Probe for circuit test

Abstract

The utility model provides a circuit test probe, comprising a protection assembly, the protection assembly comprises a protection cylinder, the bottom of the protection cylinder is fixedly connected with an extension port, a rotation assembly is arranged in the protection cylinder, the rotation assembly comprises a rotation disc, a positioning groove, a connection rod, a first spacing ring and a rotation block, and a detection assembly is arranged in the protection cylinder, the detection assembly comprises a needle rod, a needle head and a second limiting ring, the contact assembly is arranged in the protection cylinder, and the positioning assembly is arranged in the protection cylinder. According to the circuit test probe provided by the utility model, the detection assembly can be driven to move upwards to the inside of the protective cylinder by pulling the rotating assembly, the probe rods with different probe heads can be rotated to the position right above the extension ports by rotating the rotating assembly, and the probe heads can extend to the bottom of the protective cylinder through the extension ports under the elastic force action of the spring telescopic rods. Therefore, different probe heads can be switched, a plurality of probes do not need to be carried, and the probe is convenient to carry and is prevented from being lost.

Description

Technical Field

[0001] This utility model relates to the field of circuit testing technology, and in particular to a circuit testing probe. Background Technology

[0002] Circuit test probes are indispensable tools in electronic testing. As a special electronic component, they build an electrical bridge between the test equipment and the circuit under test, accurately transmit electrical signals, and realize the measurement of circuit parameters, fault detection, and performance evaluation, thus ensuring the quality and reliability of electronic equipment.

[0003] As the key part that directly contacts the circuit under test, the probe is usually made of materials with high hardness and excellent conductivity, such as tungsten alloy and rhenium-tungsten alloy. The probes come in various shapes and each has its own unique application scenarios. However, during testing, multiple probes with different probes need to be prepared, which is not only easy to lose, but also inconvenient to carry.

[0004] Therefore, it is necessary to provide a circuit testing probe to solve the above-mentioned technical problems. Utility Model Content

[0005] This invention provides a circuit testing probe that solves the problems of easy loss and inconvenience in carrying multiple probes during testing.

[0006] To solve the above-mentioned technical problems, this utility model provides a circuit testing probe, including: a protective component, the protective component including a protective cylinder, the bottom of the protective cylinder being fixedly connected to an extension opening;

[0007] A rotating assembly is disposed inside the protective cylinder, and the rotating assembly includes a rotating disk, a positioning groove, a connecting rod, a first limiting ring, and a rotating block;

[0008] A detection component is disposed inside the protective cylinder, and the detection component includes a needle rod, a needle tip, and a second limiting ring;

[0009] A contact assembly is disposed inside the protective cylinder, and the contact assembly includes a spring telescopic rod, a limiting plate, and a contact head;

[0010] A positioning component is disposed inside the protective cylinder, and the positioning component includes a limiting sleeve, a spring sleeve, and a positioning block.

[0011] Preferably, the rotating disk is movably embedded inside the protective cylinder, the positioning groove is formed on the top of the rotating disk, the bottom of the connecting rod is fixedly connected to the surface of the rotating disk, the first limiting ring is fixedly connected to the surface of the connecting rod, and the rotating block is fixedly connected to the top of the connecting rod.

[0012] Preferably, the outer surface of the needle bar is movably connected to the interior of the rotating disk, the needle tip is fixedly connected to the bottom of the needle bar, the second limiting ring is fixedly connected to the surface of the needle bar, and the second limiting ring is movably connected to the top surface of the rotating disk.

[0013] Preferably, the top of the spring telescopic rod is fixedly connected to the inner surface of the top of the protective cylinder, the limiting plate is fixedly connected to the bottom of the spring telescopic rod, the limiting plate is movably connected to the outer surface of the connecting rod, the contact head is fixedly connected to the bottom of the limiting plate, and the contact head is movably connected to the top of the needle rod.

[0014] Preferably, the limiting sleeve is fixedly connected to the inner surface of the protective cylinder, the spring sleeve is fixedly connected to the surface of the limiting sleeve, the positioning block is fixedly connected to the bottom of the spring sleeve, and the positioning block is movably connected to the inside of the positioning groove.

[0015] Preferably, the protective cylinder is provided with a fixing component inside. The fixing component includes a threaded rod, which is threadedly connected to the surface of the protective cylinder near the top. One end of the threaded rod is fixedly connected to a fixing block. A fixing groove is formed on the surface of the connecting rod, and the fixing block is movably connected inside the fixing groove.

[0016] Compared with related technologies, the circuit testing probe provided by this utility model has the following beneficial effects:

[0017] This invention provides a circuit testing probe. By pulling the rotating assembly, the detection assembly can be moved upward into the interior of the protective cylinder. By rotating the rotating assembly, the probe bar with different needle tips can be rotated to the top of the protrusion. Under the elastic force of the spring telescopic rod, the needle tip can be extended through the protrusion to the bottom of the protective cylinder, thereby realizing the switching of different needle tips. There is no need to carry multiple probes, which is convenient to carry and prevents loss. Attached Figure Description

[0018] Figure 1 A schematic diagram of the structure of a first embodiment of a circuit testing probe provided by this utility model;

[0019] Figure 2 for Figure 1 The diagram shows the internal structure of the protective cylinder.

[0020] Figure 3 for Figure 2 The enlarged schematic diagram of part A shown below;

[0021] Figure 4 This is a schematic diagram of the structure of a second embodiment of a circuit testing probe provided by the present invention.

[0022] The diagram is labeled: 1. Protective component, 11. Protective cylinder, 12. Expansion port.

[0023] 2. Rotating assembly; 21. Rotating disk; 22. Positioning groove; 23. Connecting rod; 24. First limiting ring; 25. Rotating block.

[0024] 3. Detection components; 31. Needle bar; 32. Needle tip; 33. Second limiting ring.

[0025] 4. Contact assembly; 41. Spring telescopic rod; 42. Limiting plate; 43. Contact head.

[0026] 5. Positioning components; 51. Limit sleeve; 52. Spring sleeve; 53. Positioning block.

[0027] 6. Fixing component; 61. Threaded rod; 62. Fixing block; 63. Fixing groove. Detailed Implementation

[0028] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0029] First Embodiment

[0030] Please refer to the following: Figure 1 , Figure 2 and Figure 3 ,in, Figure 1 A schematic diagram of the structure of a first embodiment of a circuit testing probe provided by this utility model; Figure 2 for Figure 1 The diagram shows the internal structure of the protective cylinder. Figure 3 for Figure 2 The diagram shows an enlarged view of part A. A circuit testing probe includes: a protective component 1, the protective component 1 including a protective cylinder 11, the bottom of the protective cylinder 11 being fixedly connected to an extension port 12;

[0031] Rotating assembly 2, which is disposed inside the protective cylinder 11, includes a rotating disk 21, a positioning groove 22, a connecting rod 23, a first limiting ring 24, and a rotating block 25;

[0032] The detection component 3 is disposed inside the protective cylinder 11, and the detection component 3 includes a needle bar 31, a needle tip 32, and a second limiting ring 33.

[0033] Contact component 4, which is disposed inside the protective cylinder 11, includes a spring telescopic rod 41, a limiting plate 42, and a contact head 43;

[0034] Positioning component 5 is disposed inside the protective cylinder 11. The positioning component 5 includes a limiting sleeve 51, a spring sleeve 52, and a positioning block 53.

[0035] The protective cylinder 11 is cylindrical with a circular opening at the bottom. The protruding opening 12 is fixedly connected to the outer surface of the protective cylinder 11 at the bottom of the opening. The rotating component 2 drives the detection component 3 to move upward and rotate circumferentially. The detection component 3 is connected to the circuit. The contact component 4 is connected to the detection component 3 to complete the detection.

[0036] The rotating disk 21 is movably embedded inside the protective cylinder 11, the positioning groove 22 is formed on the top of the rotating disk 21, the bottom of the connecting rod 23 is fixedly connected to the surface of the rotating disk 21, the first limiting ring 24 is fixedly connected to the surface of the connecting rod 23, and the rotating block 25 is fixedly connected to the top of the connecting rod 23.

[0037] The rotating disk 21 is disc-shaped with four circular holes arranged in a circumferential array. There are four positioning slots 22 arranged in a circumferential array on the top surface of the rotating disk 21. A circular ring is fixedly connected to the inner surface of the protective cylinder 11 near the bottom. In the natural state, the rotating disk 21 is connected to the top of the circular ring to limit the position of the rotating disk 21. The bottom of the connecting rod 23 is fixedly connected to the center of the top of the rotating disk 21, and the top is movably embedded in the outer surface of the top of the protective cylinder 11 through the top of the protective cylinder 11. By holding the rotating block 25, the rotating disk 21 can be moved up and down and rotated.

[0038] The outer surface of the needle bar 31 is movably connected to the interior of the rotating disk 21, the needle head 32 is fixedly connected to the bottom of the needle bar 31, the second limiting ring 33 is fixedly connected to the surface of the needle bar 31, and the second limiting ring 33 is movably connected to the top surface of the rotating disk 21.

[0039] The number of detection components 3 is two. Four needle rods 31 are slidably inserted into the four circular holes opened on the surface of the rotating disk 21. The bottom of the four needle rods 31 is connected to needles 32 of different shapes, which can detect different circuits. The surface of each of the four needle rods 31 near the top is fixedly connected to a second limiting ring 33. In the natural state, the second limiting ring 33 on the surface of the needle rod 31 inserted into the protrusion 12 is connected to the top surface of the rotating disk 21 to limit the needle rod 31. When the rotating disk 21 moves upward, it can drive the needle rod 31 to move upward.

[0040] The top of the spring telescopic rod 41 is fixedly connected to the inner surface of the top of the protective cylinder 11, the limiting plate 42 is fixedly connected to the bottom of the spring telescopic rod 41, the limiting plate 42 is movably connected to the outer surface of the connecting rod 23, the contact head 43 is fixedly connected to the bottom of the limiting plate 42, and the contact head 43 is movably connected to the top of the needle rod 31.

[0041] The spring telescopic rod 41 is a telescopic rod with a spring installed inside. The top of the telescopic rod is fixedly connected to the inner surface of the top of the protective cylinder 11. The limiting plate 42 is fixedly connected to the bottom of the telescopic rod and has a circular hole on its surface. The circular hole is movably fitted onto the outer surface of the connecting rod 23. In its natural state, the spring in the spring telescopic rod 41 exerts downward pressure on the limiting plate 42, so that the limiting plate 42 is connected to the top surface of the first limiting ring 24. The contact head 43 is connected to the top of the needle rod 31 that passes through the protrusion 12, thereby applying pressure to the needle rod 31, so that the bottom of the needle rod 31 is against the outside of the bottom of the protective cylinder 11.

[0042] The limiting sleeve 51 is fixedly connected to the inner surface of the protective cylinder 11, the spring sleeve 52 is fixedly connected to the surface of the limiting sleeve 51, the positioning block 53 is fixedly connected to the bottom of the spring sleeve 52, and the positioning block 53 is movably connected to the inside of the positioning groove 22.

[0043] The limiting sleeve 51 is ring-shaped and fixedly connected to the inner surface of the center of the protective cylinder 11. A spring is movably embedded inside the spring sleeve 52. The bottom of the positioning block 53 is hemispherical, and the top is fixedly connected to the bottom of the spring. When the rotating disk 21 is pulled upward and connected to the limiting sleeve 51, the rotating disk 21 is limited. When the needle bar 31 rotates to the bottom of the positioning block 53 corresponding to the positioning groove 22, the positioning block 53 is embedded in the interior of the positioning groove 22 under the action of the spring, which facilitates the positioning of the needle bar 31.

[0044] The working principle of the circuit testing probe provided by this utility model is as follows:

[0045] When it is necessary to change to a different needle 32, hold the rotating block 25 and pull it upward. The rotating disk 21 then applies a pushing force to the second limiting ring 33 on the surface of the needle bar 31 embedded inside the protrusion 12, thereby driving the needle bar 31 to move upward. The top of the needle bar 31 connects with the contact head 43, thereby pushing the spring telescopic rod 41 to retract upward. When the rotating disk 21 moves upward and connects to the bottom of the limiting sleeve 51, the needle bar 31 originally embedded inside the protrusion 12 completely moves into the interior of the protective cylinder 11. Then rotate the rotating block 25. At this time, the limiting plate 42 is subjected to the first limiting ring 24. The limit switch cannot move downwards, and the four needle rods 31 rotate around the rotating disk 21. When a needle rod 31 rotates to the top of the protrusion 12, the positioning block 53 is inserted into the positioning groove 22 under the elastic force of the spring sleeve 52. It continues to rotate until the positioning block 53 is embedded in the positioning groove 22 corresponding to the required needle 32. Then the rotating block 25 is released. Under the action of the spring in the spring telescopic rod 41, the contact head 43 connects to the top of the needle rod 31 directly above the protrusion 12 and pushes it out through the protrusion 12 to the outside of the bottom of the protective cylinder 11. Then the test can be performed.

[0046] Compared with related technologies, the circuit testing probe provided by this utility model has the following beneficial effects:

[0047] This invention provides a circuit testing probe. By pulling the rotating component 2, the detection component 3 can be moved upward to the inside of the protective cylinder 11. By rotating the rotating component 2, the needle rod 31 with different needle tips 32 can be rotated to the top of the protrusion port 12. Under the elastic force of the spring telescopic rod 41, the needle tip 32 can be extended through the protrusion port 12 to the bottom of the protective cylinder 11, thereby realizing the switching of different needle tips 32. There is no need to carry multiple probes, which is convenient to carry and prevents loss.

[0048] Second Embodiment

[0049] Please refer to the following: Figure 4 Based on the circuit testing probe provided in the first embodiment of this application, the second embodiment of this application proposes another circuit testing probe. The second embodiment is merely a preferred embodiment of the first embodiment, and the implementation of the second embodiment will not affect the separate implementation of the first embodiment.

[0050] Specifically, the second embodiment of this application provides a circuit testing probe that differs in that the protective cylinder 11 of the circuit testing probe has a fixing component 6 inside, the fixing component 6 includes a threaded rod 61, the threaded rod 61 is threadedly connected to the surface of the protective cylinder 11 near the top, one end of the threaded rod 61 is fixedly connected to a fixing block 62, the surface of the connecting rod 23 is provided with a fixing groove 63, and the fixing block 62 is movably connected inside the fixing groove 63.

[0051] A piece is fixedly connected to the inner surface of the protective cylinder 11 near the top. The threaded rod 61 is threaded inside the piece, and one end is movably embedded in the outer surface of the protective cylinder 11. When the rotating disk 21 is pulled upward and connected to the bottom of the limiting sleeve 51, the fixing groove 63 is just on the same horizontal line as the fixing block 62. Thus, by rotating the threaded rod 61, the fixing block 62 can be embedded into the fixing groove 63, thereby fixing the connecting rod 23 and the rotating disk 21.

[0052] The working principle of the circuit testing probe provided by this utility model is as follows:

[0053] When not in use, hold the connecting rod 23 and pull it upward. When the rotating disk 21 is connected to the bottom of the limiting sleeve 51, the fixing block 62 and the fixing groove 63 are just on the same horizontal line, and the needle rod 31 embedded on the outside moves upward with the rotating disk 21 to the inside of the protective cylinder 11. Then rotate the threaded rod 61 to drive the fixing block 62 to move into the inside of the fixing groove 63 until the fixing groove 63 is embedded in the inside of the fixing groove 63. The connecting rod 23 is limited by the fixing block 62 and cannot move downward, so the needle rod 31 is completely inside the protective cylinder 11.

[0054] Compared with related technologies, the circuit testing probe provided by this utility model has the following beneficial effects:

[0055] This utility model provides a circuit testing probe. When not in use, the threaded rod 61 can be rotated to allow the fixing block 62 to be embedded inside the fixing groove 63, so that the entire detection component 3 is embedded inside the protective cylinder 11, which can protect the detection component 3 and prevent the detection component 3 from being deformed and worn by external forces.

[0056] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent structural or procedural transformations made based on the content of this utility model specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. A circuit testing probe, characterized in that, include: A protective assembly, comprising a protective cylinder having an outlet fixedly connected to its bottom; A rotating assembly is disposed inside the protective cylinder, and the rotating assembly includes a rotating disk, a positioning groove, a connecting rod, a first limiting ring, and a rotating block; A detection component is disposed inside the protective cylinder, and the detection component includes a needle rod, a needle tip, and a second limiting ring; A contact assembly is disposed inside the protective cylinder, and the contact assembly includes a spring telescopic rod, a limiting plate, and a contact head; A positioning component is disposed inside the protective cylinder, and the positioning component includes a limiting sleeve, a spring sleeve, and a positioning block.

2. The circuit testing probe according to claim 1, characterized in that, The rotating disk is movably embedded inside the protective cylinder, the positioning groove is formed on the top of the rotating disk, the bottom of the connecting rod is fixedly connected to the surface of the rotating disk, the first limiting ring is fixedly connected to the surface of the connecting rod, and the rotating block is fixedly connected to the top of the connecting rod.

3. The circuit testing probe according to claim 1, characterized in that, The outer surface of the needle bar is movably connected to the inside of the rotating disk, the needle tip is fixedly connected to the bottom of the needle bar, the second limiting ring is fixedly connected to the surface of the needle bar, and the second limiting ring is movably connected to the top surface of the rotating disk.

4. The circuit testing probe according to claim 1, characterized in that, The top of the spring telescopic rod is fixedly connected to the inner surface of the top of the protective cylinder, the limiting plate is fixedly connected to the bottom of the spring telescopic rod, the limiting plate is movably connected to the outer surface of the connecting rod, the contact head is fixedly connected to the bottom of the limiting plate, and the contact head is movably connected to the top of the needle rod.

5. A circuit testing probe according to claim 1, characterized in that, The limiting sleeve is fixedly connected to the inner surface of the protective cylinder, the spring sleeve is fixedly connected to the surface of the limiting sleeve, the positioning block is fixedly connected to the bottom of the spring sleeve, and the positioning block is movably connected to the inside of the positioning groove.

6. A circuit testing probe according to claim 1, characterized in that, The protective cylinder has a fixing component inside, which includes a threaded rod that is threadedly connected to the surface of the protective cylinder near the top. One end of the threaded rod is fixedly connected to a fixing block, and a fixing groove is formed on the surface of the connecting rod. The fixing block is movably connected inside the fixing groove.

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