An automated high voltage testing apparatus

Abstract

The utility model relates to automatic equipment technical field discloses an automatic high -voltage test equipment, first, this equipment can realize to the positive pole test area and the negative pole test area of the device of each face of all -round, multi -angle electrode coverage and test of waiting to be measured, effectively solved the test omission problem existing in the prior art, ensured the comprehensiveness and accuracy of test result. Secondly, automation operation has improved test efficiency significantly, reduced manual intervention, can satisfy the demand of large -scale production. Besides, the equipment avoids the test error due to inaccuracy or uneven pressure by precisely controlling the contact of electrode and the device under test, improves the stability and repeatability of test result. More importantly, the direct contact of test personnel and high -voltage electrode is reduced by automatic design, the risk of electric shock is reduced significantly, and the personal safety of test personnel is ensured.

Description

Technical Field

[0001] This utility model relates to the field of automation equipment technology, and in particular to an automated high-voltage testing device. Background Technology

[0002] In modern industrial production, high-voltage testing of the insulation performance of electronic devices and electrical equipment is a crucial step in ensuring their safety and reliability.

[0003] Currently, in response to such Figure 1 When performing high-voltage insulation performance tests on the insulating plating of the device under test (DUT) 5, traditional high-voltage testing methods mainly rely on manual operation. Testers need to manually bring electrodes into contact with various test areas of the DUT to complete the test. However, this method has many problems: First, manual operation is inefficient and cannot meet the needs of large-scale production; second, manual operation is prone to inaccurate test results due to inaccurate contact, uneven pressure, and other factors; more importantly, the high-voltage testing environment poses a serious threat to the personal safety of operators and can easily lead to electric shock accidents.

[0004] Furthermore, while some existing automated high-voltage testing equipment has improved testing efficiency to some extent, it still cannot achieve comprehensive, multi-angle electrode coverage and testing of all surfaces (including inward, downward, outward, and upward) of the positive and negative test areas of the device under test. This may result in omissions in the test results, making it impossible to fully evaluate the insulation performance of the device under test.

[0005] Therefore, in order to effectively improve the efficiency and safety of high-voltage testing, protect the personal safety of testing personnel, and ensure the comprehensiveness and accuracy of test results, it is urgent to comprehensively and deeply improve and optimize existing testing technologies to adapt to increasingly complex and stringent testing requirements.

[0006] The above information is provided as background information only to aid in understanding this disclosure and does not constitute an assertion or admission that any of the above content can be used as prior art relative to this disclosure. Utility Model Content

[0007] This invention provides an automated high-voltage testing device to solve the problems existing in the prior art.

[0008] To achieve the above objectives, this utility model provides the following technical solution:

[0009] An automated high-voltage testing device includes a carrier device and an electrode device; wherein,

[0010] The carrier device is used to carry the device under test and apply a high-voltage electrical signal to the inward, downward, and outward surfaces of the positive and negative test areas of the device under test, so as to perform a high-voltage test on the insulation performance of the insulating coating of the device under test.

[0011] The electrode device is used to apply a high-voltage electrical signal to the upward-facing side of the positive and negative test areas of the device under test, so as to perform a high-voltage test on the insulation performance of the insulating plating of the device under test.

[0012] Furthermore, the automated high-voltage testing equipment also includes a base and a lifting device;

[0013] The carrier device and the lifting device are respectively mounted on the base;

[0014] The electrode device is mounted on the lifting device;

[0015] The lifting device is used to lower the electrode device to contact the device under test, and to raise the electrode device to separate it from the device under test.

[0016] Furthermore, in the automated high-voltage testing equipment, the electrode device includes a first base, an upper positive electrode block, and an upper negative electrode block;

[0017] The first base is mounted on the lifting device;

[0018] The upper positive electrode block and the upper negative electrode block are arranged side by side on the first base;

[0019] The upper positive electrode block is used to apply a high-voltage electrical signal to the upward-facing side of the positive test area of ​​the device under test;

[0020] The upper negative electrode block is used to receive the high-voltage electrical signal transmitted from the upward-facing side of the negative electrode test area of ​​the device under test, so as to form a complete electrical circuit with the upper positive electrode block.

[0021] Furthermore, in the automated high-voltage testing equipment, the electrode device also includes a mounting block, a guide rail mechanism, and a spring;

[0022] The upper positive electrode block and the upper negative electrode block are respectively disposed on a mounting block;

[0023] The side of the mounting block is mounted on the first base via the guide rail mechanism;

[0024] The top of the mounting block abuts against the first base via the spring;

[0025] The spring is used to provide cushioning when the upper positive electrode block and the upper negative electrode block respectively come into contact with the device under test;

[0026] The guide rail mechanism is used to guide the upper positive electrode block and the upper negative electrode block to move smoothly in the vertical direction during buffering.

[0027] The mounting block is provided with alignment guide posts;

[0028] The carrier device is provided with alignment guide holes that cooperate with the alignment guide posts.

[0029] Furthermore, in the automated high-voltage testing equipment, the carrier device includes a second base, an internal positive electrode block, an internal negative electrode block, an external positive electrode block, and an external negative electrode block;

[0030] The second base is disposed on the base;

[0031] The internal positive electrode block and the internal negative electrode block are arranged side by side on the second base;

[0032] The internal positive electrode block includes a first internal positive electrode portion and a second internal positive electrode portion that are vertically arranged;

[0033] The internal negative electrode block includes a first internal negative electrode portion and a second internal negative electrode portion that are vertically arranged.

[0034] The device under test is sleeved on the first internal positive electrode portion and the first internal negative electrode portion, and the first internal positive electrode portion is disposed on the inward side of the positive test area of ​​the device under test, and the first internal negative electrode portion is disposed on the inward side of the negative test area of ​​the device under test.

[0035] The second internal positive electrode portion is disposed on the downward-facing side of the positive test area of ​​the device under test, and the second internal negative electrode portion is disposed on the downward-facing side of the negative test area of ​​the device under test.

[0036] The first internal positive electrode portion is used to apply a high-voltage electrical signal to the inward-facing side of the positive electrode test area of ​​the device under test;

[0037] The first internal negative electrode portion is used to receive the high voltage signal transmitted from the inward side of the negative electrode test area of ​​the device under test, so as to form a complete electrical circuit with the first internal positive electrode portion.

[0038] The second internal positive electrode portion is used to apply a high-voltage electrical signal to the downward-facing side of the positive test area of ​​the device under test;

[0039] The second internal negative electrode section is used to receive the high voltage signal transmitted from the downward-facing side of the negative electrode test area of ​​the device under test, so as to form a complete electrical circuit with the second internal positive electrode section.

[0040] The external positive electrode block and the external negative electrode block are arranged side by side on the second base;

[0041] The external positive electrode block is used to apply a high-voltage electrical signal to the outward-facing side of the positive test area of ​​the device under test;

[0042] The external negative electrode block is used to receive the high-voltage electrical signal transmitted from the outward-facing side of the negative electrode test area of ​​the device under test, so as to form a complete electrical circuit with the external positive electrode block.

[0043] Furthermore, in the automated high-voltage testing equipment, the carrier device also includes a displacement mechanism;

[0044] The external positive electrode block and the external negative electrode block are respectively mounted on the second base through the displacement mechanism;

[0045] The displacement mechanism is used to move the external positive electrode block and the external negative electrode block in a direction close to the device under test (DUT) to contact the outward-facing sides of the positive and negative test areas of the DUT, respectively, and to move the external positive electrode block and the external negative electrode block in a direction away from the DUT to separate from the outward-facing sides of the positive and negative test areas of the DUT, respectively.

[0046] Furthermore, in the automated high-voltage testing equipment, conductive silicone is provided at the positions where the upper positive electrode block, upper negative electrode block, first internal positive electrode part, second internal positive electrode part, first internal negative electrode part, second internal negative electrode part, outer positive electrode block and outer negative electrode block respectively contact the device under test;

[0047] The thickness of the conductive silicone is 0.2 mm.

[0048] Furthermore, in the automated high-voltage testing equipment, the gap between the upper positive electrode block and the upper negative electrode block is 1.0 to 1.17 mm;

[0049] The gap between the internal positive electrode block and the internal negative electrode block is 1.0 to 1.17 mm;

[0050] The gap between the external positive electrode block and the external negative electrode block is 1.0 to 1.17 mm.

[0051] Furthermore, the automated high-voltage testing equipment also includes a sliding device;

[0052] The carrier device is mounted on the base via the sliding device;

[0053] The sliding device is used to move the carrier device from the upper material position to below the electrode device, and to move the carrier device from below the electrode device to the upper material position;

[0054] The sliding device includes a slide rail and a slider. The slide rail is fixedly mounted on the base, and the slider is fixedly connected to the carrier device and can slide along the slide rail to realize the movement of the carrier device.

[0055] Furthermore, in the automated high-voltage testing equipment, the electrode device also includes a distance sensing device;

[0056] The distance sensing device is mounted on the lifting device;

[0057] The distance sensing device is used to sense the descent distance of the upper positive electrode block and the upper negative electrode block, so as to detect whether the upper positive electrode block and the upper negative electrode block are in contact with the device under test respectively.

[0058] Compared with the prior art, the present invention has the following beneficial effects:

[0059] Comprehensive test coverage: Through the coordinated work of the carrier device and the electrode device, it is possible to achieve comprehensive and multi-angle electrode coverage and testing of all surfaces (including inward, downward, outward and upward) of the positive and negative test areas of the device under test, ensuring the comprehensiveness and accuracy of the test results.

[0060] Improved testing efficiency: Automated operations reduce human intervention, improve testing efficiency, and can meet the needs of large-scale production.

[0061] Enhanced testing safety: The use of automated equipment reduces direct contact between test personnel and high-voltage electrodes, significantly improving the safety of the testing process and ensuring the personal safety of test personnel.

[0062] Stable and reliable test results: Automated equipment can ensure more accurate and stable contact between the electrode and the device under test, avoid test errors caused by human factors, and improve the repeatability and reliability of test results.

[0063] High adaptability: The equipment has a reasonable structural design and can adapt to devices of different sizes and shapes, making it widely applicable.

[0064] This invention has other features and advantages that will be apparent from or will be set forth in detail in the accompanying drawings and the following detailed description, which together serve to explain the particular principles of this invention. Attached Figure Description

[0065] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0066] Figure 1 This is a schematic diagram of the structure of the device under test;

[0067] Figure 2 This is a schematic diagram of the structure of an automated high-voltage testing device provided in an embodiment of this utility model;

[0068] Figure 3-4 This is a schematic diagram of the electrode device provided in an embodiment of the present invention;

[0069] Figure 5 This is a schematic diagram of the structure of the carrier device provided in this embodiment of the utility model;

[0070] Figure 6-7 This is a schematic diagram of the structure of the electrode device and part of the carrier device provided in the embodiment of this utility model;

[0071] Figure 8-12 This is a schematic diagram of the structure of a portion of the carrier device provided in an embodiment of this utility model;

[0072] Figure 13 This is a schematic diagram of the upper positive electrode block provided in an embodiment of the present invention;

[0073] Figure 14 This is a schematic diagram of the internal positive electrode block provided in an embodiment of the present invention;

[0074] Figure 15 This is a schematic diagram of the internal negative electrode block provided in an embodiment of the present invention;

[0075] Figure 16 This is a schematic diagram of the structure of the external positive electrode block provided in an embodiment of the present invention;

[0076] Figure 17-18 This is a schematic diagram of the structure of a portion of the carrier device provided in an embodiment of this utility model.

[0077] Figure label:

[0078] 1. Base, 2. Carrier device, 3. Electrode device, 4. Lifting device, 5. Device under test, 6. Positive electrode test area, 7. Negative electrode test area, 8. Alignment guide hole, 9. Conductive silicone, 10. Sliding device.

[0079] Second base 201, internal positive electrode block 202, internal negative electrode block 203, external positive electrode block 204, external negative electrode block 205, displacement mechanism 206;

[0080] First base 301, upper positive electrode block 302, upper negative electrode block 303, mounting block 304, guide rail mechanism 305, spring 306, alignment guide post 307;

[0081] First internal positive electrode section 2021, second internal positive electrode section 2022;

[0082] First internal negative electrode section 2031, second internal negative electrode section 2032. Detailed Implementation

[0083] To illustrate the possible application scenarios, technical principles, implementable specific solutions, and achievable objectives and effects of this application in detail, the following description, in conjunction with the listed specific embodiments and accompanying drawings, provides a detailed explanation. The embodiments described herein are merely illustrative of the technical solutions of this application and are therefore intended to limit the scope of protection of this application.

[0084] In this document, the term "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The term "embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment, nor does it specifically limit its independence or connection with other embodiments. In principle, in this application, as long as there are no technical contradictions or conflicts, the technical features mentioned in each embodiment can be combined in any way to form corresponding implementable technical solutions.

[0085] Unless otherwise defined, the technical terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the use of related terms herein is merely for the purpose of describing particular embodiments and is not intended to limit this application.

[0086] In the description of this application, the term "and / or" is used to describe the logical relationship between objects, indicating that three relationships can exist. For example, A and / or B means: A exists, B exists, and A and B exist simultaneously. Additionally, the character " / " in this document generally indicates that the preceding and following objects have an "or" logical relationship.

[0087] In this application, terms such as “first” and “second” are used only to distinguish one entity or operation from another, and do not necessarily require or imply any actual quantity, hierarchy or order relationship between these entities or operations.

[0088] Unless otherwise specified, the use of terms such as “comprising,” “including,” “having,” or other similar expressions in this application is intended to cover non-exclusive inclusion, which does not exclude the presence of additional elements in a process, method, or product that includes the stated elements, such that a process, method, or product that includes a list of elements may include not only those defined elements but also other elements not expressly listed, or elements inherent to such a process, method, or product.

[0089] In this application, expressions such as "greater than", "less than", and "exceeding" are understood to exclude the stated number; expressions such as "above", "below", and "within" are understood to include the stated number. Furthermore, in the description of the embodiments of this application, "multiple" means two or more (including two), and similar expressions related to "multiple" are also understood in this way, such as "multiple groups" and "multiple times", unless otherwise explicitly specified.

[0090] In the description of the embodiments of this application, the space-related expressions used, such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "vertical," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," indicate the orientation or positional relationship based on the orientation or positional relationship shown in the specific embodiments or drawings. They are only for the purpose of describing the specific embodiments of this application or for the reader's understanding, and do not indicate or imply that the device or component referred to must have a specific position, a specific orientation, or be constructed or operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0091] Unless otherwise expressly specified or limited, the terms "installation," "connection," "linking," "fixing," and "setting," as used in the description of the embodiments of this application, should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral setting; it can be a mechanical connection, an electrical connection, or a communication connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two components or the interaction between two components. For those skilled in the art to which this application pertains, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0092] Please refer to Figure 2 This utility model provides an automated high-voltage testing device, the overall structure and functional implementation scheme of which are as follows:

[0093] This automated high-voltage testing equipment consists of four core modules: a base 1, a carrier device 2, an electrode device 3, and a lifting device 4. The base 1 serves as the fundamental support structure for the entire testing machine, bearing the installation and operation of the other functional modules. The carrier device 2 and the lifting device 4 are securely mounted on the base 1 via precise mechanical connections, ensuring the relative positional accuracy and operational stability of each component. The electrode device 3 is mounted on the lifting device 4, forming a complete testing execution unit.

[0094] The carrier device 2 employs high-strength, high-rigidity materials and structural design, possessing excellent load-bearing capacity and stability. Its function is to provide a stable and reliable placement platform for the device under test (DUT) 5, ensuring that the DUT 5 will not shift or shake due to external forces during the testing process, thereby guaranteeing the accuracy of the test data. The electrode device 3, as the application end of the high-voltage electrical signal, through a precise electrical connection and control system, can apply a high-voltage electrical signal of specific amplitude and waveform to the DUT 5 according to preset test parameters, thereby realizing high-voltage testing of the insulation performance of the insulation plating layer of the DUT 5.

[0095] The lifting device 4, as a key actuator of the testing machine, adopts a high-precision electric or pneumatic drive, featuring rapid response and precise control. Its function is to drive the electrode device 3 to achieve precise contact and separation with the device under test (DUT) 5 according to the requirements of the testing process. At the start of the test, the lifting device 4 drives the electrode device 3 to descend smoothly, establishing a reliable electrical connection between the electrode and the DUT 5. After the test, the lifting device 4 drives the electrode device 3 to rise rapidly, achieving safe separation from the DUT 5 and preparing for the next test.

[0096] The technical advantages and functional characteristics of this embodiment should be highlighted as follows:

[0097] First, this embodiment fully incorporates the concept of automated operation. Through the precise control of the contact and separation process between the electrode device 3 and the device under test 5 via the lifting device 4, the testing process is automated and intelligent. This innovative design not only fundamentally eliminates potential safety hazards during manual operation, such as the risk of electric shock and equipment damage, but also significantly improves the safety and reliability of the testing process, providing strong protection for the personal safety of testing personnel and the stable operation of the equipment.

[0098] Secondly, the stable design of the carrier device 2 is a key factor in ensuring the stability of the testing process. Through precise mechanical structure and material selection, it achieves robust support and accurate positioning of the device under test 5, effectively avoiding interference from factors such as device shaking and displacement. At the same time, the stable design also improves the accuracy and repeatability of the test results, making test data from different batches and under different conditions highly comparable and reliable, providing a solid foundation for subsequent data analysis and quality assessment.

[0099] Furthermore, the introduction of automated operation mode greatly improves testing efficiency. In the context of large-scale, high-efficiency testing needs, this embodiment can quickly and accurately complete a series of testing tasks thanks to its automated workflow. Compared to traditional manual testing methods, automated operation significantly reduces the number and frequency of manual interventions, reducing testing errors caused by human factors such as operator fatigue, lack of concentration, and differences in operating techniques. This not only improves the accuracy and reliability of test data but also greatly shortens the testing cycle, meeting the urgent needs of modern industrial production for rapid and accurate testing.

[0100] Finally, the structural design of this testing machine perfectly combines compactness and rationality. Its overall layout has been carefully planned and optimized, with all components working in tandem to maximize space utilization and optimize functionality. This compact design not only facilitates equipment installation and transportation but also provides operators with a convenient and comfortable operating environment. Furthermore, the rational structural design simplifies maintenance and upkeep, reducing maintenance costs and downtime, and further improving equipment efficiency and economic benefits.

[0101] In summary, the automated high-voltage testing equipment provided by this invention offers a novel solution for high-voltage testing of the insulation performance of insulating coatings, thanks to its high efficiency, safety, and reliability. This solution not only helps improve the overall level and quality of testing work but also promotes the standardization and intelligent development of testing technology, injecting new vitality into the technological progress and industrial upgrading of related industries.

[0102] Please refer to this again. Figure 1 and in conjunction with references Figure 3-4 In one embodiment of this example, the electrode device 3 is specifically composed of a first base 301, an upper positive electrode block 302, and an upper negative electrode block 303.

[0103] The first base 301 is securely mounted on the lifting device 4;

[0104] Furthermore, the upper positive electrode block 302 and the upper negative electrode block 303 are mounted side by side on the first base 301;

[0105] Specifically, the upper positive electrode block 302 has the important responsibility of applying a high voltage signal to the upper surface of the positive test area 6 of the device under test 5;

[0106] The upper negative electrode block 303 is responsible for receiving the high-voltage electrical signal transmitted from the upward-facing side of the negative electrode test area 7 of the device under test 5, so as to form a complete electrical circuit with the upper positive electrode block 302.

[0107] Please refer to this again. Figure 3-4 In one embodiment of this invention, the electrode device 3 not only includes the components described above, but also further adds key components such as a mounting block 304, a guide rail mechanism 305, and a spring 306.

[0108] Specifically, the upper positive electrode block 302 and the upper negative electrode block 303 are respectively securely mounted on an independent mounting block 304, ensuring accurate and stable positioning of the electrode blocks.

[0109] Furthermore, the side of the mounting block 304 is slidably connected to the first base 301 through the guide rail mechanism 305. This design allows the mounting block 304 to move flexibly in a specific direction, laying the foundation for subsequent buffering and movement functions.

[0110] Meanwhile, the top of the mounting block 304 forms an elastic abutment relationship with the first base 301 through the spring 306. This structural configuration allows the spring 306 to play its buffering role under specific conditions.

[0111] Specifically, when the upper positive electrode block 302 and the upper negative electrode block 303 come into contact with the device under test 5, the spring 306 can effectively absorb and disperse the impact force generated during the contact process, thereby providing necessary buffer protection for the contact between the electrode block and the device under test 5, and preventing damage to the equipment or distortion of the test results due to excessive impact force.

[0112] Furthermore, the guide rail mechanism 305 plays a crucial role in the buffering process. It not only ensures that the upper positive electrode block 302 and the upper negative electrode block 303 can move smoothly and accurately in the vertical direction when subjected to the action of the spring 306, but also effectively limits the displacement of the electrode blocks in other directions, thereby ensuring the stability and reliability of the testing process.

[0113] Please refer to this again. Figure 3-4In one embodiment of this invention, in order to ensure that the electrode device 3 and the carrier device 2 can achieve accurate and stable docking, the mounting block 304 is specially equipped with a key structure called the alignment guide post 307.

[0114] Specifically, the alignment guide post 307 is precisely positioned on the mounting block 304, and its position and size are carefully designed and calculated to ensure a perfect fit with the corresponding structure on the subsequent carrier device 2.

[0115] Meanwhile, the carrier device 2 is also provided with a corresponding alignment guide hole 8 that cooperates with the alignment guide post 307. The opening position, diameter, and depth of the alignment guide hole 8 are strictly matched with the alignment guide post 307 to ensure seamless connection and precise positioning during the docking process.

[0116] The tight fit between the alignment guide post 307 and the alignment guide hole 8 not only effectively improves the docking accuracy and stability between the electrode device 3 and the carrier device 2, but also significantly reduces the risk of test errors or equipment damage caused by docking deviations. Furthermore, this design provides strong support for subsequent automated testing processes, making the entire testing process more efficient and reliable.

[0117] In one specific embodiment provided in this example, in order to further improve the automation control accuracy and testing safety of the electrode device 3, a distance sensing device, a key component, is specially added to the electrode device 3.

[0118] Specifically, the distance sensing device is precisely installed on the lifting device 4, and its position is carefully selected and adjusted to ensure that it can sense the specific distance changes of the upper positive electrode block 302 and the upper negative electrode block 303 during the descent process in real time and accurately.

[0119] This distance sensing device employs advanced sensor technology and signal processing algorithms to monitor the descent distance of the electrode blocks in real time and feed the relevant data back to the control system. Through precise analysis of this data, the control system can accurately determine whether the upper positive electrode block 302 and the upper negative electrode block 303 have made effective contact with the device under test 5.

[0120] This design not only effectively improves the automation and control accuracy of the testing process, but also greatly enhances its safety. By monitoring the descent distance of the electrode block in real time, the control system can adjust the operating status of the lifting device 4 in a timely manner, avoiding damage to the electrode block and the device under test 5 or distortion of test results due to excessive descent. Simultaneously, this design provides strong support for subsequent fault diagnosis and preventative maintenance, helping to extend the equipment's service life and reduce maintenance costs.

[0121] Please refer to Figure 5-16 In one embodiment of this invention, the carrier device 2 is designed to fully consider the diverse testing requirements of the device under test 5, and its structure is sophisticated and its functions are complete. Specifically, the carrier device 2 is mainly composed of key components such as a second base 201, an internal positive electrode block 202, an internal negative electrode block 203, an external positive electrode block 204, and an external negative electrode block 205.

[0122] The second base 201 serves as the basic support structure of the carrier device 2 and is securely mounted on the base 1, providing a stable working platform for the entire carrier device 2.

[0123] The internal positive electrode block 202 and the internal negative electrode block 203 are arranged side by side on the second base 201, and their design fully considers the internal electrode layout of the device under test 5. Specifically, the internal positive electrode block 202 includes a first internal positive electrode portion 2021 and a second internal positive electrode portion 2022 arranged vertically, while the internal negative electrode block 203 includes a first internal negative electrode portion 2031 and a second internal negative electrode portion 2032 arranged vertically.

[0124] During assembly, the device under test (DUT) 5 is precisely fitted onto the first internal positive electrode portion 2021 and the first internal negative electrode portion 2031, and their positional relationship is carefully designed to ensure that the first internal positive electrode portion 2021 can accurately align with the inward-facing surface of the positive electrode test area 6 of the DUT 5, and the first internal negative electrode portion 2031 can tightly fit with the inward-facing surface of the negative electrode test area 7 of the DUT 5. Simultaneously, the second internal positive electrode portion 2022 and the second internal negative electrode portion 2032 are respectively positioned corresponding to the downward-facing surfaces of the positive electrode test area 6 and the negative electrode test area 7 of the DUT 5, to achieve comprehensive internal and lower electrode coverage.

[0125] In terms of functionality, the first internal positive electrode 2021 is responsible for applying a high-voltage electrical signal to the inward-facing side of the positive test area 6 of the device under test 5, while the first internal negative electrode 2031 is responsible for receiving the high-voltage electrical signal transmitted from the inward-facing side of the negative test area 7 of the device under test 5, so as to form a complete electrical circuit with the first internal positive electrode 2021. The second internal positive electrode 2022 and the second internal negative electrode 2032 are respectively responsible for applying the high-voltage electrical signal to the downward-facing side of the positive test area 6 and the negative test area 7 of the device under test 5.

[0126] In addition, to meet the external electrode testing requirements of the device under test (DUT) 5, the carrier device 2 is also specially provided with an external positive electrode block 204 and an external negative electrode block 205. These two are also arranged side by side on the second base 201. The external positive electrode block 204 is responsible for applying a high-voltage electrical signal to the outward-facing side of the positive electrode test area 6 of the DUT 5, while the external negative electrode block 205 is responsible for receiving the high-voltage electrical signal transmitted from the outward-facing side of the negative electrode test area 7 of the DUT 5, so as to form a complete electrical circuit with the external positive electrode block 204.

[0127] Through the above design, the carrier device 2 realizes the function of all-round, multi-angle electrode coverage and testing of the device under test 5, providing strong technical support for the performance evaluation and quality inspection of the device under test 5.

[0128] Please refer to this again. Figure 5-7 ,as well as Figure 11-12 In one embodiment of this example, in order to further improve the testing flexibility and adaptability of the carrier device 2, the carrier device 2 is specially equipped with a key component called displacement mechanism 206.

[0129] Specifically, the external positive electrode block 204 and the external negative electrode block 205 are not directly fixed to the second base 201, but are connected and positioned to the second base 201 respectively through the displacement mechanism 206. This design allows the external positive electrode block 204 and the external negative electrode block 205 to move flexibly according to actual needs during the testing process.

[0130] The displacement mechanism 206, as the core component for moving the external electrode blocks, operates based on advanced driving technology and precise mechanical structure design. During testing, when the external positive electrode block 204 and the external negative electrode block 205 need to contact the outward-facing surfaces of the positive test area 6 and the negative test area 7 of the device under test 5, the displacement mechanism 206 can drive the external positive electrode block 204 and the external negative electrode block 205 to move smoothly towards the device under test 5 according to a preset trajectory and speed until they achieve close contact.

[0131] Conversely, when the test is completed or the device under test 5 needs to be replaced, the displacement mechanism 206 can also move the external positive electrode block 204 and the external negative electrode block 205 away from the device under test 5 along the opposite movement trajectory and speed until the two are completely separated, which provides convenience for subsequent test operations or equipment maintenance.

[0132] Through the above design, the displacement mechanism 206 not only effectively improves the testing flexibility and adaptability of the carrier device 2, enabling the testing process to be flexibly adjusted according to the electrode layout and testing requirements of different devices under test 5, but also significantly improves testing efficiency and accuracy, reducing errors and uncertainties caused by manual operation. At the same time, this design also provides strong support for subsequent automated testing processes, making the entire testing process more efficient and reliable.

[0133] Please refer to this again. Figure 13-16 In one embodiment of this invention, in order to ensure stable and reliable contact between the electrode block and the device under test 5 and to effectively improve the signal transmission quality during the test, conductive silicone 9 is specially added as a key component at the key positions of contact between the upper positive electrode block 302, the upper negative electrode block 303, the first internal positive electrode part 2021, the second internal positive electrode part 2022, the first internal negative electrode part 2031, the second internal negative electrode part 2032, the external positive electrode block 204, and the external negative electrode block 205 and the device under test 5.

[0134] Specifically, the conductive silicone 9, with its excellent conductivity and good elasticity, is precisely attached to the contact surface between each electrode block and the device under test 5. Its thickness has been carefully designed and optimized, ultimately determined to be 0.2 mm. This thickness ensures that the conductive silicone 9 deforms appropriately under pressure, thereby filling the tiny gaps between the electrode block and the device under test 5 to achieve close contact; it also avoids signal transmission delays or energy loss due to excessive thickness.

[0135] By adding conductive silicone 9, the contact stability and reliability between the electrode block and the device under test 5 are effectively improved, reducing the risk of test errors or equipment failures caused by poor contact. It also significantly improves the signal transmission quality during the test, enabling the high-voltage signal to be transmitted to the corresponding test area of ​​the device under test 5 more efficiently and accurately, thereby improving the accuracy and reliability of the test.

[0136] Meanwhile, conductive silicone 9 also has good wear resistance and corrosion resistance, and can maintain stable conductivity and mechanical properties during long-term use, further extending the service life of electrode devices and carrier devices and reducing maintenance costs.

[0137] Please refer to Figure 17-18 In one embodiment of this invention, in order to ensure that the electrode blocks can effectively avoid the risk of short circuits and maintain good electromagnetic compatibility during the test, the gap between the electrode blocks is precisely set.

[0138] Specifically, the gap between the upper positive electrode block 302 and the upper negative electrode block 303 is strictly controlled within the range of 1.0 to 1.17 mm. This gap setting fully considers the size and shape of the electrode blocks and the electrical characteristics required during the testing process. It ensures that the positive and negative electrodes will not short-circuit due to excessive distance during high-voltage signal transmission, and effectively reduces electromagnetic interference and signal attenuation caused by excessive distance between the electrodes.

[0139] Similarly, the gap between the internal positive electrode block 202 and the internal negative electrode block 203, as well as the gap between the external positive electrode block 204 and the external negative electrode block 205, are all set to 1.0–1.17 mm. This unified gap setting standard not only simplifies the design and manufacturing process of the electrode device and the carrier device, improving production efficiency and consistency, but also ensures that the electrode blocks maintain a stable electrical gap under different testing scenarios, thereby guaranteeing the accuracy and reliability of the test results.

[0140] Through the aforementioned gap setting, the electrode device and carrier device in this embodiment exhibited excellent electrical performance and stability during testing. This design not only effectively improves testing efficiency and accuracy but also provides strong support for subsequent automated testing processes, making the entire testing process more efficient and reliable. Furthermore, this design fully considers the wear and deformation of the electrode blocks during long-term use, ensuring the long-term stability and reliability of the gap between the electrode blocks.

[0141] Please refer to this again. Figure 2In one embodiment of this example, in order to further optimize the testing process and improve the automation level of the equipment, a key component, a sliding device 10, is specially added.

[0142] Specifically, the carrier device 2 is not directly fixed to the base 1, but is flexibly connected and positioned to the base 1 through the sliding device 10. This design allows the carrier device 2 to be precisely displaced according to actual needs during testing, thereby meeting the positional requirements of different testing stages.

[0143] The sliding device 10, as the core component for realizing the displacement of the carrier device 2, is designed based on advanced mechanical transmission technology and precision manufacturing processes. Specifically, the sliding device 10 includes two main parts: a slide rail and a slider. The slide rail, serving as the moving track of the carrier device 2, is securely fixed on the base 1, providing a stable moving path for the carrier device 2. The slider is fixedly connected to the carrier device 2 and can slide smoothly along the slide rail, thereby driving the carrier device 2 to achieve precise displacement.

[0144] During testing, when the carrier device 2 needs to be moved from the loading position to below the electrode device 3, the sliding device 10 can smoothly and accurately move the carrier device 2 to the designated position according to a preset movement trajectory and speed. Conversely, when the test is completed or the device under test 5 needs to be replaced, the sliding device 10 can also move the carrier device 2 back from below the electrode device 3 to the loading position according to the opposite movement trajectory and speed, providing convenience for subsequent testing operations or equipment maintenance.

[0145] Through the above design, the sliding device 10 not only effectively improves the automation level of the testing process and reduces manual intervention and operational errors, but also significantly improves testing efficiency and accuracy, making the entire testing process more efficient and reliable. At the same time, this design provides strong support for subsequent intelligent upgrades and expansions, enabling the equipment to better adapt to future changes and developments in testing needs.

[0146] Although this application frequently uses terms such as lifting device and base, the possibility of using other terms is not excluded. These terms are used merely for the convenience of describing and explaining the essence of this utility model; interpreting them as any additional limitation would contradict the spirit of this utility model.

[0147] This utility model provides an automated high-voltage testing device that achieves significant benefits through its innovative design. Firstly, the device enables comprehensive, multi-angle electrode coverage and testing of all surfaces (including inward, downward, outward, and upward) of the positive and negative testing areas of the device under test, effectively solving the problem of test omissions in existing technologies and ensuring the comprehensiveness and accuracy of test results. Secondly, automated operation significantly improves testing efficiency, reduces manual intervention, and meets the needs of large-scale production. Furthermore, by precisely controlling the contact between the electrodes and the device under test, the device avoids testing errors caused by inaccurate contact or uneven pressure, improving the stability and repeatability of test results. More importantly, the automated design reduces direct contact between testing personnel and high-voltage electrodes, significantly reducing the risk of electric shock and ensuring the personal safety of testing personnel. In summary, this utility model not only improves the efficiency and safety of high-voltage testing but also ensures the comprehensiveness and accuracy of test results, providing an efficient and reliable solution for insulation performance testing in modern industrial production.

[0148] Finally, it should be noted that although the above embodiments have been described in the text and drawings of this application, this should not limit the scope of patent protection of this application. Any technical solutions that are based on the essential concept of this application and utilize the content described in the text and drawings of this application, resulting in equivalent structural or procedural substitutions or modifications, as well as the direct or indirect application of the technical solutions of the above embodiments to other related technical fields, are all included within the scope of patent protection of this application.

Claims

1. An automated high-voltage testing device, characterized in that, It includes a carrier device (2) and an electrode device (3); wherein, The carrier device (2) is used to carry the device under test (5) and apply a high voltage signal to the inward, downward and outward surfaces of the positive test area (6) and negative test area (7) of the device under test (5) to perform a high voltage test on the insulation performance of the insulating coating of the device under test (5). The electrode device (3) is used to apply a high voltage signal to the upward-facing side of the positive test area (6) and negative test area (7) of the device under test (5) to perform a high voltage test on the insulation performance of the insulating coating of the device under test (5).

2. The automated high-voltage testing equipment according to claim 1, characterized in that, It also includes a base (1) and a lifting device (4); The carrier device (2) and the lifting device (4) are respectively mounted on the base (1); The electrode device (3) is mounted on the lifting device (4); The lifting device (4) is used to lower the electrode device (3) to contact the device under test (5) and to raise the electrode device (3) to separate it from the device under test (5).

3. The automated high-voltage testing equipment according to claim 2, characterized in that, The electrode device (3) includes a first base (301), an upper positive electrode block (302), and an upper negative electrode block (303). The first base (301) is mounted on the lifting device (4); The upper positive electrode block (302) and the upper negative electrode block (303) are arranged side by side on the first base (301); The upper positive electrode block (302) is used to apply a high voltage signal to the upward-facing side of the positive test area (6) of the device under test (5); The upper negative electrode block (303) is used to receive the high voltage signal transmitted from the upward side of the negative test area (7) of the device under test (5) to form a complete electrical circuit with the upper positive electrode block (302).

4. The automated high-voltage testing equipment according to claim 3, characterized in that, The electrode device (3) also includes a mounting block (304), a guide rail mechanism (305), and a spring (306). The upper positive electrode block (302) and the upper negative electrode block (303) are respectively disposed on a mounting block (304); The side of the mounting block (304) is mounted on the first base (301) via the guide rail mechanism (305); The top of the mounting block (304) abuts against the first base (301) via the spring (306); The spring (306) is used to provide a buffer when the upper positive electrode block (302) and the upper negative electrode block (303) come into contact with the device under test (5) respectively; The guide rail mechanism (305) is used to guide the upper positive electrode block (302) and the upper negative electrode block (303) to move smoothly in the vertical direction during buffering. The mounting block (304) is provided with an alignment guide post (307); The carrier device (2) is provided with an alignment guide hole (8) that cooperates with the alignment guide post (307).

5. The automated high-voltage testing equipment according to claim 4, characterized in that, The carrier device (2) includes a second base (201), an internal positive electrode block (202), an internal negative electrode block (203), an external positive electrode block (204), and an external negative electrode block (205). The second base (201) is disposed on the base (1); The internal positive electrode block (202) and the internal negative electrode block (203) are arranged side by side on the second base (201); The internal positive electrode block (202) includes a first internal positive electrode portion (2021) and a second internal positive electrode portion (2022) arranged vertically. The internal negative electrode block (203) includes a first internal negative electrode part (2031) and a second internal negative electrode part (2032) arranged vertically. The device under test (5) is sleeved on the first internal positive electrode part (2021) and the first internal negative electrode part (2031), and the first internal positive electrode part (2021) is disposed on the inward side of the positive electrode test area (6) of the device under test (5), and the first internal negative electrode part (2031) is disposed on the inward side of the negative electrode test area (7) of the device under test (5). The second internal positive electrode portion (2022) is provided on the downward-facing side of the positive electrode test area (6) of the device under test (5), and the second internal negative electrode portion (2032) is provided on the downward-facing side of the negative electrode test area (7) of the device under test (5). The first internal positive electrode portion (2021) is used to apply a high voltage signal to the inward-facing side of the positive test area (6) of the device under test (5); The first internal negative electrode section (2031) is used to receive the high voltage signal transmitted from the inward side of the negative electrode test area (7) of the device under test (5) to form a complete electrical circuit with the first internal positive electrode section (2021). The second internal positive electrode portion (2022) is used to apply a high voltage electrical signal to the downward-facing side of the positive test area (6) of the device under test (5); The second internal negative electrode section (2032) is used to receive the high voltage signal transmitted from the downward side of the negative electrode test area (7) of the device under test (5) to form a complete electrical circuit with the second internal positive electrode section (2022); The external positive electrode block (204) and the external negative electrode block (205) are arranged side by side on the second base (201); The external positive electrode block (204) is used to apply a high voltage signal to the outward-facing side of the positive test area (6) of the device under test (5); The external negative electrode block (205) is used to receive the high voltage signal transmitted from the outward side of the negative test area (7) of the device under test (5) to form a complete electrical circuit with the external positive electrode block (204).

6. The automated high-voltage testing equipment according to claim 5, characterized in that, The carrier device (2) also includes a displacement mechanism (206); The external positive electrode block (204) and the external negative electrode block (205) are respectively mounted on the second base (201) via the displacement mechanism (206); The displacement mechanism (206) is used to move the external positive electrode block (204) and the external negative electrode block (205) in a direction close to the device under test (5) so as to contact the outward-facing sides of the positive test area (6) and the negative test area (7) of the device under test (5) respectively, and to move the external positive electrode block (204) and the external negative electrode block (205) in a direction away from the device under test (5) so as to separate from the outward-facing sides of the positive test area (6) and the negative test area (7) of the device under test (5) respectively.

7. The automated high-voltage testing equipment according to claim 5, characterized in that, Conductive silicone (9) is provided at the positions where the upper positive electrode block (302), upper negative electrode block (303), first internal positive electrode part (2021), second internal positive electrode part (2022), first internal negative electrode part (2031), second internal negative electrode part (2032), external positive electrode block (204) and external negative electrode block (205) respectively contact the device under test (5); The thickness of the conductive silicone (9) is 0.2 mm.

8. The automated high-voltage testing equipment according to claim 5, characterized in that, The gap between the upper positive electrode block (302) and the upper negative electrode block (303) is 1.0 to 1.17 mm; The gap between the internal positive electrode block (202) and the internal negative electrode block (203) is 1.0 to 1.17 mm; The gap between the external positive electrode block (204) and the external negative electrode block (205) is 1.0 to 1.17 mm.

9. The automated high-voltage testing equipment according to claim 2, characterized in that, It also includes a sliding device (10); The carrier device (2) is mounted on the base (1) via the sliding device (10); The sliding device (10) is used to move the carrier device (2) from the upper material position to below the electrode device (3), and to move the carrier device (2) from below the electrode device (3) to the upper material position; The sliding device (10) includes a slide rail and a slider. The slide rail is fixedly mounted on the base (1), and the slider is fixedly connected to the carrier device (2) and can slide along the slide rail to realize the movement of the carrier device (2).

10. The automated high-voltage testing equipment according to claim 3, characterized in that, The electrode device (3) also includes a distance sensing device; The distance sensing device is mounted on the lifting device (4); The distance sensing device is used to sense the descent distance of the upper positive electrode block (302) and the upper negative electrode block (303) to detect whether the upper positive electrode block (302) and the upper negative electrode block (303) are in contact with the device under test (5) respectively.

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