Artificial vertical needle card structure for needles

Abstract

The utility model discloses a perpendicular needle card structure of manual needle -to -needle, specifically relates to probe card manufacturing technical field, including vertical head and explore edge ware needle, the spring needle is installed on the vertical head, and the upper end of vertical head is connected with vertical probe card, the printed wiring board that is equipped with spring needle contact is established on the vertical probe card, explore edge ware needle is established on the vertical probe card, and explore edge ware needle is equipped with two, and the needle tip position of one explore edge ware needle is formed with certain height difference to spring needle vertically downward. The utility model discloses two position indicating needles are set, and the two needles correspond to another chip on the chip, in view of the fixed characteristics between each component on the chip spacing, the operator can easily aim at the position of the two position indicating needles with the aid of microscope, and through the ingenious indirect alignment mode, the calibration of probe card position can be accurately realized, the deficiency of old machine in position alignment is effectively made up, and the accuracy and reliability of test operation are greatly improved.

Description

Technical Field

[0001] This utility model relates to the field of probe card manufacturing technology, specifically to a vertical needle card structure for manual needle alignment. Background Technology

[0002] In the integrated circuit manufacturing process, ensuring that the chip functions as required is a critical step. This requires precise chip testing methods. The common method is to make the probes on the probe card directly contact the area of ​​the chip to be tested to extract signals. Then, in conjunction with peripheral testing instruments and software control, the chip measurement target is achieved. Among them, the vertical probe card is a common type. Its main structure uses the elasticity of the spring pin. The position of the spring pin is stabilized by the insulating material. One end of the spring pin contacts the area of ​​the chip to be tested, and the other end is connected to the corresponding pad on the printed circuit board. The pad is connected to the socket through the traces on the printed circuit board. The socket is connected to the test machine through the connecting wire, thus building a complete test system.

[0003] In actual testing operations, fully automated probe alignment machines play an important role. A camera is equipped on one side of the chip location, which can accurately capture the position of the probe and record its height. Subsequently, the chip is aligned precisely with the fixed pin holder. Then, the chip is slowly brought closer to the vertical pin holder until an electrical connection signal is detected. At this point, a certain amount of safe downward pressure is applied based on the previously recorded probe height to achieve a stable testing process. However, many testing companies in China are still using a large number of outdated equipment. These equipment require manual pin alignment. Due to the structural characteristics of the vertical pin holder, the actual condition of the pin cannot be seen when observing the chip through a microscope. More importantly, the outdated equipment does not have a camera on the chip side, making it impossible to record the position and height of the probe. This defect directly makes it difficult to accurately align the pin. In addition, the chip testing area is usually made of aluminum, which easily forms a thin oxide layer in the air. During the test, the spring pin must pierce this oxide layer when connecting to the chip. Therefore, the travel distance from the initial contact between the chip and the spring pin to the generation of an electrical connection signal is not a fixed value and varies from chip to chip. This uncertainty makes it difficult to guarantee the accuracy of the contact travel distance between the pin and the chip, and there is a high possibility of damage to the pin holder due to improper operation, which seriously affects the testing efficiency and the lifespan of the pin holder, and increases the testing cost and maintenance difficulty. Utility Model Content

[0004] The purpose of this invention is to provide a vertical needle holder structure for manual needle alignment, in order to address the aforementioned shortcomings in the technology.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a vertical needle holder structure for manual needle alignment, comprising a vertical head and an edge probe needle. A spring needle is mounted on the vertical head, and a vertical probe is connected to the upper end of the vertical head. A printed circuit board is provided on the vertical probe to contact the spring needle. The edge probe needle is disposed on the vertical probe, and there are two edge probe needles. One edge probe needle is vertically downward, forming a certain height difference with the tip of the spring needle. The other edge probe needle is horizontal on the needle shank. Since it cannot be observed through a microscope from above... For the test travel, we installed two edge probe pins on the vertical pin holder, using a battery and LED to form a visual warning structure. Specifically, we used an epoxy pin holder structure, short-circuiting the two pins. One pin was vertically downward, forming a certain height difference with the tip of the spring pin, while the other was horizontal on the pin shaft. At this point, the two pins were short-circuited, and the light illuminated. As the test was pressed down, the tip of the vertically downward pin contacted the chip, causing the pin shaft to deform and break away from the other pin. At this point, the light went out. We considered this to be the boundary of the safe travel range, serving as a warning.

[0006] Preferably, it also includes position indicator pins and chips. The position indicator pins are provided in two places, and the two position indicator pins are set to correspond to the chips. Considering the use of a visible epoxy needle card structure, two position indicator pins are made. These two pins correspond to another chip on the chip. Since the spacing on the chip is fixed, we can use a microscope to align the position, which also indirectly aligns the position of the probe card.

[0007] Preferably, the circuit board also includes a socket, the traces of which are connected to the socket, and the socket is connected to the testing machine via a connecting wire.

[0008] The technical effects and advantages provided by this utility model in the above technical solution are as follows:

[0009] 1. By setting two position indicator pins, which correspond to another chip on the chip, and given the fixed spacing between the components on the chip, the operator can easily align the positions of the two position indicator pins with the help of a microscope. Through this ingenious indirect alignment method, the position of the probe card can be accurately calibrated, effectively making up for the shortcomings of the old-fashioned machine in position alignment, and greatly improving the accuracy and reliability of the test operation.

[0010] 2. By setting up probe pins, a visual warning structure based on batteries and LEDs is constructed. This structure relies on epoxy needle holders. In the initial state, the two pins are short-circuited, and the connected LEDs light up. One pin points vertically downwards, maintaining a specific height difference with the tip of the spring pin, while the other pin is horizontally fixed to the pin bar. During testing, as the test pressure is applied, the vertically downward-pointing pin tip contacts the chip, causing the pin bar to deform under pressure, resulting in the two pins disconnecting. At this point, the LED turns off. This extinguishing signal clearly indicates that the test has reached the safe travel boundary, providing a direct and effective warning. This design allows for successful testing using vertical needle holders even with ordinary old-style probe stations, extending the lifespan of old equipment, reducing equipment replacement costs, significantly expanding the testing range of the equipment, fully exploring the potential value of old-style equipment, saving enterprises a significant amount of resources, and powerfully promoting the efficient conduct of chip testing. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings.

[0012] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0013] Figure 2 This is a side view of the positions of the spring needle and the probe needle of this utility model;

[0014] Figure 3 This is a schematic diagram showing the positional layout of the two position indicator needles and the edge probe needle of this utility model;

[0015] Figure 4 This is a schematic diagram of the existing vertical probe test structure of this utility model.

[0016] Explanation of reference numerals in the attached figures:

[0017] 1. Vertical probe; 2. Spring pin; 3. Chip; 4. Printed circuit board; 5. Socket; 6. Position indicator pin; 7. Edge probe pin; 8. Microscope; 9. Vertical head. Detailed Implementation

[0018] To enable those skilled in the art to better understand the technical solution of this utility model, the present utility model will be further described in detail below with reference to the accompanying drawings.

[0019] This utility model provides, for example Figure 1 and Figure 2The illustrated vertical needle clip structure for manual needle setting includes:

[0020] The test consists of a vertical head 9 and two edge probes 7. The vertical head 9 has a spring needle 2 mounted on it, and a vertical probe card 1 is connected to its upper end. The vertical probe card 1 has a printed circuit board 4 that contacts the spring needle 2. Two edge probes 7 are mounted on the vertical probe card 1. One edge probe 7 points vertically downwards, creating a height difference with the tip of the spring needle 2. The other edge probe 7 lies horizontally on the needle shaft. Since the test stroke cannot be observed from above using a microscope 8, two edge probes 7 are mounted on the vertical probe card. Using a battery and LEDs, a visual warning structure is formed. Specifically, an epoxy needle card structure is used, short-circuiting the two needles. One needle points vertically downwards, creating a height difference with the tip of the spring needle 2, while the other lies horizontally on the needle shaft. When the two needles are short-circuited, the light illuminates. As the test is pressed down, the vertically downward-pointing needle tip contacts the chip 3, causing the needle shaft to deform and disconnect from the other needle. At this point, the light goes out. We consider this to be the boundary of the safe stroke, serving as a warning.

[0021] It also includes position indicator pins 6 and chips 3. There are two position indicator pins 6, and the two position indicator pins 6 are set to correspond to chips 3. Considering the use of a visible epoxy needle card structure, two position indicator pins 6 are made. These two pins correspond to another chip 3 on the chip 3. Since the spacing on the chip 3 is fixed, we can use a microscope 8 to align the position, which also indirectly aligns the position of the probe card.

[0022] It also includes socket 5, the traces of printed circuit board 4 are connected to socket 5, and socket 5 is connected to the test machine through connecting wires.

[0023] The foregoing description only illustrates certain exemplary embodiments of the present invention. Undoubtedly, those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A vertical needle clip structure for manual needle alignment, characterized in that, include: A vertical head (9) and an edge probe needle (7) are provided. A spring needle (2) is installed on the vertical head (9), and a vertical probe card (1) is connected to the upper end of the vertical head (9). A printed circuit board (4) that contacts the spring needle (2) is provided on the vertical probe card (1). The edge probe needle (7) is located on the vertical probe card (1), and there are two edge probe needles (7). One edge probe needle (7) is vertically downward and forms a certain height difference with the needle tip of the spring needle (2). The other edge probe needle (7) is horizontal on the needle bar.

2. The vertical needle holder structure for manual needle alignment according to claim 1, characterized in that: It also includes a position indicator (6) and a chip (3), wherein there are two position indicator (6) and the two position indicator (6) are set to correspond to the chip (3).

3. The vertical needle holder structure for manual needle alignment according to claim 1, characterized in that: It also includes a socket (5), the traces of the printed circuit board (4) are connected to the socket (5), and the socket (5) is connected to the tester via a connecting wire.

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