A test device for storage chip packaging

Abstract

This utility model relates to the field of chip processing technology, and in particular to a testing device for memory chip packaging and testing, including a base. The base is equipped with a testing mechanism for chip testing. The testing mechanism includes: an adjustment assembly comprising two frames mounted on the base, a balance bar slidably mounted between the two ends of the frames, several slides slidably mounted laterally on the inner walls of the frames, a testing head mounted on each slide, a cam rotatably mounted on the upper inner wall of each slide, a first cylinder mounted on the upper end of the frames, a guide plate fixed to the output end of the first cylinder, and several symmetrically distributed inclined slots inside the guide plate, with the slides located inside the inclined slots; and a limiting assembly mounted on the adjustment assembly for limiting the testing head. Intelligent spacing adjustment of the testing head is achieved through pneumatic drive, and a dual guiding mechanism ensures motion stability, automatically adapting to chip testing requirements with different spacing arrangements.

Description

Technical Field

[0001] This utility model relates to the field of chip processing technology, specifically a testing device for memory chip packaging and testing. Background Technology

[0002] With the rapid development of semiconductor technology, the packaging density and performance requirements of memory chips are constantly increasing. As a key process to ensure chip reliability and performance, the packaging and testing equipment needs to meet the requirements of high precision and high efficiency.

[0003] A search of publication number CN212160007U reveals an automated chip testing device. This technology discloses "a testing body comprising a slide groove along its length and a chip mounting base movably connected to the slide groove; wherein the testing body has a loading port and a testing port vertically connected to the slide groove, and a chip testing base is mounted above the testing port."

[0004] The chip mounting base is connected to the push rod of the stroke cylinder. A lower chip test base is set at the upper end of the chip mounting base. The lower chip test base has a placement port for accommodating the chip under test and fixing the chip under test circumferentially. When the upper chip test base and the lower chip test base are closed, the upper chip test base is used to test the chip under test. The technical solution has the technical effect of "positioning the chip under test by a robotic arm, pushing it to the test area by the stroke cylinder, and finally removing the tested chip, thereby completing the automated chip test and solving the problem of low efficiency caused by manual chip test".

[0005] Existing memory chip packaging and testing equipment has significant limitations in adaptability when testing chips of different specifications. This is mainly manifested in the fact that the probe spacing adjustment mechanism is simple and has limited precision, making it unable to quickly and accurately adapt to various chip package sizes and arrangement spacings. This leads to deviations in the contact position between the probe and the chip during testing, affecting the reliability of the test results. Furthermore, if the probe movement is directly controlled for adjustment, it is easy to cause probe shaking or displacement, further reducing test stability and repeatability. Utility Model Content

[0006] To address the shortcomings of existing technologies, this utility model provides a testing device for memory chip packaging and testing. It achieves intelligent spacing adjustment of the detection head through pneumatic drive, and adopts a dual guiding mechanism to ensure motion stability. It can automatically adapt to the testing requirements of chips with different arrangement spacings.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a testing device for memory chip packaging and testing, comprising a base, wherein a testing mechanism is disposed on the base and used for chip testing, the testing mechanism comprising:

[0008] The adjustment assembly includes two frame plates mounted on the base, a balance bar slidably mounted between the two ends of the frame plates, several carriages slidably mounted laterally on the inner wall of the frame plates, a detection head mounted on the carriage, a cam rotatably mounted on the upper inner wall of the carriage, a first cylinder mounted on the upper end of the frame plates, a guide plate fixed to the output end of the first cylinder, several symmetrically distributed inclined grooves opened inside the guide plate, and the carriages located inside the inclined grooves;

[0009] A limit component is provided on the adjustment component and is used to limit the detection head.

[0010] Preferably, one of the frame plates has a mounting plate fixed to the outer wall at both ends, a second cylinder is mounted on the mounting plate, and the output end of the second cylinder is fixed to the other frame plate.

[0011] Preferably, the limiting component includes left and right limiting plates disposed below the adjusting component, a lower guide wheel is rotatably mounted on the lower outer wall of the detection head and located inside the left and right limiting plates, a plurality of front and rear limiting plates are slidably mounted on the upper part of the left and right limiting plates, and an upper guide wheel is rotatably mounted on the lower outer wall of the detection head and located inside the front and rear limiting plates.

[0012] Preferably, the limiting component further includes guide rails fixed at both ends of the top of the left and right limiting plates, and sliders fixed at both ends of the bottom of the front and rear limiting plates and slidably installed with the guide rails.

[0013] Preferably, the limiting component further includes a third cylinder fixed to the frame plate, the output end of the third cylinder is fixed with a connecting frame, both ends of the connecting frame are equipped with a fourth cylinder, and the output end of the fourth cylinder is fixed to the left and right limiting plates.

[0014] Preferably, an X-axis electric slide is installed on both sides of the top of the machine base, a crossbeam is installed between the two X-axis electric slides, a Y-axis electric slide is installed on the crossbeam, a Z-axis electric slide is installed on the Y-axis electric slide, and a frame plate is installed on the Z-axis electric slide. A tray is placed on the top of the machine base.

[0015] Beneficial effects

[0016] This invention provides a testing device for memory chip packaging and testing. Compared with the prior art, it has the following advantages:

[0017] 1. The guide plate is moved by the first cylinder, and the interaction between the inclined groove and the cam converts the vertical motion into the horizontal displacement of the carriage, thereby driving the detection head to make precise spacing adjustment; and the output end of the second cylinder drives the two frames to form a symmetrical movement, realizing precise control of the spacing between the detection heads on the two frames; thus meeting the testing needs of chips with different spacing arrangements in the tray, improving testing accuracy and equipment adaptability.

[0018] 2. By setting up a dual guiding structure with left and right limit plates and front and rear limit plates, along with the lower and upper guide wheels installed on the detection head, a multi-dimensional motion constraint is constructed. When the detection head is adjusted, the lower guide wheel rolls inside the left and right limit plates, precisely guiding the left and right movement of the detection head; at the same time, the upper guide wheel rolls inside the front and rear limit plates, stably controlling the front and rear displacement of the detection head. The dual limit structure effectively suppresses the shaking or deviation that may occur in the detection head during the test, ensuring the stability of the contact between the test probe and the chip. Attached Figure Description

[0019] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0020] Figure 2 This is a schematic diagram of the detection mechanism in this utility model;

[0021] Figure 3 This is a schematic diagram of the adjustment component in this utility model;

[0022] Figure 4 This is a schematic diagram of the limiting component in this utility model.

[0023] In the diagram: 1. Base; 2. Detection mechanism; 21. Adjustment assembly; 211. Frame plate; 212. Balance bar; 213. Slide; 214. Detection head; 215. Cam; 216. First cylinder; 217. Guide plate; 218. Inclined groove; 219. Mounting plate; 2110. Second cylinder; 22. Limiting assembly; 221. Left and right limiting plates; 222. Lower guide wheel; 223. Front and rear limiting plates; 224. Upper guide wheel; 225. Guide rail; 226. Slider; 227. Third cylinder; 228. Connecting frame; 229. Fourth cylinder; 3. X-axis electric slide; 4. Crossbeam; 5. Y-axis electric slide; 6. Z-axis electric slide; 7. Tray. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Please see Figure 1 - Figure 4 This utility model provides a technical solution: a testing device for memory chip packaging and testing, including a base 1, on which a testing mechanism 2 is disposed and used for chip testing, the testing mechanism 2 including:

[0026] The adjustment assembly 21 includes two frame plates 211 mounted on the base 1. A balance bar 212 is slidably mounted between the two ends of the frame plates 211. Several slides 213 are slidably mounted on the inner wall of the frame plates 211. A detection head 214 is mounted on the slides 213. A cam 215 is rotatably mounted on the upper inner wall of the slides 213. A first cylinder 216 is mounted on the upper end of the frame plates 211. A guide plate 217 is fixed to the output end of the first cylinder 216. Several symmetrically distributed inclined grooves 218 are opened inside the guide plate 217, and the slides 213 are located inside the inclined grooves 218.

[0027] Limiting component 22 is disposed on adjusting component 21 and is used to limit the detection head 214.

[0028] In this embodiment, the guide plate 217 is moved by the first cylinder 216, and the interaction between the inclined groove 218 and the cam 215 converts the vertical motion into the horizontal displacement of the slide 213, thereby driving the detection head 214 to make precise spacing adjustments; adapting to the testing needs of chips with different spacing arrangements in the tray 7, improving testing accuracy and equipment adaptability.

[0029] Specifically, mounting plates 219 are fixed to the outer walls of both ends of one of the frame plates 211. A second cylinder 2110 is mounted on the mounting plate 219, and the output end of the second cylinder 2110 is fixed to the other frame plate 211.

[0030] In this embodiment, the output end of the second cylinder 2110 drives the two support plates 211 to form a symmetrical movement, thereby achieving precise control of the distance between the detection heads 214 on the two support plates 211.

[0031] Specifically, the limiting component 22 includes left and right limiting plates 221 disposed below the adjusting component 21, a lower guide wheel 222 rotatably mounted on the lower outer wall of the detection head 214 and located inside the left and right limiting plates 221, a plurality of front and rear limiting plates 223 slidably mounted on the upper end of the left and right limiting plates 221, and an upper guide wheel 224 rotatably mounted on the lower outer wall of the detection head 214 and located inside the front and rear limiting plates 223.

[0032] In this embodiment, a multi-dimensional motion constraint is constructed by setting a dual guiding structure of left and right limiting plates 221 and front and rear limiting plates 223, in conjunction with the lower guide wheel 222 and upper guide wheel 224 installed on the detection head 214. When the detection head 214 is adjusted in position, the lower guide wheel 222 rolls inside the left and right limiting plates 221, precisely guiding the left and right movement of the detection head 214; at the same time, the upper guide wheel 224 rolls inside the front and rear limiting plates 223, stably controlling the front and rear displacement of the detection head 214. The dual limiting structure effectively suppresses the shaking or deviation that may occur in the detection head 214 during the test, ensuring the stability of the contact between the test probe and the chip.

[0033] Specifically, the limiting component 22 also includes guide rails 225 fixed at the top ends of the left and right limiting plates 221, and sliders 226 fixed at the bottom ends of the front and rear limiting plates 223 and slidably installed with the guide rails 225.

[0034] In this embodiment, the cooperation between the guide rail 225 and the slider 226 provides high-precision linear guidance for the front and rear limiting plates 223.

[0035] Specifically, the limiting component 22 also includes a third cylinder 227 fixed on the frame plate 211. The output end of the third cylinder 227 is fixed with a connecting frame 228. A fourth cylinder 229 is installed at both ends of the connecting frame 228, and the output end of the fourth cylinder 229 is fixed with the left and right limiting plates 221.

[0036] In this embodiment, when the detection head 214 changes the spacing through the adjustment component 21 to adapt to the testing requirements of chips of different sizes, the third cylinder 227 drives the connecting frame 228 to move the left and right limit plates 221 vertically, while the fourth cylinder 229 pushes the left and right limit plates 221 to move laterally, thereby tracking the position change of the detection head 214 in real time.

[0037] Specifically, X-axis electric slides 3 are installed on both sides of the top of the machine base 1, and a crossbeam 4 is installed between the two X-axis electric slides 3. A Y-axis electric slide 5 is installed on the crossbeam 4, and a Z-axis electric slide 6 is installed on the Y-axis electric slide 5. The support plate 211 is installed on the Z-axis electric slide 6, and a tray 7 is placed on the top of the machine base 1.

[0038] In this embodiment, the three-axis electric slide table coordinates with the detection mechanism 2 to detect the chip in the tray 7.

[0039] The working principle and usage process of this utility model are as follows: First, the guide plate 217 is moved by the first cylinder 216. The interaction between the inclined groove 218 and the cam 215 converts the vertical motion into the horizontal displacement of the slide 213, thereby driving the detection head 214 to make precise spacing adjustments. Furthermore, the output end of the second cylinder 2110 drives the two support plates 211 to form a symmetrical movement, realizing precise control of the spacing between the detection heads 214 on the two support plates 211. This meets the testing requirements of chips with different spacing arrangements in the tray 7, improving testing accuracy and equipment adaptability.

[0040] Meanwhile, by setting up a dual guiding structure of left and right limiting plates 221 and front and rear limiting plates 223, and in conjunction with the lower guide wheel 222 and upper guide wheel 224 installed on the detection head 214, a multi-dimensional motion constraint is constructed. When the detection head 214 is adjusted in position, the lower guide wheel 222 rolls inside the left and right limiting plates 221, precisely guiding the left and right movement of the detection head 214. At the same time, the upper guide wheel 224 rolls inside the front and rear limiting plates 223, stably controlling the front and rear displacement of the detection head 214. The dual limiting structure effectively suppresses the shaking or deviation that may occur in the detection head 214 during the test, ensuring the stability of the contact between the test probe and the chip.

[0041] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0042] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A testing apparatus for packaging and testing memory chips, comprising a base (1), characterized in that: The base (1) is provided with a testing mechanism (2) for chip testing. The testing mechanism (2) includes: The adjustment assembly (21) includes two frame plates (211) set on the base (1), a balance bar (212) is slidably installed between the two ends of the two frame plates (211), a number of slides (213) are slidably installed on the inner wall of the frame plate (211), a detection head (214) is installed on the slide (213), a cam (215) is rotatably installed on the upper inner wall of the slide (213), a first cylinder (216) is installed on the upper end of the frame plate (211), a guide plate (217) is fixed at the output end of the first cylinder (216), a number of symmetrically distributed inclined grooves (218) are opened inside the guide plate (217), and the slide (213) is located inside the inclined groove (218); A limiting component (22) is disposed on the adjusting component (21) and is used to limit the detection head (214).

2. The testing apparatus for memory chip packaging and testing according to claim 1, characterized in that: One of the frame plates (211) has mounting plates (219) fixed to the outer walls at both ends. A second cylinder (2110) is mounted on the mounting plate (219), and the output end of the second cylinder (2110) is fixed to the other frame plate (211).

3. The testing apparatus for packaging and testing memory chips according to claim 1, characterized in that: The limiting component (22) includes left and right limiting plates (221) disposed below the adjusting component (21). The lower outer wall of the detection head (214) is rotatably mounted with a lower guide wheel (222) and located inside the left and right limiting plates (221). Several front and rear limiting plates (223) are slidably mounted on the upper end of the left and right limiting plates (221). The lower outer wall of the detection head (214) is rotatably mounted with an upper guide wheel (224) and located inside the front and rear limiting plates (223).

4. The testing apparatus for memory chip packaging and testing according to claim 3, characterized in that: The limiting component (22) also includes guide rails (225) fixed at the top ends of the left and right limiting plates (221), and sliders (226) fixed at the bottom ends of the front and rear limiting plates (223) and slidably installed with the guide rails (225).

5. A testing apparatus for packaging and testing memory chips according to claim 3, characterized in that: The limiting component (22) also includes a third cylinder (227) fixed on the frame plate (211). The output end of the third cylinder (227) is fixed with a connecting frame (228). Both ends of the connecting frame (228) are equipped with a fourth cylinder (229), and the output end of the fourth cylinder (229) is fixed with the left and right limiting plates (221).

6. The testing apparatus for memory chip packaging and testing according to claim 1, characterized in that: X-axis electric slides (3) are installed on both sides of the top of the machine base (1). A crossbeam (4) is installed between the two X-axis electric slides (3). A Y-axis electric slide (5) is installed on the crossbeam (4). A Z-axis electric slide (6) is installed on the Y-axis electric slide (5). A support plate (211) is installed on the Z-axis electric slide (6). A tray (7) is placed on the top of the machine base (1).

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