A test circuit system and device

Abstract

This application discloses a test circuit system and device, including: an anti-static and anti-ESD module, a DC-DC converter module, a microcontroller (MCU), an open-drain PWM output module, and a push-pull PWM output module. The anti-static and anti-ESD module obtains a protection voltage by regulating and limiting the external input voltage. The DC-DC converter module converts the protection voltage into a working voltage to power the MCU and the open-drain PWM output module. The MCU outputs a first preset PWM signal and / or a second preset PWM signal, causing the open-drain PWM output module to convert the first preset PWM signal into a first test signal, and / or causing the push-pull PWM output module to convert the second preset PWM signal into a second test signal. By introducing the open-drain PWM output module and the push-pull PWM output module, this application significantly reduces the need for expensive and complex traditional test equipment, thereby lowering the testing cost during hardware development.

Description

Technical Field

[0001] This application relates to the field of power electronics, specifically to a test circuit system and device. Background Technology

[0002] During hardware development, the hardware debugging and subsequent hardware testing phases typically require the use of complex test equipment and various resistors, capacitors, and other components to construct an off-board test environment. These test devices and components are used to verify the correctness, functionality, and performance indicators of the hardware design, ensuring that the hardware system can operate normally and meet expected requirements. However, because different test circuits are often required for different hardware development stages and debugging needs, this leads to an increase in overall testing costs.

[0003] Because different test schemes or test circuits may be needed at different stages of hardware development, hardware engineers often face the challenge of performing multiple debugging and testing processes to verify the accuracy and reliability of the hardware design. In such cases, the test equipment and components required at each stage may differ, and setting up and switching between these different test environments increases time and resource costs. Furthermore, the cost of components associated with different test circuits may also increase accordingly, further raising the overall hardware testing cost.

[0004] Therefore, how to reduce the cost of complex testing equipment and devices required at different testing stages in the hardware development process is a technical problem that urgently needs to be solved by those skilled in the art. Utility Model Content

[0005] In view of this, embodiments of this application provide a test circuit system and device to solve the problem that users cannot detect abnormal pressure in vehicle fire extinguishers in a timely manner.

[0006] To address the above problems, the technical solutions provided in this application are as follows:

[0007] A test circuit system, the system comprising: an anti-reverse electrostatic discharge (ESD) module, a DC-DC converter (DCDC) module, a microcontroller (MCU), an open-drain PWM output module, and a push-pull PWM output module;

[0008] The output terminal of the anti-static and anti-reverse electrostatic discharge (ESD) module is connected to the input terminal of the DC-DC module and the voltage input terminal of the push-pull PWM output module, respectively. The DC-DC module is connected to the voltage input terminal of the MCU and the voltage input terminal of the open-drain PWM output module, respectively. The first general purpose input / output (GPIO) terminal of the MCU is connected to the signal input terminal of the open-drain PWM output module. The second GPIO terminal of the MCU is connected to the signal input terminal of the push-pull PWM output module. The signal output terminal of the open-drain PWM output module is connected to the test terminal of the device under test (DUT). The signal output terminal of the push-pull PWM output module is connected to the test terminal of the DUT.

[0009] The anti-reverse and anti-static module is used to stabilize and limit the external input voltage to obtain a protective voltage.

[0010] The DC-DC module is used to convert the protection voltage into the operating voltage, so as to use the operating voltage to power the MCU and the open-drain PWM output module;

[0011] The MCU is used to output a first preset PWM signal and / or a second preset PWM signal;

[0012] The open-drain PWM output module is used to convert the first preset PWM signal into a first test signal;

[0013] The push-pull PWM output module is used to convert the second preset PWM signal into a second test signal;

[0014] The anti-static module provides the protection voltage to the push-pull PWM output module as the voltage during the operation of the push-pull PWM output module; the hardware device under test is tested based on the first test signal or the second test signal.

[0015] In one possible implementation, the anti-static module includes a first capacitor, a second capacitor, and a diode;

[0016] The first capacitor, the second capacitor, and the diode are connected in series.

[0017] Both the first capacitor and the second capacitor are used to absorb the high-frequency signal and transient voltage fluctuations of the external input voltage to obtain a regulated voltage;

[0018] The diode is used to prevent the regulated voltage from flowing in the reverse direction, thereby obtaining the protection voltage.

[0019] In one possible implementation, the push-pull PWM output module includes a first-stage transistor and a second-stage transistor;

[0020] The base of the first-stage transistor is connected to the GPIO port of the MCU; the emitter of the first-stage transistor is grounded; the collector of the first-stage transistor is connected to the base of the second-stage transistor; the emitter of the second-stage transistor is connected to the output terminal of the anti-reverse and anti-static module; and the collector of the second-stage transistor is connected to the test terminal of the hardware device under test.

[0021] In one possible implementation, the system further includes a first setting module; the first setting module is connected to the MCU;

[0022] The first setting module is used to set the total duty cycle of the MCU.

[0023] In one possible implementation, the system further includes a second setting module; the second setting module is connected to the MCU.

[0024] The second setting module is used to set the first output PWM signal output from the first GPIO output terminal and the output frequency of the first output PWM signal; and / or,

[0025] Used to set the second output PWM signal output from the second GPIO output terminal and the output frequency of the second output PWM signal;

[0026] Wherein, the first output PWM signal, the output frequency of the first output PWM signal, the second output PWM signal, and the output frequency of the second output PWM signal are all set by the user through the second setting module based on the test requirements of the hardware device under test;

[0027] The MCU is specifically used for:

[0028] Based on the total duty cycle of the MCU, the first output PWM signal, and the output frequency of the first output PWM signal, a first preset PWM signal is output; and / or,

[0029] A second preset PWM signal is output based on the total duty cycle of the MCU, the second output PWM signal, and the output frequency of the second output PWM signal.

[0030] In one possible implementation, the second setting module includes a fixed resistor voltage divider and a rotary potentiometer;

[0031] The fixed resistor voltage divider is used to set the first output PWM signal and / or the second output PWM signal;

[0032] The rotary potentiometer is used to set the output frequency of the first output PWM signal and / or the output frequency of the second output PWM signal.

[0033] In one possible implementation, the output terminal of the push-pull PWM output module is connected to the test terminal of the hardware under test via a current-limiting resistor.

[0034] The current-limiting resistor is used to limit the current of the test signal.

[0035] In one possible implementation, the MCU also includes a 4-pin connector;

[0036] The 4-pin connector is used to connect to the programmer for firmware burning.

[0037] In one possible implementation, the first setting module includes onboard buttons and jumper caps;

[0038] The buttons on the board are used to adjust the value of the total duty cycle;

[0039] The jumper cap is used to select the range and / or preset value of the total duty cycle.

[0040] A test circuit device, comprising the test circuit system described above.

[0041] Therefore, the embodiments of this application have the following beneficial effects:

[0042] The test circuit system of this application embodiment achieves efficient and accurate hardware testing by integrating an anti-reverse electrostatic discharge (ESD) module, a DC-DC converter, an MCU, an open-drain PWM output module, and a push-pull PWM output module. Specifically, the system first stabilizes and limits the external input voltage through the ESD module to generate a protective voltage. Then, the DC-DC converter converts the protective voltage into the operating voltage to power the MCU and the PWM output module. The MCU is responsible for generating a first preset PWM signal and / or a second preset PWM signal, which are converted into a first test signal and a second test signal by the open-drain PWM output module and the push-pull PWM output module, respectively, ultimately driving the hardware device under test (DUT) for testing.

[0043] This application avoids the use of expensive and large-scale test equipment: by integrating open-drain PWM output modules and push-pull PWM output modules, the system can directly generate various types of test signals (such as the first test signal and the second test signal), thereby replacing expensive or large-scale test equipment such as signal generators, constant current power supplies, and load boxes required in traditional testing. Simultaneously, it simplifies test environment setup: since different hardware development stages may require different test circuits, traditional methods require setting up and switching complex test environments, while this system utilizes a microcontroller (MCU) to control the PWM output modules to meet different test requirements, greatly simplifying the test environment setup process. Furthermore, it saves costs: the system not only reduces reliance on expensive test equipment but also reduces the time and resource costs required to set up different test environments. In addition, the simplified test environment also reduces labor costs. Moreover, it improves test efficiency: through integrated design, the system can quickly adapt to different test requirements and reduce the time required for debugging and testing, thereby significantly improving test efficiency. Attached Figure Description

[0044] To more clearly illustrate the technical solutions in this embodiment or the prior art, the drawings used in the description of the embodiment or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0045] Figure 1 This application provides a schematic diagram of a test circuit system structure.

[0046] Figure 2 A circuit diagram of an open-drain PWM output module provided in an embodiment of this application;

[0047] Figure 3 A circuit diagram of a push-pull PWM output module provided for an embodiment of this application;

[0048] Figure 4 A circuit diagram of a button on a board provided in this application embodiment;

[0049] Figure 5 A circuit diagram of a jumper cap provided in an embodiment of this application;

[0050] Figure 6 This is a schematic diagram of another test circuit system structure provided in an embodiment of this application;

[0051] Figure 7 A circuit diagram of a fixed resistor voltage divider / rotary potentiometer provided for an embodiment of this application. Detailed Implementation

[0052] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0053] To facilitate understanding of the technical solutions provided in the embodiments of this application, the background technology involved in the embodiments of this application will be described below.

[0054] In hardware development, the hardware debugging and testing phases are crucial for ensuring the design functions correctly. During these phases, developers often rely on complex test equipment and various passive components such as resistors and capacitors to build test environments. This combination of equipment and components not only helps developers simulate real-world working environments but also enables a comprehensive evaluation and verification of potential problems in the hardware design. However, due to the complexity of hardware development and the requirements of its different stages, the necessary test equipment and circuit setup often incur high costs.

[0055] To address this issue, this application provides a test circuit system that utilizes multiple modules to collaboratively test hardware devices. The system includes an anti-static / anti-reverse voltage module, a DC-DC converter, an MCU, an open-drain PWM output module, and a push-pull PWM output module. The anti-static / anti-reverse voltage module regulates and limits the external input voltage, outputting a protective voltage for the DC-DC module. The DC-DC module converts the protective voltage into a working voltage, providing power to the MCU and PWM module. The MCU generates a preset PWM signal, which is output as test signals through the open-drain and push-pull PWM modules respectively, for testing the hardware under test. By employing open-drain and push-pull PWM output modules, this application can simulate test signals and conditions with smaller, lower-cost equipment, thereby avoiding the use of these high-cost devices and saving on hardware development and testing budgets.

[0056] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0057] See Figure 1 , Figure 1A schematic diagram of a test circuit system structure is provided for an embodiment of this application, such as... Figure 1 As shown, the system includes: an anti-static module, a DC-DC converter module, a microcontroller unit (MCU), an open-drain pulse width modulation (PWM) output module, and a push-pull PWM output module.

[0058] The output terminals of the anti-reverse electrostatic discharge (ESD) module are connected to the input terminals of the DC-DC converter and the voltage input terminals of the push-pull PWM output module, respectively. The DC-DC converter is connected to the voltage input terminals of the MCU and the open-drain PWM output module, respectively. The first general-purpose input / output (GPIO) terminal of the MCU is connected to the signal input terminal of the open-drain PWM output module. The second GPIO terminal of the MCU is connected to the signal input terminal of the push-pull PWM output module. The signal output terminal of the open-drain PWM output module is connected to the test terminal of the device under test (DUT). The signal output terminal of the push-pull PWM output module is connected to the test terminal of the DUT.

[0059] The anti-reverse and anti-static module is used to stabilize and limit the external input voltage to obtain a protective voltage.

[0060] The DC-DC module is used to convert the protection voltage into the operating voltage, so as to power the MCU and the open-drain PWM output module.

[0061] The MCU is used to output a first preset PWM signal and / or a second preset PWM signal.

[0062] An open-drain PWM output module is used to convert a first preset PWM signal into a first test signal. See also... Figure 2 , Figure 2 This is a circuit diagram of an open-drain PWM output module provided in an embodiment of this application. Figure 2R24 and R43 are jumper resistors for debugging. Considering the current limitation of the MCU's I / O port, a PNP transistor Q8 is reserved as the driving source for the N-type MOSFET Q1. The base of Q8 is directly controlled by the MCU's I / O port. R22 ensures that Q8 remains in a stable non-conducting state when no signal is driving, avoiding crosstalk-induced turn-on. The source of Q1 is grounded, and the gate is pulled to VCC_5V high level through the conduction of Q8. After conduction, the drain of Q1 is connected to a rotary potentiometer U4 as an adjustable current-limiting resistor to adjust the current limit of the final open-drain output, realizing PWM loads with different current capabilities. U4 is connected in parallel with the large-package resistors R7 and R8, and R7 and R8 themselves are also connected in parallel. In actual use, either U4 or one of R7 and R8 is selected. In most cases, only U4 is required. The rotary potentiometer U5 has the same structure as the large-package resistors R9 and R10. R9 and R10 are connected in parallel, and this combination is also connected in parallel with U5. When using this device, adjust the resistance values ​​of U4 and U5 to correspond to the minimum current Imin and maximum current Imax required by the current sensor. LED1 is the working indicator light for this circuit; its positive terminal is driven by the I / O port of driver Q8, and its negative terminal is grounded. The LED will light up when the I / O port outputs a waveform. C19 and C20 are electrostatic discharge (ESD) protection capacitors, placed at a 90° angle at the output port of the test board. J3 is the signal output, and J6 is the signal reference ground connector. Figure 2 The parameters marked next to each component indicate the selection criteria for that component.

[0063] It should be noted that, Figure 2 In the circuit shown, the high-side switch (PNP type triode switch) Q8 is driven by the MCU's I / O port. Q8's power supply uses 5V to match the MCU's I / O drive level. Q1 is an NMOS (N-type MOSFET) with a Vgsth (MOS turn-on voltage) threshold of 2~4V, used as the low-side switch and matched to the 5V rail. The minimum current value Imin of the current-type load is calculated according to Formula 1. The equivalent pull-up current-limiting resistor of the tested sample is set to Rpullup, and the pull-up voltage of the tested sample is Vpullup. In the load board circuit, Ru5 is a rotary potentiometer, which can be freely adjusted, or a fixed resistance value can be obtained by soldering R9 in parallel with R10. When Q1 is turned on, an additional current loop is added. The load board interface impedance to ground is Ru4 in parallel with Ru5, calculated as Re according to Formula 2. The maximum current value Imax of the current-type load is calculated according to Formula 3.

[0064] Formula 1 is Formula 2 is Formula 3 is .

[0065] Based on the above working principle, the circuit can simulate two current values, Imin and Imax, of a current-type Hall sensor. The switching frequency of the load current is determined by the output frequency of the MCU's I / O port, the switching frequency of transistor Q8, and the current value of Q1. This load board can stably achieve an output frequency of 1kHz, with a square wave of 0%~100% duty cycle. When this circuit is working, as long as Q8 is turned on, the corresponding LED1 indicator circuit is also turned on. R33 (with a resistance of 4.7KR) serves as a current limiter.

[0066] A push-pull PWM output module is used to convert a second preset PWM signal into a second test signal. See also... Figure 3 , Figure 3 This application provides a circuit diagram of a push-pull PWM output module according to an embodiment. Figure 3 R25 and R35 are jumper resistors for adjustment. They use the same I / O port and are used to switch specific circuits on the test board by soldering jumper resistors. They cannot be soldered simultaneously. NPN transistor Q6 acts as the current amplifier for PNP transistor Q3. The base of Q6 is directly controlled by the MCU's I / O port. R30 is connected between the base and emitter of Q6 to prevent false turn-on due to crosstalk. The collector of Q6 is connected to the base of Q3; when Q6 is on, Q3 is also on. R31 is connected between the base and emitter of Q3 to prevent false turn-on due to crosstalk. Rotary potentiometer U6 is connected in parallel with large-package resistors R11 and R14. R11 and R14 are also themselves connected in parallel. In actual use, only U6 or one of R11 or R14 should be selected. In most cases, U6 is sufficient. Rotary potentiometer U8 has the same structure as the large-package resistors R21 and R23. U21 and R23 are connected in parallel, and they are also connected in parallel with U8. During use, adjusting the resistance values ​​of U6 and U8 allows for free adjustment of the output current value, corresponding to the minimum current Imin and maximum current Imax required by the current sensor. LED2 is the working indicator for this circuit. C26 and C27 are electrostatic discharge (ESD) capacitors, placed at a 90° angle at the output port of the test board. J4 is the signal output, and J7 is the signal reference ground connector. Figure 3 The parameters marked next to each component indicate the selection criteria for that component.

[0067] It should be noted that, Figure 3 In the circuit shown, when the circuit is in OFF mode, the equivalent loop is Vpullup (UB_PR in the diagram), which flows through U8 (or R21 in parallel with R23), through the pull-down resistor on the test sample (named Rpulldown), and back to GND. The current in the loop is calculated according to Formula 4 and denoted as Imin. When the circuit is in ON mode, the equivalent loop is the resistance of U8 (or R21 in parallel with R23) in parallel with U6 (or R11 in parallel with R14). At this time, the equivalent current value is calculated according to Formula 5 and denoted as Imax.

[0068] Formula 4 is Formula 5 is .

[0069] Based on the above working principle, this circuit can simulate two current values, Imin and Imax, of a current-type Hall sensor. The switching frequency of the load current is determined by the output frequency of the MCU's I / O port, the switching frequency of transistors Q6 and Q3, and the magnitude of their current values. According to the S9014G and BC856B datasheets and actual testing, this circuit can stably output a 1kHz square wave with a duty cycle of 0~100%. When this circuit is working, as long as Q6 is turned on, the corresponding LED2 indicator circuit is also turned on. R28 (with a resistance of 4.7KR) serves as a current limiter.

[0070] It should also be noted that the anti-static and anti-reverse voltage module generates a protective voltage after regulating and limiting the external input voltage. This voltage not only powers other modules but also directly supplies the push-pull PWM output module, enabling it to operate normally. Furthermore, the testing of the hardware under test (DUT) is performed using either the first or second test signal. These signals are applied to the DUT to check whether its performance or functionality meets requirements.

[0071] Optionally, the MCU includes any one of the STM8S003 series 8-bit microcontrollers. The STM8S003 series is an 8-bit microcontroller (MCU) launched by STMicroelectronics, belonging to the STM8 series. It is mainly used for cost-sensitive embedded applications, providing high performance and a variety of peripheral interfaces.

[0072] Optionally, the DC-DC module includes an LN10063 chip. The LN10063 is an integrated buck DC-DC converter chip manufactured by Linear Technology (now part of Analog Devices). This chip is primarily used to convert higher DC voltages into lower, stable DC voltage outputs.

[0073] In one possible implementation, the output of the push-pull PWM output module is connected to the test terminal of the device under test via a current-limiting resistor.

[0074] The current-limiting resistor is used to limit the current of the test signal.

[0075] In one possible implementation, the anti-static module includes a first capacitor, a second capacitor, and a diode;

[0076] The first capacitor, the second capacitor, and the diode are connected in series.

[0077] Both the first capacitor and the second capacitor are used to absorb the high-frequency signal and transient voltage fluctuations of the external input voltage to obtain a regulated voltage;

[0078] The diode is used to prevent the regulated voltage from flowing in the reverse direction, thereby obtaining the protection voltage.

[0079] Optionally, both the first capacitor and the second capacitor can be capacitors with a capacitance value of 100nF (nanofa). This application does not impose specific restrictions on the capacitance values ​​of the first capacitor and the second capacitor. Users can adjust the capacitance values ​​of the first capacitor and the second capacitor according to actual needs.

[0080] In one possible implementation, the push-pull PWM output module includes a first-stage transistor and a second-stage transistor;

[0081] The base of the first-stage transistor is connected to the GPIO port of the MCU; the emitter of the first-stage transistor is grounded; the collector of the first-stage transistor is connected to the base of the second-stage transistor; the emitter of the second-stage transistor is connected to the output terminal of the anti-reverse and anti-static module; and the collector of the second-stage transistor is connected to the test terminal of the hardware device under test.

[0082] It should be noted that the first-stage transistor is an NPN transistor, and the second-stage transistor is a PNP transistor.

[0083] In one possible implementation, the system further includes another push-pull PWM output module as a reserved push-pull PWM output module. The reserved push-pull PWM output module differs from the aforementioned push-pull PWM output module in that it lacks an adjustable resistor. This reserved push-pull PWM output module can output arbitrary push-pull waveforms.

[0084] In one possible implementation, the system further includes a first setting module; the first setting module is connected to the MCU;

[0085] The first setting module is used to set the total duty cycle of the MCU. The total duty cycle refers to the proportion of the MCU's output signal at a "high" level within a specific period. By adjusting the total duty cycle, the waveform characteristics of the output signal can be controlled, thereby affecting the operating state of other modules in the system or the characteristics of test signals. Therefore, the main function of the first setting module is to provide adjustment of the MCU's duty cycle to ensure that the system can generate appropriate signal outputs as needed.

[0086] In one possible implementation, the first setting module consists of onboard buttons and jumper caps.

[0087] Button Functions: The buttons on the board can be used to increase or decrease the total duty cycle. Each time a button is pressed, the MCU detects the change in button status and adjusts the duty cycle setting accordingly. For example, pressing the button once increases the duty cycle by a fixed step (e.g., 5% or 10%), while holding down the button may rapidly change the duty cycle. See also... Figure 4 , Figure 4 This application provides a circuit diagram of a button on a board. Figure 4 Pins 2 and 3 of the tactile switch form a switch pair. R15 pulls pin 3 to VCC_5V, pin 2 is connected to GND, and the signal on pin 3 is connected to the MCU's digital acquisition pin PC4 after being current-limited by a 10KR resistor. When the switch is pressed and triggered, the signal is pulled to GND and is at a low level; when not triggered, it is at VCC_5V and is at a high level.

[0088] Jumper Cap Function: Jumper caps (or jumpers) are typically used to configure hardware settings. They allow you to select a range and / or preset value for the duty cycle by setting different connection states. For example, using different jumper cap combinations allows you to select a specific duty cycle range (such as a specific setting between 0% and 100%). You can also select different increments (i.e., preset values) using jumper caps, such as 1% increments or 5% increments, for fine-tuning the duty cycle. See also Figure 5 , Figure 5 This application provides a circuit diagram of a jumper cap. Figure 5 P2 is a jumper connector. Pin 1 of the jumper connector is connected to GND, and pin 2 is pulled up to VCC_5V through R18. Pin 2 is also connected to the MCU's digital acquisition pin PC3 through a current-limiting resistor R17. When the jumper is connected, pins 1 and 2 are conducting, and the signal is pulled low. When the jumper is removed, pins 1 and 2 are disconnected, and the signal is pulled high.

[0089] See Figure 6 , Figure 6 This is a schematic diagram of another test circuit system structure provided in an embodiment of this application. Accordingly, the system further includes a second setting module consisting of a fixed resistor voltage divider and a rotary potentiometer; the second setting module is connected to the MCU.

[0090] The second setting module plays a crucial role in the entire system. By connecting with the MCU (Microcontroller Unit), it provides users with flexible PWM signal setting functions, thereby meeting the testing needs of various hardware devices.

[0091] Specifically, the functions of the second settings module can be divided into two main parts:

[0092] Setting the PWM signal at the first GPIO output: The second setting module first allows the user to set the PWM signal (i.e., the first output PWM signal) output by the first GPIO output (usually a signal line connected to the hardware under test). The PWM signal controls the output waveform by adjusting its duty cycle and frequency. Through the second setting module, the user can also precisely adjust the output frequency of this signal, thereby affecting the response of the device under test to the signal. This is crucial for testing the response characteristics, performance stability, and simulating the working environment of the device.

[0093] Setting the PWM signal at the second GPIO output: In addition to the first GPIO, the second setting module also supports setting the PWM signal at the second GPIO output. Similar to the PWM signal at the first GPIO, the PWM signal output of the second GPIO (i.e., the second output PWM signal) can also be adjusted by the user, and its frequency can be set. This means that users can configure test signals not only for the first signal terminal but also for the second, making it particularly suitable for test scenarios requiring multiple signal sources.

[0094] For both of these functions, the frequency and duty cycle of the output PWM signal are set by the user according to the specific test requirements of the hardware under test. In other words, the user can flexibly adjust the parameters of the output signal according to the operating characteristics, response speed, performance requirements, etc. of the device under test to ensure that the signal configuration meets the test standards.

[0095] It should be noted that the primary function of a fixed-resistance voltage divider is to regulate the output signal voltage. By connecting a fixed resistor to the power supply, a voltage divider circuit is formed, providing a stable and controllable voltage output to the test equipment. In the second setting module, this voltage divider is used to set the first and / or second output PWM signals. Specifically, the output voltage of the PWM signal is adjusted by the resistor divider, and the value of the divider determines the voltage amplitude and response characteristics of the output signal. It provides the required signal voltage for different hardware devices as needed, thereby ensuring the accuracy and stability of the test signal. See also... Figure 7 , Figure 7 A circuit diagram of a fixed resistor voltage divider / rotary potentiometer provided in this application embodiment. Figure 7 The rotary potentiometer U9 has a 10KR range. One end is pulled up to the VCC_5V power supply using a 10KR resistor R27 to form a voltage divider. The midpoint between U9 and R27 is connected to the MCU's AD acquisition port PD5 to achieve linear voltage acquisition from 0 to 2.5V. Through software mapping, 0 to 2.5V is mapped to the target frequency range of 0 to 1KHz. The STM8 has a 10-bit AD acquisition accuracy, so the acquired values ​​from 0 to 512 are mapped to frequency values ​​from 0 to 1000Hz, resulting in an adjustment accuracy of approximately 2Hz.

[0096] It should be noted that the circuit diagram of the fixed resistor voltage divider is different from that of the rotary potentiometer. Figure 1 Therefore, all were passed Figure 7 exhibit.

[0097] The rotary potentiometer is a key component used to adjust the signal output frequency. By rotating, the potentiometer changes its resistance value; this change directly affects the current and voltage distribution in the circuit, thereby adjusting the output frequency and duty cycle of the PWM signal. In the second setting module, the rotary potentiometer is used to set the output frequency of the first and / or second output PWM signals. Frequency is a crucial parameter determining the length of the PWM signal's operating period; the rotary potentiometer allows for precise control of this parameter, enabling the system to adjust the signal's operating frequency according to different hardware testing requirements. Through the rotary potentiometer, users can easily fine-tune the frequency to adapt to diverse testing requirements.

[0098] Duty cycle refers to the proportion of the "high level" portion of a PWM signal cycle, directly affecting the signal's power output and the hardware's response. By combining a fixed-resistance voltage divider and a rotary potentiometer, the second setting module can precisely control the PWM signal's duty cycle and output frequency. This combination provides the test circuit system with great flexibility, allowing the system to adjust the signal's output characteristics, including voltage, duty cycle, and frequency, according to the needs of different hardware devices. Regardless of the signal response requirements of the tested hardware, the second setting module can provide a suitable PWM signal through fine electrical adjustments, ensuring the accuracy and reliability of the test.

[0099] In one possible implementation, the main function of the MCU is to generate a preset PWM signal output by controlling the total duty cycle and the two PWM signals.

[0100] Specifically, the MCU first calculates the duty cycle of the output signal based on the total duty cycle set by the system. This duty cycle affects the pulse width and power output of the signal. The first output PWM signal is used as the input signal, and the MCU processes this PWM signal based on its output frequency, adjusting the pulse period. Based on these parameters (total duty cycle, output frequency of the first PWM signal), the MCU calculates the required first preset PWM signal. The output frequency and duty cycle of this preset signal may differ from the input signal; after processing by the MCU, the signal output will meet specific requirements.

[0101] Similar to the previous step, the MCU will also generate a second preset PWM signal based on the second output PWM signal and its frequency, combined with the total duty cycle set by the system. The duty cycle and frequency output of the second PWM signal will also be processed by the MCU to ensure that the signal meets the testing requirements of the hardware device.

[0102] In this way, the MCU can generate corresponding first and second preset PWM signals based on the set total duty cycle, combined with the input first and second PWM signals and their frequencies, to meet the needs of the test circuit system. The MCU's control capability makes the signal output highly adjustable, flexibly responding to the requirements of different hardware devices.

[0103] In one possible implementation, the MCU also includes a 4-pin connector;

[0104] The 4-pin connector is used to connect to the programmer for firmware burning.

[0105] It should be noted that a 4-pin connector refers to a connection interface with four pins. This application will reserve such an interface in the MCU design, allowing developers or engineers to connect to the programmer via this interface when needed. A programmer is a device used to write firmware (i.e., the MCU's program code) into the MCU's memory. When the MCU's firmware needs to be updated or modified, the programmer communicates with the MCU through the 4-pin connector to transfer the new firmware data to the MCU's storage area (usually flash memory or other types of memory).

[0106] This 4-pin connector makes firmware programming very simple and efficient. The four pins of the connector typically serve different functions: power, data transfer, reset, and ground. These pins ensure that the programmer can stably transmit firmware data to the MCU and can reset the MCU, putting it in a programmable state.

[0107] Therefore, the 4-pin connector integrated into the MCU makes the firmware burning process more convenient and faster, and enables rapid updates to the MCU firmware during the development and production phases. This design greatly improves work efficiency, reduces the complexity required for firmware updates, and provides significant convenience for the debugging and maintenance of embedded systems.

[0108] This application provides a test circuit system comprising an anti-static and anti-reverse ESD module, a DC-DC converter module, an MCU, an open-drain PWM output module, and a push-pull PWM output module. The anti-static and anti-reverse ESD module outputs a protective voltage to power the DC-DC converter module and the push-pull PWM output module, respectively. The DC-DC converter module converts the protective voltage into a working voltage, supplying the MCU and the open-drain PWM output module. The MCU provides signals to the open-drain and push-pull PWM output modules through its GPIO output, thereby generating first and second test signals, respectively. The open-drain and push-pull PWM modules convert preset PWM signals into test signals for testing of the hardware under test (DUT). The anti-static and anti-reverse ESD module also provides a working voltage to the push-pull PWM module, ensuring stable system operation. By employing open-drain and push-pull PWM output modules, this application avoids the use of expensive or large test equipment, such as signal generators, constant current power supplies, and load banks. These devices are typically required during hardware debugging and testing, while this system, through modular design, achieves the output of multiple test signals, reducing the need for complex external equipment. In addition, the system can adapt to different hardware development stages, avoiding the cumbersome test environment setup caused by different topologies, greatly saving experimental environment and manpower costs, thereby improving testing efficiency and helping to shorten the overall hardware development cycle.

[0109] The foregoing has provided a detailed description of a test circuit system and device provided in this application. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of the claims of this application.

[0110] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0111] It should also be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A test circuit system, characterized in that, The system includes: an anti-static module, a DC-DC converter module, a microcontroller (MCU), an open-drain PWM output module, and a push-pull PWM output module; The output terminal of the anti-static and anti-reverse electrostatic discharge (ESD) module is connected to the input terminal of the DC-DC module and the voltage input terminal of the push-pull PWM output module, respectively. The DC-DC module is connected to the voltage input terminal of the MCU and the voltage input terminal of the open-drain PWM output module, respectively. The first general purpose input / output (GPIO) terminal of the MCU is connected to the signal input terminal of the open-drain PWM output module. The second GPIO terminal of the MCU is connected to the signal input terminal of the push-pull PWM output module. The signal output terminal of the open-drain PWM output module is connected to the test terminal of the device under test (DUT). The signal output terminal of the push-pull PWM output module is connected to the test terminal of the DUT. The anti-reverse and anti-static module is used to stabilize and limit the external input voltage to obtain a protective voltage; The DC-DC module is used to convert the protection voltage into the operating voltage, so as to use the operating voltage to power the MCU and the open-drain PWM output module; The MCU is used to output a first preset PWM signal and / or a second preset PWM signal; The open-drain PWM output module is used to convert the first preset PWM signal into a first test signal; The push-pull PWM output module is used to convert the second preset PWM signal into a second test signal; The anti-static module provides the protection voltage to the push-pull PWM output module as the voltage during the operation of the push-pull PWM output module; the hardware device under test is tested based on the first test signal or the second test signal.

2. The system according to claim 1, characterized in that, The anti-static and anti-reverse module includes a first capacitor, a second capacitor, and a diode; The first capacitor, the second capacitor, and the diode are connected in series. Both the first capacitor and the second capacitor are used to absorb the high-frequency signal and transient voltage fluctuations of the external input voltage to obtain a regulated voltage; The diode is used to prevent the regulated voltage from flowing in reverse, thereby obtaining the protection voltage.

3. The system according to claim 1, characterized in that, The push-pull PWM output module includes a first-stage transistor and a second-stage transistor; The base of the first-stage transistor is connected to the GPIO port of the MCU; the emitter of the first-stage transistor is grounded; the collector of the first-stage transistor is connected to the base of the second-stage transistor; the emitter of the second-stage transistor is connected to the output terminal of the anti-reverse and anti-static module; and the collector of the second-stage transistor is connected to the test terminal of the hardware device under test.

4. The system according to claim 1, characterized in that, The system further includes a first setting module; the first setting module is connected to the MCU; The first setting module is used to set the total duty cycle of the MCU.

5. The system according to claim 4, characterized in that, The system further includes a second setting module; the second setting module is connected to the MCU. The second setting module is used to set the first output PWM signal output from the first GPIO output terminal and the output frequency of the first output PWM signal; and / or, Used to set the second output PWM signal output from the second GPIO output terminal and the output frequency of the second output PWM signal; Wherein, the first output PWM signal, the output frequency of the first output PWM signal, the second output PWM signal, and the output frequency of the second output PWM signal are all set by the user through the second setting module based on the test requirements of the hardware device under test; The MCU is specifically used for: Based on the total duty cycle of the MCU, the first output PWM signal, and the output frequency of the first output PWM signal, a first preset PWM signal is output; and / or, A second preset PWM signal is output based on the total duty cycle of the MCU, the second output PWM signal, and the output frequency of the second output PWM signal.

6. The system according to claim 5, characterized in that, The second setting module includes a fixed resistor voltage divider and a rotary potentiometer; The fixed resistor voltage divider is used to set the first output PWM signal and / or the second output PWM signal; The rotary potentiometer is used to set the output frequency of the first output PWM signal and / or the output frequency of the second output PWM signal.

7. The system according to claim 1, characterized in that, The output terminal of the push-pull PWM output module is connected to the test terminal of the hardware device under test through a current-limiting resistor. The current-limiting resistor is used to limit the current of the test signal.

8. The system according to claim 1, characterized in that, The MCU also includes a 4-pin connector; The 4-pin connector is used to connect to the programmer for firmware burning.

9. The system according to claim 4, characterized in that, The first setting module includes onboard buttons and jumper caps; The buttons on the board are used to adjust the value of the total duty cycle; The jumper cap is used to select the range and / or preset value of the total duty cycle.

10. A test circuit device, characterized in that, Includes the test circuit system as described in any one of claims 1-9.

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