroller to receive the PWM signal from the microcontroller. The power supply noise superposition module performs voltage division and superposition processing on the PWM signal. The power supply noise superposition module is electrically connected to the op-amp module under test and provides power to the amplification module. The amplification module is electrically connected to the op-amp module under test and receives the noise output by the op-amp module under test. The amplification module amplifies the noise. The microcontroller is electrically connected to the amplification module and samples the noise to obtain a data signal. The host computer is electrically connected to the microcontroller and receives the data signal. The host computer analyzes the data signal to generate a corresponding analysis report, thereby reducing the noise influence of interference sources and improving the stability of the tested op-amp. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of an embodiment of the present utility model. Figure 1 ;

[0015] Figure 2 This is a schematic diagram of the structure of an embodiment of the present utility model. Figure 2 ;

[0016] Figure 3 This is a circuit diagram illustrating the structure of an embodiment of the present invention.

[0017] Icon labels:

[0018] 100 microcontroller

[0019] 200 Power supply noise superposition module, 201 Voltage divider unit, 202 Superposition unit, 203 Operational amplifier, 204 Adjustable resistor.

[0020] 300 operational amplifier modules under test

[0021] 400 Amplification Module

[0022] 500 host computer. Detailed Implementation

[0023] It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0024] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or assembly referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first," "second," etc., may explicitly or implicitly include one or more features. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0025] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a link, or a specific connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the connection within two groups. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0026] The specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings.

[0027] like Figure 1-3 As shown, this utility model proposes an operational amplifier testing device, which includes a microcontroller 100, a power supply noise superposition module 200, an operational amplifier module under test 300, an amplification module 400, and a host computer 500. The power supply noise superposition module 200 is electrically connected to the microcontroller 100 to receive the PWM signal from the microcontroller 100. The power supply noise superposition module 200 performs voltage division and voltage superposition processing on the PWM signal. The power supply noise superposition module 200 is electrically connected to the operational amplifier module under test 300 and provides power to the amplification module 400. The amplification module 400 is electrically connected to the operational amplifier module under test 300 and receives the noise output by the operational amplifier module under test 300. The amplification module 400 amplifies the noise. The microcontroller 100 is electrically connected to the amplification module 400 and samples the noise to obtain a data signal. The host computer 500 is electrically connected to the microcontroller 100 and receives the data signal. The host computer 500 analyzes the data signal to generate a corresponding analysis report.

[0028] Specifically, the operational amplifier module 300 under test is placed in the operational amplifier testing equipment, and its input and output terminals are connected to the corresponding power supply noise superposition module 200 and amplification module 400, respectively. The microcontroller 100 outputs a PWM signal to the power supply noise superposition module 200. When the PWM signal is transmitted to the power supply noise superposition module 200, it needs to undergo voltage division and superposition processing. This is to reduce the voltage amplitude of the PWM signal to adapt to the input range of the amplifier. A fixed DC voltage is superimposed using a simple resistor or capacitor network to ensure electrical compatibility between the DC voltage and the PWM signal, as well as compatibility with the power supply noise superposition module 200. The input signals at the input and output ends are processed by the power supply noise superposition module 200, which amplifies the processed PWM signal and uses the amplified PWM signal as the power input of the operational amplifier module under test to evaluate its anti-interference capability against power supply noise. Then, the operational amplifier module under test 300 releases noise, which is received and amplified several times by the amplification module 400. The amplification factor is determined by the amplifier model used and the user requirements. The amplified noise signal is transmitted in voltage form and collected by the microcontroller 100. The microcontroller sends the collected data to the host computer through the serial port for analysis. After the analysis is completed, a report can be generated. This reduces noise from other interference sources during operational amplifier testing, thereby improving testing efficiency and effectiveness.

[0029] The microcontroller used in the 100 series is an STM32F030F4.

[0030] Furthermore, the power supply noise superposition module 200 includes a voltage divider unit 201 and a superposition unit 202. The voltage divider unit 201 is used to reduce the voltage amplitude, and the superposition unit 202 is used to output a fixed DC voltage. The microcontroller 100 and the power supply noise superposition module 200 are electrically connected to the voltage divider unit 201 and the superposition unit 202, respectively. The PWM signal of the microcontroller 100 is processed by the voltage divider unit 201 to reduce the voltage amplitude, and then the fixed DC voltage is superimposed by the superposition unit 202.

[0031] Specifically, since the duty cycle of the PWM signal can be adjusted, the voltage of the PWM signal after passing through the voltage divider unit 201 will also change with the change of the duty cycle. By adjusting the parameters of the voltage divider circuit in the voltage divider unit 201 and the superimposed DC voltage value, the output signal can be better matched with the input requirements of the subsequent circuit, thereby improving the signal compatibility and stability of the entire system. In addition, this method can also achieve some special control effects, such as bias adjustment and signal enhancement, by superimposing DC voltage.

[0032] Furthermore, the power supply noise superposition module 200 also includes an operational amplifier 203. The input terminal of the operational amplifier 203 is electrically connected to the microcontroller 100, and the output terminal of the operational amplifier 203 is electrically connected to the operational amplifier module under test 300. The operational amplifier 203 is used to receive and amplify the PWM signal processed by the voltage divider unit 201 and the superposition unit 202, and input the amplified PWM signal as the power input of the operational amplifier module under test 300. The operational amplifier 203 is electrically connected to an adjustment resistor 204, which is used to adjust the amplitude of the square wave superimposed on the PWM signal. The operational amplifier 203 is an LM358.

[0033] The amplifier module 400 includes a second-order low-pass amplifier, which is used to receive the noise from the operational amplifier module 300 under test and amplify the noise to output the amplified voltage. The second-order low-pass amplifier used is an LMV721.

[0034] The above description provides one or more embodiments in conjunction with specific content, but it is not intended that the specific implementation of this utility model is limited to these descriptions. Any methods or structures that are similar to or identical to those of this utility model, or any technical deductions or substitutions made based on the concept of this utility model, should be considered within the scope of protection of this utility model.

Claims

1. An operational amplifier testing device, characterized in that, It includes a microcontroller (100), a power supply noise superposition module (200), an operational amplifier module under test (300), an amplification module (400), and a host computer (500). The power supply noise superposition module (200) is electrically connected to the microcontroller (100) to receive the PWM signal from the microcontroller (100). The power supply noise superposition module (200) is used to perform voltage division and voltage superposition processing on the PWM signal. The power supply noise superposition module (200) is also electrically connected to the operational amplifier module under test (300) and provides power to the amplification module (400). The amplification module (400) is electrically connected to the operational amplifier module under test (300). The amplifier module (400) receives and amplifies the noise output by the operational amplifier module (300) under test. The microcontroller (100) is electrically connected to the amplifier module (400). The microcontroller (100) is also used to sample the noise to obtain a data signal. The host computer (500) is electrically connected to the microcontroller (100) and receives the data signal. The host computer (500) is also used to analyze the data signal to generate a corresponding analysis report.

2. The operational amplifier testing device according to claim 1, characterized in that, The power supply noise superposition module (200) includes a voltage divider unit (201) and a superposition unit (202). The voltage divider unit (201) is used to reduce the voltage amplitude, and the superposition unit (202) is used to output a fixed DC voltage. The microcontroller (100) and the power supply noise superposition module (200) are electrically connected to the voltage divider unit (201) and the superposition unit (202) respectively. The PWM signal of the microcontroller (100) is processed by the voltage divider unit (201) to reduce the voltage amplitude, and then the fixed DC voltage is superimposed by the superposition unit (202).

3. The operational amplifier testing device according to claim 2, characterized in that, The power supply noise superposition module (200) further includes an operational amplifier (203). The input terminal of the operational amplifier (203) is electrically connected to the microcontroller (100), and the output terminal of the operational amplifier (203) is electrically connected to the operational amplifier module under test (300). The operational amplifier (203) is used to receive and amplify the PWM signal processed by the voltage divider unit (201) and the superposition unit (202), and input the amplified PWM signal as the power input of the operational amplifier module under test (300).

4. The operational amplifier testing device according to claim 3, characterized in that, The operational amplifier (203) is electrically connected to an adjustment resistor (204), which is used to adjust the amplitude of the square wave superimposed on the PWM signal.

5. The operational amplifier testing device according to claim 4, characterized in that, The operational amplifier (203) is an LM358.

6. The operational amplifier testing device according to claim 1, characterized in that, The amplification module (400) includes a second-order low-pass amplifier, which is used to receive noise from the operational amplifier module (300) under test and amplify the noise to output an amplified voltage.

7. The operational amplifier testing device according to claim 6, characterized in that, The second-order low-pass amplifier used is an LMV721.

8. The operational amplifier testing device according to claim 1, characterized in that, The microcontroller (100) used is an STM32F030F4.

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