A test fixture for KGD chips

By designing an adjustable test fixture and an electromagnet fixing function, the problem of insufficient applicability of existing fixtures was solved, enabling efficient and stable testing of KGD chips of different sizes, thereby improving production efficiency and testing quality.

CN224399435UActive Publication Date: 2026-06-23SUZHOU STAR TEST SEMICON CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SUZHOU STAR TEST SEMICON CO LTD
Filing Date
2025-05-30
Publication Date
2026-06-23

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    Figure CN224399435U_ABST
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Abstract

The utility model discloses a kind of test fixture of KGD chip, including support plate, the top of support plate is fixedly installed with fixed clamping plate, the top of support plate is equipped with sliding slot, the inside sliding of sliding slot is installed with sliding block, the top of sliding block is fixedly installed with moving clamping plate, the side of moving clamping plate is fixedly installed with mounting plate, the top of mounting plate is fixedly installed with inner sleeve column one;By rotating rotating disc, the position of moving clamping plate can be flexibly adjusted, so that the clamping rubber pad of the side of moving clamping plate is contacted with the end of KGD chip away from fixed clamping plate, so as to clamp KGD chip, so as to be applicable to clamping KGD chip of different size specifications, without frequently replacing fixture or carrying out complex debugging, greatly improve the efficiency and flexibility of detection work, reduce production cost and operation difficulty and can be applicable to clamping KGD chip of different size, improve the applicability of device.
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Description

Technical Field

[0001] This utility model relates to the field of KGD chip manufacturing technology, specifically a testing fixture for KGD chips. Background Technology

[0002] In today's booming semiconductor industry, chips, as core components of various electronic devices, directly determine the overall performance of these devices through their quality and performance. KGD chips, being unpackaged bare chips, require comprehensive and accurate testing before entering the subsequent packaging process. Effective testing allows for the early screening of defective or substandard chips, preventing unqualified products from being used in later production stages, thereby reducing production costs, improving efficiency, and ensuring the quality and reliability of the final electronic products.

[0003] Many existing test fixtures are designed in a relatively simple way, and are only suitable for chips of a specific size or type. When it is necessary to test KGD chips of different sizes and pin layouts, it is necessary to frequently change fixtures or perform complex debugging, which not only increases the difficulty of operation and time costs, but also reduces production efficiency. Utility Model Content

[0004] The purpose of this invention is to provide a testing fixture for KGD chips to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a test fixture for KGD chips, comprising a support plate, a fixed clamping plate fixedly installed on the top of the support plate, a sliding groove formed on the top of the support plate, a sliding block slidably installed inside the sliding groove, a movable clamping plate fixedly installed on the top of the sliding block, an mounting plate fixedly installed on one side of the movable clamping plate, an inner sleeve post one fixedly installed on the top of the mounting plate, a push-pull rod rotatably installed on the outer side of the inner sleeve post one, a rotating column rotatably installed on the top of the support plate, a rotating disk fixedly installed on the top of the rotating column, an adjusting rod fixedly installed on the outer side of the rotating disk, and an inner sleeve post two fixedly installed on the top of the adjusting rod.

[0006] Preferably, the end of the push-pull rod away from the inner sleeve column one is movably sleeved and installed on the outside of the inner sleeve column two, and clamping rubber pads are fixedly installed on the opposite sides of the fixed clamping plate and the movable clamping plate.

[0007] Preferably, a handle is fixedly installed on the top of the rotating disk, an ear block is fixedly installed on the outer side of the rotating disk, and a fixing clamping plate is fixedly installed on the bottom of the ear block.

[0008] Preferably, an electromagnet is fixedly installed on the top of the support plate, a battery is installed on the top of the support plate, and a switch button is installed on the top of the support plate. The battery, switch button, and electromagnet are connected in series in the same circuit, and the magnetic poles at the top of the electromagnet are opposite to those at the bottom of the ear block.

[0009] Preferably, the sliding block has a sliding hole inside, the sliding groove has a sliding rod fixedly installed inside, and the sliding block is slidably sleeved on the outside of the sliding rod through the sliding hole.

[0010] Preferably, the bottom of the support plate is fixedly equipped with four support legs, which are installed in a rectangular symmetrical manner at the bottom of the support plate.

[0011] Compared with the prior art, the beneficial effects of this utility model are: the position of the movable clamping plate can be flexibly adjusted by rotating the rotating disk, so that the clamping rubber pad on one side of the movable clamping plate contacts the end of the KGD chip away from the fixed clamping plate, thereby clamping the KGD chip. This makes it suitable for clamping KGD chips of different sizes and specifications, without the need for frequent clamping changes or complex debugging, which greatly improves the efficiency and flexibility of the testing work, reduces production costs and operating difficulty, and can be used to clamp KGD chips of different sizes, thus improving the applicability of the device.

[0012] Furthermore, rotating the rotating disk causes the ear block to rotate, thereby moving the fixed magnet on top of the electromagnet. When the opposite sides of the fixed clamping plate and the moving clamping plate come into contact with the two ends of the KGD chip, the battery can be activated by the switch button to power the electromagnet, giving it magnetic force. This magnetic force then applies an attraction force to the fixed magnet, thus fixing the rotating disk and fixing the position of the moving clamping plate. This effectively prevents the KGD chip from moving due to any minor vibration or external interference, ensuring the accuracy and reliability of the test data and greatly improving the device's performance and testing quality. Attached Figure Description

[0013] Figure 1 This is a three-dimensional structural diagram of the present utility model.

[0014] Figure 2 This is a top-view three-dimensional structural diagram of the present invention.

[0015] Figure 3 This is a three-dimensional structural diagram of the present invention viewed from below.

[0016] Figure 4 This is a partial three-dimensional structural diagram of the present invention.

[0017] In the diagram: 1. Support plate; 2. Fixed clamping plate; 3. Movable clamping plate; 4. Clamping rubber pad; 5. Inner sleeve post one; 6. Push-pull rod; 7. Sliding groove; 8. Inner sleeve post two; 9. Adjusting rod; 10. Hand grip rod; 11. Ear block; 12. Battery; 13. Rotating disk; 14. Switch button; 15. Electromagnet; 16. Support leg; 17. Mounting plate; 18. Sliding block; 19. Sliding hole; 20. Fixed magnet; 21. Rotating column; 22. Sliding rod. Detailed Implementation

[0018] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0019] Please see Figures 1-4 This utility model provides a technical solution: a test fixture for KGD chips, including a support plate 1, a fixed clamping plate 2 fixedly installed on the top of the support plate 1, a sliding groove 7 opened on the top of the support plate 1, a sliding block 18 slidably installed inside the sliding groove 7, a movable clamping plate 3 fixedly installed on the top of the sliding block 18, an mounting plate 17 fixedly installed on one side of the movable clamping plate 3, an inner sleeve post 5 fixedly installed on the top of the mounting plate 17, a push-pull rod 6 rotatably installed on the outer side of the inner sleeve post 5, a rotating post 21 rotatably installed on the top of the support plate 1, a rotating disk 13 fixedly installed on the top of the rotating post 21, an adjusting rod 9 fixedly installed on the outer side of the rotating disk 13, an inner sleeve post 8 fixedly installed on the top of the adjusting rod 9, and the end of the push-pull rod 6 away from the inner sleeve post 5 is movably sleeved on the outer side of the inner sleeve post 8. Clamping rubber pads 4 are fixedly installed on opposite sides of the fixed clamping plate 2 and the movable clamping plate 3.

[0020] The working principle of the above technical solution is as follows: The KGD chip can be placed on the top of the support plate 1, with one side of the KGD chip in contact with the clamping rubber pad 4 on one side of the fixed clamping plate 2. Then, the rotating disk 13 is manually rotated, thereby driving the adjusting rod 9 to rotate. This, in turn, pushes the push-pull rod 6 to move through the inner sleeve column 2 8. In turn, the push-pull rod 6, the inner sleeve column 1 5, and the mounting plate 17 push the moving clamping plate 3 to move, so that the clamping rubber pad 4 on one side of the moving clamping plate 3 contacts the end of the KGD chip away from the fixed clamping plate 2, thereby clamping the KGD chip for subsequent testing. The position of the moving clamping plate 3 can be flexibly adjusted by rotating the rotating disk 13, making it suitable for clamping KGD chips of different sizes and specifications. This eliminates the need for frequent fixture changes or complex adjustments, greatly improving the efficiency and flexibility of the testing work, reducing production costs and operational difficulty, and making it suitable for clamping KGD chips of different sizes, thus enhancing the applicability of the device.

[0021] In another implementation scheme, such as Figures 1-4 As shown, a handle 10 is fixedly installed on the top of the rotating disk 13, an ear block 11 is fixedly installed on the outside of the rotating disk 13, a fixing clamping plate 2 is fixedly installed on the bottom of the ear block 11, an electromagnet 15 is fixedly installed on the top of the support plate 1, a storage battery 12 is installed on the top of the support plate 1, and a switch button 14 is installed on the top of the support plate 1. The storage battery 12, the switch button 14 and the electromagnet 15 are connected in series in the same circuit, and the magnetic poles at the top of the electromagnet 15 are opposite to the magnetic poles at the bottom of the ear block 11.

[0022] When the rotating disk 13 is rotated, the ear block 11 can be rotated, thereby moving the fixed magnet 20 on top of the electromagnet 15. When the opposite sides of the fixed clamping plate 2 and the movable clamping plate 3 are in contact with the two ends of the KGD chip, the battery 12 can be activated by the switch button 14 to supply power to the electromagnet 15, thereby giving the electromagnet 15 magnetic force. The electromagnet 15 then applies an attraction force to the fixed magnet 20, thereby fixing the rotating disk 13 and fixing the position of the movable clamping plate 3. This effectively prevents the KGD chip from moving due to any slight vibration or external interference, ensuring the accuracy and reliability of the detection data and greatly improving the use effect and detection quality of the device.

[0023] In another implementation scheme, such as Figures 1-4 As shown, the sliding block 18 has a sliding hole 19 inside, the sliding groove 7 has a sliding rod 22 fixedly installed inside, and the sliding block 18 is slidably sleeved on the outside of the sliding rod 22 through the sliding hole 19. The bottom of the support plate 1 has a support leg 16 fixedly installed. There are four support legs 16, and the four support legs 16 are installed in a rectangular symmetrical manner on the bottom of the support plate 1.

[0024] The sliding hole 19 allows the sliding block 18 to slide on the outside of the sliding rod 22, ensuring the stability of the sliding block 18 sliding inside the sliding groove 7. In addition, the staff will regularly clean and maintain the sliding block 18 and the sliding groove 7 to ensure the smoothness of the sliding block 18 sliding inside the sliding groove 7. Furthermore, the support leg 16 can support the support plate 1.

[0025] Working Principle: The KGD chip is placed on top of the support plate 1, with one side of the KGD chip contacting the clamping rubber pad 4 on one side of the fixed clamping plate 2. Then, the rotating disk 13 is manually rotated, causing the adjusting rod 9 to rotate. This, in turn, pushes the push-pull rod 6 through the inner sleeve column 8, which in turn, through the push-pull rod 6, the inner sleeve column 5, and the mounting plate 17, moves the movable clamping plate 3. This causes the clamping rubber pad 4 on one side of the movable clamping plate 3 to contact the end of the KGD chip furthest from the fixed clamping plate 2, thus clamping the KGD chip for subsequent testing. The position of the movable clamping plate 3 can be flexibly adjusted by rotating the rotating disk 13, making it suitable for clamping KGD chips of different sizes and specifications. This eliminates the need for frequent fixture changes or complex adjustments, greatly improving the efficiency and flexibility of the testing process, reducing production costs and operational difficulty. It is also applicable to clamping KGD chips of different sizes, enhancing the device's applicability. Rotating the rotating disk 13 also drives the ear block 11. The rotating plate 13 is fixed, and the moving plate 3 is rotated so that the fixed magnet 20 moves on top of the electromagnet 15. When the opposite sides of the fixed clamping plate 2 and the moving clamping plate 3 are in contact with the two ends of the KGD chip, the battery 12 can be activated by the switch button 14 to supply power to the electromagnet 15, so that the electromagnet 15 has magnetic force. The electromagnet 15 then applies an attraction force to the fixed magnet 20, thereby fixing the rotating plate 13 and fixing the position of the moving clamping plate 3. This effectively prevents the KGD chip from moving due to any slight vibration or external interference, ensuring the accuracy and reliability of the detection data and greatly improving the use effect and detection quality of the device. The sliding hole 19 allows the sliding block 18 to slide on the outside of the sliding rod 22, ensuring the stability of the sliding block 18 sliding inside the sliding groove 7. In addition, the staff will regularly clean and maintain the sliding block 18 and the sliding groove 7 to ensure the smoothness of the sliding block 18 sliding inside the sliding groove 7. The support leg 16 can support the support plate 1.

[0026] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A test fixture for KGD chips, comprising a support plate (1), characterized in that: A fixed clamping plate (2) is fixedly installed on the top of the support plate (1). A sliding groove (7) is opened on the top of the support plate (1). A sliding block (18) is slidably installed inside the sliding groove (7). A movable clamping plate (3) is fixedly installed on the top of the sliding block (18). An installation plate (17) is fixedly installed on one side of the movable clamping plate (3). An inner sleeve column one (5) is fixedly installed on the top of the installation plate (17). A push-pull rod (6) is rotatably installed on the outer side of the inner sleeve column one (5). A rotating column (21) is rotatably installed on the top of the support plate (1). A rotating disk (13) is fixedly installed on the top of the rotating column (21). An adjusting rod (9) is fixedly installed on the outer side of the rotating disk (13). An inner sleeve column two (8) is fixedly installed on the top of the adjusting rod (9).

2. The test fixture for a KGD chip according to claim 1, characterized in that: The end of the push-pull rod (6) away from the inner sleeve column one (5) is movably sleeved and installed on the outside of the inner sleeve column two (8). The fixed clamping plate (2) and the movable clamping plate (3) are both fixedly installed with clamping rubber pads (4) on opposite sides.

3. The test fixture for a KGD chip according to claim 2, characterized in that: A handle (10) is fixedly installed on the top of the rotating disk (13), an ear block (11) is fixedly installed on the outside of the rotating disk (13), and a fixing clamping plate (2) is fixedly installed on the bottom of the ear block (11).

4. The test fixture for a KGD chip according to claim 3, characterized in that: An electromagnet (15) is fixedly installed on the top of the support plate (1), a battery (12) is installed on the top of the support plate (1), and a switch button (14) is installed on the top of the support plate (1). The battery (12), the switch button (14) and the electromagnet (15) are connected in series in the same circuit. The magnetic poles at the top of the electromagnet (15) are opposite to the magnetic poles at the bottom of the ear block (11).

5. The test fixture for a KGD chip according to claim 4, characterized in that: The sliding block (18) has a sliding hole (19) inside, and a sliding rod (22) is fixedly installed inside the sliding groove (7). The sliding block (18) is slidably sleeved on the outside of the sliding rod (22) through the sliding hole (19).

6. The test fixture for a KGD chip according to claim 5, characterized in that: The bottom of the support plate (1) is fixedly equipped with support legs (16), and there are four support legs (16), which are installed in a rectangular symmetrical manner at the bottom of the support plate (1).