Chip rapid detection device
By designing a rapid chip inspection device, which utilizes an inspection camera to automatically detect chip pattern features, the problems of long manual inspection cycles and high false negative rates are solved, achieving efficient chip inspection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU PERFECT INTELLIGENT MFG TECH CO LTD
- Filing Date
- 2025-06-11
- Publication Date
- 2026-06-26
AI Technical Summary
In the current chip manufacturing process, the manual inspection of chip pattern features and identification of chip quality is time-consuming and has a high rate of missed detections, resulting in high maintenance costs in the later stages.
A rapid chip testing device was designed, including a chip tray transport assembly, a testing station, a lifting control assembly, an auxiliary installation assembly, a lateral movement control assembly, and a testing assembly, which utilizes a testing camera for automated testing.
It automates chip inspection, improves inspection efficiency, shortens inspection cycle, and reduces false negative rate and subsequent maintenance costs.
Smart Images
Figure CN224416692U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip manufacturing technology, and in particular to a rapid chip testing device. Background Technology
[0002] A chip, also known as a microcircuit, microchip, or integrated circuit, is a silicon wafer containing integrated circuits. It is very small and is often part of a computer or other electronic device.
[0003] During the chip manufacturing process, it is necessary to check the chip pattern features at any time to identify the quality and quantity of the chips. The chips are placed in a tray. The existing chip inspection process is carried out manually. Manual inspection is time-consuming, has a high rate of missed detection, and has high maintenance costs. Therefore, it is necessary to design a chip rapid inspection device. Utility Model Content
[0004] The purpose of this invention is to solve the above-mentioned problems by designing a rapid chip testing device.
[0005] To achieve the above objectives, the technical solution of this utility model is a chip rapid testing device, comprising a chip tray conveying assembly, a chip tray being disposed on the chip tray conveying assembly, a testing station being disposed on the chip tray conveying assembly, a lifting control assembly being disposed on the chip tray conveying assembly at the testing station, an auxiliary installation assembly being disposed on one side of the chip tray conveying assembly, a lateral movement control assembly being disposed on the auxiliary installation assembly, a movement assembly being disposed at the output end of the lateral movement control assembly, and a testing assembly being disposed on the movement assembly.
[0006] As a further description of this technical solution, the chip tray conveyor assembly includes two mounting profiles, each of which is provided with two drive wheels, and the two drive wheels are connected by a conveyor belt.
[0007] As a further description of this technical solution, the two drive wheels on the mounting profiles are connected by a drive shaft, and a drive motor is provided on the side of the mounting profile, with the output end of the drive motor connected to the drive shaft.
[0008] As a further description of this technical solution, the lifting control component includes a lifting control cylinder disposed on the chip tray conveyor assembly at the detection station.
[0009] As a further description of this technical solution, the auxiliary mounting component includes an auxiliary mounting bracket disposed on one side of the chip tray conveying component, and the auxiliary mounting bracket is provided with a lateral movement control component.
[0010] As a further description of this technical solution, the lateral movement control component includes a lateral movement control module disposed on the auxiliary installation component, and the output end of the lateral movement control module is provided with a movement component.
[0011] As a further description of this technical solution, the moving component includes a moving plate frame disposed at the output end of the lateral movement control component, and a detection component is disposed on the moving plate frame.
[0012] As a further description of this technical solution, the detection component includes a detection camera disposed on the moving component.
[0013] Its beneficial effects are that the chip rapid testing device of this technical solution has an ingenious structural design, strong practicality, and stable operation. Using this chip rapid testing device can replace manual chip inspection, effectively improving chip inspection efficiency and shortening the chip inspection cycle. Attached Figure Description
[0014] Figure 1 This is a schematic diagram of the overall structure of this utility model;
[0015] In the diagram: 1. Chip tray conveyor assembly; 2. Chip tray; 3. Inspection station; 4. Lifting control assembly; 5. Auxiliary installation assembly; 6. Lateral movement control assembly; 7. Movement assembly; 8. Inspection assembly; 9. Installation profile; 10. Drive wheel; 11. Conveyor belt; 12. Drive shaft; 13. Drive motor; 14. Lifting control cylinder; 15. Auxiliary installation bracket; 16. Lateral movement control module; 17. Moving board frame; 18. Inspection camera. Detailed Implementation
[0016] First, let me explain the original intention of this invention. During the chip production process, it is necessary to check the chip pattern features at any time to identify the quality and quantity of the chips. The chips are placed in a tray. The existing chip inspection process is carried out manually. Manual inspection has a long cycle, a high rate of missed detection, and high maintenance costs. Therefore, this invention designs a chip rapid detection device.
[0017] The present invention will now be described in detail with reference to the accompanying drawings, such as... Figure 1As shown, the chip rapid testing device includes a chip tray conveyor assembly 1, on which a chip tray 2 is mounted. The chip tray conveyor assembly 1 will be described in detail below. The chip tray conveyor assembly 1 includes two mounting profiles 9, each mounting profile 9 is provided with two drive wheels 10, the two drive wheels 10 are connected by a conveyor belt 11, and the drive wheels 10 on the two mounting profiles 9 are connected by a drive shaft 12. A drive motor 13 is provided on the side of the mounting profile 9, and the output end of the drive motor 13 is connected to the drive shaft 12.
[0018] To facilitate the identification and detection of chips on the chip tray, a detection station 3 is provided on the chip tray transport assembly 1.
[0019] To facilitate the lifting of the chip tray at the testing station 3, a lifting control component 4 is provided on the chip tray conveying assembly 1 at the testing station 3. The lifting control component 4 will be described in detail below. The lifting control component 4 includes a lifting control cylinder 14 provided on the chip tray conveying assembly 1 at the testing station 3.
[0020] To facilitate the installation of the lateral movement control component 6, an auxiliary installation component 5 is provided on one side of the chip tray conveying component 1. The auxiliary installation component 5 will be described in detail below. The auxiliary installation component 5 includes an auxiliary installation bracket 15 provided on one side of the chip tray conveying component 1, and the lateral movement control component 6 is provided on the auxiliary installation bracket 15.
[0021] To facilitate the control of the lateral movement of the detection component 8, a lateral movement control component 6 is provided on the auxiliary installation component 5. The lateral movement control component 6 will be described in detail below. The lateral movement control component 6 includes a lateral movement control module 16 provided on the auxiliary installation component 5, and a movement component 7 is provided at the output end of the lateral movement control module 16.
[0022] To facilitate the installation of the detection component 8, a moving component 7 is provided at the output end of the lateral movement control component 6. The moving component 7 will be described in detail below. The moving component 7 includes a moving plate frame 17 provided at the output end of the lateral movement control component 6, and the detection component 8 is provided on the moving plate frame 17.
[0023] To facilitate the detection of the features and quantity of the chips, a detection component 8 is provided on the moving component 7. The detection component 8 will be described in detail below. The detection component 8 includes a detection camera 18 disposed on the moving component 7.
[0024] The specific structure of this utility model has been described in detail above. The working principle of this utility model will be explained below: The chip is placed in the chip tray, and the chip tray is placed on the chip tray conveyor assembly 1 for conveying. When it is conveyed to the inspection station 3, the output end of the lifting control cylinder 14 is pushed out, thereby driving the chip tray at the inspection station 3 to be lifted. Then, the horizontal movement control assembly 6 drives the inspection camera 18 to move above the chip tray, thereby taking pictures of the chips in the chip tray for inspection, and checking whether the characteristics and quantity of the chips are correct. The chip rapid inspection device of this technical solution has an ingenious structural design, strong practicality, and stable operation. Using this chip rapid inspection device, the manual inspection of chips is replaced, which effectively improves the inspection efficiency of chips and effectively shortens the chip inspection cycle.
[0025] The above technical solution only embodies the preferred technical solution of this utility model. Any changes that may be made by those skilled in the art to certain parts of it embody the principle of this utility model and fall within the protection scope of this utility model.
Claims
1. A chip rapid testing device, characterized in that, The device includes a chip tray conveyor assembly (1), on which a chip tray (2) is mounted, and a detection station (3) is mounted on the chip tray conveyor assembly (1). A lifting control assembly (4) is mounted on the chip tray conveyor assembly (1) at the detection station (3). An auxiliary installation assembly (5) is mounted on one side of the chip tray conveyor assembly (1). A lateral movement control assembly (6) is mounted on the auxiliary installation assembly (5). A movement assembly (7) is mounted on the output end of the lateral movement control assembly (6). A detection assembly (8) is mounted on the movement assembly (7).
2. The chip rapid testing device according to claim 1, characterized in that, The chip tray conveyor assembly (1) includes two mounting profiles (9), each mounting profile (9) is provided with two drive wheels (10), and the two drive wheels (10) are connected by a conveyor belt (11).
3. The chip rapid testing device according to claim 2, characterized in that, The two drive wheels (10) on the mounting profile (9) are connected by a drive shaft (12). A drive motor (13) is provided on the side of the mounting profile (9), and the output end of the drive motor (13) is connected to the drive shaft (12).
4. The chip rapid testing device according to claim 1, characterized in that, The lifting control component (4) includes a lifting control cylinder (14) located at the detection station (3) on the chip tray conveying component (1).
5. The chip rapid testing device according to claim 1, characterized in that, The auxiliary mounting component (5) includes an auxiliary mounting bracket (15) disposed on one side of the chip tray conveying component (1), and a lateral movement control component (6) is disposed on the auxiliary mounting bracket (15).
6. The chip rapid testing device according to claim 1, characterized in that, The lateral movement control component (6) includes a lateral movement control module (16) disposed on the auxiliary mounting component (5), and the output end of the lateral movement control module (16) is provided with a movement component (7).
7. The chip rapid testing device according to claim 1, characterized in that, The moving component (7) includes a moving plate frame (17) disposed at the output end of the lateral movement control component (6), and a detection component (8) is disposed on the moving plate frame (17).
8. The chip rapid testing device according to claim 1, characterized in that, The detection component (8) includes a detection camera (18) disposed on the moving component (7).