Capacitor loss detection device and system

Abstract

The embodiment of the utility model provides a capacitor loss detection device and system. The device comprises an upper steel plate, a middle clamping plate and a lower steel plate, the upper steel plate, the middle clamping plate and the lower steel plate are arranged from top to bottom; the upper steel plate and the lower steel plate are frame-shaped and are hollow in the middle; the middle clamping plate is of a hollowed-out plate-shaped structure, and the distribution of hollowed-out areas on a plate-shaped main body of the middle clamping plate is matched with the distribution of capacitors of a product to be inspected; the middle clamping plate is detachable, and the upper steel plate, the middle clamping plate and the lower steel plate are all provided with corresponding through holes and are fixed through detachable fasteners. Through the customized hollowed-out design, rapid inspection is realized, the labor cost is reduced, the inspection accuracy and efficiency are improved, the production quality of electronic components is ensured, and the device can be widely applied to the quality inspection link of electronic production enterprises.

Description

Technical Field

[0001] The present disclosure relates to the technical field of electronic manufacturing quality inspection, and particularly to a capacitor missing inspection device and system. Background Art

[0002] In the field of LGA (Land Grid Array Package) product manufacturing, a large number of pads are usually arranged on the back of the product. Some pads need to be welded with capacitors, while some are designed as empty pads. Currently, after the LGA product is inspected by an automatic optical machine, there are still units that need to be manually reconfirmed. However, the capacitors on the back of such units are tiny in size, and the number of capacitors in a single unit is large and they are arranged densely.

[0003] In the prior art, there are significant defects in the way of manually confirming whether a capacitor is missing. On the one hand, when manually checking one by one against the standard unit with the naked eye, it is very easy to cause misjudgment due to visual fatigue and resolution error, and then misjudge defective products as qualified products and flow into the next process, increasing the risk of customer complaints. On the other hand, due to the large number of units to be confirmed, the time-consuming for individual confirmation is extremely long, seriously affecting the blanking efficiency and restricting the product shipment progress. If the automatic optical machine is restarted to improve the detection accuracy, it is necessary to notify the equipment assistant to separately adjust the program for the capacitor part, which is not only cumbersome to operate, but also causes a great waste of the production capacity of the automatic optical machine, resulting in an increase in production costs and an extension of the production cycle. Therefore, there is an urgent need to develop an efficient and accurate capacitor missing detection technology or device to solve the problems of easy error and low efficiency in manual confirmation in the existing detection method, and the waste of production capacity in the re-inspection of the automatic optical machine. Utility Model Content

[0004] Embodiments of the present disclosure provide a capacitor missing inspection device and system to solve the related problems existing in the existing technical solutions.

[0005] Based on the above problems, in the first aspect, a capacitor missing inspection device is provided, including:

[0006] An upper steel plate, an intermediate clamping plate, and a lower steel plate;

[0007] The upper steel plate, the intermediate clamping plate, and the lower steel plate are arranged from top to bottom;

[0008] The upper steel plate and the lower steel plate are in a frame shape with a hollow in the middle;

[0009] The intermediate clamping plate is a hollow plate-like structure, and the distribution of the hollow areas on its plate-like main body matches the capacitor distribution of the product to be inspected;

[0010] The intermediate clamping plate is detachable, and corresponding through holes are provided on the upper steel plate, the intermediate clamping plate, and the lower steel plate, and they are fixed by detachable fasteners.

[0011] In conjunction with the first aspect, in one possible implementation, the upper steel plate, the intermediate clamping plate, and the lower steel plate are made of anti-static discharge materials.

[0012] In conjunction with the first aspect, in one possible implementation, the intermediate clamp is set to a color different from the capacitor of the product to be inspected.

[0013] In conjunction with the first aspect, in one possible implementation, the rigidity of the intermediate clamp does not exceed a preset value to avoid damage to the product to be inspected during operation.

[0014] In a second aspect, a capacitance defect inspection system is provided, comprising: a capacitance defect inspection device and a product tray as described in the first aspect or any embodiment in conjunction with the first aspect.

[0015] The product tray is used to place products to be inspected.

[0016] The capacitor missing inspection device is placed above the product tray and the product, and is fixed relative to the product tray. In the capacitor missing inspection device, the hollow area of ​​the middle clamp corresponds to the location of the capacitor of the product to be inspected.

[0017] In conjunction with the second aspect, in one possible implementation, the capacitor defect inspection device supports the simultaneous inspection of multiple products to be inspected, and the number of products to be inspected simultaneously is consistent with the number of products that can be placed on the corresponding product tray.

[0018] In conjunction with the second aspect, in one possible implementation, the hollowed-out area of ​​the intermediate clamp in the capacitor deficiency testing device is adapted to the capacitor distribution corresponding to the model of the product to be tested placed on the product tray.

[0019] In conjunction with the second aspect, in one possible implementation, the upper steel plate is provided with an indicator mark corresponding to the missing corner on the product tray, so that the capacitor missing inspection device is placed above the product tray in the correct orientation.

[0020] In conjunction with the second aspect, in one possible implementation, the lower steel plate has a groove at its bottom that matches a raised structure on the edge of the product tray, so that the capacitor loss inspection device is relatively fixed above the product tray.

[0021] In conjunction with the second aspect, in one possible implementation, the system further includes: a camera and an all-in-one unit;

[0022] The camera is mounted above the capacitance loss detection device;

[0023] The camera's shooting angle covers the hollow area of ​​the main body of the inspection device;

[0024] The camera is communicatively connected to the all-in-one device and sends images to the all-in-one device;

[0025] The all-in-one device is provided with an image display area for displaying images captured by the camera;

[0026] The length and width dimensions of the capacitor and the empty pad of the product to be inspected are fixed values, and the width of the empty pad is smaller than the width of the capacitor.

[0027] The beneficial effects of the embodiments disclosed herein include:

[0028] This disclosure provides a capacitor missing inspection device and system for use on electronic component production lines. It allows for the rapid and accurate inspection of missing capacitors on products such as circuit boards. The device consists of an upper steel plate, a middle clamping plate, and a lower steel plate arranged from top to bottom and secured by detachable fasteners, forming a stable inspection structure. The upper and lower steel plates are frame-like with a hollow center, providing a basic framework for the overall device while allowing space for easy observation and operation. The middle clamping plate is detachable, and the hollowed-out areas match the capacitor distribution of the product to be inspected. When the product is placed on the middle clamping plate, the capacitors will be located in the corresponding hollowed-out areas. If a capacitor is missing, it can be visually detected through the hollowed-out areas, facilitating identification. The capacitor missing inspection device provided by this disclosure has a simple and stable structure. Its customized hollowed-out design enables rapid inspection, reducing labor costs and improving the accuracy and efficiency of inspection. It effectively solves the technical problems of low efficiency and error-proneness in traditional manual capacitor missing inspection. This ensures the quality of electronic component production and can be widely used in the quality inspection process of electronic manufacturing enterprises. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of a capacitor loss detection device provided in an embodiment of the present disclosure;

[0030] Figure 2 This is a schematic diagram of the upper steel plate provided in an embodiment of this disclosure;

[0031] Figure 3 A schematic diagram of the intermediate clamping plate provided in an embodiment of this disclosure;

[0032] Figure 4 This is a schematic diagram of the lower steel plate provided in an embodiment of this disclosure;

[0033] Figure 5 This is a schematic diagram showing the color comparison between the capacitor and the intermediate clamping plate provided in an embodiment of this disclosure;

[0034] Figure 6 This is a schematic diagram of a capacitor loss detection system provided in an embodiment of the present disclosure;

[0035] Figure 7 A schematic diagram of the indicator markings provided in the embodiments of this disclosure;

[0036] Figure 8 This is a schematic diagram of the capacitor loss detection device, camera, and integrated machine provided in the embodiments of this disclosure. Detailed Implementation

[0037] This disclosure provides a capacitor loss testing device and system. Preferred embodiments of this disclosure are described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustrative and explanatory purposes only and are not intended to limit the scope of this disclosure. Furthermore, the embodiments and features described herein can be combined with each other unless otherwise specified.

[0038] This disclosure provides a capacitor loss detection device, such as... Figure 1 As shown, it includes: an upper steel plate 101, an intermediate clamping plate 102, and a lower steel plate 103;

[0039] The upper steel plate 101, the middle clamping plate 102 and the lower steel plate 103 are arranged from top to bottom;

[0040] The upper steel plate 101 and the lower steel plate 103 are frame-shaped with a hollow center;

[0041] The intermediate clamping plate 102 is a hollow plate-shaped structure, and the distribution of the hollow areas on its plate-shaped main body matches the capacitance distribution of the product to be inspected.

[0042] The intermediate clamping plate 102 is detachable. The upper steel plate 101, the intermediate clamping plate 102 and the lower steel plate 103 are all provided with corresponding through holes and are fixed by detachable fasteners.

[0043] Existing technical solutions in the field of capacitor defect detection suffer from problems such as low efficiency, easy errors in manual inspection, and complex and costly inspection devices. To solve these problems, this disclosure provides a capacitor defect detection device with a simple structure and convenient operation. Through reasonable component design and combination, it can achieve fast and accurate capacitor defect detection.

[0044] In this embodiment, the upper steel plate 101, the intermediate clamping plate 102, and the lower steel plate 103 constitute the main structure of the inspection device. These three components are arranged sequentially from top to bottom and fixed to detachable fasteners through corresponding through holes, forming a stable, stacked inspection structure. In actual assembly, the detachable fasteners can be screws, bolts, nuts, or studs, as long as they ensure a stable connection of the three-layer structure and meet the stability requirements during the inspection process.

[0045] The upper steel plate 101 and lower steel plate 103 adopt a frame-like design with a hollow center. This design ensures the rigidity of the device, preventing structural instability from affecting the inspection, and provides observation and operation space for capacitor inspection, facilitating the observation of capacitor installation. Furthermore, the frame of the upper steel plate 101 and lower steel plate 103 can be a common rectangular frame, or a circular, hexagonal, or other regular geometric frame structure, as long as it ensures the stability of the device and meets the requirements for hollow observation. No limitation is imposed here. Taking a rectangular frame as an example, the structure of the upper steel plate 101, the middle clamping plate 102, and the lower steel plate 103 is as follows: Figure 2 , 3 As shown in Figure 4.

[0046] The intermediate clamping plate 102 is a key component of the device. It adopts a perforated plate-like structure and is detachable. The distribution of the perforated areas on its plate-like main body matches the capacitance distribution of the product to be inspected. When the product to be inspected is placed under the capacitance loss inspection device, one product corresponds to one product unit. All the capacitors on each product unit will correspond to the corresponding perforated areas. One product unit corresponds to one perforated area. If there is a capacitor loss, if there is an empty part in the perforated area without capacitor filling, the inspector can quickly identify it visually. In addition, the perforated areas of the intermediate clamping plate 102 can be distributed in a grid pattern, or designed in an array pattern, irregular distribution, etc., according to the characteristics of the product capacitance distribution. Moreover, various intermediate clamping plates can be disassembled and replaced, as long as they can correspond to the capacitance position of the product to be inspected. There is no limitation here.

[0047] In summary, this capacitor missing detection device transforms capacitor missing detection into intuitive visual judgment through the mechanical cooperation of its components, significantly improving detection efficiency and accuracy, reducing manual inspection costs and the risk of misjudgment, and is suitable for missing detection of various capacitor layout products, possessing strong practicality and versatility.

[0048] In another embodiment provided in this disclosure, the upper steel plate 101, the intermediate clamping plate 102 and the lower steel plate 103 are made of anti-static discharge material.

[0049] During capacitor failure testing, the products under test are usually precision electronic components whose internal circuits and capacitors are sensitive to static electricity and are easily damaged or malfunction due to electrostatic discharge.

[0050] Therefore, in this embodiment of the present disclosure, to avoid the impact of static electricity on the product under test during the inspection process, the upper steel plate 101, the intermediate clamping plate 102, and the lower steel plate 103 of the capacitance deficiency inspection device are made of anti-static discharge material. The application of anti-static discharge material can effectively prevent the accumulation and discharge of static electricity during contact, placement, and inspection operations of the device with the product under test. It is also worth noting that the upper steel plate 101, the lower steel plate 103, and the intermediate clamping plate 102 differ in material due to their different structural functions. This will be explained in detail later and will not be repeated here.

[0051] In implementation, there are several options for antistatic discharge materials. Commonly used materials include engineering plastics with added antistatic agents. By uniformly mixing the antistatic agent into the plastic substrate, the surface resistance is reduced, achieving the electrostatic discharge function. Alternatively, metal materials with antistatic surface treatments can be used, such as forming an antistatic layer on the surface of a steel plate through processes like plating or coating. Furthermore, composite materials with inherently good antistatic properties can also be used, as long as they meet the requirements of preventing electrostatic discharge and not damaging the product being tested.

[0052] Using anti-static discharge materials for the upper steel plate 101, the intermediate clamping plate 102, and the lower steel plate 103 represents a further optimization of the structural design of the capacitance defect testing device. Integrating the anti-static function into the main structure of the device eliminates the potential harm of static electricity to the product during the testing process without altering the original testing function. This ensures both the accuracy and efficiency of capacitance defect testing and effectively protects the product under test, thereby improving the overall performance and application range of the device.

[0053] In another embodiment provided in this disclosure, the intermediate clamp 102 is set to a color different from the capacitor of the product to be inspected.

[0054] During the capacitor missing inspection process, inspectors need to quickly and accurately determine whether the capacitor on the product to be inspected is missing. If the intermediate clamp 102 is similar in color to the product to be inspected, it may cause visual confusion and affect the inspection efficiency and accuracy.

[0055] Based on this, in this embodiment of the disclosure, the color of the intermediate clamp 102 is set to a different color than the capacitor of the product to be inspected, thereby optimizing the performance of the inspection device. See also... Figure 5 The intermediate clamp 102, as a component supporting the product to be inspected, differs in color from the product, significantly improving the visibility of capacitor defects. For example, in actual production, circuit boards are typically green. When the capacitors on the product to be inspected are yellow, setting the intermediate clamp 102 to green, black, or another color makes the location of the missing capacitor on the circuit board more obvious due to the background color of the intermediate clamp 102. Inspectors can more intuitively observe the missing capacitor area, reducing visual fatigue and the probability of misjudgment.

[0056] Furthermore, there are several ways to set the color of the intermediate clamping plate 102 during implementation. Raw materials with a specific color can be directly selected during the clamping plate manufacturing process, such as choosing colored engineering plastics as the clamping plate base material; alternatively, after the clamping plate is formed, it can be given a specific color through processes such as spraying or dyeing. In addition, color differentiation can be achieved by pasting a colored antistatic film, as long as the color difference is obvious and does not affect the antistatic performance and perforated structure of the clamping plate.

[0057] Setting the color of the intermediate clamp 102 to a different color from the capacitor of the product to be inspected is a further improvement to the structural details of the capacitor missing inspection device. From a visual recognition perspective, this simple color differentiation solves the problem of inconvenient observation caused by similar colors. Without changing the main structure of the device or the inspection principle, it effectively improves the work efficiency and judgment accuracy of inspectors, and enhances the ease of use and reliability of the device in practical applications.

[0058] In another embodiment provided in this disclosure, the rigidity of the intermediate clamping plate 102 does not exceed a preset value, so as to avoid damage to the product to be inspected during operation.

[0059] In the capacitor loss inspection operation, the product to be inspected is usually a precision electronic component, whose surface capacitor and circuit are relatively fragile. If the rigidity of the intermediate clamp 102 is too high, the product to be inspected may be subjected to irreversible damage such as squeezing and scratching due to stress concentration during the placement and clamping process.

[0060] Based on this, in this embodiment, the rigidity of the intermediate clamping plate 102 is limited to a range not exceeding a preset value, thereby ensuring the inspection function while protecting the integrity of the product to be inspected. As the direct contact component supporting the product to be inspected, controlling the rigidity of the intermediate clamping plate 102 is crucial to preventing product damage. For example, when inspecting for capacitor defects on a flexible circuit board, the flexible circuit board itself is relatively soft. If the rigidity of the intermediate clamping plate 102 is too high, placing the circuit board on the perforated grid may cause the edges or protrusions of the clamping plate to deform or even break due to excessive pressure. By controlling the rigidity of the intermediate clamping plate 102 within a reasonable range, the clamping plate can provide adequate support when supporting the product, avoiding physical damage to the product to be inspected due to excessive rigidity.

[0061] In implementation, the rigidity of the intermediate clamping plate 102 can be controlled in several ways. This can be achieved by selecting specific materials, such as using engineering plastics with lower rigidity, like modified polypropylene, instead of metal. Rigidity can also be altered by adjusting the thickness or internal structure of the clamping plate; for example, designing a honeycomb-like perforated structure inside the clamping plate can reduce overall rigidity while maintaining basic strength. Furthermore, a buffer layer can be added to the surface of the clamping plate, such as by attaching elastic silicone sheets. This buffer layer absorbs pressure, indirectly controlling the force exerted on the product to be inspected by the clamping plate, as long as the rigidity does not exceed the preset value and the perforation detection function is not affected.

[0062] In this embodiment, the setting of the preset value needs to comprehensively consider factors such as the material, thickness, size, and internal component layout of the product to be tested. For example, for flexible circuit boards with a thickness of 0.5-1mm, due to their soft and easily deformable material, the preset value of the rigidity of the intermediate clamping plate 102 should be relatively low; while for ordinary rigid circuit boards with a thickness of 1.6-2mm, the preset value can be appropriately increased. Generally, taking a common mobile phone motherboard (approximately 0.8mm thick) as a reference, the Shore hardness of the intermediate clamping plate 102 is controlled between 40-60HA, which can provide sufficient support while avoiding deformation of the motherboard or damage to components due to excessive rigidity. In terms of implementation, modified engineering plastics with lower rigidity can be selected, or an elastic buffer layer can be added to the surface of the clamping plate.

[0063] Furthermore, the upper steel plate 101 and the lower steel plate 103 are completely hollowed out and do not contact the circuit board, primarily serving a fixing and stabilizing function. Therefore, they are made of high-rigidity materials. For example, high-strength alloy steel or hard aluminum alloy can be used, utilizing the inherent high strength of these materials to ensure the device remains stable during inspection, preventing shaking or deformation from affecting the inspection results. Even during frequent placement and removal of the circuit board, the high-rigidity upper and lower steel plates 103 maintain the structural stability of the device, providing reliable support for the intermediate clamping plate 102.

[0064] The rigidity of the intermediate clamping plate 102 is limited to a preset value to ensure the structural safety of the capacitor loss testing device. From the perspective of component mechanical performance, the differentiated design of the rigidity of different components optimizes the structural performance of the capacitor loss testing device. By combining the flexible load-bearing capacity of the intermediate clamping plate 102 with the rigid support of the upper and lower steel plates 103, the potential risk of product damage during operation is resolved through rigidity control without changing the device's cutout detection principle. This avoids damage to the product under inspection during operation and ensures the overall stability of the device. Without altering the cutout detection principle, the practicality and reliability of the testing device are significantly improved, effectively meeting the multiple needs of precision electronic component inspection scenarios.

[0065] Based on the same disclosed concept, this disclosure also provides a capacitor loss detection system. Since the principle of the problem solved by this system is similar to that of the aforementioned device, the implementation of this system can refer to the implementation of the aforementioned device, and the repeated parts will not be described again.

[0066] With the above Figure 1 Correspondingly, embodiments of this disclosure also provide a capacitor loss detection system, such as... Figure 6 As shown, it includes: a capacitor loss inspection device 601 as provided in any of the above embodiments and a product tray 602;

[0067] Product tray 602 is used to place products to be inspected;

[0068] The capacitor missing inspection device 601 is placed on top of the product tray 602 and the product, and is fixed relative to the product tray 602. In the capacitor missing inspection device 601, the hollow area of ​​the middle clamping plate 102 corresponds to the location of the capacitor of the product to be inspected.

[0069] To further improve the standardization and convenience of capacitor missing inspection, a capacitor missing inspection system is provided based on the existing capacitor missing inspection device 601. This system combines the capacitor missing inspection device 601 with a product tray 602, optimizing the inspection process and improving inspection efficiency and accuracy.

[0070] In this embodiment, the capacitor defect inspection system includes two parts: a capacitor defect inspection device 601 and a product tray 602. The product tray 602 serves as a carrier for the products to be inspected, providing a stable placement space for the products. For example, in an electronic component production line, the product tray 602 can orderly place mobile phone motherboards, computer graphics card circuit boards, and other products awaiting inspection, preventing collisions and damage during the product flow process.

[0071] The capacitor missing inspection device 601 is placed on top of the product tray 602 and the product, and is fixed relative to the product tray 602. The capacitor missing inspection device 601 maintains a fixed position during the inspection process to prevent shaking from affecting the inspection results. There are many ways to fix the product tray 602 and the capacitor missing inspection device 601; mechanical connection structures such as slots and clips can be used, as long as a stable connection is achieved and the device is easy to disassemble. In the capacitor missing inspection device 601, the hollow area of ​​the intermediate clamping plate 102 corresponds to the location of the capacitors on the product to be inspected. When the capacitor missing inspection device 601 is installed above the product tray 602, the capacitors on the product to be inspected precisely correspond to the hollow grid of the intermediate clamping plate 102, allowing inspectors to quickly check whether capacitors are missing through the hollow area. For example, when inspecting a smartwatch circuit board, the circuit board is placed on the product tray 602. After installing the capacitor missing inspection device 601, all the capacitors on the circuit board are exposed in the hollow area of ​​the intermediate clamping plate 102, facilitating quick identification of capacitor missing conditions.

[0072] In summary, the capacitor missing inspection system provided in this disclosure integrates product support and capacitor inspection functions through the combined design of the capacitor missing inspection device 601 and the product tray 602. This system ensures the stability of the product under inspection and improves the standardization of inspection operations through a fixed connection method, reducing false detections caused by device misalignment. It significantly improves the overall efficiency and reliability of capacitor missing inspection and is suitable for various electronic component production and inspection scenarios.

[0073] In another embodiment provided in this disclosure, the capacitor defect inspection device 601 supports the simultaneous inspection of multiple products to be inspected, and the number of products to be inspected simultaneously is consistent with the number of products that can be placed on the corresponding product tray 602.

[0074] In this embodiment, the capacitance defect inspection device 601 supports the simultaneous inspection of multiple products, the number of which is determined by the number of products that can be placed on the corresponding product tray 602. The product tray 602 serves as a platform for the products to be inspected, arranging multiple products in an orderly manner through preset placement positions. For example, in the inspection of tablet computer circuit boards, the product tray 602 is designed with 10 independent placement slots, capable of simultaneously fixing 10 circuit boards. The number and value of the hollowed-out areas in the intermediate clamping plate 102 of the capacitor defect inspection device 601 are also 10, and the layout of the hollowed-out areas matches the capacitance distribution of the 10 circuit boards, allowing the inspection device to perform capacitance defect inspection on 10 circuit boards in a single installation.

[0075] In this embodiment, the simultaneous inspection of multiple products is achieved through the coordinated optimization of the capacitor defect inspection device 601 and the product tray 602. Compared with the method of inspecting each product one by one, this significantly increases the inspection volume per unit time, reduces repetitive device installation operations, and lowers labor and time costs. At the same time, the standardized multi-product placement and inspection mode also improves the consistency and accuracy of inspection results, effectively meeting the high-efficiency inspection requirements in the mass production of electronic components.

[0076] In another embodiment provided in this disclosure, the hollow area of ​​the intermediate clamping plate 102 in the capacitor deficiency inspection device 601 is adapted to the capacitor distribution corresponding to the model of the product to be inspected placed on the product tray 602.

[0077] In the production and inspection of electronic components, there are many different models of products to be inspected, and their capacitance distribution and size specifications vary significantly. Traditional fixed-structure inspection devices are difficult to meet the diverse testing needs.

[0078] Therefore, in this embodiment of the present disclosure, the capacitor missing inspection device 601 adopts a detachable intermediate clamp plate 102 design, which can be adapted to different models of products and the capacitor distribution area of ​​the corresponding product tray 602 to realize the flexible application and efficient detection of the capacitor missing inspection device 601.

[0079] In practice, the intermediate clamping plate 102 is customized according to different product models and the layout of the product tray 602 that holds the products to be inspected for that model. For example, the capacitor distribution and size of smartphone motherboards and smart TV circuit boards are different, and the corresponding product trays 602 will be designed with different placement layouts and limiting structures. When customizing the intermediate clamping plate 102, it is necessary to accurately measure the capacitor positions of the corresponding products, design a matching hollow grid distribution, and ensure that the clamping plate size is compatible with the placement area of ​​the product tray 602.

[0080] When the intermediate clamping plate 102 is replaced according to the model of the product to be tested, quick loading and unloading can be achieved using the through holes and fasteners at corresponding positions on the upper steel plate 101, intermediate clamping plate 102, and lower steel plate 103. Screws are typically used as fasteners. When the intermediate clamping plate 102 needs to be replaced, the fixing screws are unscrewed to remove the original clamping plate and install a new clamping plate suitable for the current product model. Alternatively, quick-release pins, clips, or other connection structures can be used to further shorten the replacement time. For example, by setting spring clips on the edge of the clamping plate, which cooperate with the slots on the upper and lower steel plates 103, pressing the clips allows for quick disassembly and installation of the clamping plate, significantly improving the response speed of the testing device to different product models.

[0081] In this embodiment, the detachable intermediate clamp 102 design enables the capacitor defect testing device 601 to be compatible with different product models. By quickly replacing the adapter clamp, there is no need to configure dedicated testing equipment for each product, significantly reducing equipment costs and space occupation. At the same time, the precisely matched distribution of the hollowed-out areas ensures the accuracy and efficiency of testing different products, improving the versatility and practicality of the testing device and effectively meeting the diverse testing needs of electronic components.

[0082] In another embodiment provided in this disclosure, the upper steel plate 101 is provided with an indicator mark that corresponds to the missing corner on the product tray 602, so that the capacitor missing inspection device 601 is placed above the product tray 602 in the correct direction.

[0083] In the actual operation of the capacitor missing inspection system, if the capacitor missing inspection device 601 is placed in the wrong orientation, the product to be inspected will not correspond to the hollow area of ​​the intermediate clamping plate 102, thus affecting the accuracy and effectiveness of the capacitor missing inspection.

[0084] Based on this, in this embodiment of the disclosure, in order to ensure that the capacitor missing inspection device 601 can be installed in the correct direction, an indicator mark is set on the upper steel plate 101 of the capacitor missing inspection device 601 and matches the missing corner on the product tray 602 to achieve precise positioning and installation.

[0085] The indicator marks on the upper steel plate 101 and the notch on the product pallet 602 form a positioning and mating mechanism. (See reference...) Figure 7 Specifically, the indicator marks can be special graphics, symbols, or color markings etched or printed on the edge of the upper steel plate 101, while one corner of the product tray 602 is designed with a notched corner structure. During inspection, the operator must align the indicator marks on the upper steel plate 101 with the notched corner of the product tray 602. At this point, the capacitor missing inspection device 601 is in the correct installation orientation, ensuring that the capacitor distribution area of ​​the product to be inspected placed on the tray precisely matches the hollowed-out area of ​​the intermediate clamping plate 102. For example, when inspecting a smart bracelet circuit board, aligning the triangular indicator marks on the upper steel plate 101 with the notched corner of the product tray 602 ensures that the capacitors on the smart bracelet circuit board accurately correspond to the hollowed-out area of ​​the intermediate clamping plate 102, avoiding missed or misjudged capacitor inspections due to tray misalignment.

[0086] In implementation, the form of the indicator markings can be chosen in several ways. Besides graphics, symbols, and color coding, raised locating pins can also be used as indicator markings, with corresponding locating holes provided at the notched corner of the product tray 602. The pin holes work together to achieve more precise mechanical positioning. Alternatively, electronic induction markings can be used, with a sensor chip installed on the upper steel plate 101 and a sensor contact at the notched corner of the product tray 602. When the position is correct, an indicator light illuminates to indicate proper installation. The notched corner of the product tray 602 can also be replaced with a specially shaped edge structure, as long as it can form a unique and correct mating relationship with the indicator markings on the upper steel plate 101.

[0087] In this embodiment, the design of the indicator mark matching the missing corner solves the installation and positioning problem of the capacitor defect inspection device 601. Through a simple and effective mechanical or visual positioning method, installation deviations caused by human error are avoided, ensuring that the product to be inspected and the hollowed-out area of ​​the intermediate clamping plate 102 always maintain the correct correspondence. This improves the accuracy and stability of capacitor defect inspection, while reducing operator training costs and enhancing the overall reliability and ease of use of the inspection system.

[0088] In another embodiment provided in this disclosure, the lower steel plate 103 has a groove at its bottom, which matches the raised structure on the edge of the product tray 602, so that the capacitor loss inspection device 601 is relatively fixed above the product tray 602.

[0089] If the capacitor defect inspection device 601 is not securely fixed during the operation of the capacitor defect inspection system, the product to be inspected may shift during inspection, affecting the accuracy and stability of the capacitor defect inspection.

[0090] Based on this, in this embodiment of the disclosure, in order to ensure that the capacitor missing inspection device 601 is securely installed, the capacitor missing inspection device 601 is reliably fixed to the product tray 602 by setting a groove at the bottom of the lower steel plate 103 and matching it with the protruding structure on the edge of the product tray 602.

[0091] The groove at the bottom of the lower steel plate 103 and the raised structure on the edge of the product tray 602 form a mechanical fit. Specifically, the shape and size of the groove and the raised structure are precisely matched. When the capacitor missing inspection device 601 is installed, the raised structure of the product tray 602 is embedded in the groove of the lower steel plate 103. The fit between the two shapes forms a limiting constraint, firmly fixing the capacitor missing inspection device 601 above the product tray 602. For example, when inspecting a digital camera circuit board, aligning the rectangular groove at the bottom of the lower steel plate 103 with the rectangular protrusion on the edge of the product tray 602 and pressing down to make the protrusion fully embedded in the groove, the capacitor missing inspection device 601 can be stably installed. This ensures that the circuit board placed on the tray will not shift due to external force during the inspection process, and that the capacitors on the circuit board and the hollowed-out area of ​​the intermediate clamping plate 102 always maintain a corresponding relationship.

[0092] In implementation, the groove and protrusion structures can be designed in various ways. Besides rectangular structures, trapezoidal, dovetail, and other sloping shapes can be used to enhance the stability of the connection; or anti-slip textures can be added to the contact surfaces of the groove and protrusion to increase friction and prevent relative sliding. Furthermore, an elastic snap-fit ​​structure can be combined, where the snap-fit ​​automatically locks after the protrusion is embedded in the groove, further reinforcing the connection. The protrusion structure on the edge of the product pallet 602 can be designed as a detachable module, replaceable according to different product pallet 602 specifications. The groove in the lower steel plate 103 can also be modularly spliced ​​to achieve size adjustment, adapting to various sizes of product pallets 602.

[0093] In this embodiment, the design of the groove and protrusion structure solves the technical problem of fixing the capacitor defect testing device 601. A stable connection is achieved through a simple and reliable mechanical structure. Compared to traditional single fixing methods, this effectively prevents the capacitor defect testing device 601 from shifting or loosening during the testing process, significantly improving the stability and accuracy of capacitor defect testing. Simultaneously, the modular design enhances the device's adaptability to product trays 602 of different specifications, improving the versatility and practicality of the capacitor defect testing system.

[0094] In yet another embodiment provided in this disclosure, the above-mentioned capacitor loss detection system further includes: a camera and an all-in-one machine;

[0095] The camera is mounted above the capacitor loss detection device 601;

[0096] The camera's shooting angle covers the hollow area of ​​the main body of the inspection device 601;

[0097] The camera communicates with the all-in-one device and sends images to it.

[0098] The all-in-one camera has an image display area for displaying images captured by the camera;

[0099] The length and width dimensions of the capacitor and the empty pad of the product to be inspected are fixed values, and the width of the empty pad is smaller than the width of the capacitor.

[0100] With the increasing automation of electronic component production, the traditional method of visually inspecting for missing capacitors by hand is no longer sufficient to meet the needs of efficient and accurate inspection.

[0101] Therefore, in order to further improve the automation level and accuracy of capacitance defect inspection, this embodiment introduces a camera and an all-in-one unit on the basis of the original capacitance defect inspection device 601 to realize the visualization and intelligence of the inspection process.

[0102] In this embodiment, the camera is mounted above the capacitor defect inspection device 601, and its shooting angle completely covers the hollow area of ​​the main body of the inspection device. The hollow area design of the middle clamping plate 102 in the capacitor defect inspection device 601 exposes the capacitors and empty solder pads of the product to be inspected, allowing the camera to directly capture the actual state of the capacitors and empty solder pads and transmit the images to the all-in-one machine in real time. (See reference...) Figure 8 .

[0103] The all-in-one machine establishes a communication connection with the camera, receives images sent by the camera, and has a dedicated image display area for showing the captured content. Operators can more clearly and accurately determine whether a capacitor is missing by observing the image in the display area. Since the length and width dimensions of the capacitor and the empty pad of the product under inspection are fixed, and the width of the empty pad is smaller than the width of the capacitor, the empty pad of the missing capacitor shows a clear difference in size and shape from the normal capacitor in the image display, facilitating quick identification by inspectors.

[0104] During implementation, an industrial-grade high-resolution camera can be selected to ensure the clarity of the captured images; communication connections can utilize wired networks (such as Ethernet) or wireless networks (such as Wi-Fi) to transmit image data, meeting the needs of different production environments. The all-in-one machine can be equipped with a touch screen for convenient image zooming, marking, and other operations; it can also integrate simple image analysis software to automatically identify capacitor loss conditions and provide marking prompts based on preset size thresholds.

[0105] In this embodiment, the introduction of a camera and an all-in-one machine makes it possible to integrate visual inspection technology into the capacitor missing inspection device 601. This can significantly improve inspection efficiency and accuracy, and also enable visualization and data retention of the inspection process, facilitating subsequent traceability and quality analysis. Simultaneously, the inherent size difference between capacitors and empty solder pads provides a foundation for automated identification, effectively promoting the development of capacitor missing inspection towards intelligence and automation.

[0106] Those skilled in the art will understand that the accompanying drawings are merely schematic diagrams of a preferred embodiment, and the structures in the drawings are not necessarily necessary for implementing this disclosure.

[0107] Those skilled in the art will understand that the structures in the apparatus of the embodiments can be distributed in the apparatus of the embodiments as described in the embodiments, or they can be located in one or more apparatuses different from this embodiment with corresponding changes. The structures of the above embodiments can be combined into one structure, or they can be further divided into multiple substructures.

[0108] The sequence numbers of the embodiments disclosed above are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0109] Obviously, those skilled in the art can make various modifications and variations to this disclosure without departing from its spirit and scope. Therefore, if such modifications and variations fall within the scope of the claims of this disclosure and their equivalents, this disclosure is also intended to include such modifications and variations.

Claims

1. A capacitor defect detection device, characterized in that, include: Upper steel plate, middle clamping plate, and lower steel plate; The upper steel plate, the middle clamping plate, and the lower steel plate are arranged from top to bottom; The upper steel plate and the lower steel plate are frame-shaped with a hollow center. The intermediate clamping plate is a hollow plate-shaped structure, and the distribution of the hollow areas on its plate-shaped main body matches the capacitance distribution of the product to be inspected. The intermediate clamping plate is detachable, and the upper steel plate, intermediate clamping plate and lower steel plate are all provided with corresponding through holes and are fixed by detachable fasteners.

2. The apparatus as claimed in claim 1, characterized in that, The upper steel plate, the middle clamping plate, and the lower steel plate are made of anti-static discharge materials.

3. The apparatus as described in claim 1, characterized in that, The intermediate clamp is set to a color different from the capacitor of the product to be inspected.

4. The apparatus as claimed in claim 1, characterized in that, The rigidity of the intermediate clamp does not exceed a preset value to avoid damage to the product to be inspected during operation.

5. A capacitor loss detection system, characterized in that, include: The capacitor loss detection device and product tray as described in any one of claims 1-4; The product tray is used to place products to be inspected. The capacitor missing inspection device is placed above the product tray and the product, and is fixed relative to the product tray. In the capacitor missing inspection device, the hollow area of ​​the middle clamp corresponds to the location of the capacitor of the product to be inspected.

6. The system as described in claim 5, characterized in that, The capacitor loss inspection device supports the simultaneous inspection of multiple products to be inspected, and the number of products to be inspected at the same time is consistent with the number of products that can be placed on the corresponding product tray.

7. The system as described in claim 5, characterized in that, The hollowed-out area of ​​the intermediate clamping plate in the capacitor defect testing device is adapted to the capacitor distribution corresponding to the model of the product to be tested placed on the product tray.

8. The system as described in claim 5, characterized in that, The upper steel plate is equipped with indicator marks that correspond to the missing corners on the product tray, so that the capacitor missing inspection device is placed above the product tray in the correct orientation.

9. The system as described in claim 5, characterized in that, The lower steel plate has a groove at its bottom, which matches the raised structure on the edge of the product tray, so that the product tray is relatively fixed under the lower steel plate.

10. The system as described in claim 5, characterized in that, Also includes: Cameras and all-in-one devices; The camera is mounted above the capacitance loss detection device; The camera's shooting angle covers the hollow area of ​​the main body of the inspection device; The camera is communicatively connected to the all-in-one device and sends images to the all-in-one device; The all-in-one device is provided with an image display area for displaying images captured by the camera; The length and width dimensions of the capacitor and the empty pad of the product to be inspected are fixed values, and the width of the empty pad is smaller than the width of the capacitor.

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