A test fixture and test system

Abstract

This disclosure provides a test fixture and a test system. The test fixture includes a signal transmission interface element and a first slot and a second slot connected to the signal transmission interface element. The signal transmission interface element is used to receive a first test signal from a terminal device and transmit the first test signal to the first slot, and to receive a second test signal from the terminal device and transmit the second test signal to the second slot. The first slot is used for inserting a first network card, so that the first network card responds to the first test signal to perform testing and feeds back a first response signal. The second slot is used for inserting a second network card, so that the second network card responds to the second test signal to perform testing and feeds back a second response signal. The test fixture and test system of this disclosure solve the problem of incomplete testing due to neglecting the type of WLAN card during WLAN function testing of computer products, which leads to potential quality problems. It also reduces waiting time and process time used for repetitive function testing, thus improving testing efficiency.

Description

Technical Field

[0001] This disclosure relates to the field of network interface card (NIC) testing technology, and in particular to a testing fixture and testing system. Background Technology

[0002] After the motherboard fabrication process is completed, the factory needs to perform functional testing, among which the verification of Wireless Local Area Network (WLAN) functionality is a crucial step. Users typically use WLAN cards supporting the Peripheral Component Interconnect Express (PCIE) protocol or the Compute Next-generation Wireless-LAN Interface (CNVI) protocol. Currently, when conducting WLAN functionality testing on computer products, the factory can only test one type of WLAN card at a time—either PCIE or CNVI. This means inserting either a PCIE or CNVI WLAN card into a compatible slot for testing. This approach stems from the universal slot strategy used in most computer product designs, allowing functional testing of any type of WLAN card inserted into the motherboard. Specifically, in actual testing, operators first need to distinguish between the two different types of WLAN cards, then insert them into the universal slot one by one to test the WLAN functionality of the computer product. It's important to note that after testing each type of WLAN card, the computer product needs to be restarted and the testing process repeated. However, this compatibility testing strategy, which uses a universal card slot, introduces potential problems with the test results and makes it impossible to guarantee their accuracy. For example, if the two types of WLAN cards are not effectively distinguished and only one type of WLAN card is tested without being detected in time, the other type of WLAN card may have quality issues. In addition, this process inevitably introduces long waiting intervals, which seriously reduces testing efficiency. Utility Model Content

[0003] This disclosure provides a test fixture and a test system to at least solve the above-mentioned technical problems existing in the prior art.

[0004] According to a first aspect of this disclosure, a test fixture is provided, including a signal transmission interface element and a first slot and a second slot connected to the signal transmission interface element.

[0005] The signal transmission interface element is configured to be plugged into the test interface of the terminal device. The signal transmission interface element is used to receive a first test signal from the terminal device and transmit the first test signal to the first card slot, and to receive a second test signal from the terminal device and transmit the second test signal to the second card slot.

[0006] The first card slot is used for inserting the first network card, so that the first network card responds to the first test signal to perform testing and feed back the first response signal;

[0007] The second card slot is used for inserting a second network card, so that the second network card responds to the second test signal to perform the test and feed back the second response signal.

[0008] In one embodiment, the signal transmission interface element includes a first connection terminal, a second connection terminal, and a third connection terminal. The first connection terminal is connected to the first slot, the second connection terminal is connected to the second slot, and the third connection terminal is plugged into the test interface.

[0009] In one possible implementation, the third connection terminal includes a first pin group and a second pin group, wherein the first pin group is connected to the first connection terminal via a first path, and the second pin group is connected to the second connection terminal via a second path.

[0010] The first pin group and the second pin group each include at least one pin, and the pins in the first pin group and the second pin group are different.

[0011] In one possible implementation, the first pin group receives the first test signal through the test interface and transmits the first test signal to the first connection terminal through the first path. The first connection terminal receives the first response signal of the first network card through the first card slot and transmits it to the first pin group.

[0012] The second pin group receives the second test signal through the test interface and transmits the second test signal to the second connection terminal through the second path. The second connection terminal receives the second response signal of the second network card through the second card slot and transmits it to the second pin group.

[0013] In one possible implementation, the first connection end includes a third pin group and a fourth pin group, and the first slot includes a first connection group corresponding to the third pin group and a second connection group corresponding to the fourth pin group;

[0014] The third pin group and the fourth pin group include multiple pins, and the multiple pins in the third pin group and the fourth pin group are different;

[0015] The first connection group and the second connection group include multiple pins, and the multiple pins in the first connection group and the second connection group are different. The multiple pins are connected one-to-one with the multiple pins.

[0016] In one possible implementation, the first test signal includes a first test command and a second test command, and the first response signal includes a first response command and a second response command.

[0017] The third pin group receives the first test command and transmits it to the first network card through the first connection group; the first connection group receives the first response command and transmits it to the third pin group.

[0018] The fourth pin group receives the second test command and transmits it to the first network card through the second connection group. The second connection group receives the second response command and transmits it to the fourth pin group.

[0019] In one embodiment, the second connection terminal includes a fifth pin group and a sixth pin group, and the second slot includes a third connection group corresponding to the fifth pin group and a fourth connection group corresponding to the sixth pin group;

[0020] The fifth pin group and the sixth pin group include multiple pins, and the multiple pins in the fifth pin group and the sixth pin group are different;

[0021] The third connection group and the fourth connection group include multiple pins, and the multiple pins in the third connection group and the fourth connection group are different, with multiple pins and multiple pins connected in a one-to-one correspondence.

[0022] In one possible implementation, the second test signal includes a third test command and a fourth test command, and the second response signal includes a third response command and a fourth response command;

[0023] The fifth pin group receives the third test command and transmits it to the second network card through the third connection group; the third connection group receives the third response command and transmits it to the fifth pin group.

[0024] The sixth pin group receives the fourth test command and transmits it to the second network card through the fourth connection group. The fourth connection group receives the fourth response command and transmits it to the sixth pin group.

[0025] In one possible implementation, the first test instruction is used to instruct the communication function of the first network card based on the first communication protocol to be tested, and the second test instruction is used to instruct the communication function of the first network card based on the second communication protocol to be tested.

[0026] The third test instruction is used to instruct the second network card to test its communication function based on the third communication protocol, and the fourth test instruction is used to instruct the second network card to test its communication function based on the fourth communication protocol.

[0027] The first communication protocol may be the same as or different from the third communication protocol, and the second communication protocol may be the same as or different from the fourth communication protocol.

[0028] According to a second aspect of this disclosure, a testing system is provided, including a terminal device having a test interface, and the testing system further comprising a test fixture as described in any of the above embodiments, the test fixture being plugged into the test interface.

[0029] In this disclosure, the test fixture includes a signal transmission interface element and a first slot and a second slot connected to the signal transmission interface element. This allows the test fixture to be plugged into the test interface of the terminal device via the signal transmission interface element, transmitting the first test signal and the second test signal simultaneously emitted by the terminal device to the first slot and the second slot respectively. This enables simultaneous testing of the first network card and the second network card based on the first and second test signals, and provides corresponding first and second response signals. This solves the problem of incomplete testing and potential quality issues caused by neglecting the type of WLAN card during WLAN function testing of computer products. Furthermore, compared to testing different types of WLAN cards in a single slot, it saves the required power-on / off waiting time and the process time used for repetitive function testing, thus improving testing efficiency.

[0030] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0031] The above and other objects, features, and advantages of this disclosure will become readily apparent from the following detailed description of exemplary embodiments, taken in conjunction with the accompanying drawings. Several embodiments of this disclosure are illustrated in the drawings by way of example and not limitation, in which:

[0032] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.

[0033] Figure 1 A schematic diagram of the overall structure of a test fixture according to an exemplary embodiment of this disclosure is shown;

[0034] Figure 2 A schematic diagram of the internal structure of a test fixture according to an exemplary embodiment of this disclosure is shown;

[0035] Figure 3 An integrated architecture diagram of a first network interface card (NIC) and a second NIC of a test fixture according to an exemplary embodiment of this disclosure is shown.

[0036] Figure 4 A diagram illustrating the use of the signal transmission interface element PIN of a test fixture according to an exemplary embodiment of this disclosure is shown.

[0037] Figure 5 A schematic diagram of the PIN line connection between the signal transmission interface element of a test fixture and the first and second card slots, according to an exemplary embodiment of this disclosure, is shown.

[0038] The following are the labels in the diagram: 1. First card slot; 2. Second card slot; 3. Signal transmission interface element; 11. First connection group; 12. Second connection group; 21. Third connection group; 22. Fourth connection group; 31. First connection end; 32. Second connection end; 33. Third connection end. Detailed Implementation

[0039] To make the objectives, features, and advantages of this disclosure more apparent and understandable, the technical solutions in the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without creative effort are within the scope of protection of this disclosure.

[0040] The embodiments of this disclosure will now be described in detail with reference to the accompanying drawings.

[0041] Reference Figure 1 and Figure 3 As shown, this disclosure discloses a test fixture in an exemplary embodiment, including a signal transmission interface element 3 and a first slot 1 and a second slot 2 connected to the signal transmission interface element 3. The signal transmission interface element 3 is configured to be plugged into a test interface of a terminal device. The signal transmission interface element 3 is used to receive a first test signal from the terminal device and transmit the first test signal to the first slot 1, and simultaneously receive a second test signal from the terminal device and transmit the second test signal to the second slot 2. The first slot 1 is used for inserting a first network card, so that the first network card responds to the first test signal to perform testing and feed back a first response signal; the second slot 2 is used for inserting a second network card, so that the second network card responds to the second test signal to perform testing and feed back a second response signal.

[0042] In this embodiment, the test fixture is used to test the functionality of the WLAN card. The types of WLAN cards include, but are not limited to, WLAN cards supporting the PCIe protocol and WLAN cards supporting the CNVI protocol. In the embodiments disclosed in this disclosure, the first network card is a WLAN card supporting the PCIe protocol, and the second network card is a WLAN card supporting the CNVI protocol. For ease of description, the two protocols will be referred to as PCIe cards and CNVI cards in the following text. Accordingly, the first card slot 1 is a PCIe card slot, and the second card slot 2 is a CNVI card slot. Both the first card slot 1 and the second card slot 2 are connected to the signal transmission interface element 3. The signal transmission interface element 3 can specifically be a gold finger, which serves as a physical interface for connecting and transmitting signals. Since the test interface on the terminal device is originally compatible with both PCIe and CNVI cards, by plugging the signal transmission interface element 3 into the test interface, the corresponding test signals can be transmitted to the corresponding card slots through the signal transmission interface element 3. Specifically, the terminal device simultaneously sends a first test signal and a second test signal. The first test signal tests whether the PCIe card is functioning correctly, and the second test signal tests whether the CNVI card is functioning correctly. To test the functionality of either the PCIe or CNVI card, the card sends back corresponding status information based on the received test signal, and then returns this information to the terminal device via the same path. When the first and second test signals are transmitted, the signal transmission interface element 3 receives the first test signal from the terminal device and transmits it to the first card slot 1. Simultaneously, the signal transmission interface element 3 receives the second test signal from the terminal device and transmits it to the second card slot 2. Therefore, when the first network card is inserted into the first card slot 1 and the second network card is inserted into the second card slot 2, both network cards are tested simultaneously. That is, the first network card responds to the first test signal, performs the test, and sends back a first response signal; the second network card responds to the second test signal, performs the test, and sends back a second response signal. The first response signal can indicate that the PCIe card is functioning normally or abnormally. If the first network card detects a complete and normal signal after responding to the first test signal, the first response signal indicates that the PCIe card is functioning normally; if the first network card detects an abnormal signal after responding to the first test signal, the first response signal indicates that the PCIe card is malfunctioning. Similarly, the second response signal can indicate that the CNVI card is functioning normally or abnormally. If the second network card detects a complete and normal signal after responding to the second test signal, the second response signal indicates that the CNVI card is functioning normally; if the second network card detects an abnormal signal after responding to the second test signal, the second response signal indicates that the CNVI card is malfunctioning.Understandably, since the terminal device will send two test signals at the same time, when one of the first network cards or the second network card is inserted into the corresponding card slot, the network card can also be tested separately.

[0043] It should be noted that, referring to Figure 3 As shown, taking PCIe card data reception as an example, the electrical signal passes through the Radio Frequency Integrated Circuit (RFIC), Analog-to-Digital / Digital-to-Analog (AD / DA), Baseband Filter (BBFilter), Wireless Modem (BB Modem), and Media Access Control (MAC) modules from left to right. Figure 2 As can be seen, compared to PCIe cards, CNVI cards lack a MAC module for Wireless Fidelity (WiFi) and both a MAC and BB Modem module for Bluetooth (BT). These missing components are integrated into a System-on-Chip (SOC). These missing modules would normally have multiple pins for signal transmission between the card and the SOC. This results in different locations and numbers of signal-related pins on the two different types of WLAN cards, creating the opportunity for PCIe and CNVI cards to be used independently simultaneously.

[0044] In summary, because the test fixture of this disclosure includes a signal transmission interface element 3 and a first slot 1 and a second slot 2 connected to the signal transmission interface element 3, the test fixture can be plugged into the test interface of the terminal device through the signal transmission interface element 3. It then transmits the first test signal and the second test signal simultaneously emitted by the terminal device to the first slot 1 and the second slot 2 respectively. This allows for simultaneous testing of the first network card and the second network card based on the first and second test signals, and provides corresponding first and second response signals. Therefore, this solves the problem of incomplete testing and potential quality issues caused by neglecting the type of WLAN card during WLAN function testing of computer products. Furthermore, compared to testing different types of WLAN cards in a single slot, it saves the required power-on / off waiting time and the process time used for repetitive function testing, thus improving testing efficiency.

[0045] Reference Figure 2As shown, in one embodiment, the signal transmission interface element 3 includes a first connection end 31, a second connection end 32 and a third connection end 33. The first connection end 31 is connected to the first card slot 1, the second connection end 32 is connected to the second card slot 2, and the third connection end 33 is used to plug into the test interface.

[0046] In this embodiment, the first connection terminal 31 is connected to the first card slot 1, and receives a first test signal from the third connection terminal 33 and transmits the first test signal to the first card slot 1; the second connection terminal 32 is connected to the second card slot 2, and receives a second test signal from the third connection terminal 33 and transmits the second test signal to the second card slot 2. It should be noted that the third connection terminal 33 is the end that plugs into the test interface. The third connection terminal 33 has multiple pins, which can be divided into at least two groups. One group of pins is used to receive the first test signal from the terminal device, and the other group of pins is used to receive the second test signal from the terminal device, thereby ensuring that the first test signal and the second test signal are transmitted to the first connection terminal 31 and the second connection terminal 32 respectively through the corresponding internal lines of the signal transmission interface element 3.

[0047] Specifically, in one embodiment, the third connection terminal 33 includes a first pin group and a second pin group. The first pin group is connected to the first connection terminal 31 through a first path, and the second pin group is connected to the second connection terminal 32 through a second path. The first pin group and the second pin group include at least one pin, and the pins in the first pin group and the second pin group are different.

[0048] Furthermore, in one embodiment, the first pin group receives a first test signal through a test interface and transmits the first test signal to the first connection terminal 31 through a first path. The first connection terminal 31 receives a first response signal from the first network card through the first card slot 1 and transmits it to the first pin group. The second pin group receives a second test signal through a test interface and transmits the second test signal to the second connection terminal 32 through a second path. The second connection terminal 32 receives a second response signal from the second network card through the second card slot 2 and transmits it to the second pin group.

[0049] In this embodiment, the first pin group is used to receive the first test signal from the terminal device. Since the first pin group is connected to the first connection terminal 31 through the first path, after receiving the first test signal from the test interface, the first pin group transmits the first test signal to the first connection terminal 31 through the first path. Since the first connection terminal 31 is connected to the first card slot 1, the first test signal continues to be transmitted to the first card slot 1. If a first network card is inserted in the first card slot 1, the first network card will respond to the first test signal to perform the test. After the test, it will send back a first response signal. The first response signal returns along the original path and is received by the first card slot 1, and continues to be transmitted to the first pin group through the first connection terminal 31 to complete the test process of the first network card. Similarly, the second pin group is used to receive the second test signal from the terminal device. Since the second pin group is connected to the second connection terminal 32 through the second path, after receiving the second test signal from the test interface, the second pin group transmits the second test signal to the second connection terminal 32 through the second path. Since the second connection terminal 32 is connected to the second card slot 2, the second test signal continues to be transmitted to the second card slot 2. If a second network card is inserted into the second card slot 2, the second network card will respond to the second test signal to perform the test, and after the test, it will send back a second response signal. The second response signal returns along the original path and is received by the second card slot 2, and then continues to be transmitted to the second pin group through the second connection terminal 32, completing the testing process of the second network card. It is understandable that the first test signal and the second test signal are not the same; therefore, the names and functions of the pins in the first pin group and the pins in the second pin group are also different, ensuring that the two pin groups can receive the corresponding test signals.

[0050] In one embodiment, the first connection terminal 31 includes a third pin group and a fourth pin group, and the first slot 1 includes a first connection group 11 corresponding to the third pin group and a second connection group 12 corresponding to the fourth pin group. The third and fourth pin groups each include multiple pins, and these multiple pins are different from each other. The first connection group 11 and the second connection group 12 each include multiple pins, and these multiple pins are different from each other; each of the multiple pins is connected in a one-to-one correspondence.

[0051] In this embodiment, the third pin group is connected to the first connection group 11 in the first card slot 1, and the fourth pin group is connected to the second connection group 12 in the first card slot 1. Since the names of the multiple pins in the third pin group and the fourth pin group are different, and the functions of each pin are also different, the first connection terminal 31 can output the first test signal as different instructions based on the differences of each pin in the first connection terminal 31 after receiving the first test signal, and these instructions are received by the corresponding pins in the first connection group 11 and the second connection group 12.

[0052] Further, in one possible embodiment, the first test signal includes a first test command and a second test command, and the first response signal includes a first response command and a second response command. The third pin group receives the first test command and transmits it to the first network card through the first connection group 11, and the first connection group 11 receives the first response command and transmits it to the third pin group; the fourth pin group receives the second test command and transmits it to the first network card through the second connection group 12, and the second connection group 12 receives the second response command and transmits it to the fourth pin group.

[0053] In this embodiment, since the first test signal is used to test whether the PCIe card functions properly, the first test command and the second test command can respectively test the specific functions of the PCIe card, such as testing functions including but not limited to connection functions, data transmission functions, power management functions, or interrupt functions. The third pin group is used to transmit the first test command to the first connection group 11, and the fourth pin group is used to transmit the second test command to the second connection group 12. If a first network card is inserted into the first card slot 1, the first network card will respond to the first test command to perform the test, and after the test, it will send back a first response command. The first response command returns along the original path and is received by the first connection group 11, and continues to be transmitted to the first pin group through the third pin group to complete the first test command. At the same time as performing the first test command, the first network card will respond to the second test command to perform the test, and after the test, it will send back a second response command. The second response command returns along the original path and is received by the second connection group 12, and continues to be transmitted to the first pin group through the fourth pin group to complete the second test command.

[0054] In one embodiment, the second connection terminal 32 includes a fifth pin group and a sixth pin group, and the second slot 2 includes a third connection group 21 corresponding to the fifth pin group and a fourth connection group 22 corresponding to the sixth pin group. The fifth and sixth pin groups each include multiple pins, and these multiple pins are different from each other. The third and fourth connection groups 21 and 22 each include multiple pins, and these multiple pins are different from each other; each pin is connected to the other pin in a one-to-one correspondence.

[0055] In this embodiment, the fifth pin group is connected to the third connection group 21 in the second card slot 2, and the sixth pin group is connected to the fourth connection group 22 in the second card slot 2. Since the names of the multiple pins in the fifth pin group and the sixth pin group are different, and the functions of each pin are also different, the second connection terminal 32 can output the second test signal as different instructions based on the differences of each pin in the second connection terminal 32 after receiving the second test signal, and these instructions are received by the corresponding pins in the third connection group 21 and the fourth connection group 22.

[0056] Furthermore, in one possible embodiment, the second test signal includes a third test command and a fourth test command, and the second response signal includes a third response command and a fourth response command. The fifth pin group receives the third test command and transmits it to the second network card through the third connection group 21; the third connection group 21 receives the third response command and transmits it to the fifth pin group; the sixth pin group receives the fourth test command and transmits it to the second network card through the fourth connection group 22; the fourth connection group 22 receives the fourth response command and transmits it to the sixth pin group.

[0057] In this embodiment, since the second test signal is used to test whether the CNVI card functions properly, the third and fourth test commands can respectively test specific functions of the CNVI card, such as testing functions including but not limited to connection functions, data transmission functions, power management functions, or interrupt functions. The fifth pin group is used to transmit the third test command to the third connection group 21, and the sixth pin group is used to transmit the fourth test command to the fourth connection group 22. If a second network card is inserted into the second card slot 2, the second network card will perform the test in accordance with the third test command, and after the test, it will send back a third response command. The third response command will return along the original path and be received by the third connection group 21, and will continue to be transmitted to the second pin group through the fifth pin group to complete the third test command. At the same time as performing the third test command, the second network card will respond to the fourth test command to perform the test, and after the test, it will send back a fourth response command. The fourth response command will return along the original path and be received by the fourth connection group 22, and will continue to be transmitted to the second pin group through the sixth pin group to complete the fourth test command.

[0058] Reference Figure 4 and Figure 5 As shown, in one possible implementation, a first test instruction is used to instruct the testing of the communication function of the first network interface card (NIC) based on a first communication protocol; a second test instruction is used to instruct the testing of the communication function of the first NIC based on a second communication protocol; a third test instruction is used to instruct the testing of the communication function of the second NIC based on a third communication protocol; and a fourth test instruction is used to instruct the testing of the communication function of the second NIC based on a fourth communication protocol. The first and third communication protocols may be the same or different, and the second and fourth communication protocols may be the same or different.

[0059] In this embodiment, the first, second, third, and fourth communication protocols can all be either WiFi or BitTorrent (BT) communication protocols. However, these two communication protocols cannot be repeated for the same network card. Therefore, assuming the first communication protocol is WiFi, the second communication protocol is BT communication. The third communication protocol is a communication protocol based on the second network card, so it can be the same as or different from the first communication protocol. That is, the third communication protocol is either WiFi or BT communication. Then, the fourth communication protocol is a different communication protocol from the third. In the embodiments shown in this disclosure, the first test instruction specifically tests whether the BT function of the PCIE card is normal, the second test instruction specifically tests whether the WiFi function of the PCIE card is normal, the third test instruction specifically tests whether the BT function of the CNVI card is normal, and the fourth test instruction specifically tests whether the WiFi function of the CNVI card is normal. The signal transmission interface element 3 includes multiple pins, which are sequentially PIN1, PIN2, PIN3...PIN74 and PIN75, as shown below. Figure 4 The diagram shows the usage instructions for the 3-pin signal transmission interface element of PCIe and CNVI cards. It can be seen that PCIe cards use PIN3 and PIN5 for BT communication, and PIN35, PIN37, PIN41, PIN43, PIN47, and PIN49 for WiFi communication. That is, the third pin group includes PIN3 and PIN5, and the fourth pin group includes PIN35, PIN37, PIN41, PIN43, PIN47, and PIN49. These pins are not used in CNVI cards. Similarly, CNVI cards use PIN9, PIN11, PIN15, PIN17, PIN21, and PIN23 for BT communication, and PIN59, PIN61, PIN65, PIN67, PIN71, and PIN73 for WiFi communication. That is, the fifth pin group includes PIN9, PIN11, PIN15, PIN17, PIN21, and PIN23, and the sixth pin group includes PIN59, PIN61, PIN65, PIN67, PIN71, and PIN73. These pins are not used in PCIe cards.

[0060] This disclosure also provides a testing system, including a terminal device having a testing interface, and the testing system further includes a testing fixture as described in any of the above embodiments, the testing fixture being plugged into the testing interface.

[0061] In this embodiment, the terminal device is a computer product with a test interface compatible with PCIe and CNVI cards. Therefore, by plugging the test fixture into the test interface, the corresponding test signals can be transmitted to the corresponding card slot via the signal transmission interface element 3. In actual testing, only a specific version of the computer software (Basic Input Output System, or BIOS) needs to be flashed onto the terminal device to enable the simultaneous operation of the first and second network cards. Therefore, the test system of this disclosure, including the terminal device and the test fixture plugged into the test interface, simultaneously tests the first and second network cards based on the first and second test signals and feeds back corresponding first and second response signals. This solves the problem of incomplete testing and potential quality issues caused by neglecting the type of WLAN card during WLAN function testing of computer products. Furthermore, compared to testing different types of WLAN cards in a single card slot, it saves the required power-on / off waiting time and the process time used for repetitive function testing, thus improving testing efficiency.

[0062] In the description of this disclosure, it should be understood that the orientation or positional relationship indicated by directional terms is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this disclosure and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this disclosure; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0063] For ease of description, spatial relative terms such as "above," "over," "on the upper surface of," and "above" are used herein to describe the spatial positional relationship between one or more components or features shown in the figures and other components or features. It should be understood that spatial relative terms include not only the orientation of the component as depicted in the figures but also different orientations during use or operation. For example, if the components in the figures are inverted as a whole, "above" or "above other components or features" will include cases where the component is "below" or "under" other components or features. Thus, the exemplary term "above" can include both "above" and "below." Furthermore, these components or features may also be positioned at other different angles (e.g., rotated 90 degrees or other angles), and this document intends to include all such cases.

[0064] It should be noted that the terminology used herein is for the purpose of describing particular implementations only and is not intended to limit the exemplary implementations according to this disclosure. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms “comprising” and / or “including” are used in this specification, they indicate the presence of features, steps, operations, parts, components, and / or combinations thereof.

[0065] It should be noted that the terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this disclosure described herein can be implemented in sequences other than those illustrated or described herein.

[0066] This disclosure has been described through the above embodiments; however, it should be understood that the above embodiments are for illustrative purposes only and are not intended to limit this disclosure to the described embodiments. Furthermore, those skilled in the art will understand that this disclosure is not limited to the above embodiments, and many more variations and modifications can be made based on the teachings of this disclosure, all of which fall within the scope of protection claimed by this disclosure. The scope of protection of this disclosure is defined by the appended claims and their equivalents.

Claims

1. A test fixture, characterized in that, It includes a signal transmission interface element (3) and a first slot (1) and a second slot (2) connected to the signal transmission interface element (3); The signal transmission interface element (3) is configured to be plugged into the test interface of the terminal device. The signal transmission interface element (3) is used to receive a first test signal from the terminal device and transmit the first test signal to the first card slot (1) and to receive a second test signal from the terminal device and transmit the second test signal to the second card slot (2). The first card slot (1) is used for inserting the first network card so that the first network card responds to the first test signal to perform the test and feed back the first response signal; The second card slot (2) is used for inserting the second network card so that the second network card responds to the second test signal to perform the test and feed back the second response signal.

2. The test fixture according to claim 1, characterized in that, The signal transmission interface element (3) includes a first connection end (31), a second connection end (32) and a third connection end (33). The first connection end (31) is connected to the first card slot (1), the second connection end (32) is connected to the second card slot (2), and the third connection end (33) is plugged into the test interface.

3. The test fixture according to claim 2, characterized in that, The third connection terminal (33) includes a first pin group and a second pin group. The first pin group is connected to the first connection terminal (31) through a first path, and the second pin group is connected to the second connection terminal (32) through a second path. The first pin group and the second pin group each include at least one pin, and the pins in the first pin group and the second pin group are different.

4. The test fixture according to claim 3, characterized in that, The first pin group receives the first test signal through the test interface and transmits the first test signal to the first connection terminal (31) through the first channel. The first connection terminal (31) receives the first response signal of the first network card through the first card slot (1) and transmits it to the first pin group. The second pin group receives the second test signal through the test interface and transmits the second test signal to the second connection terminal (32) through the second path. The second connection terminal (32) receives the second response signal of the second network card through the second card slot (2) and transmits it to the second pin group.

5. The test fixture according to claim 2, characterized in that, The first connection end (31) includes a third pin group and a fourth pin group, and the first slot (1) includes a first connection group (11) corresponding to the third pin group and a second connection group (12) corresponding to the fourth pin group. The third pin group and the fourth pin group include multiple pins, and the multiple pins in the third pin group and the fourth pin group are different; The first connection group (11) and the second connection group (12) include multiple pins. The multiple pins in the first connection group (11) and the second connection group (12) are different, and the multiple pins and multiple pins are connected one-to-one.

6. The test fixture according to claim 5, characterized in that, The first test signal includes a first test command and a second test command, and the first response signal includes a first response command and a second response command; The third pin group receives the first test command and transmits it to the first network card through the first connection group (11); the first connection group (11) receives the first response command and transmits it to the third pin group. The fourth pin group receives the second test command and transmits it to the first network card through the second connection group (12). The second connection group (12) receives the second response command and transmits it to the fourth pin group.

7. The test fixture according to claim 6, characterized in that, The second connection end (32) includes a fifth pin group and a sixth pin group, and the second slot (2) includes a third connection group (21) corresponding to the fifth pin group and a fourth connection group (22) corresponding to the sixth pin group. The fifth pin group and the sixth pin group include multiple pins, and the multiple pins in the fifth pin group and the sixth pin group are different; The third connection group (21) and the fourth connection group (22) include multiple pins. The multiple pins in the third connection group (21) and the fourth connection group (22) are different, and the multiple pins and multiple pins are connected one-to-one.

8. The test fixture according to claim 7, characterized in that, The second test signal includes a third test command and a fourth test command, and the second response signal includes a third response command and a fourth response command; The fifth pin group receives the third test command and transmits it to the second network card through the third connection group (21); the third connection group (21) receives the third response command and transmits it to the fifth pin group. The sixth pin group receives the fourth test command and transmits it to the second network card through the fourth connection group (22). The fourth connection group (22) receives the fourth response command and transmits it to the sixth pin group.

9. The test fixture according to claim 8, characterized in that, The first test instruction is used to instruct the communication function of the first network card based on the first communication protocol to be tested, and the second test instruction is used to instruct the communication function of the first network card based on the second communication protocol to be tested. The third test instruction is used to instruct the second network card to test its communication function based on the third communication protocol, and the fourth test instruction is used to instruct the second network card to test its communication function based on the fourth communication protocol. The first communication protocol may be the same as or different from the third communication protocol, and the second communication protocol may be the same as or different from the fourth communication protocol.

10. A testing system, comprising a terminal device having a testing interface, characterized in that, The testing system is further provided with a testing fixture as described in any one of claims 1-9, the testing fixture being plugged into the testing interface.

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