Detection base

Abstract

The utility model belongs to the technical field of chip detection, and discloses a detection base. A middle detection groove and a plurality of communicating grooves are formed in the detection base, the center detection groove comprises a plurality of abutting surfaces which are connected in sequence, any two adjacent abutting surfaces can abut against two adjacent side faces of a chip to be detected in a one-to-one correspondence mode, and the communicating grooves and the abutting surfaces are arranged in a one-to-one correspondence mode; and the plurality of communication grooves are communicated with the central detection groove. The center detection groove of the detection base is used for accommodating the to-be-detected chip, the two abutting surfaces of the middle detection groove can abut against the to-be-detected chip, then the to-be-detected chip is limited, the position stability of the to-be-detected chip can be improved, the detection effect of the to-be-detected chip is improved, meanwhile, the plurality of communication grooves are communicated with the center detection groove, and the detection accuracy of the to-be-detected chip is improved. And the communication groove can avoid the detection probe, so that the detection convenience is improved.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a testing base. Background Technology

[0002] Chips are miniature electronic circuits manufactured using semiconductor processes. They perform specific functions such as data processing, signal amplification, and information storage, and are widely used in fields such as communications, radar, satellite navigation, and radio spectrum monitoring. Due to advancements in packaging technology, chips are increasingly moving towards high performance, low cost, and miniaturization. This makes testing the physical characteristics of these tiny, lightweight chips more challenging. When testing the physical properties of chips, the clamping force of traditional fixtures is difficult to control precisely, leading to chip damage. Under normal clamping conditions, uneven force on the chip can cause it to bounce off the ground. Furthermore, the chip's position is difficult to fix, resulting in measurement errors.

[0003] Therefore, a detection base is needed to solve the above problems. Utility Model Content

[0004] The purpose of this invention is to provide a detection base that can stably limit the position of the chip under test, ensure that the position is fixed during the detection process, and improve the detection effect.

[0005] To achieve this objective, the present invention adopts the following technical solution:

[0006] A detection base is used to fix the chip under test. The detection base has a central detection groove and several connecting grooves. The central detection groove includes several abutment surfaces connected in sequence. Any two adjacent abutment surfaces can abut against two adjacent sides of the chip under test in a one-to-one correspondence. The several connecting grooves extend to the several abutment surfaces in a one-to-one correspondence.

[0007] As an optional technical solution, the central detection groove has a rectangular cross-section and includes four abutment surfaces, each of which is provided with a corresponding connecting groove.

[0008] As an optional technical solution, in the two connecting grooves corresponding to the two opposing abutting surfaces, one connecting groove extends along a first direction and the other connecting groove extends along a second direction, wherein the first direction and the second direction are parallel or at an angle.

[0009] As an optional technical solution, the axes of the two connecting grooves corresponding to the two opposing abutment surfaces coincide.

[0010] As an optional technical solution, the two opposing abutment surfaces are provided with grooves and protrusions, and the protrusions are positioned closer to the connecting groove than the grooves.

[0011] As an optional technical solution, the surface of the protrusion facing the chip under test is an arc-shaped surface.

[0012] As an optional technical solution, the detection base is also provided with a side detection groove, and at least part of the connecting groove is connected to the side detection groove at one end away from the central detection groove, and the bottom of the side detection groove can abut against any side of the chip under test.

[0013] As an optional technical solution, the opening of the side detection groove is provided with a plurality of limiting grooves communicating with the side detection groove. The limiting grooves extend along a direction perpendicular to the axis of the side detection groove, and the limiting grooves are provided on both sides of the side detection groove along the direction perpendicular to the axis.

[0014] As an optional technical solution, the depth of the connecting groove is a, and the depth of the side detection groove is c, where a < c.

[0015] As an optional technical solution, the detection base is provided with a plurality of central detection slots, and each central detection slot is connected to a plurality of connecting slots.

[0016] The beneficial effects of this utility model are:

[0017] This utility model discloses a testing base for positioning and fixing chips during physical performance testing. The testing base has a central testing groove and several connecting grooves. The central testing groove includes several sequentially connected abutment surfaces. Any two adjacent abutment surfaces can abut against two adjacent sides of the chip under test. The connecting grooves and abutment surfaces are arranged in a one-to-one correspondence so that all connecting grooves are connected to the central testing groove. The central testing groove of this testing base accommodates the chip under test. The two abutment surfaces of the central testing groove abut against the chip under test, thereby limiting the chip's position and improving its positional stability, thus enhancing the testing effect. Simultaneously, the connecting grooves, all connected to the central testing groove, can avoid detection probes, thereby improving testing convenience. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of the detection base according to an embodiment of the present invention;

[0019] Figure 2 yes Figure 1 A magnified view of a portion of point A in the middle.

[0020] In the picture:

[0021] 1. Testing base; 2. Chip under test;

[0022] 10. Central detection groove; 11. Abutment surface; 12. Groove; 13. Protrusion;

[0023] 20. Connecting slot;

[0024] 30. Side detection groove; 31. Limiting groove. Detailed Implementation

[0025] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, not the entire structure.

[0026] In the description of this utility model, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0027] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0028] In the description of this embodiment, the terms "upper," "lower," "right," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first" and "second" are only used for distinction in description and have no special meaning.

[0029] like Figure 1 and Figure 2As shown, this embodiment provides a detection base 1 for fixing the chip 2 under test. The detection base 1 has a central detection groove 10 and a plurality of connecting grooves 20. The central detection groove 10 includes a plurality of abutment surfaces 11 connected in sequence. Any two adjacent abutment surfaces 11 can abut against two adjacent sides of the chip 2 under test in a one-to-one correspondence. The plurality of connecting grooves 20 extend to the plurality of abutment surfaces 11 in a one-to-one correspondence. Specifically, in this embodiment, when the chip under test 2 is placed in the central detection groove 10, any two contact surfaces 11 can contact the two adjacent sides of the chip under test 2 one by one, thereby fixing the position of the chip under test 2 and preventing displacement of the chip under test 2 during the detection process, ensuring the detection effect of the chip under test 2, and effectively preventing the chip under test 2 from flying away; and several connecting grooves 20 extend one by one to several contact surfaces 11. When the probe needs to contact the side of the chip under test 2, the probe is usually set at an angle. The connecting grooves 20 can avoid part of the probe structure, thereby improving the contact effect between the probe and the chip under test 2, and thus improving the detection effect and convenience of the chip.

[0030] Specifically, in this embodiment, the detection base 1 is made of bakelite, and the surface is treated with antistatic agents to eliminate Coulomb force interference, thereby reducing the interference of the detection base 1 itself with the chip under test 2, and thus achieving stable and accurate measurement of the chip under test 2.

[0031] Specifically, in this embodiment, the contact surface 11 may be roughened to increase the friction between the contact surface 11 and the chip under test 2, thereby achieving stable contact between the chip under test 2 and the contact surface 11, preventing the chip under test 2 from moving during the testing process, and thus ensuring the accuracy of the test results of the chip under test 2.

[0032] Furthermore, such as Figure 2 As shown, the central detection groove 10 has a rectangular cross-section and includes four contact surfaces 11, each of which is provided with a corresponding connecting groove 20. Specifically, in this embodiment, since the structure of the commonly available chip under test 2 is usually rectangular, setting the cross-section of the central detection groove 10 to a rectangle allows it to be adapted to the chip under test 2, thereby ensuring the stable positioning of the chip under test 2. The connecting groove 20 provided with each contact surface 11 ensures that the probe is avoided.

[0033] Specifically, in other embodiments, the number of connecting slots 20 can be set according to actual use, and is not limited here.

[0034] Furthermore, such as Figure 2As shown, among the two connecting grooves 20 corresponding to the two opposing contact surfaces 11, one connecting groove 20 extends along a first direction, and the other connecting groove 20 extends along a second direction. The first and second directions are parallel or at an angle. Specifically, in this embodiment, during actual testing, in order to ensure good contact between the probe and the side of the chip under test 2, it is usually necessary to make the probe perpendicular to the side of the chip under test 2 before contacting it. Therefore, in this embodiment, both the first and second directions are perpendicular to the corresponding side of the chip under test 2, thereby ensuring that the connecting groove 20 and the corresponding contact surface 11 are perpendicular. This improves the avoidance effect of the connecting groove 20 on the probe and also corrects the direction of the probe, ensuring the testing effect of the chip under test 2.

[0035] In another embodiment, in order to facilitate the observation of the chip 2 under test by personnel during the testing process, the first direction and the second direction can be set at an angle to the chip 2 under test, without any specific restrictions.

[0036] Furthermore, such as Figure 2 As shown, the axes of the two connecting grooves 20 corresponding to the two opposing contact surfaces 11 coincide. Specifically, in this embodiment, this arrangement enables the detection position of the chip under test 2 to be relatively fixed, thereby improving the accuracy of the detection results of the chip under test 2, achieving the effect of controlling the variable of the detection position of the chip under test 2, and thus effectively ensuring that the detection results have good reference value.

[0037] Furthermore, such as Figure 2 As shown, two opposing contact surfaces 11 are provided with grooves 12 and protrusions 13, with the protrusions 13 positioned closer to the connecting groove 20 than the grooves 12. Specifically, in this embodiment, the protrusions 13 are used to abut against the side of the chip under test 2, which can prevent the edges and corners of the chip under test 2 from being bumped, thereby reducing damage or deformation of the chip under test 2 during the testing process and reducing material loss.

[0038] Furthermore, such as Figure 2 As shown, the surface of the protrusion 13 facing the chip 2 under test is an arc-shaped surface. Specifically, in this embodiment, the surface of the protrusion 13 facing the chip 2 under test is an arc-shaped surface. The arc-shaped surface design ensures that the protrusion 13 has no sharp edges, thereby reducing collisions when the protrusion 13 comes into contact with the chip 2 under test, avoiding unnecessary damage to the chip 2 under test, and improving the safety performance during the testing process.

[0039] Furthermore, such as Figure 2As shown, the detection base 1 is also provided with a side detection groove 30. At least one end of the connecting groove 20 away from the central detection groove 10 is connected to the side detection groove 30, and the bottom of the side detection groove 30 can abut against any side of the chip 2 under test. Specifically, in this embodiment, after the side of the chip 2 under test is detected, the chip 2 under test is placed in the side detection groove 30 so that the probe can contact the bottom surface of the chip 2 under test, so as to ensure that all surfaces of the chip 2 under test can be detected normally.

[0040] Furthermore, such as Figure 2 As shown, the side detection groove 30 has several limiting grooves 31 that communicate with the side detection groove 30 at the groove opening. The limiting grooves 31 extend along the direction perpendicular to the axis of the side detection groove 30, and the side detection groove 30 has limiting grooves 31 on both sides along the direction perpendicular to the axis. Specifically, in this embodiment, limiting grooves 31 communicating with the side detection groove 30 are provided on both sides of the side detection groove 30 along the axis of the side detection groove 30 at the groove opening. When detecting the bottom surface of the chip 2 under test, the chip 2 under test is first placed in the side detection groove 30, and then the probe is moved along the limiting groove 31 towards the chip 2 under test until the probe abuts the chip 2 under test against the side wall of the side detection groove 30 away from the probe, thereby improving the stability and safety of the chip 2 under test during the detection process. In addition, the limiting grooves 31 provided on both sides of the side detection groove 30 along the axis of the side detection groove 30 at the groove opening can position the chip 2 under test located in the side detection groove 30 from both sides. During the detection, there is no need to distinguish between the front and back of the chip 2 under test, thereby improving the flexibility of the detection process.

[0041] Preferably, in this embodiment, the side detection groove 30 can be provided with different numbers of limiting grooves 31 on both sides along the axial direction according to actual use, so as to ensure that the chips under test 2 of different specifications can be limited, thereby improving the versatility of the detection base 1.

[0042] Furthermore, such as Figure 2 As shown, the depth of the connecting groove 20 is a, and the depth of the side detection groove 30 is c, where a < c. Specifically, in this embodiment, the depth of the connecting groove 20 is set to be less than the depth of the side detection groove 30, which enables the sidewall of the connecting groove 20 to limit the chip under test 2 located in the side detection groove 30, thereby reducing the possibility of the chip under test 2 flying away and improving the stability during the detection process.

[0043] Furthermore, such as Figure 1As shown, the detection base 1 has multiple central detection slots 10, and each central detection slot 10 is connected to several connecting slots 20. Specifically, in this embodiment, the detection base 1 has multiple central detection slots 10, and each central detection slot 10 is connected to several connecting slots 20. The dimensions of the central detection slots 10 and the connecting slots connected to them can be specifically set according to actual use, which can meet the testing requirements of chips 2 of different specifications, thereby improving the versatility of the detection base 1.

[0044] Obviously, the above embodiments of this utility model are merely examples for clearly illustrating the present utility model, and are not intended to limit the implementation of the present utility model. Those skilled in the art can make various obvious changes, readjustments, and substitutions without departing from the protection scope of this utility model. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the protection scope of the claims of this utility model.

Claims

1. A detection base for fixing the chip (2) to be tested, characterized in that, The detection base (1) is provided with a central detection groove (10) and a number of connecting grooves (20). The central detection groove (10) includes a number of abutment surfaces (11) connected in sequence. Any two adjacent abutment surfaces (11) can abut against two adjacent sides of the chip under test (2) in a one-to-one correspondence. The number of connecting grooves (20) extends to the number of abutment surfaces (11) in a one-to-one correspondence.

2. The detection base according to claim 1, characterized in that, The central detection groove (10) has a rectangular cross-section and includes four abutment surfaces (11), each of which is provided with a corresponding connecting groove (20).

3. The detection base according to claim 2, characterized in that, In the two connecting grooves (20) corresponding to the two opposing contact surfaces (11), one connecting groove (20) extends along a first direction and the other connecting groove (20) extends along a second direction. The first direction and the second direction are parallel or at an angle.

4. The detection base according to claim 2, characterized in that, The axes of the two connecting grooves (20) corresponding to the two opposing contact surfaces (11) coincide.

5. The detection base according to claim 1, characterized in that, The two opposing contact surfaces (11) are provided with grooves (12) and protrusions (13), and the protrusions (13) are positioned closer to the connecting groove (20) than the grooves (12).

6. The detection base according to claim 5, characterized in that, The protrusion (13) facing the chip (2) under test has an arc-shaped surface.

7. The detection base according to claim 1, characterized in that, The detection base (1) is also provided with a side detection groove (30), and at least part of the connecting groove (20) is connected to the side detection groove (30) at one end away from the central detection groove (10). The bottom of the side detection groove (30) can abut against any side of the chip under test (2).

8. The detection base according to claim 7, characterized in that, The side detection groove (30) has a plurality of limiting grooves (31) communicating with the side detection groove (30) at the groove opening. The limiting grooves (31) extend along a direction perpendicular to the axis of the side detection groove (30), and the limiting grooves (31) are provided on both sides of the side detection groove (30) along the direction perpendicular to the axis.

9. The detection base according to claim 7, characterized in that, The depth of the connecting groove (20) is a, and the depth of the side detection groove (30) is c, where a < c.

10. The detection base according to any one of claims 1-9, characterized in that, The detection base (1) is provided with a plurality of central detection slots (10), and each central detection slot (10) is connected to a plurality of connecting slots (20).

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