Soft contact type chip test structure

Abstract

The utility model relates to the field of chip test equipment, and discloses a soft contact type chip test structure, which comprises a first plate seat, the first plate seat comprises a first surface and a second surface which are opposite to each other, the first surface is provided with at least one first limiting groove, and the second surface is provided with a second limiting groove penetrating through the first limiting groove correspondingly. A limiting frame for limiting the chip and conductive adhesive are arranged in the first limiting groove and the second limiting groove in a limiting mode respectively, and the conductive adhesive comprises a conductive adhesive fixing frame and an insulating fixing part fixed in the conductive adhesive fixing frame, and one end of the insulating fixing part extends to the corresponding end of the limiting frame in the first limiting groove; elastic conductive columns penetrating and protruding out of the two ends are arranged in the insulation fixing part at intervals, a plurality of limiting fixing holes are formed in the periphery of the conductive adhesive fixing frame, and fixing limiting columns matched with the limiting fixing holes to elastically limit and fix the conductive adhesive are arranged at the positions, corresponding to the limiting fixing holes, in the second limiting groove. And the conductive adhesive is not easy to fall off and damage while the mounting and dismounting are simple.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment and devices, and in particular to a soft-contact chip testing structure. Background Technology

[0002] Chip testing equipment is widely used in semiconductor manufacturing, quality control, electronics, information technology, and automotive industries. In semiconductor manufacturing, it is used for wafer-level testing and post-packaging testing to analyze chip performance and ensure chip quality.

[0003] Existing chip testing structures generally include a chip testing structure for fixing the chip, a test circuit board for testing the chip, and conductive adhesive or a conductive block with elastic pins for connecting and switching the chip and the test circuit board.

[0004] Existing methods for fixing conductive adhesive typically involve screws or metal fixing posts connected to mounting holes in the conductive adhesive frame. Screw fixing leads to a complex structure; the screws require specially made, very thin nuts, and are difficult to operate with ordinary screwdrivers. Excessive force can damage the conductive adhesive, while insufficient force can cause the screw to fall off. Using metal fixing posts with mounting holes in the conductive adhesive frame presents challenges. The metal fixing posts lack elasticity, and the conductive adhesive frame, which needs sufficient rigidity to hold the insulating blocks on the conductive adhesive, has a low tolerance for elastic deformation. Therefore, even slight mismatches can lead to easy detachment or failure to install, damaging the conductive adhesive frame. Sometimes adhesive is used as an auxiliary method, but this can cause contamination to the structure. Utility Model Content

[0005] This utility model provides a soft-contact chip testing structure, which solves the technical problems of existing conductive adhesive fixing installation being inconvenient and prone to falling off or being damaged.

[0006] The technical solution adopted by this utility model to solve its technical problem is: a soft-contact chip testing structure, including a first board base, the first board base including a first surface and a second surface opposite to each other, the first surface is provided with at least one first limiting groove and the second surface is provided with a second limiting groove corresponding to the first limiting groove, penetrating through the first limiting groove, a limiting frame for limiting the chip is provided in the first limiting groove, and conductive adhesive is provided in the second limiting groove, the conductive adhesive including a conductive adhesive fixing frame and an insulating fixing part fixed in the conductive adhesive fixing frame and extending one end to the end of the limiting frame in the first limiting groove corresponding to the first limiting groove, the insulating fixing part is provided with elastic conductive posts protruding from both ends through the insulating fixing part, the outer periphery of the conductive adhesive fixing frame is provided with multiple limiting fixing holes, and the second limiting groove is provided with fixing limiting posts at positions corresponding to the limiting fixing holes, which cooperate with the limiting fixing holes to elastically limit and fix the conductive adhesive. Installation and disassembly are simple, and the conductive adhesive is not easily detached or damaged.

[0007] Furthermore, it also includes a second board holder, on which a test circuit board limiting structure is provided at a position corresponding to the second limiting groove. The test circuit board limiting structure limits a test circuit board for testing chips. On the second surface of the first board holder, around the second limiting groove, a clearance groove structure is provided for accommodating the test circuit board and electronic components on the test circuit board. This effectively protects the elastic conductive pillars on the conductive adhesive during assembly, preventing accidental contact with these pillars during assembly and disassembly, which could damage the high-precision conductive adhesive.

[0008] Furthermore, the first and second plate bases are respectively provided with docking limiting structures, and the first and second plate bases are respectively provided with locking structures for locking the first and second plate bases. This design facilitates easy installation and removal when the conductive adhesive needs to be disassembled and replaced; simply opening and closing the locking structures is sufficient, eliminating the need for repeated disassembly and assembly using bolts and other components. The structure is stable and highly efficient.

[0009] Furthermore, a fixing hole is provided in the second limiting groove on the first plate base, and the fixing limiting post includes a fixing post with one end fixed in the fixing hole and an elastic limiting sleeve sleeved on the fixing post.

[0010] The structure is simple and achieves elastic positioning and fixing of conductive adhesive by matching the fixed limiting post and the limiting fixing hole.

[0011] Furthermore, the fixing post includes a first post, a second post coaxially fixed to the upper end of the first post, and a frustum coaxially fixed to the upper end of the second post. The diameter of the first post is larger than the diameter of the second post. One end of the frustum connected to the second post is the first end, and the other end is the second end. The diameter of the first end of the frustum is smaller than the diameter of the second end, and the diameter of the first end is larger than the diameter of the second post. The elastic limiting sleeve is cylindrical in shape and has a cavity inside that matches and fits onto the second post and the frustum. The first post is fixed in the fixing hole, and at this time, the second post and the corresponding elastic limiting sleeve are at least partially located in the fixing hole. The thickness of the conductive adhesive fixing frame is less than the height of the fixing post protruding from the fixing hole. When the fixing limiting post and the limiting fixing hole are used to elastically limit and fix the conductive adhesive, the second end of the frustum passes through the limiting fixing hole and protrudes to the other end of the limiting fixing hole. The natural outer diameter of the elastic limiting sleeve after it is fitted onto the fixing post is larger than the inner diameter of the limiting fixing hole. The minimum effective outer diameter of the elastic limiting sleeve after it is fitted onto the fixing post is smaller than the inner diameter of the limiting fixing hole. Effectively limits the conductive adhesive, preventing it from falling off.

[0012] Furthermore, the first limiting groove is provided with multiple first magnetic components, and the limiting frame is provided with second magnetic components that are attracted to the first magnetic components at positions corresponding to them. The limiting frame is easy to install and remove, facilitating maintenance and repair of the test structure.

[0013] Furthermore, the first plate base has mating bosses extending away from the first surface at both ends of the second surface, and a mating recess corresponding to the mating bosses is provided on the opposite side of the second plate base. A fixing boss is provided on the side of the second plate base away from the first plate base, corresponding to the mating recess. When placed alone, the conductive adhesive on it is less likely to come into contact with the outside world, preventing accidental damage to the conductive adhesive and reducing interference from the test platform to the test structure.

[0014] Furthermore, the docking limiting structure includes multiple through docking limiting holes located at the docking boss positions on the first plate base and docking limiting posts located at the docking recess positions on the second plate base, corresponding to the docking limiting holes. The upper end of each docking limiting post is located below the upper surface of the second plate base, and the end of each docking limiting post corresponding to the docking limiting hole is provided with a smooth guide arc surface. This makes it more aesthetically pleasing and less prone to accidental deformation.

[0015] Furthermore, the first and second plate seats have through threaded fixing holes at the corresponding positions of the mating bosses and recesses. This enhances the practicality of the test structure. Attached Figure Description

[0016] Figure 1 This is an exploded view of the lower part of the present invention;

[0017] Figure 2 This is an exploded view of the upper structure of this utility model;

[0018] Figure 3 This is a top view schematic diagram of the structure of this utility model;

[0019] Figure 4 This is an enlarged cross-sectional schematic diagram of the fixed limiting post and the elastic limiting sleeve.

[0020] The components are labeled as follows: First plate base 100, docking limiting hole 101, first limiting groove 110, first magnetic component 111, second limiting groove 120, clearance groove structure 130, docking boss 140, limiting frame 200, second magnetic component 210, conductive adhesive fixing frame 310, limiting fixing hole 311, insulating fixing part 320, elastic conductive post 330, fixed limiting post 400, first column 411, second column 412, frustum 413, elastic limiting sleeve 420, second plate base 500, docking limiting post 501, test circuit board limiting structure 510, docking recess 520, fixed boss 530, test circuit board 600, and locking structure 700. Detailed Implementation

[0021] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0022] like Figure 1 The soft-contact chip testing structure shown includes a first board base 100, which includes a first surface and a second surface opposite to each other. The first surface is provided with at least one first limiting groove 110, and the second surface is provided with a second limiting groove 120 corresponding to the first limiting groove 110 and penetrating through it. A limiting frame 200 for limiting the chip is provided in the first limiting groove 110. Conductive adhesive is provided in the second limiting groove 120. The conductive adhesive includes a conductive adhesive fixing frame 310 and an insulating fixing part 320 fixed in the conductive adhesive fixing frame 310 and extending to the end of the limiting frame 200 in the first limiting groove 110. Elastic conductive posts 330 protruding from both ends are arranged in a partitioned manner in the insulating fixing part 320. A plurality of limiting fixing holes 311 are provided around the conductive adhesive fixing frame 310. A fixing limiting post 400 is provided in the second limiting groove 120 at a position corresponding to the limiting fixing hole 311 and cooperates with the limiting fixing hole 311 to elastically limit and fix the conductive adhesive. In this specific embodiment, the first plate holder 100 is provided with four first limiting grooves 110, which can test multiple chips simultaneously, resulting in high efficiency. Corresponding to the first limiting grooves 110, the first plate holder 100 is also provided with a chip outer surface limiting mechanism that cooperates to press the chip tightly within the limiting frame 200, allowing the chip's test pins to elastically connect with the elastic conductive posts 330 on the insulating fixing part 320. The chip outer surface limiting mechanism is fixed to the first plate holder 100 by a hinge, and has elastic pressure blocks on it for limiting and pressing the outer surface of the chip. In practical applications, the chip outer surface limiting mechanism can also be an elastic compression structure combined with an external automated machine, thus applying the soft-contact chip testing structure of this invention to an automated testing machine. The conductive adhesive is directly and elastically fixed and limited through the limiting fixing holes 311 on it in conjunction with the fixing limiting posts 400, making installation and disassembly simple while preventing the conductive adhesive from easily falling off or being damaged.

[0023] Based on the above, such as Figure 1 and Figure 2 As shown, the system also includes a second board holder 500. A test circuit board limiting structure 510 is provided on the second board holder 500 at a position corresponding to the second limiting groove 120. The test circuit board limiting structure 510 limits a test circuit board 600 for testing chips. A clearance groove structure 130 is provided around the second limiting groove 120 on the second surface of the first board holder 100 to accommodate the test circuit board 600 and the electronic components on it. In a specific implementation, the clearance groove structure 130 and the test circuit board limiting structure 510 jointly limit and accommodate the test circuit board, ensuring that the conductive adhesive and the end corresponding to the test circuit board 600 do not protrude beyond the second surface before assembly. This effectively protects the elastic conductive posts 330 on the conductive adhesive during assembly, preventing accidental contact with the elastic conductive posts 330 during assembly and disassembly, thus avoiding damage to the high-precision conductive adhesive.

[0024] Based on the above, such as Figures 1 to 3 As shown, the first plate base 100 and the second plate base 500 are respectively provided with docking limiting structures, and the first plate base 100 and the second plate base 500 are respectively provided with locking structures 700 for locking the first plate base 100 and the second plate base 500.

[0025] In this specific implementation, the locking structure 700 includes fasteners located on both sides of the first plate base 100. The two ends of the fasteners are respectively located on the upper and lower sides of the end of the first plate base 100, and the middle part is fixed to the first plate base 100 via a pivot. Multiple springs are provided between the end of the first plate base 100 and the fasteners. Without external force, the multiple springs exert a force on the upper part of the fastener located on the pivot, away from the end of the first plate base 100. Pressing compresses the springs, causing the lower end of the fastener to rotate outward and open. After the pressing force is removed, the fastener is pressed inward by the springs. The second plate base 5... The end of the fastener has a recessed locking recess corresponding to the fastener. When the fastener is pressed inward by the spring, the protrusion at the lower end of the fastener engages with the locking recess, so that the first plate seat 100 and the second plate seat 500 are elastically locked together. The first plate seat 100 is provided with four first limiting grooves 110, which limit and fix the chip in the limiting frame 200. Multiple chips can be tested at one time. When it is necessary to disassemble and replace the conductive adhesive, it is convenient to install and remove. Only the locking structure 700 needs to be opened and closed. There is no need to repeatedly disassemble and reassemble through bolts and other parts. The structure is stable and efficient.

[0026] Based on the above, such as Figure 1 , Figure 2 and Figure 4As shown, a fixing hole is provided in the second limiting groove 120 on the first plate base 100. The fixing limiting post 400 includes a fixing post with one end fixed in the fixing hole and an elastic limiting sleeve 420 sleeved on the fixing post. The structure is simple and realizes that the fixing limiting post 400 and the limiting fixing hole 311 cooperate to elastically limit and fix the conductive adhesive.

[0027] Based on the above, such as Figure 1 , Figure 2 and Figure 4 As shown, the fixing column includes a first column 411, a second column 412 coaxially fixed to the upper end of the first column 411, and a frustum 413 coaxially fixed to the upper end of the second column 412. The diameter of the first column 411 is larger than the diameter of the second column 412. One end of the frustum 413 connected to the second column 412 is the first end, and the other end is the second end. The diameter of the first end of the frustum 413 is smaller than the diameter of the second end, and the diameter of the first end is larger than the diameter of the second column 412. The elastic limiting sleeve 420 is cylindrical in shape and has a cavity inside that matches and is fitted onto the second column 412 and the frustum 413. The first column 411... 1. The second column 412 and the corresponding elastic limiting sleeve 420 are at least partially located in the fixing hole. The thickness of the conductive adhesive fixing frame 310 is less than the height of the fixing column protruding from the fixing hole. When the fixing limiting column 400 cooperates with the limiting fixing hole 311 to elastically limit and fix the conductive adhesive, the second end of the frustum 413 passes through the limiting fixing hole 311 and protrudes to the other end of the limiting fixing hole 311. The natural outer diameter of the elastic limiting sleeve 420 after being fitted onto the fixing column is greater than the inner diameter of the limiting fixing hole 311. The minimum effective outer diameter of the elastic limiting sleeve 420 after being fitted onto the fixing column is less than the inner diameter of the limiting fixing hole 311. In this specific embodiment, both the second end of the frustum 413 and the corresponding end of the elastic limiting sleeve 420 are provided with smooth guide surfaces to facilitate the insertion and fixing of the fixing post and the elastic limiting sleeve 420. In specific implementation, the setting of the second post 412 effectively fixes the elastic limiting sleeve 420, preventing the elastic limiting sleeve 420 from falling off during the insertion and fixing and disassembly process of the fixing post and the elastic limiting sleeve 420. The setting of the frustum 413 makes the elastic force on the outer end of the limiting fixing hole 311 greater than the elastic force on the inner end after the elastic limiting sleeve 420 elastically contacts the inner wall of the limiting fixing hole 311, and the combined elastic force on the inner side effectively limits the conductive adhesive and prevents the conductive adhesive from falling off.

[0028] Based on the above, such as Figure 1 and Figure 2As shown, a plurality of first magnetic components 111 are disposed within the first limiting groove 110, and a second magnetic component 210 is disposed on the limiting frame 200 at a position corresponding to the first magnetic components 111, which is attracted to each other. In this specific embodiment, both the first magnetic component 111 and the second magnetic component 210 are columnar permanent magnets and are respectively located in the mounting cavities on the first limiting groove 110 and the limiting frame 200; the limiting frame 200 is easy to install and remove, facilitating maintenance and repair of the test structure.

[0029] Based on the above, such as Figure 1 and Figure 2 As shown, the first plate base 100 has mating bosses 140 extending away from the first surface at both ends of the second surface. The second plate base 500 has mating recesses 520 corresponding to the mating bosses 140 at the corresponding positions on the opposite side of the second plate base 100. The second plate base 500 has fixing bosses 530 at the corresponding positions on the side away from the first plate base 100. In specific implementations, the mating bosses 140 and 520 can initially position the first plate base 100 and the second plate base 500. The downward-protruding mating bosses 140 on the first plate base 100 make it less likely for the conductive adhesive on the first plate base 100 to come into contact with the outside when placed alone, preventing accidental damage to the conductive adhesive. The fixing bosses 530, when placed after the first plate base 100 and the second plate base 500 are assembled, act as support feet, raising and suspending the main body of the test structure, reducing interference from the test platform to the test structure.

[0030] Based on the above, such as Figures 1 to 3 As shown, the docking limiting structure includes multiple through docking limiting holes 101 disposed on the docking boss 140 on the first plate base 100 and docking limiting posts 501 disposed on the docking recess 520 on the second plate base 500, which correspond to the docking limiting holes 101. The upper end of the docking limiting post 501 is located below the upper surface of the second plate base 500, and the end of the docking limiting post 501 corresponding to the docking limiting hole 101 is provided with a smooth guide arc surface. In specific implementation, the docking limiting post 501 is located below the overall upper plate structure of the second plate base 500, which is more aesthetically pleasing and less likely to cause accidental deformation. The cooperation of the docking limiting holes 101, the docking limiting post 501, the docking boss 140, and the docking recess 520 achieves high-precision docking limiting of the first plate base 100 and the second plate base 500.

[0031] Based on the above, such as Figure 1 and Figure 2As shown, the first plate holder 100 and the second plate holder 500 are provided with through threaded fixing holes at corresponding positions of the mating boss 140 and the mating recess 520. In specific implementations, the first plate holder 100 and the second plate holder 500 can be fixed together with bolts according to actual needs. Alternatively, the first plate holder 100 and the second plate holder 500 can be fixed to corresponding positions on automated machine tools or manual operating tables with bolts, making the testing structure more practical.

[0032] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of this utility model. It should be understood that the above descriptions are merely specific embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A soft-contact chip testing structure, characterized in that: The first board base (100) includes a first surface and a second surface opposite to each other. At least one first limiting groove (110) is provided on the first surface, and a second limiting groove (120) corresponding to and penetrating the first limiting groove (110) is provided on the second surface. A limiting frame (200) for limiting a chip is provided within the first limiting groove (110), and conductive adhesive is provided within the second limiting groove (120). The conductive adhesive includes a conductive adhesive fixing frame (310) and a component fixed to the conductive adhesive fixing frame (310). 10) An insulating fixing part (320) is provided inside the first limiting groove (110) and one end extends to the corresponding end of the limiting frame (200). The insulating fixing part (320) is provided with elastic conductive posts (330) that protrude through both ends. The outer periphery of the conductive adhesive fixing frame (310) is provided with multiple limiting fixing holes (311). The second limiting groove (120) is provided with a fixing limiting post (400) that cooperates with the limiting fixing hole (311) to elastically limit and fix the conductive adhesive.

2. The soft-contact chip testing structure according to claim 1, characterized in that: It also includes a second board base (500), on which a test circuit board limiting structure (510) is provided at a position corresponding to the second limiting groove (120). A test circuit board (600) for testing chips is limited in the test circuit board limiting structure (510). A clearance groove structure (130) for accommodating the test circuit board (600) and electronic devices on the test circuit board (600) is provided on the periphery of the second limiting groove (120) on the second surface of the first board base (100).

3. The soft-contact chip testing structure according to claim 2, characterized in that: The first plate base (100) and the second plate base (500) are respectively provided with docking limiting structures, and the first plate base (100) and the second plate base (500) are respectively provided with locking structures (700) for locking the first plate base (100) and the second plate base (500).

4. The soft-contact chip testing structure according to claim 2, characterized in that: A fixing hole is provided in the second limiting groove (120) on the first plate base (100). The fixing limiting post (400) includes a fixing post with one end fixed in the fixing hole and an elastic limiting sleeve (420) sleeved on the fixing post.

5. The soft-contact chip testing structure according to claim 4, characterized in that: The fixing column includes a first column (411), a second column (412) coaxially fixed to the upper end of the first column (411), and a frustum (413) coaxially fixed to the upper end of the second column (412). The diameter of the first column (411) is larger than the diameter of the second column (412). One end of the frustum (413) connected to the second column (412) is the first end, and the other end is the second end. The diameter of the first end of the frustum (413) is smaller than the diameter of the second end, and the diameter of the first end is larger than the diameter of the second column (412). The elastic limiting sleeve (420) is cylindrical in shape and has a cavity inside that matches and is fitted onto the second column (412) and the frustum (413). 1) The second column (412) and the corresponding elastic limiting sleeve (420) are at least partially located in the fixing hole. The thickness of the conductive adhesive fixing frame (310) is less than the height of the fixing column protruding from the fixing hole. When the fixing limiting column (400) and the limiting fixing hole (311) cooperate to elastically limit and fix the conductive adhesive, the second end of the frustum (413) passes through the limiting fixing hole (311) and protrudes to the other end of the limiting fixing hole (311). The natural outer diameter of the elastic limiting sleeve (420) after being fitted onto the fixing column is greater than the inner diameter of the limiting fixing hole (311). The minimum effective outer diameter of the elastic limiting sleeve (420) after being fitted onto the fixing column is less than the inner diameter of the limiting fixing hole (311).

6. The soft-contact chip testing structure according to claim 1, characterized in that: The first limiting groove (110) is provided with a plurality of first magnetic components (111), and the limiting frame (200) is provided with a second magnetic component (210) that is attracted to the first magnetic component (111) at a position corresponding to the first magnetic component (111).

7. The soft-contact chip testing structure according to claim 3, characterized in that: The first plate base (100) has two ends of the second surface with mating bosses (140) extending away from the first surface. The second plate base (500) has a mating recess (520) corresponding to the mating boss (140) at the corresponding position on the side opposite to the mating boss (140). The second plate base (500) has a fixing boss (530) at the corresponding position on the side away from the first plate base (100) and corresponding to the mating recess (520).

8. The soft-contact chip testing structure according to claim 7, characterized in that: The docking limiting structure includes a plurality of through docking limiting holes (101) disposed on the docking boss (140) on the first plate base (100) and docking limiting posts (501) disposed on the docking recess (520) on the second plate base (500) that match the docking limiting holes (101). The upper end of the docking limiting post (501) is located below the upper surface of the second plate base (500), and a smooth guide arc surface is provided at one end of the docking limiting post (501) corresponding to the docking limiting hole (101).

9. The soft-contact chip testing structure according to claim 7, characterized in that: The first plate base (100) and the second plate base (500) are provided with through threaded fixing holes at the corresponding positions of the mating boss (140) and the mating recess (520).

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