Battery sheet testing apparatus, battery sheet, and photovoltaic module

Abstract

The utility model provides a kind of battery piece testing device, battery piece and photovoltaic module, it is related to photovoltaic technical field.Battery piece testing device includes: test board and multiple current contact protrusions and multiple voltage contact protrusions block integrated on test board;The number of current contact protrusion is greater than the number of voltage contact protrusion block;At least part current contact protrusion point is arranged in column along first direction and forms current contact protrusion point column;The area of current protrusion contact block and voltage contact protrusion block surface away from test board is all greater than the area of current contact protrusion surface away from test board;In the side of test board, along first direction, at least one voltage contact protrusion block is located between two adjacent current contact protrusion blocks.The battery piece testing device of the application is not only easy to install, and voltage and current test are more accurate, and battery piece test basically does not bring hidden crack risk to battery piece.

Description

Technical Field

[0001] This utility model relates to the field of photovoltaic technology, and in particular to a cell testing device, a cell, and a photovoltaic module. Background Technology

[0002] When conducting IV (current-voltage) and EL (electroluminescence) tests on solar cells, a testing device must be used for the tests.

[0003] Currently, the testing equipment includes multiple probe rows, each containing multiple probes. The probes are installed inside a probe sleeve and are used to contact the pads on the solar cell for testing.

[0004] However, for gridless solar cells, if a test device including probe arrays is used, small-sized probes need to be customized, and there are thousands of probes. The small probe installation spacing makes it impossible to install probe sleeves, making probe installation difficult. Utility Model Content

[0005] This invention provides a solar cell testing device, a solar cell, and a photovoltaic module, aiming to solve the problem of difficult probe installation in existing solar cell testing devices.

[0006] A first aspect of this utility model provides a battery cell testing device, comprising:

[0007] The test board includes multiple current contact protrusions and multiple voltage contact protrusions integrated on the test board; both the current contact protrusions and the voltage contact protrusions protrude from the test board; the voltage contact protrusions and the current contact protrusions are respectively used to contact the voltage test section and the current test section on the battery cell; the number of current contact protrusions is greater than the number of voltage contact protrusions.

[0008] The plurality of current contact bumps include: a plurality of current contact bump points and a plurality of current bump contact blocks; at least some of the current contact bump points are arranged in a row along a first direction to form a current contact bump point row; the area of ​​the current bump contact blocks and the voltage contact bump blocks facing away from the surface of the test board is greater than the area of ​​the current contact bump points facing away from the surface of the test board.

[0009] On one side of the test board, along the first direction, at least one of the voltage contact bumps is located between two adjacent current contact bumps.

[0010] In this application, current contact bumps and voltage contact bumps are integrated into a single test board. This allows for both IV and EL testing of the solar cell to be performed on a single board. The test board is integrally molded, simplifying installation and solving the technical problem of difficult probe installation in existing testing fixtures. Furthermore, the number of current contact bumps is greater than the number of voltage contact bumps. The greater number of current contact bumps results in more uniform current collection and more accurate current measurement. Meanwhile, due to the small number of voltage contact bumps, the alignment quality of each voltage contact bump with the voltage testing section on the battery cell has a significant impact on the accuracy of the voltage test. The surface of the voltage contact bump away from the test plate is the area of ​​the contact surface between the voltage contact bump and the voltage testing section. Similarly, the surface of the current contact bump away from the test plate is the area of ​​the contact surface between the current contact bump and the current testing section. In this application, the area of ​​the voltage contact bump away from the test plate is larger than the area of ​​the current contact bump away from the test plate. This indicates that the contact surface area between the voltage contact bump and the voltage testing section is larger, which not only allows for greater tolerance in the contact arrangement but also improves the contact quality between the voltage contact bump and the voltage testing section. This enhances the alignment quality between the voltage contact bump and the voltage testing section on the battery cell, thereby improving the accuracy of the voltage test. Furthermore, on one side of the test plate, along the first direction, at least one voltage contact bump... The protrusion is located between two adjacent current contact protrusions, indicating that on the same side of the test plate, at least one voltage contact protrusion is located in a relatively inward position, thus contacting the voltage testing section in the relatively inward position of the solar cell. Firstly, the quality of the inward position of the solar cell is generally better than that of the edge position. Measuring the voltage of the solar cell at the inward position minimizes interference from the cell's quality, improving the accuracy of voltage measurement. Secondly, the inward position of the solar cell has a lower risk of microcracks compared to the edge position, resulting in better contact quality between the voltage contact protrusion and the voltage testing section on the solar cell, further improving the accuracy of voltage measurement. Thirdly, the inward position of the solar cell has a lower risk of microcracks compared to the edge position, reducing the risk of microcracks during contact and minimizing the risk of microcracks during solar cell testing. In summary, the solar cell testing device of this application is not only easy to install but also provides more accurate voltage and current measurements, and virtually eliminates the risk of microcracks in the solar cells during testing.

[0011] A second aspect of this utility model provides a battery cell, comprising: a battery body and an electrode structure located on the surface of the battery body;

[0012] The electrode structure includes: multiple main grid electrodes, multiple first electrode disks, and multiple second electrode disks; at least a portion of the first electrode disks are arranged in a row along a third direction to form a first electrode disk array; the main grid electrodes extend along the third direction.

[0013] On one side of the battery body, along the third direction, at least one second electrode disk is located on a main grid electrode, and the second electrode disk also has exposed main grid electrode segments on both sides along the third direction; the total number of exposed main grid electrode segments and the first electrode disk is greater than the number of second electrode disks.

[0014] A third aspect of this utility model provides a photovoltaic module, an interconnecting element, and any of the aforementioned solar cells; the interconnecting element electrically connects the electrode structures of two adjacent solar cells.

[0015] The aforementioned cell testing device, cells, and photovoltaic modules have the same or similar beneficial effects, and will not be described again here to avoid repetition. Attached Figure Description

[0016] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments of this utility model will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figures 1 to 3 A partial structural schematic diagram of several battery cell testing devices in embodiments of this utility model is shown;

[0018] Figure 4 A partial structural schematic diagram of a battery cell according to an embodiment of the present invention is shown.

[0019] Explanation of the attached drawing numbers:

[0020] 1-Test board, 11-Positive current raised contact point, 12-Positive current raised contact block, 13-Negative current raised contact point, 14-Negative current raised contact block, 15-Positive voltage contact raised block, 16-Negative voltage contact raised block, 17-Through hole, 18-Groove, 2-Battery body, 21-Main grid electrode, 211-Main grid electrode segment, 22-First electrode disk, 23-Second electrode disk, 24-Uncut edge, 25-Fine grid electrode. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present utility model.

[0022] Figure 1 This is a partial three-dimensional schematic diagram of the first polarity current contact protrusion and the first polarity voltage contact protrusion. Figure 2 This is a partial three-dimensional schematic diagram of the second polarity flow contact protrusion and the second polarity voltage contact protrusion block. Figure 3 This is a partial top view of a solar cell testing device. Figure 4 This is a partial top-view schematic diagram of a solar cell. Of the first and second polarities shown here, one is the positive electrode and the other is the negative electrode; however, there is no specific limitation on which is positive and which is negative. For example, the first polarity here can be positive and the second polarity can be negative, or vice versa.

[0023] Reference Figures 1 to 3 This invention provides a battery cell testing device, comprising: a test plate 1 and multiple current contact protrusions and multiple voltage contact protrusions integrated on the test plate 1. The current contact protrusions and voltage contact protrusions are integrated on a single test plate, enabling both IV and EL testing of the battery cell. The test plate is integrally formed, facilitating easy installation and solving the technical problem of difficult probe installation in existing testing fixtures. The current contact protrusions may include positive current contact protrusions and negative current contact protrusions, and the voltage contact protrusions may include positive voltage contact protrusion 15 and negative voltage contact protrusion 16. The voltage contact protrusions and current contact protrusions are respectively used to contact the voltage testing section and current testing section on the battery cell, both of which contact the electrodes of the battery cell. Specifically, the positive current contact protrusion and positive voltage contact protrusion contact the positive electrode of the battery cell, and the negative current contact protrusion and negative voltage contact protrusion contact the negative electrode of the battery cell.

[0024] Reference Figure 2Both current contact bumps and voltage contact bumps protrude from the test plate to facilitate alignment and contact with the voltage and current testing sections on the solar cell. The number of current contact bumps is greater than the number of voltage contact bumps. Specifically, the greater number and wider placement of current contact bumps results in more uniform current collection and more accurate current measurement. There is no specific limit to the exact number of both; for example, there may be thousands of current contact bumps, while the number of voltage contact bumps may be only a few dozen.

[0025] The multiple current contact bumps include: multiple current contact bump points and multiple current bump contact blocks; at least some of the current contact bump points are arranged in a row along the first direction L1 to form a current contact bump point row. The specific number of current contact bump point rows in the cell testing fixture is not limited. For details, refer to... Figure 1 The positive current contact bump includes: multiple positive current contact bump points 11 and multiple positive current bump contact blocks 12; see reference. Figure 2 The negative current contact protrusion includes: multiple negative current contact protrusion points 13 and multiple negative current protrusion contact blocks 14.

[0026] The surface area of ​​both the current contact bump and the voltage contact bump away from the test board is larger than the surface area of ​​the current contact bump away from the test board. Specifically, the surface area of ​​the voltage contact bump away from the test board is the area of ​​the contact surface between the voltage contact bump and the voltage testing section; the surface area of ​​the current contact bump away from the test board is the area of ​​the contact surface between the current contact bump and the current testing section; and the surface area of ​​the current contact bump away from the test board is the area of ​​the contact surface between the current contact bump and the current testing section. Since the number of voltage contact bumps is small, the alignment quality of each voltage contact bump with the voltage testing section on the battery cell has a significant impact on the accuracy of the voltage test. In this application, the surface area of ​​the voltage contact bump away from the test board is larger than the surface area of ​​the current contact bump away from the test board, indicating that the contact surface area between the voltage contact bump and the voltage testing section is larger. This not only allows for greater tolerance in the contact arrangement but also improves the contact quality between the voltage contact bump and the voltage testing section, thus improving the alignment quality between the voltage contact bump and the voltage testing section on the battery cell and enhancing the accuracy of the voltage test.

[0027] On one side of the test board, along the first direction L1, at least one of the aforementioned voltage contact bumps is located between two adjacent current contact bumps. For example, on one side of the test board, along the first direction L1, at least one positive voltage contact bump 15 may be located between two adjacent positive current contact bumps 12; as another example, on one side of the test board, along the first direction L1, at least one negative voltage contact bump 16 may be located between two adjacent negative current contact bumps 14. The invention describes a device where at least one voltage contact protrusion is located on one side of the test plate, positioned relatively inward. This protrusion contacts the voltage testing section located relatively inward within the solar cell. Firstly, the quality of the innermost part of the solar cell is generally better than that of the edge parts. Measuring the voltage at the innermost part of the cell minimizes interference from the cell's quality, thus improving the accuracy of the voltage measurement. Secondly, the innermost part of the solar cell has a lower risk of microcracks compared to the edge parts, resulting in better contact between the voltage contact protrusion and the voltage testing section, further enhancing the accuracy of the voltage measurement. Thirdly, the innermost part of the solar cell has a lower risk of microcracks compared to the edge parts, reducing the risk of microcracks during contact between the voltage contact protrusion and the voltage testing section, thus virtually eliminating the risk of microcracks during solar cell testing. In summary, the solar cell testing device of this application is not only easy to install but also provides more accurate voltage and current measurements, and virtually eliminates the risk of microcracks in the solar cells during testing.

[0028] It should be noted that the area of ​​the current-protruding contact block and the voltage-protruding contact block facing away from the surface of the test board is greater than the area of ​​the current-protruding contact point facing away from the surface of the test board. This can mean that the area of ​​each individual current-protruding contact block and each individual voltage-protruding contact block facing away from the surface of the test board is greater than the area of ​​each individual current-protruding contact point facing away from the surface of the test board; or it can mean that the average area of ​​the multiple current-protruding contact blocks and the average area of ​​the multiple voltage-protruding contact blocks facing away from the surface of the test board are both greater than the average area of ​​the multiple current-protruding contact points facing away from the surface of the test board. Here, "multiple" refers to two or more.

[0029] In some embodiments, the test board 1 includes multiple stacked test circuit layers, with adjacent test circuit layers insulated from each other. Each stacked test circuit layer includes at least one voltage test layer and at least one current test layer, thereby making the internal conduction paths of voltage and current independent, reducing test interference and improving test reliability. The voltage test layer includes the aforementioned voltage contact bumps, and the current test layer includes the aforementioned current contact bumps. For example, the number of test circuit layers is preferably four: a positive voltage test circuit layer, a positive current test circuit layer, a negative voltage test circuit layer, and a negative current test circuit layer. By layering the positive and negative current test layers, positive and negative currents can be isolated, avoiding short circuits and interference with test data caused by contact between the positive and negative current test layers. For example, the opposing sides of two adjacent test circuit layers are covered with insulating material to achieve insulation between adjacent test circuit layers. This cell testing device is used for testing cells, specifically for IV and EL testing of cells. The cell can be a cell with a main grid, or a cell without a main grid or a cell with few main grids (e.g., ...). Figure 4 (As shown).

[0030] In some embodiments, refer to Figure 1 and Figure 2 The two adjacent current contact protrusions are connected and a groove 18 is provided between them. The voltage contact protrusion is located in the groove 18, and there is a gap between the voltage contact protrusion and the groove 18. The two adjacent current contact protrusions are connected, so that if either one fails, the current can still be conducted through the other connected current contact protrusion during current testing, improving the fault tolerance and accuracy of current measurement. The voltage contact protrusion is cleverly positioned in the groove 18, and the arrangement of the voltage test section on the battery cell that contacts the voltage contact protrusion is relatively simple. The gap between the voltage contact protrusion and the groove 18 serves as insulation, meaning that voltage testing and current testing are electrically isolated from each other, preventing mutual interference and improving test reliability. It should be noted that the size of this gap is not limited.

[0031] In some embodiments, the two adjacent current contact bumps and the voltage contact bump located between the two adjacent current contact bumps are at least partially collinear with at least one current contact bump array. Since the current contact bump array mainly extends along the first direction L1, the contact bumps and the current contact bump array are also at least partially collinear along the first direction. Firstly, the corresponding test portions on the battery cell are also at least partially collinear, resulting in minimal improvement to the electrode pattern while maintaining compatibility with the existing electrode pattern of the battery cell. Secondly, the current contact bumps and current contact bump arrays are widely and uniformly distributed along the first direction, resulting in more uniform current collection and more accurate current testing. Thirdly, the fabrication processes of the contact bumps and current contact bump arrays are also largely compatible, which can reduce the cost of the battery cell testing device.

[0032] For example, refer to Figure 1 , Figure 3 Two adjacent positive current contact bumps 12, a positive voltage contact bump 15 located between two adjacent positive current contact bumps 12, and a positive current contact bump array are at least partially collinear along the first direction L1; for example, refer to Figure 2 , Figure 3 Two adjacent negative current contact bumps 14, a negative voltage contact bump 16 located between two adjacent negative current contact bumps 14, and a negative current contact bump array are at least partially collinear along the first direction L1.

[0033] In some embodiments, refer to Figures 1 to 3The dimensions of the current-protruding contact block and the voltage-protruding contact block away from the surface of the test board in the direction parallel to the first direction L1 are both greater than the dimensions of the current-protruding contact point away from the surface of the test board in the direction parallel to the first direction L1. For example, the dimensions of the positive current-protruding contact block 12 and the negative current-protruding contact block 14 away from the surface of the test board, and the dimensions of the positive voltage-protruding contact block 15 and the negative voltage-protruding contact block 16 away from the surface of the test board in the direction parallel to the first direction L1 are both greater than the dimensions of the positive current-protruding contact point 11 and the negative current-protruding contact point 13 away from the surface of the test board in the direction parallel to the first direction L1. The dimensions of the current-protruding contact blocks and voltage-protruding contact blocks facing away from the test board in the direction parallel to the second direction are between 80% and 120% of the dimensions of the current-protruding contact points facing away from the test board in the direction parallel to the second direction. That is, the dimensions of the positive current-protruding contact block 12 and the negative current-protruding contact block 14 facing away from the test board, and the dimensions of the positive voltage-protruding contact block 15 and the negative voltage-protruding contact block 16 facing away from the test board in the direction parallel to the second direction L2 are approximately equal to the dimensions of the positive current-protruding contact point 11 and the negative current-protruding contact point 13 facing away from the test board in the direction parallel to the second direction L2. The resistance of the current collection points in the direction parallel to the second direction L2 is approximately equal, the current collection is more uniform, and the current measurement is more accurate. Furthermore, the aforementioned current-protruding contact blocks and voltage-protruding contact blocks facing away from the test board can be obtained by simply having larger dimensions in the direction parallel to the first direction, while having approximately equal dimensions in the direction parallel to the second direction, and the process is generally compatible. The second direction L2 and the first direction L1 are perpendicular to each other and both are perpendicular to the thickness direction of the test plate.

[0034] The dimensions of the surfaces of the current-protruding contact blocks and voltage-protruding contact blocks facing away from the test board in the direction parallel to the first direction L1 are all greater than the dimensions of the surfaces of the current-protruding contact points facing away from the test board in the direction parallel to the first direction L1. Specifically, this can mean that the dimensions of the surfaces of each current-protruding contact block and each voltage-protruding contact block facing away from the test board in the direction parallel to the first direction L1 are all greater than the dimensions of the surfaces of each current-protruding contact point facing away from the test board in the direction parallel to the first direction L1; or it can mean that the average dimensions of the surfaces of the current-protruding contact blocks facing away from the test board in the direction parallel to the first direction L1 and the average dimensions of the surfaces of the voltage-protruding contact blocks facing away from the test board in the direction parallel to the first direction L1 are all greater than the average dimensions of the surfaces of the current-protruding contact points facing away from the test board in the direction parallel to the first direction L1. The dimensions of the current-protruding contact blocks and voltage-protruding contact blocks away from the surface of the test plate in the direction parallel to the second direction are between 80% and 120% of the dimensions of the current-protruding contact points away from the surface of the test plate in the direction parallel to the second direction. Specifically, this can mean that the dimensions of each of the multiple current-protruding contact blocks and each of the multiple voltage-protruding contact blocks away from the surface of the test plate in the direction parallel to the second direction L2 are all between 80% and 120% of the dimensions of each of the multiple current-protruding contact points away from the surface of the test plate in the direction parallel to the second direction L2; or specifically, this can mean that the average dimensions of the multiple current-protruding contact blocks and the average dimensions of the multiple voltage-protruding contact blocks away from the surface of the test plate in the direction parallel to the second direction L2 are both between 80% and 120% of the average dimensions of the multiple current-protruding contact points away from the surface of the test plate in the direction parallel to the second direction L2. Here, "multiple" refers to two or more.

[0035] For example, the dimensions of the current contact bump and voltage contact bump away from the surface of the test plate in the direction parallel to the second direction can be 80%, 82%, 85%, 86%, 88%, 89%, 90%, 92%, 93%, 95%, 98%, 100%, 105%, 110%, 115%, or 120% of the dimensions of the current contact bump away from the surface of the test plate in the direction parallel to the second direction.

[0036] In some embodiments, the height difference between the surfaces of all current contact protrusions and voltage contact protrusions on the same side of the test plate and the surface of the test plate is less than or equal to 5 μm. This means that the height difference between the highest and lowest surfaces among all current contact protrusions and voltage contact protrusions on the same side of the test plate and the surfaces of the protrusions facing away from the test plate is less than or equal to 5 μm. Specifically, during the testing process, the surfaces of all current contact protrusions and voltage contact protrusions on the same side of the test plate and the surfaces of the test plates facing away from the battery body need to contact each current testing section and voltage testing section on the same surface of the battery cell. All testing sections on the same surface of the battery cell mainly refer to the electrodes on the same surface of the battery cell. The electrodes on the same surface of the battery cell are usually roughly flush with the surface of the battery body. Therefore, the height difference between the surfaces of all current contact protrusions and voltage contact protrusions on the same side of the test plate and the surface of the test plate is small, within 5 μm. During the process of all current contact protrusions and voltage contact protrusions on the same side of the test plate contacting each other with the corresponding test portions on the same surface of the battery cell away from the battery body, under the same pressure, the degree of contact between each current contact protrusion and voltage contact protrusion on the same side of the test plate and the corresponding test portions on the same surface of the battery cell away from the battery body is roughly similar. This allows all current contact protrusions and voltage contact protrusions on the same side of the test plate to make more sufficient contact with all test portions on the same surface of the battery cell, and also avoids battery cell cracking.

[0037] For example, the height difference between all current contact bumps and all voltage contact bumps protruding from the same side of the test board and the surface of the test board can be 0, 0.1μm, 0.3μm, 0.5μm, 0.8μm, 0.9μm, 1μm, 0.1μm, 1.2μm, 1.5μm, 1.8μm, 2μm, 2.2μm, 2.5μm, 2.7μm, 3μm, 3.2μm, 3.3μm, 3.5μm, 3.8μm, 4μm, 4.1μm, 4.3μm, 4.5μm, 4.8μm, and 5μm.

[0038] In some embodiments, along the first direction L1, the test plate includes two opposing first edges; along the second direction L2, the test plate includes two opposing second edges and a first intermediate portion located between the two second edges, wherein the aforementioned two adjacent current contact protrusions are located at the first edges and the first intermediate portion. The number of voltage contact protrusions is relatively small, and the placement of the voltage contact protrusions has a significant impact on the accuracy of voltage measurement. In other words, along the first direction L1, the two adjacent current contact bumps are located at the edge of the test plate, but along the second direction L2, the two adjacent current contact bumps are located in the middle of the test plate. Consequently, the fewer voltage contact bumps are also roughly located in the first middle part along the second direction L2. Along the edge of the first direction L1, the voltage test block on the cell corresponding to the voltage contact bump is also roughly located in the first middle part along the second direction L2. Along the edge of the first direction L1, one edge of the cell along the first direction L1 is usually a slice location. Since slicing leads to a loss of passivation performance, measuring the voltage at this location will result in inaccurate measurements. Therefore, in this application, voltage measurement can be specifically staggered from the slice location, which can improve the accuracy of voltage measurement. Simultaneously, along the second direction L2, the placement of the voltage contact bumps is also staggered from the second edge location, avoiding measurement errors caused by cell quality defects at the second edge location, thus improving the voltage measurement accuracy. Similar to the above, it also reduces the risk of microcracks in the cell and improves the contact quality of the voltage contact bumps, further improving the voltage measurement accuracy. Furthermore, the current contact protrusions and voltage contact protrusions have relatively large areas facing away from the surface of the test plate. These contact protrusions are all located at the edge of the test plate along the first direction L1. Therefore, the test section, i.e., the electrode, which matches the position of the contact protrusions, is also located at the edge of the solar cell along the first direction L1, which can reduce light shading and improve the photoelectric performance of the solar cell. The relative relationship between the second direction L2 and the first direction L1 is as described above and will not be repeated here.

[0039] For example, refer to Figure 3 , Figure 3 The lower edge of the test board 1 is one of the first edges, and the left edge is one of the second edges. Along the first direction L1, the two adjacent current contact bumps and the voltage contact bump between the two adjacent current contact bumps are located at the edge of the test board. However, along the second direction L2, the two adjacent current contact bumps and the voltage contact bump between the two adjacent current contact bumps are located in the middle of the test board.

[0040] In some embodiments, refer to Figure 3At least one current contact protrusion row and at least one current contact protrusion block are at least partially collinear to form a current contact protrusion row. Since the extension direction of the current contact protrusion row is a first direction L1, at least one current contact protrusion row and at least one current contact protrusion block are at least partially collinear along the first direction L1 to form a current contact protrusion row. Along the second direction L2, the test plate includes: two opposing second edges, and a first intermediate portion located between the two second edges. The number of current contact protrusions in a current contact protrusion row at the second edge position is less than the number of current contact protrusions in a current contact protrusion row at the first intermediate portion position. Specifically, in battery cell testing devices, the voltage contact protrusions and current contact protrusions typically need to achieve good contact with the voltage and current testing sections on the battery cell through vacuum adsorption or other methods. Since the second edge position has more connections to the outside world, the vacuum adsorption effect at the second edge position may not be as good as that at the first middle position. Therefore, a relatively small number of current contact protrusions are set in the row of current contact protrusions at the second edge position to avoid measurement errors caused by poor contact between the current contact protrusions and the current testing sections on the battery cell, and to avoid wasting current contact protrusions. At the same time, at the second edge position, the current collection range of the current testing section corresponding to one row of current contact protrusions on the battery cell is approximately half that at the first middle position. Therefore, appropriately reducing the number of current contact protrusions in the row of current contact protrusions at the second edge position has little impact on the accuracy of current measurement.

[0041] In some embodiments, the battery cell testing device further includes a vacuum adsorption plate, with a test plate 1 disposed on the vacuum adsorption plate. The vacuum adsorption plate has multiple adsorption holes, and the test plate 1 has through holes 17 corresponding to each of the multiple adsorption holes. The test plate 1 can be glued to the vacuum adsorption plate or bolted to it. The vacuum adsorption plate is connected to a vacuum adsorption connector, which is connected to an external vacuum generator. The external vacuum generator is used to evacuate the vacuum adsorption plate so that it adsorbs the battery cells.

[0042] In this application, the term "first intermediate position column of current contact bumps" can refer to the column of current contact bumps closest to the midpoint of the test board in the second direction L2, or it can refer to all current contact bump columns other than the column of current contact bumps closest to the edge in the second direction L2. When "first intermediate position column of current contact bumps" refers to all current contact bump columns other than the column of current contact bumps closest to the edge in the second direction L2, the number of such columns can refer to the number of any column of current contact bumps other than the column of current contact bumps closest to the edge in the second direction L2, or it can be the average number of multiple columns of current contact bumps other than the column of current contact bumps closest to the edge in the second direction L2. Here, "multiple columns" means two or more columns.

[0043] In some embodiments, refer to Figure 3At least one current contact protrusion column and at least one current contact protrusion block are at least partially collinear to form a current contact protrusion column along a second direction L2. The test plate includes: two opposing second edges and a first intermediate portion located between the two second edges. The total dimension of the current contact protrusions in the column of current contact protrusions at the second edge position along the first direction L1 is smaller than the total dimension of the current contact protrusions in the column of current contact protrusions at the first intermediate portion position along the first direction L1. As mentioned earlier, the vacuum adsorption effect at the second edge position may not be as good as that at the first middle position. Therefore, relatively small current contact protrusions are set in the current contact protrusion row at the second edge position to avoid measurement errors caused by poor contact between the current contact protrusions at the second edge position and the current testing section on the battery cell, as well as the waste of current contact protrusions. At the same time, at the second edge position, the current collection range of the current testing section on the battery cell corresponding to the current contact protrusion row is approximately half that at the first middle position. Therefore, appropriately reducing the size of the current contact protrusions in the current contact protrusion row at the second edge position will not have a significant impact on the accuracy of current measurement. The total size of the current contact protrusions in the current contact protrusion row along the first direction L1 refers to the sum of the sizes of each current contact protrusion in the current contact protrusion row along the first direction L1. In the case where a single row of current contact bumps at the first intermediate position refers to any of the remaining rows of current contact bumps excluding the row closest to the edge in the second direction L2, the total dimension of this row of current contact bumps along the first direction L1 in this application can refer to the total dimension of any row of current contact bumps excluding the row closest to the edge in the second direction L2 along the first direction L1, or the average of the total dimensions of multiple rows of current contact bumps along the first direction L1 excluding the row closest to the edge in the second direction L2. Here, "multiple rows" refers to two or more rows.

[0044] In some embodiments, refer to Figure 3The number of current contact protrusions in the second edge row is less than the number of current contact protrusions in the first middle row. Specifically, the surface area of ​​the current contact protrusions facing away from the test plate is larger than that of the current contact protrusion points. Therefore, the current contact protrusions usually require greater adsorption force to make sufficient contact with the current testing part on the battery cell. Since the vacuum adsorption effect at the second edge may not be as good as that at the first middle position, the adsorption effect of the current contact protrusions at the second edge may be weaker. Therefore, a relatively small number of current contact protrusions are set in the second edge row to avoid measurement errors and waste of current contact protrusions caused by poor contact between the current contact protrusions at the second edge and the current testing part on the battery cell. In the case where a single row of current contact bumps at the first intermediate position can refer to any of the remaining rows of current contact bumps excluding the row closest to the edge in the second direction L2, the number of such a row of current contact bumps at the first intermediate position can refer to the number of any row of current contact bumps in any of the remaining rows of current contact bumps excluding the row closest to the edge in the second direction L2, or the average number of multiple rows of current contact bumps in any of the remaining rows of current contact bumps excluding the row closest to the edge in the second direction L2. Here, "multiple rows" means two or more rows.

[0045] For example, Figure 3 In the middle, the left edge is the second edge. In the column of current contact protrusions at the second edge, the number of positive current contact protrusions 12 at the lower position is relatively small, while in the column of current contact protrusions at the first middle position, the number of current contact protrusions at the lower position is relatively large.

[0046] In some embodiments, refer to Figure 3 The total dimension of the current contact protrusions along the first direction L1 in the row of current contact protrusions at the second edge position is smaller than the total dimension of the current contact protrusions along the first direction L1 in the row of current contact protrusions at the first middle position. Specifically, as mentioned earlier, the vacuum adsorption effect at the second edge position may not be as good as that at the first middle position, and the adsorption effect of the current contact protrusions at the second edge position may be weaker. Therefore, relatively small-sized current contact protrusions are set in the row of current contact protrusions at the second edge position to avoid measurement errors and waste of current contact protrusions caused by poor contact between the current contact protrusions at the second edge position and the current testing part on the battery cell. The method for determining the total dimension of the current contact protrusions along the first direction L1 in the row of current contact protrusions here is similar to the method for determining the total dimension of the current contact protrusions along the first direction L1 in the row of current contact protrusions mentioned above, and will not be repeated here to avoid repetition.

[0047] In some embodiments, refer to Figure 3 The distance d1 between the voltage contact protrusion and the innermost current contact protrusion along the first direction L1 among the two adjacent current contact protrusions is less than or equal to the dimension d2 of the six current contact protrusions arranged sequentially in the current contact protrusion row and the spacing between them along the first direction L1. That is, the distance d1 between the voltage contact protrusion and the innermost current contact protrusion along the first direction L1 among the two adjacent current contact protrusions is smaller, and the voltage contact protrusion is farther from the edge. As mentioned earlier, this avoids measurement errors caused by quality defects in the battery cell at the edge, improves the accuracy of voltage measurement, reduces the risk of microcracks in the battery cell, and improves the contact quality of the voltage contact protrusion, further improving the accuracy of voltage measurement. (Refer to...) Figure 3 Here, the distance d1 between the voltage contact bump and the innermost current contact bump can be the distance between the centerline of the voltage contact bump in the first direction L1 and the centerline of the innermost current contact bump in the first direction L1; d2 can be the distance between the centerline of the first current contact bump in the first direction L1 and the centerline of the last current contact bump in the first direction L1 among the six current contact bumps arranged sequentially in the row of current contact bumps. This relationship applies to every single voltage contact bump. For example, d1 can be the dimension along the first direction L1 of 6 current contact bumps arranged in sequence and the spacing between them, 5 current contact bumps arranged in sequence and the spacing between them, 4 current contact bumps arranged in sequence and the spacing between them, 3 current contact bumps arranged in sequence and the spacing between them, 2 current contact bumps arranged in sequence and the spacing between them, 1 current contact bump and the spacing between two adjacent current contact bumps, etc.

[0048] In some embodiments, the number of voltage contact bumps in the cell testing device is less than or equal to 8. Specifically, the voltage contact bumps in the cell testing device only need to include both positive and negative voltage contact bumps to meet the voltage testing requirements. This allows more testing space on the cell to be allocated to current contact bumps, resulting in a more uniform distribution of current contact bumps, more even current collection, and more accurate current measurement. For example, the number of voltage contact bumps in the cell testing device can be 8, 6, 4, or 2.

[0049] In some embodiments, the voltage contact bumps include: positive voltage contact bumps 15 and negative voltage contact bumps 16; the number of positive voltage contact bumps 15 and the number of negative voltage contact bumps 16 are both less than or equal to 4. By allocating more testing space on the solar cell to the current contact bumps, the current contact bumps are more evenly distributed, current collection is more uniform, and current measurement is more accurate. For example, the number of positive voltage contact bumps 15 and negative voltage contact bumps 16 in the solar cell testing device can be 4, 3, 2, or 1.

[0050] In some embodiments, refer to Figures 1 to 3 The shapes of the current-protruding contact blocks and voltage-protruding contact blocks away from the surface of the test plate include: polygons with 4 or more sides; the shapes of the current-contact protrusions away from the surface of the test plate include: circles or ellipses. The shapes of the current-protruding contact blocks and voltage-contact protrusions away from the surface of the test plate, and the shapes of the current-contact protrusions away from the surface of the test plate, are well matched with the surface shapes of the electrodes in the battery cell, making it easy to achieve good contact and improving test accuracy.

[0051] For example, refer to Figures 1 to 3 The current-protruding contact block and the voltage-protruding contact block are rectangular in shape relative to the surface of the test board, and the dimension of the rectangle along the first direction L1 is larger than the dimension along the second direction L2. The current-protruding contact point is circular in shape relative to the surface of the test board.

[0052] In some embodiments, the test board includes: a first test board and a second test board disposed opposite to each other. Voltage contact bumps include: positive voltage contact bumps and negative voltage contact bumps; current contact bumps include: positive current contact bumps and negative current contact bumps. The first test board integrates multiple positive current contact bumps and multiple positive voltage contact bumps; the second test board integrates multiple negative current contact bumps and multiple negative voltage contact bumps; the positive current contact bumps and positive voltage contact bumps on the first test board are respectively used to contact the positive current testing portion and the positive voltage testing portion on the first surface of the battery cell; the negative current contact bumps and negative voltage contact bumps on the second test board are respectively used to contact the negative current testing portion and the negative voltage testing portion on the second surface of the battery cell; along the thickness direction of the battery cell, the first surface and the second surface are opposite to each other, and the first surface of the battery cell is provided with a positive electrode, and the second surface is provided with a negative electrode. Here, one of the first surface and the second surface is the light-facing surface of the battery cell, and the other is the backlight surface of the battery cell; which is specifically the light-facing surface and which is the backlight surface is not limited. This testing device is used to test the performance of solar cells with electrodes on both sides. During normal operation, the side of the solar cell that primarily absorbs light is its light-facing side.

[0053] In some embodiments, the test plate includes: a third surface and a fourth surface disposed opposite to each other along its thickness direction; voltage contact bumps, including: a positive voltage contact bump 12 and a negative voltage contact bump 14; current contact bumps, including: a positive current contact bump and a negative current contact bump; all voltage contact bumps and all current contact bumps protrude from the third surface of the test plate; the voltage contact bumps and current contact bumps protruding from the third surface of the test plate are respectively used to contact the voltage testing section and the current testing section on the first surface of the battery cell. The first surface of the battery cell can be the back surface of the battery cell, and the battery cell is a back contact battery cell. The test device is used to test the battery performance of the back contact battery cell.

[0054] When the battery cell is a back-contact battery cell, refer to Figure 3 In some embodiments, a plurality of positive current contact bumps 11 are arranged in a row along a first direction L1 to form a positive current contact bump row, and a plurality of negative current contact bumps 13 are arranged in a row along the first direction L1 to form a negative current contact bump row. For example, Figure 3 In the middle, the leftmost multiple positive current contact bumps 11 are arranged in a row along the first direction L1 to form a positive current contact bump column. The second column from left to right is a negative current contact bump column formed by multiple negative current contact bumps 13 arranged in a row along the first direction L1. The positive current contact bump columns and the negative current contact bump columns are arranged alternately and at intervals along the second direction L2, which means that along the second direction L2, a column of positive current contact bumps is followed by a column of negative current contact bumps, and then another column of positive current contact bumps is arranged in this manner. Along the second direction L2, the distance d3 between at least one positive voltage contact protrusion 15 and at least one negative voltage contact protrusion 16 is less than or equal to the dimension d4 of the spacing between the three sequentially arranged current contact protrusions along the second direction L2. That is, along the second direction L2, the smaller distance d3 between the positive voltage contact protrusion 15 and the negative voltage contact protrusion 16 results in a shorter current transmission distance and lower transmission resistance, leading to less interference with voltage measurement and more accurate voltage measurement, whether in the battery cell testing device or the battery cell itself. The relative positional relationship between the second direction L2 and the first direction L1 can be referred to the aforementioned description; to avoid repetition, it will not be repeated here.

[0055] This application also provides a solar cell, which is the type of solar cell that can be tested by the aforementioned solar cell testing device. (See reference...) Figure 4The solar cell includes a cell body 2 and an electrode structure located on the surface of the cell body. The cell body 2 contains a PN junction for separating charge carriers. The electrode structure is used to collect and conduct current in the cell body. The electrode structure may include multiple main grid electrodes 21, multiple first electrode disks 22, and multiple second electrode disks 23; at least a portion of the first electrode disks 21 are arranged in a row along a third direction L3 to form a first electrode disk array. The main grid electrodes 21 extend along the third direction L3, which can be understood as the overall orientation of the linear or strip-shaped main grid electrodes 21 being along the third direction L3, with local bending or folding of the linear or strip-shaped main grid electrodes 21 permitted in other directions. During the measurement of the solar cell by the solar cell testing device, the aforementioned first direction L1 is parallel to the third direction L3.

[0056] On one side of the battery body 21, along a third direction L3, at least one second electrode disk 23 is located on a main grid electrode 21, and both sides of the second electrode disk 23 along the third direction L3 also have exposed main grid electrode segments 211; the total number of exposed main grid electrode segments 211 and the first electrode disk 22 is greater than the number of second electrode disks 23. During the measurement of the battery cell by the battery cell testing device, the aforementioned current contact protrusions can contact the first electrode disk 22, the current contact protrusions can contact the main grid electrode segments 211, and the voltage contact protrusions can contact the second electrode disks 23. The battery cell here can be a whole battery cell or a segmented battery cell, and there is no specific limitation on this.

[0057] In some embodiments, refer to Figure 4 The battery body includes: cut edges (not shown) and non-cut edges 24 relatively distributed along the third direction L3, as shown in the figure. Figure 4 The topmost edge (not shown) in the battery body can be a cutting edge. A cutting edge refers to the cutting position where a whole battery cell is cut to form a segmented battery; thus, the battery cell can be a segmented battery. The battery body also includes two opposing third edges along the fourth direction L4, i.e. Figure 4The left edge and right edge (not shown) of the second electrode disk 23 are located between the two third edges, and the second middle portion is located between the two third edges. The main grid electrode 21 is close to the non-cut edge 24 and located in the second middle portion. That is, along the third direction L3, the main grid electrode segment 211 of the aforementioned second electrode disk 23, which is exposed on both sides along the third direction L3, is located at the edge of the battery body. However, along the fourth direction L4, the main grid electrode segment 211 of the aforementioned second electrode disk, which is exposed on both sides along the third direction L3, is located in the middle of the battery body. The second electrode disk 23, which is in contact with a small number of voltage contact protrusions, is located approximately in the second middle portion along the fourth direction L4 and close to the non-cut edge. Along the third direction L3, the second electrode disk 23 is not close to the cut position. The cut position has passivation loss, which has a significant impact on voltage measurement. Therefore, in this application, the voltage measurement is staggered from the cut position, which can improve the accuracy of voltage measurement. In addition, the main grid electrode segment 211 and the second electrode disk 23 are both located at the edge of the battery body along the third direction L3, which can reduce light shading and improve the photoelectric performance of the battery cell.

[0058] It should be noted that the third direction L3 here is different from the fourth direction L4. During the measurement of the battery cell by the battery cell testing device, the aforementioned second direction L2 is parallel to the fourth direction L4 here.

[0059] In some embodiments, refer to Figure 4 Along the third direction L3, the distance between the second electrode disk 23 located on the main grid electrode 1 and the center of the innermost main grid electrode segment among the two exposed main grid electrode segments 211 along the third direction L3 is less than or equal to the dimension d5 of the six first electrode disks 22 arranged sequentially in the first electrode disk row and the spacing between them along the third direction L3. That is, the distance between the second electrode disk 23 and the innermost main grid electrode segment 211 among the aforementioned two main grid electrode segments 211 along the third direction L3 is smaller. The second electrode disk 23 is farther from the edge, thus during measurement, the voltage contact protrusion is farther from the edge, avoiding measurement errors caused by cell quality defects at the edge, improving voltage measurement accuracy, reducing the risk of microcracks in the cell, and improving the contact quality of the voltage contact protrusion, further improving voltage measurement accuracy. (Refer to...) Figure 4Along the third direction L3, the distance between the second electrode disk 23 located on the main gate electrode 1 and the center of the innermost main gate electrode segment among the two exposed main gate electrode segments 211 along the third direction L3 can be the distance between the centerline of the second electrode disk 23 along the third direction L3 and the centerline of the innermost main gate electrode segment 211 along the third direction L3; d5 can be the distance between the centerline of the first first electrode disk 22 arranged sequentially in the first electrode disk column along the third direction L3 and the centerline of the last first electrode disk 22 among the six first electrode disks 22 arranged sequentially along the third direction L3. This relationship applies to any given second electrode disk 23. For example, the distance between the second electrode disk 23 located on the main gate electrode 1 along the third direction L3 and the center of the innermost main gate electrode segment among the two exposed main gate electrode segments 211 along the third direction L3 can be the size of the spacing between the six first electrode disks 22 arranged in sequence along the third direction L3, the size of the spacing between the five first electrode disks 22 arranged in sequence along the third direction L3, the size of the spacing between the four first electrode disks 22 arranged in sequence along the third direction L3, the size of the spacing between the three first electrode disks 22 arranged in sequence along the third direction L3, the size of the spacing between the two first electrode disks 22 arranged in sequence along the third direction L1, the size of the spacing between one first electrode disk 22 and two adjacent first electrode disks 22 along the third direction L1, etc.

[0060] In some embodiments, the number of second electrode disks 23 is less than or equal to 8; for example, the number of second electrode disks 23 can be 8, 6, 4, or 2. The beneficial effect here corresponds to the number of the aforementioned voltage contact protrusions.

[0061] In some embodiments, the second electrode disk includes a positive second electrode disk and a negative second electrode disk; the number of positive second electrode disks and the number of negative second electrode disks are both less than or equal to 4, for example, they can be 4, 3, 2, or 1.

[0062] In some embodiments, the main grid electrode 21 includes a positive main grid electrode and a negative main grid electrode; the first electrode disk 22 includes a positive first electrode disk and a negative first electrode disk; the second electrode disk 23 includes a positive second electrode disk and a negative second electrode disk; the positive second electrode disk and the negative second electrode disk; the positive first electrode disk, the negative first electrode disk, the positive main grid electrode and the negative main grid electrode are all located on the same side of the battery body, the battery is a back contact battery cell, and the testing device is used to test the battery performance of the back contact battery cell. Multiple positive first electrode disks are arranged in a row along the third direction L3 to form a positive first electrode disk row, and multiple negative first electrode disks are arranged in a row along the third direction L3 to form a negative first electrode disk row. The positive and negative first electrode disk rows are arranged alternately and at intervals along the fourth direction L4, that is, along the fourth direction L4, one positive first electrode disk row, then one negative first electrode disk row, and then another positive first electrode disk row. The relative positional relationship between the fourth direction and the third direction is as described above. Along the fourth direction L4, the distance between at least one positive second electrode disk and at least one negative second electrode disk is less than or equal to the dimension of the three sequentially arranged first electrode disk rows and the spacing between them along the fourth direction L4.

[0063] It should be noted that during the testing of the battery cell in this application, the positive first electrode disk can contact the aforementioned positive current contact protrusion 11, the negative first electrode disk can contact the aforementioned negative current contact protrusion 13, the positive main grid electrode or positive main grid electrode segment can contact the aforementioned positive current contact protrusion 12, the negative main grid electrode or negative main grid electrode segment can contact the aforementioned negative current contact protrusion 14, the positive second electrode disk can contact the aforementioned positive voltage contact protrusion 15, and the negative second electrode disk can contact the aforementioned negative voltage contact protrusion 16. The arrangement positions of the corresponding structures and their beneficial effects can be referred to each other. To avoid repetition, the relevant parts are briefly described.

[0064] In this application, the electrode structure of the solar cell includes a fine grid electrode 25, which includes a positive fine grid electrode and a negative fine grid electrode. The positive fine grid electrode is electrically connected to a positive first electrode disk and is also electrically connected to a positive second electrode disk. The negative fine grid electrode is electrically connected to a negative first electrode disk and is also electrically connected to a negative second electrode disk.

[0065] This application also provides a photovoltaic module, including interconnects and a plurality of any of the aforementioned solar cells. The interconnects electrically connect the electrode structures of two adjacent solar cells. Specifically, the interconnects may electrically connect the positive electrode in the electrode structure of one of two adjacent solar cells to the negative electrode in the electrode structure of the other solar cell. The interconnects here may be solder strips, conductive interconnects, etc.

[0066] It should be noted that the related aspects of the solar cell testing device, solar cell, and photovoltaic module in this application can be referred to each other. To avoid repetition, they will not be described again here.

[0067] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0068] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.

Claims

1. A battery cell testing device, characterized in that, include: The test board and multiple current contact bumps and multiple voltage contact bumps integrated on the test board; Both the current contact protrusion and the voltage contact protrusion block protrude from the test plate; The voltage contact protrusion and the current contact protrusion are respectively used to contact the voltage test section and the current test section on the battery cell; The number of current contact bumps is greater than the number of voltage contact bumps. The plurality of current contact bumps include: a plurality of current contact bump points and a plurality of current bump contact blocks; at least some of the current contact bump points are arranged in a row along a first direction to form a current contact bump point row; the area of ​​the current bump contact blocks and the voltage contact bump blocks facing away from the surface of the test board is greater than the area of ​​the current contact bump points facing away from the surface of the test board. On one side of the test board, along the first direction, at least one of the voltage contact bumps is located between two adjacent current contact bumps.

2. The battery cell testing apparatus according to claim 1, characterized in that, The two adjacent current contact protrusions are connected and a groove is provided between them. The voltage contact protrusion is disposed in the groove and there is a gap between the voltage contact protrusion and the groove.

3. The battery cell testing apparatus according to claim 1, characterized in that, The two adjacent current contact bumps, the voltage contact bump located between the two adjacent current contact bumps, are at least partially collinear with at least one of the current contact bump arrays.

4. The battery cell testing apparatus according to claim 1, characterized in that, Along the first direction, the test board includes two opposing first edges; along the second direction, the test board includes two opposing second edges and a first intermediate portion located between the two second edges; the two adjacent current contact protrusions are located at the first edges and the first intermediate portion.

5. The battery cell testing apparatus according to claim 4, characterized in that, The distance between the voltage contact protrusion located between two adjacent current contact protrusions and the innermost current contact protrusion in the first direction is less than or equal to the dimension of the six current contact protrusions arranged sequentially in the current contact protrusion column and the spacing between them in the first direction.

6. The battery cell testing apparatus according to claim 1, characterized in that, The number of voltage contact bumps is less than or equal to 8.

7. The battery cell testing apparatus according to claim 1, characterized in that, The voltage contact protrusion includes: a positive voltage contact protrusion and a negative voltage contact protrusion; the number of the positive voltage contact protrusion and the number of the negative voltage contact protrusion are both less than or equal to 4.

8. The battery cell testing apparatus according to claim 1, characterized in that, At least one of the current contact protrusion arrays is at least partially collinear with at least one of the current contact protrusion blocks to form a current contact protrusion array; Along the second direction, the test plate includes: two opposing second edges, and a first intermediate portion located between the two second edges; The number of current contact protrusions in the second edge position column is less than the number of current contact protrusions in the first middle position column; and / or, the total dimension of the current contact protrusions in the second edge position column along the first direction is less than the total dimension of the current contact protrusions in the first middle position column along the first direction.

9. The battery cell testing apparatus according to claim 8, characterized in that, The number of current contact protrusions in the second edge position column is less than the number of current contact protrusions in the first middle position column; and / or, the total dimension of the current contact protrusions in the second edge position column along the first direction is less than the total dimension of the current contact protrusions in the first middle position column along the first direction.

10. The battery cell testing apparatus according to claim 1, characterized in that, The dimensions of the current protrusion contact block and the voltage protrusion contact block facing away from the surface of the test board in the direction parallel to the first direction are both greater than the dimensions of the current contact protrusion point facing away from the surface of the test board in the direction parallel to the first direction. The dimensions of the current protrusion contact block and the voltage protrusion block away from the surface of the test board in a direction parallel to the second direction are between 80% and 120% of the dimensions of the current contact protrusion point away from the surface of the test board in a direction parallel to the second direction; the second direction is perpendicular to the first direction.

11. The battery cell testing apparatus according to claim 1, characterized in that, The height difference between all the current contact bumps and all the voltage contact bumps protruding from the same side of the test board and the surface of the test board is less than or equal to 5 μm.

12. The battery cell testing apparatus according to claim 1, characterized in that, The shapes of the current protrusion contact block and the voltage contact protrusion block away from the surface of the test board include: polygons, wherein the polygons have more than or equal to 4 sides; The shape of the current contact protrusion away from the surface of the test board includes: circular or elliptical.

13. The cell testing apparatus according to any one of claims 1 to 12, characterized in that, The test board includes: a first test board and a second test board arranged opposite to each other; the voltage contact protrusion includes: a positive voltage contact protrusion and a negative voltage contact protrusion; the current contact protrusion includes: a positive current contact protrusion and a negative current contact protrusion. The first test board integrates multiple positive current contact protrusions and multiple positive voltage contact protrusions; the second test board integrates multiple negative current contact protrusions and multiple negative voltage contact protrusions; the positive current contact protrusions and positive voltage contact protrusions on the first test board are respectively used to contact the positive current test section and the positive voltage test section on the first surface of the battery cell; the negative current contact protrusions and negative voltage contact protrusions on the second test board are respectively used to contact the negative current test section and the negative voltage test section on the second surface of the battery cell; along the thickness direction of the battery cell, the first surface and the second surface are opposite to each other.

14. The cell testing apparatus according to any one of claims 1 to 12, characterized in that, The test plate includes a third surface and a fourth surface disposed opposite to each other along its thickness direction; the voltage contact protrusion includes a positive voltage contact protrusion and a negative voltage contact protrusion; the current contact protrusion includes a positive current contact protrusion and a negative current contact protrusion; all the voltage contact protrusions and all the current contact protrusions protrude from the third surface; the voltage contact protrusions and the current contact protrusions are respectively used to contact the voltage test section and the current test section on the first surface of the battery cell.

15. The battery cell testing apparatus according to claim 14, characterized in that, Multiple positive current contact protrusions are arranged in a row along the first direction to form a positive current contact protrusion column, and multiple negative current contact protrusions are arranged in a row along the first direction to form a negative current contact protrusion column. The positive current contact protrusion column and the negative current contact protrusion column are arranged alternately and at intervals along the second direction; the second direction is perpendicular to the first direction. Along the second direction, the distance between at least one of the positive voltage contact bumps and at least one of the negative voltage contact bumps is less than or equal to the dimension of the three sequentially arranged current contact bumps and the spacing between them along the second direction.

16. A battery cell, characterized in that, include: The battery body and the electrode structure located on the surface of the battery body; The electrode structure includes: multiple main grid electrodes, multiple first electrode disks, and multiple second electrode disks; at least a portion of the first electrode disks are arranged in a row along a third direction to form a first electrode disk array; the main grid electrodes extend along the third direction. On one side of the battery body, along the third direction, at least one second electrode disk is located on a main grid electrode, and the second electrode disk also has exposed main grid electrode segments on both sides along the third direction; the total number of exposed main grid electrode segments and the first electrode disk is greater than the number of second electrode disks.

17. The battery cell according to claim 16, characterized in that, The battery body includes: cut edges and non-cut edges distributed opposite each other along the third direction; the battery body also includes: two third edges opposite each other along the fourth direction, and a second intermediate portion located between the two third edges; the main grid electrode is close to the non-cut edge and located in the second intermediate portion.

18. The battery cell according to claim 17, characterized in that, Along the third direction, the distance between the second electrode disk located on the main gate electrode and the center of the innermost of the two exposed main gate electrode segments in the third direction is less than or equal to the dimension of the six first electrode disks arranged sequentially in the first electrode disk column and the spacing between them along the third direction.

19. The battery cell according to claim 16, characterized in that, The number of the second electrode disks is less than or equal to 8.

20. The battery cell according to claim 19, characterized in that, The second electrode disk includes a positive second electrode disk and a negative second electrode disk; the number of the positive second electrode disks and the number of the negative second electrode disks are both less than or equal to 4.

21. The battery cell according to any one of claims 16 to 20, characterized in that, The main grid electrode includes a positive main grid electrode and a negative main grid electrode; the first electrode disk includes a positive first electrode disk and a negative first electrode disk; the second electrode disk includes a positive second electrode disk and a negative second electrode disk; the positive second electrode disk and the negative second electrode disk; the positive first electrode disk, the negative first electrode disk, the positive main grid electrode and the negative main grid electrode are all located on the same side of the battery body; Multiple positive first electrode disks are arranged in a row along the third direction to form a positive first electrode disk row, and multiple negative first electrode disks are arranged in a row along the third direction to form a negative first electrode disk row. The positive first electrode disk row and the negative first electrode disk row are arranged alternately and at intervals along a fourth direction; the fourth direction is perpendicular to the third direction. Along the fourth direction, the distance between at least one of the positive second electrode disks and at least one of the negative second electrode disks is less than or equal to the dimension of the three sequentially arranged columns of the first electrode disks and the spacing between them along the fourth direction.

22. A photovoltaic module, characterized in that, include: Interconnectors, and the battery cell as described in any one of claims 16 to 21; The interconnecting element electrically connects the electrode structures of two adjacent battery cells.

Images