Millimeter wave test system

Abstract

The utility model discloses a millimeter wave test system, which relates to the technical field of microwaves and millimeter waves and comprises a signal generator module, a spectrum analysis module, a network analysis module, a power measurement module, an antenna test module, a signal processing module, a control and data processing module, a test fixture and an adapter. According to the utility model, a plurality of test functions are integrated, so that the complexity of the system is reduced, and the test efficiency is improved; according to the utility model, advanced signal processing and calibration technologies are adopted, so that the accuracy of a test result is ensured; multiple test modes and interface types are supported, and diversified test requirements are met; automatic testing is achieved through control, and personal errors are reduced.

Description

Technical Field

[0001] This utility model relates to the field of microwave and millimeter wave technology, and in particular to a millimeter wave testing system. Background Technology

[0002] With the rapid development of 5G communication, millimeter-wave radar, and high-frequency wireless communication technologies, the testing requirements for millimeter-wave band (30 GHz to 300 GHz) devices are increasing. Traditional microwave testing systems cannot meet the high-frequency, wide-bandwidth, and high-precision testing requirements of the millimeter-wave band. Existing millimeter-wave testing systems have the following problems:

[0003] 1. The testing equipment is complex and has low integration, making it difficult to achieve efficient automated testing.

[0004] 2. Significant signal transmission loss and insufficient testing accuracy.

[0005] 3. Lack of flexible testing solutions makes it difficult to meet the testing needs of multiple scenarios.

[0006] Therefore, there is an urgent need for a new millimeter-wave testing system to solve the above problems. Utility Model Content

[0007] The purpose of this invention is to address the shortcomings and deficiencies of existing technologies by providing a millimeter-wave testing system with high integration, high testing accuracy, and strong compatibility, which can meet the diverse testing needs of millimeter-wave equipment.

[0008] To achieve the above objectives, this utility model provides the following technical solution:

[0009] A millimeter-wave testing system includes a signal generator module, a spectrum analysis module, a network analysis module, a power measurement module, an antenna testing module, a signal processing module, a control and data processing module, a memory module, a clock module, an interface module, a data transmission module, test fixtures and adapters, and a power supply module.

[0010] The output of the signal generator module is connected to the input of the spectrum analysis module; the output of the spectrum analysis module is connected to the input of the network analysis module; the output of the network analysis module is connected to the input of the power measurement module; the output of the power measurement module is connected to the input of the antenna test module; the output of the antenna test module is connected to the input of the signal processing module; the output of the signal processing module is connected to the input of the control and data processing module; and the output of the data processing module is connected to the test fixture and adapter. The memory module, clock module, interface module, data transmission module, and power supply module are respectively connected to the control and data processing module.

[0011] As a further preferred embodiment of the millimeter-wave testing system of this utility model, the frequency range of the signal generator module is 30GHz to 300GHz.

[0012] As a further preferred embodiment of the millimeter-wave testing system of this utility model, the signal processing module includes an attenuator, an amplifier circuit, a mixer, and a local oscillator circuit; the antenna testing module is connected to the control and data processing module in sequence through the attenuator, the amplification and filtering circuit, the mixer, and the local oscillator circuit.

[0013] As a further preferred embodiment of the millimeter-wave testing system of this utility model, the amplification and filtering circuit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a first operational amplifier, a second operational amplifier, and a third operational amplifier. The signal input -IN terminal is connected to one end of the first resistor; the other end of the first resistor is connected to one end of the first capacitor, one end of the third resistor, and the negative power supply pin of the first operational amplifier; the other end of the first capacitor is connected to the other end of the third resistor and the output pin of the first operational amplifier; the signal input +IN terminal is connected to one end of the second resistor; and the other end of the second resistor is connected to the output pin of the first operational amplifier. The positive power supply pin is connected to one end of the fourth resistor and one end of the second capacitor. The other end of the second capacitor is connected to the other end of the fourth resistor and grounded. The output pin of the first operational amplifier is connected to one end of the fifth resistor. The other end of the fifth resistor is connected to the positive power supply pin of the second operational amplifier. The negative power supply pin of the second operational amplifier is connected to the negative power supply pin of the third operational amplifier. The positive power supply pin of the third operational amplifier is connected to one end of the eighth resistor and one end of the ninth resistor. The other end of the ninth resistor is grounded. The other end of the eighth resistor is connected to one end of the seventh resistor and the output pin of the second operational amplifier. The other end of the seventh resistor is connected to one end of the fourth capacitor. The other end of the fourth capacitor is connected to one end of the ninth resistor. The other end of the ninth resistor is connected to one end of the third capacitor. The other end of the third capacitor is grounded.

[0014] As a further preferred embodiment of the millimeter-wave testing system of this utility model, the control and data processing module supports automated test scripts and multiple communication interfaces; the communication interfaces include GPIB, LAN, and USB.

[0015] As a further preferred embodiment of the millimeter-wave testing system of this utility model, the power supply module includes a voltage source and an overvoltage protection circuit connected thereto, and the overvoltage protection circuit includes a reference voltage circuit and a feedback control circuit.

[0016] The reference voltage circuit is used to generate a reference voltage based on the source voltage when the source voltage exceeds the clamping voltage.

[0017] The feedback control circuit is used to receive the reference voltage and clamp the output voltage to the clamping voltage;

[0018] Specifically, it includes a first diode Z1, a second diode Z2, a third diode Z3, a fourth diode Z4, a fifth diode Z5, a first resistor R1, a second resistor R2, a third resistor R3, and PMOS transistors M1, M2, M3, and M4. The anode of the first diode Z1 is connected to one end of the first resistor R1, the cathode and anode of the first diode Z1 are connected to the cathode of the second diode Z2, the anode of the second diode Z2 is connected to the cathode of the third diode Z3, and the anode of the third diode Z3 is connected to one end of the second resistor R2, the anode of the fourth diode Z4, and one end of the third resistor R3. The anode of the fifth diode Z5 and the source of PMOS transistor M1 are connected to the drain of PMOS transistor M3, the gate of PMOS transistor M3, and the gate of PMOS transistor M4, respectively. The source of PMOS transistor M3 is connected to the source of PMOS transistor M4, the drain of PMOS transistor M2, and the drain of PMOS transistor M1, respectively. The drain of PMOS transistor M4 is connected to the other end of the second resistor R2, the cathode of the fourth diode Z4, and the gate of PMOS transistor M2, respectively. The source of PMOS transistor M2 is connected to the other end of the third resistor R3, the cathode of the fifth diode Z5, and the gate of PMOS transistor M1, respectively.

[0019] Compared with the prior art, the present invention, by adopting the above technical solution, has the following technical effects:

[0020] This invention discloses a millimeter-wave testing system, comprising a signal generator module, a spectrum analysis module, a network analysis module, a power measurement module, an antenna testing module, a signal processing module, a control and data processing module, and test fixtures and adapters. The system generates millimeter-wave test signals through the signal generator module, which are then input to the device under test (DUT). The output signals of the DUT are measured and analyzed by the spectrum analysis, network analysis, and power measurement modules. The antenna testing module tests the radiation characteristics of the millimeter-wave antenna using a three-dimensional positioning system. The signal processing module adjusts the signal intensity and converts the frequency to ensure testing accuracy. The control and data processing module monitors the testing process, collects data, and generates test reports. This invention integrates multiple testing functions, reducing system complexity and improving testing efficiency. It employs advanced signal processing and calibration technologies to ensure the accuracy of test results. It supports multiple test modes and interface types to meet diverse testing needs. Automated testing is achieved through control, reducing human error. Attached Figure Description

[0021] The accompanying drawings, which are provided to further illustrate the present invention and form part of this application, do not constitute an undue limitation of the present invention. In the drawings:

[0022] Figure 1 This is a schematic diagram of the structural principle of a millimeter-wave testing system according to this utility model;

[0023] Figure 2 This is a circuit diagram of the amplification and filtering circuit of this utility model;

[0024] Figure 3 This is the circuit diagram of the power supply module of this utility model. Detailed Implementation

[0025] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments. The illustrative embodiments and descriptions are only used to explain the present invention and are not intended to limit the present invention.

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present utility model, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the scope of protection of the present utility model.

[0027] A millimeter-wave testing system, such as Figure 1 As shown, it includes a signal generator module, a spectrum analysis module, a network analysis module, a power measurement module, an antenna test module, a signal processing module, a control and data processing module, a memory module, a clock module, an interface module, a data transmission module, a test fixture and adapter, and a power supply module;

[0028] The output of the signal generator module is connected to the input of the spectrum analysis module; the output of the spectrum analysis module is connected to the input of the network analysis module; the output of the network analysis module is connected to the input of the power measurement module; the output of the power measurement module is connected to the input of the antenna test module; the output of the antenna test module is connected to the input of the signal processing module; the output of the signal processing module is connected to the input of the control and data processing module; and the output of the data processing module is connected to the test fixture and adapter. The memory module, clock module, interface module, data transmission module, and power supply module are respectively connected to the control and data processing module.

[0029] The signal generator module is used to generate high-frequency signals in the millimeter-wave band, covering a frequency range of 30 GHz to 300 GHz. It supports various modulation methods and waveform generation, such as continuous wave, pulse wave, and frequency-modulated wave.

[0030] The spectrum analysis module is used to measure and analyze the spectral characteristics of millimeter-wave signals, featuring high resolution and a wide dynamic range. It supports real-time spectrum display and data processing.

[0031] The network analysis module is used to measure the S-parameters of millimeter-wave devices and components, supporting multi-port configuration and high-precision measurement; the built-in calibration function ensures the accuracy of measurement results.

[0032] The power measurement module is used to measure the power of millimeter-wave signals and features high sensitivity and fast response. It supports peak power, average power, and power spectral density measurements.

[0033] The antenna testing module is used to test the radiation characteristics of millimeter-wave antennas, including gain, radiation pattern, and polarization. It is equipped with a 3D positioning system to support automated testing.

[0034] The signal processing module, including attenuators, amplifiers, mixers, and local oscillators, is used for signal strength adjustment and frequency conversion. It features low noise, high linearity, and wide bandwidth.

[0035] The control and data processing module is used for device control, data acquisition, analysis, and report generation. It supports multiple communication interfaces (such as GPIB, LAN, USB) and automated test scripts.

[0036] Test fixtures and adapters are used to connect the device under test (DUT) and the test equipment, ensuring stable signal transmission and low loss. They support multiple interface types for quick replacement and installation.

[0037] This invention generates a millimeter-wave test signal through a signal generator module, which is then input to the device under test (DUT). The output signal of the DUT is measured and analyzed by a spectrum analysis module, a network analysis module, and a power measurement module. The antenna test module tests the radiation characteristics of the millimeter-wave antenna using a three-dimensional positioning system. The signal processing module adjusts the signal intensity and converts the frequency to ensure test accuracy. The control and data processing module monitors the test process, collects data, and generates a test report.

[0038] Integrated design: Integrates multiple testing functions into one, reducing system complexity and improving testing efficiency.

[0039] High-precision measurement: Advanced signal processing and calibration technologies are employed to ensure the accuracy of test results.

[0040] Highly flexible: Supports multiple test modes and interface types to meet diverse testing needs.

[0041] High degree of automation: Automated testing is achieved through control software, reducing human error.

[0042] The specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings:

[0043] 1. Connect the device under test to the test system, ensuring a secure connection and stable signal transmission.

[0044] 2. Start the control software, select the test mode and parameter configuration.

[0045] 3. Run the test program; the system will automatically complete signal generation, measurement, and data acquisition.

[0046] 4. Analyze the test results, generate a test report, and make adjustments and optimizations as needed.

[0047] The millimeter-wave testing system provided by this utility model has the advantages of high integration, high testing accuracy, and strong compatibility. It can be widely used in the research, development, production, and verification of millimeter-wave equipment, and provides strong support for the technological development in related fields.

[0048] like Figure 2 As shown, the amplification and filtering circuit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a first operational amplifier, a second operational amplifier, and a third operational amplifier. The signal input -IN terminal is connected to one end of the first resistor. The other end of the first resistor is connected to one end of the first capacitor, one end of the third resistor, and the negative power supply pin of the first operational amplifier. The other end of the first capacitor is connected to the other end of the third resistor and the output pin of the first operational amplifier. The signal input +IN terminal is connected to one end of the second resistor. The other end of the second resistor is connected to the positive power supply pin of the first operational amplifier and one end of the fourth resistor. One end of the first operational amplifier is connected to one end of the second capacitor, and the other end of the second capacitor is connected to the other end of the fourth resistor and grounded. The output pin of the first operational amplifier is connected to one end of the fifth resistor, and the other end of the fifth resistor is connected to the positive power supply pin of the second operational amplifier. The negative power supply pin of the second operational amplifier is connected to the negative power supply pin of the third operational amplifier. The positive power supply pin of the third operational amplifier is connected to one end of the eighth resistor and one end of the ninth resistor, respectively. The other end of the ninth resistor is grounded. The other end of the eighth resistor is connected to one end of the seventh resistor and one end of the second operational amplifier, respectively. The other end of the seventh resistor is connected to one end of the fourth capacitor, and the other end of the fourth capacitor is connected to one end of the ninth resistor, respectively. The other end of the ninth resistor is connected to one end of the third capacitor, and the other end of the third capacitor is grounded.

[0049] After the collected data is amplified and filtered by the amplification and filtering circuit, the signal noise and signal loss in the measurement are greatly reduced, which is beneficial to long-distance wireless transmission of the signal.

[0050] The control and data processing module supports automated test scripts and multiple communication interfaces, including GPIB, LAN, and USB.

[0051] like Figure 3 As shown, the power module includes a voltage source and an overvoltage protection circuit connected thereto. The overvoltage protection circuit includes a reference voltage circuit and a feedback control circuit.

[0052] The reference voltage circuit is used to generate a reference voltage based on the source voltage when the source voltage exceeds the clamping voltage.

[0053] The feedback control circuit is used to receive the reference voltage and clamp the output voltage to the clamping voltage;

[0054] Specifically, it includes a first diode Z1, a second diode Z2, a third diode Z3, a fourth diode Z4, a fifth diode Z5, a first resistor R1, a second resistor R2, a third resistor R3, and PMOS transistors M1, M2, M3, and M4. The anode of the first diode Z1 is connected to one end of the first resistor R1, the cathode and anode of the first diode Z1 are connected to the cathode of the second diode Z2, the anode of the second diode Z2 is connected to the cathode of the third diode Z3, and the anode of the third diode Z3 is connected to one end of the second resistor R2, the anode of the fourth diode Z4, and one end of the third resistor R3. The anode of the fifth diode Z5 and the source of PMOS transistor M1 are connected to the drain of PMOS transistor M3, the gate of PMOS transistor M3, and the gate of PMOS transistor M4, respectively. The source of PMOS transistor M3 is connected to the source of PMOS transistor M4, the drain of PMOS transistor M2, and the drain of PMOS transistor M1, respectively. The drain of PMOS transistor M4 is connected to the other end of the second resistor R2, the cathode of the fourth diode Z4, and the gate of PMOS transistor M2, respectively. The source of PMOS transistor M2 is connected to the other end of the third resistor R3, the cathode of the fifth diode Z5, and the gate of PMOS transistor M1, respectively.

[0055] The reference voltage circuit is composed of diodes Z1, Z2, and Z3. PMOS transistors M3 and M4 form a current mirror to generate a reference current. PMOS transistor M2 acts as the driver, generating the turn-on current for PMOS transistor M1. PMOS transistor M1 acts as a bleeder, releasing surge current. When the surge voltage exceeds the diode string breakdown voltage, the diode string generates a reference voltage, meaning the Vx voltage remains constant. Simultaneously, a reference current is generated on the side of PMOS transistor M3. This current, mirrored by the current mirror, acts on PMOS transistor M4. This current, passing through resistor R2, raises the voltage across R2, causing the gate voltage of driver PMOS transistor M2 to exceed its threshold voltage, thus turning on PMOS transistor M2. The drive current generated after PMOS transistor M2 turns on raises the voltage across R3, turning on the main bleeder M1. M1 can then discharge a large amount of current, clamping the entire chip at a certain voltage. Due to the large size of M1, M2 needs to generate sufficient drive current to turn it on.

[0056] Typically, a current of tens of microamps is required to drive the bleeder. Furthermore, to improve the discharge efficiency of M1, its gate voltage can be appropriately increased. Raising the instantaneous gate voltage of M1 to exceed its maximum gate voltage is beneficial for enhancing its discharge capability.

[0057] As the source voltage Vsource increases, more current is injected into the buffer transistor M2, which further increases the gate voltage of the main clamping device M1, thereby allowing more current to be discharged and adjusting the output voltage of the circuit to the clamping voltage.

[0058] By using feedback control, the output voltage can be precisely clamped to the desired clamping voltage. Regardless of the current discharged by the main clamping transistor, the final dynamic resistance of the protection circuit can be almost zero.

[0059] The above description is only a preferred embodiment of the present utility model. Therefore, all equivalent changes or modifications made to the structure, features and principles described in the claims of the present utility model patent application are included in the scope of the present utility model patent application.

[0060] It will be understood by those skilled in the art that, unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in general dictionaries should be understood to have the same meaning as in the context of the prior art, and should not be interpreted in an idealized or overly formal sense unless defined as herein.

[0061] The above embodiments are merely illustrative of the technical concept of this utility model and should not be construed as limiting the scope of protection of this utility model. Any modifications made to the technical solution based on the technical concept proposed in this utility model shall fall within the scope of protection of this utility model. The implementation methods of this utility model have been described in detail above, but this utility model is not limited to the above-described implementation methods. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this utility model.

Claims

1. A millimeter-wave testing system, characterized in that: It includes a signal generator module, a spectrum analysis module, a network analysis module, a power measurement module, an antenna test module, a signal processing module, a control and data processing module, a memory module, a clock module, an interface module, a data transmission module, test fixtures and adapters, and a power supply module; The output of the signal generator module is connected to the input of the spectrum analysis module; the output of the spectrum analysis module is connected to the input of the network analysis module; the output of the network analysis module is connected to the input of the power measurement module; the output of the power measurement module is connected to the input of the antenna test module; the output of the antenna test module is connected to the input of the signal processing module; the output of the signal processing module is connected to the input of the control and data processing module; and the output of the data processing module is connected to the test fixture and adapter. The memory module, clock module, interface module, data transmission module, and power supply module are respectively connected to the control and data processing module.

2. The millimeter-wave testing system according to claim 1, characterized in that: The frequency range of the signal generator module is 30 GHz to 300 GHz.

3. The millimeter-wave testing system according to claim 1, characterized in that: The signal processing module includes an attenuator, an amplifier circuit, a mixer, and a local oscillator circuit; the antenna testing module is connected to the control and data processing module in sequence through the attenuator, amplification and filtering circuit, mixer, and local oscillator circuit.

4. The millimeter-wave testing system according to claim 3, characterized in that: The amplification and filtering circuit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a first operational amplifier, a second operational amplifier, and a third operational amplifier. The signal input -IN terminal is connected to one end of the first resistor. The other end of the first resistor is connected to one end of the first capacitor, one end of the third resistor, and the negative power supply pin of the first operational amplifier. The other end of the first capacitor is connected to the other end of the third resistor and the output pin of the first operational amplifier. The signal input +IN terminal is connected to one end of the second resistor. The other end of the second resistor is connected to the positive power supply pin of the first operational amplifier and one end of the fourth resistor. One end of the first operational amplifier is connected to one end of the second capacitor, and the other end of the second capacitor is connected to the other end of the fourth resistor and grounded. The output pin of the first operational amplifier is connected to one end of the fifth resistor, and the other end of the fifth resistor is connected to the positive power supply pin of the second operational amplifier. The negative power supply pin of the second operational amplifier is connected to the negative power supply pin of the third operational amplifier. The positive power supply pin of the third operational amplifier is connected to one end of the eighth resistor and one end of the ninth resistor, respectively. The other end of the ninth resistor is grounded. The other end of the eighth resistor is connected to one end of the seventh resistor and one end of the second operational amplifier, respectively. The other end of the seventh resistor is connected to one end of the fourth capacitor, and the other end of the fourth capacitor is connected to one end of the ninth resistor, respectively. The other end of the ninth resistor is connected to one end of the third capacitor, and the other end of the third capacitor is grounded.

5. The millimeter-wave testing system according to claim 1, characterized in that: The control and data processing module supports automated test scripts and multiple communication interfaces, including GPIB, LAN, and USB.

6. The millimeter-wave testing system according to claim 1, characterized in that, The power module includes a voltage source and an overvoltage protection circuit connected thereto, the overvoltage protection circuit including a reference voltage circuit and a feedback control circuit; The reference voltage circuit is used to generate a reference voltage based on the source voltage when the source voltage exceeds the clamping voltage. The feedback control circuit is used to receive the reference voltage and clamp the output voltage to the clamping voltage; Specifically, it includes a first diode Z1, a second diode Z2, a third diode Z3, a fourth diode Z4, a fifth diode Z5, a first resistor R1, a second resistor R2, a third resistor R3, and PMOS transistors M1, M2, M3, and M4. The anode of the first diode Z1 is connected to one end of the first resistor R1, the cathode and anode of the first diode Z1 are connected to the cathode of the second diode Z2, the anode of the second diode Z2 is connected to the cathode of the third diode Z3, and the anode of the third diode Z3 is connected to one end of the second resistor R2, the anode of the fourth diode Z4, and one end of the third resistor R3. The anode of the fifth diode Z5 and the source of PMOS transistor M1 are connected to the drain of PMOS transistor M3, the gate of PMOS transistor M3, and the gate of PMOS transistor M4, respectively. The source of PMOS transistor M3 is connected to the source of PMOS transistor M4, the drain of PMOS transistor M2, and the drain of PMOS transistor M1, respectively. The drain of PMOS transistor M4 is connected to the other end of the second resistor R2, the cathode of the fourth diode Z4, and the gate of PMOS transistor M2, respectively. The source of PMOS transistor M2 is connected to the other end of the third resistor R3, the cathode of the fifth diode Z5, and the gate of PMOS transistor M1, respectively.

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