Circuit board automatic test mechanism
By designing an automated circuit board testing mechanism, automated testing of the TCON motherboard was achieved, improving testing efficiency and reliability, solving the problems of low efficiency and damage in manual testing, and featuring a compact structure that is adaptable to various circuit boards.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- QINGDAO ZHIDONG SEIKO INSTR CO LTD
- Filing Date
- 2025-05-27
- Publication Date
- 2026-05-26
Smart Images
Figure CN224287069U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of circuit board testing technology, and in particular to an automatic circuit board testing mechanism. Background Technology
[0002] Circuit boards serve as the support structure for electronic components and provide electrical connections between them. They are the infrastructure of almost all electronic products. Besides fixing various small electronic components to their basic function, their primary function is to provide interconnections between these components.
[0003] In modern industrial production, circuit board testing is a crucial step in ensuring its quality and performance. Take the TCON (Timing Controller Board) as an example. The TCON is one of the core components in LCD display devices (such as televisions, monitors, and flat panels), responsible for converting video signals into timing signals recognizable by the screen and controlling pixel driving and display effects. Currently, testing is performed by manually connecting FPC connectors to corresponding terminals or interfaces on the TCON. Manual testing is inefficient and prone to damaging the TCON. Utility Model Content
[0004] The purpose of this invention is to provide an automatic circuit board testing mechanism for automatically aligning test terminals and circuit boards, thereby improving the efficiency of circuit board testing. The automatic circuit board testing mechanism has a compact structure and occupies a smaller area.
[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:
[0006] According to one aspect of this utility model, an automatic circuit board testing mechanism is provided, including a test frame, a carrier module, and a test module; the carrier module is used to support the circuit board; the carrier module is horizontally slidably disposed on the test frame so as to slide between a supporting position and a test position; the test module includes a test plate, a lifting unit, and a limiting plate; the test plate and the limiting plate are located above the carrier module; the limiting plate is movably disposed on the test plate to limit the test terminals on the test plate; the limiting plate and the test plate are configured to clamp different test terminals on the test plate; the lifting unit is connected between the test plate and the test frame so as to drive the test plate to move vertically; when the carrier module is in the test position, the test plate can drive the test terminals downward to abut against the circuit board on the carrier module.
[0007] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0008] The carrier module is horizontally slidable on the test fixture, allowing it to slide between the carrying and testing positions. In the carrying position, circuit boards can be placed and removed from the carrier module. When the carrier module moves to the testing position, the test board moves the test terminals downwards to contact the circuit board on the carrier module, automatically aligning the test terminals and the circuit board for convenient testing and improved efficiency. Both the carrier module and the test module are mounted on the test fixture, with the test board and limiting plate positioned above the carrier module. When the carrier module moves to the testing position, it is positioned below the test board and limiting plate. The compact design of the carrier module and test module on the test fixture results in a compact automatic circuit board testing mechanism that occupies less space.
[0009] Meanwhile, a limiting plate is movably mounted on the test plate to limit the test terminals on the test plate; the limiting plate and the test plate are constructed to clamp different test terminals on the test plate, thereby corresponding to different circuit boards, so that the testing mechanism can test different circuit boards.
[0010] In some embodiments of this application, the test terminal includes an FPC flexible cable and a test probe fixed to one end of the FPC flexible cable; the limiting plate is disposed on the upper surface of the test plate, and the FPC flexible cable is clamped between the test plate and the limiting plate; the test plate has a through hole extending vertically for the insertion of the test probe.
[0011] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0012] The FPC flexible cable is clamped between the test board and the limiting plate to fix the test terminals to the test module. The test board has through holes running vertically to allow test probes to pass through. The test probes pass through these holes to abut or insert into the corresponding terminals on the circuit board for testing.
[0013] In some embodiments of this application, a plurality of protruding limiting ribs are formed on the upper surface of the test plate; the plurality of limiting ribs are respectively disposed near the side of the test plate; a limiting groove is formed on the side of the limiting rib facing the center of the test plate; the test plate is provided with the limiting ribs on at least two opposite edges; the edge of the limiting plate is slidably disposed in the limiting groove, so that the limiting plate can be detachably engaged with the limiting rib.
[0014] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0015] A limiting groove is formed on the side of the limiting rib facing the center of the test plate, and the test plate is provided with limiting ribs on at least two opposite edges. The edge of the limiting plate is slidably disposed in the limiting groove, so that the limiting plate can be detachably engaged with the limiting rib. The two opposite edges of the limiting plate can be engaged in the limiting groove on the limiting rib, so that the limiting plate is limited above the test plate, thereby clamping the FPC flexible cable between the limiting plate and the test plate.
[0016] In some embodiments of this application, three limiting ribs are provided, and the three limiting ribs are respectively provided on one side of the test plate.
[0017] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0018] Three limiting ribs are provided. Two limiting ribs are arranged opposite each other, corresponding to one side of the test plate, and the remaining limiting rib corresponds to the other side of the test plate. The three limiting ribs enclose an interface with one open end, which facilitates the installation and removal of the limiting plate from this opening.
[0019] In some embodiments of this application, the bottom surface of the test board has a protruding limiting post; when the test board moves downward to a preset downward position, the lower end of the limiting post can abut against the carrier module.
[0020] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0021] When the test board moves downward to the preset downward position, the lower end of the limiting post can abut against the carrier module to effectively prevent the test terminals from hitting the circuit board downward, thus protecting the circuit board and the test terminals.
[0022] In some embodiments of this application, a protruding guide post is formed on the bottom surface of the test board; a protruding guide block is formed on the upper surface of the carrier module; a guide hole is provided at the upper end of the guide block; during the downward movement of the test board, the guide post can extend into the guide hole.
[0023] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0024] The guide post can extend into the guide hole for alignment guidance between the guide post and the guide hole. This guidance between the guide post and the guide hole ensures precise positioning of the test board and carrier module, guaranteeing accurate alignment between the test terminals and the circuit board.
[0025] In some embodiments of this application, the test frame includes a horizontal plate and a support plate; two support plates are spaced apart above the horizontal plate; the carrier plate module is disposed between the two support plates, and the test plate is disposed above the support plates.
[0026] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0027] The carrier module is positioned between two support plates, and the test board is positioned above the support plates. The test board moves downwards, allowing the test terminals to extend downwards between the two support plates and contact the circuit board. The placement of the carrier module and test board on the support plates makes full use of the space available on the support plates, resulting in a more compact test mechanism.
[0028] In some embodiments of this application, the carrier plate module includes horizontal guide rails on opposite sides of the two support plates, a carrier plate slidably disposed on the horizontal guide rails, and a horizontal drive unit; the horizontal drive unit is used to drive the carrier plate to slide along the length direction of the horizontal guide rails, so as to drive the carrier plate to slide between the bearing position and the test position.
[0029] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0030] A horizontal guide rail is positioned between two support plates, and a carrier plate is slidably mounted on the horizontal guide rail. The carrier plate is used to support and fix the circuit board. A horizontal drive unit is used to drive the carrier plate to slide along the length of the horizontal guide rail, thereby moving the carrier plate between the support position and the test position.
[0031] In some embodiments of this application, the carrier plate module further includes a stagger plate and a limiting shaft; the stagger plate is disposed at one end of the two support plates; the limiting shaft passes through the stagger plate to stop the carrier plate when it slides from the bearing position toward the test position to the test position; the limiting shaft is movable relative to the stagger plate along its own axial direction, thereby stopping the carrier plate at different positions.
[0032] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0033] By adjusting the limiting axis, the carrier plate can be limited to different positions, and the test position of the carrier plate can be adjusted to adapt to the testing of different circuit boards.
[0034] In some embodiments of this application, upright plates are respectively provided on opposite sides of the two support plates, and the upright plates are fixed to the support plates or the horizontal plates; a vertical plate is provided on the lower surface of the test plate; a slide rail assembly is provided between the vertical plate and the upright plate so that the vertical plate can slide upward along the upright plate.
[0035] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0036] The connection between the slide rail assembly and the vertical plate allows the test plate to move vertically. Both the vertical and vertical plates are positioned outside the support plates, with the carrier plate module positioned between the two support plates, resulting in a more compact structure for the testing mechanism.
[0037] In some embodiments of this application, at least two upright plates are provided on any opposite side of the two support plates; the number of vertical plates corresponds to the number of upright plates.
[0038] The above-mentioned technical features have at least the following beneficial effects and advantages:
[0039] At least two upright plates are provided on any opposite side of the two support plates, and the number of vertical plates corresponds to the number of upright plates. A slide rail assembly is provided between each vertical plate and the upright plate. Multiple upright plates provide multi-point support for the test plate, making the vertical movement of the test plate more stable and reliable.
[0040] Other features and advantages of this application will become apparent from the following detailed description, or may be learned in part from practice of this application.
[0041] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description
[0042] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure. It is obvious that the drawings described below are merely some embodiments of this disclosure, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort.
[0043] Figure 1 This is a structural schematic diagram of the testing mechanism of this utility model in one state.
[0044] Figure 2 This is a structural schematic diagram of another state of the testing mechanism of this utility model.
[0045] Figure 3 This is a partial structural schematic diagram of the testing mechanism of this utility model.
[0046] Figure 4 This is a schematic diagram of the carrier plate module of this utility model on the test fixture.
[0047] Figure 5 This is a structural schematic diagram of the carrier plate module of this utility model from one perspective.
[0048] Figure 6 This is a structural schematic diagram of the carrier plate module of this utility model from another perspective.
[0049] Figure 7 This is a schematic diagram of the structure of the bearing plate of this utility model.
[0050] Figure 8 This is a structural schematic diagram of the test module of this utility model from one perspective.
[0051] Figure 9 This is a structural schematic diagram of the test module of this utility model from another perspective.
[0052] Figure 10 This is a schematic diagram of the structure of the test board of this utility model.
[0053] Figure 11 This is a bottom schematic diagram of the testing mechanism of this utility model.
[0054] The reference numerals in the attached drawings are explained as follows: 100, Test frame; 110, Horizontal plate; 120, Support plate; 130, Vertical plate; 140, Vertical plate; 200, Carrier plate module; 210, Horizontal guide rail; 220, Bearing plate; 221, Slider; 222, Guide block; 223, Guide hole; 230, Mounting plate; 240, Horizontal drive unit; 250, Anti-fool plate; 260, Limiting shaft; 300, Test module; 310, Test plate; 311, Limiting post; 312, Guide post; 313, Through hole; 314, Limiting rib; 320, Lifting unit; 330, Limiting plate; 400, Slide rail assembly; 500, Solenoid valve module; 600, Electrical control module; 700, Control module. Detailed Implementation
[0055] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be more thorough and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art.
[0056] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.
[0057] The present application will now be described in further detail with reference to the accompanying drawings and specific embodiments. It should be noted that the technical features involved in the various embodiments described below can be combined with each other as long as they do not conflict with each other. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present application, and should not be construed as limiting the present application.
[0058] Figure 1 This is a structural schematic diagram of the testing mechanism of this utility model in one state. Figure 2 This is a structural schematic diagram of another state of the testing mechanism of this utility model.
[0059] See Figure 1 and Figure 2 This application provides an automatic circuit board testing mechanism, including a test rack 100, a carrier board module 200, and a test module 300. The carrier board is horizontally slidably mounted on the test rack 100, and the test module 300 is vertically slidably mounted on the test rack 100.
[0060] It should be noted that in this application, the carrier module 200 moves longitudinally, and the test module 300 moves vertically. The direction that is horizontal and perpendicular to the longitudinal direction is the transverse direction.
[0061] The carrier module 200 is used to carry the circuit board. The carrier module 200 is horizontally slidably mounted on the test fixture 100 so that it can slide between the carrying position and the test position. Figure 1 This is a schematic diagram of the testing mechanism when the carrier module 200 is in the load-bearing position. Figure 2 This is a schematic diagram of the testing mechanism when the carrier module 200 is in the testing position.
[0062] When in the carrying position, the carrier module 200 is used to pick up and place circuit boards. The circuit board to be tested is placed on the carrier module 200 in the carrier position. The carrier module 200 moves to the testing position, and the testing module 300 tests the circuit board on the carrier module 200. After testing, the carrier module 200 moves from the testing position to the carrier position, the tested circuit board is removed from the carrier module 200, and the circuit board to be tested is placed on the carrier module 200. This process is repeated to sequentially test the circuit boards.
[0063] Figure 3 This is a partial structural schematic diagram of the testing mechanism of this utility model.
[0064] See Figures 1 to 3 The test fixture 100 includes a horizontal plate 110 and support plates 120. Two support plates 120 are spaced apart above the horizontal plate 110. The horizontal plate 110 is horizontally positioned, while the support plates 120 are vertically positioned and connected vertically to the horizontal plate 110. The support plates 120 extend longitudinally horizontally, and the two support plates 120 are spaced apart laterally. A carrier module 200 is positioned between the two support plates 120, and a test module 300 is positioned above the support plates 120, thereby fully utilizing the space on the test fixture 100 to reduce the area and space occupied by the testing mechanism.
[0065] Two support plates 120 extend longitudinally, and a carrier module 200 is disposed between the two support plates 120, sliding longitudinally between them. When the carrier module 200 slides to the test position, it is located below the test module 300. The test module 300 is pressed down, and the test terminals (not shown in the figure) on the test module 300 are pressed down, with the corresponding connectors or interfaces of the test terminals abutting against the circuit board on the carrier module 200 for testing the circuit board.
[0066] Figure 4 This is a schematic diagram of the carrier plate module of this utility model on the test fixture. Figure 5 This is a structural schematic diagram of the carrier plate module of this utility model from one perspective. Figure 6 This is a structural schematic diagram of the carrier plate module of this utility model from another perspective.
[0067] See Figures 4 to 6 The carrier module 200 may include a horizontal guide rail 210 and a carrier plate 220. The horizontal guide rail 210 extends longitudinally, and the carrier plate 220 is slidably disposed on the horizontal guide rail 210 so as to be able to slide between the carrier plate position and the test position.
[0068] The horizontal guide rail 210 is disposed in the space between the opposite sides of the two support plates 120, and the horizontal guide rail 210 extends longitudinally.
[0069] In some embodiments, the horizontal guide rail 210 is fixed to the opposite surfaces of the two support plates 120. In another embodiment, the horizontal guide rail 210 is fixed to the horizontal plate 110.
[0070] In other embodiments, one or two horizontal guide rails 210 are provided. When two horizontal guide rails 210 are provided, the two horizontal guide rails 210 extend longitudinally and are spaced apart laterally.
[0071] In one embodiment, a horizontal mounting plate 230 is disposed between two support plates 120, with its two lateral sides fixed to the support plates 120 respectively. The mounting plate 230 is located above the horizontal plate 110 and is spaced apart from the horizontal plate 110. The space between the horizontal plate 110 and the mounting plate 230 can be used for installing other accessories, such as wiring of air or oil pipes, and installation of control valves.
[0072] In another embodiment, the horizontal guide rail 210 is fixed to the mounting plate 230, either directly or indirectly through other structures.
[0073] In this application, a support plate 220 is used to support a circuit board. The support plate 220 is slidably mounted on a horizontal guide rail 210 so that the support plate 220 can slide longitudinally. A slider 221 is provided on the bottom surface of the support plate 220. The slider 221 is sleeved on the horizontal guide rail 210 so that it can slide along the length direction of the horizontal guide rail 210.
[0074] In some embodiments, the carrier plate 220 slides between a carrying position and a testing position, where circuit boards can be placed and removed from the carrier plate 220. When the carrier plate 220 moves to the carrying position, its upper surface is exposed to facilitate the placement and removal of circuit boards from the carrier plate 220.
[0075] In one embodiment, a robotic arm approaches the support location to automatically pick up and place circuit boards on the support plate 220. In another embodiment, circuit boards can be picked up and placed on the support plate 220 manually.
[0076] In some embodiments, the carrier plate module 200 may further include a horizontal drive unit 240, which is used to drive the carrier plate 220 to slide along the length direction of the horizontal guide rail 210, so as to drive the carrier plate 220 to slide between the bearing position and the test position.
[0077] In one embodiment, the horizontal drive unit 240 is a horizontal cylinder, with the cylinder rod and cylinder body connected to the support plate 220 and the mounting plate 230, respectively. The extension and retraction of the horizontal cylinder causes the support plate 220 to move.
[0078] In other embodiments, the horizontal drive unit 240 may be a structure such as a motor or a hydraulic cylinder.
[0079] See Figure 3 and Figure 4 In this application, the carrier plate module 200 also includes a stagger plate 250 and a limiting shaft 260; the stagger plate 250 is disposed at one end of the two support plates 120; the limiting shaft 260 passes through the stagger plate 250 to stop the carrier plate 220 when the carrier plate 220 slides from the bearing position toward the test position to the test position, thereby limiting the position of the carrier plate 220.
[0080] The limiting shaft 260 can move relative to the anti-fouling plate 250 along its own axis, thereby stopping the carrier plate 220 in different positions. By adjusting the limiting shaft 260, the carrier plate 220 can be limited to different positions, the test position of the carrier plate 220 can be adjusted, thereby adjusting the horizontal position of the carrier plate 220, and adjusting the relative position between the carrier plate 220 and the test module 300, so as to adapt to the testing of different circuit boards.
[0081] In one embodiment, the two ends of the anti-misalignment plate 250 are respectively connected to a support plate 120. In another embodiment, one end of the anti-misalignment plate 250 is fixedly connected to a support plate 120.
[0082] In some embodiments, the limiting shaft 260 extends longitudinally and is threadedly connected to the anti-misalignment plate 250. By rotating the limiting shaft 260, the longitudinal position of the limiting shaft 260 can be adjusted.
[0083] Figure 7 This is a schematic diagram of the structure of the bearing plate of this utility model. Figure 8 This is a structural schematic diagram of the test module of this utility model from one perspective. Figure 9 This is a structural schematic diagram of the test module of this utility model from another perspective. Figure 10 This is a schematic diagram of the structure of the test board of this utility model.
[0084] See Figures 7 to 10 The test module 300 is used to fix the test terminals so that they can contact the circuit board. The test terminals are connected to an external testing device. After the test terminals contact the circuit board, a path is formed on the circuit board for testing. The circuit board has a structure including a TCON mainboard, mainboard, and power board.
[0085] In some embodiments, the test module 300 includes a test board 310 and a lifting unit 320. The test board 310 is higher than the carrier module 200 and is located above the carrier module 200. Test terminals are fixed to the side plate and extend downward beyond the lower surface of the test board 310. The lifting unit 320 can move the test board 310 downward, thereby moving the test terminals downward. When the carrier plate 220 moves to the test position, the test terminals move downward to a preset downward position, and the test terminals abut against the corresponding contacts or terminals on the circuit board, thereby enabling the circuit board to be tested.
[0086] The lifting unit 320 is a vertical cylinder. One end of the vertical cylinder is connected to the test plate 310, and the other end is connected to the support plate 120 or the horizontal plate 110. The vertical cylinder is located on opposite sides of the two support plates 120.
[0087] In other embodiments, the vertical unit can be a structure such as a motor or a hydraulic cylinder.
[0088] In some embodiments, upright plates 130 are respectively provided on opposite sides of the two support plates 120, and the upright plates 130 are fixed on the support plates 120 or the horizontal plate 110. A vertical plate 140 is provided on the lower surface of the test plate 310. A slide rail assembly 400 is provided between the vertical plate 140 and the upright plate 130 so that the vertical plate 140 can slide upward along the upright plate 130. The movement of the vertical plate 140 relative to the upright plate 130 allows the test plate 310 to move vertically. The slide rail assembly 400 includes a track and a corresponding slider, which are respectively provided on the vertical plate 140 and the upright plate 130.
[0089] In other embodiments, at least two upright plates 130 are provided on any opposite side of the two support plates 120; the number of vertical plates 140 and upright plates 130 correspond.
[0090] In one embodiment, the upright plate 130 is provided with one, two, or three on any opposite side of the support plate 120.
[0091] In some embodiments, a protruding limiting post 311 is formed on the bottom surface of the test board 310; when the test board 310 moves downward to a preset downward position, the lower end of the limiting post 311 can abut against the carrier module 200, so as to effectively prevent the test terminals from hitting the circuit board downward, thereby protecting the circuit board and the test terminals. When the test board 310 moves downward to the preset downward position, the lower end of the limiting post 311 can abut against the support plate 220 to accommodate the circuit board and the test terminals.
[0092] In other embodiments, a protruding guide post 312 is formed on the bottom surface of the test plate 310; a protruding guide block 222 is formed on the upper surface of the carrier plate module 200; a guide hole 223 is provided at the upper end of the guide block 222. The guide block 222 is disposed on the upper surface of the carrier plate 220.
[0093] The guide post 312 can extend into the guide hole 223 for alignment guidance between the guide post 312 and the guide hole 223. This guidance between the guide post 312 and the guide hole 223 ensures precise positioning of the test board 310 and the carrier module 200, guaranteeing accurate alignment between the test terminals and the circuit board.
[0094] In some embodiments, the lower end of the guide post 312 extends downward beyond the lower end of the limiting post 311. During the process of the test plate 310 moving downward to the downward position, the guide post 312 first extends into the guide hole 223, and after the test plate 310 continues to move downward, the limiting post 311 abuts against the support plate 220.
[0095] See Figures 7 to 10 The test module 300 also includes a limiting plate 330, and both the test board 310 and the limiting plate 330 are located above the carrier module 200. The limiting plate 330 is movably disposed on the test board 310 to limit the test terminals on the test board 310; the limiting plate 330 and the test board 310 are configured to clamp different test terminals on the test board 310 to accommodate the testing of different circuit boards.
[0096] In one embodiment, the test terminal includes an FPC flexible cable and a test probe fixed to one end of the FPC flexible cable; a limiting plate 330 is disposed on the upper surface of the test plate 310, and the FPC flexible cable is clamped between the test plate 310 and the limiting plate 330; the test plate 310 has a through hole 313 extending vertically for the insertion of the test probe. The FPC flexible cable is clamped between the test plate 310 and the limiting plate 330 to fix the test terminal to the test module 300. The test probe passes through the through hole 313 to abut or insert into the corresponding terminal on the circuit board for testing the circuit board.
[0097] In some embodiments, a plurality of protruding limiting ribs 314 are formed on the upper surface of the test plate 310; the plurality of limiting ribs 314 are respectively disposed near the side of the test plate 310; limiting grooves are formed on the side of the limiting ribs 314 facing the center of the test plate 310; limiting ribs 314 are respectively disposed on at least two opposite edges of the test plate 310; the edge of the limiting plate 330 is slidably disposed in the limiting groove, so that the limiting plate 330 can be detachably engaged with the limiting rib 314. The two opposite edges of the limiting plate 330 can be respectively engaged in the limiting grooves on the limiting ribs 314, so that the limiting plate 330 is limited above the test plate 310, thereby enabling the FPC flexible cable to be clamped between the limiting plate 330 and the test plate 310. The detachability of the limiting plate 330 on the test plate 310 is used to fix different test terminals on the test plate 310.
[0098] In some implementations, three limiting ribs 314 are provided, each corresponding to one side of the test plate 310. Two limiting ribs 314 are arranged opposite each other, each corresponding to one side of the test plate 310, and the remaining limiting rib 314 corresponds to the other side of the test plate 310. The three limiting ribs 314 enclose an interface with one open end, thereby facilitating the installation and removal of the limiting plate 330 from this opening.
[0099] In another embodiment, two limiting ribs 314 are provided, which are arranged opposite to each other. Limiting grooves are formed on the opposite sides of the two limiting ribs 314, and the opposite ends of the limiting plate 330 are engaged in the limiting grooves.
[0100] In another embodiment, the upper surface of the test plate 310 is not provided with limiting ribs 314, and the limiting plate 330 is limited on the test plate 310 by means of bolts or buckles or other structures.
[0101] Figure 11 This is a bottom schematic diagram of the testing mechanism of this utility model.
[0102] See Figure 11 and combined Figures 1 to 10 The testing mechanism also includes a solenoid valve module 500 and an electronic control module 600. The solenoid valve module 500 is connected to the horizontal drive unit 240 and the lifting unit 320 via pipelines to control their movement. The electronic control module 600 is electrically connected to the solenoid valve module 500 to control its operation, thereby controlling the operation of the horizontal drive unit 240 and the lifting unit 320. The solenoid valve module 500 can be a PLC or a microcontroller, etc.
[0103] In some embodiments, a gap is provided between the mounting plate 230 and the horizontal plate 110, within which the solenoid valve module 500 and the electronic control module 600 are housed, making the structure of the testing mechanism more compact. A through window is provided on the horizontal plate to facilitate the installation of the solenoid valve module 500 and the electronic control module 600.
[0104] In other embodiments, the testing mechanism further includes a control module 700, which is equipped with buttons to control the operation of the testing mechanism. For example, the buttons can be used to control the movement of the horizontal drive unit 240 and the lifting unit 320.
[0105] In some embodiments, the buttons on the control module 700 may also include an emergency button for controlling the testing mechanism to stop operation.
[0106] Based on the above description, when testing the circuit board is required, the test terminals corresponding to the circuit board are fixed to the test module 300. Specifically, the test terminals are fixed to the test board 310 through the detachable connection of the limiting plate 330 to the test board 310.
[0107] Place the circuit board on the carrier plate 220. The circuit board is placed in the preset position on the carrier plate 220 by a robotic arm or manually.
[0108] The horizontal drive unit 240 drives the carrier plate 220 to slide along the horizontal guide rail 210, and the carrier plate 220 moves from the bearing position to the test position.
[0109] The lifting unit 320 drives the test board 310 to move downwards, which in turn moves the test terminals downwards, causing them to contact the corresponding terminals or contacts on the circuit board. External testing equipment then tests the circuit board.
[0110] After the test is completed, the lifting unit 320 drives the test board 310 to move upward, causing the test terminals and the circuit board to separate. The horizontal drive unit 240 drives the carrier plate 220 to slide along the horizontal guide rail 210, moving the carrier plate 220 from the test position to the carrier position. The circuit board is then removed from the carrier plate 220 by a robotic arm or manually.
[0111] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.
[0112] In this application, unless otherwise expressly specified and limited, the terms "assembly," "connection," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances. In the description of this specification, the reference to terms such as "some embodiments," "exemplarily," etc., means that the specific features, structures, materials, or characteristics described in connection with that embodiment or example are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any suitable manner in one or more embodiments or examples. Furthermore, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification and the features of different embodiments or examples.
[0113] Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of this application. Therefore, any changes or modifications made in accordance with the claims and description of this application should fall within the scope of this patent application.
Claims
1. A circuit board automatic testing mechanism characterized by comprising: include: Test fixture (100); Carrier module (200), which is used to carry circuit boards; The carrier module (200) is slidably mounted on the test frame (100) in a horizontal direction so that it can slide between the bearing position and the test position; The test module (300) includes a test plate (310), a lifting unit (320), and a limiting plate (330); the test plate (310) and the limiting plate (330) are located above the carrier module (200); the limiting plate (330) is movably disposed on the test plate (310) to limit the test terminals on the test plate (310); the limiting plate (330) and the test plate (310) are configured to clamp different test terminals on the test plate (310); The lifting unit (320) is connected between the test board (310) and the test frame (100) so as to drive the test board (310) to move vertically; when the carrier module (200) is in the test position, the test board (310) can drive the test terminals downward to contact the circuit board on the carrier module (200).
2. The circuit board automatic testing mechanism according to claim 1, wherein The test terminal includes an FPC flexible cable and a test probe fixed to one end of the FPC flexible cable. The limiting plate (330) is disposed on the upper surface of the test plate (310), and the FPC flexible cable is clamped between the test plate (310) and the limiting plate (330); the test plate (310) has a through hole (313) that runs vertically through it for the insertion of the test probe.
3. The circuit board automatic testing mechanism according to claim 2, wherein The upper surface of the test plate (310) is provided with a plurality of protruding limiting ribs (314); the plurality of limiting ribs (314) are respectively disposed near the side of the test plate (310); the limiting ribs (314) are provided with limiting grooves on the side facing the center of the test plate (310); the test plate (310) is provided with the limiting ribs (314) on at least two opposite edges; The edge of the limiting plate (330) is slidably disposed in the limiting groove so that the limiting plate (330) can be separably engaged with the limiting rib (314).
4. The circuit board automatic testing mechanism according to claim 3, wherein The limiting ribs (314) are configured in three parts, and the three limiting ribs (314) are respectively configured on one side of the test plate (310).
5. The automatic circuit board testing mechanism according to claim 1, characterized in that, The bottom surface of the test plate (310) has a protruding limiting post (311); when the test plate (310) moves downward to a preset downward position, the lower end of the limiting post (311) can abut against the carrier module (200).
6. The automatic circuit board testing mechanism according to claim 1, characterized in that, The bottom surface of the test board (310) has a protruding guide post (312); the upper surface of the carrier module (200) has a protruding guide block (222); the upper end of the guide block (222) has a guide hole (223); During the downward movement of the test plate (310), the guide post (312) can extend into the guide hole (223).
7. The automatic circuit board testing mechanism according to claim 1, characterized in that, The test frame (100) includes a horizontal plate (110) and a support plate (120); two support plates (120) are spaced apart above the horizontal plate (110); the carrier module (200) is disposed between the two support plates (120), and the test plate (310) is disposed above the support plate (120).
8. The automatic circuit board testing mechanism according to claim 7, characterized in that, The carrier plate module (200) includes horizontal guide rails (210) on opposite sides of the two support plates (120), a carrier plate (220) slidably disposed on the horizontal guide rails (210), and a horizontal drive unit (240); the horizontal drive unit (240) is used to drive the carrier plate (220) to slide along the length direction of the horizontal guide rails (210) so as to drive the carrier plate (220) to slide between the bearing position and the test position.
9. The automatic circuit board testing mechanism according to claim 8, characterized in that, The carrier plate module (200) also includes a stagger plate (250) and a limiting shaft (260); the stagger plate (250) is disposed at one end of the two support plates (120); the limiting shaft (260) passes through the stagger plate (250) to stop the carrier plate (220) when the carrier plate (220) slides from the bearing position toward the test position to the test position; The limiting shaft (260) is movable relative to the anti-fouling plate (250) along its own axial direction, thereby stopping the bearing plate (220) at different positions.
10. The automatic circuit board testing mechanism according to claim 7, characterized in that, Each of the two support plates (120) has a vertical plate (130) on its opposite side, and the vertical plate (130) is fixed on the support plate (120) or the horizontal plate (110); The lower surface of the test plate (310) is provided with a vertical plate (140); a slide rail assembly (400) is provided between the vertical plate (140) and the upright plate (130) so that the vertical plate (140) can slide upward along the upright plate (130).