A diode testing device

Abstract

This utility model discloses a diode testing device, belonging to the field of diode testing technology. It includes a base with supporting components installed at the four corners of the base's bottom. A mounting bracket is installed on one side of the upper end of the base, and an assembly block is snapped into the middle of the mounting bracket. Several diode slots are formed in the middle of the assembly block. A clamping component is located at the bottom of the assembly block below the electrode holes. The utility model also includes a conductive component. A contact plate and an arc-shaped plate move to the upper electrode post of the diode. The arc-shaped plate, under force, moves the contact plate, which in turn pushes a movable rod to extend the reset spring. The contact plate then moves to press against the upper electrode post of the diode, ensuring stable conductivity.

Description

Technical Field

[0001] This utility model belongs to the field of diode testing technology, and specifically relates to a diode testing device. Background Technology

[0002] Diodes are commonly used components in circuits, especially in control circuits. A diode is mainly composed of two electrode parts at both ends and a PN junction in the middle. The measurement of a diode is mainly to verify whether it has the characteristic of unidirectional conduction.

[0003] Existing diode testing devices have several drawbacks: the multimeter probes have difficulty making contact with the upper electrode of the diode, and there is poor contact between the lower electrode and the assembly block, affecting the measurement. Furthermore, the base cannot be adjusted, resulting in unstable support and affecting usability.

[0004] Therefore, a diode testing device is designed to solve the above problems. Utility Model Content

[0005] To address the problems mentioned in the background section, this invention provides a diode testing device that features convenient and reliable electrode post contact, and stable support.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a diode testing device, comprising a base, supporting components installed at the four corners of the bottom of the base, a mounting bracket installed on one side of the upper end of the base, an assembly block snapped into the middle of the mounting bracket, a plurality of diode slots opened in the middle of the assembly block, a clamping component set at the bottom of the assembly block below the electrode holes, a slide mounted on the other side of the upper end of the base, a lead screw rotatably connected in the middle of the slide, a motor mounted on the side of the slide, the motor shaft connected to the lead screw, a movable seat connected to the surface of the lead screw, a conductive component mounted on the side of the movable seat, a multimeter set in the middle of the upper end of the base, a red probe wire connected between the multimeter and the conductive component, and a black probe external wire connected between the multimeter and the assembly block;

[0007] The conductive component includes a connecting frame, a movable rod is movably connected to the middle of the connecting frame, a contact plate is connected to one end of the movable rod away from the connecting frame, arc-shaped plates are provided at both ends of the contact plate, a limit block is connected to the other end of the movable rod, and a return spring is nested on the surface of the movable rod located between the connecting frame and the limit block.

[0008] Preferably, the contact plate remains in close contact with the diode's electrode post under the elastic force of the reset spring.

[0009] Preferably, the clamping assembly includes a vertical plate, and the bottom of the assembly block is equipped with vertical plates on both sides of the electrode hole. A second reset spring is fixedly connected to the middle of the side of the vertical plate near the electrode hole, and the other end of the second reset spring is connected to a connecting plate. A clamping plate is installed on the upper end of the connecting plate.

[0010] Preferably, the bottom of the assembly block is provided with limit rails on both sides of the clamping plate, and the clamping plate is slidably connected to the limit rails.

[0011] Preferably, the end of the clamping plate near the electrode hole is designed with an arc surface structure, and the elastic force of the second reset spring makes the two clamping plates fit tightly together.

[0012] Preferably, the support assembly includes a fixed frame, the lower end of which is movably connected to an adjusting member, and the lower bottom of the adjusting member is fixedly connected to a support base.

[0013] Preferably, the adjusting component includes a support screw, the support screw is movably connected to the bottom center of the fixing frame, an upper adjusting nut is connected to the surface of the support screw inside the fixing frame, and a lower adjusting nut is connected to the support screw at the bottom position of the fixing frame.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] 1. This utility model is equipped with a conductive component. The contact plate and the arc plate move to the upper electrode post of the diode. The arc plate is forced to move the contact plate, and the contact plate pushes the movable rod to move, so that the reset spring is extended. The contact plate moves and fits tightly against the upper electrode post of the diode to ensure stable conductivity.

[0016] 2. This utility model is equipped with a clamping assembly. The lower electrode post of the diode is inserted into the electrode hole. The lower electrode post squeezes and causes the clamping plate to move to both sides. The elastic force of the second reset spring ensures that the clamping plate tightly clamps the lower electrode post, avoids poor contact, and ensures stable diode testing.

[0017] 3. This utility model is equipped with a support component. The fixed frame is connected to the bottom of the base. By adjusting the lower and upper adjusting nuts, the position of the bottom of the fixed frame relative to the support screw can be changed, thereby changing the height of the support base, making the base stable and preventing shaking from affecting the test. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of this utility model;

[0019] Figure 2 This is a schematic diagram of the conductive component structure of this utility model;

[0020] Figure 3 This is a schematic diagram of the position structure of the clamping component of this utility model;

[0021] Figure 4 This utility model Figure 3 Enlarged view of point A;

[0022] Figure 5 This is a schematic diagram of the support component structure of this utility model;

[0023] In the diagram: 1. Base; 2. Support assembly; 21. Fixing frame; 22. Support seat; 23. Adjusting component; 231. Lower adjusting nut; 232. Support screw; 233. Upper adjusting nut; 3. Conductive assembly; 31. Connecting frame; 32. Arc plate; 33. Contact plate; 34. Movable rod; 35. Return spring one; 36. Limiting block; 4. Slide; 5. Multimeter; 6. Red probe wire; 7. Assembly block; 8. Mounting bracket; 9. Diode slot; 10. Motor; 11. Lead screw; 12. Moving seat; 13. Electrode hole; 14. Clamping assembly; 141. Clamping plate; 142. Limiting slide rail; 143. Connecting plate; 144. Return spring two; 145. Vertical plate. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] A diode testing device includes a base 1, with support components 2 installed at the four corners of the bottom of the base 1, a mounting bracket 8 installed on one side of the upper end of the base 1, an assembly block 7 snapped into the middle of the mounting bracket 8, a plurality of diode slots 9 opened in the middle of the assembly block 7, a clamping component 14 set at the bottom of the assembly block 7 below the electrode hole 13, a slide 4 installed on the other side of the upper end of the base 1, a lead screw 11 rotatably connected in the middle of the slide 4, a motor 10 installed on the side of the slide 4, the shaft of the motor 10 connected to the lead screw 11, a movable seat 12 connected to the surface of the lead screw 11, a conductive component 3 installed on the side of the movable seat 12, a multimeter 5 set in the middle of the upper end of the base 1, a red probe wire 6 connected between the multimeter 5 and the conductive component 3, and a black probe external wire connected between the multimeter 5 and the assembly block 7.

[0026] The conductive component 3 includes a connecting frame 31, a movable rod 34 is movably connected in the middle of the connecting frame 31, a contact plate 33 is connected to one end of the movable rod 34 away from the connecting frame 31, arc plates 32 are provided at both ends of the contact plate 33, a limit block 36 is connected to the other end of the movable rod 34, and a return spring 35 is nested on the surface of the movable rod 34 located between the connecting frame 31 and the limit block 36.

[0027] In this embodiment, see Figure 1-2 The diode to be tested is inserted into the diode slot 9, and the lower electrode post of the diode is inserted into the electrode hole 13. The motor 10 rotates, driving the lead screw 11 to rotate. The lead screw 11 drives the moving seat 12 to move in the slide 4. The connecting bracket 31 on the side of the moving seat 12 moves, causing the contact plate 33 and the arc plate 32 to move to the upper electrode post of the diode. The arc plate 32 is forced to move the contact plate 33. The contact plate 33 pushes the movable rod 34 to move, causing the reset spring 35 to extend. The contact plate 33 moves and comes into close contact with the upper electrode post of the diode. The diode is then tested using a multimeter 5.

[0028] Specifically, under the elastic force of the reset spring 35, the contact plate 33 is always in close contact with the diode electrode post.

[0029] In this embodiment, see Figure 2 The spring force of the reset spring 35 ensures that the contact plate 33 is in close contact with the upper electrode post of the diode, thus ensuring stable diode testing.

[0030] Specifically, the clamping assembly 14 includes a vertical plate 145. The bottom of the assembly block 7 is equipped with vertical plates 145 on both sides of the electrode hole 13. A second reset spring 144 is fixedly connected to the middle of the side of the vertical plate 145 near the electrode hole 13. The other end of the second reset spring 144 is connected to a connecting plate 143. A clamping plate 141 is installed on the upper end of the connecting plate 143.

[0031] In this embodiment, see Figure 3-4 The lower electrode post of the diode is inserted into the electrode hole 13. The lower electrode post squeezes and causes the clamping plate 141 to move to both sides. The elastic force of the reset spring 144 ensures that the clamping plate 141 tightly clamps the lower electrode post, avoids poor contact, and ensures stable diode testing.

[0032] Specifically, the bottom of the assembly block 7 is provided with limit slide rails 142 on both sides of the clamping plate 141, and the clamping plate 141 is slidably connected to the limit slide rails 142.

[0033] In this embodiment, see Figure 4 By setting the limiting slide rail 142, the clamping plate 141 can slide stably to avoid falling off, and the connection between the lower electrode post and the clamping plate 141 and the assembly block 7 can be stable to avoid poor contact.

[0034] Specifically, the end of the clamping plate 141 near the electrode hole 13 is designed with an arc surface structure, and the elastic force of the reset spring 144 makes the two clamping plates 141 fit tightly on the sides.

[0035] In this embodiment, see Figure 4 The side of the clamping plate 141 is designed with an arc surface structure to ensure that when the lower electrode post is pressed down, the clamping plate 141 moves to both sides, ensuring that the lower electrode post is in close contact with the clamping plate 141 and ensuring a reliable contact.

[0036] Specifically, the support component 2 includes a fixed frame 21, an adjusting member 23 is movably connected to the lower end of the fixed frame 21, and a support base 22 is fixedly connected to the lower bottom of the adjusting member 23.

[0037] In this embodiment, see Figure 5 The fixed frame 21 is connected to the bottom of the base 1. By adjusting the adjusting piece 23, the distance between the fixed frame 21 and the support base 22 is changed, thereby changing the height of the base 1 and realizing the support adjustment of the base 1, ensuring the stability of the base 1 and avoiding shaking.

[0038] Specifically, the adjusting component 23 includes a support screw 232, the support screw 232 is movably connected to the bottom middle of the fixed frame 21, the upper adjusting nut 233 is connected to the surface of the support screw 232 inside the fixed frame 21, and the lower adjusting nut 231 is connected to the support screw 232 at the bottom position of the fixed frame 21.

[0039] In this embodiment, see Figure 5 By adjusting the lower adjusting nut 231 and the upper adjusting nut 233, the position of the bottom of the fixing frame 21 relative to the support screw 232 is changed, thereby changing the height of the support base 22, making the base 1 stable and preventing shaking from affecting the test.

[0040] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A diode testing device comprising a base (1), characterised in that: Support components (2) are installed at the four corners of the bottom of the base (1). A mounting bracket (8) is installed on one side of the upper end of the base (1). An assembly block (7) is snapped into the middle of the mounting bracket (8). Several diode slots (9) are opened in the middle of the assembly block (7). A clamping component (14) is set at the bottom of the assembly block (7) below the electrode hole (13). A slide (4) is installed on the other side of the upper end of the base (1). A lead screw (11) is rotatably connected in the middle of the slide (4). A motor (10) is installed on the side of the slide (4). The shaft of the motor (10) is connected to the lead screw (11). A movable seat (12) is connected to the surface of the lead screw (11). A conductive component (3) is installed on the side of the movable seat (12). A multimeter (5) is set in the middle of the upper end of the base (1). A red probe wire (6) is connected between the multimeter (5) and the conductive component (3). A black probe external wire is connected between the multimeter (5) and the assembly block (7). The conductive component (3) includes a connecting frame (31), a movable rod (34) is movably connected in the middle of the connecting frame (31), a contact plate (33) is connected to one end of the movable rod (34) away from the connecting frame (31), arc plates (32) are provided at both ends of the contact plate (33), a limit block (36) is connected to the other end of the movable rod (34), and a reset spring (35) is nested on the surface of the movable rod (34) between the connecting frame (31) and the limit block (36).

2. The diode testing device according to claim 1, characterized in that: The contact plate (33) is always in close contact with the electrode post of the diode under the elastic force of the reset spring (35).

3. The diode testing device according to claim 1, characterized in that: The clamping assembly (14) includes a vertical plate (145). The bottom of the assembly block (7) is equipped with vertical plates (145) on both sides of the electrode hole (13). A second reset spring (144) is fixedly connected to the middle of the side of the vertical plate (145) near the electrode hole (13). The other end of the second reset spring (144) is connected to a connecting plate (143). A clamping plate (141) is installed on the upper end of the connecting plate (143).

4. A diode testing device according to claim 3, characterized in that: The bottom of the assembly block (7) is provided with limit slide rails (142) on both sides of the clamping plate (141), and the clamping plate (141) is slidably connected to the limit slide rails (142).

5. A diode testing device according to claim 3, characterized in that: The end of the clamp (141) near the electrode hole (13) is set as an arc surface structure, and the elastic force of the second reset spring (144) makes the two clamps (141) fit tightly on the sides.

6. A diode testing device according to claim 1, characterized in that: The support assembly (2) includes a fixed frame (21), the lower end of which is movably connected to an adjusting member (23), and the lower bottom of the adjusting member (23) is fixedly connected to a support base (22).

7. A diode testing device according to claim 6, characterized in that: The adjusting component (23) includes a support screw (232), the support screw (232) is movably connected to the middle of the bottom of the fixed frame (21), the upper adjusting nut (233) is connected to the surface of the support screw (232) inside the fixed frame (21), and the lower adjusting nut (231) is connected to the bottom position of the support screw (232) at the bottom of the fixed frame (21).

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