Switching fixture and voltage test equipment

Abstract

The utility model discloses a switching fixture and voltage test equipment, relates to the technical field of voltage measurement, the switching fixture is used for voltage test of D-Sub connecting lines, the switching fixture comprises two adapters, two dial switches and a voltage test connector, the two adapters are arranged at intervals, each adapter comprises a plurality of pins, and the pins are connected with the two dial switches. The plurality of pins of the two adapters are in one-to-one correspondence and are electrically connected respectively; each dial switch comprises a plurality of sub-switches, each sub-switch has an opening state and a closing state, and one end of each sub-switch of each dial switch is electrically connected with one pin of one adapter; the voltage testing connector comprises a center part and a shell shielding layer, the other ends of the multiple sub-switches of one dial switch are in short circuit and are electrically connected with the center part, and the other ends of the multiple sub-switches of the other dial switch are in short circuit and are electrically connected with the shell shielding layer. The switching jig provided by the utility model aims to measure the voltage between the two pins of the D-Sub connecting line.

Description

Technical Field

[0001] This utility model relates to the field of voltage measurement technology, and in particular to an adapter fixture and a voltage testing device. Background Technology

[0002] In magnetic resonance imaging equipment, it is often necessary to check the voltage between each pin on each D-Sub (D-Subminiature) connector line.

[0003] Existing methods for measuring the voltage between each pin on a D-Sub cable typically require an additional wire to be connected to the two pins to be measured. If you want to measure the voltage between any two pins, multiple wires are needed, which is complex and affects the normal use of the D-Sub cable. Utility Model Content

[0004] The main purpose of this invention is to provide an adapter fixture and voltage testing device for measuring the voltage between two pins of a D-Sub connector.

[0005] To achieve the above objectives, this utility model proposes an adapter fixture for voltage testing of D-Sub connection lines. The adapter fixture includes two adapters, two DIP switches, and a voltage test connector. The two adapters are spaced apart, and each adapter includes multiple pins. The multiple pins of the two adapters correspond one-to-one and are electrically connected. Each DIP switch includes multiple sub-switches, and each sub-switch has two states: open and closed. One end of each sub-switch of each DIP switch is electrically connected to one pin of one adapter. The voltage test connector includes a central part and an outer shielding layer. The other ends of the multiple sub-switches of one DIP switch are short-circuited and electrically connected to the central part, and the other ends of the multiple sub-switches of the other DIP switch are short-circuited and electrically connected to the outer shielding layer.

[0006] One sub-switch of the DIP switch is switched to the open state, and the other sub-switch of the other DIP switch is switched to the open state. The center part and the outer shell shielding layer of the voltage test connector are respectively used to electrically connect with the tester to measure the voltage between the center part and the outer shell shielding layer, and then measure the voltage between the pins corresponding to the two sub-switches.

[0007] In one embodiment, the number of sub-switches of the two DIP switches is the same.

[0008] In one embodiment, the number of pins of the adapter is the same as the number of sub-switches of the DIP switch, and one pin of each adapter corresponds one-to-one with one sub-switch of each DIP switch.

[0009] In one embodiment, the number of pins of the adapter includes 9, 15, 25, 37, or 44.

[0010] In one embodiment, one of the adapters is a male connector and the other is a female connector.

[0011] In one embodiment, the outer shielding layer of the voltage test connector is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy.

[0012] In one embodiment, the adapter fixture further includes a housing having a first receiving cavity and a second receiving cavity spaced apart, the two adapters being respectively embedded in and partially exposed in opposite cavity walls of the first receiving cavity, the voltage test connector being embedded in and partially exposed in the other cavity wall of the first receiving cavity, and the two DIP switches being spaced apart in the second receiving cavity.

[0013] In one embodiment, the housing is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy.

[0014] In one embodiment, the adapter fixture further includes a PCB board, with a clearance opening in the cavity wall between the first receiving cavity and the second receiving cavity. Part of the PCB board is disposed in the first receiving cavity, and the remaining part passes through the clearance opening and is disposed in the second receiving cavity. Each pin of the two adapters and the voltage test connector are electrically connected to the PCB board, and the two DIP switches are electrically connected to the PCB board.

[0015] This utility model also proposes a voltage testing device, which includes the adapter fixture and voltage tester as described above, wherein the voltage test connector of the adapter fixture is electrically connected to the voltage tester.

[0016] The technical solution of this utility model is to connect multiple pins of two adapters one-to-one and electrically connect them respectively, and connect multiple sub-switches of two DIP switches to multiple pins one-to-one. The other end of multiple sub-switches of one DIP switch is shorted and electrically connected to the center of the voltage test connector, and the other end of multiple sub-switches of the other DIP switch is shorted and electrically connected to the outer shell shielding layer of the voltage test connector.

[0017] Connect the D-Sub cable to be tested to the two adapters on this adapter fixture. To test the voltage between the first and second pins, turn on the first sub-switch of one DIP switch and the second sub-switch of the other DIP switch, and turn off the other sub-switches. This will allow you to test the voltage between the first and second pins of the D-Sub cable. Similarly, you can test the voltage between the second and fifth pins, or the third and sixth pins, or any other desired pair of pins. This allows you to test the voltage between any two pins of the D-Sub cable. Using this adapter fixture to test the voltage between any two pins of the D-Sub cable requires no additional wiring, making the testing process much simpler. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of an embodiment of the adapter fixture provided by this utility model.

[0020] Explanation of icon numbers:

[0021] 100. Adapter fixture; 1. Adapter; 2. DIP switch; 21. Sub-switch; 3. Voltage test connector; 31. Outer shell shielding layer.

[0022] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0024] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0025] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or" or "and / or" throughout the text includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0026] In magnetic resonance imaging equipment, it is often necessary to check the voltage between each pin on each D-Sub (D-Subminiature) connector line.

[0027] Existing methods for measuring the voltage between each pin on a D-Sub cable typically require an additional wire to be connected to the two pins to be measured. If you want to measure the voltage between any two pins, multiple wires are needed, which is complex and affects the normal use of the D-Sub cable.

[0028] This invention proposes an adapter fixture and a voltage testing device, designed to measure the voltage between two pins of a D-Sub connector.

[0029] Please see Figure 1 In one embodiment of this utility model, the adapter fixture 100 is used for voltage testing of D-Sub connection lines. The adapter fixture 100 includes two adapters 1, two DIP switches 2, and a voltage test connector 3. The two adapters 1 are spaced apart, and each adapter 1 includes multiple pins. The multiple pins of the two adapters 1 correspond one-to-one and are electrically connected respectively. Each DIP switch 2 includes multiple sub-switches 21. Each sub-switch 21 has two states: open and closed. One end of each sub-switch 21 of each DIP switch 2 is electrically connected to one pin of an adapter 1. The voltage test connector 3 includes a central part and an outer shell shielding layer 31. The other ends of the multiple sub-switches 21 of one DIP switch 2 are short-circuited and electrically connected to the central part. The other ends of the multiple sub-switches 21 of the other DIP switch 2 are short-circuited and electrically connected to the outer shell shielding layer 31.

[0030] One sub-switch 21 of one DIP switch 2 is switched to the open state, and the other sub-switch 21 of another DIP switch 2 is switched to the open state. The center part of the voltage test connector 3 and the outer shell shielding layer 31 are respectively used to electrically connect with the tester to measure the voltage between the center part and the outer shell shielding layer 31, and then measure the voltage between the corresponding pins of the two sub-switches 21.

[0031] In this embodiment, the adapter 1 of the adapter fixture 100 is a D-Sub connector. Common pin counts for D-Sub connectors include, but are not limited to, 9, 15, 25, 37, 44, 50, 62, and 78 pins. Common types of D-Sub connectors include male and female connectors. The combination of the two adapters 1 of the adapter fixture 100 can be a male-male combination, a female-female combination, or a male-female combination; no further limitation is made here. The electrical connection between the pins of the two adapters 1 can be achieved through cables or by using a PCB board for one-to-one electrical connection; no further limitation is made here. The DIP switch 2 is a commercially available DIP switch 2 with multiple sub-switches 21, and the type can be a flat switch or a piano key type, etc. The number of sub-switches 21 of the two DIP switches 2 can be the same, and the same as the number of pins of the D-Sub connection line. Each sub-switch 21 is electrically connected to a corresponding pin. By controlling the opening and closing of the sub-switches 21 of the two DIP switches 2, the voltage value between any two pins of the D-Sub connection line can be measured. It is understood that, in another embodiment, the number of sub-switches 21 of the DIP switch 2 is one less than the number of pins of the D-Sub connection line. For example, if the number of pins of the D-Sub connection line is 9, the number of sub-switches 21 of the two DIP switches 2 is 8 each. The 8 sub-switches 21 of the first DIP switch 2 are electrically connected to pins 1 to 8 of the D-Sub connection line, and the 8 sub-switches 21 of the second DIP switch 2 are electrically connected to pins 2 to 9 of the D-Sub connection line. The voltage value between any two pins of the D-Sub connection line can also be measured through the two DIP switches 2.

[0032] The voltage test connector 3 is a BNC connector, a bayonet-type coaxial cable connector used for quick connection to a voltage tester and ensuring stable signal transmission. The voltage test connector 3 includes a center section and an outer shielding layer 31. The center section contains pins, which act as the inner conductor responsible for signal transmission. The outer shielding layer 31 isolates the center section to prevent short circuits. The center section is shorted to multiple sub-switches 21 of one of the DIP switches 2, and the outer shielding layer 31 is shorted to multiple sub-switches 21 of the other DIP switch 2. By opening the first sub-switch 21 of the first DIP switch 2 and the second sub-switch 21 of the second DIP switch 2, the voltage between the center section and the outer shielding layer 31 can be measured. This allows for the determination of the voltage between the pins of the D-Sub connection corresponding to the first sub-switch 21 of the first DIP switch 2 and the pins of the D-Sub connection corresponding to the second sub-switch 21 of the second DIP switch 2.

[0033] The technical solution of this utility model is to connect multiple pins of two adapters 1 one by one and electrically connect them respectively, and connect multiple sub-switches 21 of two DIP switches 2 one by one to multiple pins respectively. The other end of the multiple sub-switches 21 of one DIP switch 2 is short-circuited and electrically connected to the center of the voltage test connector 3, and the other end of the multiple sub-switches 21 of the other DIP switch 2 is short-circuited and electrically connected to the outer shell shielding layer 31 of the voltage test connector 3.

[0034] Connect the D-Sub cable to be tested to the two adapters 1 of this adapter fixture 100. To test the voltage between the first and second pins, turn on the first sub-switch 21 of one DIP switch 2 and the second sub-switch 21 of the other DIP switch 2, and turn off the other sub-switches 21. This will allow you to test the voltage between the first and second pins of the D-Sub cable. Similarly, you can test the voltage between the second and fifth pins, or the voltage between the third and sixth pins, or any other desired pair of pins. This allows you to test the voltage between any two pins of the D-Sub cable. Using this adapter fixture 100 to test the voltage between any two pins of the D-Sub cable eliminates the need for additional wiring, making the testing process much simpler.

[0035] In the embodiments of this utility model, the number of sub-switches 21 of the two DIP switches 2 is the same.

[0036] In this embodiment, the number of sub-switches 21 on both DIP switches 2 is the same. The number of sub-switches 21 can be the same as the number of pins on the D-Sub connection line. For example, if the D-Sub connection line has 9 pins, both DIP switches 2 have 9 sub-switches 21. The 9 sub-switches 21 of the first DIP switch 2 are electrically connected to pins 1 to 9 of the D-Sub connection line, and the 9 sub-switches 21 of the second DIP switch 2 are also electrically connected to pins 1 to 9 of the D-Sub connection line. By opening and closing the sub-switches 21 of the two DIP switches 2, the measurement of the D-Sub connection line can be achieved. The voltage value between any two pins of the D-Sub connection can be measured. Alternatively, the number of sub-switches 21 of the D-Sub connection can be one less than the number of pins of the D-Sub connection. For example, if the number of pins of the D-Sub connection is 9, the number of sub-switches 21 of the two D-Sub switches 2 is 8 each. The 8 sub-switches 21 of the first D-Sub switch 2 are electrically connected to pins 1 to 8 of the D-Sub connection, and the 8 sub-switches 21 of the second D-Sub switch 2 are electrically connected to pins 2 to 9 of the D-Sub connection. The voltage value between any two pins of the D-Sub connection can also be measured through the two D-Sub switches 2.

[0037] In the embodiments of this utility model, the number of pins of the adapter 1 is the same as the number of sub-switches 21 of the DIP switch 2, and one pin of each adapter 1 corresponds one-to-one with one sub-switch 21 of each DIP switch 2.

[0038] In this embodiment, the number of sub-switches 21 of the two DIP switches 2 is the same and the same as the number of pins of the adapter 1. For example, the number of pins of the D-Sub connection line is 15, and the number of sub-switches 21 of the two DIP switches 2 is 15. The 15 sub-switches 21 of the first DIP switch 2 are electrically connected to pins 1 to 15 of the D-Sub connection line, and the 15 sub-switches 21 of the second DIP switch 2 are electrically connected to pins 1 to 15 of the D-Sub connection line, respectively. By turning on the first sub-switch 21 of the first DIP switch 2 and the second sub-switch 21 of the second DIP switch 2, the voltage value between the first and second pins of the D-Sub connection line can be measured; by turning on the second sub-switch 21 of the first DIP switch 2 and the third sub-switch 21 of the second DIP switch 2, the voltage value between the second and third pins of the D-Sub connection line can be measured.

[0039] In embodiments of this invention, the number of pins on the adapter 1 includes 9, 15, 25, 37, or 44.

[0040] In this embodiment, the number of pins of adapter 1 should be selected according to the number of pins of the D-Sub adapter cable to be measured. Commonly available D-Sub adapter cables have 9, 15, 25, 37, or 44 pins. It is understood that in other embodiments, the number of pins of the D-Sub adapter cable may also include 50, 62, or 78 pins.

[0041] In an embodiment of this utility model, one adapter 1 is a male connector and the other adapter 1 is a female connector.

[0042] In this embodiment, the two adapters 1 of the adapter fixture 100 are one male and the other female. The D-Sub connection cable to be measured is divided into two wires. One end of one wire is normally connected to the power equipment, and the other end is connected to the male wire. The other wire is normally connected to the power equipment, and the other end is connected to the female wire. This will not affect the normal use of the D-Sub connection cable.

[0043] In the embodiments of this utility model, the outer shell shielding layer 31 of the voltage test connector 3 is made of a non-magnetic material, including beryllium copper, stainless steel or aluminum alloy.

[0044] In this embodiment, the outer shell shielding layer 31 is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy, which are free of iron and nickel alloys. This material can isolate the central part and prevent short circuits.

[0045] In an embodiment of this utility model, the adapter fixture 100 further includes a housing, the housing having a first receiving cavity and a second receiving cavity spaced apart, two adapters 1 respectively embedded in and partially exposed in the opposite two cavity walls of the first receiving cavity, a voltage test connector 3 embedded in and partially exposed in the other cavity wall of the first receiving cavity, and two DIP switches 2 spaced apart in the second receiving cavity.

[0046] In this embodiment, the housing has a first receiving cavity and a second receiving cavity spaced apart. Two adapters 1 are respectively embedded in and partially exposed on opposite walls of the first receiving cavity, and a voltage test connector 3 is embedded in and partially exposed on the other wall of the first receiving cavity. Two DIP switches 2 are spaced apart in the second receiving cavity. The two adapters 1, the voltage test connector 3, and the two DIP switches 2 can be electrically connected by wires. The first receiving cavity is a closed cavity, achieving a shielding effect on the wires and the two adapters 1 inside the cavity. The second receiving cavity is an open cavity, allowing the user to directly adjust the opening and closing of the sub-switch 21 of the DIP switch 2.

[0047] In embodiments of this utility model, the shell is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy.

[0048] In this embodiment, the shell is made of a non-magnetic material, such as beryllium copper, stainless steel, or aluminum alloy, which are free of iron and nickel alloys. This material can shield the magnetic field and prevent the magnetic field from affecting the electric field inside the shell.

[0049] In an embodiment of this utility model, the adapter fixture 100 also includes a PCB board. A clearance opening is provided in the cavity wall between the first receiving cavity and the second receiving cavity. Part of the PCB board is located in the first receiving cavity, and the remaining part passes through the clearance opening and is located in the second receiving cavity. Each pin of the two adapters 1 and the voltage test connector 3 are electrically connected to the PCB board, and the two DIP switches 2 are electrically connected to the PCB board.

[0050] In this embodiment, each pin of the two adapters 1, the two DIP switches 2, and the voltage test connector 3 are electrically connected via a PCB board, which reduces wire tangling and makes the design simpler. A portion of the PCB board is located in the first receiving cavity, and another portion passes through the clearance opening and is located in the second receiving cavity. The clearance opening can be sealed by means of soldering or other methods to keep the first receiving cavity a closed cavity.

[0051] This utility model also proposes a voltage testing device, which includes the adapter fixture 100 and the voltage tester as described above, wherein the voltage test connector 3 of the adapter fixture 100 is electrically connected to the voltage tester.

[0052] The above description is merely an exemplary embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural transformations made based on the technical concept of the present utility model and the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. An adapter fixture for voltage testing of D-Sub connection lines, characterized in that, The adapter fixture includes: Two adapters are provided, with the two adapters spaced apart. Each adapter includes multiple pins, and the multiple pins of the two adapters correspond one-to-one and are electrically connected respectively. Two DIP switches, each DIP switch including multiple sub-switches, each sub-switch having two states: on and off, and one end of each sub-switch of each DIP switch being electrically connected to a pin of an adapter; and A voltage test connector, comprising a central portion and an outer shielding layer, wherein the other ends of a plurality of sub-switches of one DIP switch are short-circuited and electrically connected to the central portion, and the other ends of a plurality of sub-switches of another DIP switch are short-circuited and electrically connected to the outer shielding layer. One sub-switch of the DIP switch is switched to the open state, and the other sub-switch of the other DIP switch is switched to the open state. The center part and the outer shell shielding layer of the voltage test connector are respectively used to electrically connect with the tester to measure the voltage between the center part and the outer shell shielding layer, and then measure the voltage between the pins corresponding to the two sub-switches.

2. The adapter fixture as described in claim 1, characterized in that, The two DIP switches have the same number of sub-switches.

3. The adapter fixture as described in claim 2, characterized in that, The number of pins of the adapter is the same as the number of sub-switches of the DIP switch, and one pin of each adapter corresponds one-to-one with one sub-switch of each DIP switch.

4. The adapter fixture as described in claim 3, characterized in that, The number of pins on the adapter may be 9, 15, 25, 37, or 44.

5. The adapter fixture as described in claim 4, characterized in that, One adapter is a male connector, and the other adapter is a female connector.

6. The adapter fixture as described in any one of claims 1 to 5, characterized in that, The outer shielding layer of the voltage test connector is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy.

7. The adapter fixture as described in any one of claims 1 to 5, characterized in that, The adapter fixture also includes a housing, which has a first receiving cavity and a second receiving cavity spaced apart. The two adapters are respectively embedded in and partially exposed in the opposite two cavity walls of the first receiving cavity, the voltage test connector is embedded in and partially exposed in the other cavity wall of the first receiving cavity, and the two DIP switches are spaced apart in the second receiving cavity.

8. The adapter fixture as described in claim 7, characterized in that, The shell is made of a non-magnetic material, including beryllium copper, stainless steel, or aluminum alloy.

9. The adapter fixture as described in claim 8, characterized in that, The adapter fixture also includes a PCB board. A clearance opening is provided in the cavity wall between the first receiving cavity and the second receiving cavity. Part of the PCB board is located in the first receiving cavity, and the remaining part passes through the clearance opening and is located in the second receiving cavity. Each pin of the two adapters and the voltage test connector are electrically connected to the PCB board. The two DIP switches are electrically connected to the PCB board.

10. A voltage testing device, characterized in that, The voltage testing equipment includes an adapter fixture and a voltage tester as described in any one of claims 1 to 9, wherein the voltage test connector of the adapter fixture is electrically connected to the voltage tester.

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