Sample detection device and sample analysis equipment

Abstract

This application discloses a sample detection device and a sample analysis equipment. The sample detection device includes a carrier component, a carrier base, a light source component, and a detection component. The carrier component has a detection channel; the carrier base is at least partially disposed within the detection channel and is used to place the sample to be tested. The carrier base is used to move the sample to be tested relative to the carrier component along the scanning direction. The light source component and the detection component are disposed on the carrier component. The light source component generates detection light, and the detection component receives the detection light. The detection light forms an elliptical spot on the sample to be tested through a first optical path and is reflected to the detection component through a second optical path. The above-mentioned sample detection device can realize optical path detection of the sample to be tested. During optical path detection, it will not interfere with non-target samples. Moreover, the detection light irradiating the sample to be tested can form an elliptical spot. The formation of the elliptical spot allows more detection points to fall within the detection range of the detection component, which can reduce false detections and missed detections.

Description

Technical Field

[0001] This application relates to the field of medical device technology, particularly to sample testing devices and sample analysis equipment. Background Technology

[0002] In the field of medical devices, sample analysis equipment can perform detection and analysis of various types of samples, such as blood, body fluids, and urine.

[0003] When sample analysis equipment uses dry chemistry methods to test samples, such as dry biochemical testing of urine, the sample is typically dropped onto a test strip, and the corresponding indicator is detected by color change. However, when related technologies use a detection optical path to detect samples in different detection areas, problems such as signal crosstalk and low detection sensitivity can easily occur. Utility Model Content

[0004] This application provides a sample detection device and a sample analysis equipment. A sample to be tested can be moved along the detection channel of a carrier component using a support base. A light source component and a detection component are fixedly mounted on the carrier component. By moving the sample to be tested, the light source component and the detection component can perform optical path detection on the sample to be tested at the target position. At this time, the detection light emitted by the light source component will not illuminate the sample to be tested at a non-target position, thus avoiding interference. Furthermore, the detection light emitted by the light source component forms an elliptical spot on the sample to be tested. The formation of the elliptical spot allows more detection points to fall within the detection range of the detection component, thereby reducing false detections and missed detections.

[0005] To address the aforementioned technical problems, this application provides a sample detection device, comprising a carrier component, a carrier base, a light source component, and a detection component. The carrier component has a detection channel; the carrier base is at least partially disposed within the detection channel, and is used to place the sample to be detected and to move the sample relative to the carrier component along the scanning direction; the light source component and the detection component are disposed on the carrier component, the light source component generating detection light, and the detection component receiving the detection light; the detection light forms an elliptical spot on the sample through a first optical path and is reflected to the detection component through a second optical path.

[0006] In some embodiments, the first included angle between the first optical path and the object to be detected is an acute angle.

[0007] In some embodiments, the light source assembly and the detection assembly are respectively disposed on both sides of the object to be detected along a direction perpendicular to the scanning direction, and the minor axis of the light spot is disposed parallel to the scanning direction.

[0008] In some embodiments, the light source assembly and the detection assembly are respectively disposed on both sides of the detection area of ​​the object to be detected along the scanning direction, and the minor axis of the light spot is disposed perpendicular to the scanning direction.

[0009] In some embodiments, the object to be tested has multiple detection areas along the scanning direction, and the diameter of the first optical path is smaller than the width of the detection area.

[0010] In some embodiments, the ratio of the diameter of the first optical path to the width of the detection area is less than 0.5.

[0011] In some embodiments, the ratio of the minor axis to the major axis of the elliptical spot is 0.4 to 0.6.

[0012] In some embodiments, the light source assembly includes a first connecting plate and an emission source. The first connecting plate is disposed on the support assembly, and the emission source is disposed on the first connecting plate. The first connecting plate is tilted relative to the object to be detected, and the emission source is used to generate detection light.

[0013] In some embodiments, the detection component includes a second connecting plate and a sensing device. The second connecting plate is disposed on the support component, and the sensing device is disposed on the second connecting plate. The second connecting plate is inclined relative to the object to be detected, and the extension direction of the second connecting plate intersects the extension direction of the first connecting plate. The sensing device is used to sense and receive detection light reflected by the object to be detected.

[0014] In some embodiments, the sample detection device further includes a transport component and a drive component. The transport component is connected to the drive component, and the transport component and the drive component are respectively disposed on the carrier component. The carrier is disposed on the transport component. The transport component is used to drive the carrier to move relative to the carrier component along the scanning direction under the drive of the drive component.

[0015] To address the aforementioned technical problems, this application also provides a sample analysis apparatus, which includes a frame, the aforementioned sample detection device, and a pipetting assembly. The sample detection device is mounted on the frame. The pipetting assembly is mounted on the frame and is used to add the sample to be tested to the sample detection device.

[0016] The sample detection device and sample analysis equipment provided in some embodiments of this application include a carrier component, a carrier base, a light source component, and a detection component. The carrier component has a detection channel; the carrier base is at least partially disposed within the detection channel, and is used to place the sample to be tested. The carrier base is used to move the sample to be tested relative to the carrier component along the scanning direction. The light source component and the detection component are disposed on the carrier component. The light source component generates detection light, and the detection component receives the detection light. The detection light forms an elliptical spot on the sample to be tested through a first optical path and is reflected to the detection component through a second optical path. On one hand, the light source component and the detection component are fixedly disposed on the carrier component. By moving the sample to be tested, the light source component and the detection component can perform optical path detection on the sample to be tested of the sample to be tested that has moved to a target position. The detection light emitted by the light source component will not illuminate the sample to be tested of ... On the other hand, the detection light emitted by the light source component is emitted onto the device under test, which can form an elliptical light spot on the device under test. The formation of the elliptical light spot allows more detection points to fall within the detection range of the detection component, thereby reducing the occurrence of false detection and missed detection. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0018] Figure 1 These are schematic diagrams of the sample detection device in some embodiments of this application;

[0019] Figure 2 yes Figure 1 A schematic cross-sectional view of the sample detection device shown.

[0020] Figure 3 These are schematic diagrams of the structure of the component to be tested in some embodiments of this application;

[0021] Figure 4 This is a schematic diagram of the structure of the sample analysis device in some embodiments of this application. Detailed Implementation

[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0023] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0024] In the description of this application, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "setting," "connection," and "linking" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or connections through an intermediate medium. For those skilled in the art, if directional indicators (such as up, down, left, right, front, back, etc.) are involved in the embodiments of this application, these directional indicators are only used to explain the relative positional relationships and movement of the components in a specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indicators will also change accordingly.

[0025] See Figure 1 and Figure 2 , Figure 1 These are schematic diagrams of the sample detection device in some embodiments of this application. Figure 2 yes Figure 1 A schematic cross-sectional view of the sample detection device shown.

[0026] like Figure 1 and Figure 2 As shown, the sample detection device 10 includes a support component 101, a support base 102, a light source component 103, and a detection component 104.

[0027] The carrier component 101 has a detection channel 1011.

[0028] At least a portion of the carrier 102 is disposed within the detection channel 1011. The carrier 102 is used to place the workpiece 20 to be tested and to drive the workpiece 20 to be tested so that the workpiece 20 to be tested moves relative to the carrier assembly 101 along the scanning direction (indicated by "X" in the figure).

[0029] The light source assembly 103 is disposed on the carrier assembly 101, and the light source assembly 103 is used to generate detection light.

[0030] The detection component 104 is disposed on the carrier component 101, and the detection component 104 is used to receive detection light.

[0031] The detection light is incident on the first optical path of the test piece 20, forms an elliptical spot on the test piece through the first optical path, and is reflected to the detection component 104 through the second optical path.

[0032] In some embodiments, the first included angle between the detection light and the device under test 20 is an acute angle, so that the first optical path between the detection light and the device under test 20 is a non-perpendicular optical path. The design of the non-perpendicular optical path can improve the coverage of the elliptical spot formed by the detection light on the device under test 20, and can reduce the occurrence of false detection and missed detection.

[0033] The second optical path of the detection light reflected by the test piece 20 forms a second obtuse angle with the test piece 20. At this time, the second optical path between the reflected detection light and the test piece 20 is also a non-perpendicular optical path.

[0034] It is understandable that, since neither the first optical path formed by the incident detection light nor the second optical path formed by the reflected detection light is perpendicular to the object under test 20, the light spot formed by the object under test 20 under the action of the first and second optical paths is elliptical. The major axis of the elliptical light spot can be parallel to or perpendicular to the scanning direction.

[0035] In some embodiments, such as Figure 1 and Figure 2 As shown, the carrier component 101 has a detection through-hole 1012, which is at least partially connected to the detection channel 1011. The light source component 103 and the detection component 104 are disposed on the carrier component 101 and arranged around the detection through-hole 1012. When the carrier 102 moves the test piece 20 along the detection channel 1011 of the carrier component 101, so that the test piece 20 moves relative to the carrier component 101 in the scanning direction, the test sample of the test piece 20 on the carrier 102 is correspondingly positioned with respect to the detection through-hole 1012. At this time, the light source component 103 can emit detection light to a portion of the test piece 20, forming a first optical path. The detection component 104 arranged around the detection through-hole 1012 can receive the detection light reflected by the test sample of the test piece 20.

[0036] The carrier component 101 is provided with a detection through hole 1012, and the light source component 103 and the detection component 104 are arranged around the detection through hole 1012. This arrangement allows only a portion of the test samples of the test piece 20 (e.g., one test piece 20) to be detected each time the light path detection of the emission and reflection of the detection light is performed using the light source component 103 and the detection component 104. Other test samples of the test pieces 20 on the carrier 102 (e.g., adjacent test pieces 20) will not be illuminated by the detection light. This can prevent the detection light from crossing the detection boundary due to light path divergence or other reasons. Especially when the test samples on the test pieces 20 are different or the test items performed on the test pieces 20 are different, it can prevent the detection light from crossing the detection boundary and entering other detection areas, thus preventing mutual interference between different items.

[0037] It is worth noting that, in order to ensure that the detection light emitted by the light source assembly 103 can illuminate the object under test 20 and can be received or detected by the detection assembly 104, the placement of the light source assembly 103 and the detection assembly 104 must meet preset conditions, or the emission direction of the detection light from the light source assembly 103 and the placement of the detection assembly 104 must meet preset conditions. These preset conditions may be related to the placement angle, the size of the light source assembly 103, and the size of the detection assembly 104, etc.

[0038] For example, when the carrier 102 moves the test piece 20 along the detection channel 1011 of the carrier component 101, the light source component 103 and the detection component 104 have a certain height difference with the test piece 20. In order to ensure that the detection light emitted by the light source component 103 can illuminate the test piece 20, the angle between the detection light emitted by the light source component 103 and the test piece 20 is required to be an acute angle, forming a non-perpendicular light path.

[0039] Compared to the vertical optical path, the angle between the detection light emitted by the light source component 103 of this application and the test piece 20 is an acute angle. The resulting non-vertical optical path can effectively improve the coverage of the light spot formed by the detection light on the test piece 20, and avoid false detection or missed detection when performing weak signal detection items such as trace albumin.

[0040] In some embodiments of this application, the sample detection device 10 has the following features: Firstly, the light source assembly 103 and the detection assembly 104 are fixedly mounted on the support assembly 101. By moving the sample to be tested 20, the light source assembly 103 and the detection assembly 104 can perform optical path detection on the sample to be tested 20 at the target position. The detection light emitted by the light source assembly 103 will not illuminate the sample to be tested 20 at a non-target position, thus avoiding interference with the sample to be tested 20 at a non-target position. Secondly, the detection light emitted by the light source assembly 103, when emitted onto the sample to be tested 20, can form an elliptical light spot on the sample to be tested 20. The formation of the elliptical light spot allows more detection points to fall within the detection range of the detection assembly 104, thereby reducing false detections and missed detections.

[0041] In some embodiments, such as Figure 1 and Figure 2 As shown, the light source assembly 103 and the detection assembly 104 are respectively disposed on both sides of the object to be detected 20 along a direction perpendicular to the scanning direction, and the minor axis of the light spot is arranged parallel to the scanning direction. The light spot formed at this time can be seen in... Figure 3 Hit "O1".

[0042] When the carrier component 101 has a detection through hole 1012, the light source component 103 and the detection component 104 are respectively disposed on two sides of the detection through hole 1012 that are parallel to the scanning direction. At this time, the light source component 103 and the detection component 104 are spaced apart in a direction perpendicular to the scanning direction.

[0043] In some embodiments, the light source assembly 103 and the detection assembly 104 are respectively disposed on both sides of the detection area of ​​the object to be detected 20 along the scanning direction, and the minor axis of the light spot is perpendicular to the scanning direction. The light spot formed in this case can be seen in... Figure 3 O2 in the middle.

[0044] When the carrier component 101 has a detection through hole 1012, the light source component 103 and the detection component 104 are respectively disposed on two sides of the detection through hole 1012 perpendicular to the scanning direction. At this time, the light source component 103 and the detection component 104 are spaced apart in a direction parallel to the scanning direction.

[0045] In one application scenario, to avoid missed detections and false detections, the major axis (represented by "L1") and minor axis (represented by "L2") of the elliptical light spot must satisfy the following ratio: L1 / L2 = 0.4 to 0.6. That is, the ratio of the major axis to the minor axis of the light spot should be between 0.4 and 0.6.

[0046] In some embodiments, since the detection light diverges, the farther the exit of the first optical path formed by the incident detection light and the exit of the second optical path formed by the reflection of the detection light are from the object to be detected 20, the more important it is to prevent the detection light from crossing the detection boundary and entering other detection areas. Therefore, the diameter of the first optical path is required to be ( Figure 2 (Indicated by "d1") and the diameter of the second optical path ( Figure 2 (Indicated by "d2") The smaller the value, the greater the distance. That is, the distance is inversely proportional to the diameter.

[0047] like Figure 3 As shown, the workpiece 20 to be inspected has multiple detection areas along the scanning direction. In this case, the diameter of the first optical path is smaller than the width of the detection area; the diameter of the second optical path is smaller than the width of the detection area. Alternatively, the diameter of the first optical path is smaller than the length of the detection area; the diameter of the second optical path is smaller than the length of the detection area.

[0048] For example, the test piece 20 includes several detection areas, each of which can hold a test sample. The test samples placed in adjacent detection areas may be the same or different. The diameter of the first optical path formed by the incident detection light and the diameter of the second optical path formed by the reflected detection light are less than half the width of the detection area (represented by "L"). In this case, the width of the test piece 20 corresponds to the width of the detection area.

[0049] For example, the test piece 20 includes several detection areas, each of which can hold a test sample. The test samples placed in adjacent detection areas may be the same or different. The diameter of the first optical path formed by the incident detection light and the diameter of the second optical path formed by the reflected detection light are less than half the length of the detection area (represented by "L"). In this case, the width of the test piece 20 corresponds to the length of the detection area.

[0050] For example, the test piece 20 includes several detection areas, each of which can hold a test sample. The test samples placed in adjacent detection areas may be the same or different. The diameter of the first optical path formed by the incident detection light and the diameter of the second optical path formed by the reflection of the detection light are less than half the width of the test piece 20 (represented by "L").

[0051] In one application scenario, through repeated experiments, it was found that when the ratio of the diameter of the first optical path to the width of the detection area is less than 0.5, especially when the diameter of the first optical path is less than 0.4L, it can be ensured that the detection light can illuminate the device under test 20, the detection component 104 can receive the detection light reflected by the device under test 20, and the detection light will not cross the detection boundary, thus avoiding interference with the sample of the device under test 20 located in other detection areas. Furthermore, when the diameter of the first optical path is 0.35L, the effect of avoiding interference is the best.

[0052] In some embodiments, such as Figure 1 and Figure 2 As shown, the sample detection device 10 also includes a conveying component 105, which is disposed on the carrier component 101. The carrier seat 102 is disposed on the conveying component 105. The conveying component 105 is used to convey the carrier seat 102, so that the sample to be tested 20 placed on the carrier seat 102 moves relative to the carrier component 101 along the scanning direction.

[0053] In some embodiments, such as Figure 1 and Figure 2 As shown, the sample detection device 10 also includes a driving component 106, which is disposed on the carrier component 101 and connected to the conveying component 105. Driven by the driving component 106, the conveying component 105 moves the carrier base 102 relative to the carrier component 101 along the scanning direction, thereby moving the sample to be tested 20 placed on the carrier base 102 relative to the carrier component 101 along the scanning direction. The driving component 106 includes, but is not limited to, a motor, such as a stepper motor or a servo motor.

[0054] In some embodiments, the conveying assembly 105 includes a rack and a gear assembly. The gear assembly is disposed inside the rack and connected to the drive assembly 106. The outer side of the rack is connected to the carrier 102. Under the drive of the drive assembly 106, the gear assembly drives the rack to move, and the rack drives the carrier 102 to move relative to the carrier assembly 101 along the scanning direction.

[0055] In some embodiments, the detection channel 1011 extends along the scanning direction and passes through the carrier component 101. When the test piece 20 on the carrier 102 moves relative to the carrier component 101 along the scanning direction under the action of the conveying component 105, the test piece 20 on the carrier 102 enters from the first end of the detection channel 1011 along the scanning direction and exits from the second end of the detection channel 1011. The test piece 20 that completes the detection item using the light source component 103 and the detection component 104 can be obtained from the second end of the detection channel 1011.

[0056] It is understandable that when the test item 20 includes a flowing, liquid sample, the test item 20 enters from the first end of the detection channel 1011 and exits from the second end of the detection channel 1011 along the scanning direction, which can prevent the sample from flowing out of the corresponding detection area and causing contamination to other detection areas or the sample detection device 10.

[0057] In other embodiments, the detection channel 1011 extends along the scanning direction but does not pass through the carrier component 101. When the test piece 20 on the carrier 102 moves relative to the carrier component 101 along the scanning direction under the action of the conveying component 105, the test piece 20 on the carrier 102 passes through the first end of the detection channel 1011 along the scanning direction and exits from the first end of the detection channel 1011.

[0058] It is understood that the above method is mainly for cases where the test item 20 does not include a flowing, liquid test sample. For example, if the test item 20 includes a test strip and the test sample is added or picked up on the test strip, the test sample will not flow out of the test strip. When the test item 20 enters and exits from the first end of the detection channel 1011 along the scanning direction, the test sample will not flow out of the test strip, thus avoiding contamination of other detection areas or the sample detection device 10.

[0059] like Figure 1 and Figure 2 As shown, the light source assembly 103 includes a first connecting plate 1031 and an emission source 1032. The first connecting plate 1031 is disposed on the support assembly 101, and the emission source 1032 is disposed on the first connecting plate 1031. The first connecting plate 1031 is tilted relative to the test piece 20. The emission source 1032 is used to generate detection light. The emission source 1032 includes, but is not limited to, LEDs (Light Emitting Diodes) and lasers. The detection light generated by the emission source 1032 can be white or colored.

[0060] In some embodiments, the first connecting plate 1031 is movably connected to the support assembly 101. The first connecting plate 1031 can be moved as needed to change its position on the support assembly 101, or rotated as needed to change its tilt angle relative to the test piece 20. To ensure that the detection light emitted by the emission source 1032 disposed on the first connecting plate 1031 can illuminate the test piece 20, the included angle between the first connecting plate 1031 and the test piece 20 is required to be an acute angle.

[0061] In some embodiments, the transmitter 1032 is movably connected to the first connecting plate 1031. The transmitter 1032 can be moved as needed to change its position on the first connecting plate 1031, or the transmitter 1032 can be rotated as needed to change the angle between the transmitter 1032 and the first connecting plate 1031. The angle between the transmitter 1032 and the first connecting plate 1031 is determined according to the actual situation.

[0062] It is worth noting that when the first connecting plate 1031 is movably connected to the bearing assembly 101 and the transmitter 1032 is movably connected to the first connecting plate 1031, the included angle between the first connecting plate 1031 and the test piece 20 can also be a right angle or an obtuse angle.

[0063] like Figure 1 and Figure 2 As shown, the detection component 104 includes a second connecting plate 1041 and a sensing device 1042. The second connecting plate 1041 is disposed on the supporting component 101, and the sensing device 1042 is disposed on the second connecting plate 1041. The second connecting plate 1041 is inclined relative to the object to be detected 20, and the extending direction of the second connecting plate 1041 intersects the extending direction of the first connecting plate 1031. The sensing device 1042 is used to sense and receive the detection light reflected by the object to be detected 20. The sensing device 1042 includes, but is not limited to, sensors, such as photosensors and color sensors.

[0064] In some embodiments, the second connecting plate 1041 is movably connected to the support assembly 101. The second connecting plate 1041 can be moved as needed to change its position on the support assembly 101, or rotated as needed to change its tilt angle relative to the object to be detected 20. To ensure that the sensing device 1042 mounted on the second connecting plate 1041 can receive the detection light reflected by the object to be detected 20, the angle between the second connecting plate 1041 and the object to be detected 20 is required to be an obtuse angle.

[0065] In some embodiments, the sensing device 1042 is movably connected to the second connecting plate 1041. The sensing device 1042 can be moved as needed to change its position on the second connecting plate 1041, or rotated as needed to change the angle between the sensing device 1042 and the second connecting plate 1041. The angle between the sensing device 1042 and the second connecting plate 1041 is determined according to the actual situation.

[0066] It is worth noting that when the second connecting plate 1041 is movably connected to the bearing assembly 101 and the sensing device 1042 is movably connected to the second connecting plate 1041, the included angle between the second connecting plate 1041 and the workpiece 20 to be tested can be a right angle or an acute angle. When the included angle between the first connecting plate 1031 and the workpiece 20 to be tested is a right angle, and the included angle between the second connecting plate 1041 and the workpiece 20 to be tested is a right angle, the first connecting plate 1031 is parallel to the second connecting plate 1041.

[0067] In summary, in one application scenario, the sample detection device 10 includes a support component 101, a support base 102, a light source component 103, a detection component 104, a conveying component 105, and a driving component 106. The sample to be tested 20 includes a test strip with multiple detection areas, each capable of holding a sample. The support base 102 includes a test strip platform, the light source component 103 includes an LED light panel and LED lights, the detection component 104 includes a detection plate and a detection sensor, the conveying component 105 includes gears and a rack, and the driving component 106 includes a motor. By placing the test strip with the sample added onto the test strip platform, the motor drives the test strip platform relative to the detection component 104 via gears and a rack. When the test strip moves below the detection component 104, detection begins until all detection areas are tested, yielding the detection result.

[0068] The test strips can perform urine dry chemistry analysis, a method that uses specialized test strips to qualitatively analyze the components of urine (the sample). Each test strip contains reagent modules for multiple tests. These modules react chemically with corresponding components in the urine, displaying different colors. The intensity of the color is directly proportional to the concentration of that component in the urine. These color changes can be detected using specialized sample analysis equipment (such as a urine dry chemistry analyzer) to determine whether the urine contains specific substances, such as pH, protein, or glucose.

[0069] See Figure 4 , Figure 4 This is a schematic diagram of the structure of a sample analysis device in some embodiments of this application. The sample analysis device 100 includes a frame 30, a sample detection device 10 and a pipetting assembly 40 in any of the above embodiments.

[0070] The sample detection device 10 is mounted on the frame 30. The pipetting assembly 40 is mounted on the frame 30 and is used to add the sample to be tested to the sample detection device 20.

[0071] In summary, the sample detection device 10 and sample analysis device 100 provided in some embodiments of this application can detect the test sample of the test piece 20. On the one hand, in related technologies, the incident light or reflected light crosses the detection boundary due to optical path divergence in adjacent detection areas, resulting in mutual interference between different items. This application can solve the signal crosstalk problem, that is, avoid the incident light or reflected light from crossing the detection boundary due to optical path divergence, thereby avoiding interference to the test sample of the test piece 20 in adjacent detection areas.

[0072] On the other hand, in related technologies, the vertical optical path design results in insufficient effective spot coverage, and some weak signal items (such as microalbumin) are prone to missed detection. However, this application can improve detection sensitivity. Compared with the vertical optical path method, the non-vertical optical path design of this application can improve the spot coverage and avoid false detection or missed detection when performing weak signal detection items such as microalbumin.

[0073] On the other hand, in related technologies, when the shape of the light spot does not match the scanning direction, even a slight mechanical offset can cause signal intensity fluctuations. This application can solve the problem of large mechanical positioning errors in related technologies. Through optical path layout design and parameter optimization, it avoids signal interference from other areas to the detection area, thereby improving the accuracy and sensitivity of detection.

[0074] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A sample detection device, characterized in that, include: The supporting component has a detection channel; A carrier, at least partially disposed within the detection channel, is used to place the workpiece to be detected and to move the workpiece to be detected relative to the carrier assembly along the scanning direction. A light source component and a detection component are disposed on the carrier component, wherein the light source component is used to generate detection light and the detection component is used to receive the detection light; The detection light forms an elliptical spot on the object to be tested through a first optical path, and is reflected to the detection component through a second optical path.

2. The sample detection device according to claim 1, characterized in that, The first included angle between the first optical path and the object to be tested is an acute angle.

3. The sample detection device according to claim 1, characterized in that, The light source assembly and the detection assembly are respectively disposed on both sides of the object to be detected along a direction perpendicular to the scanning direction, and the minor axis of the light spot is disposed parallel to the scanning direction.

4. The sample detection device according to claim 1, characterized in that, The light source assembly and the detection assembly are respectively disposed on both sides of the detection area of ​​the object to be detected along the scanning direction, and the minor axis of the light spot is perpendicular to the scanning direction.

5. The sample detection device according to claim 1, characterized in that, The object to be tested has multiple detection areas along the scanning direction, and the diameter of the first optical path is smaller than the width of the detection areas.

6. The sample detection device according to claim 5, characterized in that, The ratio of the diameter of the first optical path to the width of the detection area is less than 0.

5.

7. The sample detection device according to claim 1, characterized in that, The ratio of the minor axis to the major axis of the elliptical light spot is 0.4 to 0.

6.

8. The sample detection device according to claim 1, characterized in that, The light source assembly includes a first connecting plate and an emission source. The first connecting plate is disposed on the supporting assembly, and the emission source is disposed on the first connecting plate. The first connecting plate is inclined relative to the object to be tested, and the emission source is used to generate the detection light. The detection component includes a second connecting plate and a sensing device. The second connecting plate is disposed on the bearing component, and the sensing device is disposed on the second connecting plate. The second connecting plate is inclined relative to the object to be detected, and the extension direction of the second connecting plate intersects the extension direction of the first connecting plate. The sensing device is used to sense and receive the detection light reflected by the object to be detected.

9. The sample detection device according to any one of claims 1-8, characterized in that, The sample detection device further includes a conveying component and a driving component. The conveying component is connected to the driving component. The conveying component and the driving component are respectively disposed on the carrier component, and the carrier is disposed on the conveying component. The conveying component is used to drive the carrier to move relative to the carrier component along the scanning direction under the drive of the driving component.

10. A sample analysis device, characterized in that, include: frame; The sample detection device according to any one of claims 1-9, wherein the sample detection device is disposed on the frame; A pipetting assembly, which is mounted on the frame, is used to add a sample to be tested to the sample detection device.

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