A weak dark current testing device

Abstract

This application provides a weak dark current testing device, comprising: a housing; a test socket disposed within the housing for supporting and electrically connecting one or more devices under test (DUTs) to collect dark current signals generated by the DUTs; a channel interface disposed on the housing for connecting to external testing equipment; a channel switching module disposed within the housing and connected to both the test socket and the channel interface, forming a dark current signal path from the DUTs to the external testing equipment; and the channel switching module selectively conducting the dark current signal path, enabling dark current testing of different DUTs through the external testing equipment. This application, through the channel switching module, time-division multiplexes the dark current signal paths between each DUT and the external testing equipment, sequentially completing the dark current testing of each DUT, thereby improving the efficiency of dark current testing.

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